JP2012502674A - Measurement system for ophthalmic surgery - Google Patents

Abstract

  The present invention relates to an optical measurement system including a wavefront sensor for characterizing the shape of a wavefront of measurement light and an imaging lens, and the imaging lens is a first for imaging an object region on an entrance region of the wavefront sensor. And a second optical assembly. The distance between the object region and the first optical assembly is greater than the focal length of the first optical assembly. Furthermore, the optical measurement system may comprise an optical microscope system and optionally an OCT system for performing different optical inspection methods simultaneously.

Description

  The present invention relates to an ophthalmic surgical measurement system having a wavefront sensor and an imaging optical member. In particular, the present invention provides a wavefront sensor and imaging optics suitable for use in surgery, particularly in eye surgery, by providing a sufficiently large distance between the imaging optical member and the object under examination. The present invention relates to a measurement system for ophthalmic surgery having a member. The present invention further relates to a measurement system for ophthalmic surgery having a wavefront sensor and an OCT system.

  Wavefront sensors configured to characterize the shape of the wavefront of the measurement light are known in the art. Such wavefront sensors are described in particular in J. J. Liang, B. B. Grimm, S.M. S. Goelz, J.A. F. JF Bille article “Objective measurement of a Hartmann-Shack wavefront sensor” (J. Opt. Soc. Am. A 11 (1994) pp. 1949-1957) As has been described, it may be used to measure the aberrations of the human eye using a Hartman-Shack sensor. In such a system, the Hartman-Shack sensor comprises an array of microlenses arranged in particular on a plane, and a position sensitive photosensor is arranged on a common focal plane of the microlenses. In such a Hartman-Shack sensor, the shape of the wavefront incident on the array of microlenses can be determined by measuring the local slope of the wavefront in the region corresponding to each microlens.

  In order to measure the optical properties of the human eye, the smallest possible illumination spot is generated on the retina of the human eye. A nearly spherical wave is emitted from this pointed irradiation spot and exits the human eye across the vitreous, lens and cornea. The shape of the wavefront is changed when crossing different optical interfaces of the human eye. As a result, the outgoing wavefront deviates from the plane wavefront. These deviations from the plane wavefront can be represented by local tilts in the lateral region, which can be measured using a Hartman-Shack wavefront sensor.

  The document US 2005/0241653 A1 discloses a wavefront sensor that can be placed and mounted between an objective lens of a microscope system and an object under examination.

  Document US 6,550,917 B1 discloses a wavefront sensor designed such that a spherical wavefront can be transformed into a plane wavefront. The spherical wavefront can be, for example, a wavefront exiting a refractive eye that has spherical aberration. Thereby, the measurement range of the wavefront sensor can be increased.

  Document DE 103 60 570 B4 discloses an optical measurement system comprising an OCT system and a wavefront analysis system. Based on the measurement of the wavefront shape, the adaptive optical element is controlled such that the wavefront measured by the wavefront detector is substantially a plane wavefront. Thereby, it is possible to obtain an improved OCT signal.

  However, the surgical use of the wavefront sensor disclosed in the above-mentioned document is only limited. This is because surgery requires a short distance between the object and the optical component located closest to the object.

  Accordingly, it is an object of the present invention to provide an optical measurement system having a wavefront sensor suitable for use in surgery. In particular, it is an object of the present invention to provide a measurement system with a wavefront sensor that is suitable for use in eye surgery, particularly cataract surgery.

  It is a further object of the present invention to provide an optical measurement system having a wavefront sensor and an OCT system that allows an object to be inspected by analyzing the wavefront emanating from the object, which analysis comprises a three-dimensional structure. This is done by measuring the data set. The measurement system must also be suitable for surgery.

  Embodiments of the present invention provide an optical measurement system, particularly a measurement system for eye surgery, that provides a surgeon with sufficient working space to perform a surgical operation.

  According to an embodiment of the present invention, an optical measurement system is provided, the optical measurement system comprising: a wavefront sensor for characterizing a wavefront shape of measurement light at an entrance region of the wavefront sensor; and a wavefront sensor using the measurement light. An imaging optical member having a first optical assembly and a second optical assembly for imaging the object region on the entrance region, and a relationship of 1.1 * f ≦ d is satisfied, 1 represents the focal length of one optical assembly, and d represents the distance between the object region and the first optical assembly.

  The wavefront sensor may comprise a wide array of refractive or diffractive optical elements. This array of optical elements may in particular be an array of microlenses. Each of these refractive or diffractive optical elements is designed such that the measuring light is focused at the focal plane. A position sensitive photosensor is provided on a common focal plane formed from the individual focal planes of the refractive or diffractive optical element. The position sensitive light sensor may be, for example, a CCD camera and / or a CMOS sensor or other light sensitive sensor. In particular, the position sensitive optical sensor may be configured to resolve a spatial intensity distribution. The position sensitive photo detector may be arranged on a plane oriented perpendicular to the optical axis of the wavefront sensor. The entrance area of the wavefront sensor may be defined by the area in which the array of refractive or diffractive optical elements is located. In particular, this region may have a planar shape. This plane may be defined, for example, by aligning the plane with the optical interface of a refractive or diffractive optical element, which is the farthest away from the position sensitive photosensor. These optical surfaces are provided.

  Depending on the shape of the wavefront of the measurement light incident on the wavefront sensor, the ray bundle of this wavefront is imaged onto an array of corresponding regions on the position sensitive photodetector by an array of refractive or diffractive optical elements. . These focused beam bundle regions may in particular have an elliptical or circular shape. The average position of each region or the position of the center of mass with respect to the lateral position of the corresponding refractive or diffractive optical element represents the local tilt or tilt of the beam bundle of the respective refractive or diffractive optical element and is incident on the wavefront sensor. The wavefront has this beam.

  In particular, the position sensitive photosensor may comprise a plurality of sensor segments or pixels. Depending on the light intensity incident on each detector segment, the wavefront sensor generates an electrical signal. These electrical signals are then transmitted to the processing unit. The processing unit is configured to determine the position of the focused beam bundle from the electrical signal. This position may in particular be a center or center of mass position, eg extending over several detector segments and focused across one of the refractive or diffractive optical elements of the wavefront sensor. It may be the center of mass of the region formed by the incident light beam.

  According to an embodiment of the present invention, the wavefront sensor is a Hartman-Shack sensor. Alternatively, the wavefront sensor may be, for example, an interferometer, typical Hartman test, Ronchi test, Talbot interferometry, or phase recovery method. Further, the optical measurement system may be configured such that possible astigmatism of the patient's eye is pre-compensated by the variable cylindrical lens. The cylindrical lens may be rotatably supported. For example, the cylindrical lens may be a liquid lens.

  The optical measurement system may further comprise a light source for illuminating the object under inspection. In particular, the measurement system may be configured to illuminate an area of the retina of the eye under examination, which area is as small as possible. The wavefront of the substantially parallel or spherical measuring light can be incident on the eye under examination, and after the wavefront traverses the cornea, lens and vitreous body of the eye under examination, the wavefront becomes a substantially spherical wavefront Incident on the retina. Thereby, a region of the retina having a small area is illuminated. Depending on the refractive error of the eye under examination, this region may have a circular or elliptical shape. The difference in the lengths of the ellipse principal axes can increase with astigmatism of the eye under examination.

  In order to measure the shape of the wavefront emanating from the eye under examination, the wavefront is directed onto the entrance area of the wavefront sensor. For this purpose, the optical measurement system comprises an imaging optical member having a first optical assembly and a second optical assembly. The optical assembly may be one of refractive optical elements, diffractive optical elements or the like, such as mirrors and / or lenses and / or gratings and / or one or more electronically or mechanically controllable variable lenses or mirrors These may be designed such that the optical power can be adapted by changing the shape. The optical components of the optical assembly have fixed positions relative to each other, such as a cementing element, or alternatively individual lenses and / or cementing elements mounted using a lens mount. May be.

  Light emitted in a different direction from a point in the focal region of the first optical assembly is transformed into a beam of substantially parallel rays by traversing the first optical assembly. From this fact, the position of the focal region of the first optical assembly can be determined. The focal region may in particular have the shape of a plane located perpendicular to the optical axis of the first optical assembly. In this case, the focal region can be referred to as the focal plane. The focal point of the first optical assembly may be defined as the point where the optical axis of the first optical assembly intersects the focal plane. Incident light that passes through the focal point of the first optical assembly and forms a small angle with the optical axis is transformed by the first optical assembly into an outgoing light beam that travels parallel to the optical axis of the first optical assembly. The point where the spread outgoing light beam intersects the spread incident light beam is in the main plane of the first optical assembly. The focal length f of the first optical assembly is defined by the distance between the main plane of the first optical assembly and the focal plane of the first optical assembly.

  The distance d between the object region and the first optical assembly is defined by the distance between the object region and the optical surface of the component of the first optical assembly, which optical surface is in the beam path of the measuring light. Can correspond to the optical surface of a component of the first optical assembly located along the closest object region along. This component of the first optical assembly is a lens, ie an optical component having the effect of a component having a refractive power greater than zero. In particular, this component is not a parallel plane plate or other form of component that does not change the shape of the wavefront of the measurement light. Thus, further optical components may be arranged between the object region and the first optical assembly in the beam path of the measuring light, with a distance less than d from the object region. The power of these further optical components may be zero, or the first optical power, such as less than 5% of the power of the first optical assembly, in particular less than 1%. The refractive power may be smaller than the refractive power of the component. The refractive power of the first optical assembly is indicated by the reciprocal of the focal length, ie 1 / f.

  Thereby, the distance d represents the free space between the first optical assembly and the object under examination. This free space is sometimes called the work space, and the distance d is sometimes called the work distance. Satisfying the condition 1.1 * f ≦ d ensures that the working distance d is greater than the focal length f of the first optical assembly. Thereby, the working distance is increased by increasing d, which is particularly advantageous during surgery, especially surgery performed on the human eye.

