JP2011192933A - Ion trap frequency standard device - Google Patents

Ion trap frequency standard device Download PDF

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JP2011192933A
JP2011192933A JP2010059971A JP2010059971A JP2011192933A JP 2011192933 A JP2011192933 A JP 2011192933A JP 2010059971 A JP2010059971 A JP 2010059971A JP 2010059971 A JP2010059971 A JP 2010059971A JP 2011192933 A JP2011192933 A JP 2011192933A
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electromagnetic wave
mercury ions
ground state
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JP5167298B2 (en
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Katao Morikawa
容雄 森川
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Anritsu Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an ion trap frequency standard device having an anti-reflection film that prevents light scattering that optically pumps mercury ions. <P>SOLUTION: An ion trap frequency standard device 302 is equipped with: an optical pumping means 15 that collects mercury ions 102 in a container 17 at a lower level of a ground state by optical pumping; an electromagnetic wave irradiation means 13 that transits mercury ions 103 collected at the lower level of the ground state to the upper level by irradiating an electromagnetic wave; a light receiving means 14 that measures a light intensity of a fluorescence 23 emitted when the mercury ions 103 return to the ground state again through an excited state by the optical pumping means; a control means that adjusts a frequency of an electromagnetic wave so that the light intensity of the fluorescence 23 becomes greatest; an output means that outputs the frequency of the electromagnetic wave irradiated by the electromagnetic wave irradiation means 13 as an output frequency; and an anti-reflection film 27 that is a thin metal film having a moth-eye structure and arranged around a region where the mercury ions 102 in the container 17 is optically pumped. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、水銀イオンを使用したイオントラップ型周波数標準器に関する。   The present invention relates to an ion trap type frequency standard using mercury ions.

超高真空容器内に閉じこめられた原子−分子、イオンに励起光を照射し、励起された該原子、分子、イオンからの微弱な蛍光を観測する装置において、該励起光や該原子を特定の空間領域に閉じこめるためのトラップ光が容器壁等から散乱されて該蛍光と一緒に蛍光検出器に入射することがある。これらの散乱光は不要光であり、蛍光検出の信号雑音比を劣化させる。このため、良好な信号雑音比を得るためには極力これらの散乱光を抑制することが必要である。   In an apparatus for irradiating excitation light to atoms-molecules and ions confined in an ultra-high vacuum vessel and observing weak fluorescence from the excited atoms, molecules and ions, the excitation light and the atoms are specified. Trap light to be confined in the space region may be scattered from the container wall or the like and enter the fluorescence detector together with the fluorescence. These scattered lights are unnecessary lights, and degrade the signal-to-noise ratio of fluorescence detection. For this reason, in order to obtain a good signal-to-noise ratio, it is necessary to suppress these scattered lights as much as possible.

例えば、超高真空容器の壁等の散乱面を反射係数の小さな反射防止膜で覆うことで散乱光を抑制することができる。超高真空容器内で使用する反射防止膜には、ガス放出が小さく、真空ベーキングに耐える高い耐熱温度を有していることが求められる。例えば、高真空環境下で使用できる反射防止膜として、容器壁をコーティングして黒色化処理する無電解ニッケルメッキやＤＬＣ（ダイヤモンドライクカーボン）薄膜（例えば、非特許文献１を参照。）、あるいは誘電体多層膜が知られている。   For example, scattered light can be suppressed by covering a scattering surface such as a wall of an ultra-high vacuum container with an antireflection film having a small reflection coefficient. An antireflection film used in an ultra-high vacuum container is required to have a high heat-resistant temperature that is small in gas emission and can withstand vacuum baking. For example, as an antireflection film that can be used in a high vacuum environment, electroless nickel plating or DLC (diamond-like carbon) thin film (for example, refer to Non-Patent Document 1) or dielectric that coats the container wall to make it black. Multi-layer films are known.

齊藤芳男、「大型真空システムに利用される最近の材料 −Ｊ・ＰＡＲＣ加速器での例−」、真空、Ｖｏｌ．４９（２００６）、Ｎｏ．８ ｐｐ．４５３−４５９Yoshio Saito, “Recent Materials Used in Large Vacuum Systems-Examples of J / PARC Accelerators”, Vacuum, Vol. 49 (2006), no. 8 pp. 453-459

しかし、ＤＬＣ薄膜は、反射防止特性が得られる波長が特定の波長領域に限定されているという課題がある。そこで、本発明は、水銀イオンを光ポンピングする光の散乱を防止できる反射防止膜を備えるイオントラップ型周波数標準器を提供することを目的とする。   However, the DLC thin film has a problem that the wavelength at which antireflection characteristics are obtained is limited to a specific wavelength region. Therefore, an object of the present invention is to provide an ion trap type frequency standard device including an antireflection film that can prevent scattering of light for optically pumping mercury ions.

