JP2012211913A - Reflection type photoelectric sensor - Google Patents

Reflection type photoelectric sensor Download PDF

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JP2012211913A
JP2012211913A JP2012131765A JP2012131765A JP2012211913A JP 2012211913 A JP2012211913 A JP 2012211913A JP 2012131765 A JP2012131765 A JP 2012131765A JP 2012131765 A JP2012131765 A JP 2012131765A JP 2012211913 A JP2012211913 A JP 2012211913A
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light
amount
received
photoelectric sensor
distance
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Hirokazu Yoshimi
浩和 吉見
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Panasonic Industrial Devices SUNX Co Ltd
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Panasonic Industrial Devices SUNX Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a reflection type photoelectric sensor capable of determining a reflectance of an object to be detected, from the photoelectric sensor, in addition to detection of the presence of the object to be detected.SOLUTION: Light Pf emitted from light projection means to the object to be detected is divided into the first-sixth pulse lights Pf1-Pf6, as shown in Fig. 2(a), projection light amount E of the respective lights are made different each other, and the object to be detected is irradiated with the light Pf with a change rate ε1. The pulse light reflected by the object to be detected is received by photoreception means, to determine a change rate ε2 of received light amount W of the pulse light Pg shown in Fig. 2(b). The change rate ε2 of the received light amount W of the pulse light Pg is varied as shown in the Fig. 2(b) or Fig. 2(c), when the reflectance δ of the object to be detected is different, and therefore the reflectance δ of the object to be detected is selectively determined in response to the change rate ε2 of the received light amount W of the determined pulse light Pg, based on correlation data between the reflectance δ and the change rate ε2.

Description

本発明は、発光素子からの出射光が、その光路上にある被検出物体で反射され、その反射光を受光素子で受光することにより、物体の有無の検出を行う反射型光電センサに係り、詳しくは物体の反射率あるいは光電センサと物体との距離を判別することができる反射型光電センサに関する。   The present invention relates to a reflective photoelectric sensor that detects the presence or absence of an object by reflecting light emitted from a light emitting element by a detected object on the optical path and receiving the reflected light by a light receiving element. Specifically, the present invention relates to a reflective photoelectric sensor that can determine the reflectance of an object or the distance between the photoelectric sensor and the object.

この種の反射型光電センサは、例えば、工場の生産ライン等で、物体の有無を判別するために多用されている。従来の反射型光電センサは、発光素子により発光された光が投光レンズを介して、該投光レンズより前方に配置された紙等の被検出物体に照射される。照射された光は、被検出物体の表面により反射され、この反射光の一部は、受光レンズを通して受光素子で受光され、この光は光信号から電気信号に変換され、さらに増幅器により増幅される。そして、増幅された光の光量が予め設定された閾値を超えた場合に、被検出物体が有ると判定される。   This type of reflective photoelectric sensor is frequently used to determine the presence or absence of an object, for example, in a production line of a factory. In a conventional reflective photoelectric sensor, light emitted from a light emitting element is irradiated through a light projecting lens onto a detected object such as paper disposed in front of the light projecting lens. The irradiated light is reflected by the surface of the object to be detected, and a part of the reflected light is received by the light receiving element through the light receiving lens, and this light is converted from an optical signal to an electric signal and further amplified by an amplifier. . Then, when the amount of the amplified light exceeds a preset threshold value, it is determined that there is an object to be detected.

従来の反射型光電センサの発光素子から発光される光が常時検出領域に照射されると、エネルギーが浪費されることになるので、図6(a)に示すように、発光素子から所定の周期で同じ形状の縦長矩形のパルス光として被検出物体に照射され、反射されたパルス光は図6(b)に示すように減衰されて受光素子に入るようになっている(特許文献1参照)。   When light emitted from the light emitting element of the conventional reflective photoelectric sensor is constantly irradiated to the detection region, energy is wasted. Therefore, as shown in FIG. In FIG. 6 (b), the object to be detected is irradiated as a vertically-long rectangular pulse light having the same shape, and the reflected pulse light is attenuated and enters the light receiving element (see Patent Document 1). .

特開平6−132803号公報。JP-A-6-132803.

ところが、上記従来の反射型光電センサは、発光素子から発光されるパルス光が、図6(a)に示すように、同じ矩形のパルス波形となるようになっていたので、受光素子により受光されるパルス光の波形が図6(b)に示すように減衰されてはいるが単調な形状のパルス光となる。このため、受光されたパルス光を基に被検出物体の有無の検出を行うことしかできないという問題があった。   However, in the conventional reflective photoelectric sensor, the pulsed light emitted from the light emitting element has the same rectangular pulse waveform as shown in FIG. 6A, so that it is received by the light receiving element. Although the waveform of the pulsed light is attenuated as shown in FIG. 6B, it becomes a monotonous shaped pulsed light. For this reason, there has been a problem that only the presence / absence of the detected object can be detected based on the received pulsed light.

本発明の目的は、被検出物体の有無の検出以外に、一単位の光が複数のパルス光として被検出物体に照射されたときの各パルス光の受光量レベルと予め定められた所定レベルとを比較し、受光量レベルが前記所定レベル以下から以上に変化したときの投光された光の各パルス光の投光量を判別することができ、この投光量に基づいて光電センサから被検出物体までの距離を判別することができる反射型光電センサを提供することにある。   The purpose of the present invention is to detect the amount of received light of each pulse light when a unit of light is irradiated to the detected object as a plurality of pulse lights, in addition to detecting the presence or absence of the detected object, and a predetermined predetermined level. , And the light projection amount of each pulsed light of the projected light when the light reception level changes from the predetermined level or less to the above can be determined, and the detected object from the photoelectric sensor based on this light projection amount It is an object of the present invention to provide a reflection type photoelectric sensor that can determine the distance to the distance.

