JP2010165007A - Information processor - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To shorten a system set-up time in an embedded device by skipping self-diagnosis in turning-on a power source or resetting the device and also to enhance reliability by reliably performing the self-diagnosis when needed. <P>SOLUTION: An embedded device 100 counts times where the self-diagnosis is continuously skipped, and measures time when the self-diagnosis is continuously skipped. When the times for skipping the self-diagnosis or the time for skipping the self-diagnosis reaches a threshold, the self-diagnosis is performed. When both of the self-diagnosis skipping times and skipping time do not reach the thresholds, the self-diagnosis is skipped, so as to set up the system. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to an information processing apparatus that performs a self-diagnosis (self-test), for example, an embedded apparatus such as a car navigation system (hereinafter referred to as a car navigation system).

  In the conventional computer system self-diagnosis (self-test) method, the test items of the target device are based on the history information of the self-diagnosis execution results that have been left in the non-volatile memory at the time of system start-up and the number of start-up conditions. Control is performed to determine whether or not to execute self-diagnosis every time (for example, Patent Document 1).

JP-A-8-129495, pages 2 to 5, FIGS. 5 and 10

The conventional self-diagnosis method requires a large-capacity nonvolatile memory in order to determine whether or not to execute the self-diagnosis, and thus has a problem that the cost increases.
Also, if the system has not been started for a long time, it is likely that the hardware status has actually changed, but the system is started without performing self-diagnosis. After that, there is a problem that the possibility that a failure will occur increases, resulting in a decrease in the reliability of the system operation.
Furthermore, in an embedded device such as a car navigation system, the hardware is complicated, the scale is increased, and the computer is used in a good environment even though the environment is severe. Since self-diagnosis is not performed when power is turned on or after reset, there is a problem that even if a failure occurs, it cannot be discovered until a system operation failure occurs, reducing the reliability of the system operation.

  One of the main objects of the present invention is to solve the above-described problems. In an information processing apparatus such as an embedded apparatus used in a harsh environment such as a car navigation system, when power is turned on or reset is performed. To improve the reliability of the information processing system by avoiding lengthening the system start-up time by executing self-diagnosis every time, and by executing self-diagnosis reliably when necessary Main purpose.

An information processing apparatus according to the present invention includes:
An information processing apparatus capable of performing self-diagnosis during start-up processing and omitting self-diagnosis during start-up processing in a predetermined case,
A count unit that counts the number of start-up processes in which self-diagnosis is omitted continuously as a self-diagnosis skipped continuous number;
A timekeeping unit that counts the time during which self-diagnosis is not performed continuously as self-diagnosis skipping continuation time;
During start-up processing, it is determined whether or not the number of consecutive self-diagnosis skips counted by the number-of-times counting unit is greater than or equal to a threshold value, and whether or not the duration of self-diagnosis skipped time counted by the timing unit is greater than or equal to a threshold value A self-diagnosis determining unit that determines whether or not to perform self-diagnosis during the start-up process.

  According to the present invention, the number of times the self-diagnosis is omitted continuously is counted, the time when the self-diagnosis is continuously omitted is measured, and the number of times the self-diagnosis is omitted and the self-diagnosis are Since it is determined whether or not self-diagnosis is performed by comparing the omitted time with a threshold, if the threshold is not reached, the self-diagnosis is omitted and if the threshold is reached, the self-diagnosis is performed. The start-up time of the apparatus can be shortened and the reliability of the apparatus can be improved.

