JP2010249735A - Reflection characteristics measuring device, method therefor, and spectral characteristic measuring device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a reflection characteristics measuring device and a method therefor capable of measuring a close spectral reflectance coefficient by visibility, and measuring the reflection characteristics of a sample, based on the spectral reflectance coefficient, and to provide a spectral characteristic measuring device capable of measuring a spectral characteristic of the sample, based on the spectral reflectance coefficient. <P>SOLUTION: The spectral characteristics measuring device S includes: a measuring part for measuring a first spectral reflectance coefficient of the sample 1, based on a first diffusion illumination condition including regularly reflected light, and measuring a second spectral reflectance coefficient of the sample 1, based on a second diffusion illumination condition which does not include regularly reflected light; and an operation part for determining the spectral reflectance coefficient, by calculating the weighted average of the first spectral reflectance coefficient and the second spectral reflectance coefficient measured by the measuring part. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to a reflection characteristic measuring apparatus and a reflection characteristic measuring method for measuring a reflection characteristic of a sample. The present invention relates to a spectral characteristic measuring apparatus that includes this reflective characteristic measuring apparatus and measures spectral characteristics of a sample based on the reflective characteristics.

The color is perceived when the retina of the eye is stimulated by the light entering the human eye and the human brain reacts to the stimulus. The color perceived by this person's perception is subjective, but is standardized by the Commission International de l'Eclairage (CIE), XYZ color system, L ^* a ^* b ^* table It is possible to quantify the color system (CIE Lab color system) or L ^* C ^* h color system.

  Colors that are digitized in such a color system are generally measured by a measuring device called a colorimeter. The color measurement methods of this colorimeter are roughly classified into a stimulus value direct reading method and a spectral colorimetry method. This stimulus value direct reading method measures reflected light from a sample (sample) with three X, Y, and Z sensors each having a response level substantially equal to the spectral response level corresponding to the human eye. , Y, Z values are obtained directly from the sensors. Spectral colorimetry measures the reflectance (spectral reflectance coefficient) of each wavelength by dispersing the reflected light from the sample with a diffraction grating and receiving the spectrum with a plurality of sensors, and this spectral reflectance coefficient. This is a method of calculating numerical values in the color system based on the above. Each color system is linked to each other by a predetermined function expression, and it is possible to obtain numerical values in other color systems by obtaining numerical values in one color system.

  The object (sample) absorbs and scatters part of the illumination light from the light source and reflects the remainder. In the case of an object color, the light that enters the human eye is reflected light reflected by the object, so that the color appearance depends on the light source (the spectral distribution of the illumination light), the illumination position, the surface condition of the sample, and the observation. It depends on various observation conditions such as direction and individual differences among observers. For this reason, the spectral reflectance coefficient depends on the difference in predetermined observation conditions during measurement, that is, diffuse illumination conditions (Specular Component Included) including specular reflection light (specular reflection component, specular reflection component, specular reflection component) from the sample. , SCI) spectral reflectance coefficient (SCI spectral reflectance coefficient) and spectral reflectance coefficient (SCE spectroscopy) measured under diffuse illumination conditions (Specular Component Excluded, SCE) that do not include specularly reflected light from the sample. These are appropriately used depending on, for example, the surface state of the sample and the usage of the colorimeter. It is said that under the SCI diffuse illumination condition, the color of the material itself is evaluated, and under the SCE diffuse illumination condition, the color evaluation is close to visual observation.

  For the measurement of the SCI spectral reflectance coefficient and the SCE spectral reflectance coefficient, for example, in the case of an 8 ° light receiving d / 8 optical system (diffuse illumination / 8 ° direction light receiving), the normal to the sample surface is used. An integrating sphere having a trap mechanism capable of opening and closing a partial region of the inner wall of the integrating sphere corresponding to the -8 ° direction is used, and the SCI spectral reflectance coefficient is measured by closing the trap mechanism, and the SCI spectral reflectance coefficient is measured. A reflectance coefficient is output, the SCE spectral reflectance coefficient is measured by opening the trap mechanism, and the SCE spectral reflectance coefficient is output (for example, see Patent Document 1).

JP 09-061243 A

  By the way, as described above, the appearance depends on various observation conditions, and the surface state of the sample cannot be uniformly discriminated between glossy having a large specular reflection component and glossless which is a complete diffusion surface. In addition, when a user (person) visually evaluates a sample, in order to unintentionally eliminate the influence of illumination light and observe the original color of the sample, generally, the specularly reflected light of the illumination light reflected on the sample surface is somewhat Remove and observe. For this reason, it is difficult to express the appearance more accurately only with the SCI spectral reflectance coefficient and the SCE spectral reflectance coefficient. In Patent Document 1, only one of the SCI spectral reflectance coefficient and the SCE spectral reflectance coefficient is output, and this cannot be dealt with.

  The present invention has been made in view of the above circumstances, and its purpose is to measure a spectral reflectance coefficient closer to the appearance and to measure the reflection characteristics of a sample based on the spectral reflectance coefficient. It is to provide a reflection characteristic measuring apparatus and a reflection characteristic measuring method that can be performed. And this invention is providing the spectral characteristic measuring apparatus which can measure the spectral characteristic of a sample based on this reflection characteristic, ie, based on this spectral reflectance coefficient.

  As a result of various studies, the present inventor has found that the above object is achieved by the present invention described below. That is, the reflection characteristic measuring apparatus according to one aspect of the present invention measures the first spectral reflectance coefficient of the sample under the first diffuse illumination condition including specularly reflected light, and the second diffused illumination not including the specularly reflected light. A spectral reflectance coefficient is obtained by weighted averaging a measurement unit that measures the second spectral reflectance coefficient of the sample under conditions, and the first spectral reflectance coefficient and the second spectral reflectance coefficient measured by the measurement unit. And an operation unit to be obtained. According to another aspect of the invention, there is provided a reflection characteristic measurement method that includes an SCI measurement step of measuring a first spectral reflectance coefficient of a sample under first diffuse illumination conditions including specular reflection light, and does not include the specular reflection light. An SCE measurement step of measuring a second spectral reflectance coefficient of the sample under a second diffuse illumination condition, a first spectral reflectance coefficient measured in the SCI measurement step, and a second spectral reflection measured in the SCE measurement step. And a calculation step of obtaining a spectral reflectance coefficient by performing weighted averaging of the rate coefficient.

  In the reflection characteristic measuring apparatus and the reflection characteristic measuring method having such a configuration, the first spectral reflectance coefficient (SCI spectral reflectance coefficient) of the sample is measured under the first diffuse illumination condition including the regular reflected light, and the regular reflected light is measured. The second spectral reflectance coefficient (SCE spectral reflectance coefficient) of the sample is measured under a second diffuse illumination condition that does not include the above, and the first spectral reflectance coefficient and the second spectral reflectance coefficient are weighted and averaged. A reflectance coefficient is determined. For this reason, the reflection characteristic measuring apparatus and the reflection characteristic measuring method having the above-described configuration can measure the spectral reflectance coefficient closer to the appearance, and can measure the reflection characteristics of the sample based on the spectral reflectance coefficient. . Therefore, a reflection characteristic closer to the appearance can be obtained.