上記問題点を解決するために、請求項1に記載の発明は、被検出物体へ光を照射する投光手段と、上記被検出物体から反射された光を受光する受光手段と、上記受光手段の受光量に基づいて前記被検出物体の有無の判別を行う有無判別手段とを備えた反射型光電センサにおいて、前記投光手段に対して、投光量が異なる複数のパルス光を順次出射させる投光動作を制御する投光量制御手段と、各投光動作毎に、各パルス光による受光量レベルと予め定められた所定レベルとの比較を行う受光量比較手段と、前記受光量比較手段の比較により前記受光量レベルが前記所定レベル以下から以上に変化したときの投光された各パルス光の投光量を判別して出力する投光量判別手段と、光電センサから異なる距離に存在する複数の被検出物体による受光量レベルが前記所定レベル以下から以上に変化するときの投光されたパルス光の投光量と前記各距離とを対応付けて記憶する距離記憶手段と、前記投光量判別手段から出力される投光量情報に対応する距離を、前記距離記憶手段に記憶されたデータベースの中から読み出すことにより光電センサから前記被検出物体までの距離を判別する距離判別手段とを備えることを要旨とする。   In order to solve the above problems, the invention described in claim 1 includes a light projecting unit that irradiates light to a detected object, a light receiving unit that receives light reflected from the detected object, and the light receiving unit. In a reflection type photoelectric sensor comprising presence / absence determination means for determining the presence / absence of the detected object based on the amount of received light, a plurality of pulse lights having different light emission amounts are sequentially emitted to the light projection means. Comparison between the received light amount control means for controlling the light operation, the received light amount comparison means for comparing the received light amount level of each pulsed light with a predetermined level for each light emitting operation, and the received light amount comparing means And a plurality of light receiving amount determining means for determining and outputting a light emitting amount of each of the projected pulsed light when the light receiving amount level changes from the predetermined level or less to the above, and a plurality of light receiving units present at different distances from the photoelectric sensor. Receipt by sensing object Distance storage means for storing the light emission quantity of the emitted pulsed light and the distances in association with each other when the quantity level changes from the predetermined level or less to the above, and the light emission quantity output from the light emission quantity determination means The gist of the present invention is to include distance determination means for determining the distance from the photoelectric sensor to the detected object by reading the distance corresponding to the information from the database stored in the distance storage means.

請求項2に記載の発明は、請求項1において、前記各投光動作毎に各パルス光による受光量をそれぞれ記憶する受光量記憶手段と、上記受光量記憶手段に記憶された各パルス光の受光量から受光量の変化率を判別して出力する変化率判別手段と、前記変化率判別手段により判別された変化率に基づいて前記距離判別手段により判別された距離を補正する距離補正手段とを備えることを要旨とする。   The invention described in claim 2 is the light receiving amount storage means for storing the amount of light received by each pulsed light for each light projecting operation, and the amount of each pulsed light stored in the light receiving amount storage means. A rate-of-change discriminating unit that discriminates and outputs the rate of change of the received light amount from the amount of received light; a distance correcting unit that corrects the distance discriminated by the distance discriminating unit based on the rate of change discriminated by the rate-of-change discriminating unit; It is a summary to provide.

請求項3に記載の発明は、請求項1又は2において、前記投光量制御手段は、各投光動作におけるパルス光の数を任意に変更する機能を備えることを要旨とする。
請求項4に記載の発明は、請求項1又は2において、前記投光量制御手段は、所定時間の中で各投光動作におけるパルス数を任意に変更する機能を備えていることを要旨とする。
A gist of a third aspect of the present invention is that, in the first or second aspect, the light projection amount control means has a function of arbitrarily changing the number of pulse lights in each light projection operation.
A fourth aspect of the present invention is characterized in that, in the first or second aspect, the light projection amount control means has a function of arbitrarily changing the number of pulses in each light projection operation within a predetermined time. .

請求項5に記載の発明は、請求項1〜4のいずれか一項において、前記投光量制御手段は、各投光動作における各パルス光の投光量を任意に設定可能に構成されていることを要旨とする。   According to a fifth aspect of the present invention, in any one of the first to fourth aspects, the light projection amount control means is configured to arbitrarily set the light projection amount of each pulsed light in each light projection operation. Is the gist.

各請求項に記載の発明によれば、被検出物体の有無の検出以外に、光が複数のパルス光として被検出物体に照射されたときの各パルス光の受光量レベルと予め定められた所定レベルとを比較し、受光量レベルが前記所定レベル以下から以上に変化したときの投光された光の各パルス光の投光量を判別することができる。この判別された投光量に基づいて光電センサから被検出物体までの距離を判別することができる。この距離を判別することによって、例えば被検出物体の位置や形状あるいは大きさの判定を行うことが可能となる。   According to the invention described in each claim, in addition to the detection of the presence or absence of the detected object, the received light amount level of each pulsed light when the light is irradiated to the detected object as a plurality of pulsed lights and a predetermined predetermined value By comparing with the level, it is possible to determine the light projection amount of each pulsed light of the projected light when the light reception level changes from the predetermined level or less to the above. The distance from the photoelectric sensor to the detected object can be determined based on the determined light projection amount. By determining this distance, for example, it is possible to determine the position, shape, or size of the detected object.

反射型光電センサの第1の実施形態を示すブロック回路図。The block circuit diagram which shows 1st Embodiment of a reflection type photoelectric sensor. (a)〜(c)は、第1の実施形態の光電センサの動作を説明するグラフ。(A)-(c) is a graph explaining operation | movement of the photoelectric sensor of 1st Embodiment. 反射型光電センサの第2の実施形態を示すブロック回路図。The block circuit diagram which shows 2nd Embodiment of a reflection type photoelectric sensor. (a)〜(c)は、第2の実施形態の光電センサの動作を説明するグラフ。(A)-(c) is a graph explaining operation | movement of the photoelectric sensor of 2nd Embodiment. (a)〜(c)は、第2の実施形態の光電センサの動作を説明するグラフ。(A)-(c) is a graph explaining operation | movement of the photoelectric sensor of 2nd Embodiment. (a),(b)は、従来の光電センサの投光波形及び受光波形を示すグラフ。(A), (b) is a graph which shows the light projection waveform and light reception waveform of the conventional photoelectric sensor.

