JP2012058133A - Preparation instrument of sample for x-ray fluorescence analysis - Google Patents

Preparation instrument of sample for x-ray fluorescence analysis Download PDF

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JP2012058133A
JP2012058133A JP2010203154A JP2010203154A JP2012058133A JP 2012058133 A JP2012058133 A JP 2012058133A JP 2010203154 A JP2010203154 A JP 2010203154A JP 2010203154 A JP2010203154 A JP 2010203154A JP 2012058133 A JP2012058133 A JP 2012058133A
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metal frame
sample
base
plate
fluorescent
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Kazuyoshi Hashimoto
一慶 橋本
Tatsuya Kiyono
達也 清野
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Hitachi Cable Ltd
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Hitachi Cable Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a preparation instrument of a sample for X-ray fluorescence analysis, having successful analysis sensitivity and less variation in analysis results, and allowing to easily obtain a solid sample suitable to be used in the X-ray fluorescence analysis.SOLUTION: The preparation instrument of the sample for the X-ray fluorescence analysis includes: a sample molding jig 10 having a metal frame 12 in which a sample raw material storage hole 11 is formed, a metal frame storage board 15 on which a metal frame storage hole 14 is formed, a base 13 for mounting the metal frame storage board 15 thereon, and a pressure board 16 arranged at a position opposite to the metal frame storage board 15 so as to sandwich the metal frame 12 stored in the metal frame storage board 15 to press the metal frame 12; and an overflow removal jig 20 having a base 21 for mounting the metal frame storage board 15 thereon including the metal frame 12, a holding member 22 arranged at a position opposite to the base 21 to hold the metal frame storage board 15 mounted on the base 21, and a lever 24 in which sample extrusion means 23 for extruding a molded solid sample from the metal frame storage board 15 held at the base 21 by the holding member 22 is formed.

Description

本発明は、蛍光X線分析に用いる固体試料を作製するのに好適な蛍光X線分析用試料作製器具に関するものである。   The present invention relates to a sample preparation instrument for fluorescent X-ray analysis suitable for preparing a solid sample used for fluorescent X-ray analysis.

蛍光X線分析用試料、即ち、蛍光X線分析に用いる固体からなる試料(以下、固体試料と言う)の作製においては、固体試料の原料となる試料原料を金枠に投入し、加圧装置で試料原料を含む金枠に圧力を加えて所定の大きさ及び形状に成型することで固体試料を作製する作製方法が知られている。   In the preparation of a sample for fluorescent X-ray analysis, that is, a sample made of a solid used for fluorescent X-ray analysis (hereinafter referred to as a solid sample), a sample raw material that is a raw material of the solid sample is put into a metal frame, and a pressurizing apparatus Thus, there is known a production method for producing a solid sample by applying pressure to a metal frame containing a sample raw material and molding it into a predetermined size and shape.

このような作製方法では、加圧装置の容量によって同時に複数の固体試料を作製している。また、蛍光X線分析に用いる固体試料は、蛍光X線分析の際の分析感度を上げること、及び分析結果がバラツキ難くすることを目的として、固体試料の密度を高くし、且つ、固体試料の表面を平滑にすることが望ましいとされている。   In such a production method, a plurality of solid samples are produced at the same time depending on the capacity of the pressure device. In addition, the solid sample used for fluorescent X-ray analysis is designed to increase the density of the solid sample and increase the density of the solid sample for the purpose of increasing the analytical sensitivity in the fluorescent X-ray analysis and making the analysis results difficult to vary. It is desirable to have a smooth surface.

特開2006−71608号公報JP 2006-71608 A 特開2006−242600号公報JP 2006-242600 A 特開昭57−14746号公報JP-A-57-14746

固体試料の密度を高くすると共にその表面を平滑にするため、加圧装置にて圧力を加える際、試料原料が金枠から溢れ出す(オーバーフローする)ようにして作製する。   In order to increase the density of the solid sample and make the surface smooth, the sample material is made to overflow (overflow) from the metal frame when pressure is applied by a pressurizing device.