  In another aspect, the reflection characteristic measuring apparatus further includes an input unit for inputting the weighted average weight.

  According to this configuration, since the weighted average weight can be input from the input unit, for example, the weighted average weight can be finely adjusted, and the spectral reflectance coefficient closer to the appearance can be measured. It becomes possible.

  According to another aspect, the above-described reflection characteristic measurement device further includes a storage unit that stores a weight table indicating a correspondence relationship between the observation condition name of the sample and the weight of the weighted average. .

  According to this configuration, since the weight table indicating the correspondence between the observation condition name of the sample and the weighted average weight is stored in the storage unit, the appropriate observation condition name of the sample can be selected by selecting the observation condition name of the sample. A weighted average weight can be set, and a spectral reflectance coefficient closer to the appearance can be measured. For example, the weight table may be incorporated in the reflection characteristic measuring apparatus in advance by a manufacturer or the like, or may be incorporated in the reflection characteristic measuring apparatus by being input from a predetermined input unit by the user, for example.

  In another aspect of the present invention, the first spectral reflectance coefficient measured under the first diffuse illumination condition including specularly reflected light and the second measured under the second diffuse illumination condition not including the specularly reflected light. A light source box for determining a weight of the weighted average used when weighted average of spectral reflectance coefficients, and a predetermined casing and a predetermined fixed position provided in a predetermined position in the casing It is provided with the light source, the arrangement | positioning member for arrange | positioning a sample provided in the said housing | casing, and the observation window provided in the said housing | casing for observing the reflected light from the said sample.

  In the light source box having such a configuration, the light source is provided so as to be fixed at a predetermined position in the casing, the arrangement position of the sample is fixed by the arrangement member, and the observation direction of the sample is also fixed by the observation window. Various conditions of the light source (spectral distribution of illumination light), illumination position, and observation direction are specified, the sample can be observed more stably, and the weighted average weight can be determined more stably. .

  In another aspect of the present invention, the spectral characteristic measurement includes a reflectance measuring unit that obtains a spectral reflectance coefficient of the sample, and a spectral characteristic measuring unit that obtains the spectral characteristic of the sample based on the spectral reflectance coefficient. In the apparatus, the reflectance measuring unit is any of the above-described reflection characteristic measuring apparatuses.

  The spectral characteristic measuring apparatus having such a configuration can measure the spectral reflectance coefficient closer to the appearance with the reflectance measuring unit, and can measure the spectral characteristics of the sample based on the spectral reflectance coefficient. Therefore, spectral characteristics closer to the appearance can be obtained.

  The reflection characteristic measuring apparatus and the reflection characteristic measuring method according to the present invention can measure the spectral reflectance coefficient closer to the appearance, and can measure the reflection characteristic of the sample based on the spectral reflectance coefficient.

  Further, the spectral characteristic measuring apparatus according to the present invention can measure a spectral reflectance coefficient closer to the appearance, and can measure the spectral characteristics of the sample based on the spectral reflectance coefficient.

  In the light source box according to the present invention, the conditions of the light source (spectral distribution of illumination light), illumination position, and observation direction are specified, and the sample can be observed more stably, and the weighted average can be more stably performed. Can be determined.

It is sectional drawing which shows schematic structure of the spectral characteristic measuring apparatus in embodiment. It is sectional drawing which shows the structure of the integrating sphere and its peripheral member in the spectral characteristic measuring apparatus of embodiment. It is sectional drawing which shows the structure of the spectrometer in the spectral characteristic measuring apparatus of embodiment. It is a block diagram which shows the electrical structure of the spectral characteristic measuring apparatus in embodiment. It is a figure for demonstrating the SCI diffuse illumination which contains regular reflection light, and the SCE diffuse illumination which does not contain regular reflection light. It is a flowchart which shows operation | movement of the spectral characteristic measuring apparatus in embodiment. It is a figure for demonstrating the measuring method of the weight of a weighted average. It is a figure which shows the chart for weight measurement used for the measurement of the weight of a weighted average. It is a perspective view which shows the structure of the light source box used for the measurement of the weight of a weighted average. It is a figure for demonstrating the relationship between the light source position in a light source box, and the regular reflection component intensity | strength radiated | emitted from an observation window. It is a figure which shows the spectral reflectance coefficient in a predetermined sample. It is a figure which shows the colorimetric value of the L ^* a ^* b ^* color system in a predetermined sample.

  Hereinafter, an embodiment according to the present invention will be described with reference to the drawings. In addition, the structure which attached | subjected the same code | symbol in each figure shows that it is the same structure, The description is abbreviate | omitted suitably.

  FIG. 1 is a cross-sectional view illustrating a schematic configuration of a spectral characteristic measuring apparatus according to an embodiment. FIG. 2 is a cross-sectional view showing the configuration of the integrating sphere and its peripheral members in the spectral characteristic measuring apparatus of the embodiment. FIG. 3 is a cross-sectional view illustrating a configuration of a spectrometer in the spectral characteristic measuring apparatus according to the embodiment. FIG. 4 is a block diagram illustrating an electrical configuration of the spectral characteristic measuring apparatus according to the embodiment. FIG. 5 is a diagram for explaining SCI diffused illumination including regular reflected light and SCE diffused illumination not including regular reflected light. FIG. 5A shows SCI diffuse illumination, and FIG. 5B shows SCE diffuse illumination.

  The spectral characteristic measurement apparatus according to the present embodiment includes a reflectance measurement unit that obtains a spectral reflectance coefficient of a sample (sample, measurement target), and a spectral characteristic measurement unit that obtains a spectral characteristic of the sample based on the spectral reflectance coefficient. It is prepared for. The reflectance measuring unit measures the first spectral reflectance coefficient (SCI spectral reflectance coefficient) of the sample under the first diffuse illumination condition including the specularly reflected light, and the second diffused light not including the specularly reflected light. A measurement unit that measures a second spectral reflectance coefficient (SCE spectral reflectance coefficient) of the sample under illumination conditions, and a weighted average of the first spectral reflectance coefficient and the second spectral reflectance coefficient measured by the measurement unit By doing so, it is configured to include a calculation unit that obtains the spectral reflectance coefficient.

  In the example shown in FIGS. 1 to 4, the color of the sample is measured as the spectral characteristic based on the spectral reflectance coefficient. The spectral characteristic measuring apparatus S shown in FIGS. 1 to 4 is a colorimeter in this embodiment. Is configured.

  1 to 4, such a spectral characteristic measuring apparatus S includes, for example, an integrating sphere 2, a first spectroscopic unit 3, an arithmetic control unit 4, a second spectroscopic unit 5, an input unit 6, and an output. Part 7.

  The integrating sphere 2 obtains the first reflected light (SCI reflected light) from the sample 1 by illuminating the sample 1 with the diffused illumination light under the first diffuse illumination condition including the regular reflected light, and includes the regular reflected light. It is a member for obtaining the second reflected light (SCE reflected light) from the sample 1 by illuminating the sample 1 with the diffused illumination light under the second diffuse illumination condition that is not present. More specifically, the integrating sphere 2 includes, for example, an integrating sphere main body 21, a light source unit 22, and a trap mechanism 23, as shown in FIG.

