JP2012134427A - Semiconductor device - Google Patents

Semiconductor device Download PDF

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JP2012134427A
JP2012134427A JP2010287489A JP2010287489A JP2012134427A JP 2012134427 A JP2012134427 A JP 2012134427A JP 2010287489 A JP2010287489 A JP 2010287489A JP 2010287489 A JP2010287489 A JP 2010287489A JP 2012134427 A JP2012134427 A JP 2012134427A
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notch
control board
connection member
height direction
semiconductor device
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Tatsuya Kondo
竜哉 近藤
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Aisin AW Co Ltd
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Aisin AW Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13091Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19107Disposition of discrete passive components off-chip wires

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  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)

Abstract

PROBLEM TO BE SOLVED: To achieve a semiconductor device which can simplify a manufacturing operation with inhibiting increase in manufacturing cost and the device size, and enhance long-term reliability of the device.SOLUTION: A semiconductor device includes a connection member 50 electrically connecting a semiconductor element 20 and a control substrate 30. In the control substrate 30, a notched part 40 penetrating the control substrate 30 in a height direction H and opening on an exterior edge of the control substrate 30 is formed. A connection member 50 extends from a base 51 fixed on the semiconductor substrate 10 side in an extension direction E slanting with respect to the height direction H and fixed to the control substrate 30 by a brazing filler metal 60 in a state of penetrating the notched part 40 in the height direction H. An opening direction O of the notched part 40 is the same direction as the extension direction E when viewed from above in the height direction H.

Description

本発明は、素子配置面に半導体素子が配置された半導体基板と、半導体素子を制御するとともに素子配置面に直交する高さ方向に半導体基板から離間して配置された制御基板と、を備えた半導体装置に関する。   The present invention includes a semiconductor substrate in which a semiconductor element is arranged on an element arrangement surface, and a control board that controls the semiconductor element and is arranged apart from the semiconductor substrate in a height direction orthogonal to the element arrangement surface. The present invention relates to a semiconductor device.

上記のような半導体装置として、例えば下記の特許文献1に記載された装置が既に知られている。以下、この背景技術の説明では、特許文献1の符号又は名称を適宜()内に記載して引用する。この特許文献1に記載の装置では、当該文献の図1に示されているように、半導体素子(3)と制御基板(6)とを電気的に接続する接続部材(中継端子5)が備えられ、この接続部材を介して半導体素子を制御するための制御信号が伝達される。   As such a semiconductor device, for example, a device described in Patent Document 1 below is already known. Hereinafter, in the description of the background art, the code or name of Patent Document 1 is appropriately described in () and cited. In the apparatus described in Patent Document 1, as shown in FIG. 1 of the document, a connection member (relay terminal 5) for electrically connecting the semiconductor element (3) and the control board (6) is provided. Then, a control signal for controlling the semiconductor element is transmitted through the connection member.

ところで、半導体基板と制御基板とは高さ方向に離間して配置されるため、接続部材は高さ方向に延びる部分を有して構成される。特許文献1に記載の構成では、接続部材は、半導体基板側に固定された基部から高さ方向と平行な方向に延び、制御基板に設けられた孔部(スルーホール6a)を貫通するように設けられる。接続部材は、孔部におけるはんだ接合により制御基板に対して固定される。そして、特許文献1に記載の構成では、接続部材の孔部への挿入時に当該接続部材の先端部を案内するための案内部材(ガイド部材7)を制御基板の下面に備えている。これにより、半導体装置の製造時において接続部材の孔部への挿入が容易になり、組み立てが容易な半導体装置が得られるとされている。   By the way, since the semiconductor substrate and the control substrate are spaced apart from each other in the height direction, the connection member is configured to have a portion extending in the height direction. In the configuration described in Patent Document 1, the connection member extends from the base fixed to the semiconductor substrate side in a direction parallel to the height direction, and penetrates the hole (through hole 6a) provided in the control substrate. Provided. The connecting member is fixed to the control board by solder bonding in the hole. And in the structure of patent document 1, the guide member (guide member 7) for guiding the front-end | tip part of the said connection member at the time of insertion to the hole of a connection member is provided in the lower surface of the control board. This makes it easy to insert the connection member into the hole during manufacture of the semiconductor device, thereby obtaining a semiconductor device that can be easily assembled.

しかしながら、特許文献1に記載の構成では、半導体装置の製造時の作業の容易化を図ることができるものの、案内部材を別途備える必要があるため、部品点数の増加により製造コストが増大したり、案内部材を配置するためのスペースにより装置が大型化するおそれがある。また、接続部材と制御基板とが、全周において制御基板により区画された孔部において接合されるため、接合部における欠陥の有無を外観検査により発見するのは容易ではない。そのため、装置の長期信頼性が低下するおそれもある。   However, in the configuration described in Patent Document 1, although it is possible to facilitate the work at the time of manufacturing the semiconductor device, it is necessary to separately include a guide member, so that the manufacturing cost increases due to an increase in the number of parts, There is a possibility that the apparatus becomes large due to the space for arranging the guide member. In addition, since the connecting member and the control board are joined in the holes defined by the control board on the entire circumference, it is not easy to detect the presence or absence of defects in the joint by visual inspection. Therefore, the long-term reliability of the device may be reduced.

特開2004−87605号公報JP 2004-87605 A

そこで、製造コストの増大や装置の大型化を抑制しつつ製造作業の容易化を図ることができるとともに、装置の長期信頼性の向上も図ることができる半導体装置の実現が望まれる。   Therefore, it is desired to realize a semiconductor device that can facilitate manufacturing work while suppressing an increase in manufacturing cost and an increase in size of the device, and can improve long-term reliability of the device.

本発明に係る素子配置面に半導体素子が配置された半導体基板と、前記半導体素子を制御するとともに前記素子配置面に直交する高さ方向に前記半導体基板から離間して配置された制御基板と、を備えた半導体装置の特徴構成は、前記半導体素子と前記制御基板とを電気的に接続する接続部材を備え、前記制御基板には、当該制御基板を前記高さ方向に貫通すると共に、当該制御基板の外縁部に開口する切欠部が形成され、前記接続部材は、前記半導体基板側に固定された基部から、前記高さ方向に対して傾斜した延在方向に延び、前記切欠部内を前記高さ方向に貫通した状態で鑞材により前記制御基板に接合されており、前記高さ方向に沿った平面視で、前記切欠部の開口方向が、前記延在方向と同じ方向とされている点にある。   A semiconductor substrate in which a semiconductor element is arranged on an element arrangement surface according to the present invention; and a control board that controls the semiconductor element and is arranged apart from the semiconductor substrate in a height direction orthogonal to the element arrangement surface; The semiconductor device comprising: a semiconductor device comprising: a connection member that electrically connects the semiconductor element and the control board; the control board penetrates the control board in the height direction and the control board A notch is formed in an outer edge of the substrate, and the connection member extends from a base fixed to the semiconductor substrate in an extending direction inclined with respect to the height direction, and the inside of the notch is It is joined to the control substrate by a brazing material in a state penetrating in the vertical direction, and the opening direction of the notch is the same direction as the extending direction in a plan view along the height direction. It is in.

本願では、2つの方向に関して「同じ方向」とは、当該2つの方向が完全に同じ向きである場合だけでなく、製造上の誤差に応じたずれを含む概念として用いている。製造上の誤差は、例えば、寸法や取付位置の公差の範囲内のずれにより生じる。   In the present application, the “same direction” with respect to the two directions is used as a concept including not only a case where the two directions are completely the same direction but also a deviation corresponding to a manufacturing error. An error in manufacturing occurs due to, for example, a deviation within a tolerance range of dimensions and mounting positions.