  According to an embodiment of the present invention, 1.5 * f ≦ d, in particular 1.75 * f ≦ d, in particular 2 * f ≦ d. In certain applications, it is advantageous to provide a relatively small focal length for the first optical assembly. Also in this case, a sufficiently large working distance can be obtained for performing a surgical operation.

  According to an embodiment of the present invention, d ≧ 150 millimeters holds, in particular d ≧ 175 millimeters holds, and more particularly d ≧ 190 mm holds. Such a working distance makes it possible to perform a surgical operation under various requirements, particularly those resulting from performing an eye surgery. According to a further embodiment, d ≦ 500 mm holds, in particular d ≦ 300 mm, and more particularly d ≦ 200 mm.

  According to an embodiment of the invention, at least one of the first optical assembly and the second optical assembly is a refractive optical assembly, in particular a lens assembly. A lens assembly is a set of lenses comprising one or more lenses. The lens assembly may consist of a cemented element. The lenses of the lens assembly may be placed in a fixed position relative to each other.

  According to an embodiment of the present invention, the optical measurement system is arranged and configured to image the object region along the beam path of the microscope on an image region different from the entrance region of the wavefront sensor. An optical assembly is further provided. Thereby, in addition to analyzing the wavefront, it is possible to perform an optical microscopic examination of the object region. Performing light microscopy is particularly useful during surgery.

According to an embodiment of the invention, the object area is located in the focal area of the first optical assembly.
According to an embodiment of the present invention, the first optical assembly comprises a first optical subassembly and a second optical subassembly that are located at a distance from each other. The first optical assembly comprises a first optical subassembly and a second optical subassembly. In particular, the first optical subassembly and the second optical subassembly are arranged in a fixed position relative to each other.

  According to embodiments of the present invention, the optical path traversed by the measurement light along the beam path of the measurement light between the first optical assembly and the second optical assembly is adaptable. The suitability of the optical path has the advantage that the spherical aberration of the human eye under examination can be pre-compensated. Thereby, it is possible to minimize the curvature of the wavefront incident on the wavefront sensor, thereby increasing the measurement range or dynamic range of the wavefront sensor. If the wavefront of the measurement light has a spherical shape when incident on the first optical assembly, the wavefront at the entrance region of the wavefront sensor may be transformed into a wavefront having a substantially planar shape. This variation increases or decreases the optical path between the first optical assembly and the second optical assembly, in particular the second optical subassembly and the second optical assembly of the first optical assembly. May be adapted by increasing or decreasing the optical path between.

  The focal region of the first optical assembly that may comprise the first optical subassembly and the second optical subassembly even if the optical path between the first optical assembly and the second optical assembly is changed. Is still imaged on the entrance area of the wavefront sensor. Changing the optical path may comprise moving / displaceting the second optical subassembly relative to the second optical assembly. An actuator for changing the optical path may be provided, and the actuator is designed to provide a driving force for displacing the second optical subassembly relative to the second optical assembly. The actuator may be a motor or actuator that may be configured to transmit a driving force for displacement, such as an actuation mechanism such as a screw. The displacement may be performed along a track or guide. A displacement amount such as a displacement distance may be detected and measured by a detector. The actuator may be in signal communication with the controller so that the controller can activate the actuator. The controller may be equipped with a calibration curve that allows a conversion between the amount of spherical aberration of the eye under examination and the displacement distance to pre-compensate for this refractive error or use a calibration curve May be. By using a calibration curve, it is possible to control an actuator for displacing the second optical subassembly relative to the second optical assembly based on a known refractive error of the eye under examination.

  In accordance with an embodiment of the present invention, an ophthalmic surgical measurement system is configured to characterize a wavefront shape of measurement light emanating from an eye disposed in an object region, the first optical assembly and the second optical assembly. By changing the optical path between and the eye, the eye has a spherical aberration of -5 dpt (diopter) to +25 dpt (diopter). The sign of the spherical aberration of the eye is defined so that the aphakic eye, ie the eye with the lens removed, has a spherical aberration of about +20 dpt.

  According to an embodiment of the invention, the optical measurement system further comprises a reflector, in particular for deflecting the measurement light by 180 °, which reflector can be used to change the optical path traversed by the measurement light. Displaceably disposed between the first optical assembly and the second optical assembly in the beam path. In particular, the reflector is displaceably disposed between the second optical subassembly and the second optical assembly of the first optical assembly in the beam path of the measuring light.

  According to an embodiment of the invention, the reflector comprises at least two mirror surfaces arranged at an angle different from zero. The reflector may comprise, for example, two or three mirrors and the reflector does not comprise a further reflecting surface. It is advantageous to use just two mirrors for the preferred polarization behavior.

  In accordance with an embodiment of the present invention, an optical measurement system includes a first optical assembly (particularly a second optical subassembly of the first optical assembly) and a second optical assembly in a beam path of measurement light. Is further included. A retroreflector is an optical system that substantially reverses the direction of propagation of measurement light. This feature is substantially independent of the direction of the propagation direction of the measurement light with respect to the retroreflector. As an example, the measurement light is not reflected by the retroreflector along the beam path of the incident measurement light, but is retroreflected along a path displaced laterally with respect to the beam path of the incident measurement light. Is reflected by. Placing the retroreflector between the second optical subassembly and the second optical assembly to displace the optical between the second optical subassembly and the second optical assembly by displacing the retroreflector. It is possible to change the route. By displacing the retroreflector by a distance 1 in a direction parallel to the optical axis of the first optical assembly, the optical path between the second optical subassembly and the second optical assembly is 2 * n * 1. This results in an increase or decrease, where n represents the refractive index of the medium in the beam path of the measurement light between the second optical subassembly and the second optical assembly. By providing a retroreflector, it becomes possible to design an optical measurement system that is very compact in size. This in turn allows the optical measurement system to be mounted in or under the microscope system.

  According to an embodiment of the invention, the retroreflector comprises a corner cube. The corner cube includes a transparent body having a substantially triangular pyramid shape. The triangular pyramid may include three triangles oriented perpendicular to each other, each of which has the shape of an isosceles triangle, a right triangle, and is a surface of an equilateral triangle shape. By this corner cube, the incident light beam is reflected by the corner cube on three surfaces. The mirroring process can occur by total internal reflection. However, it is also conceivable to apply a reflective coating to the surface where the mirroring process takes place, for example by applying a metallic coating. Thereby, the possible polarization of light is affected in different ways.

  According to an embodiment of the present invention, the optical measurement system further comprises a beam splitter disposed between the entrance region of the wavefront sensor and the second optical assembly. The beam splitter may be designed as a polarizing beam splitter. A beam splitter may advantageously be used to couple measurement light into the beam path. Accordingly, measurement light on the way from the beam splitter to the object in the focal region of the first optical assembly traverses substantially the same path as light emitted from the object on the way to the beam splitter. On the way from the beam splitter to the object, the measuring light traverses the second optical assembly and the first optical assembly (in particular, the first optical subassembly and the second optical subassembly of the first optical assembly). On the way from the object to the beam splitter, the measurement light traverses the first optical assembly (in particular, the first optical subassembly and the second optical subassembly of the first optical assembly) and the second optical assembly. . Further, the measurement light reaches the wavefront sensor along a portion of the beam path where the measurement light does not cross on the way from the beam splitter to the object. Thereby, in the case of an eye under examination with spherical aberration, the measuring light illuminating the eye can be adapted with respect to the curvature of the wavefront of the measuring light, so that the illuminated spot on the retina of the eye under examination is as small as possible To be particularly certain. This may be done by changing the optical path between the second optical assembly and the second optical subassembly.

  According to an embodiment of the present invention, the relationship d (1,2) ≧ f1 * d / (d−f1) is established, where d (1,2) is the first component of the first optical subassembly and the first component. 2 represents the distance between the two optical subassemblies, and f1 represents the focal length of the first optical subassembly. The first optical subassembly and the second optical subassembly are located at a distance from each other, particularly along the optical axis of the first optical assembly, so that a point in the focal region of the first optical assembly. The light beam emanating from crosses the first optical subassembly and then intersects between the first optical subassembly and the second optical subassembly. An intermediate image of the object region arranged in such a crossing region, in particular in the focal region of the first optical assembly, is formed. d (1,2) is the distance along the optical axis of the first optical assembly between the optical surface of the component of the first optical subassembly and the optical surface of the component of the second optical subassembly Wherein both components have a refractive power different from 0, and both optical components are each of those optical sub-assemblies of the first and second optical subassemblies having a minimum distance from each other. It is a component.

  According to an embodiment of the invention, the first optical subassembly comprises a first lens group, in particular an objective lens, and a second lens group arranged at a distance from the first lens group, The microscope beam path traverses the first lens group of the first optical subassembly, and the third optical assembly comprises a zoom system. Thereby, the beam path of the measuring light and the microscope beam path for the wavefront sensor traverse the first lens group of the first optical subassembly. Thereby, it is possible to provide an optical measurement system that allows wavefront analysis and simultaneous optical microscopy, wherein the first lens group of the first optical subassembly is used for both purposes. It is done. Thereby, the components of the optical measurement system can be integrated, and the size of the optical measurement system becomes compact.

  According to an embodiment of the invention, a mirror surface, such as a mirror surface of a folding mirror, is disposed between the first lens group and the second lens group of the first optical subassembly in the beam path of the measuring light. Is done. The mirror surface is provided to spatially separate the measurement light beam path from the microscope beam path.

  According to an embodiment of the invention, the second lens group of the first optical subassembly and the second optical subassembly constitute an afocal system, in particular a Kepler telescope. Light having a plane wavefront is transformed into light having a plane wavefront by traversing the afocal system. A Kepler telescope is an optical system consisting of two lenses or lens systems, respectively. The two lenses are placed at a distance from each other along the optical axis, which distance corresponds to the sum of the focal lengths of both lenses.

  According to an embodiment, the object region is located in the focal region of the first lens group of the first optical subassembly. The first lens group of the first optical subassembly can be referred to as the main objective of the microscope system. Therefore, the object region is located in the focal region of the main objective lens of the microscope system. This is advantageous when additional optical components such as a zoom system or eyepiece are used downstream of the main objective.