The integrating sphere body 21 is a hollow sphere member having an inner surface with high diffusion and high reflectance. The inner wall of the integrating sphere body 21 is coated with a white diffuse reflection paint such as magnesium oxide (MgO) or barium sulfate (BaSO ₂ ) in order to realize the high diffusion and high reflectance. The integrating sphere main body (spherical member) 21 has a sample opening 211, a light source opening 212, a measurement opening 213, and a trap opening 214 each having a predetermined size (area). Opened (perforated).

  The light source portion 212 faces the light source opening portion 212, and the light source opening portion 212 integrates in order to guide light (light flux) emitted from the light source portion 22 into the integrating sphere body (spherical member) 21. It is an opening (hole) formed at a predetermined location of the sphere body 21. When the sample 1 is measured, the sample 1 faces the sample opening 211, and the sample opening 211 receives the light from the light source unit 22 guided into the integrating sphere main body 21. In order to irradiate the sample 1 with diffuse illumination light obtained by diffuse reflection within the aperture 21, the aperture (hole) is formed at a predetermined location of the integrating sphere body 21. The first spectroscopic unit 3 faces the measurement aperture 213, and an aperture (hole) formed at a predetermined position of the integrating sphere main body 21 to guide the reflected light from the sample 1 to the first spectroscopic unit 3. ). In the case of an 8 ° light receiving d / 8 optical system, the measurement opening 213 is formed in a partial region of the integrating sphere main body 21 corresponding to the + 8 ° direction with respect to the normal of the sample surface in the sample 1. More specifically, this sample surface is a surface virtually assumed as the sample surface of the sample 1 when the sample 1 is disposed in the sample opening 211, and usually the opening surface of the sample opening 211. Is approximately the same. A trap mechanism 23 faces the trap opening 214, and an opening (hole) formed at a predetermined position of the integrating sphere main body 21 to guide the specularly reflected light of the sample 1 to the outside of the integrating sphere main body 21. It is. In this embodiment, it is an 8 ° light receiving d / 8 optical system, and the measurement aperture 213 is formed in a partial region of the integrating sphere main body 21 corresponding to the + 8 ° direction with respect to the normal of the sample surface in the sample 1. Accordingly, it is formed in a partial region of the integrating sphere main body 21 corresponding to the −8 ° direction with respect to the normal line of the sample surface in the sample 1.

  The light source unit 22 is a device that is disposed so as to face the light source opening 212 of the integrating sphere main body 21 and supplies light (light flux) into the integrating sphere main body 21. The light source unit 22 includes, for example, a lamp 221 and a reflection member 222. The lamp 221 is a light emitting element that can emit light having a spectral distribution of a continuous spectrum, such as a xenon lamp. The reflection member 222 is a reflector that reflects light emitted from the lamp 221 in a direction opposite to the direction from the lamp 221 toward the light source opening 212 toward the light source opening 212. The amount of light incident on the integrating sphere body 21 out of the light emitted from the lamp 221 is increased by the reflecting member 222. Further, in order to reflect more efficiently, the reflecting member 222 is a reflecting mirror having a parabolic surface, and the lamp 221 is preferably disposed at a substantially focal position on the parabolic surface. Light emitted from the lamp 221 of the light source unit 22 is incident on the integrating sphere main body 21 through the light source opening 212 and is diffusely reflected in the integrating sphere main body 21 to generate white diffuse illumination light. The sample 1 is illuminated through the sample opening 211.

  The trap mechanism 23 emits specularly reflected light for the component guided to the first beam splitting unit 3 in the reflected light of the sample 1 to the outside of the integrating sphere body 21 and controls the integrating sphere according to the control of the arithmetic control unit 4. It is a member for diffusing and reflecting into the main body 21. Depending on the operation of the trap mechanism 23, one of the first diffuse illumination condition (SCI diffuse illumination condition) including specular reflection light and the second diffuse illumination condition (SCE diffuse illumination condition) not including the regular reflection light is used. A condition (state) is realized.

  For example, as shown in FIG. 2, the trap mechanism 23 includes an opening / closing member 231, an actuator 232, and an arm 233. The opening / closing member 231 is a member for closing or opening the trap opening 214 of the integrating sphere main body 21. The opening / closing member 231 is, for example, a plate-like member having a shape capable of closing the trap opening 214, and the inner side surface of the opening / closing member 231 is coated with, for example, the white diffuse reflection paint, and is optically connected to the inner wall surface of the integrating sphere body 21. The properties are almost the same. The actuator 232 is a device such as a motor that is driven according to the control of the arithmetic control unit to generate the driving force in order to open / close the opening / closing member 231. The arm 233 is, for example, a rod-shaped member for transmitting the driving force generated by the actuator 232 to the opening / closing member 231 in order to open / close the opening / closing member 231. One end of the arm 233 is fixed to the rotating shaft of the actuator 232, and the other end is fixed to the back surface of the opening / closing member 231, and the actuator 232 and the opening / closing member 231 are connected to each other by the arm 233. The

  The actuator 232 is driven by the control of the arithmetic control unit 4, and the opening / closing member 231 is moved via the arm 233, whereby the trap opening 214 is closed by the opening / closing member 231 and the trap opening 214 is closed. Then, as shown in FIG. 5A, the regular reflection light is diffusely reflected on the inner surface of the opening / closing member 231, and the first diffuse illumination condition (SCI diffuse illumination condition) including the regular reflection light is realized. On the other hand, the actuator 232 is driven by the control of the arithmetic control unit 4, and the opening / closing member 231 is moved via the arm 233, whereby the opening / closing member 231 is retracted from the trap opening 214 and the trap opening 214 is opened. Then, as shown in FIG. 5B, the specularly reflected light is radiated from the integrating sphere main body 21 to the outside through the trap opening 214, and the second diffused illumination does not include the specularly reflected light. The condition (SCE diffuse illumination condition) is realized. When the trap opening 214 is in the open state, light emitted from the integrating sphere body 21 to the outside through the trap opening 214 is not guided again into the integrating sphere body 21 by the opening / closing member 231. The opening / closing member 231 is retracted.

  The first beam splitting unit 3 is a spectrometer that receives the reflected light from the sample 1 through the measurement opening 213 of the integrating sphere main body 21 and spectrally measures the reflected light. In spectroscopic measurement, the light intensity of light to be measured is measured for each wavelength at a predetermined wavelength interval. In the present embodiment, since it is an 8 ° light receiving d / 8 optical system, the first beam splitting unit 3 is arranged so that its optical axis coincides with the normal of the sample surface of the sample 1 in the + 8 ° direction. Established.

  More specifically, the first beam splitting unit 3 includes, for example, a light receiving optical system 31 and a beam splitting unit 32 as shown in FIG.