上記の特徴構成によれば、半導体装置の製造時に、接続部材を比較的容易に切欠部内に挿入することができる。すなわち、半導体装置の製造時に、接続部材に対して制御基板を高さ方向に近づけることで、平面視で切欠部の開口方向と同じ方向に延在する接続部材が、開口方向側に位置する部分から順次切欠部内に挿入されることになる。よって、接続部材の寸法や取付位置、或いは延在方向の誤差を吸収することが容易となる。また、半導体装置の製造時に、接続部材に対して制御基板を高さ方向に交差する方向に近づけ、接続部材を切欠部に対して開口部側から挿入する場合にも、同様に、接続部材の寸法や取付位置、或いは延在方向の誤差を吸収することが容易となる。よって、接続部材を切欠部内に比較的容易に挿入することができる。
以上のように、上記の特徴構成によれば、案内部材のような特別な部材を別途備えることなく、半導体装置の製造時に接続部材を比較的容易に切欠部内に挿入することができる。すなわち、製造コストの増大や装置の大型化が抑制される形態で製造作業の容易化が図られた半導体装置を提供することができる。
また、上記の特徴構成によれば、接続部材と制御基板との鑞材による接合部が、全周を制御基板により区画された孔部ではなく、制御基板の外縁部に開口する切欠部に形成される。このため、制御基板により遮られない方向(すなわち、開口部側)から接合部の外観検査を行うことができる。よって、鑞材の不濡れ等の接合部における欠陥を発見するのが比較的容易になり、装置の長期信頼性の向上を図ることができる。
According to said characteristic structure, a connection member can be inserted in a notch part comparatively easily at the time of manufacture of a semiconductor device. That is, when the semiconductor device is manufactured, the connection member extending in the same direction as the opening direction of the notch portion in a plan view is located on the opening direction side by bringing the control substrate closer to the height direction with respect to the connection member. Are sequentially inserted into the notch. Therefore, it becomes easy to absorb the error of the dimension of the connecting member, the mounting position, or the extending direction. Similarly, when the semiconductor device is manufactured, the control board is brought close to the direction intersecting the height direction with respect to the connection member, and the connection member is inserted into the cutout portion from the opening side in the same manner. It becomes easy to absorb errors in dimensions, mounting positions, or extending directions. Therefore, the connecting member can be inserted into the cutout portion relatively easily.
As described above, according to the above-described characteristic configuration, the connection member can be inserted into the notch portion relatively easily during the manufacture of the semiconductor device without separately providing a special member such as a guide member. That is, it is possible to provide a semiconductor device in which the manufacturing operation is facilitated in a form in which an increase in manufacturing cost and an increase in size of the device are suppressed.
In addition, according to the above-described characteristic configuration, the joint portion of the connecting member and the control board formed by the brazing material is not formed in the hole portion partitioned by the control board on the entire circumference but in the notch that opens to the outer edge of the control board. Is done. For this reason, the appearance inspection of the joint portion can be performed from the direction not blocked by the control substrate (that is, the opening side). Therefore, it becomes relatively easy to find defects in the joint such as non-wetting of the brazing material, and the long-term reliability of the apparatus can be improved.

ここで、前記接続部材は、前記切欠部の前記開口方向とは反対側における前記制御基板との境界縁部である底部に当接した状態で前記制御基板に接合されていると好適である。   Here, it is preferable that the connection member is bonded to the control board in a state where the connection member is in contact with a bottom portion which is a boundary edge with the control board on a side opposite to the opening direction of the notch.

この構成によれば、接合の対象となる2つの部材である接続部材と制御基板とが、接合部において当接した状態で鑞材による接合作業を行うことができるため、接合作業が容易になるとともに、信頼性の高い接合を行うことが可能となる。   According to this configuration, since the connecting member, which is two members to be joined, and the control board can be joined with the brazing material in a state where they are in contact with each other at the joined portion, the joining work is facilitated. At the same time, highly reliable joining can be performed.

上記のように、前記接続部材が前記底部に当接した状態で前記制御基板に接合されている構成において、前記接続部材は、前記切欠部の前記底部により前記開口方向に押圧されて弾性変形した状態で前記底部に当接していると好適である。   As described above, in the configuration in which the connection member is bonded to the control board in contact with the bottom portion, the connection member is elastically deformed by being pressed in the opening direction by the bottom portion of the notch portion. It is preferable that it is in contact with the bottom in a state.

この構成によれば、接続部材と切欠部の底部とが当接した状態を容易に維持することができるため、上述した接合作業の容易化や接合の信頼性の向上をより確実に図ることができる。   According to this configuration, the state in which the connection member and the bottom of the notch are in contact with each other can be easily maintained, so that the above-described joining work can be facilitated and the joining reliability can be more reliably improved. it can.

上記の各構成の半導体装置において、前記切欠部は、前記平面視で、前記開口方向に向かうに従って、当該開口方向に直交する方向の幅が広くなるように形成されていると好適である。   In the semiconductor device having each configuration described above, it is preferable that the cutout portion is formed so that a width in a direction orthogonal to the opening direction becomes wider as it goes in the opening direction in the plan view.

接続部材に対して制御基板を高さ方向に近づけることで接続部材を切欠部内に挿入する場合、及び、接続部材に対して制御基板を高さ方向に交差する方向に近づけ、接続部材を切欠部に対して開口部側から挿入する場合の双方において、接続部材は、切欠部内を開口部側から底部側に向かって移動する。
この点に鑑み、上記の構成によれば、切欠部における接続部材が最初に入る部分の幅を広くして接続部材が容易に切欠部内に導入されるように構成することができる。そして、接続部材の一部が切欠部内に入ると、その後は切欠部の内面を接続部材のガイドとして機能させて、接続部材を切欠部内の所定位置まで移動させることができる。すなわち、上記の構成によれば、高さ方向及び開口方向の双方に直交する方向(開口幅方向)における接続部材の寸法や取付位置の誤差、或いは延在方向の誤差を吸収することが容易となる。
When the connection member is inserted into the notch by bringing the control board closer to the connection member in the height direction, and the connection member is moved closer to the direction intersecting the height direction than the connection member, and the connection member is moved to the notch. In both cases of insertion from the opening side, the connecting member moves in the notch from the opening side toward the bottom side.
In view of this point, according to the above configuration, it is possible to increase the width of the portion where the connection member first enters in the cutout portion so that the connection member is easily introduced into the cutout portion. When a part of the connection member enters the notch, the inner surface of the notch can then function as a guide for the connection member, and the connection member can be moved to a predetermined position in the notch. That is, according to the above configuration, it is easy to absorb the error in the dimension of the connecting member and the mounting position in the direction (opening width direction) orthogonal to both the height direction and the opening direction, or the error in the extending direction. Become.

本発明の実施形態に係る半導体装置の分解斜視図である。1 is an exploded perspective view of a semiconductor device according to an embodiment of the present invention. 本発明の実施形態に係る半導体装置の上面図である。1 is a top view of a semiconductor device according to an embodiment of the present invention. 図2におけるIII−III断面図である。It is III-III sectional drawing in FIG. 図2におけるIV−IV断面図である。It is IV-IV sectional drawing in FIG. 本発明の実施形態に係る接続部材と制御基板との接合部近傍の拡大断面図である。It is an expanded sectional view of the junction part vicinity of the connection member and control board concerning the embodiment of the present invention. 本発明の実施形態に係る接続部材挿入工程の説明図である。It is explanatory drawing of the connection member insertion process which concerns on embodiment of this invention.

本発明に係る半導体装置の実施形態について、図面を参照して説明する。ここでは、本発明に係る半導体装置を、半導体素子としてスイッチング素子20を備えた半導体装置100に適用した場合を例として説明する。図1に示すように、本実施形態に係る半導体装置100は、素子配置面11にスイッチング素子20が配置された半導体基板10と、スイッチング素子20を制御する制御基板30と、スイッチング素子20と制御基板30とを電気的に接続する接続部材50を備えている。   Embodiments of a semiconductor device according to the present invention will be described with reference to the drawings. Here, a case where the semiconductor device according to the present invention is applied to the semiconductor device 100 including the switching element 20 as a semiconductor element will be described as an example. As shown in FIG. 1, the semiconductor device 100 according to the present embodiment includes a semiconductor substrate 10 in which a switching element 20 is arranged on an element arrangement surface 11, a control board 30 that controls the switching element 20, a switching element 20, and a control. A connection member 50 for electrically connecting the substrate 30 is provided.

このような構成において、本実施形態に係る半導体装置100では、制御基板30に当該制御基板30の外縁部31に開口する切欠部40が形成されているとともに、接続部材50が、基部51から高さ方向Hに対して傾斜した延在方向Eに延び、切欠部40内を高さ方向Hに貫通した状態ではんだ60により制御基板30に接合されている(図3)。そして、高さ方向Hに沿った平面視で、切欠部40の開口方向Oが、延在方向Eと同じ方向とされている(図2)。これにより、半導体装置100の製造時に接続部材50を比較的容易に切欠部40内に挿入することが可能となり、製造作業の容易化を図ることが可能となっている。以下、本実施形態に係る半導体装置100の構成について、「半導体装置の構成」、「切欠部の構成」、「半導体装置の製造方法」の順に説明する。   In such a configuration, in the semiconductor device 100 according to the present embodiment, the control board 30 is formed with the notch portion 40 that opens to the outer edge portion 31 of the control board 30, and the connection member 50 is high from the base 51. It extends in the extending direction E inclined with respect to the height direction H, and is joined to the control board 30 by the solder 60 in a state of penetrating the notch 40 in the height direction H (FIG. 3). And the opening direction O of the notch part 40 is made into the same direction as the extending direction E by planar view along the height direction H (FIG. 2). As a result, the connection member 50 can be inserted into the cutout portion 40 relatively easily when the semiconductor device 100 is manufactured, and the manufacturing operation can be facilitated. Hereinafter, the configuration of the semiconductor device 100 according to the present embodiment will be described in the order of “semiconductor device configuration”, “notch configuration”, and “semiconductor device manufacturing method”.