FIG. 3 is a diagram illustrating a configuration example of an embedded device according to the first embodiment. FIG. 6 is a diagram illustrating a configuration example of an embedded device according to a second embodiment. FIG. 10 is a diagram illustrating a configuration example of an embedded device according to a third embodiment. FIG. 10 is a diagram illustrating a configuration example of an embedded device according to a fourth embodiment. FIG. 6 shows a configuration example of an embedded device according to a fifth embodiment. FIG. 10 shows a configuration example of an embedded device according to a sixth embodiment. FIG. 10 illustrates a configuration example of an embedded device according to a seventh embodiment. FIG. 10 shows a configuration example of an embedded device according to an eighth embodiment. FIG. 10 shows a configuration example of an embedded device according to Embodiment 9. FIG. 18 illustrates a configuration example of an embedded device according to a tenth embodiment. FIG. 18 shows a configuration example of an embedded device according to Embodiment 11. FIG. 18 shows a configuration example of an embedded device according to Embodiment 12. FIG. 18 shows a configuration example of an embedded device according to Embodiment 13; FIG. 18 shows a configuration example of an embedded device according to Embodiment 14; FIG. 18 shows a configuration example of an embedded device according to Embodiment 15. FIG. 3 is a flowchart showing an operation example of the embedded device according to the first embodiment. FIG. 10 is a flowchart showing an operation example of the embedded device according to the third embodiment. FIG. 10 is a flowchart showing an operation example of the embedded device according to the third embodiment. FIG. 10 is a flowchart showing an operation example of the embedded device according to the fourth embodiment. FIG. 10 is a flowchart showing an operation example of the embedded device according to the fourth embodiment. FIG. 10 is a flowchart showing an operation example of the embedded device according to the fifth embodiment. FIG. 10 is a flowchart showing an operation example of the embedded device according to the fifth embodiment. FIG. 18 is a flowchart showing an operation example of the embedded device according to the seventh embodiment. FIG. 18 is a flowchart showing an operation example of the embedded device according to the seventh embodiment. FIG. 19 is a flowchart showing an operation example of the embedded device according to the eighth embodiment. FIG. 19 is a flowchart showing an operation example of the embedded device according to the eighth embodiment. FIG. 25 is a flowchart showing an operation example of the embedded device according to the ninth embodiment. FIG. 25 is a flowchart showing an operation example of the embedded device according to the ninth embodiment. FIG. 22 is a flowchart showing an operation example of the embedded device according to the eleventh embodiment. FIG. 22 is a flowchart showing an operation example of the embedded device according to the eleventh embodiment. FIG. 19 is a flowchart showing an operation example of the embedded device according to the twelfth embodiment. FIG. 19 is a flowchart showing an operation example of the embedded device according to the twelfth embodiment. FIG. 23 is a flowchart showing an operation example of the embedded device according to the thirteenth embodiment. FIG. 23 is a flowchart showing an operation example of the embedded device according to the thirteenth embodiment. FIG. 25 is a flowchart showing an operation example of the embedded device according to the fifteenth embodiment. FIG. 25 is a flowchart showing an operation example of the embedded device according to the fifteenth embodiment. FIG. 25 is a flowchart showing an operation example of the embedded device according to the sixteenth embodiment.

Embodiment 1 FIG.
FIG. 1 is a block diagram showing a configuration of an embedded device 100 according to the present embodiment.
In FIG. 1, a CPU (Central Processing Unit) 1 is a microprocessor that executes self-diagnosis.
A ROM (Read Only Memory) 2 is a storage device that stores initialization executed by the CPU 1, a self-diagnostic program, a boot loader for a normal operation system program, or the normal operation system program itself.
A RAM (Random Access Memory) 3 is a boot destination of the system program, and is a memory for storing various programs stored in the ROM 2 and variables necessary for executing the system program.
An RTC (Real Time Clock) 4 is a battery-backed timepiece.
The input unit 5 includes a push button or the like.
The display unit 6 includes an LCD (Liquid Crystal Display) or the like.
The DVD / CD 7 is an external storage medium reading device such as a DVD or a CD (Compact Disc).
An HDD (Hard Disk Drive) 8 is a hard disk device.
The battery 9 is a power source for the embedded device 100.

The startup success flag 10 is a flag indicating whether or not the startup has been successfully completed when the embedded device 100 was started up last time.
The continuous startup success number counting unit 11 counts the number of successful continuous startups that have been successfully started up. As will be described later, the continuous startup success number counted by the continuous startup success number counting unit 11 corresponds to the number of startup processes in which self-diagnosis is omitted (self-diagnosis skipped continuous number). The success count counter 11 is an example of a count counter.
The self-diagnosis non-execution number setting unit 12 sets an upper limit value of the number of successful continuous startups.
The self-diagnosis non-execution period setting unit 13 sets a self-diagnosis non-execution period, which is a period during which the self-diagnosis is not executed after successful startup.
The self-diagnosis non-execution time limit setting unit 14 sets a self-diagnosis non-execution time limit that is a time limit (time) for which self-diagnosis is suspended after successful startup.
As will be described later, the RTC 4, the self-diagnosis non-execution period setting unit 13 and the self-diagnosis non-execution time limit setting unit 14 work together to measure the time during which self-diagnosis is not performed (self-diagnosis omission duration). , Each corresponds to an example of a timing unit.
The self-diagnosis determination unit 15 determines whether or not the continuous startup success count counted by the continuous startup success count counter 11 has reached the self-diagnosis non-execution count (threshold) during the startup process. It is determined whether the time when the self-diagnosis timed by the RTC 4, the self-diagnosis non-execution period setting unit 13 and the self-diagnosis non-execution period setting unit 14 has reached the self-diagnosis non-execution period (threshold) The self-diagnosis is determined to be performed at least one of when the number of continuous startup successes has reached the number of times of self-diagnosis non-execution and when the time when self-diagnosis is omitted has reached the self-diagnosis non-execution deadline.