上記目的を達成するために、本発明に係るイオントラップ型周波数標準器は、広い波長領域で良好な反射防止特性が得られるモスアイ構造を放出ガスが小さくかつ耐熱温度の高い金属薄膜に転写した反射防止膜で容器壁等の散乱面を覆い散乱光を抑制することとした。   In order to achieve the above object, the ion trap type frequency standard according to the present invention is a reflection obtained by transferring a moth-eye structure capable of obtaining good antireflection characteristics in a wide wavelength region to a metal thin film having a small emission gas and a high heat resistance temperature. It was decided to cover the scattering surface such as the container wall with the prevention film to suppress scattered light.

具体的には、本発明に係るイオントラップ型周波数標準器は、容器（１７）内の水銀イオンを光ポンピングして前記水銀イオンを基底状態（２Ｓ１／２）の下準位（Ｆ＝０）へ集める光ポンピング手段（１５）と、上準位（Ｆ＝１）と下準位の間のエネルギー差に相当する周波数の電磁波を照射して、前記光ポンピング手段で基底状態の下準位に集まった前記水銀イオンを基底状態の上準位に遷移させる電磁波照射手段（１３）と、前記電磁波照射手段で上準位へ遷移した前記水銀イオンを前記光ポンピング手段で再び光ポンピングし、該水銀イオンが励起状態を経由して再び基底状態へ戻る際に放射される蛍光の光強度を測定する受光手段（１４）と、前記受光手段で測定した前記蛍光の光強度が最大となるように前記電磁波照射手段が照射する前記電磁波の周波数を調整する制御手段と、前記電磁波照射手段が照射する前記電磁波の周波数を出力周波数として出力する出力手段と、前記容器内のうち前記水銀イオンが光ポンピングされる領域の周囲に配置され、モスアイ構造を有する金属薄膜の反射防止膜（２７）と、を備える。 Specifically, an ion trap frequency standard according to the present invention, the lower level of containers mercury ions by optical pumping the mercury ions to the ground state in the (17) (2 S 1/2) (F = And an optical pumping means (15) that collects to 0) and an electromagnetic wave having a frequency corresponding to the energy difference between the upper level (F = 1) and the lower level, and the lower level of the ground state is irradiated by the optical pumping means. Electromagnetic wave irradiation means (13) for transitioning the mercury ions collected at the level to the upper level of the ground state, and the mercury ion transitioned to the upper level by the electromagnetic wave irradiation means is optically pumped again by the optical pumping means, A light receiving means (14) for measuring the light intensity of the fluorescence emitted when the mercury ions return to the ground state again via the excited state, and the light intensity of the fluorescence measured by the light receiving means is maximized. The electromagnetic wave irradiation means A control means for adjusting the frequency of the electromagnetic wave to be irradiated, an output means for outputting the frequency of the electromagnetic wave irradiated by the electromagnetic wave irradiation means as an output frequency, and a surrounding area of the container where the mercury ions are optically pumped And a metal thin film antireflection film (27) having a moth-eye structure.

本発明に係るイオントラップ型周波数標準器の前記反射防止膜は、光ポンピングされる前記領域に前記水銀イオンをトラップする電極にも配置されていることが好ましい。   It is preferable that the antireflection film of the ion trap type frequency standard according to the present invention is also disposed on the electrode that traps the mercury ions in the region to be optically pumped.

前記反射防止膜は、金属薄膜であるため、放出ガスが小さくかつ耐熱温度を高くすることができる。さらに、前記反射防止膜は、表面にモスアイ構造が形成された金属薄膜であるので、水銀イオンを光ポンピングする光が容器壁等で散乱するのを防止できる。従って、本発明は、水銀イオンを光ポンピングする光の散乱を防止できる反射防止膜を備えるイオントラップ型周波数標準器を提供することができる。   Since the antireflection film is a metal thin film, the emitted gas is small and the heat resistant temperature can be increased. Furthermore, since the antireflection film is a metal thin film having a moth-eye structure formed on the surface, it is possible to prevent light for optically pumping mercury ions from being scattered on the container wall or the like. Therefore, the present invention can provide an ion trap type frequency standard equipped with an antireflection film capable of preventing scattering of light for optically pumping mercury ions.