このとき、金枠の周辺に試料原料がオーバーフローしてオーバーフロー部分が形成される。このオーバーフロー部分が付着した状態の固体試料のままでは、蛍光X線分析装置の規格を満たすことができず分析ができないため、オーバーフロー部分を除去しなければならない。   At this time, the sample material overflows around the metal frame to form an overflow portion. The solid sample with the overflow portion attached cannot satisfy the standard of the fluorescent X-ray analyzer and cannot perform analysis, so the overflow portion must be removed.

しかしながら、オーバーフロー部分を除去する際には、固体試料の表面の平滑性を保つように手作業で行われるため、作業中に固体試料が汚れたり、固体試料に異物が付着したりする(コンタミネーション)などが発生して、分析感度が低下する虞がある。   However, the removal of the overflow portion is performed manually so as to maintain the smoothness of the surface of the solid sample, so that the solid sample becomes dirty during the operation or foreign matter adheres to the solid sample (contamination). ) And the like may occur, and the analysis sensitivity may decrease.

そこで、本発明の目的は、良好な分析感度を有し、且つ、分析結果のバラツキが少なく、蛍光X線分析に用いるのに好適な固体試料が容易に得られる蛍光X線分析用試料作製器具を提供することにある。   SUMMARY OF THE INVENTION An object of the present invention is to provide a sample preparation instrument for fluorescent X-ray analysis that has a good analytical sensitivity, has little variation in analysis results, and can easily obtain a solid sample suitable for use in fluorescent X-ray analysis. Is to provide.

この目的を達成するために創案された本発明は、試料原料を所定の大きさ及び形状に成型することで、蛍光X線分析に用いる固体試料を作製するための蛍光X線分析用試料作製器具であって、試料原料を収容するための試料原料収容孔が形成された金枠と、前記金枠を収容するための金枠収容孔が形成された金枠収容板と、前記金枠収容板を載置するための基台と、前記金枠収容板に収容された前記金枠を挟むように前記金枠収容板に対向した位置に配置されて前記金枠を加圧するための加圧盤と、を有する試料成型治具と、前記試料成型治具から取り出された前記金枠を含む前記金枠収容板を載置するための土台と、前記土台に対向する位置に配置されて前記土台に載置された前記金枠を含む前記金枠収容板を保持するための保持部材と、前記保持部材で前記土台に保持された前記金枠を含む前記金枠収容板から成型された固体試料を押し出すための試料押出手段が形成されたレバーと、を有するオーバーフロー除去治具と、を備える蛍光X線分析用試料作製器具である。   The present invention devised to achieve this object is a sample preparation instrument for fluorescent X-ray analysis for forming a solid sample used for fluorescent X-ray analysis by molding a sample raw material into a predetermined size and shape. A metal frame in which a sample material accommodation hole for accommodating a sample material is formed, a metal frame accommodation plate in which a metal frame accommodation hole for accommodating the metal frame is formed, and the metal frame accommodation plate And a pressure plate for pressurizing the metal frame disposed at a position facing the metal frame accommodation plate so as to sandwich the metal frame accommodated in the metal frame accommodation plate. , A base for placing the metal frame receiving plate including the metal frame taken out from the sample molding jig, and a base that is disposed at a position facing the base. A holding member for holding the metal frame housing plate including the mounted metal frame; An overflow removing jig having a lever formed with a sample pushing means for pushing out a solid sample molded from the metal frame housing plate including the metal frame held on the base by the holding member. It is a sample preparation instrument for fluorescent X-ray analysis.

前記加圧盤は、前記金枠と接する面がフッ素樹脂で加工されていると良い。   The press platen is preferably processed with a fluororesin on the surface in contact with the metal frame.

前記金枠収容板には、前記基台と対向する面であって、前記金枠収容孔が形成された位置と対向する位置に、凹形状の溝が形成されており、前記基台には、前記金枠収容板に形成された前記溝と嵌合する凸形状の突部が形成されていると良い。   A concave groove is formed on the metal frame housing plate at a position facing the base and facing the position where the metal frame housing hole is formed. It is preferable that a convex protrusion that fits into the groove formed on the metal frame housing plate is formed.