なお、以下の説明では、「上」は、素子配置面11に直交する高さ方向Hに沿って半導体基板10から制御基板30側へ向かう方向(図1における上方)を指し、「下」は、高さ方向Hに沿って制御基板30から半導体基板10側へ向かう方向(図1における下方)を指す。なお、高さ方向Hは、素子配置面11が水平面と平行に配置された構成では、鉛直方向となる。また、以下の説明では、特に断らない限り、半導体装置100を構成する各部材についての方向は、これらが半導体装置100に組み付けられた状態での方向を表す。なお、各部材についての方向や、2つの部材間の配置方向の関係(例えば、「平行」や「直交」等)は、製造上の誤差に応じたずれを含む概念として用いている。このような製造上の誤差は、例えば、寸法や取り付け位置の公差の範囲内のずれにより生じる。   In the following description, “upper” indicates a direction (upward in FIG. 1) from the semiconductor substrate 10 toward the control substrate 30 along the height direction H orthogonal to the element arrangement surface 11, and “lower” , The direction from the control substrate 30 toward the semiconductor substrate 10 along the height direction H (downward in FIG. 1). The height direction H is the vertical direction in the configuration in which the element arrangement surface 11 is arranged in parallel with the horizontal plane. In the following description, unless otherwise specified, the direction of each member constituting the semiconductor device 100 indicates the direction in which these members are assembled to the semiconductor device 100. Note that the direction of each member and the relationship of the arrangement direction between the two members (for example, “parallel”, “orthogonal”, etc.) are used as a concept including a deviation corresponding to a manufacturing error. Such manufacturing errors are caused, for example, by deviations within the tolerances of dimensions and mounting positions.

1.半導体装置の構成
図1から図3に示すように、半導体装置100は、ケース1と、ケース1の下側に固定されたベース板2と、ケース1の上側に固定された制御基板30とを備えている。ケース1は、図1に示すように、高さ方向Hに延びる壁部を有する枠状に形成されている。また、ケース1が備える壁部の一部は上面部が切り欠かれており、ケース1は、制御基板30の下面部に当接する第一上面部1aと、第一上面部1aに対して下側に位置する第二上面部1bとを有する。なお、図1では、発明の理解を容易にすべく、ケース1の一部を切り欠いて表している。
1. Configuration of Semiconductor Device As shown in FIGS. 1 to 3, the semiconductor device 100 includes a case 1, a base plate 2 fixed to the lower side of the case 1, and a control board 30 fixed to the upper side of the case 1. I have. As shown in FIG. 1, the case 1 is formed in a frame shape having a wall portion extending in the height direction H. In addition, a part of the wall portion included in the case 1 is cut away from the upper surface portion. And a second upper surface portion 1b located on the side. In FIG. 1, a part of the case 1 is cut out to facilitate understanding of the invention.

上記のようにケース1を構成することで、ケース1の上側に制御基板30が固定された状態で、図3に示すように、第二上面部1bと制御基板30との間には隙間Gが形成される。そして、この隙間Gを形成することで、後述するように、接続部材50と制御基板30との接合部の外観検査が容易となっている。なお、ケース1は、本例では、絶縁性の材料(例えば樹脂等)により形成されている。   By configuring the case 1 as described above, a gap G is formed between the second upper surface portion 1b and the control board 30 as shown in FIG. 3 with the control board 30 fixed to the upper side of the case 1. Is formed. By forming this gap G, it is easy to inspect the appearance of the joint between the connection member 50 and the control board 30 as described later. In this example, the case 1 is formed of an insulating material (for example, resin).

ベース板2は、半導体基板10を配置するためのベースとなる板状の部材であり、ケース1の下部に固定されている。ベース板2は、熱伝導性を備える材料(例えば、銅やアルミニウム等の金属材料や樹脂材料)で形成され、下面には放熱フィン4が形成されている。ベース板2は、締結ボルトや接着部材等によりケース1の下面部に固定される。なお、ベース板2がケース1と一体的に形成された構成とすることもできる。   The base plate 2 is a plate-like member that serves as a base for placing the semiconductor substrate 10, and is fixed to the lower portion of the case 1. The base plate 2 is formed of a material having thermal conductivity (for example, a metal material such as copper or aluminum, or a resin material), and heat radiating fins 4 are formed on the lower surface. The base plate 2 is fixed to the lower surface portion of the case 1 with fastening bolts, adhesive members, or the like. Note that the base plate 2 may be formed integrally with the case 1.

制御基板30は、スイッチング素子20を制御するための制御回路を備え、半導体基板10から高さ方向Hに離間して配置されている。制御基板30には挿通孔95が形成されており、挿通孔95に上側から挿入された締結ボルト96(図2参照)がケース1の上面部(第一上面部1a)に形成された締結孔94に固定されることで、制御基板30がケース1に対して上下方向に締結固定される。   The control board 30 includes a control circuit for controlling the switching element 20, and is arranged away from the semiconductor substrate 10 in the height direction H. An insertion hole 95 is formed in the control board 30, and a fastening bolt 96 (see FIG. 2) inserted into the insertion hole 95 from above is formed in the upper surface portion (first upper surface portion 1 a) of the case 1. By being fixed to 94, the control board 30 is fastened and fixed to the case 1 in the vertical direction.

本例ではケース1、ベース板2、及び制御基板30は、高さ方向Hに沿った平面視(以下、単に「平面視」という。)における外縁部が、互いに同じ大きさの矩形状となるように形成されている。また、ベース板2、ケース1、及び制御基板30は、記載の順に、高さ方向Hに沿って互いに平行な状態で積み重なるように配置され、これらのケース1、ベース板2、及び制御基板30により囲まれた直方体状の空間に、図1及び図3に示すように、半導体基板10が収容されている。本例では、複数(例えば、6個や12個)の半導体基板10が当該直方体状の空間内に配置されている。   In this example, the outer edges of the case 1, the base plate 2, and the control board 30 in a plan view (hereinafter simply referred to as “plan view”) along the height direction H are rectangular with the same size. It is formed as follows. The base plate 2, the case 1, and the control board 30 are arranged so as to be stacked in parallel with each other along the height direction H in the order described, and the case 1, the base board 2, and the control board 30 are stacked. As shown in FIGS. 1 and 3, the semiconductor substrate 10 is accommodated in a rectangular parallelepiped space surrounded by. In this example, a plurality of (for example, six or twelve) semiconductor substrates 10 are arranged in the rectangular parallelepiped space.

半導体基板10は、上面がスイッチング素子20を配置するための素子配置面11とされている。本例では、半導体基板10は、導電性の材料(例えば、銅やアルミニウム等の金属材料)で形成されており、樹脂等で形成された絶縁部材3を介してベース板2の上面に配置されている。図3に示すように、半導体基板10は、絶縁部材3に対して平行に配置されており、これにより、本例では、ベース板2、制御基板30、及び半導体基板10が、互いに平行に配置される。本実施形態では、スイッチング素子20が本発明における「半導体素子」に相当する。スイッチング素子20は、例えばIGBTやMOSFET等を用いることができる。   The upper surface of the semiconductor substrate 10 is an element arrangement surface 11 for arranging the switching element 20. In this example, the semiconductor substrate 10 is formed of a conductive material (for example, a metal material such as copper or aluminum), and is disposed on the upper surface of the base plate 2 via an insulating member 3 formed of resin or the like. ing. As shown in FIG. 3, the semiconductor substrate 10 is arranged in parallel to the insulating member 3, and in this example, the base plate 2, the control board 30, and the semiconductor substrate 10 are arranged in parallel to each other. Is done. In the present embodiment, the switching element 20 corresponds to a “semiconductor element” in the present invention. As the switching element 20, for example, an IGBT or a MOSFET can be used.