本発明は、水銀イオンを光ポンピングする光の散乱を防止できる反射防止膜を備えるイオントラップ型周波数標準器を提供することができる。また、本イオントラップ型周波数標準器は、水銀イオンが光ポンピングされる領域の周囲にこの反射防止膜を配置して散乱光を低減するため、良好な信号雑音比を得ることができる。   The present invention can provide an ion trap type frequency standard equipped with an antireflection film capable of preventing scattering of light for optically pumping mercury ions. Further, the present ion trap type frequency standard device can obtain a good signal-to-noise ratio because this antireflection film is disposed around the area where mercury ions are optically pumped to reduce scattered light.

本発明に係るイオントラップ型周波数標準器を説明する図である。It is a figure explaining the ion trap type | mold frequency standard device which concerns on this invention. 本発明に係るイオントラップ型周波数標準器を説明する図である。It is a figure explaining the ion trap type | mold frequency standard device which concerns on this invention. 水銀イオンエネルギー準位を説明する図である。It is a figure explaining a mercury ion energy level. 反射防止膜のないイオントラップ型周波数標準器を説明する図である。It is a figure explaining the ion trap type | mold frequency standard device without an antireflection film.

以下、具体的に実施形態を示して本発明を詳細に説明するが、本願の発明は以下の記載に限定して解釈されない。なお、本明細書及び図面において符号が同じ構成要素は、相互に同一のものを示すものとする。   Hereinafter, the present invention will be described in detail with specific embodiments, but the present invention is not construed as being limited to the following description. In the present specification and drawings, the same reference numerals denote the same components.

図１は、本実施形態のイオントラップ型周波数標準器３０２を説明する図である。イオントラップ型周波数標準器３０２は、容器１７内の水銀イオン１０２を光ポンピングして水銀イオン１０２を基底状態の下準位へ集める光ポンピング手段１５と、上準位と下準位の間のエネルギー差に対応する周波数の電磁波を照射して、光ポンピング手段１５で基底状態の下準位に集まった水銀イオン１０３を上準位へ遷移させる電磁波照射手段１３と、電磁波照射手段１３で上準位へ遷移した水銀イオン１０２を光ポンピング手段１５で再び光ポンピングし、水銀イオン１０２が励起状態を経由して再び基底状態へ戻る際に放射される蛍光２３の光強度を測定する受光手段１４と、受光手段１４で測定した蛍光２３の光強度が最大となるように電磁波照射手段１３が照射する電磁波の周波数を調整する制御手段（不図示）と、電磁波照射手段１３が照射する電磁波の周波数を出力周波数として出力する出力手段（不図示）と、容器１７内のうち水銀イオン１０２が光ポンピングされる領域の周囲に配置され、モスアイ構造を有する金属薄膜の反射防止膜２７と、を備える。   FIG. 1 is a diagram illustrating an ion trap type frequency standard 302 according to this embodiment. The ion trap type frequency standard 302 is an optical pumping means 15 for optically pumping the mercury ions 102 in the container 17 and collecting the mercury ions 102 to the lower level of the ground state, and the energy between the upper level and the lower level. An electromagnetic wave irradiation means 13 for irradiating an electromagnetic wave having a frequency corresponding to the difference and causing the optical pumping means 15 to transition the mercury ions 103 collected at the lower level of the ground state to the upper level, and the electromagnetic wave irradiation means 13 for the upper level. The light-receiving means 14 for measuring the light intensity of the fluorescence 23 emitted when the mercury ion 102 returns to the ground state again via the excited state, Control means (not shown) for adjusting the frequency of the electromagnetic wave emitted by the electromagnetic wave irradiation means 13 so that the light intensity of the fluorescence 23 measured by the light receiving means 14 is maximized; An output means (not shown) for outputting the frequency of the electromagnetic wave emitted by the radiating means 13 as an output frequency, and a metal thin film having a moth-eye structure, which is disposed around the region in the container 17 where the mercury ions 102 are optically pumped. And an antireflection film 27.