前記保持部材には、前記レバーを前記保持部材側に可動させたときに、前記試料押出手段が前記金枠へ案内されるように案内孔が形成されていると良い。   The holding member may be formed with a guide hole so that the sample pushing means is guided to the metal frame when the lever is moved toward the holding member.

本発明によれば、良好な分析感度を有し、且つ、分析結果のバラツキが少なく、蛍光X線分析に用いるのに好適な固体試料が容易に得られる蛍光X線分析用試料作製器具を提供することができる。   According to the present invention, there is provided a sample preparation instrument for fluorescent X-ray analysis that has a good analytical sensitivity, has little variation in analysis results, and can easily obtain a solid sample suitable for use in fluorescent X-ray analysis. can do.

本発明に係る蛍光X線分析用試料作製器具の試料成型治具を示す斜視図である。It is a perspective view which shows the sample shaping | molding jig of the sample preparation instrument for fluorescent X-ray analysis which concerns on this invention. 本発明に係る蛍光X線分析用試料作製器具のオーバーフロー除去治具を示す斜視図である。It is a perspective view which shows the overflow removal jig | tool of the sample preparation instrument for a fluorescent X-ray analysis which concerns on this invention. 本発明に係る蛍光X線分析用試料作製器具を用いた蛍光X線分析用試料作の作製方法を説明する図である。It is a figure explaining the preparation method of the sample preparation for fluorescent X-ray analysis using the sample preparation instrument for fluorescent X-ray analysis which concerns on this invention.

以下、本発明の好適な実施の形態を添付図面にしたがって説明する。   Preferred embodiments of the present invention will be described below with reference to the accompanying drawings.

図1は本発明の好適な実施の形態に係る蛍光X線分析用試料作製器具の試料成型治具を示す斜視図であり、図2はそのオーバーフロー除去治具を示す斜視図である。   FIG. 1 is a perspective view showing a sample molding jig of a sample preparation instrument for fluorescent X-ray analysis according to a preferred embodiment of the present invention, and FIG. 2 is a perspective view showing the overflow removing jig.

本実施の形態に係る蛍光X線分析用試料作製器具は、試料原料を所定の大きさ及び形状に成型することで、蛍光X線分析に用いる固体試料を作製するためのものであり、試料成型治具10とオーバーフロー除去治具20とからなる。   The sample preparation instrument for fluorescent X-ray analysis according to the present embodiment is for preparing a solid sample used for fluorescent X-ray analysis by molding a sample raw material into a predetermined size and shape. It consists of a jig 10 and an overflow removal jig 20.

[試料成型治具の構成]
図1に示すように、試料成型治具10は、試料原料を収容するための試料原料収容孔11が形成された金枠12と、金枠12を収容するための金枠収容孔14が形成された金枠収容板15と、金枠収容板15を載置するための基台13と、金枠収容板15に収容された金枠12を挟むように金枠収容板15に対向した位置に配置されて金枠12を加圧するための加圧盤16と、を有する。
[Configuration of sample molding jig]
As shown in FIG. 1, the sample molding jig 10 is formed with a metal frame 12 in which a sample raw material accommodation hole 11 for accommodating a sample raw material and a metal frame accommodation hole 14 for accommodating the metal frame 12 are formed. The position facing the metal frame accommodating plate 15 so as to sandwich the metal frame 12 accommodated in the metal frame accommodating plate 15, the base 13 for placing the metal frame accommodating plate 15, and the metal frame 12 accommodated in the metal frame accommodating plate 15. And a pressurizing plate 16 for pressurizing the metal frame 12.

金枠12の試料原料収容孔11は、その内径が蛍光X線分析装置の規格を満たす大きさ及び形状を有するように形成されている。なお、規格を満たす形状とは、例えば、円筒状、立方体状を示す。   The sample material accommodation hole 11 of the metal frame 12 is formed so that the inner diameter thereof has a size and a shape that satisfy the standard of the fluorescent X-ray analyzer. The shape satisfying the standard indicates, for example, a cylindrical shape or a cubic shape.