  According to an embodiment of the present invention, the third optical assembly comprises an objective lens and a zoom system, the beam path of the measurement light does not cross the objective lens, and the mirror surface is separated from the object region in the beam path of the measurement light. And a first optical subassembly. According to this embodiment, none of the components of the optical measurement system described above are provided for performing wavefront analysis and optical microscopy. In particular, this has the advantage that the components for wavefront analysis can be removably attached to the optical microscope system and thus can be designed to be removable for performing wavefront analysis. . In addition, these components can be attached to different optical microscope systems without requiring significant optical components of the optical microscope system or without having to adapt significant optical components of the optical microscope system. May be designed to be

According to an embodiment of the present invention, the object region is located in the focal region of the objective lens.
According to an embodiment of the present invention, the object area is different from the focal area of the first optical assembly.

  According to an embodiment of the present invention, the first optical assembly and the second optical assembly together constitute an afocal system, in particular a Kepler telescope.

  According to the embodiment of the present invention, the beam splitter is displaceably disposed between the first optical assembly and the second optical assembly in the beam path of the measurement light. Through the beam splitter, the illumination light can be directed to the object region.

  According to an embodiment of the invention, a mirror surface (61) is arranged between the first optical assembly and the object area. Thereby, the optical measurement system can be combined with the microscope system, and the beam splitter separates the part that forms the measurement light for wavefront analysis from the light used for microscopy.

  According to an embodiment of the present invention, the ophthalmic surgical measurement system further comprises an OCT system having an OCT light source for generating OCT measurement light, wherein the OCT measurement light is at least a first optical for illuminating the object region. An OCT beam splitter is disposed in the beam path of the OCT measurement light between the first optical assembly and the second optical assembly or between the second optical assembly and the entrance region of the wavefront sensor to be directed to the assembly. The When the OCT beam splitter is disposed between the first optical assembly and the second optical assembly, the OCT measurement light is only emitted from the first optical assembly, not the second optical assembly, to illuminate the object region. Directed to pass through. When the OCT beam splitter is positioned between the second optical assembly and the entrance area of the wavefront sensor, the OCT measurement light traverses the first optical assembly and the second optical assembly to illuminate the object area. To do. The OCT measurement light may interact with the OCT beam splitter, which interaction may comprise, for example, transmission or reflection. The OCT beam splitter may be configured to position the beam path of the OCT measurement light at least in part to be identical to the beam path of the measurement light used for wavefront analysis. Thereby, the measurement light used for wavefront analysis may cross or be reflected by components of the system that also traverse OCT measurement light or reflect OCT measurement light. The optical component of the system may comprise a first optical assembly. In addition, these components may also include a second optical assembly. Thereby, a cost-effective and compact size mechanism can be obtained.

  Optical coherence tomography (OCT) is an interferometry-based method for obtaining structural information of an object in a volume portion by reflecting light at different depths of the object under investigation.

  The OCT light source may be configured to provide OCT measurement light having a wavelength in the visible range and / or near-infrared range of wavelengths, wherein the bandwidth of the OCT light source is the OCT measurement light emitted from the OCT light source. The coherence length is adjusted to be several micrometers to several tens of micrometers. A portion of the OCT measurement light emitted from the OCT light source is directed to an object located in the object region along an OCT beam path comprising mirrors, lenses and / or optical fibers. OCT measurement light penetrates the object to a certain penetration depth depending on the wavelength and the material in the object. Part of the invading OCT measurement light is reflected according to the reflectance in the object, and is superimposed on the second portion of the OCT measurement light emitted from the OCT light source and reflected by the reference surface. The superimposed light is detected by a detector and converted into an electrical signal corresponding to the detected intensity of the superimposed light. Due to the relatively short coherence length of the OCT measurement light, the optical path taken by the OCT measurement light to and from the object and the second of the light emitted by the OCT light source and reflected by the reference surface Constructive interference is observed only when the difference from the optical path taken by the part is less than the coherence length of the OCT measurement light.

  Different embodiments provide different variations of the OCT system. Different variants of the OCT system differ from each other in that the structural information is obtained from scanning along the depth direction (axial direction) and that the superimposed light is detected. According to an embodiment of time domain OCT (TD-OCT), the reference plane on which the second part of the light emitted by the light source is reflected is for obtaining structural information of the object from different depths. It is displaced. In this case, the intensity of the superimposed light may be detected by a photodetector.

  Even in the frequency domain OCT (Frequency-Domain-OCT) (FD-OCT), the second portion of the OCT measurement light emitted from the OCT light source is reflected by the reference surface. However, the reference plane need not be displaced to obtain structural information from different depths within the object. Rather, the superimposed light is spectrally dispersed into a spectral portion by a spectrometer, which is detected by a position sensitive detector such as a CCD camera. Structure information of the object along the depth direction can be obtained by Fourier transform of the obtained spectrum of the superimposed light (Fourier domain OCT).

  A further modification of FD-OCT is a swept-source-OCT (SS-OCT). The spectrum of the superimposed light is recorded sequentially by continuously changing the average wavelength of the OCT measurement light having a very narrow bandwidth. At the same time, the superimposed light is recorded using a photodiode.

  The OCT system may be used in particular to examine the anterior or posterior chamber of the human eye, or the structure of the retina of the human eye.

  In accordance with an embodiment of the present invention, an ophthalmic surgical measurement system includes at least one scanning mirror that is pivotally disposed between an OCT light source and an OCT beam splitter for scanning OCT measurement light over an object region. Is further provided. The OCT system may further include a collimating optical member for collimating the OCT measurement light generated by the OCT light source. By rotating at least one scanning mirror, the collimated OCT measurement light may be guided onto the object region as a focused OCT measurement beam. As a result, structural information can be obtained from the portion of the object region that extends in the lateral direction. The system may include two or more scanning mirrors, such as two scanning mirrors that can be rotated about different axes.

  According to an embodiment of the present invention, the at least one scanning mirror, the second lens group of the first optical subassembly, and the second optical subassembly have an area close to the mirror plane in an area close to the at least one scanning mirror Constructed and arranged to image on top. The first optical assembly includes a first optical subassembly and a second optical subassembly, as described above, and the first optical subassembly includes a second lens group. The second lens group of the first optical subassembly and the second optical subassembly constitute an afocal system for imaging an area located near the scanning mirror into an area located near the mirror surface. May be.

  The mirror surface is disposed between the first lens group of the first optical subassembly and the second lens group of the first optical subassembly in the beam path of the measurement light to analyze the wavefront. For example, a mirror surface that is part of a folding mirror may reflect the measurement light so that the measurement light traverses a further lens, such as a microscope objective on the path to the object region. In an optimally tuned system, the center of at least one scanning mirror is imaged on the center of the mirror plane by the second lens group of the first optical subassembly and by the second optical subassembly. Such an optical imaging process is such that, for different rotational positions of at least one scanning mirror, OCT measuring light emitted from a point on the scanning mirror is imaged on a point at the center of the mirror surface, ie beam walk-off. It has the advantage that there is no (beam walk-off). Thereby, it is prevented that the OCT measurement light does not hit the mirror surface. Therefore, it is possible to design a mirror surface that is relatively compact in size.

  If this system comprises two scanning mirrors arranged at a distance from each other, the center point of the connecting line between the two scanning mirrors is notably the center of the mirror surface or the lateral extent of the mirror surface. Designed to be imaged on at least an area located near the mirror surface, such as an area located along the OCT beam path at a distance from the center of the mirror surface by exactly 100, 10 or 2 times. , May be adjusted. The connecting line is directed along the OCT beam path of the optical system consisting of the second lens group of the first optical subassembly and the second optical subassembly. The distance of the area from the mirror surface may depend on the optical magnification of the system consisting of the second lens group of the first optical subassembly and the second optical subassembly, so that this distance is high. It grows as it becomes. This dependency relationship may be linear.

  The area located near the scanning mirror is a range of scanning mirrors with which the system is equipped with a spatial point with a smaller distance to the scanning mirror of the system, in particular a tenth, a fifth or a half. You may have.

  The region close to the mirror surface may include a spatial point as a range of the mirror surface, the distance to the mirror surface being particularly 1/10, 1/5 or 1/2 along the OCT beam path. Good. The mirror surface and the OCT beam path may be at an angle between 30 ° and 60 °.

  According to an embodiment of the present invention, the measurement system for ophthalmic surgery further comprises a wavefront light source for generating measurement light used for analyzing the wavefront, wherein at least 80% of the total intensity of the generated measurement light is It consists of light having a wavelength of 800 nm to 870 nm, particularly 820 nm to 840 nm. The measurement light may be generated by, for example, a superluminescence diode (SLD). Measurement light of such a wavelength is particularly suitable for traversing the human eye to the retina so as to form an illumination spot on the retina. Then, after irregular reflection, the light exits the eye and is inspected by the wavefront sensor taking into account the wavefront shape. It is advantageous to use light in these wavelength ranges. This is because the patient's eyes do not recognize this light so that the patient is not blinded and the iris of the patient's eye is not contracted. Iris contraction will impair measurement.

  According to an embodiment of the present invention, at least 80% of the total intensity of the generated OCT measurement light is composed of light having a wavelength of 1280 nm to 1320 nm, particularly 1300 nm to 1320 nm. OCT measuring light of these wavelengths is particularly suitable for entering the region of the inner chamber of the eye and being reflected by this region. Thereby, structural information from the anterior chamber can be obtained. In addition, structural information can be obtained from the posterior chamber of the eye and / or the retina.

  A wavelength range of 800 nm to 870 nm is very suitable for investigating or observing the retina by OCT. This is because this light reaches the retina. In this case, the spectrum of the wavefront light source and the OCT light source is such that at least 60%, in particular at least 80% of the intensity of the measurement light for wavefront analysis is located in the wavelength range where 80% of the intensity of the OCT measurement light is located. May overlap. The measurement light for wavefront analysis may have essentially the same wavelength as the OCT measurement light. In this case, it is possible to use a single light source that also generates measurement light for wavefront analysis and OCT measurement light.