  The light receiving optical system 31 includes, for example, one or a plurality of lenses and the like, and is reflected light from the sample 1 that is incident through the measurement opening 213 of the integrating sphere main body 21 (+8 with respect to the normal of the sample surface). This is an optical element that guides the light component (° direction light component) to the spectroscopic unit 32. The spectroscopic unit 32 is a measuring device that spectroscopically measures the reflected light from the sample 1 guided by the light receiving optical system 31, and includes, for example, a slit plate 321, a reflecting mirror 323, a diffraction grating 324, and an array sensor for measurement. 325. The slit plate 321 is a plate-like member in which a slit 3211 that regulates reflected light incident on the measurement array sensor 325 is formed. The reflecting mirror 323 is a concave mirror that reflects the reflected light incident through the slit 3211 of the slit plate 321 to the diffraction grating 324. The diffraction grating 324 is an optical element that diffracts the reflected light reflected by the reflecting mirror 323 and separates the reflected light for each wavelength at a predetermined wavelength interval and guides it to the measurement array sensor 325. The measurement array sensor 325 includes a plurality of photoelectric conversion elements arranged in a line in the wavelength direction separated by the diffraction grating 324, and each photoelectric conversion element receives light having a different wavelength from each other. It is an element which outputs each electric signal according to the light intensity of each light.

  The reflected light from the sample 1 guided by the light receiving optical system 31 is regulated by the slit 3211 of the slit plate 321 and incident on the reflecting mirror 323, reflected by the reflecting mirror 323, incident on the diffraction grating 324, and diffracted. And is incident on the measurement array sensor 325. A dispersion image of the slit 3211 is formed on the light receiving surface of the measurement array sensor 325. In the measurement array sensor 325, each photoelectric conversion element photoelectrically converts the dispersed light of the reflected light, and outputs an electrical signal corresponding to the spectral intensity of the reflected light from the sample 1. The reflecting mirror 323 and the diffraction grating 324 may be replaced with a reflective concave diffraction grating.

  The arithmetic control unit 4 is a circuit that controls the operation of the entire spectral characteristic measuring apparatus S. For example, as shown in FIG. 4, the arithmetic control unit 4 includes an analog / digital conversion unit (A / D unit) 41, an input / output unit (I / O unit) 42, a control unit 43, and a light emission drive. A unit 44 and an illumination condition switching drive unit 45 are provided.

  The A / D unit 41 is a circuit that converts an analog signal into a digital signal having a predetermined number of bits. The A / D unit 41 is connected to the measurement array sensor 325 of the first spectroscopic unit 3, the light source monitor array sensor 525 of the second spectroscopic unit 5, and the I / O unit 42, and is used for the measurement of the first spectroscopic unit 3. The analog signal output from the array sensor 325 is converted into a digital signal and output to the I / O unit 42, and the analog signal output from the light source monitor array sensor 525 of the second spectroscopic unit 5 is converted into a digital signal. To the I / O unit 42.

  The I / O unit 42 is an interface circuit, and is connected to the A / D unit 41, the light emission driving unit 44, the illumination condition switching driving unit 45, and the control unit 43. The I / O unit 42 converts the signal (measurement spectral output signal) output from the A / D unit 41 due to the output signal of the measurement array sensor 325 into a format that can be processed by the control unit 43, and controls the control unit. 43, and the signal output from the A / D unit 41 due to the output signal of the light source monitor array sensor 525 (monitor spectral output signal) is converted into a format that can be processed by the control unit 43, and the control unit Output to 43. The I / O unit 42 converts the control signal (light emission control signal) output from the control unit 43 into a format that can be processed by the light emission drive unit 44 in order to control the light emission operation of the lamp 221 in the light source unit 22. Output to the drive unit 44. The I / O unit 42 can process the control signal (open / close control signal) output from the control unit 43 by the illumination condition switching drive unit 45 in order to control the opening / closing operation of the opening / closing member 231 in the trap mechanism 23. And output to the illumination condition switching drive unit 45.

  The light emission drive unit 44 supplies driving power to the lamp 221 of the light source unit 22 according to the light emission control signal input from the control unit 43 via the I / O unit 42, and the lamp 221 of the light source unit 22 follows the light emission control signal. This is a drive circuit that emits light.

  The illumination condition switching drive unit 45 supplies driving power to the actuator 232 of the trap mechanism 23 in accordance with the open / close control signal input from the control unit 43 via the I / O unit 42 and opens / closes the trap mechanism 23 via the arm 233. This is a drive circuit that causes the member 231 to perform an opening / closing operation in accordance with an opening / closing control signal.

  The control unit 33 generates control signals such as a light emission control signal and an open / close control signal in accordance with a control program, for example, in order to control the overall operation of the spectral characteristic measuring apparatus S, and in order to obtain reflection characteristics and spectral characteristics, for example, signal processing. This is a circuit that obtains reflection characteristics and spectral characteristics by calculating and processing signals such as the output signal of the measurement array sensor 325 and the output signal of the light source monitor array sensor 525 according to a program according to a predetermined processing procedure. For example, as shown in FIG. 4, the control unit 33 includes a CPU (Central Processing Unit) 431, a ROM (Read Only Memory) 432, a RAM (Random Access Memory) 433, and their peripheral circuits. It is prepared for. The ROM 432 is a non-volatile storage element and stores various data necessary for executing the various programs such as the control program and the signal processing program and the weighted average weight w described later. (Remember). The ROM 432 may include a rewritable nonvolatile storage element such as an EEPROM (Electrically Erasable Programmable Read Only Memory). The CPU 431 operates according to the control program, generates control signals such as a light emission control signal and an open / close control signal, and operates according to the signal processing program, and outputs an output signal of the measurement array sensor 325 and an output signal of the light source monitor array sensor 525. The reflection characteristics, spectral characteristics, and the like are obtained based on signals such as. The RAM 433 is a so-called working memory of the CPU 431 that stores data generated during the execution of the various programs.

  A light guide light receiving portion such as an optical fiber is faced at a predetermined position of the integrating sphere main body 21 (not shown), and a part of the diffuse illumination light is guided to the second spectroscopic portion 5 by the light guide. It is configured to be. The second beam splitting unit 5 is configured in the same manner as the first beam splitting unit 3, and a part of the diffuse illumination light guided by the light guide is received by the light source monitor array sensor 525 for spectroscopic measurement. To monitor the diffuse illumination light. By monitoring the diffuse illumination light substantially simultaneously by the second spectroscopic unit 5 during the spectroscopic measurement of the first spectroscopic unit 3, the light intensity fluctuation of the light source unit 22 during the measurement can be corrected.

  The input unit 6 is a device for inputting commands (commands), data, and the like from the outside, and is, for example, a touch panel or a keyboard. The output unit 7 is a device for outputting the command and data input from the input unit 6 and the calculation result of the control unit 43, and is, for example, an LCD (liquid crystal display) or an organic EL display.

  Next, the operation of the spectral characteristic measuring apparatus S in the embodiment will be described. For example, when the start-up command is received from the input unit 6 by a user operation, the spectral characteristic measurement apparatus S executes various programs such as a control program and a signal processing program. Regarding the calculation of the spectral reflectance coefficient, when the sample 1 is measured under the first diffuse illumination condition including specularly reflected light by the execution of the signal processing program, the CPU 431 outputs the output signal from the first spectroscopic unit 3 and the second spectral signal. When the sample 1 is measured under a first spectral reflectance coefficient calculation unit (not shown) that calculates the first spectral reflectance coefficient based on the output signal of the unit 5 and the second diffuse illumination condition that does not include regular reflection light, A second spectral reflectance coefficient computing unit (not shown) that computes a second spectral reflectance coefficient based on the output signal of the first spectral part 3 and the output signal of the second spectral part 5, and the first spectral reflectance coefficient A spectral reflectance coefficient calculation unit (not shown) that obtains the spectral reflectance coefficient by weighted averaging the second spectral reflectance coefficient is functionally configured. The spectral characteristic measuring device S obtains a spectral reflectance coefficient by the following operation, and obtains a predetermined spectral characteristic based on the spectral reflectance coefficient.