本実施形態では、半導体基板10が備える素子配置面11には、スイッチング素子20が配置されるとともに、スイッチング素子20に隣接してダイオード素子21が配置されている。また、図示は省略するが、スイッチング素子20やダイオード素子21の上面、及び半導体基板10の上面には接続端子が配置され、当該接続端子に、直流電源や回転電機(共に図示せず)との間の電流経路を構成するバスバーが接続される。そして、制御基板30にて生成されたスイッチング信号(本例では、ゲート駆動信号)に従ってスイッチング素子20がオンオフ動作(スイッチング動作)することで、直流電源からの直流電圧が交流電圧に変換されて回転電機に供給される。すなわち、本例では、スイッチング素子20とダイオード素子21とにより回転電機を制御するためのインバータ回路が形成されており、半導体装置100は、回転電機を駆動制御するためのインバータ装置とされている。   In the present embodiment, the switching element 20 is arranged on the element arrangement surface 11 provided in the semiconductor substrate 10, and the diode element 21 is arranged adjacent to the switching element 20. Although not shown, connection terminals are arranged on the upper surface of the switching element 20 and the diode element 21 and on the upper surface of the semiconductor substrate 10, and the connection terminal is connected to a DC power source or a rotating electrical machine (both not shown). The bus bars constituting the current path between them are connected. Then, the switching element 20 is turned on / off (switching operation) in accordance with the switching signal generated in the control board 30 (in this example, the gate drive signal), whereby the DC voltage from the DC power source is converted into an AC voltage and rotated. Supplied to the electric machine. That is, in this example, an inverter circuit for controlling the rotating electrical machine is formed by the switching element 20 and the diode element 21, and the semiconductor device 100 is an inverter device for driving and controlling the rotating electrical machine.

図1に示すように、スイッチング素子20には、電極20a(例えばゲート電極)が5つ設けられており、スイッチング素子20に設けられた電極20aと制御基板30との間を電気的に接続するように、接続部材50が配置されている。接続部材50は、図1及び図3に示すように、半導体基板10側に固定された基部51から、高さ方向Hに対して傾斜した延在方向Eに延び、切欠部40内を高さ方向Hに貫通するように配置されている。なお、切欠部40の構成については、後の「2.切欠部の構成」の項で詳細に説明する。接続部材50は、導電性の材料(例えば、銅やアルミニウム等の金属材料)で形成されている。また、接続部材50は、延在方向(通電方向に同じ)に直交する断面の形状が延在方向に沿って一様に形成されており、本例では、接続部材50の断面形状は矩形状とされている。   As shown in FIG. 1, the switching element 20 includes five electrodes 20 a (for example, gate electrodes), and electrically connects the electrode 20 a provided on the switching element 20 and the control substrate 30. Thus, the connection member 50 is arranged. As shown in FIGS. 1 and 3, the connection member 50 extends from a base 51 fixed to the semiconductor substrate 10 side in an extending direction E inclined with respect to the height direction H, and has a height in the notch 40. They are arranged so as to penetrate in the direction H. The configuration of the notch 40 will be described in detail later in the section “2. Configuration of the notch”. The connection member 50 is formed of a conductive material (for example, a metal material such as copper or aluminum). In addition, the connecting member 50 has a cross-sectional shape that is orthogonal to the extending direction (same as the energizing direction) and is formed uniformly along the extending direction. In this example, the connecting member 50 has a rectangular cross-sectional shape. It is said that.

本実施形態では、図3に示すように、接続部材50は、一部がケース1内に収容されるとともに高さ方向Hに直交する方向に延びる第一部分と、第一部分の端部から高さ方向Hに対して交差する方向に延びるとともに一部がケース1内に収容された第二部分との、延在方向が互いに異なる2つの部分を連結してなる。そして、接続部材50の上記第一部分が基部51を構成し、上記第二部分が本体部を構成している。また、接続部材50の第二部分(本体部)の第一部分(基部51)とは反対側の端部が、接続部材50の先端部52を構成している。本実施形態では、「第二部分(本体部)の延在方向」をEとしている。なお、この延在方向Eは、高さ方向Hに対して交差する方向であり、高さ方向Hから所定角度だけ傾斜した方向とされている。所定角度は、例えば、5度未満の角度や10度未満の角度、或いは、15度未満の角度や20度未満の角度から選択した角度とすることができる。   In the present embodiment, as shown in FIG. 3, the connection member 50 is partly housed in the case 1 and extends in a direction perpendicular to the height direction H, and the height from the end of the first portion. Two parts that extend in a direction intersecting with the direction H and partially extend in the extending direction are connected to a second part accommodated in the case 1. And the said 1st part of the connection member 50 comprises the base 51, and the said 2nd part comprises the main-body part. Further, the end portion of the connection member 50 opposite to the first portion (base portion 51) of the second portion (main body portion) constitutes the distal end portion 52 of the connection member 50. In the present embodiment, “the extending direction of the second part (main body part)” is E. The extending direction E is a direction that intersects the height direction H, and is inclined from the height direction H by a predetermined angle. The predetermined angle can be, for example, an angle selected from an angle of less than 5 degrees, an angle of less than 10 degrees, an angle of less than 15 degrees, and an angle of less than 20 degrees.

図1及び図3に示すように、接続部材50の基部51とスイッチング素子20に設けられた電極20aとは、導電性のワイヤ(ボンディングワイヤ)91と、絶縁部材3の上面に形成された電極パッド90とを介して電気的に接続されている。また、接続部材50の先端部52側の部分は、切欠部40内を高さ方向Hに貫通した状態で、はんだ60により制御基板30に接合されている。本実施形態では、はんだ60が本発明における「鑞材」に相当する。なお、本発明では、主成分として含まれる金属の種類(例えば、錫等)によらず種々のはんだを採用することができる。   As shown in FIGS. 1 and 3, the base 51 of the connection member 50 and the electrode 20 a provided on the switching element 20 are composed of a conductive wire (bonding wire) 91 and an electrode formed on the upper surface of the insulating member 3. It is electrically connected to the pad 90. Further, the portion of the connecting member 50 on the tip end portion 52 side is joined to the control board 30 by the solder 60 in a state of penetrating the notch 40 in the height direction H. In the present embodiment, the solder 60 corresponds to “a brazing material” in the present invention. In the present invention, various solders can be employed regardless of the type of metal (eg, tin) contained as the main component.

また、図示は省略するが、本実施形態では、ケース1とベース板2とにより形成される凹状の空間には、素子の保護や短絡の防止等のための絶縁樹脂が充填されている。絶縁樹脂は、例えばエポキシ樹脂やウレタン樹脂等の電気的絶縁性を有する硬質の樹脂とされ、少なくとも、スイッチング素子20、ダイオード素子21、ワイヤ91を覆う高さまで設けられている。なお、このような絶縁樹脂が設けられない構成とすることも可能である。   Although not shown, in the present embodiment, the concave space formed by the case 1 and the base plate 2 is filled with an insulating resin for protecting elements, preventing short circuits, and the like. The insulating resin is a hard resin having electrical insulation properties such as an epoxy resin or a urethane resin, and is provided to a height that covers at least the switching element 20, the diode element 21, and the wire 91. Note that a configuration in which such an insulating resin is not provided is also possible.

2.切欠部の構成
次に、制御基板30に形成されている切欠部40の構成について説明する。切欠部40は、図1から図3に示すように、制御基板30を高さ方向Hに貫通すると共に、当該制御基板30の外縁部31に開口するように形成されている。すなわち、切欠部40は、制御基板30を厚さ方向(高さ方向H)の全域に亘って外縁部31から内側に切り欠いて形成されている。そして、本例では、切欠部40は、高さ方向Hに直交する断面の形状(図5)が、高さ方向Hに一様に形成されている。
2. Next, the configuration of the notch 40 formed in the control board 30 will be described. As shown in FIGS. 1 to 3, the cutout portion 40 is formed so as to penetrate the control board 30 in the height direction H and open to the outer edge portion 31 of the control board 30. That is, the notch 40 is formed by notching the control substrate 30 inward from the outer edge 31 over the entire region in the thickness direction (height direction H). In this example, the cutout 40 has a cross-sectional shape (FIG. 5) orthogonal to the height direction H that is uniformly formed in the height direction H.

切欠部40は、図2に示すように、平面視で開口方向Oが対象となる接続部材50の延在方向Eと同じ方向となるように形成されている。なお、図2における「O(E)」は、延在方向Eを高さ方向Hに直交する面に投影した方向が開口方向Oと等しくなることを表す。これにより、切欠部40を高さ方向Hに貫通した状態ではんだ60により制御基板30に固定されている接続部材50は、図2に示すように、平面視で切欠部40と重複する(切欠部40内に位置する)部分を有するように配置される。   As shown in FIG. 2, the notch 40 is formed so that the opening direction O is the same as the extending direction E of the connection member 50 as a target in plan view. Note that “O (E)” in FIG. 2 indicates that the direction in which the extending direction E is projected onto a plane orthogonal to the height direction H is equal to the opening direction O. Thereby, the connection member 50 fixed to the control board 30 with the solder 60 in a state of penetrating the notch 40 in the height direction H overlaps with the notch 40 in a plan view (notch) as shown in FIG. (Positioned within the portion 40).