In the present embodiment, the startup success flag 10, the continuous startup success count unit 11, the self-diagnosis non-execution count setting unit 12, the self-diagnosis non-execution period setting unit 13, and the self-diagnosis non-execution deadline setting unit 14 , Each is hardware.
On the other hand, the self-diagnosis determination unit 15 is a part of the self-diagnosis program stored in the ROM 2.
Further, the RTC 4, the startup success flag 10, the continuous startup success frequency counting unit 11, the self-diagnosis non-execution frequency setting unit 12, the self-diagnosis non-execution period setting unit 13 and the self-diagnosis non-execution time limit setting unit 14 are backed up by the battery 9. Has been.

Next, the operation will be described.
When the power of the embedded device 100 is turned on or reset is executed, the self-diagnosis program stored in the ROM 2 is read out and executed by the CPU 1.
FIG. 16 is a flowchart showing the operation at this time. The operation of the embedded device 100 will be described with reference to FIG.

In the self-diagnosis program, first, the self-diagnosis determination unit 15 reads the state of the startup success flag 10 (101).
Then, it is determined whether the startup success flag 10 is set (102).
If the startup success flag 10 is not set, the self-diagnosis determination unit 15 determines that the self-diagnosis has not been completed normally, determines execution of the self-diagnosis, and clears the startup success flag 10 (110 ), The continuous startup success count section 11 is cleared (111).
Then, the self-diagnosis program executes hardware self-diagnosis (112).
After executing the self-diagnosis, the self-diagnosis determination unit 15 checks whether an error has occurred in the self-diagnosis (113).
If no error occurs and the process ends normally, the self-diagnosis determination unit 15 sets the startup success flag (114), and the time set in the self-diagnosis non-execution period setting unit 13 at the time read from the RTC 4 Is set in the self-diagnosis non-execution time limit setting unit 14 (115).
Then, after the self-diagnosis determining unit 15 increases the content of the continuous startup success number counting unit 11 by 1 (116), the execution of the self-diagnosis program is terminated and the actual system is started up.
If an error occurs in the self-diagnosis, the self-diagnosis determination unit 15 does not set the start-up success flag 10, displays an error occurrence (117), and stops the system start-up.

On the other hand, if the startup success flag 10 is set in step 102, the self-diagnosis determination unit 15 determines that the execution of the self-diagnosis has been normally completed at least once. The contents are compared with the contents of the self-diagnosis non-execution frequency setting unit 12 (103).
When the content of the continuous startup success number counting unit 11 exceeds the content of the self-diagnosis non-execution frequency setting unit 22, the self-diagnosis determination unit 15 has omitted the execution of the self-diagnosis by the number of times already specified. After execution of the self-diagnosis is determined and the startup success flag 10 is cleared, the self-diagnosis program performs self-diagnosis (110).
If the content of the continuous startup success count unit 11 does not exceed the content of the self-diagnosis non-execution number setting unit 12, the self-diagnosis determination unit 15 reads the time read from the RTC 4 and the self-diagnosis non-execution time limit setting unit The time set in 14 is compared (104).
If the time read from the RTC 4 has passed the time set in the self-diagnosis non-execution deadline setting unit 14, the self-diagnosis has not been executed beyond the specified time, so the self-diagnosis determination unit 15 Determines execution of self-diagnosis, and after the processing after clearing the startup success flag 10, the self-diagnosis program performs self-diagnosis (110).
If the time read from the RTC 4 has not passed the time set in the self-diagnosis non-execution time limit setting unit 14, the self-diagnosis determination unit 15 determines omission of self-diagnosis, and the continuous startup success count counter 11 The content is incremented by 1 (116), and the self-diagnosis program is terminated and the actual system is started.