  FIG. 6 is a flowchart illustrating the operation of the spectral characteristic measuring apparatus according to the embodiment. In FIG. 6, in step S11, the weighted average weight w is set. By configuring the spectral characteristic measuring apparatus S in this way, the user can set the weighted average weight w according to the observation conditions suitable for the measurement, and can perform a measurement closer to the appearance. It becomes. More specifically, the control unit 43 of the spectral characteristic measuring apparatus S outputs a message for prompting the setting of the weighted average weight w to the output unit 7 and is input from the input unit 6 by a user such as an operator. An instruction for setting the weighted average weight w is received, and the weighted average weight w is set according to the received instruction.

  This user instruction may be any of the following instructions, for example.

  First, for example, the ROM 432 of the control unit 43 stores in advance a weight table in which an observation condition name and the weighted average weight w are associated with each other for each of one or more observation conditions. The unit 43 outputs the observation condition to the output unit 7 by referring to the weight table of the ROM 432. In this output, the weighted average weight w may be output for each observation condition. And the said instruction | indication is selection of any one of the observation conditions output to this output part 7 designated by the user. By receiving a selection instruction by the user from the input unit 6, the control unit 43 retrieves the weighted average weight w corresponding to the observation condition of the received selection instruction from the weight table of the ROM 432, and reads the weighted average weight w. The weight w of the weighted average is set with the obtained value.

  The weight table may be stored in advance in the ROM 432 of the control unit 43, for example, at the manufacturing stage, the sales stage, or the like by the manufacturer of the spectral characteristic measuring apparatus S. By configuring the spectral characteristic measuring apparatus S in this way, the user can set an appropriate weighted average weight w simply by selecting an observation condition (observation condition name) suitable for the measurement, Measurements closer to the appearance can be easily performed. In addition, for example, the weight table is created by the user before the measurement (measurement at the start of use or measurement after the start of use) is started by the spectral characteristic measuring apparatus S, and the weighted average created by the user is calculated. The weight w may be input from the input unit 6 to the spectral characteristic measuring device S and stored in advance in the ROM 432 of the control unit 43. By configuring the spectral characteristic measuring apparatus S in this way, the user can set an appropriate weighted average weight w only by selecting an observation condition (observation condition name) suitable for the measurement. Furthermore, the spectral characteristic measuring apparatus S can be customized to suit the user's usage, and it is possible to perform a measurement that is closer to the appearance.

  For example, secondly, the ROM 432 of the control unit 43 stores in advance a weight table in which the weighted average weight w is associated with each of one or more observation conditions, and the control unit 43 stores the weight in the ROM 432. The weighted average weight w is output to the output unit 7 for each observation condition by referring to the weight table. The instruction is a selection of one of the observation conditions output to the output unit 7 specified by the user, and the weighted average weight corresponding to the selected observation condition This is the correction amount of w. By receiving the selection instruction and the correction amount by the user from the input unit 6, the control unit 43 retrieves the weighted average weight w corresponding to the received observation condition of the selection instruction from the weight table of the ROM 432, reads this, The weighted average weight w is set by correcting the read value with the correction amount. By configuring the spectral characteristic measuring apparatus S in this way, the user can set the weighted average weight w according to the observation conditions suitable for the measurement while finely adjusting it, and is even closer to the appearance. Measurement can be performed.

  Also, for example, thirdly, the instruction may be the value of the weighted average weight w specified by the user. By receiving the weighted average weight w by the user from the input unit 6, the control unit 43 sets the weighted average weight w with the received value. By configuring the spectral characteristic measuring apparatus S in this way, the user can set or fine-tune the weighted average weight w according to the observation conditions suitable for the measurement, and the measurement is closer to the user's appearance. Can be performed.

  The weight w of the weighted average is measured and determined by the following method, for example. FIG. 7 is a diagram for explaining a weighted average weight measurement method. FIG. 8 is a diagram showing a weight measurement chart used for measurement of the weighted average weight. FIG. 9 is a perspective view showing a configuration of a light source box used for measuring a weighted average weight. FIG. 10 is a diagram for explaining the relationship between the light source position in the light source box and the intensity of the specular reflection component emitted from the observation window.

  For example, as shown in FIG. 7, the weighted average weight w is measured in a predetermined space SP formed by a measurement room or the like in a manufacturer or in a measurement room (booth) where a user actually performs color evaluation. Done. A light source LT having a predetermined spectral distribution is disposed in the predetermined space SP, and the weight measurement chart CT is arranged at a position where the diffuse reflection light from the light source LT can irradiate the weight measurement chart CT. When the observer OV observes the measurement object (sample 1) to be measured by the spectral characteristic measuring apparatus S, the optical axis coincides with the observation direction DR that the observer OV estimates to observe the measurement object. As shown, a luminance meter LM (not shown) is provided.

  The light source LT may be an arbitrary light source, for example, a standard light source such as an A light source, a C light source, and a D light source (D55, D65, D75) standardized by the CIE. A lighting device such as a light bulb may be used. By appropriately setting the predetermined space SP and the light source LT, the weighted average weight w of the observation condition under outdoor sunlight can be measured, and the weighted average weight of the observation condition in a room, for example, a showroom w can be measured.

The weight measurement chart CT is a pair of achromatic colors. For example, as shown in FIG. 8, the first lightness having a predetermined lightness (equivalent to achromatic black L ^* = 30) imitating a glossy sample. A sample (glossy sample) BK and a second lightness sample (matte sample, gray scale) GR having a plurality of different brightness values imitating a matte sample, these first lightness sample BK and second lightness sample The GR is juxtaposed with a predetermined interval. Each lightness of the second lightness sample GR is associated with the weighted average weight w, and the weights w are sequentially assigned from 0 to 1 from white to black. In the example shown in FIG. 8, the second lightness sample GR has 11 lightness values different from each other in 11 stages, and the weight w is assigned in order of 0.1 from 0 to 1 in order from white to black. Yes. More specifically, based on the first brightness sample BK, the weight w is calculated from the spectral reflectance coefficients Ri and Re respectively measured with the first diffused illumination light and the second diffused illumination light by the spectrocolorimeter. Each spectral reflectance coefficient Rm changed stepwise between 0 and 1 is obtained, and a colorimetric value (for example, L ^* a ^* b ^* ) corresponding to each value of the weight w is obtained. Each lightness in the second lightness sample GR is set so that the value is the color closest to the reference. Thus, the weight measurement chart CT is preferably black, which is most susceptible to regular reflection light.