(第1の実施形態)
以下、反射型光電センサの第1の実施形態を図1及び図2に従って説明する。
この第1の実施形態の光電センサは、概略的に見て、図1に示すようにワーク等の被検出物体11に所定の加工を施す生産ラインのコンベアによって搬送される前記被検出物体11に光を照射する投光手段12と、前記被検出物体11に入反射された光を受光する受光手段13と、前記投光手段12及び受光手段13の動作を制御する制御装置14とよって構成されている。
(First embodiment)
Hereinafter, a first embodiment of a reflective photoelectric sensor will be described with reference to FIGS.
The photoelectric sensor of the first embodiment is schematically shown in FIG. 1 in the detected object 11 conveyed by a conveyor of a production line that performs predetermined processing on the detected object 11 such as a workpiece. The light projecting means 12 for irradiating light, the light receiving means 13 for receiving the light incident on and reflected by the detected object 11, and the control device 14 for controlling the operations of the light projecting means 12 and the light receiving means 13 are configured. ing.

そこで、前記投光手段12、受光手段13及び制御装置14の各構成を順次説明する。
前記投光手段12は、発光回路15と、該発光回路15に接続された発光素子16と、投光レンズ17とによって構成されている。又、前記受光手段13は、受光素子18と、前記被検出物体11によって反射された光を前記受光素子18に導く受光レンズ19と、前記受光素子18に接続された受光回路20とによって構成されている。そして、受光素子18により受光された光を受光回路20により電気信号に変換して増幅し、制御装置14に送るようになっている。
Therefore, each configuration of the light projecting means 12, the light receiving means 13, and the control device 14 will be described in order.
The light projecting means 12 includes a light emitting circuit 15, a light emitting element 16 connected to the light emitting circuit 15, and a light projecting lens 17. The light receiving means 13 includes a light receiving element 18, a light receiving lens 19 for guiding the light reflected by the detected object 11 to the light receiving element 18, and a light receiving circuit 20 connected to the light receiving element 18. ing. The light received by the light receiving element 18 is converted into an electric signal by the light receiving circuit 20 and amplified and sent to the control device 14.

次に、前記制御装置14について説明する。この制御装置14は、各種の演算処理あるいは判別処理を行う中央演算処理装置(CPU)21を備えている。このCPU21には、各種の動作プログラムを予め記憶するためのリードオンリーメモリ(ROM)22が接続されるとともに、各種のデータを記憶するための記憶手段としての読み出し書き込み可能なランダムアクセスメモリ(RAM)23が接続されている。このRAM23は、受光量記憶手段、反射率記憶手段及び距離記憶手段として機能する。前記CPU21には投光量制御手段24が設けられ、この投光量制御手段24によって、図2(a)に示すように、1回の投光動作により投光される一単位の光Pfを第1〜第6の矩形のパルス光Pf1〜Pf6に分割された波形とし、各パルス光Pf1〜Pf6の投光量Eが時間tの経過と共に段階的に増加するように制御できるようにしている。そして、各パルス光Pf1〜Pf6の投光量E1〜E6の変化率ε1を所望する値に設定できるようにしている。この変化率ε1は、例えば第1のパルス光Pf1から第6のパルス光Pf6までの経過時間を基準時間tcとすると、この所定の基準時間tc当たりの第1のパルス光Pf1の投光量E1から第6のパルス光Pf6の投光量E6の変化量(E6−E1)を意味する。   Next, the control device 14 will be described. The control device 14 includes a central processing unit (CPU) 21 that performs various types of arithmetic processing or discrimination processing. The CPU 21 is connected to a read only memory (ROM) 22 for storing various operation programs in advance, and is a readable / writable random access memory (RAM) as a storage means for storing various data. 23 is connected. The RAM 23 functions as a received light amount storage unit, a reflectance storage unit, and a distance storage unit. The CPU 21 is provided with a light projection amount control unit 24. The light projection amount control unit 24 uses the light projection amount control unit 24 to generate a first unit of light Pf that is projected by one light projection operation, as shown in FIG. The waveform is divided into sixth rectangular pulse lights Pf1 to Pf6, and the light emission amount E of each of the pulse lights Pf1 to Pf6 can be controlled so as to increase stepwise with the lapse of time t. The rate of change ε1 of the light projection amounts E1 to E6 of the pulse lights Pf1 to Pf6 can be set to a desired value. The rate of change ε1 is, for example, from the light projection amount E1 of the first pulsed light Pf1 per predetermined reference time tc, where the elapsed time from the first pulsed light Pf1 to the sixth pulsed light Pf6 is the reference time tc. This means the amount of change (E6-E1) in the light projection amount E6 of the sixth pulsed light Pf6.

前記CPU21には、前記受光回路20からの受光信号に基づいて、被検出物体11の有無を判別する有無判別手段25が設けられている。この有無判別手段25によって、例えば、前記第1〜第6のパルス光Pg1〜Pg6のうち第6のパルス光Pg6の受光量W6が所定値を超えた場合に、被検出物体11が有ると判別するようにしている。   The CPU 21 is provided with presence / absence discriminating means 25 for discriminating the presence / absence of the detected object 11 based on the light receiving signal from the light receiving circuit 20. The presence / absence discriminating means 25 discriminates that the detected object 11 is present, for example, when the light receiving amount W6 of the sixth pulsed light Pg6 out of the first to sixth pulsed light Pg1 to Pg6 exceeds a predetermined value. Like to do.

又、前記CPU21には、図2(b)に示すように受光手段13により受光された第1〜第6のパルス光Pg1〜Pg6の受光量Wに基づいて、一単位のパルス光Pgの受光量Wの変化率ε2を判別するための変化率判別手段26が設けられている。この変化率ε2は、前述した変化率ε1と同様に第1のパルス光Pg1から第6のパルス光Pg6までの経過時間を基準時間tcとし、この所定の基準時間tc当たりの第1のパルス光Pg1の受光量W1から第6のパルス光Pg6の受光量W6の変化量(W6−W1)を意味する。   Further, the CPU 21 receives a unit of pulsed light Pg based on the received light amount W of the first to sixth pulsed lights Pg1 to Pg6 received by the light receiving means 13, as shown in FIG. A change rate discriminating means 26 for discriminating the change rate ε2 of the amount W is provided. The rate of change ε2 is the same as the rate of change ε1 described above, and the elapsed time from the first pulsed light Pg1 to the sixth pulsed light Pg6 is defined as the reference time tc, and the first pulsed light per the predetermined reference time tc. It means the amount of change (W6-W1) in the received light amount W6 of the sixth pulsed light Pg6 from the received light amount W1 of Pg1.