水銀源１０１は、容器１７内に水銀蒸気を供給する。電子銃１６は電子線２２で水銀蒸気を水銀イオンにイオン化する。四重極トラップ１８は、１〜２ＭＨｚのＲＦ電圧が印加されており、水銀イオンを中心部に閉じ込める。図１では、この様子を水銀イオン１０２として示している。光ポンピング手段１５は、波長１９４．２ｎｍの励起光２１を出力する水銀ランプである。   The mercury source 101 supplies mercury vapor into the container 17. The electron gun 16 ionizes mercury vapor into mercury ions with an electron beam 22. The quadrupole trap 18 is applied with an RF voltage of 1 to 2 MHz and traps mercury ions in the center. In FIG. 1, this state is shown as mercury ions 102. The optical pumping means 15 is a mercury lamp that outputs excitation light 21 having a wavelength of 194.2 nm.

光ポンピングについて、図３の水銀イオンのエネルギー準位の図で説明する。水銀イオンは２つのエネルギー状態、つまり基底状態２Ｓ１／２と励起状態２Ｐ１／２を持ち、基底状態は二つのエネルギー準位（Ｆ＝０、１）から構成される。ここで、光ポンピング手段１５から励起光２１を照射すると、基底状態の準位Ｆ＝１にあるイオンのみが励起状態へ遷移する。しかし、励起状態に遷移したイオンは、すぐに基底状態へ遷移する。このとき、イオンはそれぞれの準位（Ｆ＝０、１）に均等に遷移する。そして、基底状態の準位Ｆ＝１にあるイオンは、励起光２１を吸収して再び励起状態へ上がる。一方、基底状態の準位Ｆ＝０にあるイオンは、そのまま残る。これを繰り返すことで、全てのイオンは基底状態の準位Ｆ＝０に集まる。 The optical pumping will be described with reference to the energy level diagram of mercury ion in FIG. Mercury ions have two energy states, namely a ground state 2 S 1/2 and an excited state 2 P 1/2 , and the ground state is composed of two energy levels (F = 0, 1). Here, when the excitation light 21 is irradiated from the optical pumping means 15, only the ions in the ground state level F = 1 transition to the excitation state. However, the ion that has transitioned to the excited state immediately transitions to the ground state. At this time, the ions uniformly transition to the respective levels (F = 0, 1). Then, the ions in the ground state level F = 1 absorb the excitation light 21 and rise to the excited state again. On the other hand, ions in the ground state level F = 0 remain as they are. By repeating this, all ions gather at the ground state level F = 0.

十二重極トラップ１９も、１〜２ＭＨｚのＲＦ電圧が印加されており、水銀イオンを中心部に閉じ込めることができる。十二重極トラップ１９は、光ポンピングされた水銀イオン１０２を四重極トラップ１８から取り出し、中心部に閉じ込める。図１では、この様子を水銀イオン１０３として示している。   The doubly-polar trap 19 is also applied with an RF voltage of 1 to 2 MHz and can confine mercury ions in the center. The ten-pole trap 19 takes out the optically pumped mercury ions 102 from the quadrupole trap 18 and confines them in the center. In FIG. 1, this state is shown as mercury ions 103.

電磁波照射手段１３は、例えば、４０ＧＨｚ導波管である。電磁波照射手段１３は、制御手段で周波数が設定された電磁波を水銀イオン１０３に照射する。このときの水銀イオン１０３の様子を図３の水銀イオンのエネルギー準位の図で説明する。光ポンピング直後の水銀イオン１０３は基底状態の準位Ｆ＝０にある。周波数４０．５ＧＨｚの電磁波が照射されると、基底状態の準位Ｆ＝０にあるイオンは同じ基底状態の準位Ｆ＝１に遷移する。このとき、電磁波の周波数が４０．５ＧＨｚからずれると基底状態の準位Ｆ＝０から準位Ｆ＝１へ遷移するイオンの量が少なくなる。   The electromagnetic wave irradiation means 13 is, for example, a 40 GHz waveguide. The electromagnetic wave irradiation means 13 irradiates the mercury ions 103 with an electromagnetic wave whose frequency is set by the control means. The state of the mercury ion 103 at this time will be described with reference to the energy level diagram of the mercury ion in FIG. The mercury ion 103 immediately after the optical pumping is at the ground state level F = 0. When an electromagnetic wave with a frequency of 40.5 GHz is irradiated, ions in the ground state level F = 0 transition to the same ground state level F = 1. At this time, when the frequency of the electromagnetic wave deviates from 40.5 GHz, the amount of ions that transition from the ground state level F = 0 to the level F = 1 decreases.