金枠収容板15には、基台13と対向する面であって、金枠収容孔14が形成された位置と対向する位置に、凹形状の溝17が形成されている。一方、基台13には、金枠収容板15に形成された溝17と嵌合する凸形状の突部18が形成されている。これら溝17と突部18とが嵌合することで、金枠収容板15と基台13とが嵌合され固定される。なお、これら溝17と突部18とは、各々の表面がフッ素樹脂で加工されていることが望ましい。これは加圧盤16にて加圧した後に、金枠収容板15を基台13からストレス無く容易に取り出せるようにするためである。   A concave groove 17 is formed on the metal frame housing plate 15 at a position facing the base 13 and a position facing the position where the metal frame housing hole 14 is formed. On the other hand, the base 13 is formed with a convex protrusion 18 that fits into the groove 17 formed in the metal frame housing plate 15. By fitting the grooves 17 and the protrusions 18, the metal frame housing plate 15 and the base 13 are fitted and fixed. In addition, as for these groove | channels 17 and the protrusions 18, it is desirable that each surface is processed with the fluororesin. This is because the metal frame housing plate 15 can be easily removed from the base 13 without stress after being pressurized by the pressure platen 16.

また、金枠収容板15は、加圧盤16と接する面が平滑な面で形成されており、この平滑な面に、金枠12を収容するための金枠収容孔14が複数個形成されている。この金枠収容孔14には、金枠12に形成された試料原料収容孔11と同じかそれよりも若干大きい程度の内径を有し、溝17に連通する図示しない連通孔が形成されている。この連通孔は、加圧して成型した固体試料を後述するオーバーフロー除去治具20にて加工する際に、金枠12から加工された固体試料(オーバーフロー部分を除去した固体試料)を取り出すための取出し孔となる。   Further, the metal frame housing plate 15 is formed with a smooth surface in contact with the pressure plate 16, and a plurality of metal frame housing holes 14 for housing the metal frame 12 are formed on the smooth surface. Yes. The metal frame accommodation hole 14 has a communication hole (not shown) having an inner diameter that is the same as or slightly larger than the sample raw material accommodation hole 11 formed in the metal frame 12 and communicates with the groove 17. . This communication hole is used to take out a solid sample processed from the metal frame 12 (a solid sample from which the overflow portion has been removed) when processing the solid sample formed by pressurization with an overflow removal jig 20 described later. It becomes a hole.

加圧盤16は、金枠12側の表面(金枠12と接する面)が低密着加工されている低密着面19からなる。これは、試料原料を加圧する際に試料原料が加圧盤16に密着することを防ぐためである。低密着面19は、低摩擦性、耐熱性、耐化学薬品性に優れたフッ素樹脂で低密着加工されていることが好ましい。   The pressure plate 16 is composed of a low adhesion surface 19 whose surface on the metal frame 12 side (surface in contact with the metal frame 12) is subjected to low adhesion processing. This is to prevent the sample material from sticking to the pressure plate 16 when the sample material is pressurized. The low adhesion surface 19 is preferably low adhesion processed with a fluororesin excellent in low friction, heat resistance and chemical resistance.

[オーバーフロー除去治具の構成]
図2に示すように、オーバーフロー除去治具20は、試料成型治具10から取り出された金枠12を含む金枠収容板15を載置するための土台21と、土台21に対向する位置に配置されて土台21に載置された金枠12を含む金枠収容板15を保持するための保持部材22と、保持部材22で土台21に保持された金枠12を含む金枠収容板15から成型された固体試料を押し出すための試料押出手段23が形成されたレバー24と、を有する。
[Configuration of overflow removal jig]
As shown in FIG. 2, the overflow removing jig 20 has a base 21 for placing the metal frame receiving plate 15 including the metal frame 12 taken out from the sample molding jig 10, and a position facing the base 21. A holding member 22 for holding the metal frame housing plate 15 including the metal frame 12 placed and placed on the base 21, and a metal frame housing plate 15 including the metal frame 12 held on the base 21 by the holding member 22. And a lever 24 formed with a sample extrusion means 23 for extruding a solid sample molded from the.