さらに、前記CPU21には、前記変化率判別手段26によって判別されたパルス光Pgの受光量の変化率ε2に基づいて、被検出物体11の反射率δを判別するための反射率判別手段27が設けられている。この反射率判別手段27は、次のような機能を有している。即ち、被検出物体11の表面の色彩の違いや表面処理の違い等によって、前記発光素子16から発光され光Pfの各パルス光Pf1〜Pf6が一定の変化率ε1に設定されている場合においても、被検出物体11の反射率δの相違によって、例えば反射率δが高い場合には、図2(b)に示すように、受光されたパルス光Pgの変化率ε2が大きくなる。反対に、被検出物体11の反射率δが低い場合には、図2(c)に示すように受光されたパルス光Pgの変化率ε2が小さくなることが判っている。このため、投光される光Pfの投光量Eの変化率ε1と、被検出物体11の反射率δと、受光されたパルス光Pgの受光量Wの変化率ε2との相関データを予め実験あるいは適正な理論を用いて求める。そして、この相関データをデータベースとして、前記RAM23に予め記憶させておき、このデータベースの中から判別された変化率ε2に対応する反射率δを選択する。この選択された反射率δは、制御装置14に接続された表示装置28に表示されるようになっている。なお、この表示装置28には、被検出物体11の有無の判別結果あるいはその他の各種のデータが表示されるようになっている。   Further, the CPU 21 has a reflectance determining means 27 for determining the reflectance δ of the detected object 11 based on the change rate ε2 of the received light amount of the pulsed light Pg determined by the change rate determining means 26. Is provided. This reflectance determination means 27 has the following functions. That is, even when the pulsed light Pf1 to Pf6 of the light Pf emitted from the light emitting element 16 is set to a constant change rate ε1 due to a difference in the color of the surface of the detected object 11 or a difference in surface treatment. For example, when the reflectance δ is high due to the difference in the reflectance δ of the detected object 11, the rate of change ε2 of the received pulsed light Pg increases as shown in FIG. 2B. On the contrary, when the reflectance δ of the detected object 11 is low, it is known that the rate of change ε2 of the received pulsed light Pg is small as shown in FIG. For this reason, the correlation data of the change rate ε1 of the projected light amount E of the projected light Pf, the reflectance δ of the detected object 11, and the change rate ε2 of the received light amount W of the received pulsed light Pg are previously tested. Or, use an appropriate theory. The correlation data is stored in advance in the RAM 23 as a database, and the reflectance δ corresponding to the determined change rate ε2 is selected from the database. The selected reflectance δ is displayed on the display device 28 connected to the control device 14. The display device 28 is configured to display the determination result of the presence or absence of the detected object 11 or other various data.

前記CPU21には、前記投光量制御手段24、有無判別手段25、変化率判別手段26及び反射率判別手段27等の各種のデータを入力する入力装置29が接続されている。
次に、前記のように構成された反射型光電センサの動作について説明する。
The CPU 21 is connected to an input device 29 for inputting various data such as the light projection amount control means 24, presence / absence determination means 25, change rate determination means 26, and reflectance determination means 27.
Next, the operation of the reflective photoelectric sensor configured as described above will be described.

図1において、前記投光手段12が作動され、前記投光量制御手段24からの制御信号によって、発光回路15が作動され、発光素子16から図2(a)に示す投光量Eの変化率ε1の光Pfが所定の周期で、被検出物体11に向かって照射される。この被検出物体11に照射された光Pfは、被検出物体11によって反射され、受光素子18によって受光される。この受光されたパルス光Pgは、受光回路20に入力されて光信号から電気信号に変換され、例えば図2(b)に示すように、第1〜第6のパルス光Pg1〜Pg6として、有無判別手段25に入力される。この有無判別手段25によって、第6のパルス光Pg6の受光量W6が予め設定された基準値に達したか否かが判別され、基準値に達した場合には、被検出物体11が有ると判別されて、表示装置28にその旨が表示される。   In FIG. 1, the light projecting means 12 is operated, the light emitting circuit 15 is operated by a control signal from the light projecting light quantity control means 24, and the change rate ε1 of the light projecting quantity E shown in FIG. Light Pf is emitted toward the detected object 11 at a predetermined cycle. The light Pf irradiated to the detected object 11 is reflected by the detected object 11 and received by the light receiving element 18. The received pulsed light Pg is input to the light receiving circuit 20 and converted from an optical signal to an electric signal. For example, as shown in FIG. 2B, the first to sixth pulsed lights Pg1 to Pg6 are present. Input to the discriminating means 25. The presence / absence discriminating means 25 discriminates whether or not the received light amount W6 of the sixth pulsed light Pg6 has reached a preset reference value, and if it has reached the reference value, the detected object 11 is present. As a result, it is displayed on the display device 28.

一方、前記受光回路20からCPU21に送信された図2(b)に示すデータは、前記変化率判別手段26に入力されて、この変化率判別手段26によって、受光されたパルス光Pgの受光量Wの変化率ε2が判別される。この判別された変化率ε2が前記反射率判別手段27に入力されて、この反射率判別手段27によって、予めRAM23に記憶された投光量Eの変化率ε1、被検出物体11の反射率δ及び受光されたパルス光Pgの受光量Wの変化率ε2の相関データに基づいて、実際の変化率ε2に応じた被検出物体11の反射率δが選択され、この選択された被検出物体11の反射率δが表示装置28に表示される。   On the other hand, the data shown in FIG. 2B transmitted from the light receiving circuit 20 to the CPU 21 is input to the change rate discriminating means 26, and the received light amount of the pulsed light Pg received by the change rate discriminating means 26. The rate of change ε2 of W is determined. The determined change rate ε2 is input to the reflectance determining unit 27, and the reflectance determining unit 27 uses the reflectance determining unit 27 to store the change rate ε1 of the light projection amount E stored in advance in the RAM 23, the reflectance δ of the detected object 11, and the like. Based on the correlation data of the change rate ε2 of the received light amount W of the received pulsed light Pg, the reflectance δ of the detected object 11 corresponding to the actual change rate ε2 is selected, and the selected detected object 11 is detected. The reflectance δ is displayed on the display device 28.