続いて、四重極トラップ１８は電磁波が照射された水銀イオン１０３を十二重極トラップ１９から取り出し、再び中心部に閉じ込める。図１では、この様子を水銀イオン１０２として示している。四重極トラップ１８では光ポンピング手段１５から励起光２１が照射されているので、水銀イオン１０２の基底状態の準位Ｆ＝１にあるイオンは励起状態へ遷移することになる。そして、励起状態へ遷移したイオンは、すぐに蛍光２３を出して基底状態へ遷移する。   Subsequently, the quadrupole trap 18 takes out the mercury ions 103 irradiated with the electromagnetic wave from the dodecapole trap 19 and confines them again in the center. In FIG. 1, this state is shown as mercury ions 102. Since the excitation light 21 is irradiated from the optical pumping means 15 in the quadrupole trap 18, ions in the ground state level F = 1 of the mercury ion 102 transition to the excitation state. The ions that have transitioned to the excited state immediately emit fluorescence 23 and transition to the ground state.

受光手段１４は、蛍光２３の光強度を測定する。ここで、前述のように電磁波照射手段１３が照射した電磁波の周波数が４０．５ＧＨｚからずれていると基底状態の準位Ｆ＝１にあるイオンが少ないので、蛍光２３の光強度が弱くなる。そこで、制御手段は、蛍光２３の光強度が最大となるように電磁波の周波数を調整する。出力手段は、制御手段が調整した電磁波の周波数を出力周波数として出力する。イオントラップ型周波数標準器３０２は、このようにして、正確な４０．５ＧＨｚの周波数を出力することができる。なお、イオントラップ型周波数標準器３０２は、磁場の影響を低減するための磁場シールド１１及びエネルギー状態の縮退を解くＣコイル１２も備えている。   The light receiving means 14 measures the light intensity of the fluorescence 23. Here, when the frequency of the electromagnetic wave irradiated by the electromagnetic wave irradiation means 13 deviates from 40.5 GHz as described above, the number of ions in the ground state level F = 1 is small, and thus the light intensity of the fluorescence 23 is weakened. Therefore, the control means adjusts the frequency of the electromagnetic wave so that the light intensity of the fluorescence 23 is maximized. The output means outputs the frequency of the electromagnetic wave adjusted by the control means as an output frequency. In this way, the ion trap type frequency standard 302 can output an accurate frequency of 40.5 GHz. The ion trap type frequency standard 302 is also provided with a magnetic field shield 11 for reducing the influence of the magnetic field and a C coil 12 for solving the degeneracy of the energy state.

反射防止膜２７は、表面にモスアイ構造を有する金属薄膜である。容器１７は高真空とするために高温ベーキングされる。このため、金属薄膜は、耐熱温度が高く、ベーキング時に放出ガスが少ない金属とする。例えば、金属薄膜は金である。   The antireflection film 27 is a metal thin film having a moth-eye structure on the surface. The container 17 is baked at a high temperature to make a high vacuum. For this reason, the metal thin film is made of a metal having a high heat-resistant temperature and a small amount of released gas during baking. For example, the metal thin film is gold.

図２は、イオントラップ型周波数標準器３０２の反射防止膜２７を説明する図である。反射防止膜２７は、水銀イオン１０２が四重極トラップ１８（図２において不図示）でトラップされる領域の周囲に配置されている。例えば、反射防止膜２７は、容器１７の内壁に貼り付けられる。さらに、反射防止膜２７は、金属であるため、四重極トラップ１８の電極にも貼り付けることができる。   FIG. 2 is a diagram illustrating the antireflection film 27 of the ion trap type frequency standard 302. The antireflection film 27 is disposed around a region where the mercury ions 102 are trapped by the quadrupole trap 18 (not shown in FIG. 2). For example, the antireflection film 27 is attached to the inner wall of the container 17. Furthermore, since the antireflection film 27 is made of metal, it can be attached to the electrode of the quadrupole trap 18.

