JP2012228525A5 - - Google Patents

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Publication number
JP2012228525A5
JP2012228525A5 JP2012144204A JP2012144204A JP2012228525A5 JP 2012228525 A5 JP2012228525 A5 JP 2012228525A5 JP 2012144204 A JP2012144204 A JP 2012144204A JP 2012144204 A JP2012144204 A JP 2012144204A JP 2012228525 A5 JP2012228525 A5 JP 2012228525A5
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JP
Japan
Prior art keywords
evoked potential
signal data
assr
processing unit
estimation processing
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JP2012144204A
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English (en)
Japanese (ja)
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JP2012228525A (ja
JP5553088B2 (ja
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Priority to JP2012144204A priority Critical patent/JP5553088B2/ja
Priority claimed from JP2012144204A external-priority patent/JP5553088B2/ja
Publication of JP2012228525A publication Critical patent/JP2012228525A/ja
Publication of JP2012228525A5 publication Critical patent/JP2012228525A5/ja
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Publication of JP5553088B2 publication Critical patent/JP5553088B2/ja
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JP2012144204A 2006-09-27 2012-06-27 誘発電位検査装置及び誘発電位検査システム Active JP5553088B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012144204A JP5553088B2 (ja) 2006-09-27 2012-06-27 誘発電位検査装置及び誘発電位検査システム

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2006262220 2006-09-27
JP2006262220 2006-09-27
JP2007052088 2007-03-01
JP2007052088 2007-03-01
JP2012144204A JP5553088B2 (ja) 2006-09-27 2012-06-27 誘発電位検査装置及び誘発電位検査システム

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2008536389A Division JP5099453B2 (ja) 2006-09-27 2007-09-26 誘発電位検査装置及び誘発電位検査システム

Publications (3)

Publication Number Publication Date
JP2012228525A JP2012228525A (ja) 2012-11-22
JP2012228525A5 true JP2012228525A5 (https=) 2013-09-26
JP5553088B2 JP5553088B2 (ja) 2014-07-16

Family

ID=39230086

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2008536389A Active JP5099453B2 (ja) 2006-09-27 2007-09-26 誘発電位検査装置及び誘発電位検査システム
JP2012144204A Active JP5553088B2 (ja) 2006-09-27 2012-06-27 誘発電位検査装置及び誘発電位検査システム

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2008536389A Active JP5099453B2 (ja) 2006-09-27 2007-09-26 誘発電位検査装置及び誘発電位検査システム

Country Status (2)

Country Link
JP (2) JP5099453B2 (https=)
WO (1) WO2008038650A1 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4982573B2 (ja) * 2007-03-23 2012-07-25 ヴェーデクス・アクティーセルスカプ 個人の聴力の他覚的測定システムおよび方法
JP5219202B2 (ja) * 2008-10-02 2013-06-26 学校法人金沢工業大学 音信号処理装置、ヘッドホン装置および音信号処理方法
CN103098493A (zh) 2010-11-12 2013-05-08 松下电器产业株式会社 音压评价系统及其方法、程序
CN103081516A (zh) 2011-06-30 2013-05-01 松下电器产业株式会社 不舒适声压决定系统、方法及其程序、助听器调整系统及不舒适声压决定装置
WO2013001836A1 (ja) * 2011-06-30 2013-01-03 パナソニック株式会社 不快閾値推定システム、方法およびそのプログラム、補聴器調整システムおよび不快閾値推定処理回路
CN103313654B (zh) * 2011-10-18 2015-09-23 松下电器产业株式会社 不适声压推测系统、不适声压推测装置及不适声压推测方法
JP5915944B2 (ja) 2012-03-19 2016-05-11 パナソニックＩｐマネジメント株式会社 不快音圧推定システム、不快音圧推定装置、不快音圧推定方法およびそのコンピュータプログラム
JP6041271B2 (ja) * 2012-04-24 2016-12-07 パナソニックＩｐマネジメント株式会社 補聴器利得決定システム、補聴器利得決定方法、およびコンピュータプログラム
JP5579352B1 (ja) * 2012-09-27 2014-08-27 パナソニック株式会社 不快音圧評価システム、不快音圧評価装置、不快音圧調整装置、不快音圧評価方法およびそのコンピュータプログラム
CN109284009B (zh) * 2018-11-27 2020-05-22 中国医学科学院生物医学工程研究所 一种提高听觉稳态响应脑-机接口性能的系统及方法
JP7497023B2 (ja) * 2020-07-02 2024-06-10 国立大学法人 東京大学 聴力検査システムおよび聴力検査方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2085028A1 (en) * 1998-11-09 2009-08-05 Xinde Li Processing low signal-to-noise ratio signals
US6602202B2 (en) * 2000-05-19 2003-08-05 Baycrest Centre For Geriatric Care System and methods for objective evaluation of hearing using auditory steady-state responses
US20060153396A1 (en) * 2003-02-07 2006-07-13 John Michael S Rapid screening, threshold, and diagnostic tests for evaluation of hearing

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