JP2012018628A - Distributed control system test execution management device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a test execution management device for a distributed control system capable of effectively reproducing a test while considering processing load on an input/output simulation device.SOLUTION: Each of input/output simulation devices 2a-2c carries out input/output operation with input/output means of a control unit based on a predetermined sequence while associating with text items as a simulation device for devices to be controlled in a distributed control system, and outputs obtained measurement result of the processing load and input/output results in each of relevant test items. A test result determination means 16, which is included in an test execution management device 1, determines acceptability based on the input/output result and expected input/output results on each test items. A test item storing means 14 stores the determination result while associating with the processing load. A test item selection means 13 selects test items to be executed referring the stored result.

Description

  The present invention relates to a distributed control system test execution management device in which an operation test is performed on a distributed control system in which a plurality of control devices having input / output means for controlling controlled devices are provided via a network.

  There is a distributed control system in which a common network is connected to a plurality of control devices so that data communication can be performed between the control devices, and an execution process is performed on controlled devices controlled by the control devices. . In order to perform a comprehensive debugging test of such a distributed control system, it is necessary to provide an input / output simulation device according to the number of controlled devices. However, depending on the scale of the distributed control system, all controlled devices may be provided. It may be difficult in terms of cost and installation area to prepare the number of input / output simulation devices corresponding to the number. In order to solve this problem, some of the input / output simulation devices corresponding to all controlled devices, some of the input / output simulation devices, and the test execution management device connected to these input / output simulation devices via a network A distributed control system test execution management device comprising: and extracting configuration information of the provided input / output simulation device and performing only test items that can be tested with the obtained configuration of the input / output simulation device There is a thing which improves test efficiency by this (for example, refer to patent documents 1).

Japanese Patent Laying-Open No. 2005-242421 (FIG. 1)

  However, in Patent Document 1, when the processing load of the input / output simulation device temporarily becomes extremely high, there is a case where input / output correspondence to the test item is not performed at the expected timing. For this reason, it is determined whether the control procedure for the test item has an error and abnormal operation has occurred, or whether the test has failed to operate normally because the processing load on the I / O simulator is temporarily very high. It becomes difficult. For this reason, when the test is performed again to determine whether the test result is expected if the processing load of the I / O simulator is normal, there is an error in the control procedure for the test item and the test item causing the abnormal operation However, the test was performed again and the efficiency of the retest was not good.

  The present invention has been made to solve the above-described problems. If the processing load of the input / output simulation apparatus is normal, the test items for retesting whether the test results will be the expected results are listed in the past. A distributed control system test execution management device that improves the efficiency of a retest by selecting a test item preferentially from the processing load information of the input / output simulation device in the simulation test.

  In the distributed control system test execution management device according to the present invention, a control device having input / output means for controlling a controlled device performs a plurality of operation tests on a distributed control system provided via a network. In the control system test execution management apparatus, an input / output operation is performed with the input / output unit corresponding to the controlled device as a simulation device, and an input / output simulation unit for obtaining the input / output result, and a process related to the input / output simulation unit In an input / output simulation device having a processing load measuring means for measuring and outputting a load, a test procedure showing a control procedure in the input / output simulation means for each test item of the plurality of operation tests, and a predetermined input / output simulation means Test item storage means for storing expected results determined based on the design, and test items to be executed from the test item storage means A test item selection means to select, an input / output simulation device control means for controlling a predetermined input / output simulation device based on the control procedure for the selected test item, the input / output result for the executed test item and the test item Test result determination means for outputting a pass / fail determination result indicating whether or not the test has been correctly performed from the corresponding predetermined input / output value, and the processing load and the pass / fail determination result for the performed test item. A test execution management device having test result storage means for storing in association with items, wherein the test item selection means includes the processing load and the pass / fail judgment result for each test item stored in the test result storage means. The priority order of the test items to be executed among the test items to be executed with reference to the above is changed.

  This invention measures the processing load related to the corresponding input / output simulation means during the execution of the simulation test, stores the measurement result together with the result of the simulation test, and the test item for the test item selection means to perform the retest. , The priority order can be changed with reference to test results and processing loads of test items performed in the past. As a result, if the processing load of the input / output simulation device is normal, it is possible to preferentially carry out test items that are the expected results of the test, so that an effect of improving the efficiency of the retest can be achieved.