  The time of the RTC 4, the number of times of self-diagnosis omission of the self-diagnosis non-execution setting unit 12, and the setting of the self-diagnosis omission period of the self-diagnosis non-execution period setting unit 13 are set in advance by the user using the setting function of the self-diagnosis program I can keep it.

As described above, in this embodiment, once self-diagnosis is successful, the execution of self-diagnosis at the time of power-on or reset execution is omitted for a predetermined number of times. Can do.
If the power is not turned on or reset for a long time, the self-diagnosis is executed even if the specified number of self-diagnosis has not been reached. Therefore, it is possible to improve the reliability of the system because the failure can be pointed out reliably.

  As described above, in this embodiment, the previous startup of the embedded device succeeded in the self-diagnosis at the time of power-on or reset execution of the embedded device intended for use in a harsh operating environment such as a car navigation system. Startup success flag that stores whether or not it has been successful, continuous startup success count counter that counts the number of successful startups after successful startup, and self-diagnosis non-execution to set the threshold A number setting means, a self-diagnosis non-execution period setting means for setting a period in which self-diagnosis is not executed after successful start-up and a self-diagnosis non-execution deadline setting means for setting a self-diagnosis non-execution deadline are provided, Once all self-diagnostics have been successfully executed, the startup success flag is set, the continuous startup success count counter is cleared to zero, and the self-diagnosis has succeeded. By adding the time set in the self-diagnostic non-execution period setting means to the self-diagnosis non-execution time limit setting means, the next successful power-on count or the reset execution means Self-diagnosis is not executed until the value set in the self-diagnosis non-execution count setting means is exceeded or the time when the power is turned on or reset passes the time set in the self-diagnosis non-execution deadline setting means The execution control method of the self-diagnosis of the built-in device that starts the normal system start-up by only increasing the continuous start-up success count counting means by 1 has been described.

Embodiment 2. FIG.
In the first embodiment described above, the startup success flag 10, the continuous startup success frequency count unit 11, the self-diagnosis non-execution frequency setting unit 12, the self-diagnosis non-execution period setting unit 13, and the self-diagnosis non-execution time limit setting unit 14 are set. Although implemented as individual hardware, an embodiment in which these are stored in a small-capacity battery-backed RAM will be described next.
FIG. 2 is a block diagram showing the configuration of the embedded device in such a case.
A predetermined address of the battery-backed RAM 20 is set to a successful startup flag 10, a continuous startup success frequency count unit 11, a self-diagnosis non-execution frequency setting unit 12, a self-diagnosis non-execution period setting unit 13, and a self-diagnosis non-execution time limit setting unit Assign as 14.
FIG. 2 shows an example in which the self-diagnosis determination unit 15 is also stored in the RAM 20.
The self-diagnosis determination unit 15 may be stored in the ROM 2 as a part of the self-diagnosis program as in the first embodiment. In the following embodiments, the self-diagnosis determination unit 15 is similarly stored in the RAM 20, but in the following embodiments, the self-diagnosis determination unit 15 is a ROM 2 as a part of the self-diagnosis program. You may make it store in.
The operation is the same as in the first embodiment.
That is, when the self-diagnosis program stored in the ROM 2 is read by the CPU 1, each element stored in the RAM 20 is also read by the CPU 1 and becomes operable. Thereafter, the same procedure as in the first embodiment is performed. Determine whether self-diagnosis is necessary.

  According to the present embodiment, the amount of information to be stored for self-diagnosis execution control can be reduced, and self-diagnosis execution control can be realized using a small-capacity RAM. Wear can be realized at low cost. Furthermore, if the RAM built in the RTC is used, hardware dedicated for self-diagnosis execution control is not required, and an embedded device can be realized at a lower cost.

  As described above, in the present embodiment, the startup success flag, the continuous startup success frequency counting means, the self-diagnosis non-execution frequency setting means, the self-diagnosis non-execution period setting means, and the self-diagnosis non-execution deadline setting means are small-scale backed up by a battery. Self-diagnosis execution control method for embedded devices that share and use a part of a small-sized non-volatile memory such as RAM or FLASH, or a battery-backed non-volatile memory such as RAM or FLASH already mounted for other purposes Explained.