  According to an embodiment of the present invention, at least 70%, in particular at least 90%, of the intensity of the measurement light and OCT measurement light used for wavefront analysis is not located in the overlapping wavelength range. Measurement light and OCT measurement light used for wavefront analysis traverse or interact with the optical components of an ophthalmic surgical measurement system, but the measurement light is in a different wavelength range For this purpose, they may be separated from each other, for example by dichroic elements. The optical component with which the measuring light interacts or that the measuring light traverses can be, for example, a first optical assembly, and in particular a second optical assembly. Thereby, the measurement of the wavefront is prevented from affecting the measurement by the OCT system. However, both measurement lights may have a common wavelength range and their spectra may overlap significantly.

  According to an embodiment of the present invention, the OCT beam splitter includes a dichroic mirror, and the transmittance of the dichroic mirror in the wavelength range of 800 nm to 870 nm, particularly 820 nm to 840 nm, is in the wavelength range of 1280 nm to 1340 nm, particularly 1300 nm to 1320 nm. Is at least twice as high or exactly half as high.

  According to an embodiment of the present invention, at least 80% of the intensity of the measurement light for wavefront analysis or the OCT measurement light is transmitted through the OCT beam splitter.

  According to an embodiment of the present invention, the OCT beam splitter comprises a dichroic mirror, and the reflectivity of the dichroic mirror in the wavelength range of 1280 nm to 1340 nm, especially 1300 nm to 1320 nm is in the wavelength range of 800 nm to 870 nm, especially 820 nm to 840 nm. Is at least twice as high or at most half as high.

  According to an embodiment of the present invention, at least 80% of the intensity of the measurement light for wavefront analysis or the OCT measurement light is reflected by the OCT beam splitter.

  The dichroic mirror may be coated with layers of materials having different dielectric constants. These layers may be configured such that constructive interference occurs due to reflected or transmitted measurement light when the measurement light strikes a dichroic mirror.

  According to an embodiment of the present invention, most of the intensity of the OCT measurement light striking the OCT beam splitter, in particular at least 70%, is reflected by the OCT beam splitter. In this process, most of the intensity of the measurement light for wavefront analysis impinging on the OCT beam splitter, in particular at least 70%, is transmitted through the OCT beam splitter.

  Specific embodiments of the present invention will be described in detail with reference to the accompanying drawings. Similar elements in different embodiments are designated with the same reference signs having different letters as suffixes. Thereby, missing descriptions of elements of one embodiment can be derived from descriptions of elements of different embodiments.

It is the figure which showed schematically the Example of the optical measurement system of this invention, and is a figure in which the irradiation beam path | route or the wavefront beam path | route is each shown. FIG. 1B schematically shows the embodiment shown in FIG. 1A, in which the object beam path is shown. 1B schematically illustrates a section of the embodiment shown in FIGS. 1A and 1B of an optical measurement system. FIG. FIG. 6 schematically shows a further embodiment of the optical measurement system according to the invention, in which the irradiation beam path or the wavefront beam path are respectively shown. FIG. 2B schematically shows the embodiment shown in FIG. 2A, in which the object beam path is shown. FIG. 6 schematically shows a further embodiment of an optical measurement system according to the invention. FIG. 6 schematically shows a further embodiment of an optical measurement system according to the invention. FIG. 6 schematically shows a further embodiment of the optical measurement system according to the invention, in which the irradiation beam path or the wavefront beam path are respectively shown. FIG. 5B is a diagram schematically showing the embodiment shown in FIG. 5A, in which an object beam path is shown. FIG. 6 shows an optical measurement system according to a further embodiment of the invention, in particular an OCT measurement beam path. FIG. 4 shows an optical measurement system according to a further embodiment of the invention, in particular an OCT beam path.

  FIG. 1A schematically shows an optical measurement system 1 according to an embodiment of the present invention. The measurement system 1 includes a light source 3 that generates measurement light 5. The measuring light 5 is collimated by a collimating optical member 7 in order to generate measuring light 9 consisting essentially of a plane wavefront. The measurement light 9 is reflected by the beam splitter 11 and traverses the junction element 13. The measuring light converged by the junction element 13 is deflected by 180 ° by a reflector 17 comprising two mirror surfaces 17 ′ and 17 ″ that are directed orthogonally to each other through the aperture 15. The light 9 is substantially deflected in the opposite direction and displaced in the lateral direction, that is, in a direction perpendicular to the propagation direction of the measuring light 9.

  In a further embodiment, the reflector 17 may be a corner cube. The corner cube includes a glass body having a triangular pyramid shape. The outer surface of the triangular pyramid consists of isosceles triangles and right triangles, and each pair of these triangles is oriented perpendicular to each other. Further, the corner cube has a reference surface in the shape of an isosceles triangle. When a corner cube is used in the measurement system, the measurement light 9 is reflected by the surfaces of three isosceles triangles and right triangles.

  The reflector 17 can be displaced in the direction indicated by the double arrow 20. The aperture 15 is disposed in the focal region of the bonding element 13 independently of the displacement position of the reflector 17.

  The measurement light 9 reflected by the reflector 17 traverses the junction element 19, thereby forming a converged measurement light. On the plane 21, the measurement light 9 is substantially converged at a certain point, that is, at an intersection, and continues to travel as divergent measurement light. The diverging measurement light 9 crosses the further junction element 23 and is transformed into a plane wavefront. The plane measurement light 9 crosses the quarter wave plate 24 and hits the eye 25 in the shape of a plane wavefront. The pupil of the human eye 25 is located on the object plane 28. The image of the iris is called the pupil of the eye 25. Generally, the pupil is located about 2.7 mm to 3 mm behind the top of the cornea 33. In this embodiment, the object plane 28 is located at the focal plane 29 of the first optical assembly 31 comprising the bonding element 23 and the bonding element 19. Therefore, the pupil of the eye 25 is located on the focal plane 29.

  The measuring light 9 traverses the cornea 33 of the eye 25 and the lens 35 and is focused on a spot 37 on the retina 39. In the beam splitter 11, the measurement light is a plane wavefront, that is, a bundle of parallel light beams. Only in the case of a normal eye without spherical aberration, the measuring light is imaged on a spot 37 on the retina of the eye 25 when the optical components are in a fixed position relative to each other. In this case, the reflector is positioned so that the entire system consisting of the three optical assemblies 23, 19 and 13 is an afocal system. However, if the eye has spherical aberration, a reflector along the direction indicated by the double arrow 20 in order to generate slightly convergent measuring light 9 or slightly diverging light 9 incident on the eye 25 17 or the corner cube 17 can be displaced respectively. Thereby, even if the eye has spherical aberration, it is possible to generate an irradiation spot of measurement light as small as possible on the retina. By displacing the corner cube 17 along the direction indicated by the double arrow 20, the optical path of the measurement light between the bonding element 13 and the bonding element 19 is changed. Therefore, when the spherical aberration of the eye 25 is within a specific range, the measurement light 9 can be focused on a point on the retina 39 of the refractive error eye 25.

  The irradiation spot 37 is a diffusion light source on the retina 39 of the eye 25 that emits light 41 having a substantially spherical wavefront. Light 41 traverses the vitreous, lens 35 and cornea 33 to form light 43. Depending on the optical characteristics and shape of the lens 35 and the cornea 33, the wavefront of the light 43 deviates from the plane wavefront. The shape of the wavefront forming the light 43 represents the refractive error of the optical component or interface of the eye 25, ie in particular the properties and shape of the lens 35 and the cornea 33.

  The light 43 traverses the junction element 23 and forms converged light. In the spatial region of the plane 21 where the image of the retina is formed, the light 43 converges to a minimum extent and then diverges. Further, the measurement light 43 traverses the junction element 19, is reflected by the reflector 17, is displaced laterally, passes through the aperture 15, traverses the junction element 13, and forms light having a substantially plane wavefront. . The deviation of the wavefront of the measurement light 43 from the plane wavefront represents a refractive error of the eye 25.

  The measuring light 43 enters the entrance region 45 of the Hartman-Shack sensor 47. The entrance region 45 is formed by an array of microlenses, and an electronic imaging sensor such as a CCD camera chip is disposed on a common focal plane of the microlenses. The electronic imaging sensor includes a plurality of pixels, each of which converts an incident light intensity value into an electrical signal. This electrical signal is transmitted via a data line 49 to a processing unit (not shown). For each microlens of the microlens array of Hartman-Shack sensors 47, the processing unit determines the displacement position of the light focused by each microlens. Thereby, it is possible to determine the shape of the wavefront of the measurement light 43 in the entrance region 45 of the Hartman-Shack sensor. With reference to FIG. 1B, it is described that the area of the focal plane 29 is imaged on the entrance area 45 of the Hartman-Shack sensor 47. Thereby, the shape of the wavefront of the light 43 emitted from the eye 25 can be determined. With reference to FIG. 1B, further properties and advantages of the optical measurement system 1 are described. The pupil of the eye 25 in the object plane 28 is arranged on the focal plane 29 of the first optical assembly 31 consisting of the junction elements 23 and 19. Three light beams 53a, 53b, 53c are emitted from the focal point 53 in the focal plane 29 along the object beam path, traverse the quarter wave plate 24 and the junction element 23, and to a minimum extent in the intermediate image region 55. To converge. The beam 53 is emitted from the intermediate image area 55 as a divergent beam, traverses the junction element 19 and exits the junction element 19 as substantially parallel beams 53a ', 53b', 53c '. The parallel beams 53a ', 53b', 53c 'are reflected by the reflector 17 and displaced laterally, pass through the aperture 15, cross the junction element 13, cross the beam splitter 11, and then converge to a certain point. Is done. This point is defined by the optical axis of the measurement system 1 and the entrance region 45 of the Hartman-Shack sensor 47. Thereby, a point in the focal plane 29 is imaged on a point in the entrance region 45 of the Hartman-Shack sensor 47. Displacement of the corner cube 17 along the direction indicated by the double arrow 20 does not change this imaging characteristic. This is because the light beam emitted from a point on the focal plane 29 is directed parallel between the junction element 19 and the junction element 13 and the reflector 17 is arranged in the beam path. Therefore, the shape of the wavefront emerging from the refractive error eye or the normal vision eye can be inspected very accurately.