図４は、反射防止膜を具備しないイオントラップ型周波数標準器３００を説明する図である。イオントラップ型周波数標準器３００において、光ポンピング手段１５からの励起光２１は、容器１７の内壁や四重極トラップ電極１８に当たり散乱する。散乱光２９の一部は蛍光２３とともに受光手段１４に受光されることになる。一方、図２のイオントラップ型周波数標準器３０２においても、光ポンピング手段１５からの励起光２１は、同様に容器１７の内壁や四重極トラップ電極１８に当たるが、これらには反射防止膜２７が配置されており、散乱光の発生を抑制することができる。従って、受光手段１４が受光する散乱光が低減し、イオントラップ型周波数標準器３０２は良好な信号雑音比を得ることができる。   FIG. 4 is a diagram illustrating an ion trap type frequency standard 300 that does not include an antireflection film. In the ion trap type frequency standard 300, the excitation light 21 from the optical pumping means 15 hits the inner wall of the container 17 and the quadrupole trap electrode 18 and is scattered. A part of the scattered light 29 is received by the light receiving means 14 together with the fluorescence 23. On the other hand, also in the ion trap type frequency standard 302 of FIG. 2, the excitation light 21 from the optical pumping means 15 similarly hits the inner wall of the container 17 and the quadrupole trap electrode 18. It is arrange | positioned and generation | occurrence | production of scattered light can be suppressed. Therefore, the scattered light received by the light receiving means 14 is reduced, and the ion trap type frequency standard 302 can obtain a good signal-to-noise ratio.

１１：磁場シールド
１２：Ｃコイル
１３：電磁波照射手段
１４：受光手段
１５：光ポンピング手段
１６：電子銃
１７：容器
１８：四重極トラップ
１９：十二重極トラップ
２１：励起光
２２：電子線
２３：蛍光
２７：反射防止膜
２９：散乱光
１０１：水銀源
１０２、１０３：水銀イオン
３００、３０２：イオントラップ型周波数標準器 11: Magnetic field shield 12: C coil 13: Electromagnetic wave irradiation means 14: Light receiving means 15: Optical pumping means 16: Electron gun 17: Container 18: Quadrupole trap 19: Doubly pole trap 21: Excitation light 22: Electron beam 23: Fluorescence 27: Antireflection film 29: Scattered light 101: Mercury source 102, 103: Mercury ion 300, 302: Ion trap type frequency standard

Claims (2)

容器（１７）内の水銀イオンを光ポンピングして前記水銀イオンを基底状態の下準位へ集める光ポンピング手段（１５）と、
上準位と下準位の間のエネルギー差に対応する周波数の電磁波を照射して、前記光ポンピング手段で基底状態の下準位に集まった前記水銀イオンを基底状態の上準位へ遷移させる電磁波照射手段（１３）と、
前記電磁波照射手段で上準位へ遷移した前記水銀イオンを前記光ポンピング手段で再び光ポンピングし、該水銀イオンが励起状態を経由して再び基底状態へ戻る際に放射される蛍光の光強度を測定する受光手段（１４）と、
前記受光手段で測定した前記蛍光の光強度が最大となるように前記電磁波照射手段が照射する前記電磁波の周波数を調整する制御手段と、
前記電磁波照射手段が照射する前記電磁波の周波数を出力周波数として出力する出力手段と、
前記容器内のうち前記水銀イオンが光ポンピングされる領域の周囲に配置され、モスアイ構造を有する金属薄膜の反射防止膜（２７）と、
を備えるイオントラップ型周波数標準器。 Optical pumping means (15) for optically pumping mercury ions in the container (17) and collecting the mercury ions to a lower level of a ground state;
Irradiate an electromagnetic wave having a frequency corresponding to the energy difference between the upper level and the lower level, and the optical pumping means causes the mercury ions collected at the lower level of the ground state to transition to the upper level of the ground state. Electromagnetic wave irradiation means (13);
The mercury ion transitioned to the upper level by the electromagnetic wave irradiation means is optically pumped again by the optical pumping means, and the light intensity of the fluorescence emitted when the mercury ion returns to the ground state again via the excited state is determined. A light receiving means (14) for measuring;
Control means for adjusting the frequency of the electromagnetic wave emitted by the electromagnetic wave irradiation means so that the light intensity of the fluorescence measured by the light receiving means is maximized;
An output means for outputting the frequency of the electromagnetic wave emitted by the electromagnetic wave irradiation means as an output frequency;
An antireflection film (27) of a metal thin film having a moth-eye structure, which is disposed around a region where the mercury ions are optically pumped in the container;
Ion trap type frequency standard equipped with. 前記反射防止膜は、光ポンピングされる前記領域に前記水銀イオンをトラップする電極にも配置されていることを特徴とする請求項１に記載のイオントラップ型周波数標準器。   2. The ion trap type frequency standard according to claim 1, wherein the antireflection film is also disposed on an electrode for trapping the mercury ions in the region to be optically pumped.
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