Embodiment 3 FIG.
In the above embodiment, control is performed by the number of times the execution of self-diagnosis is omitted after power-on or reset execution and the time elapsed after successful self-diagnosis. An embodiment in which the temperature of the environment to be entered is also included in the conditions for controlling the execution of the self-diagnosis is shown.

FIG. 3 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 3, 30 is a temperature measurement unit such as a temperature sensor, 31 is an upper limit temperature setting unit for setting an upper limit temperature at which the hardware failure rate increases when the temperature is exceeded, and 32 is a temperature abnormality occurrence flag. It is. The temperature measurement unit 30 is an example of an operating environment measurement unit.
In FIG. 3, the same reference numerals as those in FIG. 2 denote the same parts or parts that perform the same function.

Next, the operation will be described.
When the power of the embedded device 100 is turned on or reset is executed, the self-diagnosis program stored in the ROM 2 is read out and executed by the CPU 1. At this time, each element stored in the RAM 20 is also read out by the CPU 1 and becomes operable.
FIG. 17 is a flowchart showing the operation at this time, and the operation will be described with reference to FIG.

First, the self-diagnosis determination unit 15 reads the state of the startup success flag 10 (301).
Then, it is determined whether the startup success flag is set (302).
If the startup success flag is not set, the self-diagnosis determination unit 15 determines that the self-diagnosis has not ended normally, clears the startup success flag 10 (310), and continuously counts the number of successful startups. 11 is cleared (311).
Further, the self-diagnosis determination unit 15 clears the temperature abnormality occurrence flag 32 (320).
Then, the self-diagnosis program executes hardware self-diagnosis (312).
After executing the self-diagnosis, the self-diagnosis determination unit 15 checks whether an error has occurred in the self-diagnosis (313).
If no error occurs and the process ends normally, the self-diagnosis determination unit 15 sets a startup success flag (314), and the time set in the self-diagnosis non-execution period setting unit 13 at the time read from the RTC 4 Is set in the self-diagnosis non-execution time limit setting unit 14 (315).
Then, after the self-diagnosis determining unit 15 increments the content of the continuous startup success number counting unit 11 by one (316), the execution of the self-diagnosis program is terminated and the start-up of the actual system is started.
If an error occurs in the self-diagnosis, the self-diagnosis determination unit 15 does not set the startup success flag 10 but displays an error occurrence (317) and stops the system startup.

On the other hand, if the startup success flag 10 is set in step 302, the self-diagnosis determination unit 15 determines that the execution of the self-diagnosis has been normally completed at least once, and the continuous startup success count counter 11 The contents are compared with the contents of the self-diagnosis non-execution count setting unit 12 (303).
When the content of the continuous startup success number counting unit 11 exceeds the content of the self-diagnosis non-execution frequency setting unit 22, the self-diagnosis determination unit 15 has omitted the execution of the self-diagnosis by the number of times already specified. After execution of the self-diagnosis is determined and the processing after the startup success flag 10 is cleared, the self-diagnosis program performs self-diagnosis (310).
If the content of the continuous startup success count unit 11 does not exceed the content of the self-diagnosis non-execution number setting unit 12, the self-diagnosis determination unit 15 reads the time read from the RTC 4 and the self-diagnosis non-execution time limit setting unit The time set to 14 is compared (304).
If the time read from the RTC 4 has passed the time set in the self-diagnosis non-execution deadline setting unit 14, the self-diagnosis has not been executed beyond the specified time, so the self-diagnosis determination unit 15 Decides execution of self-diagnosis, and after the processing after clearing the startup success flag 10, the self-diagnosis program performs self-diagnosis (310).
If the time read from the RTC 4 has not passed the time set in the self-diagnosis non-execution time limit setting unit 14, the self-diagnosis determination unit 15 checks the temperature abnormality occurrence flag 32 (305).
If the temperature abnormality flag is set, there is a possibility that an abnormally high temperature has occurred and a hardware failure has occurred. Therefore, the self-diagnosis determination unit 15 decides to execute self-diagnosis, and after the startup success flag 10 is cleared After the processing, the self-diagnosis program performs self-diagnosis (310).
If the temperature abnormality occurrence flag has not been set, the self-diagnosis determination unit 15 decides to omit the self-diagnosis, increments the content of the continuous startup success count unit 11 by 1 (316), and terminates the self-diagnosis program And start up the actual system.