  FIG. 1C schematically shows a part of the optical measurement system 1 of the embodiment shown schematically in FIGS. 1A and 1B according to the invention. Light beams 53 a, 53 b and 53 c are emitted from the focal point 51, traverse the junction element 23 and are focused on the intermediate image region 55. Three light beams are emitted from the intermediate image region 55 and deflected by the junction element 19 so as to form three parallel light beams 53a ′, 53b ′ and 53c ′ traveling in parallel to the optical axis 10. The joining elements 23 and 19 constitute the first optical assembly 31 as described above. The focal length f of the first optical assembly 31 may be determined as described below.

  The light beam 53a ′ parallel to the optical axis 10 spreads beyond the focal plane 29 in the direction toward the focal plane 29, as indicated by the dotted line 55a ′. Thus, the light beam 53b that is incident on the first optical assembly 31 and is transformed into the beam 53a 'after traversing the optical system 31 is spread beyond the focal plane 29 as indicated by the dotted line 55a. The line 55a and the line 55a ′ intersect at a point 57a. The point 57 a is located on the main plane 59 of the first optical assembly 31. The main plane 59 is located at a distance f from the focal plane 29 parallel to the main plane 59. A point 57c similar to the point 57a is also located on the main plane, and the point 57c is defined by the intersection of the lines 55c ′ and 55c. Thus, the light beams 53a and 53c appear to be refracted at points 57a or 57c located in the main plane 59, respectively. The light beams 53a and 53c travel parallel to the optical axis after traversing the first optical assembly 31.

  The light beams 53 a ′, 53 b ′ and 53 c ′ are reflected by the corner cube 17, schematically shown, and focused by the junction element 13 onto the entrance region 45 of the wavefront sensor 47. The entrance region 45 is formed by those surfaces of the microlens 46 located closest to the bonding element 13. Accordingly, the object region 28 ′ in the object plane 28 in the focal plane 29 of the first optical assembly 31 is imaged on the entrance region 45 of the wavefront sensor 47. Each of the microlenses 46 has a focal length 1. At a distance 1 from the entrance region 45 of the wavefront sensor 47, a CCD 48 for position sensitive detection of the light intensity is disposed. As described above, the wavefront shape of the measurement light emitted from the object region 28 ′ can be determined by detecting the light intensity distribution and the subsequent analysis. The object area 28 ′ in the focal plane 29 of the first optical assembly 31 is located at a distance d from the optical plane of the first optical assembly 31, and this optical plane is the optical plane closest to the focal area 29. It is. In the exemplary embodiment shown, the distance d is about 2.5 times the focal length f of the first optical assembly 31.

  The optical measurement system 1 is particularly suitable for eye surgery, particularly cataract surgery. The cornea or pupil of the eye during surgery is placed in the object region 28 '. The distance d between the cornea or pupil of the eye under examination and the components of the first optical assembly 31 is 220 mm in exemplary embodiment 1. Thus, the surgeon will have sufficient working space to perform the surgical procedure by hand.

  Example 1 of the optical measurement system shown in FIGS. 1A, 1B and 1C may be mounted in a fixed position relative to the optical microscope system. For example, the optical measurement system is supported upstream of the objective lens of the optical microscope system in the beam path of measurement light emanating from the object under examination. In this embodiment, the measuring light 43 emitted from the object area 28 ′ may be reflected by a folding mirror 61 which is schematically shown. After reflection by the foldable mirror 61, the measurement light crosses the first optical assembly 31, is reflected by the corner cube 17, crosses the junction element 13, and then enters the entrance region 45 of the wavefront sensor 47. The position of the folding mirror 61 is shown in FIGS. 1A and 1B. Another portion of the light emitted from the object region 28 'is directed through the objective lens of the microscope system for performing microscope imaging. Accordingly, the surgeon can obtain a microscopic image of the object under operation, and can analyze the shape of the wavefront of the measurement light emitted from the object region 28 '. According to an embodiment, the folding mirror 61 is located close to the objective lens of the microscope system. Thereby, the free working space is not reduced as much as possible.

  2A and 2B schematically show a further embodiment 1a of the optical measurement system according to the invention. Some components of the optical measurement system 1a are similar to the components of the optical measurement system 1 shown in FIGS. 1A, 1B and 1C. Accordingly, in the detailed description of these components, reference is made to the corresponding description of the first embodiment. For example, the junction elements 19a and 13a of Example 1a correspond to the junction elements 19 and 13 of Example 1. Furthermore, the light source 3, the collimating optical member 7, and the wavefront sensor 47 of the first embodiment correspond to the light source 3a, the collimating optical member 7a, and the wavefront sensor 47a of the first embodiment.

  Unlike Example 1 of the optical measurement system including the joining element 23 shown in FIGS. 1A, 1B, and 1C, Example 1a shown in FIGS. 2A and 2B includes a lens system 63a and a lens system 65a. A lens group 23a. Further, the embodiment 1a does not include the reflector 17 or the corner cube 17 as in the case of the embodiment 1. On the contrary, the aperture 15a, the joining element 13a, the beam splitter 11a, the collimating optical member 7a, the light source 3a, and the wavefront sensor 47a are arranged at fixed positions with respect to each other, along the optical axis 10a of the measurement system 1a. They may be displaceable together in different directions. This is indicated by a dotted box 67a which is displaceable along the direction indicated by the double arrow 69. As described with reference to the first embodiment shown in FIGS. 1A, 1B, and 1C, the junction elements 19 and 13 of the measurement light incident on the object region 28 ′ and the measurement light 43 emitted from the object region 28 ′. Alternatively, the spherical aberration of the eye 25 under examination can be compensated by changing the respective optical paths between the bonding elements 19a and 13a. This compensation achieves measurement light illumination and wavefront analysis exiting the eye 25. Thereby, the dynamic measurement range of the wavefront sensor 47 can be expanded.

  Instead of providing a displaceable unit 67a for this purpose in this embodiment, a configuration may be provided by using the reflector 17 or the corner cube 17 shown in FIGS. 1A and 1B, respectively, in a corresponding manner. Therefore, the first embodiment of the optical measurement system shown in FIGS. 1A, 1B, and 1C may not include the reflector 17. Instead, as shown in FIGS. 2A and 2B in a corresponding manner, the component aperture 15, the junction element 13, the beam splitter 11, the collimating optical member 7, the light source 3 and the wavefront sensor 47 are fixed with respect to each other. Are designed to be displaceable together along the optical axis 10. These components may also be designed so that they are not displaceable. If these components are not displaceable, a wavefront sensor 47 having a large dynamic range is provided. This is because in this case, pre-compensation is not possible when inspecting an eye having spherical aberration.

  The cornea 33 or pupil of the eye 25 of the normal eye that does not have spherical aberration is disposed in the object region 28 'of the object plane 28a in the focal plane 29a. The light 5a generated by the light source 3a is deformed by the collimating optical member 7a into measurement light 9 having a substantially plane wavefront. The measurement light 9 is reflected by the beam splitter 11a, traverses the junction element 13a, passes through the aperture 15a, passes through the intersection, crosses the junction element 19a, passes through the intersection of the measurement light 9 on the plane 21a, and passes through the lens system. After crossing 65a and crossing the lens system 63a, it enters the eye 25 as a plane wavefront. A refractive-abnormal eye having no spherical aberration focuses the measuring light 9 on the point 37 of the retina 39 of the eye 25. A spherical wavefront is emitted from the point 37, traverses the vitreous body, the lens 35 and the cornea 33, and then comes out as measurement light 43 having a plane wavefront in the object region 28 ′. The measurement light 43 traverses the lens system 63a, traverses the lens system 65a, traverses the junction element 19a, traverses the junction element 13a, traverses the beam splitter 11a, and enters the wavefront sensor 47a. Therefore, a CCD detector (not shown) records the light distribution to determine the shape of the wavefront of the measurement light 43 emitted from the object region 28 '.

  The working distance d between the object region 28 'and the surface of the lens system 63a located closest to the object region 28' is that of the first optical assembly 31a comprising the lens system 63a, the lens system 65a, and the joining element 19a. It is about 3 times the focal length f. Thereby, the optical measurement system embodiment 1a provides a sufficiently large working distance d to provide sufficient free working space for performing the surgery.

  FIG. 2B shows an example 1a of an optical measurement system in which the object beam path, ie the beam path emanating from the object plane 28a, is shown to demonstrate further properties of the measurement system 1a. The pupil of the eye 25 is located in the object plane 28 in the example shown using the optical measurement system 1a to investigate the eye 25. Accordingly, the object beam path corresponds to the pupil beam path. The light beams 53a, 53b and 53c of the light 43 emitted from the focal point 51a are transformed into light beams 53a ", 53b" and 53c "by the lens system 63a, each of which is parallel to the optical axis 10a of the optical measurement system 1a. The focal point 51a is also located in the object region 28a ', and therefore the distance between the main plane 63a' of the lens system 63a and the object region 28a 'is equal to the focal length f (63a) of the lens system 63a. The focal length f (63a) of the lens system 63a substantially corresponds to the working distance d between the object region 28a ′ and the surface of the lens system 63a located closest to the object region 28a ′. And the junction element 19a are arranged at a distance along the optical axis 10 corresponding to the sum of their focal lengths, ie, f (65a) + f (19a). Accordingly, the lens system 65a and the joining element 19a constitute a so-called Keplerian telescope, which is an example of an afocal system that transforms a parallel incident light beam into a parallel outgoing light beam. The light beams 53a ", 53b" and 53c "are transformed into parallel light beams 53a ', 53b' and 53c 'by the lens system 65a and the joining element 19a. The light beams 53a ', 53b' and 53c 'are focused on the entrance region 45a of the wavefront sensor 47a after traversing the junction element 13a. Thereby, the object region 28a 'is imaged on the entrance region 45a of the wavefront sensor. Since the light beam between the junction element 19a and the junction element 13a is parallel, such imaging is independent of the change in the optical path of the measurement light between the junction elements 19a and 13a. Such a change is accomplished by displacing system 67a along the direction indicated by arrow 69.