It is a block diagram which shows the structure of the distributed control system made into the object of this invention. 1 is a block diagram of a distributed control system test execution management device showing a first embodiment of the present invention. FIG. It is a figure which shows a structure when the distributed control system test execution management apparatus which shows Embodiment 1 of this invention is applied to the object distributed control system. It is a figure which shows the example of the format of the test item database in Embodiment 1 of this invention. It is a figure which shows the example of the format of the apparatus structure database in Embodiment 1 of this invention. It is a figure which shows a structure when the distributed control system test execution management apparatus which shows Embodiment 1 of this invention is applied to the object distributed control system, and another example of an apparatus structure database. It is a figure which shows the example of the format of the test result database in Embodiment 1 of this invention. It is a flowchart which shows the operation | movement procedure of the distributed control system test execution management apparatus which shows Embodiment 1 of this invention. It is a flowchart which shows the operation | movement procedure of the distributed control system test execution management apparatus which shows Embodiment 3 of this invention.

Embodiment 1 FIG.
FIG. 1 is a block diagram showing a distributed control system 100 that is a subject for which a simulation test is performed by the distributed control system test execution management device of the present invention. A plurality of control devices 400 are connected between the control devices via a control network 500. Data communication can be performed. Each control device 400 includes an input / output unit 401, and each input / output unit 401 is connected to an input / output unit 201 included in the controlled device 200 to control the controlled device 200.

  In FIG. 1, the control device 400a has input / output means 401a and 402b, the input / output means 401a is the input / output means 201a of the controlled apparatus 200a, and the input / output means 401b is the input / output means 201b of the controlled apparatus 200b. The controlled device 200a or 200b is controlled by exchanging data by being connected to. Similarly, the control device 400b has an input / output means 401c, and the input / output means 401c is connected to the input / output means 201c of the controlled device 200c and exchanges data to control the operation of the controlled device 200c. Yes.

  FIG. 2 is a block diagram of the distributed control system test execution management apparatus showing the first embodiment of the present invention. In FIG. 2, the test execution management device 1 and a plurality of input / output simulation devices 2 are connected by a test execution management network 3. The test execution management device 1 manages and controls a simulation test by the distributed control system test execution management device, and the input / output simulation device 2 executes an exchange with the device under test 4 according to a predetermined control procedure. To do. This control procedure is determined in association with the test item. In FIG. 2, 2a, 2b, and 2c are shown for three types of devices under test 4a, 4b, and 4c, respectively.

  FIG. 3 is a diagram showing a configuration when the distributed control system test execution management apparatus according to Embodiment 1 of the present invention is applied to a target distributed control system. As shown in FIG. 3, the plurality of input / output simulation devices 2 in the distributed control system test execution management device according to the first embodiment of the present invention are assumed to simulate any of the plurality of controlled devices 200 in FIG. The test target device 4 corresponds to the input / output means 401 of the control device 400 corresponding to the controlled device 200.

  Next, the detailed configuration and operation of the distributed control system test execution management apparatus according to Embodiment 1 of the present invention will be described.

  The input / output simulation means control means 11 included in the test execution management device 1 is an input / output simulation means included in the corresponding input / output simulation apparatus 2 based on the control procedure associated with the test item selected by the test item selection means 13. 21 is controlled to carry out exchanges with the corresponding device under test 4. In addition, the input / output simulation means 21 at this time receives the input / output result when it exchanges with the device under test 4 from the input / output simulation means 21 and supplies it to the test result determination means 16.

  Here, the input / output simulation means 21 is a means for simulating the behavior of input / output according to the test items in accordance with the instruction from the test execution management apparatus 1, and is realized by dedicated software or emulator software on a general-purpose computer such as a PC. .

  The test result determination means 16 compares the input / output result received by the input / output simulation means control means 11 with the result expected by the corresponding test item, determines the test result (pass or fail), and determines the determination result as the test result. The data is output to the DB storage unit 17. Here, the expected result of a test item is the result that should be obtained when the test item behaves in a distributed control system, and can be predicted if the distributed control system and test item are designed. is there.

  The processing load measurement result acquisition unit 12 acquires a processing load measurement result from the processing load measurement unit 22 included in the plurality of input / output simulation apparatuses 2 and outputs the acquisition result to the test result DB storage unit 17.

  Here, the processing load measuring unit 22 is a unit that measures the usage rate of the CPU in the input / output simulation device 2 and acquires the execution time of each process in the real-time operating system. Realized by part of.

  The test result DB storage unit 17 measures the processing load of the input / output simulation apparatus 2 acquired by the processing load measurement result acquisition unit 12 and the determination result determined by the test result determination unit 16 in association with the test item that has been performed. The result is stored in accordance with a prescribed format.

  The test item DB storage means 14 stores a plurality of test items, control procedures associated with the respective test items, and expected input / output results from the device under test 4 as a test item database.