  The luminance meter LM measures the first brightness sample BK of the weight measurement chart CT in the predetermined observation direction, and then measures each brightness of the second brightness sample GR. Then, the lightness of the second lightness sample GR that most closely matches (is close to) the measurement value of the first lightness sample BK is selected from the measurement values at each lightness of the second lightness sample GR, and this selected second lightness is selected. The value assigned to the brightness of the sample GR is acquired. The weighted average weight w is set with the acquired value.

  In the measurement of the weight w of the weighted average, it is assumed that (color excluding specular reflection light of gloss sample BK) + (regular reflection light amount in visual observation) = (color of mat sample GR). Yes. The difference in appearance is caused by the fact that the intensity of the specularly reflected light depends on the reflection direction (observation direction) when it is glossy. By selecting the brightness of the matte sample GR that most closely matches (close to) the measurement value of the gloss sample BK from the measurement values of each brightness of the GR, the intensity of specular reflection light in this observation direction can be specified. The weighted average weight w can be set appropriately.

  Thus, by measuring the weight measurement chart CT arranged at a predetermined position in the predetermined space SP with the luminance meter LM, the weighted average weight w can be objectively measured.

  Here, in place of the luminance meter LM, the observer OV actually observes the weight measurement chart CT, and this observer most closely matches (closes) the second lightness sample with the appearance of the first lightness sample BK. The lightness of the GR may be selected, and the weighted average weight w may be set with a value assigned to the lightness of the selected second lightness sample GR. Thus, by setting the weighted average weight w by the observer OV, the weighted average weight w in accordance with the actual appearance can be measured, and combined with the measurement of the luminance meter LM. The weighted average weight w measured by the luminance meter LM can be finely adjusted based on the observation result of the observer OV.

  The weighted average weight w thus measured is measured under a plurality of different observation conditions, for example, and stored in a storage unit such as an EEPROM in the above-described weight table format. For example, the observation condition name is A light source, each weight w of the weighted average measured under this observation condition is registered in the weight table, and for example, the observation condition name is A vehicle type shoe room. Each weight w of the weighted average measured under the condition is registered in the weight table.

  In the measurement of the weighted average weight w, as described above, the color appearance varies depending on various factors such as the light source (spectral distribution of illumination light), illumination position, sample surface condition, observation direction, and individual differences among observers. Since it depends on the observation conditions, it is preferable that the observation conditions are stable. That is, it is preferable that this observation condition does not change with time. In particular, in this observation condition, the relative position relationship between the illumination position (light source position), the position of the sample, and the observation direction is important, and it is preferable that these relative position relationships are fixed in time. In order to realize such a stable observation condition, the weighted average weight w may be measured using a light source box.

  This light source box (color booth) BX has a first spectral reflectance coefficient measured under the first diffuse illumination condition including specularly reflected light and a second diffused illumination condition that does not include the specularly reflected light. An apparatus for determining a weight w of the weighted average used when performing a weighted average of spectral reflectance coefficients, for example, as shown in FIG. A predetermined light source 52 that can be fixed at a predetermined position in the body 51, an arrangement member 53 that is provided in the casing 51 for arranging the sample, and a reflected light from the sample provided in the casing 51. And an observation window 54 for observing.

  The inner surface of the housing 51 may be a surface having arbitrary optical characteristics. Similarly to the light source LT, the light source 52 may be an arbitrary light source, for example, the standard light source by CIE, or the lighting fixture. The arrangement member 53 is a plate-like member on which a sample is arranged, and has a predetermined angle with respect to the floor surface of the casing 51 so that the sample arrangement surface (upper surface) and the floor surface of the casing 51 are at a predetermined angle. Arranged at an angle. The sample placement surface of the placement member 53 may be provided with a placement marker 53a that points to the sample placement location in order to define the sample placement location. Further, in the present embodiment, the light source 52 is configured to be movable in a predetermined direction within the housing 51 in order to change the intensity of the regular reflection component emitted from the observation window 54. More specifically, in the present embodiment, for example, the light source 52 includes a line segment connecting a predetermined point (for example, the center point) in the light source 52 and a predetermined point (for example, the center point) on the sample arrangement surface of the arrangement member 53. The angle between the predetermined point (for example, the center point) of the arrangement member 53 and the line segment connecting the predetermined point (for example, the center point) in the observation window can be changed by control means (not shown). The moving means (not shown) is configured to be movable in the contact / disconnection direction Dr that contacts / disconnects the observation window 54. The control means includes, for example, a microcomputer, and the moving means includes, for example, a rail that guides the light source 52 in the separating direction and an actuator, a gear, and the like that move the light source 52 by the rail. And a moving mechanism provided. By configuring the light source 52 to be movable in this way, for example, as shown in FIG. 10B, a mode in which the light source 52 is substantially directly above the arrangement member 53 is used as a basic mode. When the intensity of the radiated specular component is used as the reference intensity, the light source 52 is moved closer to the observation window 54 along the ceiling surface of the casing 51 by the moving means as shown in FIG. When moved (proximity mode), the intensity of the specular reflection component radiated from the observation window 54 becomes stronger than the reference intensity. On the other hand, as shown in FIG. Therefore, the intensity of the specular reflection component radiated from the observation window 54 is smaller than the reference intensity when moved in the direction away from the observation window 54 along the ceiling surface of the casing 51 (separation mode). In this way, by changing the arrangement position of the light source 52 and fixing it at that position, it is possible to change the intensity of the regular reflection component emitted from the observation window 54. By appropriately setting the optical characteristics of the inner surface of the casing 51 and the arrangement position of the light source 52, for example, observation conditions in a booth (measurement room) where a user actually performs color evaluation, observation conditions under outdoor sunlight, The observation conditions in a room such as a showroom can be set. In the present embodiment, the light source 52 is configured to be movable by a moving means (not shown). However, the light source 52 is arranged at a predetermined interval in the separation / contact direction and is engaged with the light source 52. The light source 52 is engaged with any one of the plurality of light source engaging members, and the light source 52 can be fixed in the casing 51 and moved in a predetermined direction. May be configured.

  Then, the light source 52 is moved and fixed by the moving means so as to satisfy a predetermined observation condition, the weight measurement chart CT is arranged on the arrangement member 53, and the luminance meter is measured from a predetermined observation direction through the observation window 54. Alternatively, the weight measurement chart CT is measured or visually observed by the observer OV, and the weight w of the weighted average is measured.

  In such a light source box BX, the light source 52 is provided so as to be fixed at a predetermined position in the casing 51, the placement location of the weight measurement chart CT is also fixed by the placement member 53, and the weight measurement chart is further provided by the observation window 54. Since the CT observation direction can also be fixed, various conditions of the light source (spectral distribution of illumination light), illumination position and observation direction can be specified, and the weight measurement chart CT can be measured or observed more stably. Thus, the weight w of the weighted average can be determined more stably.

  In such a light source box BX, the relationship between the weighted average weight w and the arrangement position of the light source 52 is measured in advance, and the relationship between the weighted average weight w and the arrangement position of the light source 52 is not illustrated. The control means is stored in, for example, a table format, and the designation of the weighted average weight w is received from a user such as an operator from an input means (not shown) so that the weighted average weight w is accepted. The light source 52 may be moved by the control means and the moving means with reference to the table. In the table, for example, the light source 52 in which the measurement value of the first brightness sample BK of the weight measurement chart CT measured by the luminance meter LM through the observation window 54 becomes each measurement value at each brightness of the second brightness sample GR. It is created by searching for each arrangement position. As a result, the light source box BX can be easily reproduced simply by inputting an observation condition that gives the predetermined weight w of the weighted average from the input means.