土台21とレバー24とは、軸部25を介して連結されており、その軸部25を境にして互いに回動自在となるように構成されている。土台21には、金枠12を含む金枠収容板15を載置するための載置部26が形成されている。   The base 21 and the lever 24 are connected via a shaft portion 25, and are configured to be rotatable with respect to the shaft portion 25 as a boundary. On the base 21, a mounting portion 26 for mounting the metal frame accommodation plate 15 including the metal frame 12 is formed.

保持部材22は、土台21上の載置部26に金枠12を含む金枠収容板15を載置した後、この金枠12を含む金枠収容板15を保持するものである。これに加え、保持部材22は、保持された金枠12を含む金枠収容板15の方向にレバー24を閉じるように可動させたときに、試料押出手段23による加圧によって金枠12の内部に形成された固体試料からオーバーフロー部分を切り離すために、金枠収容板15上の金枠12の周辺に付着したオーバーフロー部分を金枠収容板15との間で保持する役割も有する部材である。   The holding member 22 holds the metal frame housing plate 15 including the metal frame 12 after placing the metal frame housing plate 15 including the metal frame 12 on the mounting portion 26 on the base 21. In addition to this, when the holding member 22 is moved so as to close the lever 24 in the direction of the metal frame housing plate 15 including the held metal frame 12, the inside of the metal frame 12 is pressed by the sample pushing means 23. In order to separate the overflow portion from the solid sample formed on the metal frame housing plate 15, the overflow portion attached to the periphery of the metal frame 12 on the metal frame housing plate 15 is also a member that holds the metal frame housing plate 15.

また、保持部材22には、レバー24を保持部材22側へ可動させたときに、レバー24に形成された試料押出手段23が金枠収容板15上の金枠12へ案内されるように案内孔27が金枠12上に形成されている。この案内孔27によって、試料押出手段23がレバー24の可動に合わせて金枠12の試料原料収容孔11上に案内され、更にレバー24を閉じるように金枠収容板15側に可動させることで、金枠12の内部に形成された固体試料が押し出される。なお、押し出された固体試料は、金枠収容板15に形成された取り出し孔(連通孔)を介して、金枠収容板15の溝17の部分からオーバーフロー除去治具20の外部に取り出される。   The holding member 22 is guided so that the sample pushing means 23 formed on the lever 24 is guided to the metal frame 12 on the metal frame housing plate 15 when the lever 24 is moved to the holding member 22 side. A hole 27 is formed on the metal frame 12. By this guide hole 27, the sample pushing means 23 is guided on the sample material accommodation hole 11 of the metal frame 12 in accordance with the movement of the lever 24, and is further moved to the metal frame accommodation plate 15 side so as to close the lever 24. The solid sample formed inside the metal frame 12 is extruded. The extruded solid sample is taken out of the overflow removing jig 20 from the groove 17 portion of the metal frame housing plate 15 through a take-out hole (communication hole) formed in the metal frame housing plate 15.

[蛍光X線分析用試料作製器具を用いた固体試料の作製方法]
蛍光X線分析用試料作製器具を用いた固体試料の作製方法について、図3に基づき以下に説明する。
[Method for preparing a solid sample using a sample preparation instrument for fluorescent X-ray analysis]
A method of preparing a solid sample using the sample preparation instrument for fluorescent X-ray analysis will be described below with reference to FIG.

先ず、図3(a)に示すように、基台13の試料下表面(金枠収容板15が接する面)を平滑にし、試料原料を加圧成型する際に試料原料が密着することを防ぐために設けた突部18に金枠収容板15の溝17を嵌め込んで設置する。   First, as shown in FIG. 3A, the sample lower surface of the base 13 (the surface on which the metal frame housing plate 15 contacts) is smoothed to prevent the sample material from sticking when the sample material is pressure-molded. The groove 17 of the metal frame housing plate 15 is fitted into the protrusion 18 provided for the purpose.