  FIG. 4 shows an example of the format of the test item database. The test item is composed of “test item identification number”, “input / output simulation device control procedure”, and “expected result”. The “input / output simulation device control procedure” includes “time”, “target input / output simulation means”, “data type”, and “value”. Here, “time” refers to the elapsed time from the start of the test. The “data type” is an identifier indicating which one or a plurality of data should be held in each input / output simulation means 21, and “value” should be substituted for the data Points to the value. It is also possible to describe a periodic change in value by indicating a period at “time” and an increase / decrease value at “value”.

  The “expected result” also includes “time”, “target input / output simulation means”, “data type”, and “value”. A description in which “time” has a time width and a description in which “value” has a numerical width are also possible.

  In FIG. 4, as the input / output simulation device control procedure for test item TI1, input / output control means Ea substitutes (outputs) value Va for data type Da between times T1 and T2, and input / output control means after time T3. Eb substitutes the value Vb for the data type Db, and indicates that the input / output control means Ec substitutes the value Vc for the data type Dc from the test start time to time T4. As an expected result, the time point at time T5 is shown. Indicates that the value Ve is assigned (input) to the data type De of the input / output control means Ee.

  In the example of the test item TI1, a plurality of input / output simulation device control procedures and one expected result are used, but any number of input / output simulation device control procedures may be used, and any number of expected results may be used. .

  The device configuration DB storage unit 15 stores the configuration relationship with the device under test 4 associated with each input / output simulation unit 21 as a device configuration database according to a prescribed format. Here, FIG. 5 is an example of a format showing the apparatus configuration database. In FIG. 5, the input / output means Ea operates on the input / output simulation device Pa. Similarly, the input / output means Eb is on the input / output simulation device Pb, the input / output means Ec is on the input / output simulation device Pc, and the input / output means Ed is on. It shows that on the input / output simulation device Pd, the input / output means Ee operates on the input / output simulation device Pe, and the input / output means Ef operates on the input / output simulation device Pf.

  In the configuration of the input / output simulation device 2 in FIG. 2, the device configuration in the device configuration database is one-to-one correspondence, but the input / output simulation means 21 included in the input / output simulation device 2 as shown in FIG. In the case of a configuration corresponding to a plurality of devices under test 4, the device configuration is associated with the device configuration database. Therefore, the device configuration database is an input / output simulation device Pa as shown in FIG. The input / output means Ea and Eb operating above are associated with each other, and the input / output means Ec, Ed and Ee operating on the input / output simulation device Pb are associated with each other. For example, the input / output simulation device 2e in FIG. 6A is Pb in FIG. 6A, and the input / output simulation devices 201f, 201g, and 201h in FIG. 6A are Ec and Ed in FIG. , Ee.

  The test item selection unit 13 selects a test item to be executed based on the test item database stored in the test item DB storage unit 14 and the test result database stored in the test result DB storage unit 17.

  Here, FIG. 7 shows an example of the format of the test result database. In FIG. 7, the test result of the test item TI1 (comparison with the expected result) is “match” and the device exceeding the processing capability is “none”, and the test result of the test item TI2 is “mismatch” and the processing capability is exceeded. The device is “None”, the test result of the test item TI3 is “match”, the device that exceeds the processing capacity is “Pa”, the time is “between T6 and T7”, and the test result of the test item TI4 is “mismatch” The device that exceeds the processing capacity indicates “Pb” and the time is “between T8 and T9”. If there are a plurality of devices that have exceeded the processing capacity, they can be described, and if there are a plurality of times that have exceeded, it can be described.

  Here, how to make the determination that “the processing capacity has been exceeded (of the input / output simulation device)” will be described. As described above, the processing load can be measured based on the usage rate of the CPU and whether or not the processing is completed within a specified real time in the real time operating system. That is, when the CPU usage rate is a predetermined usage rate, for example, 95% or more, or when the real-time processing does not end within the specified time, it is determined that the processing capacity has been exceeded, and the CPU usage rate is predetermined. For example, a method of determining that “the processing capability has returned to normal” can be considered when all the real-time processing ends within a predetermined time. At this time, the predetermined usage rate may be given a different value for each input / output simulation device, or the predetermined usage rate standard for determining that “the processing capacity has been exceeded” and “the processing capacity is normal. It may be possible to have a different standard for the predetermined usage rate when determining that "returned to".

  After making such a determination on the processing load measuring means 22 side, the determination is designed to be transmitted to the processing load measurement result acquiring means 12 as a measurement result. The processing load measurement result acquisition means 12 receives this measurement result, converts the reception time of each information into a relative time from the test start time, and within the format of the corresponding test item in the test result storage means 17. The identifier of the input / output simulation device 2 that has transmitted the information and the time (the period during which the processing capacity has been exceeded) are stored.