具体的には、接続部材50における制御基板30との接合部から先端部52までの間の接合部側の少なくとも一部(本例では全部)が、平面視で切欠部40と重複する(切欠部40内に位置する)ように配置される。なお、接合部から先端部52までの間の接合部側の一部のみが平面視で切欠部40と重複するように配置される構成では、当該一部と先端部52側の残りの一部との境界部は、平面視で開口部42を跨ぐように配置される。   Specifically, at least a part (all in this example) of the connecting member 50 between the joint part with the control board 30 and the tip part 52 in the connection member 50 overlaps with the notch part 40 in a plan view (notch part). (Positioned within the portion 40). In the configuration in which only a part on the joint part side from the joint part to the tip part 52 is arranged so as to overlap the notch part 40 in a plan view, the part and the remaining part on the tip part 52 side. Is arranged so as to straddle the opening 42 in plan view.

なお、本例では、複数の接続部材50が備えられており、複数の接続部材50のそれぞれに対応して接続部材50と同数の切欠部40が制御基板30に形成されている。なお、図1には、矩形状に形成された制御基板30の一辺にのみ切欠部40が形成されているが、他辺(例えば、上記一辺とは反対側の辺)にも切欠部40が設けられた構成とすることできる。   In this example, a plurality of connection members 50 are provided, and the same number of cutout portions 40 as the connection members 50 are formed in the control board 30 corresponding to each of the plurality of connection members 50. In FIG. 1, the cutout 40 is formed only on one side of the control board 30 formed in a rectangular shape, but the cutout 40 is also formed on the other side (for example, the side opposite to the one side). It can be set as the provided structure.

上記のように、平面視で、切欠部40の開口方向Oが延在方向Eと同じ方向となるように配置することで、半導体装置100の製造時に、接続部材50の寸法や取付位置、或いは延在方向Eの誤差を吸収することが容易となり、接続部材50を比較的容易に切欠部40内に挿入することが可能となっている。   As described above, by arranging the opening direction O of the notch 40 in the same direction as the extending direction E in plan view, the dimensions and mounting positions of the connection member 50 or the mounting position when the semiconductor device 100 is manufactured, or It becomes easy to absorb the error in the extending direction E, and the connecting member 50 can be inserted into the notch 40 relatively easily.

補足説明すると、半導体装置100の製造時に、接続部材50に対して制御基板30を高さ方向Hに近づける場合には、平面視で切欠部40の開口方向Oと同じ方向に延在する接続部材50が、開口方向O側に位置する部分から順次切欠部40内に挿入される。より正確には、接続部材50における、平面視で切欠部40内に位置する部分の中で最も上方に位置する部分(本例では、先端部52)から順次、切欠部40内に挿入される。   Supplementally, when the control substrate 30 is brought close to the height direction H with respect to the connection member 50 when the semiconductor device 100 is manufactured, the connection member extends in the same direction as the opening direction O of the notch 40 in plan view. 50 are sequentially inserted into the notch 40 from the portion located on the opening direction O side. More precisely, the connecting member 50 is inserted into the notch 40 sequentially from the uppermost part (in this example, the tip 52) of the parts located in the notch 40 in plan view. .

また、半導体装置100の製造時に、接続部材50に対して制御基板30を高さ方向Hに交差する方向(例えば、高さ方向Hに直交或いは略直交する方向)に近づける場合には、接続部材50が、切欠部40に対して開口部42側から挿入される。よって、いずれの場合でも、接続部材50の寸法や取付位置、或いは延在方向Eの誤差を吸収することが容易な構成となっており、接続部材50を切欠部40内に比較的容易に挿入することができる。   Further, when the semiconductor device 100 is manufactured, when the control substrate 30 is brought close to the direction intersecting the height direction H with respect to the connection member 50 (for example, a direction orthogonal or substantially orthogonal to the height direction H), the connection member is used. 50 is inserted into the notch 40 from the opening 42 side. Therefore, in any case, it is easy to absorb the dimension and mounting position of the connection member 50 or the error in the extending direction E, and the connection member 50 can be inserted into the notch 40 relatively easily. can do.

更に、本実施形態では、図5に示すように、切欠部40は、平面視で、開口方向Oに向かうに従って、当該開口方向Oに直交する方向(本例では、開口方向O及び高さ方向Hの双方に直交する開口幅方向)の幅Wが広くなるように形成されている。これにより、半導体装置100の製造時に、開口幅方向における接続部材50の寸法や取付位置の誤差、或いは延在方向Eの誤差を吸収することが容易となり、接続部材50を切欠部40内に更に容易に挿入することが可能となっている。   Furthermore, in the present embodiment, as shown in FIG. 5, the cutout portion 40 has a direction orthogonal to the opening direction O as viewed in a plan view (in this example, the opening direction O and the height direction). The width W in the opening width direction orthogonal to both H is formed to be wide. Thereby, it becomes easy to absorb the error of the dimension and the mounting position of the connecting member 50 in the opening width direction or the error of the extending direction E when the semiconductor device 100 is manufactured, and the connecting member 50 is further inserted into the notch 40. It can be easily inserted.

補足説明すると、接続部材50に対して制御基板30を高さ方向Hに近づけることで接続部材50を切欠部40内に挿入する場合、及び、接続部材50に対して制御基板30を高さ方向Hに交差する方向に近づけることで接続部材50を切欠部40内に挿入する場合の双方において、接続部材50は、切欠部40内を開口部42側から底部41側に向かって移動する。ここで、切欠部40の「底部41」とは、図5に示すように、切欠部40の開口方向Oとは反対側における制御基板30との境界縁部である。なお、本例では、図5に示すように、切欠部40の底部41は、平面視で円弧状に形成された部分であり、制御基板30の曲面壁部により構成されている。   To supplementally describe, when the connection member 50 is inserted into the notch 40 by bringing the control board 30 close to the height direction H with respect to the connection member 50, and in the height direction with respect to the connection member 50. In both cases where the connection member 50 is inserted into the notch 40 by approaching the direction intersecting H, the connection member 50 moves in the notch 40 from the opening 42 side toward the bottom 41 side. Here, the “bottom 41” of the cutout 40 is a boundary edge with the control substrate 30 on the opposite side of the opening direction O of the cutout 40 as shown in FIG. In this example, as shown in FIG. 5, the bottom 41 of the notch 40 is a portion formed in an arc shape in plan view, and is configured by a curved wall portion of the control board 30.

よって、上記のように、切欠部40の開口幅方向の幅Wが、開口方向Oに向かうに従って広くなるようにすることで、切欠部40における接続部材50が最初に入る部分の幅Wが広くなり、接続部材50を容易に切欠部40内に導入することができる。なお、接続部材50の一部が切欠部40内に入ると、その後は切欠部40の内面(切欠部40を区画する制御基板30の外面)をガイドとして機能させて、接続部材50を切欠部40内の所定位置(本例では底部41)まで移動させることができるため、開口幅方向における上記誤差の吸収が容易となる。   Therefore, as described above, by making the width W in the opening width direction of the cutout portion 40 wider toward the opening direction O, the width W of the portion where the connection member 50 first enters in the cutout portion 40 is wide. Thus, the connecting member 50 can be easily introduced into the notch 40. When a part of the connection member 50 enters the notch 40, the inner surface of the notch 40 (the outer surface of the control board 30 that defines the notch 40) is then used as a guide so that the connection member 50 is not cut. Since it can be moved to a predetermined position within 40 (the bottom 41 in this example), it is easy to absorb the error in the opening width direction.

本実施形態では、図3及び図5に示すように、接続部材50は、切欠部40の底部41に当接した状態で制御基板30に接合されている。なお、図5では、はんだ60は省略して示している。さらに、接続部材50は、切欠部40の底部41により開口方向Oに押圧されて弾性変形した状態で底部41に当接している(図6参照)。これにより、半導体装置100を製造する際の接続部材50と制御基板30との接合作業時に、接続部材50と制御基板30とが当接するとともに、弾性変形による復元力を利用して当該当接した状態を容易に維持することができる。その結果、接続部材50と制御基板30とのはんだ60による接合作業を容易に行うことが可能になるとともに、接合の信頼性を向上させることも可能になる。   In the present embodiment, as shown in FIGS. 3 and 5, the connection member 50 is joined to the control board 30 in a state of being in contact with the bottom 41 of the notch 40. In FIG. 5, the solder 60 is omitted. Furthermore, the connecting member 50 is in contact with the bottom 41 in a state where it is elastically deformed by being pressed in the opening direction O by the bottom 41 of the notch 40 (see FIG. 6). Thereby, at the time of joining operation of the connection member 50 and the control board 30 when the semiconductor device 100 is manufactured, the connection member 50 and the control board 30 come into contact with each other by using a restoring force due to elastic deformation. The state can be easily maintained. As a result, it is possible to easily perform the joining operation of the connecting member 50 and the control substrate 30 with the solder 60 and to improve the reliability of the joining.