次いで、図3(b)に示すように、金枠12を収容するために設けた金枠収容板15の金枠収容孔14に金枠12を設置、収容し、試料原料を蛍光X線分析装置の規格を満たす形状に成型するための試料原料収容孔11に試料原料を投入、収容する。   Next, as shown in FIG. 3B, the metal frame 12 is installed and accommodated in the metal frame accommodation hole 14 of the metal frame accommodation plate 15 provided to accommodate the metal frame 12, and the sample raw material is subjected to fluorescent X-ray analysis. A sample raw material is put in and stored in a sample raw material storage hole 11 for molding into a shape that satisfies the specifications of the apparatus.

そして、図3(c)に示すように、金枠12上部に、加圧盤16を、試料上表面(金枠12が接する面)を平滑にし、試料原料を加圧成型する際に試料原料が密着することを防ぐために設けた低密着面19を下にして設置する。   Then, as shown in FIG. 3 (c), the pressure plate 16 is placed on the upper part of the metal frame 12, the sample upper surface (the surface with which the metal frame 12 is in contact) is smoothed, and the sample material is subjected to pressure molding. It is installed with the low adhesion surface 19 provided in order to prevent the adhesion.

その後、金枠12上から加圧盤16にて金枠12を加圧すると、試料原料収容孔11内に固体試料が形成されると共に、金枠収容板15の上面に試料原料収容孔11から漏れ出た(溢れ出た)試料原料によってオーバーフロー部分が形成される。   Thereafter, when the metal frame 12 is pressurized from above the metal frame 12 with the pressure plate 16, a solid sample is formed in the sample material accommodation hole 11 and leaks from the sample material accommodation hole 11 to the upper surface of the metal frame accommodation plate 15. An overflow portion is formed by the sample material that has come out (overflowed).

次いで、図3(d)に示すように、金枠収容板15を基台13から水平方向にスライドさせて取り外す。   Next, as shown in FIG. 3 (d), the metal frame receiving plate 15 is slid horizontally from the base 13 and removed.

その後、図3(e)に示すように、取り外した金枠収容板15をオーバーフロー除去治具20の土台21上に形成された金枠収容板15を載置するための載置部26に載置する。   Thereafter, as shown in FIG. 3 (e), the removed metal frame accommodation plate 15 is placed on a placement portion 26 for placing the metal frame accommodation plate 15 formed on the base 21 of the overflow removing jig 20. Put.

金枠収容板15を載置した後、図3(f)に示すように、レバー24を金枠収容板15側に倒すことで、オーバーフロー部分を金枠収容板15とレバー24との間で保持するために金枠12の上方に設けられた保持部材22が、金枠収容板15上のオーバーフロー部分を保持し、試料押出手段23が試料原料収容孔11内に形成された固体試料を上方から下方へ押し出す。   After placing the metal frame housing plate 15, as shown in FIG. 3 (f), the overflow portion is moved between the metal frame housing plate 15 and the lever 24 by tilting the lever 24 toward the metal frame housing plate 15. A holding member 22 provided above the metal frame 12 for holding holds the overflow portion on the metal frame housing plate 15, and the sample pushing means 23 moves the solid sample formed in the sample raw material housing hole 11 upward. Push down from.

これにより、オーバーフロー部分が除去された固体試料が、金枠収容板15の溝17によって金枠収容板15と土台21との間にできた孔から取り出される。   As a result, the solid sample from which the overflow portion has been removed is taken out from a hole formed between the metal frame housing plate 15 and the base 21 by the groove 17 of the metal frame housing plate 15.