  Further, the self-diagnosis determination unit 15 periodically performs the process of the temperature abnormality monitoring 1 shown in FIG. 18 during the execution of the self-diagnosis and the system operation, periodically monitors the occurrence of the temperature abnormality, and detects the temperature. When the value set in the upper limit temperature setting unit 31 is exceeded, the temperature abnormality occurrence flag 32 is set.

  The RTC 4 time, the number of self-diagnosis skips to the self-diagnosis non-execution number setting unit 12, the self-diagnosis skip period to the self-diagnosis non-execution period setting unit 13, and the upper limit temperature setting to the upper limit temperature setting unit 31 are self-diagnosis. The user can set in advance by a program setting function or the like.

  As described above, in this embodiment, after successful self-diagnosis, if it operates under an abnormally high temperature even if it does not reach the determined number of times and the determined period, the next power-on or reset Since the self-diagnosis is executed at the time of execution, it is possible to reliably point out a failure when a hardware failure occurs due to an abnormally high temperature, thereby improving the reliability of the system.

  As described above, in the present embodiment, the temperature measuring means for measuring the temperature of the operating environment and the upper limit temperature setting means for setting the upper limit temperature at which the hardware failure rate increases when the temperature exceeds a certain temperature and the occurrence of temperature abnormality A flag is provided, and if the temperature measurement result during operation by the temperature measurement means exceeds the value set in the upper limit temperature setting means, a temperature abnormality occurrence flag is set, and at the next power on or reset execution, A self-diagnosis execution control method for an embedded device that performs a self-diagnosis by setting a temperature abnormality occurrence flag even if both the continuous startup success count unit and the self-diagnosis non-execution deadline setting unit satisfy the conditions explained.

Embodiment 4 FIG.
In the fourth embodiment, in addition to the third embodiment, an embodiment in which the number of occurrences of temperature abnormality is included in the conditions for controlling the execution of self-diagnosis is shown.

FIG. 4 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 4, 33 is a temperature abnormality occurrence count section for counting the temperature abnormality occurrence count, and 34 is a temperature abnormality self-diagnosis execution threshold setting section.
The temperature abnormality occurrence number counting unit 33 is an example of the number counting unit together with the continuous startup success number counting unit 11. Also, the temperature abnormality occurrence count counted by the temperature abnormality occurrence count counting unit 33 is an example of the abnormal value continuous count.
In FIG. 4, the same reference numerals as those in FIG. 3 denote the same parts or parts that perform the same function.

After power-on and reset execution, the processing of FIG. 19 is performed.
FIG. 19 is different from FIG. 17 only in that a step (409) for clearing the temperature abnormality occurrence count section 33 is added, and the other processes are the same as those in FIG.

In addition, the self-diagnosis determination unit 15 performs monitoring of occurrence of temperature abnormality. While the self-diagnosis is being executed and the system operation is being executed, the temperature abnormality monitoring 2 process shown in FIG. 20 is periodically performed.
That is, first, the self-diagnosis determination unit 15 reads the temperature from the temperature measurement unit 30 (450).
The read temperature is compared with the value set in the upper limit temperature setting unit 31 (451).
When the temperature read from the temperature measurement unit 30 does not exceed the temperature set in the upper limit temperature setting unit 31, the self-diagnosis determination unit 15 stores the current temperature as the previous temperature (456), and the temperature abnormality monitoring 2 End the process.
On the other hand, when the temperature read from the temperature measurement unit 30 exceeds the temperature set in the upper limit temperature setting unit 31 in step 451, the self-diagnosis determination unit 15 checks the previous temperature (452).
When the previous temperature exceeds the temperature set in the upper limit temperature setting unit 31, the self-diagnosis determination unit 15 determines that the high temperature state continues and stores the current temperature as the previous temperature ( 456), the temperature abnormality monitoring 2 process is terminated.
In step 452, if the previous temperature did not exceed the temperature set in the upper limit temperature setting unit 31, the self-diagnosis determination unit 15 determines that a new temperature abnormality has occurred, and a temperature abnormality has occurred. The count section 33 is incremented by 1 (453).
Then, the value of the temperature abnormality occurrence count section 33 is compared with the value set in the temperature abnormality self-diagnosis execution threshold setting section 34 (454).
If the value of the temperature abnormality occurrence count unit 33 does not exceed the value set in the temperature abnormality self-diagnosis execution threshold setting unit 34, the self-diagnosis determination unit 15 stores the current temperature as the previous temperature (456). ) The temperature abnormality monitoring 2 process is terminated.
In step 454, when the value of the temperature abnormality occurrence number counting unit 33 exceeds the value set in the temperature abnormality self-diagnosis execution threshold setting unit 34, the self-diagnosis determination unit 15 sets the temperature abnormality occurrence flag 32 ( 455).
And this temperature is memorize | stored as last temperature (456), and the process of the temperature abnormality monitoring 2 is complete | finished.