接合の信頼性に関しては、さらに以下の点からも接合の信頼性の向上を図ることが可能となっている。すなわち、接続部材50と制御基板30とのはんだ60による接合部は、全周を制御基板30により区画された孔部(スルーホール等)ではなく、制御基板30の外縁部31に開口する切欠部40に形成される。これにより、切欠部40の開口部42側から接合部の外観検査を行う場合に、図4に示すように、制御基板30の上部に形成されるフィレットに加えて、切欠部40内におけるはんだ60を観察することができる。さらに、本実施形態では、上述したように、ケース1の第二上面部1bと制御基板30との間には隙間Gが形成されており(図3参照)、更に、制御基板30の下部に形成されるフィレットも観察することができる。これにより、はんだ60の不濡れ等の接合部における欠陥を発見するのが容易になり、接続部材50と制御基板30との接合部の長期信頼性の向上を図ることが可能となっている。   Regarding the reliability of bonding, it is possible to further improve the reliability of bonding from the following points. That is, the joint portion of the connecting member 50 and the control board 30 by the solder 60 is not a hole (through hole or the like) partitioned by the control board 30 on the entire periphery, but a notch that opens to the outer edge 31 of the control board 30. 40. As a result, when the appearance inspection of the joint portion is performed from the opening 42 side of the notch 40, the solder 60 in the notch 40 is added to the fillet formed on the upper portion of the control board 30 as shown in FIG. 4. Can be observed. Further, in the present embodiment, as described above, the gap G is formed between the second upper surface portion 1b of the case 1 and the control board 30 (see FIG. 3), and further below the control board 30. The fillets that are formed can also be observed. Thereby, it becomes easy to find defects in the joint portion such as non-wetting of the solder 60, and it is possible to improve the long-term reliability of the joint portion between the connection member 50 and the control substrate 30.

なお、このような切欠部40は、打ち抜き加工やルーター加工等により形成することができる。例えば、制御基板30に貫通孔を形成した後に当該貫通孔にめっき処理を施し、その後、当該貫通孔に対して外縁部31側に隣接する制御基板30の部分(端部)を打ち抜くことで、制御基板30の外縁部31に開口する切欠部40を形成することができる。   In addition, such a notch part 40 can be formed by a punching process or a router process. For example, after forming a through hole in the control substrate 30, the through hole is plated, and then, by punching out a portion (end portion) of the control substrate 30 adjacent to the outer edge portion 31 side with respect to the through hole, A notch 40 opening in the outer edge 31 of the control board 30 can be formed.

また、本例では、半導体装置100の製造時における搬送装置による搬送のための専用のスペース(デッドスペース)が制御基板30に設けられており、切欠部40はこのスペースに形成されている。このようなスペースを利用して切欠部40を形成することで、制御基板30の面積を大型化させることなく切欠部40を設けることが可能となっている。   In this example, a dedicated space (dead space) for transport by the transport device at the time of manufacturing the semiconductor device 100 is provided in the control substrate 30, and the notch 40 is formed in this space. By forming the notch 40 using such a space, it is possible to provide the notch 40 without increasing the area of the control board 30.

ところで、図5に示すように、切欠部40の開口方向Oは、底部41から開口部42に向かう方向とされる。そして、開口部42は、所定の面積を持つ開口面により形成され、底部41は、所定の面積を持つ制御基板30の外面により形成される。よって、開口方向Oは切欠部40に対して一意には定まらず、所定の範囲内に含まれる任意の方向となる。すなわち、底部41における任意の一点から開口面における任意の一点へ向かう方向の全てが開口方向Oとなる。よって、平面視で切欠部40の開口方向Oと接続部材50の延在方向Eとが同じ方向となる配置は、開口方向Oの不確定さ(設定の自由度)に応じた程度の自由度を有する。   By the way, as shown in FIG. 5, the opening direction O of the notch 40 is a direction from the bottom 41 to the opening 42. The opening 42 is formed by an opening surface having a predetermined area, and the bottom 41 is formed by the outer surface of the control board 30 having a predetermined area. Therefore, the opening direction O is not uniquely determined with respect to the cutout portion 40 and is an arbitrary direction included in a predetermined range. That is, all the directions from any one point on the bottom 41 to any one point on the opening surface are the opening direction O. Therefore, the arrangement in which the opening direction O of the notch 40 and the extending direction E of the connection member 50 are the same in a plan view is a degree of freedom corresponding to the uncertainty of the opening direction O (degree of freedom of setting). Have

すなわち、平面視で接続部材50の先端部52が切欠部40内に位置する場合(図2参照)には、先端部52を更に延在方向Eに沿って切欠部40の外側まで延ばした形状を想定し、当該形状が平面視で切欠部40の開口部42のみを通って切欠部40の外側に延びるような配置であれば、切欠部40の開口方向Oと接続部材50の延在方向Eとは、平面視で同じ方向といえる。また、平面視で接続部材50の先端部52が切欠部40の外側に位置する場合(図示は省略)には、接続部材50における制御基板30との接合部から先端部52までの部分が、平面視で切欠部40の開口部42のみを跨ぐような配置であれば、切欠部40の開口方向Oと接続部材50の延在方向Eとは、平面視で同じ方向といえる。   That is, when the distal end portion 52 of the connection member 50 is located in the notch portion 40 in plan view (see FIG. 2), the shape in which the distal end portion 52 is further extended to the outside of the notch portion 40 along the extending direction E. Assuming that the shape extends in the plan view through only the opening 42 of the notch 40 and extends to the outside of the notch 40, the opening direction O of the notch 40 and the extending direction of the connecting member 50 E can be said to be the same direction in plan view. Further, when the distal end portion 52 of the connection member 50 is located outside the notch portion 40 in plan view (not shown), a portion from the joint portion with the control board 30 to the distal end portion 52 in the connection member 50 is If it is arranged so as to straddle only the opening 42 of the notch 40 in plan view, the opening direction O of the notch 40 and the extending direction E of the connecting member 50 can be said to be the same direction in plan view.

なお、図5に示すように、切欠部40の全体形状が、制御基板30の外縁部31から当該外縁部31に対して直交する方向に切り欠かれた形状である場合等には、開口部42を構成する開口面に直交する方向を開口方向Oとして設計すると好適である。また、切欠部40の全体形状が、制御基板30の外縁部31から当該外縁部31に対して直交する方向に交差する方向に切り欠かれた形状である場合には、底部41における中心点から開口面における中心点に向かう方向を開口方向Oとして設計すると好適である。このような構成とすれば、接続部材50の寸法や取付位置の誤差を、開口方向O及び高さ方向Hの双方に直交する開口幅方向の両側で同程度に吸収することが可能となる。   As shown in FIG. 5, when the overall shape of the notch 40 is a shape that is notched in the direction orthogonal to the outer edge 31 from the outer edge 31 of the control board 30, the opening It is preferable to design the direction orthogonal to the opening surface constituting 42 as the opening direction O. Further, when the overall shape of the notch 40 is a shape that is cut from the outer edge 31 of the control board 30 in a direction that intersects with the direction orthogonal to the outer edge 31, from the center point at the bottom 41. It is preferable to design the direction toward the center point on the opening surface as the opening direction O. With such a configuration, it is possible to absorb errors in the dimensions and attachment positions of the connection member 50 to the same extent on both sides in the opening width direction orthogonal to both the opening direction O and the height direction H.

なお、開口面における上記中心点は、開口面が平面である場合には、開口面における重心とすることができる。また、開口面における上記中心点は、開口面が曲面である場合には、法線方向が開口面の各部の法線方向の平均値と一致する点とすることができる。一方、底部41における上記中心点は、底部41が平面により構成されている場合には、当該平面における重心とすることができる。また、底部41における上記中心点は、底部41が曲面により構成されている場合には、法線方向が当該曲面の各部の法線方向の平均値と一致する点とすることができ、或いは、外縁部31から当該外縁部31に直交する方向に最も離間する点とすることもできる。   In addition, the said center point in an opening surface can be made into the gravity center in an opening surface, when an opening surface is a plane. Moreover, the said center point in an opening surface can be made into the point in which a normal line direction corresponds with the average value of the normal line direction of each part of an opening surface, when an opening surface is a curved surface. On the other hand, the said center point in the bottom part 41 can be made into the gravity center in the said plane, when the bottom part 41 is comprised by the plane. Further, the center point in the bottom portion 41 can be a point where the normal direction coincides with the average value of the normal direction of each portion of the curved surface when the bottom portion 41 is configured by a curved surface, or It can also be set as the point most spaced apart from the outer edge part 31 in the direction orthogonal to the outer edge part 31.