以上説明したように、本実施の形態に係る蛍光X線分析用試料作製器具によれば、試料原料を所定の大きさ及び形状に成型することで、蛍光X線分析に用いる固体試料を作製するための蛍光X線分析用試料作製器具であって、試料原料を収容するための試料原料収容孔が形成された金枠と、前記金枠を収容するための金枠収容孔が形成された金枠収容板と、前記金枠収容板を載置するための基台と、前記金枠収容板に収容された前記金枠を挟むように前記金枠収容板に対向した位置に配置されて前記金枠を加圧するための加圧盤と、を有する試料成型治具と、前記試料成型治具から取り出された前記金枠を含む前記金枠収容板を載置するための土台と、前記土台に対向する位置に配置されて前記土台に載置された前記金枠を含む前記金枠収容板を保持するための保持部材と、前記保持部材で前記土台に保持された前記金枠を含む前記金枠収容板から成型された固体試料を押し出すための試料押出手段が形成されたレバーと、を有するオーバーフロー除去治具と、を備えることにより、オーバーフロー部分を除去する際に、固体試料の表面の平滑性を保つようにオーバーフロー部分を手作業で行うことなく除去することができる。これにより、作業中に固体試料が汚れたり、固体試料に異物が付着したりする(コンタミネーション)などの問題が発生するのを防止することができる。   As described above, according to the sample preparation instrument for fluorescent X-ray analysis according to the present embodiment, a solid sample used for fluorescent X-ray analysis is prepared by molding a sample raw material into a predetermined size and shape. A sample preparation tool for fluorescent X-ray analysis for a metal frame in which a sample material accommodation hole for accommodating a sample material is formed and a gold frame in which a metal frame accommodation hole for accommodating the metal frame is formed A frame housing plate, a base for mounting the metal frame housing plate, and a position facing the metal frame housing plate so as to sandwich the metal frame housed in the metal frame housing plate; A sample molding jig having a pressure plate for pressurizing the metal frame, a base for placing the metal frame receiving plate including the metal frame taken out from the sample molding jig, and the base The said metal frame accommodation containing the said metal frame arrange | positioned in the position which opposes, and was mounted in the said base A lever formed with a sample pushing means for extruding a solid sample molded from the metal frame housing plate including the metal frame held on the base by the holding member. By providing the overflow removing jig, the overflow portion can be removed without manual operation so as to maintain the smoothness of the surface of the solid sample when the overflow portion is removed. As a result, it is possible to prevent problems such as contamination of the solid sample during work and foreign matter adhering to the solid sample (contamination).

また、従来のような加圧装置で試料原料に圧力を加えて成型して固体試料を作製する方法では、加圧した際に、試料原料の性質によって加圧装置の加圧盤面に試料原料が密着してしまうことがある。このような場合、加圧盤面に密着した試料原料を、その表面の平滑性を保つことに注意しながら加圧盤から採取する必要があるため、作業に時間が掛かる。   In addition, in the conventional method of producing a solid sample by applying pressure to a sample material with a pressure device, the sample material is placed on the pressure plate surface of the pressure device depending on the properties of the sample material. It may stick. In such a case, since it is necessary to extract the sample raw material closely attached to the pressure plate surface from the pressure plate while paying attention to maintaining the smoothness of the surface, it takes time to work.

これに対し、本実施の形態に係る蛍光X線分析用試料作製器具では、加圧盤16は、金枠12と接する面がフッ素樹脂で加工されているため、試料原料が密着しにくく、作業が短時間で行える。   On the other hand, in the sample preparation instrument for fluorescent X-ray analysis according to the present embodiment, the surface of the pressure plate 16 that is in contact with the metal frame 12 is processed with a fluororesin. It can be done in a short time.

即ち、本発明によれば、良好な分析感度を有し、且つ、分析結果のバラツキが少なく、蛍光X線分析に用いるのに好適な固体試料が容易に得られる。   That is, according to the present invention, it is possible to easily obtain a solid sample having good analytical sensitivity and less variation in analysis results and suitable for use in fluorescent X-ray analysis.

なお、本実施の形態においては、土台21とレバー24とが軸部25で連結されているものとしたが、土台21とレバー24とを連結せず、土台21に対してレバー24をその対向面同士が平行になるように押し込む押込型にしても良い。   In this embodiment, the base 21 and the lever 24 are connected by the shaft portion 25. However, the base 21 and the lever 24 are not connected, and the lever 24 is opposed to the base 21. You may make it the pushing type pushed in so that surfaces may become parallel.