  Returning to FIG. 6, in step S <b> 12, a white calibration plate is set (arranged) in the sample opening 211 of the spectral characteristic measuring apparatus S in order to perform white calibration of the spectral characteristic measuring apparatus S. The white calibration plate is priced so that the spectral radiance factor has a predetermined standard characteristic. More specifically, for example, the control unit 43 of the spectral characteristic measuring apparatus S outputs a message to the output unit 7 prompting the white calibration plate to be set in the sample opening 211.

  Subsequently, in step S13, white calibration of the spectral characteristic measuring apparatus S is performed. This white calibration is performed in both cases when the white calibration plate is measured under the first diffuse illumination condition including specularly reflected light and when the white calibration plate is measured under the second diffuse illumination condition not including the specularly reflected light. Each is done. More specifically, for example, the control unit 43 of the spectral characteristic measuring apparatus S waits for a predetermined time after outputting the message to the output unit 7 in step S12, or by using a sensor (not shown). When a sample set is detected in the opening 211 for white, white calibration is started. In white calibration (SCI white calibration) when measuring the white calibration plate under the first diffuse illumination condition including specularly reflected light, the control unit 43 controls the trap mechanism 23 to open the trap opening with the opening / closing member 231. 214 is closed, and the light source unit 22 is controlled to cause the lamp 221 to emit light, and output signals are acquired from the first beam splitting unit 3 and the second beam splitting unit 5, respectively, and the first beam splitting unit 3 and the second beam splitting unit 5. Based on the output signals, white calibration is performed by, for example, a known conventional means. Here, light including specularly reflected light from the surface of the sample 1 is guided to the first beam splitting unit 3. Further, in white calibration (SCE white calibration) when the white calibration plate is measured under the second diffuse illumination condition that does not include regular reflection light, the control unit 43 controls the trap mechanism 23 to retract the opening / closing member 231. Then, the trap opening 214 is opened, and the light source unit 22 is controlled to cause the lamp 221 to emit light, and output signals are obtained from the first beam splitting unit 3 and the second beam splitting unit 5, respectively. Based on each output signal of the second beam splitting unit 5, white calibration is performed by, for example, a known conventional means. Here, light that does not include specularly reflected light from the surface of the sample 1 is guided to the first beam splitting unit 3.

  Subsequently, in step S14, the sample 1 is set (arranged) in the sample opening 211 of the spectral characteristic measuring apparatus S so that the spectral characteristic measuring apparatus S can measure the sample 1. More specifically, for example, the control unit 43 of the spectral characteristic measuring apparatus S issues a message prompting the user to set the sample 1 in the sample opening 211 instead of the white calibration plate after the white calibration is completed. Output to the output unit 7.

  Subsequently, in step S15, the sample 1 is measured. The measurement of the sample 1 is performed in both cases where the sample 1 is measured under the first diffuse illumination condition including specularly reflected light and when the sample 1 is measured under the second diffuse illumination condition not including the specularly reflected light. Each done. More specifically, for example, the control unit 43 of the spectral characteristic measuring apparatus S waits for a predetermined time after outputting the message to the output unit 7 in step S14 or by using a sensor (not shown). When the sample set is not detected in the opening 211 for detection and then detected, the measurement of the sample 1 is started. When measuring the sample 1 under the first diffuse illumination condition including specularly reflected light (SCI measurement), the control unit 43 controls the trap mechanism 23 to close the trap opening 214 with the opening / closing member 231, The lamp 221 is caused to emit light by controlling the unit 22, and output signals are obtained from the first beam splitting unit 3 and the second beam splitting unit 5, respectively. The first spectroscopic unit 3 guides light including specularly reflected light from the surface of the sample 1. In the case where the sample 1 is measured under the second diffuse illumination condition that does not include specularly reflected light (SCE measurement), the control unit 43 controls the trap mechanism 23 to retract the opening / closing member 231 to open the trap opening. The unit 214 is opened, and the light source unit 22 is controlled to cause the lamp 221 to emit light, and output signals are acquired from the first beam splitting unit 3 and the second beam splitting unit 5, respectively. The first spectroscopic unit 3 guides light that does not include specularly reflected light from the surface of the sample 1.

Subsequently, in step S16, the first spectral reflectance coefficient calculation unit in the control unit 43 of the spectral characteristic measurement apparatus S includes the first spectral unit 3 and the second spectral unit 5 acquired by SCI measurement in step S15. Based on each output signal, the first spectral reflectance coefficient Ri is obtained by, for example, Expression 1. And the said 2nd spectral reflectance coefficient calculating part in the control part 43 of the spectral characteristic measuring apparatus S is based on each output signal of the 1st spectroscopic part 3 and the 2nd spectroscopic part 5 which were acquired by the SCE measurement in the said step S15. Thus, for example, the second spectral reflectance coefficient Re is obtained by Equation 2.
Ri (λ) = (Si (λ) / Sical (λ) · (Iical (λ) / Ii (λ))) · Wi (λ) (1)
Here, under the SCI diffuse illumination conditions, Si (λ) is the spectral light intensity received by the measurement array sensor 325 of the first spectroscopic unit 3 at the wavelength λ, and Sical (λ) is at the wavelength λ. The spectral light intensity received by the measurement array sensor 325 of the first spectral unit 3 during white calibration, and Iical (λ) is the light source monitor of the second spectral unit 5 during white calibration at the wavelength λ. Is the spectral light intensity received by the array sensor 525, and Ii (λ) is the spectral light intensity received by the light source monitor array sensor 525 of the second spectroscopic unit 5 at the wavelength λ, and Wi (λ ) Is the reflectance of the white calibration plate.
Re (λ) = (Se (λ) / Secal (λ) · (Iecal (λ) / Ie (λ))) · We (λ) (1)
Here, in the SCE diffuse illumination condition, Se (λ) is the spectral light intensity received by the measurement array sensor 325 of the first spectroscopic unit 3 at the wavelength λ, and Secal (λ) is at the wavelength λ. The spectral light intensity received by the measurement array sensor 325 of the first spectral unit 3 during white calibration, and Iecal (λ) is the light source monitor of the second spectral unit 5 during white calibration at the wavelength λ. Is the spectral light intensity received by the array sensor 525, and Ie (λ) is the spectral light intensity received by the light source monitoring array sensor 525 of the second spectral section 5 at the wavelength λ, and We (λ ) Is the reflectance of the white calibration plate.

  Subsequently, in step S17, the spectral reflectance coefficient calculation unit in the control unit 43 of the spectral characteristic measuring apparatus S calculates the first spectral reflectance coefficient Ri and the second spectral reflectance coefficient Re calculated in step S16. The spectral reflectance coefficient Rm is obtained by weighted averaging using the weight w set in step S11. That is, the spectral reflectance coefficient calculation unit in the control unit 43 of the spectral characteristic measuring apparatus S obtains the spectral reflectance coefficient Rm according to Equation 3.