ところで、被検出物体11の反射率δが判別されると、被検出物体11が例えば紙である場合においては、紙の色彩の赤色、黄色、青色等の相違を判別することができるので、被検出物体11の色彩の相違を判別するために利用することが可能となる。又、被検出物体11が例えば切削加工された各種の部品である場合において、部品の表面の仕上げ状態によって反射率δが異なるので、この反射率δを判別することによって、部品の表面仕上げ精度の良否を判別することができる。   By the way, when the reflectance δ of the detected object 11 is determined, when the detected object 11 is, for example, paper, differences in paper colors such as red, yellow, and blue can be determined. This can be used to determine the color difference of the detection object 11. Further, when the detected object 11 is, for example, various parts that have been machined, the reflectance δ varies depending on the finished state of the surface of the component. Therefore, by determining the reflectance δ, the surface finishing accuracy of the component can be improved. Good or bad can be determined.

上記実施形態の反射型光電センサによれば、以下のような効果を得ることができる。
(1)上記実施形態では、前記制御装置14に投光量制御手段24を設け、発光素子16から図2(a)に示す第1〜第6のパルス光Pf1〜Pf6の光Pfを被検出物体11に向かって照射し、受光手段13によって受光されたパルス光Pgの第1〜第6のパルス光Pg1〜Pgnの変化率ε2を変化率判別手段26によって判別するようにした。又、この変化率ε2に基づいて反射率判別手段27によって、被検出物体11の反射率δを前述した投光量Eの変化率ε1、被検出物体11の反射率δ及び受光されたパルス光Pgの受光量Wの変化率ε2の相関データの中から選択して判別するようにした。このため、制御装置14のCPU21の機能を変更するのみで、被検出物体11の反射率δを容易に判別でき、この反射率δによって被検出物体11の例えば、色彩や加工精度の良否等を判別することができる。
According to the reflective photoelectric sensor of the above embodiment, the following effects can be obtained.
(1) In the above embodiment, the light intensity control means 24 is provided in the control device 14, and the light Pf of the first to sixth pulse lights Pf1 to Pf6 shown in FIG. 11 and the rate of change ε2 of the first to sixth pulsed light Pg1 to Pgn of the pulsed light Pg received by the light receiving unit 13 is determined by the rate of change determining unit 26. Further, based on the change rate ε2, the reflectivity discriminating means 27 causes the reflectivity δ of the detected object 11 to be changed to the change rate ε1 of the projected light amount E, the reflectivity δ of the detected object 11, and the received pulsed light Pg. Is selected from the correlation data of the rate of change ε2 of the received light amount W. Therefore, it is possible to easily determine the reflectance δ of the detected object 11 only by changing the function of the CPU 21 of the control device 14, and the reflectance δ can be used to determine, for example, whether the detected object 11 is good in color, processing accuracy, or the like. Can be determined.

(2)上記実施形態では、RAM23に予め記憶された投光される光Pfの変化率ε1、受光されたパルス光Pgの変化率ε2及び被検出物体11の反射率δの相関関係を表すデータベースの中から受光されたパルス光Pgの変化率ε2に応じた被検出物体11の反射率δを選択して設定するようにした。このため、被検出物体11の反射率δを適正に判別することができるとともに、変化率判別手段26及び反射率判別手段27の動作を制御するソフトウェアのプログラムを容易に行うことができる。   (2) In the above embodiment, the database representing the correlation among the change rate ε1 of the projected light Pf stored in advance in the RAM 23, the change rate ε2 of the received pulsed light Pg, and the reflectance δ of the detected object 11. The reflectance δ of the detected object 11 corresponding to the rate of change ε2 of the received pulsed light Pg is selected and set. Therefore, the reflectance δ of the detected object 11 can be properly determined, and a software program for controlling the operations of the change rate determining means 26 and the reflectance determining means 27 can be easily performed.

(第2の実施形態)
次に、反射型光電センサの第2の実施形態を図3〜図5に従って説明する。なお、第2の実施形態は、第1の実施形態の反射型光電センサの制御装置14の構成を変更した構成であるため、同様の部分についてはその詳細な説明を省略する。
(Second Embodiment)
Next, a second embodiment of the reflective photoelectric sensor will be described with reference to FIGS. In addition, since 2nd Embodiment is the structure which changed the structure of the control apparatus 14 of the reflection type photoelectric sensor of 1st Embodiment, the detailed description is abbreviate | omitted about the same part.

図3に示すように、前記制御装置14には、投光手段12から所定の変化率ε1で光Pfが被検出物体11に照射されたときの前記受光手段13による各パルス光Pg1〜Pg6の受光量W1〜W6のレベルと予め定められた被検出物体11の検出が可能な所定レベルとの比較を行う受光量比較手段31が設けられている。この受光量比較手段31には、前記受光量比較手段31の比較により前記受光量のレベルが前記所定レベル以下から以上に変化したときの投光された光Pfの各パルス光Pf1〜Pf6の投光量E1〜E6を判別して出力する投光量判別手段32が設けられている。さらに、この投光量判別手段32には、該投光量判別手段32により判別された投光レベルに基づいて光電センサ(投光手段12)から被検出物体11までの距離Lを判別する距離判別手段33が接続されている。さらに、前記CPU21には、前記変化率判別手段26及び距離判別手段33からの信号に基づいて、前記距離Lを補正するための距離補正手段34が設けられている。   As shown in FIG. 3, the control device 14 includes the pulse light Pg <b> 1 to Pg <b> 6 generated by the light receiving unit 13 when the light Pf is irradiated from the light projecting unit 12 at a predetermined change rate ε <b> 1. A received light amount comparing means 31 is provided for comparing the levels of the received light amounts W1 to W6 with a predetermined level at which a predetermined detection object 11 can be detected. The received light amount comparing means 31 emits each of the pulsed lights Pf1 to Pf6 of the emitted light Pf when the level of the received light amount is changed from the predetermined level or less to the above by the comparison of the received light amount comparing means 31. A light projection amount discriminating means 32 for discriminating and outputting the light amounts E1 to E6 is provided. Further, the light quantity determining means 32 includes a distance determining means for determining the distance L from the photoelectric sensor (light projecting means 12) to the detected object 11 based on the light projection level determined by the light quantity determining means 32. 33 is connected. Further, the CPU 21 is provided with a distance correction means 34 for correcting the distance L based on signals from the change rate determination means 26 and the distance determination means 33.