  Next, a flowchart illustrating an example of a test procedure executed by the test execution management apparatus 1 will be described with reference to FIG.

  When a test execution is instructed by the user, the test item selection means 13 takes out the first test item from the test item storage means 14 in step STP1. In step STP2, it is checked whether this test item is an item to be executed.

  Here, the test item selection means 13 holds information (hereinafter referred to as priority information) indicating whether the test item attribute should be implemented or whether there is a priority in the implementation order. This attribute means “untested test item” “test item for which the test result was successful when the processing capability of the input / output simulation device was appropriate at the previous execution” “appropriate processing capability of the input / output simulation device at the previous execution” Test item for which the test result was unsuccessful in the normal state ”“ Test item for which the test result was successful when the processing capacity of the I / O simulator was exceeded during the previous implementation ”“ Processing capacity of the I / O simulator for the previous implementation ” This is information indicating which of the “test items in which the test result is determined to have failed as a result of the test being overdone”, or in which priority order. The priority can be designated from the first priority to the fifth priority for five attributes.

  Now, following the processing of step STP2, the test item selection means 13 takes out the previous test result of the test item from the test result storage means 17 in order to check whether or not it is an item to be executed. If there is no previous test result, the attribute of the test item is “untested test item”. If there is a test result, one of the other four attributes is discriminated based on the result. Then, whether the test item of the attribute is to be executed or whether the execution priority is the first priority is checked based on the information held. If it is determined to be implemented, the process proceeds to step STP3. If not implemented, or if it is determined not to be the first priority, the process proceeds to step STP6.

  In step STP3, when the test item selection means 13 instructs the input / output simulation device control means 31 to start the input / output simulation control, the input / output simulation device control means 11 controls the input / output simulation device control as shown in FIG. Input / output simulation is instructed to each input / output simulation means 21 of each input / output simulation device 20 using the procedure. Here, the correspondence relationship between the input / output simulation means 21 and the input / output simulation device 20 is as shown in FIG.

  In step STP4, the test result determination means 16 acquires data necessary for the test determination from the input / output simulation device control means 11, compares it with the “expected result” of the test item from the test item storage means, and the result (pass / fail) Is stored as the “test result” of the test item in the test result storage means 17 (see FIG. 7).

  In step STP5, the processing load measurement result acquisition unit 12 acquires the processing load measurement result measured by the processing load measurement unit 22 of each input / output simulation device 20 during the test. With time, the test result storage means stores the test item "device exceeding the processing capacity" (see FIG. 7).

  When the execution of the test item is completed, the test item selection unit 13 takes out the next test item from the test item storage unit 24 in step STP6. If test items remain, the process returns to step STP2. Even if there are no test items remaining, if there is priority information and a test item with a low priority has not yet been implemented, the execution priority is lowered by one, and the flow returns to step STP2 to return to the top of the test item. I will check again. Test all priorities, and end the test if no test items remain.

  As described above, the processing load related to the corresponding input / output simulation means during the simulation test is measured, and the measurement result is stored together with the result of the simulation test. In this case, the fact that the test is invalid is added to the result of the test so that the test is invalid. Since it is possible to see the high possibility that the test could not operate normally due to the temporary increase in the reliability, the reliability of the test result is improved. As a result, if the processing load of the input / output simulation device is normal, it is possible to preferentially carry out test items that are the expected results of the test, so that an effect of improving the efficiency of the retest can be achieved.

Embodiment 2. FIG.
The test result DB storage unit 17 in the distributed control system test execution management apparatus according to the first embodiment associates the determination result determined by the test result determination unit 16 with the performed test item, and the processing capability measurement result acquisition unit. 12, the measurement result of the processing load of the input / output simulation device 2 acquired in 12 is stored in accordance with a prescribed format. In the second embodiment, the device configuration stored in the device configuration storage means 15 is stored in association with each other. .

  For example, the apparatus configuration information is recorded as a file on a storage medium such as an HDD, and the file name can be referred to from the test result. When the test item selection means 13 determines whether or not to execute the test item, the attribute of the test item is “test item that the test result is successful when the processing capacity of the input / output simulation device has been exceeded during the previous test. ”Or“ A test item in which the test result is failed when the input / output simulation device has exceeded the processing capacity at the previous implementation ”, compare the device configuration associated with the test result with the device configuration used this time. If the same apparatus configuration is used, even if the same test is repeated, it is determined that the processing capability is likely to be exceeded as in the previous case, so that the test item is determined not to be performed.