10 試料成型治具
11 試料原料収容孔
12 金枠
13 基台
14 金枠収容孔
15 金枠収容板
16 加圧盤
17 溝
18 突部
19 低密着面
20 オーバーフロー除去治具
21 土台
22 保持部材
23 試料押出手段
24 レバー
25 軸部
26 載置部
27 案内孔
DESCRIPTION OF SYMBOLS 10 Sample shaping | molding jig | tool 11 Sample raw material accommodation hole 12 Metal frame 13 Base 14 Metal frame accommodation hole 15 Metal frame accommodation plate 16 Pressure board 17 Groove 18 Protrusion 19 Low adhesion surface 20 Overflow removal jig 21 Base 22 Holding member 23 Sample Extruding means 24 Lever 25 Shaft portion 26 Placement portion 27 Guide hole

Claims (4)

試料原料を所定の大きさ及び形状に成型することで、蛍光X線分析に用いる固体試料を作製するための蛍光X線分析用試料作製器具であって、
試料原料を収容するための試料原料収容孔が形成された金枠と、前記金枠を収容するための金枠収容孔が形成された金枠収容板と、前記金枠収容板を載置するための基台と、前記金枠収容板に収容された前記金枠を挟むように前記金枠収容板に対向した位置に配置されて前記金枠を加圧するための加圧盤と、を有する試料成型治具と、
前記試料成型治具から取り出された前記金枠を含む前記金枠収容板を載置するための土台と、前記土台に対向する位置に配置されて前記土台に載置された前記金枠を含む前記金枠収容板を保持するための保持部材と、前記保持部材で前記土台に保持された前記金枠を含む前記金枠収容板から成型された固体試料を押し出すための試料押出手段が形成されたレバーと、を有するオーバーフロー除去治具と、
を備えることを特徴とする蛍光X線分析用試料作製器具。
A sample preparation instrument for fluorescent X-ray analysis for forming a solid sample used for fluorescent X-ray analysis by molding a sample raw material into a predetermined size and shape,
A metal frame in which a sample material accommodation hole for accommodating a sample material, a metal frame accommodation plate in which a metal frame accommodation hole for accommodating the metal frame is formed, and the metal frame accommodation plate are placed. A sample having a base for pressurization and a pressurizing plate disposed at a position facing the metal frame housing plate so as to sandwich the metal frame housed in the metal frame housing plate and pressurizing the metal frame A molding jig,
Including a base for mounting the metal frame receiving plate including the metal frame taken out from the sample forming jig, and the metal frame placed on the base and disposed at a position facing the base. A holding member for holding the metal frame housing plate, and a sample extrusion means for extruding a solid sample molded from the metal frame housing plate including the metal frame held on the base by the holding member are formed. An overflow removal jig having a lever,
A sample preparation device for fluorescent X-ray analysis, comprising:
前記加圧盤は、前記金枠と接する面がフッ素樹脂で加工されている請求項1に記載の蛍光X線分析用試料作製器具。   2. The sample preparation instrument for fluorescent X-ray analysis according to claim 1, wherein a surface of the pressure plate that is in contact with the metal frame is processed with a fluororesin. 前記金枠収容板には、前記基台と対向する面であって、前記金枠収容孔が形成された位置と対向する位置に、凹形状の溝が形成されており、
前記基台には、前記金枠収容板に形成された前記溝と嵌合する凸形状の突部が形成されている請求項1又は2に記載の蛍光X線分析用試料作製器具。
A concave groove is formed on the metal frame housing plate at a position facing the base and facing the position where the metal frame housing hole is formed,
The sample preparation instrument for fluorescent X-ray analysis according to claim 1 or 2, wherein a convex protrusion that fits into the groove formed in the metal frame housing plate is formed on the base.
前記保持部材には、前記レバーを前記保持部材側に可動させたときに、前記試料押出手段が前記金枠へ案内されるように案内孔が形成されている請求項1〜3のいずれかに記載の蛍光X線分析用試料作製器具。   The guide hole is formed in the said holding member so that the said sample extrusion means may be guided to the said metal frame when the said lever is moved to the said holding member side. The sample preparation instrument for fluorescent X-ray analysis as described.
JP2010203154A 2010-09-10 2010-09-10 Preparation instrument of sample for x-ray fluorescence analysis Pending JP2012058133A (en)

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