次に、上記受光量比較手段31、投光量判別手段32、距離判別手段33及び距離補正手段34の機能を順次説明する。
図4(a)に示すように、発光素子16から被検出物体11に照射される光Pfの第1〜第6のパルス光Pf1〜Pf6の投光量Eの変化率ε1と、図4(b)に示すように受光されたパルス光Pgの第1〜第6のパルス光Pg1〜Pg6の受光量Wの変化率ε2とが同じである場合においても、光電センサから被検出物体11までの距離Lの相違によって、パルス光Pgの波形が図4(b)又は図4(c)に示すように異なる波形となる。即ち、前記距離Lが短い場合には、被検出物体11の反射も正常に行われて、図4(b)に示すように受光されたパルス光Pgの波形は、投光された光Pfの波形とほぼ同様の波形となる。しかし、前記距離Lが大きい場合には、図4(c)に示すように、光の減衰によって、検出が可能な最初のパルス光が検出されるのは、投光された第1〜第6のパルス光Pf1〜Pf6のうち例えば第4のパルス光Pf4と対応する第4のパルス光Pg4が最初となる。従って、投光された第1〜第6のパルス光Pf1〜Pf6のうち最初に第1のパルス光Pf1が検出された場合の前記距離Lを第1距離L1とし、以下、第2〜第6のパルス光Pf2〜Pf6が順次最初に検出された場合のそれぞれの距離を第2〜第6距離L2〜L6として、これらの相関データを実験により求める。そして、この相関データをデータベースとして、前記RAM23に予め記憶させておき、前記受光量比較手段31、投光量判別手段32及び距離判別手段33によって、前記相関データのなかから最初に検出された任意のパルス光に対応する前記距離L1〜L6のいずれかを選択するようにしている。
Next, the functions of the received light amount comparing means 31, the projected light quantity determining means 32, the distance determining means 33, and the distance correcting means 34 will be described sequentially.
As shown in FIG. 4A, the change rate ε1 of the light projection amount E of the first to sixth pulse lights Pf1 to Pf6 of the light Pf irradiated from the light emitting element 16 to the detected object 11, and FIG. The distance from the photoelectric sensor to the detected object 11 even when the rate of change ε2 of the received light amount W of the first to sixth pulse lights Pg1 to Pg6 of the received pulse light Pg is the same as shown in FIG. Due to the difference in L, the waveform of the pulsed light Pg becomes different as shown in FIG. 4B or 4C. That is, when the distance L is short, the detected object 11 is also reflected normally, and the waveform of the received pulsed light Pg is the same as that of the projected light Pf as shown in FIG. The waveform is almost the same as the waveform. However, when the distance L is large, as shown in FIG. 4C, the first pulsed light that can be detected is detected by the attenuation of the light. For example, the fourth pulse light Pg4 corresponding to the fourth pulse light Pf4 is first among the pulse lights Pf1 to Pf6. Therefore, the first distance L1 when the first pulsed light Pf1 is first detected among the projected first to sixth pulsed lights Pf1 to Pf6 is defined as the first distance L1, and hereinafter the second to sixth The respective distances when the first and second pulse lights Pf2 to Pf6 are sequentially detected are set as the second to sixth distances L2 to L6, and these correlation data are obtained by experiments. Then, the correlation data is stored in advance in the RAM 23 as a database, and an arbitrary first detected from the correlation data by the received light amount comparison unit 31, the light projection amount determination unit 32, and the distance determination unit 33. One of the distances L1 to L6 corresponding to the pulsed light is selected.

さらに詳述すると、この第2の実施形態においては、光電センサから異なる距離L1〜L6に存在する複数の被検出物体11による各パルス光Pg1〜Pg6の受光量W1〜W6のレベルが前記所定レベル以下から以上に変化するときの投光されたパルス光Pf1〜Pf6の投光量E1〜E6と、前記各距離L1〜L6とが対応付けられてRAM23にデータベースとして記憶される。そして、前記投光量判別手段32から出力された投光量(例えば第4のパルス光Pf4のE4)情報に対応する距離L4を、前記RAM23に記憶されたデータベースの中から読み出すことにより光電センサから前記被検出物体までの距離L4を判別する。この距離L4が判別されることによって、例えば、被検出物体11の高さ、幅等を知ることが可能となる。   More specifically, in the second embodiment, the levels of the received light amounts W1 to W6 of the pulse lights Pg1 to Pg6 by the plurality of detected objects 11 existing at different distances L1 to L6 from the photoelectric sensor are the predetermined levels. The projected light amounts E1 to E6 of the projected pulse lights Pf1 to Pf6 and the distances L1 to L6 are stored in the RAM 23 as a database in association with each other. Then, the distance L4 corresponding to the light quantity (for example, E4 of the fourth pulsed light Pf4) output from the light quantity determining means 32 is read from the photoelectric sensor by reading out the distance L4 from the database stored in the RAM 23. A distance L4 to the detected object is determined. By determining the distance L4, for example, the height and width of the detected object 11 can be known.

ところで、上述した距離L1〜L6の判別方法は、受光されたパルス光Pgの受光量Wの変化率ε2が投光された光Pfの投光量Eの変化率ε1と同じ場合に適用される。しかし、前述したように、被検出物体11の反射率δが変化すると、第1の実施形態で述べた図2(b)及び(c)に示すように、受光されたパルス光Pgの受光量Wの変化率ε2も変動する。このため、この第2の実施形態においては、パルス光Pgの変化率ε2の相違によって、距離L1〜L6の判別動作に誤差が生じないように、前記距離補正手段34に以下の機能を付与している。   By the way, the above-described determination method of the distances L1 to L6 is applied when the rate of change ε2 of the received light amount W of the received pulsed light Pg is the same as the rate of change ε1 of the projected light amount E of the projected light Pf. However, as described above, when the reflectance δ of the detected object 11 changes, as shown in FIGS. 2B and 2C described in the first embodiment, the received light amount of the received pulsed light Pg. The change rate ε2 of W also varies. For this reason, in the second embodiment, the distance correction means 34 is provided with the following function so that an error does not occur in the determination operation of the distances L1 to L6 due to the difference in the change rate ε2 of the pulsed light Pg. ing.