  FIG. 3 shows a further embodiment 1b of the optical measurement system according to the invention. The structures and orientations of elements 63b, 65b, 19b, 13b, 11b, 7b, 3b and 47b are relative to each other, with elements 63a, 65a, 19a, 13a, 11a, 7a, 3a and 47a shown in FIGS. 2A and 2B. Substantially correspond to the structure and relative arrangement of each. Compared to the embodiments shown and described so far, the optical measurement system 1b comprises further lens elements 71, 73 and 75, which further comprise a lens system 63b, a lens system 65b. And the object region 28b 'in the focal plane 29b of the first optical assembly 31b composed of the bonding element 19b. The focal length of the lens element 71 is 40 mm, the focal length of the lens element 73 is 18.5 mm, and the focal length of the lens element 75 is 75 mm. These lens elements 71, 73 and 75 are arranged for examining the aphakic eye 25, ie the eye from which the lens has been removed and is therefore omitted in FIG. Shown are light beams 43a, 43b and 43c that diverge from the point 37 of the retina 39 of the eye 25 and exit the eye 25. In the example shown, the aphakic eye has 19 diopters. The diverging light beams 43a, 43b and 43c emitted from the object region 28b 'and exhibiting a spherical wavefront are imaged as parallel wavefronts on the wavefront sensor entrance region 45b by the optical imaging system of the optical measurement system 1b. . Thereby, the dynamic measurement range of the wavefront sensor 47 can be further increased by inserting the lens elements 71, 73 and 75 so that even aphakic eyes can be inspected in consideration of spherical aberration and aspheric aberration. . Lens elements 71, 73 and 75 may also be provided in the embodiments shown in FIGS. 1A, 1B, 1C, 2A and 2B.

  FIG. 4 shows a further embodiment 1c of the optical measurement system according to the invention. The optical measurement system 1 c includes a wavefront analysis system 77 and an optical microscope system 79. Many of the components of the wavefront analysis system 77 have a similar structure and similar relative orientation as the optical measurement system 1a shown in FIGS. 2A and 2B. Therefore, a detailed description of these components is omitted. The lens system 63a of the optical measurement system 1a is also the objective lens 63c of the optical microscope system 79 in the optical measurement system 1c. In the embodiment shown in FIG. 4, the diameter of the objective lens 63c is 53 mm. The light beams 43a, 43b and 43c, which are emitted as parallel beams from the object region 28c 'in the focal plane 29c of the first optical assembly 31c forming the plane wavefront, consisting of the lens system 19c, the lens system 65c and the objective lens 63c. Crosses the first optical assembly 31c, the junction element 13c, and the beam splitter 11c, and then enters the wavefront sensor 47c as a plane wavefront. A parallel light beam emanating from the object region 28c 'and thus not exhibiting a plane wavefront enters the wavefront sensor 47c as a non-planar wavefront. As described above, the shape of such a non-planar wavefront may be determined by detecting the intensity distribution with the wavefront sensor 47c and by subsequent analysis.

  Furthermore, the optical measurement system 1c makes it possible to acquire a microscope image of the object region 28c ′. Light beams 81 and 83 are emitted from a point 51 in the object region 28c ′ in the focal plane 29c of the first optical assembly 31c (and the objective lens 63c). The light beams 81 and 83 form a solid angle α. The light beam 81 crosses the region 85 of the objective lens 63c, and the light beam 83 crosses the region 87 of the objective lens 63c, and then propagates as a parallel light beam. The light beam 81 then traverses the zoom system 89 and the light beam 83 traverses the zoom system 91. A visual system and / or a camera for imaging the object region 28c ′ in the image region may be located downstream of the objective lens 63c.

  In the example shown, the distance d between the surface of the objective lens 63c closest to the object area 28c 'and the object area 28c' is 20 cm. In the example shown, this distance corresponds to the focal length f (63c) of the objective lens. Further embodiments comprise an objective lens with a focal length of 15 cm or 25 cm. The focal length f of the optical assembly 31c consisting of the lens system 19c, the lens system 65c and the objective lens 63c is about 70 mm in the embodiment shown. Thereby, a sufficiently large working space is provided for performing a surgical operation and the focal length f is much smaller.

  In the optical measurement system embodiment 1c shown in FIG. 4, the light beams 43a, 43b and 43c used for wavefront analysis traverse the objective lens 63c of the optical microscope system 79. The objective lens 63c is traversed in a region 86 of the objective lens 63c different from the regions 85 and 87 through which the light beams 81 and 83 used for microscope imaging pass. The light beams 43a, 43b and 43c used for wavefront analysis are separated from further components of the optical microscope system 79 by a folding mirror 61c.

  As an alternative to this separation method, the light beams 43a, 43b and 43c may be separated between the object region 28c ′ and the objective lens 63c of the optical microscope system 79 by a folding mirror 61 indicated by a dotted line. Good. Thereby, Example 1 of the optical measurement system shown in FIGS. 1A, 1B and 1C may be combined with the optical microscope system 79 or Example 1d shown in FIGS. 5A and 5B. This is illustrated in FIGS. 1A, 1B, 5A and 5B by a folding mirror 61. FIG.

  Instead of simultaneously displacing the components that the box 67c of the wavefront analysis system 77 surrounds, by providing a displaceable corner cube 17 as shown in FIGS. 1A and 1B, a space between the lens system 19c and the junction element 13c is provided. The optical path may be changed. This method of precompensating the spherical aberration of the eye under examination may be used in combination with the separation of the measuring light 47 by the folding mirror 61 c and the separation of the measuring light 43 using the folding mirror 61.

  The optical measurement system 1c provides a microscopic image of the anterior chamber of the eye to the surgeon and at the same time allows the wavefront of the measurement light emitted from the eye to be analyzed. Thereby, an accurate measurement of refraction is possible using a wavefront sensor. Due to the large working space, the wavefront analysis system does not need to be removed during the surgery and does not need to be inserted when needed. Thereby, handling is greatly simplified and there is no need to pivotally support the wavefront analysis system.

  The object region 28c ′ is also located on the focal plane of the objective lens 63c. Downstream of the objective lens 63c, the light beams 81 and 83 emitted from the point 51 of the object region 28c ′ are parallel, which provides further advantages for subsequent components and microscopic imaging. The wavefront analysis system 77 of the optical measurement system 1c is provided with further lens elements 71, 73 and 75, similar to the optical measurement system embodiment 1b shown in FIG. 3, for analyzing the wavefront emerging from the aphakic eye. May be. Thus, it is possible to examine an eye with 14 diopters, 19 diopters, 24 diopters, and spherical aberrations with values in between. When the lens elements 71, 73 and 75 are not provided, the optical path between the elements 13 and 19, the optical path between the elements 13a and 19a, or the optical path between the elements 13c and 19c is changed, respectively. The eye having the spherical aberration in the range of at least −5 dpt to +5 dpt can be inspected.

  The Keplerian telescope constituted by the lens system 65a and the junction element 19a shown in FIGS. 2A and 2B may be replaced with a Galilean telescope or another afocal system.

  According to an embodiment, the entrance area of the wavefront sensor has a range of 6.34 mm * 6.34 mm. In alternative embodiments, other ranges may be given. Each of the light sources 3, 3a, 3b, and 3c generally includes a super luminescence diode and serves as a point light source. The optical measurement system 1c may also be designed such that the optical path is variable for pre-compensation of spherical aberration. An optical element that interacts with the polarization of light, such as a quarter wave plate or a beam splitter configured as a polarizing beam splitter, is generated on the optical surface from the measurement light emitted from the illumination spot 37 on the retina 39. It may be used to separate reflected light.

  5A and 5B schematically show a further embodiment of an optical measurement system 1d according to the present invention. Again, the illumination beam path or wavefront beam path is shown in FIG. 5A and the object beam path is shown in FIG. 5B. The optical measurement system 1d includes a first optical assembly 31d which is a bonding element in this embodiment, a second optical assembly 13d which is a bonding element in this embodiment, and a wavefront sensor 47d.

  In order to irradiate the eye 25, the optical measurement system 1d further includes a light source 3d that emits light 5d. The light 5d is converted into the converged measurement light 9 by the beam shaping optical member 7d, reflected by the beam splitter 11d, and then focused on the area of the aperture 12d. When inspecting a normal eye, the aperture 12d is disposed on the focal plane of the bonding element 31d. The measurement light 9 substantially includes a plane wavefront that enters the eye 25 after traversing the junction element 31d. The measurement light 9 passes through the cornea 33 and the lens 35 and is then focused on the point 37 of the retina 39.

  Light 41 is emitted from point 37 and forms measurement light 43 after traversing lens 35 and cornea 33. In the case of a normal eye, the measurement light 43 substantially has a plane wavefront. The pupil of the human eye is placed on the object plane 28d in the object region 28d ′. In FIG. 5A, the distance between the object plane 28d and the bonding element 31d is represented as a distance d, and the focal length of the bonding element 31d is represented as a distance f. The measurement light 43 emitted from the object region 28d ′ crosses the junction element 31d, passes through the intersection in the plane of the aperture 12d, crosses the beam splitter 11d, crosses the junction element 13d, and in the case of a normal eye It hits the entrance area 45d of the wavefront sensor 47d as a plane wavefront.

  The joining element 31d and the joining element 13d constitute an afocal system, particularly a Kepler system. To achieve this, the junction element 31d and the junction element 13d are arranged at a distance along the optical axis 10d, and this distance corresponds to the sum of the focal lengths of the junction element 31d and the junction element 13d.