3.半導体装置の製造方法
次に、本実施形態に係る半導体装置100の製造方法について説明する。以下に述べるように、本実施形態に係る半導体装置100の製造方法は、位置決め工程、接続部材挿入工程、及び接合工程を含んでいる。そして、これらの位置決め工程、接続部材挿入工程、及び接合工程は、記載の順に実行されるが、位置決め工程の実行前の状態では、図1から制御基板30を除いた状態まで各部品が組み付けられているとする。すなわち、ベース板2の上面に、接続部材50が固定されたケース1と、絶縁部材3を介して半導体基板10とが配置されているとともに、接続部材50とスイッチング素子20との間を電気的に接続するためのワイヤ91の接続作業が終了しているとする。さらに、本例では、ケース1とベース板2とにより形成される凹状の空間に、少なくとも、スイッチング素子20、ダイオード素子21、ワイヤ91を覆う高さまで絶縁樹脂が充填されているとする。
3. Method for Manufacturing Semiconductor Device Next, a method for manufacturing the semiconductor device 100 according to the present embodiment will be described. As described below, the method for manufacturing the semiconductor device 100 according to the present embodiment includes a positioning step, a connecting member insertion step, and a joining step. And these positioning process, connecting member insertion process, and joining process are performed in the order of description, but in the state before execution of a positioning process, each component is assembled | attached to the state except the control board 30 from FIG. Suppose that That is, the case 1 in which the connection member 50 is fixed to the upper surface of the base plate 2 and the semiconductor substrate 10 are disposed via the insulating member 3, and the connection member 50 and the switching element 20 are electrically connected to each other. It is assumed that the connection work of the wire 91 for connecting to is completed. Furthermore, in this example, it is assumed that the concave space formed by the case 1 and the base plate 2 is filled with an insulating resin to a height that covers at least the switching element 20, the diode element 21, and the wire 91.

位置決め工程は、接続部材50が取り付けられた部材(本例ではベース板2と一体のケース1)に対して制御基板30を位置決めする工程である。言い換えれば、位置決め工程は、接続部材50の接続対象のスイッチング素子20(半導体基板10)に対して制御基板30を位置決めする工程である。本実施形態では、位置決め工程では、制御基板30を接続部材50に対して上方に配置するとともに、制御基板30に形成された切欠部40の開口方向Oが接続部材50の延在方向Eと同じ方向となり、更に、制御基板30に形成された挿通孔95とケース1に形成された締結孔94とが平面視で重複するように、制御基板30を配置する。なお、接続部材50の位置及び向きは、上記のように制御基板30を配置した場合に、先端部52側の少なくとも一部が平面視で切欠部40と重複する(切欠部40内に位置する)ように設計されている。なお、先端部52側の一部のみが平面視で切欠部40と重複するように配置される構成では、当該一部と先端部52側の残りの一部との境界部は、平面視で開口部42を跨ぐように設計される。   The positioning step is a step of positioning the control board 30 with respect to the member to which the connection member 50 is attached (in this example, the case 1 integrated with the base plate 2). In other words, the positioning step is a step of positioning the control board 30 with respect to the switching element 20 (semiconductor substrate 10) to be connected to the connection member 50. In the present embodiment, in the positioning step, the control board 30 is disposed above the connection member 50, and the opening direction O of the notch 40 formed in the control board 30 is the same as the extending direction E of the connection member 50. Further, the control board 30 is arranged so that the insertion hole 95 formed in the control board 30 and the fastening hole 94 formed in the case 1 overlap in plan view. Note that the position and orientation of the connecting member 50 is such that at least a part on the tip 52 side overlaps with the notch 40 in plan view when the control board 30 is arranged as described above (located in the notch 40). ) Designed to be In a configuration in which only a part on the tip end 52 side is arranged so as to overlap the notch 40 in a plan view, a boundary part between the part and the remaining part on the tip end 52 side is a plan view. It is designed to straddle the opening 42.

接続部材挿入工程は、上記位置決め工程を実行した後に行われる工程であり、接続部材50に対して制御基板30を近づけ、接続部材50を切欠部40内に挿入する工程である。本例では、接続部材挿入工程は、図6(a)に示すように、接続部材50に対して制御基板30を高さ方向Hに近づけるように移動させ、図6(b)に示すように、制御基板30の下面をケース1の上面(第一上面部1a、図1参照)に当接させる工程である。これにより、接続部材50は、切欠部40に対して下側から挿入される。具体的には、本例では、制御基板30の高さ方向Hにおける接続部材50側(半導体基板10側)への移動に伴い、接続部材50の先端部52が最初に切欠部40内に挿入され、その後、接続部材50の基部51側に位置する部分が、切欠部40内における底部41側にずれた位置に順次挿入される。   The connecting member inserting step is a step performed after the positioning step is performed, and is a step of bringing the control board 30 close to the connecting member 50 and inserting the connecting member 50 into the notch 40. In this example, in the connection member insertion step, as shown in FIG. 6A, the control board 30 is moved so as to approach the height direction H with respect to the connection member 50, and as shown in FIG. In this step, the lower surface of the control board 30 is brought into contact with the upper surface of the case 1 (first upper surface portion 1a, see FIG. 1). Thereby, the connecting member 50 is inserted into the cutout portion 40 from below. Specifically, in this example, as the control substrate 30 moves in the height direction H toward the connection member 50 side (semiconductor substrate 10 side), the tip end portion 52 of the connection member 50 is first inserted into the notch 40. Thereafter, the portion of the connecting member 50 located on the base 51 side is sequentially inserted at a position shifted to the bottom 41 side in the notch 40.

なお、本実施形態では、接続部材50は、図6に示すように、接続部材挿入工程の実行後(図6(b))における接続部材50の延在方向Eの高さ方向Hからの傾斜角が、接続部材挿入工程の実行前(図6(a))に比べて大きくなるように設定されている。すなわち、接続部材挿入工程の実行により、接続部材50は切欠部40の底部41により開口方向Oに押圧されて弾性変形するように構成されている。これにより、上述したように、以下に述べる接合工程の作業性及び接合の信頼性の向上が可能となっている。   In the present embodiment, as shown in FIG. 6, the connecting member 50 is inclined from the height direction H in the extending direction E of the connecting member 50 after the execution of the connecting member insertion step (FIG. 6B). The corner is set to be larger than before the connection member insertion step (FIG. 6A). That is, the connection member 50 is configured to be elastically deformed by being pressed in the opening direction O by the bottom 41 of the notch 40 by performing the connection member insertion step. Thereby, as mentioned above, it is possible to improve the workability of the joining process described below and the reliability of the joining.

接合工程は、上記接続部材挿入工程を実行した後に行われる工程であり、接続部材50における切欠部40を高さ方向Hに貫通する部分と制御基板30とをはんだ60により接合する工程である。接合工程では、例えば、フローはんだ付けや、ロボットによるコテはんだ付けにより接合を行う構成とすることができる。   A joining process is a process performed after performing the said connection member insertion process, and is a process of joining the part which penetrates the notch part 40 in the connection member 50 to the height direction H, and the control board 30 with the solder 60. FIG. In a joining process, it can be set as the structure which joins by flow soldering or iron soldering by a robot, for example.

4.その他の実施形態
最後に、本発明に係るその他の実施形態を説明する。なお、以下の各々の実施形態で開示される特徴は、その実施形態でのみ利用できるものではなく、矛盾が生じない限り、別の実施形態にも適用可能である。
4). Other Embodiments Finally, other embodiments according to the present invention will be described. Note that the features disclosed in each of the following embodiments can be used only in that embodiment, and can be applied to other embodiments as long as no contradiction arises.

(1)上記の実施形態では、切欠部40が、平面視で、開口方向Oに向かうに従って、当該開口方向Oに直交する方向の幅Wが広くなるように形成されている構成を例として説明した。しかし、本発明の実施形態はこれに限定されるものではなく、切欠部40の幅Wを、開口方向Oの位置によらず一定に形成することも、本発明の好適な実施形態の一つである。また、切欠部40の幅Wを、開口方向Oに向かうに従って狭くなるように形成することも可能である。 (1) In the above-described embodiment, a configuration in which the cutout portion 40 is formed so that the width W in the direction orthogonal to the opening direction O increases in the plan view in the direction orthogonal to the opening direction O will be described as an example. did. However, the embodiment of the present invention is not limited to this, and forming the width W of the notch 40 constant irrespective of the position in the opening direction O is one of the preferred embodiments of the present invention. It is. It is also possible to form the notch 40 so that the width W becomes narrower as it goes in the opening direction O.

(2)上記の実施形態では、接続部材50が、切欠部40の底部41により開口方向Oに押圧されて弾性変形した状態で底部41に当接している構成を例として説明した。しかし、本発明の実施形態はこれに限定されるものではなく、接続部材50が、切欠部40の底部41により押圧されることなく底部41に当接している構成とすることもできる。 (2) In the above embodiment, the connection member 50 has been described as an example in which the connection member 50 is pressed in the opening direction O by the bottom 41 of the notch 40 and is elastically deformed and is in contact with the bottom 41. However, the embodiment of the present invention is not limited to this, and the connection member 50 may be in contact with the bottom 41 without being pressed by the bottom 41 of the notch 40.