即ち、図5(a)に示すように、受光されたパルス光Pgの変化率が基準変化率ε2kと同じ変化率の場合に、例えば図5(b)に示すように第4のパルス光Pg4が最初に検出されるものとすると、図5(a)に示すように、変化率ε2kよりも判別された変化率ε2が小さい場合には、受光量Wが減少するので、図5(c)に示すように第5のパルス光Pg5が最初に検出されることになる。従って、判別された変化率ε2が基準変化率ε2kと異なる場合に、基準変化率ε2kと判別され変化率ε2との変化率差と、前記距離Lの補正値との相関データを予め実験や適正な理論により求めておき、これを距離の補正演算式として設定し、この補正演算式をROM22に記憶する。そして、距離補正手段34により前記補正演算式に基づいて、実際の変化率差に対応する距離Lの補正値を演算するようにしている。   That is, as shown in FIG. 5A, when the rate of change of the received pulsed light Pg is the same rate of change as the reference rate of change ε2k, for example, as shown in FIG. 5B, the fourth pulsed light Pg4 Is detected first, as shown in FIG. 5A, when the change rate ε2 determined to be smaller than the change rate ε2k is small, the amount of received light W decreases. As shown in FIG. 5, the fifth pulsed light Pg5 is detected first. Therefore, when the determined change rate ε2 is different from the reference change rate ε2k, correlation data between the change rate difference between the change rate ε2 determined to be the reference change rate ε2k and the correction value of the distance L is obtained in advance through experiments or appropriate values. It is obtained by a simple theory, and this is set as a distance correction calculation formula, and this correction calculation formula is stored in the ROM 22. Then, the distance correction means 34 calculates the correction value of the distance L corresponding to the actual change rate difference based on the correction calculation formula.

なお、上記各実施形態は以下のように変更してもよい。
・第1の実施形態において、前記反射率判別手段27に対し、予め記憶媒体に記憶されたパルス光Pgの受光量Wの複数の変化率ε2と、各変化率ε2に応じて設定された複数の反射率δとの相関データを、記憶媒体に予めデータベースとして記憶しておき、このデータベースの中から判別された前記変化率ε2に応じた反射率δを選択する機能を付与してもよい。
In addition, you may change each said embodiment as follows.
In the first embodiment, a plurality of change rates ε2 of the received light amount W of the pulsed light Pg stored in the storage medium in advance and a plurality set according to each change rate ε2 with respect to the reflectance determination unit 27. The correlation data with the reflectance δ may be stored in advance as a database in a storage medium, and a function of selecting the reflectance δ according to the change rate ε2 determined from the database may be added.

・第1の実施形態において、図1に示す前記反射率判別手段27を省略してもよい。この場合には、光電センサの変化率判別手段26から出力された受光量の変化率情報を光電センサとは別の制御機器に設けられた反射率判別手段27に送信して、反射率を判別する。   In the first embodiment, the reflectance determination unit 27 shown in FIG. 1 may be omitted. In this case, the change rate information of the received light amount output from the change rate determination unit 26 of the photoelectric sensor is transmitted to the reflectivity determination unit 27 provided in a control device different from the photoelectric sensor to determine the reflectivity. To do.

・第2の実施形態において、図3に示す前記距離判別手段33及び距離補正手段34を省略してもよい。この場合には、光電センサの投光量判別手段32から出力された投光量情報を光電センサとは別の制御機器に設けられた距離判別手段33及び距離補正手段34に送信して、距離を判別する。   In the second embodiment, the distance determination unit 33 and the distance correction unit 34 shown in FIG. 3 may be omitted. In this case, the light amount information output from the light amount determining unit 32 of the photoelectric sensor is transmitted to the distance determining unit 33 and the distance correcting unit 34 provided in a control device different from the photoelectric sensor, and the distance is determined. To do.

・第2の実施形態において、判別された変化率ε2が基準変化率ε2kと異なる場合に、基準変化率ε2kと判別され変化率ε2との変化率差と、前記距離Lの補正値との相関データを予め実験や適正な理論により求めておき、これを距離の補正データとしてRAM23に記憶しておき、距離補正手段34により前記補正データの中から該当する補正データを選択して、実際の変化率差に対応する距離Lの補正値を距離判別手段33により演算するようにしもよい。   In the second embodiment, when the determined change rate ε2 is different from the reference change rate ε2k, the correlation between the change rate difference between the determined change rate ε2k and the change rate ε2, and the correction value of the distance L Data is obtained in advance by experiment or appropriate theory, and this is stored in the RAM 23 as distance correction data, and the corresponding correction data is selected from the correction data by the distance correction means 34, and the actual change. A correction value for the distance L corresponding to the rate difference may be calculated by the distance determination means 33.

・第1の実施形態において、図2(a)に示す光Pfを第1〜第6のパルス光Pf1〜Pf6の投光量が段階的に小さくなるように投光量制御手段24の機能を設定してもよい。   In the first embodiment, the function of the light quantity control means 24 is set so that the light quantity of the first to sixth pulse lights Pf1 to Pf6 is gradually reduced from the light Pf shown in FIG. May be.

・前記投光量制御手段24に対し、一単位の光Pfを形成する複数のパルス光Pf1〜Pfnの数を任意に変更する機能を付与してもよい。
・前記投光量制御手段24に対し、所定時間の中でパルス光Pf1〜Pfnの数を任意の数に可変設定する機能を付与してもよい。
A function of arbitrarily changing the number of the plurality of pulse lights Pf1 to Pfn that form one unit of light Pf may be given to the light emission amount control means 24.
A function of variably setting the number of pulsed lights Pf <b> 1 to Pfn to an arbitrary number within a predetermined time may be given to the light emission amount control means 24.