  Displacement of components (ie, the light source 3d, the beam shaping optical member 7d, the beam splitter 11d, and the aperture 12d) along the optical axis 10d surrounded by the box 14d as indicated by the double arrow 16d has spherical aberration. Even when examining the eye, it is possible to generate an illumination spot 37 having a small area on the retina 39 of the eye 25. In this case, the measurement light 43 emitted from the object region 28d ′ is not formed by a substantially plane wavefront. This also applies to the measurement light incident on the entrance region 45d of the wavefront sensor 47d. Therefore, it is possible for the wavefront sensor 47d used in Example 1d to measure a wavefront having a relatively small curvature.

  FIG. 5B shows the object beam path of the optical measurement system 1d. The light beam emitted from the point 28d ″ in the object area 28d ′ in the object plane 28d crosses the junction element 31d, the beam splitter 11d, and the junction element 13d and hits the point 45d ′ in the entrance area of the wavefront sensor 47d. Obviously, the distance d between 31d and the object plane 28d is much larger than the focal length f of the junction element 31d.

  The optical measurement system 1d may include a folding mirror 61 that allows the optical measurement system 1d to be combined with an optical microscope system 79 as shown in FIG. FIG. 4 schematically shows the position of the folding mirror 61.

  FIG. 6 schematically shows an optical measurement system 1e according to an embodiment of the present invention. The optical measurement system 1e shown in FIG. 6 is configured to inspect the object region 28e 'by analysis of wavefronts emanating from the object region and by optical coherence tomography (OCT). To this effect, the measurement system 1e shown in FIG. 6 includes an OCT system 93 and an OCT beam splitter 95 in addition to the measurement system 1 shown in FIGS. 1A and 1B. The OCT system 93 includes an OCT light source for generating the OCT measurement light 99, an optical coupler for dividing and combining the OCT measurement light, a reference mirror, a spectrometer, a position sensitive detector, An OCT component 97 comprising an analysis system is provided.

  The OCT light source emits OCT measurement light 99, which enters the scanner with two scanning mirrors 103 and 105 as a collimated OCT measurement light beam across the collimating optical member 101. . The scanning mirrors 103 and 105 are pivotable about axes that are oriented perpendicular to each other in order to scan the OCT measuring beam 99 on the object region 28e '. For illustrative purposes, in FIG. 6, elements 97, 101 and 103 are shown tilted about the connection line between the two scanning mirrors 103 and 105. The OCT measurement light 99 may have a wavelength of light of 1290 nm to 1330 nm as a major part.

  FIG. 6 shows the scanning mirror when the scanning mirror is positioned at three different rotational positions obtained by rotating the rotational mirror about a rotational axis that is directed perpendicular to the paper surface and intersects the point A. Three light beams of OCT measurement light reflected at 105 points A are shown in an exemplary manner. The light beam of the OCT measurement light 99 enters an OCT beam splitter 95 including a dichroic mirror 96. The dichroic mirror 96 includes layers deposited on the mirror surface of the dichroic mirror 96, and these layers reflect the incident OCT measurement light 99 with high efficiency and transmit a small part such as less than 30%. And have different dielectric properties. The OCT measurement light 99 is reflected by the dichroic mirror 96 and then traverses the lens 19e. For example, the lens 19e may be designed as a cemented element and an additional individual lens. Next, the OCT measurement light 99 crosses the bonding element 23e. The joining element 23e and the lens 19e constitute a first optical assembly 31e. The first optical assembly 31e connects the center point A of the scanning mirror 105 on the point A 'between the first optical assembly 31e and the object region 28e' where the focal point 51e of the first optical assembly 31e is located. Image. Similarly, the center point P of the connection line between the scanning mirror 103 and the scanning mirror 105 is imaged on the point P ′ by the first optical assembly 31e. In this position, an optional folding mirror 61 may be positioned to deflect the OCT measurement light 99 propagating toward the object region 28e 'and the OCT measurement light returning from the object region 28e'. This may be advantageous when the optical measurement system 1e is used in combination with an optical microscope. In this case, the folding mirror 61 may be arranged between the main objective lens of the microscope and the object region 28e ′ in the beam path of the microscope.

  In particular, in such a case, it is advantageous for the optical measurement system 1 e to image the point P on the point P ′ located on the folding mirror 61. This is because the walk-off of the point P ′ from the center of the folding mirror 61 is minimized at different rotational positions of the mirrors 103 and 105. Therefore, it is possible to design the folding mirror 61 that is compact in size so as to prevent kicking of the beam path of the microscope. To achieve this, the scanning mirrors of the scanner (scanning mirrors 103 and 105 in this case) must all be placed as close as possible to point P, and the folding mirror 61 is as close as possible to point P ′. Must be located.

  Three light beams of OCT measurement light corresponding to three different rotational positions of the scanning mirror 105 are incident at three different points in the object region 28 'interacting with an object arranged in the object region 28e'. FIG. 6 shows only three scanning points. However, the entire object region 28e ′ is scanned by continuously rotating the scanning mirrors 103 and 105.

  The OCT measurement light emitted from the object region 28e 'is reflected by different layers within the object, thereby including structural information of the object under inspection. The reflected OCT measurement light 100 crosses the bonding element 23e and the lens 19e, and most of the reflected light is reflected by the dichroic mirror 96 of the OCT beam splitter 95. After further reflection at the scanning mirrors 105, 103, the return OCT measurement light traverses the collimating optical member 101 and enters an optical fiber (not shown) of the OCT component 97. The return OCT measurement light is then superimposed on the reference light, spectrally dispersed by a spectrometer, and detected by a position sensitive detector. The spectrum of the return OCT measurement light superimposed on the reference light by the interferometry obtains structural information from the object region 28e ′ in the lateral direction of the object under inspection along the depth direction, that is, perpendicular to the object surface 28e. To be processed.

  Like Example 1 of the optical measurement system shown in FIGS. 1A and 1B, the optical measurement system 1e shown in FIG. 6 also includes components for analyzing the wavefront described above. For the sake of simplicity of illustration, FIG. 6 shows the beam paths of the measuring light 9 and the returning measuring light 43 guided through the joining element 13e, the lens 19e and the joining element 23e towards the object region 28e '. Absent. These beam paths are shown in FIGS. 1A and 1B, and in the embodiment of the optical measurement system 1e shown in FIG. 6 from FIGS. 1A and 1B, the object region 28 ', in particular the first optical assembly, is also shown. It can be seen that the focal point 51e of 31e is imaged on the entrance region 45e of the Hartman-Shack sensor 47e.

  Thus, Example 1e allows the object region 28 'to be examined simultaneously by analyzing the wavefront emanating from this region and by acquiring OCT structure data. In particular, the wavefront light source 3e may be configured such that the central portion of the measurement light generated by the light source 3e is located within a wavelength range of about 830 nm to 870 nm. The OCT beam splitter 95, particularly its dichroic mirror 96, is designed to transmit a substantial portion of light in the wavelength range of about 830 nm to 870 nm. Thereby, it is possible to separate the OCT measurement light from the measurement light for inspecting the wavefront for the purpose of reducing interference.

  According to a further embodiment, no reflector 17e is provided between the lens 19e and the junction element 13e, so that the beam path of the measuring light 9, 43 used for wavefront analysis is the junction element 19e, It propagates linearly along the optical axis of 23e, that is, the optical axis of the first optical assembly 31e without being deflected.

  According to a further embodiment of the present invention, the OCT beam splitter 95 is not positioned between the first optical assembly 31e and the second optical assembly 13e, but instead of the second optical assembly 13e and the Hartmann-Shack sensor 45e. Between the two. This is indicated by the dotted box 95a. Thus, the OCT system 93 is shown as a dotted box with reference number 93a as an alternative. This embodiment is advantageous when obtaining structural information from the back of the eye using an OCT system. This configuration of the OCT beam splitter 95a or the OCT system 93a may be used particularly when the optical measurement system does not have the reflector 17e as described above.

  FIG. 7 schematically shows an optical measurement system 1f according to a further embodiment of the invention. The optical measurement system 1f shown in FIG. 7 is designed in a manner similar to the optical measurement system 1c shown in FIG. 4 as long as the optical measurement system 1f also includes components 67c of the wavefront analysis system 77 and a microscope system 79. . The microscope system 79 includes an objective lens 63c for imaging the object region 28c 'located at the focal plane 29c after traversing the zoom systems 89 and 91. Also, the wavefront analysis system 77 can inspect wavefronts originating from or traversing the object region 28c 'in view of their shape as described with reference to FIG. Designed.

  In addition to the functions of the optical measurement system 1c shown in FIG. 4, the optical measurement system 1f shown in FIG. 7 uses the OCT system 93a to make the object region along the depth direction, ie perpendicular to the focal plane 29c. 28c 'structure can be inspected. To this effect, the OCT system 93a includes similar components as the OCT system 93 shown in FIG.

  FIG. 7 schematically shows a beam path of the OCT measurement light 99a at three different rotational positions of the scanner including the scanning mirrors 103a and 105a. For simplicity of illustration, OCT measurement light 99a emitted from the point P between the scanning mirrors 103a and 105a in three different directions is shown. Alternatively, the center of the three-dimensional scanner may be arranged at this point P. If the scanner has more than one mirroring surface, the point P is advantageously arranged so that the distance to the mirror surface of the scanner is minimized.

  The light beam of the OCT measurement light 99 emitted from the point P is reflected by the scanning mirror 105a, mostly reflected by the dichroic mirror 96a, crosses the afocal system composed of the junction element 19c and the junction element 65c, and is folded. An image is formed on a point P ′ arranged at the center of the mirror 61c. Point P is through the junction element 19c, ie the second optical subassembly of the first optical assembly 31c, and through the junction lens 65c, ie the second lens group of the first optical subassembly of the first optical assembly. Then, an image is formed on a point P ′ located at the center of the folding mirror 61c. Therefore, the walk-off of the point P ′ is minimal for the different rotational positions of the scanner comprising the scanning mirrors 105a and 103a. In the case of an ideally positioned 3D scanner with only one reflecting surface, it is expected that there will be no beam walk-off. As a result, the folding mirror 61c having a compact size can be designed so that the beam paths of the microscopes 81 and 83 can pass through the folding mirror 61 and enter the respective zoom systems of the stereoscopic microscope system 79. .