  In this way, by storing in the test result database in association with the device configuration, it is possible to lower the priority for test items that are likely to exceed the processing capacity as in the previous time, and to improve the efficiency of retesting. Improvements can be made.

Embodiment 3 FIG.
FIG. 9 is a flowchart illustrating an example of a test procedure executed by the test execution management apparatus 1 according to the embodiment. The difference from the flowchart shown in FIG. 7 is only step STP55, and this step STP55 has a step of determining whether the same test item is to be tested again when one test item is executed. .

  In step STP55, when a situation in which the processing load is exceeded occurs, if the length of time for the execution of the test item is within a specified range, the process does not proceed to step STP6, and the test is performed in steps STP3 to STP5. If the test is completed without the processing load being exceeded and the test is completed, the process proceeds to step 6. If the processing load is exceeded even if the test is repeated a prescribed number of times, the test item is re-executed and the test is re-executed. Configure to proceed to

In this way, when the test items are executed and the processing load is exceeded, the same test items are executed again within the specified time range. When excess processing capacity occurs or does not occur, improvement in processing efficiency can be expected by shortening the cycle until retesting.
Here, it is determined whether the test should be performed again based on whether the time taken to perform the test item is within a specified range, but it may be specified by the number of times of repeated testing.

DESCRIPTION OF SYMBOLS 1 Test execution management apparatus 11 Input / output simulation apparatus control means 13 Test item selection means 14 Test item storage means 16 Test result determination means 17 Test result storage means 2 Input / output simulation apparatus 21 Input / output simulation means 22 Processing load measurement means

Claims (3)

In a distributed control system test execution management apparatus for performing a plurality of operation tests on a distributed control system provided with a plurality of input / output means for controlling controlled devices via a network,
Input / output operation for performing input / output operation with the corresponding input / output unit as a simulation device of the controlled device, and obtaining the input / output result, and processing load for measuring and outputting the processing load related to the input / output simulation unit An input / output simulation device having a measuring means;
A test procedure indicating a control procedure in the input / output simulation means for each test item of the plurality of operation tests, and a test item storage means for storing an expected result determined based on the design in the predetermined input / output simulation means;
Test item selection means for selecting test items to be implemented from the test item storage means;
An input / output simulation device control means for controlling a predetermined input / output simulation device based on the control procedure relating to the selected test item;
A test result determination means for outputting a pass / fail determination result as to whether or not the test has been correctly performed from the input / output result for the performed test item and the predetermined input / output value corresponding to the test item;
And a test execution management device having test result storage means for storing the processing load and the pass / fail determination result for the performed test item in association with the test item,
The test item selection means changes the priority order of the test items to be executed among the test items to be executed with reference to the processing load and the pass / fail judgment result for each test item stored in the test result storage means. A distributed control system test execution management device characterized by the above. Provide multiple input / output simulation devices,
The test execution management device includes device configuration storage means for storing device configuration information indicating the configuration of the input / output means corresponding to the input / output simulation means controlled for each of the plurality of operation test items. There,
The test item selection means includes the test items to be executed.
Test items that have not been scheduled for the test, and
A test item that was correctly executed in a state where the processing load corresponding to the test item corresponding to the previous test item was lower than a predetermined load,
Test items that were not correctly implemented when the processing load corresponding to the corresponding test item was lower than a predetermined load when the previous test was performed,
A test item that is said to have been correctly implemented in a state where the processing load corresponding to the test item corresponding to the previous test item is equal to or higher than a predetermined load;
The processing load corresponding to the test item corresponding to the test item executed last time based on the classification of the test item corresponding to the test item corresponding to the test item corresponding to the test item executed the previous time when the test load was not properly executed. 2. The distribution according to claim 1, wherein the test is not performed when there is no change in the apparatus configuration information in the test item when the test item is in a state of being equal to or greater than a predetermined load when the test item is performed last time. Control system test execution management device. Test result storage means
Furthermore, the time for which the processing load for the test item performed is in a state of a predetermined load or more is stored,
The test item selection means refers to the processing load for each test item stored in the test result storage means and the time when the state is equal to or higher than a predetermined load and the pass / fail judgment result,
For test items whose processing load corresponding to the test item corresponding to the previous test item was equal to or higher than the predetermined load, the test item is selected again, and the test item is selected a specified number of times. 2. When the time that has been in the state of the predetermined load or more exceeds a predetermined allowable time range, the test item is again selected and the next test item is selected. The test execution management device for a distributed control system according to claim 3.

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