  The time of the RTC 4, the number of times of self-diagnosis omitted to the self-diagnosis non-execution number setting unit 12, the self-diagnosis omission period to the self-diagnosis non-execution period setting unit 13, the upper limit temperature to the upper limit temperature setting unit 31, and the temperature abnormality self-diagnosis The setting of the temperature abnormality occurrence frequency threshold value in the execution threshold value setting unit 34 can be set in advance by the user using a setting function of a self-diagnosis program.

  As described above, in this embodiment, even when operating at an abnormally high temperature, if the number of times does not exceed the specified value, self-diagnosis at power-on or reset execution is not executed, so it is unnecessary. It becomes possible to prevent the time required for system startup from becoming long.

  As described above, in the present embodiment, the temperature abnormality occurrence frequency counting means for counting the temperature abnormality occurrence frequency and the temperature abnormality self-diagnosis execution threshold setting means are provided, and the temperature measurement result during operation by the temperature measurement means is the upper limit temperature setting means. When the value exceeds the set value and exceeds it, the temperature abnormality occurrence count counting means is increased by 1, and the value of the temperature abnormality occurrence count counting means is set to the value set in the temperature abnormality self-diagnosis execution threshold setting means. If it exceeds, the temperature abnormality occurrence flag is set, and the next time the power is turned on or reset, a temperature abnormality occurs even if both the continuous startup success count counting means and the self-diagnosis non-execution deadline setting means satisfy both conditions A self-diagnosis execution control method for an embedded device that performs a self-diagnosis by setting a flag has been described.

Embodiment 5 FIG.
In the fifth embodiment, an embodiment in which the time during which the temperature abnormality continues is included in the condition for controlling the execution of the self-diagnosis will be described.

FIG. 5 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 5, reference numeral 35 denotes a temperature abnormality occurrence time measuring unit for measuring the time after the temperature abnormality occurrence state, and 36 denotes a temperature abnormality grace time setting unit.
The temperature abnormality occurrence time measuring unit 35 is an example of a time measuring unit together with the RTC 4, the self-diagnosis non-execution period setting unit 13, and the self-diagnosis non-execution time limit setting unit 14. Further, the temperature abnormality occurrence time measured by the temperature abnormality occurrence time measuring unit 35 is an example of the abnormal value duration.
In FIG. 5, the same reference numerals as those in FIG. 3 denote the same parts or parts that perform the same function.

After power-on and reset execution, the processing of FIG. 21 is performed.
FIG. 21 differs from the process of FIG. 17 only in that a step (509) for clearing the temperature abnormality occurrence time measurement unit 35 is added, and the other processes are the same as those in FIG.

Further, in order to monitor the occurrence of temperature abnormality, the self-diagnosis determination unit 15 periodically performs the process of temperature abnormality monitoring 3 shown in FIG. 22 during the execution of the self-diagnosis and the system operation.
That is, first, the self-diagnosis determination unit 15 reads the temperature from the temperature measurement unit 30 (550).
Next, the self-diagnosis determination unit 15 compares the read temperature with the value set in the upper limit temperature setting unit 31 (551).
When the temperature read from the temperature measurement unit 30 does not exceed the temperature set in the upper limit temperature setting unit 31, the self-diagnosis determination unit 15 ends the temperature abnormality monitoring 3 process.
On the other hand, if the temperature read from the temperature measurement unit 30 exceeds the temperature set in the upper limit temperature setting unit 31 in step 551, the temperature abnormality occurrence time measurement unit 35 is increased by 1 (552).
Then, the self-diagnosis determination unit 15 compares the value of the temperature abnormality occurrence time measurement unit 35 with the value set in the temperature abnormality grace time setting unit 36 (553).
When the value of the temperature abnormality occurrence time measuring unit 35 does not exceed the value set in the temperature abnormality grace time setting unit 36, the self-diagnosis determination unit 15 ends the process of the temperature abnormality monitoring 3.
In step 553, when the value of the temperature abnormality occurrence time measurement unit 35 exceeds the value set in the temperature abnormality grace time setting unit 36, the self-diagnosis determination unit 15 sets the temperature abnormality occurrence flag 32 ( 554).
And the process of the temperature abnormality monitoring 3 is complete | finished.