・前記投光量制御手段24に対し、一単位の光Pfを形成するパルス光の各投光量をそれぞれ任意の投光量に可変設定する機能を付与してもよい。   A function for variably setting each light projection amount of the pulsed light that forms one unit of light Pf to an arbitrary light projection amount may be added to the light projection amount control means 24.

δ…反射率、E,E1〜E6…投光量、L,L1〜L6…距離、W,W1,W6…受光量、ε1,ε2,ε2k…変化率、Pf,Pg…パルス光、ε2k…基準変化率、Pf1〜Pf6…パルス光、11…被検出物体、12…投光手段、13…受光手段、24…投光量制御手段、25…有無判別手段、26…変化率判別手段、27…反射率判別手段、31…受光量比較手段、32…投光量判別手段、33…距離判別手段、34…距離補正手段。   δ ... Reflectance, E, E1 to E6 ... Emission light quantity, L, L1 to L6 ... Distance, W, W1, W6 ... Received light amount, ε1, ε2, ε2k ... Change rate, Pf, Pg ... Pulse light, ε2k ... Reference Rate of change, Pf1 to Pf6 ... pulsed light, 11 ... object to be detected, 12 ... light projecting means, 13 ... light receiving means, 24 ... light quantity control means, 25 ... presence determining means, 26 ... change rate judging means, 27 ... reflection Rate discriminating means, 31... Received light amount comparing means, 32... Projected light quantity judging means, 33.

Claims (5)

被検出物体へ光を照射する投光手段と、
上記被検出物体から反射された光を受光する受光手段と、
上記受光手段の受光量に基づいて前記被検出物体の有無の判別を行う有無判別手段とを備えた反射型光電センサにおいて、
前記投光手段に対して、投光量が異なる複数のパルス光を順次出射させる投光動作を制御する投光量制御手段と、
各投光動作毎に、各パルス光による受光量レベルと予め定められた所定レベルとの比較を行う受光量比較手段と、
前記受光量比較手段の比較により前記受光量レベルが前記所定レベル以下から以上に変化したときの投光された各パルス光の投光量を判別して出力する投光量判別手段と、
光電センサから異なる距離に存在する複数の被検出物体による受光量レベルが前記所定レベル以下から以上に変化するときの投光されたパルス光の投光量と前記各距離とを対応付けて記憶する距離記憶手段と、
前記投光量判別手段から出力される投光量情報に対応する距離を、前記距離記憶手段に記憶されたデータベースの中から読み出すことにより光電センサから前記被検出物体までの距離を判別する距離判別手段と
を備えることを特徴とする反射型光電センサ。
A light projecting means for irradiating the detected object with light;
A light receiving means for receiving light reflected from the detected object;
A reflection type photoelectric sensor comprising presence / absence determination means for determining the presence / absence of the detected object based on the amount of light received by the light receiving means;
A light projection amount control unit that controls a light projection operation for sequentially emitting a plurality of pulse lights having different light projection amounts to the light projection unit, and
A received light amount comparing means for comparing the received light amount level of each pulsed light with a predetermined level for each light projecting operation;
A light projection amount discriminating means for discriminating and outputting a light projection amount of each pulsed light projected when the light reception amount level changes from the predetermined level or less to the above by comparison of the light reception amount comparison means;
A distance in which the projected light quantity of the projected pulsed light and the respective distances are stored in association with each other when the received light amount level of the plurality of detected objects existing at different distances from the photoelectric sensor changes from the predetermined level or less to the above. Storage means;
Distance determining means for determining the distance from the photoelectric sensor to the detected object by reading the distance corresponding to the light intensity information output from the light intensity determining means from the database stored in the distance storage means; A reflective photoelectric sensor comprising:
請求項1において、前記各投光動作毎に各パルス光による受光量をそれぞれ記憶する受光量記憶手段と、
上記受光量記憶手段に記憶された各パルス光の受光量から受光量の変化率を判別して出力する変化率判別手段と、
前記変化率判別手段により判別された変化率に基づいて前記距離判別手段により判別された距離を補正する距離補正手段と、を備えることを特徴とする反射型光電センサ。
The light receiving amount storage means for storing the amount of light received by each pulsed light for each light projecting operation according to claim 1,
A rate-of-change discriminating means for discriminating and outputting the rate of change of the received light amount from the received light amount of each pulsed light stored in the received light amount storage unit;
A reflection type photoelectric sensor comprising: a distance correction unit that corrects the distance determined by the distance determination unit based on the change rate determined by the change rate determination unit.
請求項1又は2において、前記投光量制御手段は、各投光動作におけるパルス光の数を任意に変更する機能を備えることを特徴とする反射型光電センサ。   3. The reflection type photoelectric sensor according to claim 1, wherein the light projection amount control means has a function of arbitrarily changing the number of pulse lights in each light projection operation. 請求項1又は2において、前記投光量制御手段は、所定時間の中で各投光動作におけるパルス数を任意に変更する機能を備えていることを特徴とする反射型光電センサ。   3. The reflective photoelectric sensor according to claim 1, wherein the light projection amount control means has a function of arbitrarily changing the number of pulses in each light projection operation within a predetermined time. 請求項1〜4のいずれか一項において、前記投光量制御手段は、各投光動作における各パルス光の投光量を任意に設定可能に構成されていることを特徴とする反射型光電センサ。   5. The reflection type photoelectric sensor according to claim 1, wherein the light projection amount control unit is configured to arbitrarily set a light projection amount of each pulsed light in each light projection operation. 6.
JP2012131765A 2012-06-11 2012-06-11 Reflection type photoelectric sensor Pending JP2012211913A (en)

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002131051A (en) * 2000-10-26 2002-05-09 Stanley Electric Co Ltd Distance detector
JP2005167703A (en) * 2003-12-03 2005-06-23 Tietech Co Ltd Detection method in photoelectric switch

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002131051A (en) * 2000-10-26 2002-05-09 Stanley Electric Co Ltd Distance detector
JP2005167703A (en) * 2003-12-03 2005-06-23 Tietech Co Ltd Detection method in photoelectric switch

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