(3)上記の実施形態では、接続部材50が、切欠部40の底部41に当接した状態で制御基板30に接合されている構成を例として説明した。しかし、本発明の実施形態はこれに限定されるものではなく、接続部材50が、切欠部40における開口部42と底部41との間の中間位置において、制御基板30と当接した状態或いは当接していない状態で、はんだ60により制御基板30に接合された構成とすることもできる。 (3) In the above-described embodiment, the configuration in which the connection member 50 is joined to the control board 30 in a state of being in contact with the bottom 41 of the notch 40 has been described as an example. However, the embodiment of the present invention is not limited to this, and the connection member 50 is in contact with the control board 30 at the intermediate position between the opening 42 and the bottom 41 in the notch 40 or the contact member 50. It can also be set as the structure joined to the control board 30 with the solder 60 in the state which is not contacting.

(4)上記の実施形態では、接続部材挿入工程が、接続部材50に対して制御基板30を高さ方向Hに近づけるように移動させ、接続部材50を切欠部40に対して下側から挿入する工程である場合を例として説明した。しかし、本発明の実施形態はこれに限定されるものではなく、接続部材挿入工程を、接続部材50に対して制御基板30を高さ方向Hに交差する方向(例えば、高さ方向Hに直交或いは略直交する方向)に近づけるように移動させ、接続部材50を切欠部40に対して開口部42側から挿入する工程とすることもできる。 (4) In the above embodiment, the connecting member insertion step moves the control board 30 so as to approach the height direction H with respect to the connecting member 50, and inserts the connecting member 50 into the notch 40 from below. The case where it is the process to perform was demonstrated as an example. However, the embodiment of the present invention is not limited to this, and the connecting member insertion step is performed in a direction (for example, orthogonal to the height direction H) that intersects the control board 30 with respect to the connection member 50 in the height direction H. Alternatively, the connection member 50 may be moved from the opening 42 side to the notch 40 by moving it so as to approach the substantially orthogonal direction.

(5)上記の実施形態では、接続部材50として断面形状が矩形状のものを用いた構成を例として示したが、矩形状以外(例えば、円形状や多角形状等)の断面形状をもつ接続部材を用いることもできる。 (5) In the above embodiment, the connection member 50 has a configuration in which the cross-sectional shape is rectangular. However, the connection member 50 has a cross-sectional shape other than the rectangular shape (for example, a circular shape or a polygonal shape). A member can also be used.

(6)上記の実施形態では、本発明における鑞材がはんだである場合を例として説明した。しかし、本発明の実施形態はこれに限定されるものではなく、接続部材50や切欠部40を区画する材料(制御基板30の切欠部40を囲む部分)より低い融点を持つものであれば、はんだに代えて種々の鑞材(例えば、金、銀、銅等を含むもの。硬鑞であるか軟鑞であるかを問わない。)を採用することが可能である。さらに、鑞材は、合金からなる材料に限られるものではなく、加熱により液化し冷却(自然冷却を含む)により固化して接続端子と接合対象面とを接合可能なあらゆる導電性材料を鑞材として採用することが可能である。 (6) In the above embodiment, the case where the brazing material in the present invention is solder has been described as an example. However, the embodiment of the present invention is not limited to this, as long as it has a lower melting point than the material that divides the connection member 50 and the notch 40 (the portion surrounding the notch 40 of the control board 30). Instead of solder, various brazing materials (for example, those containing gold, silver, copper, etc., regardless of whether they are hard or soft) can be employed. Furthermore, the brazing material is not limited to a material made of an alloy, and any conductive material that can be liquefied by heating and solidified by cooling (including natural cooling) to join the connection terminal and the surface to be joined is dredged. Can be adopted.

(7)上記の実施形態では、半導体装置100がインバータ装置である場合を例として説明した。しかし、本発明の実施形態はこれに限定されるものではなく、半導体素子が配置された半導体基板と、半導体素子を制御する制御基板とを備えるあらゆる半導体装置に本発明を適用することができる。 (7) In the above embodiment, the case where the semiconductor device 100 is an inverter device has been described as an example. However, embodiments of the present invention are not limited to this, and the present invention can be applied to any semiconductor device including a semiconductor substrate on which semiconductor elements are arranged and a control substrate that controls the semiconductor elements.

(8)その他の構成に関しても、本明細書において開示された実施形態は全ての点で例示であって、本発明の実施形態はこれに限定されない。すなわち、本願の特許請求の範囲に記載された構成及びこれと均等な構成を備えている限り、特許請求の範囲に記載されていない構成の一部を適宜改変した構成も、当然に本発明の技術的範囲に属する。 (8) Regarding other configurations as well, the embodiments disclosed herein are illustrative in all respects, and the embodiments of the present invention are not limited thereto. That is, as long as the configuration described in the claims of the present application and a configuration equivalent thereto are provided, a configuration obtained by appropriately modifying a part of the configuration not described in the claims is naturally also included in the present invention. Belongs to the technical scope.

本発明は、素子配置面に半導体素子が配置された半導体基板と、半導体素子を制御するとともに素子配置面に直交する高さ方向に半導体基板から離間して配置された制御基板と、を備えた半導体装置に好適に利用することができる。   The present invention includes a semiconductor substrate in which a semiconductor element is arranged on an element arrangement surface, and a control board that controls the semiconductor element and is arranged apart from the semiconductor substrate in a height direction orthogonal to the element arrangement surface. It can be suitably used for a semiconductor device.

10:半導体基板
11:素子配置面
20:スイッチング素子(半導体素子)
30:制御基板
31:外縁部
40:切欠部
41:底部
50:接続部材
51:基部
60:はんだ(鑞材)
100:半導体装置
H:高さ方向
E:延在方向
O:開口方向
W:幅
10: Semiconductor substrate 11: Element arrangement surface 20: Switching element (semiconductor element)
30: Control board 31: Outer edge part 40: Notch part 41: Bottom part 50: Connection member 51: Base part 60: Solder (saddle material)
100: Semiconductor device H: Height direction E: Extension direction O: Opening direction W: Width

Claims (4)

素子配置面に半導体素子が配置された半導体基板と、前記半導体素子を制御するとともに前記素子配置面に直交する高さ方向に前記半導体基板から離間して配置された制御基板と、を備えた半導体装置であって、
前記半導体素子と前記制御基板とを電気的に接続する接続部材を備え、
前記制御基板には、当該制御基板を前記高さ方向に貫通すると共に、当該制御基板の外縁部に開口する切欠部が形成され、
前記接続部材は、前記半導体基板側に固定された基部から、前記高さ方向に対して傾斜した延在方向に延び、前記切欠部内を前記高さ方向に貫通した状態で鑞材により前記制御基板に接合されており、
前記高さ方向に沿った平面視で、前記切欠部の開口方向が、前記延在方向と同じ方向とされている半導体装置。
A semiconductor comprising: a semiconductor substrate on which a semiconductor element is arranged on an element arrangement surface; and a control board that controls the semiconductor element and is arranged apart from the semiconductor substrate in a height direction orthogonal to the element arrangement surface. A device,
A connection member for electrically connecting the semiconductor element and the control board;
The control board is formed with a notch that penetrates the control board in the height direction and opens at the outer edge of the control board.
The connection member extends from a base portion fixed to the semiconductor substrate side in an extending direction inclined with respect to the height direction, and passes through the notch portion in the height direction so as to pass through the height direction with the control substrate. Are joined to
A semiconductor device in which an opening direction of the notch is the same as the extending direction in a plan view along the height direction.
前記接続部材は、前記切欠部の前記開口方向とは反対側における前記制御基板との境界縁部である底部に当接した状態で前記制御基板に接合されている請求項1に記載の半導体装置。   2. The semiconductor device according to claim 1, wherein the connection member is bonded to the control board in a state of being in contact with a bottom portion that is a boundary edge with the control board on a side opposite to the opening direction of the notch. . 前記接続部材は、前記切欠部の前記底部により前記開口方向に押圧されて弾性変形した状態で前記底部に当接している請求項2に記載の半導体装置。   The semiconductor device according to claim 2, wherein the connection member is in contact with the bottom in a state of being elastically deformed by being pressed in the opening direction by the bottom of the notch. 前記切欠部は、前記平面視で、前記開口方向に向かうに従って、当該開口方向に直交する方向の幅が広くなるように形成されている請求項1から3のいずれか一項に記載の半導体装置。   4. The semiconductor device according to claim 1, wherein the cutout portion is formed so that a width in a direction orthogonal to the opening direction becomes wider toward the opening direction in the plan view. 5. .
JP2010287489A 2010-12-24 2010-12-24 Semiconductor device Pending JP2012134427A (en)

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