  As an alternative to the configuration of the OCT beam splitter 95a and the OCT system 93a shown in FIG. 7, these components or at least the OCT beam splitter 95a may be disposed between the junction element 65c and the folding mirror 61c.

  As an alternative to the embodiment shown in FIGS. 6 and 7, OCT beam splitters 95, 95a or dichroic mirrors 96, 96a allow OCT measurement light 99, 99a to be transmitted with greater effectiveness than is reflected. May be designed. They may also be designed such that the measuring light 9 used for wavefront measurement is reflected with higher effectiveness than it is transmitted. Thus, in an alternative embodiment, the spatial arrangement of the wavefront analysis system 77 and the OCT systems 93, 93a can be compatible.

  According to a further embodiment of the invention, the wavelength range comprising 70% of the total intensity of the OCT measurement light may overlap with the wavelength range comprising 70% of the total intensity of the measurement light for inspecting the wavefront. Thereby, light in the same wavelength range can be used for inspecting the wavefront and for inspection using OCT light. In this case, the OCT beam splitters 95 and 95a having the dichroic mirrors 96 and 96a are unnecessary. In this case, it is advantageous to continue the measurement for determining the wavefront and the measurement for determining the structure using OCT. Thereby, interference is prevented. However, an optical element having a polarization effect, such as a quarter-wave plate, in which both measurements can be performed simultaneously, may be inserted into the beam path. For example, the elements 11, 11a, 11b, 11c, 11d, and 11e may be configured as polarization beam splitters.

  According to a further embodiment, the light beam of the OCT measuring beam 99 is not focused on the object areas 28c ', 28e' but on a deeper area such as on the retina of the eye under examination. Is done.

Claims (35)

A measurement system for ophthalmic surgery,
A wavefront sensor (47) for characterizing the shape of the wavefront of the measuring beam (43) in the entrance region (45) of the wavefront sensor;
Imaging optics comprising a first optical assembly (31) and a second optical assembly (13) for imaging an object region (28 ') on the entrance region of the wavefront sensor using measuring light (43) Members (13, 19, 23),
1.1 * f ≦ d is established,
o represents the focal length of the first optical assembly (31) and d represents the distance between the object region (28 ') and the first optical assembly (31). system.   The measurement system for ophthalmic surgery according to claim 1, wherein a relationship of 1.5 * f ≦ d, particularly 2 * f ≦ d is established.   The measurement system for ophthalmic surgery according to claim 1, wherein a relationship of d ≧ 150 mm, particularly d ≧ 175 mm, and more particularly d ≧ 190 mm is established.   Measurement system for ophthalmic surgery according to any of the preceding claims, wherein at least one of the first optical assembly (31) and the second optical assembly is a refractive optical assembly, in particular a lens group. .   A third optical assembly (89, 91) arranged and designed to image the object area (28 ') on the image area along a microscope beam path, the image area comprising the wavefront; The measurement system for ophthalmic surgery according to any of the preceding claims, wherein the measurement system is different from the entrance region (45) of the sensor.   The measurement system for ophthalmic surgery according to any of the preceding claims, wherein the object area (28 ') is located in a focal area (29) of the first optical assembly.   The measurement system for ophthalmic surgery according to claim 6, wherein the first optical assembly comprises a first optical subassembly (23) and a second optical subassembly (19) arranged at a distance from each other. Optical paths (OP; OP ₁ , OP ₂ ) traversed by the measurement light along the beam path of the measurement light between the first optical assembly (31) and the second optical assembly (13) are The measurement system for ophthalmic surgery according to claim 6 or 7, wherein the measurement system is variable. The measurement system changes the optical path (OP; OP ₁ , OP ₂ ) between the first optical assembly (31) and the second optical assembly (13) to thereby change the object region (28). The measurement system for ophthalmic surgery according to claim 8, which is designed such that the shape of the wavefront of the measurement light emitted from an eye having a refractive error of −5 dpt to +25 dpt arranged in ′) can be characterized.   In particular, it further comprises a reflector for deflecting the measurement light by 180 °, the reflector being adapted to change the first optical in the beam path of the measurement light in order to change the traversed optical path of the measurement light. The measurement system for ophthalmic surgery according to claim 8 or 9, wherein the measurement system is displaceably arranged between an assembly (31) and the second optical assembly (13).   The measurement system for ophthalmic surgery according to claim 10, wherein the reflector includes at least two mirror surfaces arranged at an angle different from zero.   11. The ophthalmic surgical measurement system according to claim 10, wherein the reflector comprises a retroreflector (17), in particular a corner cube.   The beam splitter (11) disposed between the entrance region (45) of the wavefront sensor (47) and the second optical assembly (13) in the beam path of the measurement light. To 12. The measurement system for ophthalmic surgery according to any one of 1 to 12. The relationship d (1,2) ≧ f1 * d / (d−f1) is established,
d (1,2) represents the distance between the components of the first optical subassembly (23) and the components of the second optical subassembly (19), and f1 represents the first optical subassembly (23). An ophthalmic surgical measurement system according to any of claims 7 to 13, in combination with claim 7, representing the focal length of the optical subassembly (23).   The first optical subassembly (23) comprises a first lens group (63c), in particular an objective lens, and a second lens group (disposed at a distance from the first lens group (63c)). The measurement system for ophthalmic surgery according to any of claims 7 to 14, in combination with claim 7, further comprising 65c).   The microscope beam path traverses the first lens group (63c) of the first optical subassembly and the third optical assembly comprises a zoom system (89, 91). The measurement system for ophthalmic surgery according to claim 15.   A mirror surface (61c) is disposed between the first lens group (63c) and the second lens group (65c) of the first optical subassembly (23c) in the beam path of the measurement light. The measurement system for ophthalmic surgery according to claim 15 or 16.   The second lens group (65c) and the second optical subassembly (19c) of the first optical subassembly together constitute an afocal system, in particular a Kepler system. The measurement system for ophthalmic surgery according to 1.   The measurement system for ophthalmic surgery according to any of claims 15 to 18, wherein the object region is arranged in a focal region of the first lens group (63c) of the first optical subassembly (23c).   The third optical assembly includes an objective lens (63c) and a zoom system (89, 91), and the beam path of the measurement light does not cross the objective lens, and is in the beam path of the measurement light. The ophthalmologic according to any one of claims 6 to 14, in combination with claim 5, wherein a mirror surface (61) is arranged between the object region (28c ') and the first optical subassembly (23c). Surgical measurement system.   The measurement system for ophthalmic surgery according to claim 20, wherein the object region is arranged in a focal region of the objective lens.   The measurement system for ophthalmic surgery according to any of claims 1 to 5, wherein the object area (28d ') is different from the focal area (29d) of the first optical assembly (31d).   The measurement system for ophthalmic surgery according to claim 22, wherein the first optical assembly (31d) and the second optical assembly (13d) constitute an afocal system, in particular a Kepler system.   24. A beam splitter (11d) is displaceably disposed between the first optical assembly (31d) and the second optical assembly (13d) in the beam path of the measuring light. The measurement system for ophthalmic surgery according to 1.   The measurement system for ophthalmic surgery according to any of claims 22 to 24, wherein a mirror surface (61) is arranged between the first optical assembly (31d) and the object region (28d ').   An OCT system having an OCT light source for generating OCT measurement light is further provided, and the OCT measurement light is guided through at least the first optical assembly (31) to illuminate the object region (28 '). As described, in the OCT beam path of the OCT measurement light, between the first optical assembly (31) and the second optical assembly (13) or between the second optical assembly (13) and the wavefront sensor. 26. A measurement system for ophthalmic surgery according to any of the preceding claims, wherein an OCT beam splitter is arranged between the entrance region (45).   27. The ophthalmic surgical measurement system according to claim 26, further comprising at least one pivotable scanning mirror disposed in the OCT beam path between the OCT light source and the OCT beam splitter.   In the scanning mirror, the second lens group (65c) and the second optical subassembly (19c) of the first optical subassembly (23), a region close to the scanning mirror is the mirror surface (61c). 28. The ophthalmic surgical measurement system according to claim 27, in combination with claim 15 and claim 17, designed and arranged to be imaged on an area close to.   2. A wavefront light source for generating the measurement light (9) is further provided, and at least 80% of the total intensity of the generated measurement light consists of light having a wavelength of 800 nm to 870 nm, in particular 820 nm to 840 nm. 30. The measurement system for ophthalmic surgery according to any one of items 1 to 28.   30. The measurement system for ophthalmic surgery according to any one of claims 26 to 29, wherein at least 80% of the total intensity of the generated OCT measurement light is composed of light having a wavelength of 1280 nm to 1320 nm, particularly 1300 nm to 1320 nm.   The OCT beam splitter includes a dichroic mirror, and the transmittance of the OCT beam splitter in the wavelength range of 800 nm to 870 nm, particularly 820 nm to 840 nm is at least 2 of the transmittance in the wavelength range of 1280 nm to 1340 nm, particularly 1300 nm to 1320 nm. 31. The ophthalmic surgical measurement system according to any one of claims 26 to 30, wherein the measurement system is double or exactly half height.   The OCT beam splitter includes a dichroic mirror, and the reflectance of the dichroic mirror in the wavelength range of 1280 nm to 1340 nm, particularly 1300 nm to 1320 nm is at least twice the reflectance in the wavelength range of 800 nm to 870 nm, particularly 820 nm to 840 nm. The measurement system for ophthalmic surgery according to any one of claims 26 to 31, which is at least half the height.   The measurement system for ophthalmic surgery according to any one of claims 26 to 32, wherein at least 70% of the intensity of the OCT measurement light incident on the OCT beam splitter is reflected by the OCT beam splitter.   34. The ophthalmic surgical measurement system according to any of claims 26 to 33, wherein at least 70% of the intensity of the measurement light (9) incident on the OCT beam splitter is transmitted through the OCT beam splitter.   35. At least 60%, in particular at least 80% of the total intensity of the measuring light (9) consists of light in the wavelength range in which 80% of the total intensity of the OCT measuring light is located. The measurement system for ophthalmic surgery according to 1.

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