Rm (λ) = w · Ri (λ) + (1−w) · Re (λ) (3)
Here, the weight w is 0 <w <1.

  And the control part 43 calculates | requires the predetermined spectral characteristic of the sample 1, for example, the color value in a predetermined color system in this embodiment, based on this calculated | required spectral reflectance coefficient Rm. The obtained spectral characteristic of the sample 1 is output to the output unit 7 by the control unit 43. The output unit 7 may also output the weighted average weight w, the observation conditions, and the like used when calculating the spectral characteristics of the sample 1.

  Since the spectral characteristic measuring apparatus according to the present embodiment operates in this way, it can measure the spectral reflectance coefficient closer to the appearance, and measure the spectral characteristics of the sample 1 based on the spectral reflectance coefficient. Can do. Therefore, the spectral characteristics of the sample 1 closer to the appearance are obtained, and the color matching of the sample 1 that matches the color of the sample 1 with the target color is improved.

Next, one measurement result will be described. FIG. 11 is a diagram showing the spectral reflectance coefficient in a predetermined sample. In FIG. 11, the relatively thick solid line indicates the SCI spectral reflectance coefficient, the relatively thin solid line indicates the SCE spectral reflectance coefficient, and the broken line indicates the spectral when the weighted average weight w is 0.5. The reflectance coefficient is shown. FIG. 12 is a diagram showing colorimetric values of the L ^* a ^* b ^* color system in a predetermined sample.

When a predetermined sample 1 is measured under SCI diffuse illumination conditions (first diffuse illumination conditions), the SCI spectral reflectance coefficient (first spectral reflectance coefficient) becomes, for example, a profile represented by a thick solid line in FIG. For example, as shown in FIG. 12, the color values are L ^* = 34.07, a ^* = 8.61, and b ^* = − 34.80 when the data name is data 1. On the other hand, when this predetermined sample 1 (same sample 1) is measured under the SCE diffuse illumination condition (second diffuse illumination condition), the SCE spectral reflectance coefficient (second spectral reflectance coefficient) is, for example, as shown in FIG. becomes profile represented by a thin solid line, the colorimetric values, for example, as shown in FIG. 12, the ^L * ⁼ 22.50 data name data ^{2, a * = 10.28, b} * = -46.95 and Become. Incidentally, the deviation between the measured value in the measured value and SCE diffuse illumination conditions in SCI diffuse lighting ^{conditions, △ L * = 11.57, △} a * = -1.67, △ b * = -12.15, ΔE ^* ab = 16.85. That is, the SCE spectral reflectance coefficient is smaller than the SCI spectral reflectance coefficient over all wavelengths, and shows a vivid appearance. In other words, the SCI spectral reflectance coefficient has a larger value over all wavelengths than the SCE spectral reflectance coefficient, and shows a whitish appearance.

  On the other hand, as described above, when the user (person) evaluates the color of the sample 1 visually, the illumination light reflected on the sample surface is generally reflected in order to unintentionally remove the influence of the illumination light and observe the original color of the sample. Observe the slightly reflected light. Therefore, in the visual observation, the sample 1 is observed under the diffuse illumination condition in which the specularly reflected light between the SCI diffuse illumination condition and the SCE diffuse illumination condition is removed halfway. As a result, the user feels disagreement, “even if there is a color visually, the colorimeter does not match the colorimeter,” conversely, “the colorimetric value of the colorimeter does not match the color visually. An event occurs.

In the spectral characteristic measuring apparatus S of the present embodiment, the spectral reflectance coefficient Rm is obtained by weighted averaging of the first spectral reflectance coefficient Ri and the second spectral reflectance coefficient Re. If you set the weight w to 0.5, becomes a profile shown by the broken line in FIG. 11, the colorimetric values, for example, as shown in FIG. 12, the data name of the data 3 ^L * = 29.03, a ^* = 9.10, b ^* = − 39.72. As described above, in the spectral characteristic measuring apparatus S according to the present embodiment, a spectral reflectance coefficient between the SCI spectral reflectance coefficient of the SCI diffuse illumination condition and the SCE spectral reflectance coefficient of the CSE diffuse illumination condition is obtained. Close spectral reflectance coefficients can be measured. Incidentally, the deviation between the measured value by the measured value and a weighted average of at SCI diffuse lighting ^{conditions, △ L * = 5.04, △} a * = -0.49, △ b * = -4.92, △ E * ab = 7.06.

  In order to express the present invention, the present invention has been properly and fully described through the embodiments with reference to the drawings. However, those skilled in the art can easily change and / or improve the above-described embodiments. It should be recognized that this is possible. Therefore, unless the modifications or improvements implemented by those skilled in the art are at a level that departs from the scope of the claims recited in the claims, the modifications or improvements are not covered by the claims. To be construed as inclusive.

S Spectral Characteristic Measuring Device CT Weight Measurement Chart BX Light Source Box 2 Integrating Sphere 3 First Spectrometer 4 Operation Control Unit 5 Second Spectrometer 6 Input Unit 7 Output Unit 23 Trap Mechanism 43 Control Unit 45 Illumination Condition Switching Drive Unit

Claims (6)

Measurement of measuring the first spectral reflectance coefficient of the sample under the first diffuse illumination condition including specularly reflected light and measuring the second spectral reflectance coefficient of the sample under the second diffuse illumination condition not including the specularly reflected light And
A reflection characteristic measuring apparatus comprising: an arithmetic unit that obtains a spectral reflectance coefficient by weighted averaging of the first spectral reflectance coefficient and the second spectral reflectance coefficient measured by the measuring section. The reflection characteristic measuring apparatus according to claim 1, further comprising an input unit for inputting a weight of the weighted average. The reflection characteristic measuring apparatus according to claim 1, further comprising a storage unit that stores a weight table indicating a correspondence relationship between the observation condition name of the sample and the weighted average weight. When the first spectral reflectance coefficient measured under the first diffuse illumination condition including specularly reflected light and the second spectral reflectance coefficient measured under the second diffuse illumination condition not including the specularly reflected light are weighted averaged A light source box for determining the weight of the weighted average used,
A predetermined housing;
A predetermined light source provided so as to be fixed at a predetermined position in the housing;
An arrangement member provided in the housing for arranging the sample;
A light source box, comprising: an observation window provided in the housing for observing reflected light from the sample. In a spectral characteristic measuring apparatus comprising a reflectance measuring unit for obtaining a spectral reflectance coefficient of a sample, and a spectral characteristic measuring unit for obtaining a spectral characteristic of the sample based on the spectral reflectance coefficient,
The spectral characteristic measuring device according to claim 1, wherein the reflectance measuring unit is the reflective characteristic measuring device according to claim 1. An SCI measurement step of measuring a first spectral reflectance coefficient of the sample under a first diffuse illumination condition including specularly reflected light;
An SCE measurement step of measuring a second spectral reflectance coefficient of the sample under a second diffuse illumination condition not including the regular reflection light;
A calculation step of obtaining a spectral reflectance coefficient by weighted averaging of the first spectral reflectance coefficient measured in the SCI measurement step and the second spectral reflectance coefficient measured in the SCE measurement step. Reflective characteristic measurement method.

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