  The time of the RTC 4, the number of times of self-diagnosis omitted to the self-diagnosis non-execution number setting unit 12, the self-diagnosis omission period to the self-diagnosis non-execution period setting unit 13, the upper limit temperature to the upper limit temperature setting unit 31, and the temperature abnormality grace time The setting of the temperature abnormality occurrence grace time in the setting unit 36 can be set in advance by the user using a setting function of the self-diagnosis program.

  As described above, in this embodiment, even when operating at an abnormally high temperature, the self-diagnosis at the time of power-on or reset execution is not executed unless the total time exceeds the specified value. It becomes possible to prevent the time required for starting up the system from becoming long if necessary.

  As described above, in this embodiment, the temperature abnormality occurrence time measuring means and the temperature abnormality time setting means for measuring the time after the temperature abnormality occurrence state is provided, and the temperature measurement result during operation by the temperature measurement means is obtained. Start the time measurement by the temperature abnormality occurrence time measurement means when the value exceeds the value set in the upper limit temperature setting means, and stop the time measurement when it returns within the value set in the temperature setting means Therefore, if the total temperature abnormality occurrence time exceeding the value set in the upper limit temperature setting means exceeds the value set in the temperature abnormality time setting means, the temperature abnormality occurrence flag is set and the power is turned on or reset next time When executing the above, the temperature abnormality occurrence flag must be set even if the continuous startup success count counting means and the self-diagnosis non-execution deadline setting means both satisfy the conditions. It described a self-diagnosis execution control method of the embedded device to perform more self diagnosis.

Embodiment 6 FIG.
In the above third to fifth embodiments, the upper limit temperature setting unit 31, the temperature abnormality occurrence flag 32, the temperature abnormality occurrence count unit 33, the temperature abnormality self-diagnosis execution threshold setting unit 34, the temperature abnormality occurrence time measurement unit 35, the temperature abnormality The grace time setting unit 36 is realized as individual hardware. Next, an embodiment in which these are stored in a small-capacity battery-backed RAM will be described.

FIG. 6 is a block diagram showing a configuration of the embedded device 100 in such a case.
The predetermined addresses of the battery-backed RAM 20 are respectively set to an upper limit temperature setting unit 31, a temperature abnormality occurrence flag 32, a temperature abnormality occurrence count unit 33, a temperature abnormality self-diagnosis execution threshold setting unit 34, a temperature abnormality occurrence time measuring unit 35, and a temperature. Assigned as the abnormal grace time setting unit 36.
The operation is the same as in the third to fifth embodiments.
That is, when the self-diagnosis program stored in the ROM 2 is read by the CPU 1, each element stored in the RAM 20 is also read by the CPU 1 and becomes operable. Thereafter, the same procedure as in the third to fifth embodiments is performed. Determine whether self-diagnosis is necessary.

  As described above, according to the present embodiment, the amount of information to be stored for self-diagnosis execution control can be reduced, and self-diagnosis execution control can be realized using a small-capacity RAM. Can be realized at low cost. Furthermore, if the RAM built in the RTC is used, hardware dedicated for self-diagnosis execution control is not required, and an embedded device can be realized at a lower cost.

  As described above, in this embodiment, the upper limit temperature setting means, temperature abnormality occurrence count counting means, temperature abnormality self-diagnosis execution threshold setting means, temperature abnormality occurrence time measuring means, temperature abnormality time setting means, and temperature abnormality occurrence flag are backed up by a battery. Self-diagnosis of embedded devices that share a small amount of non-volatile memory such as RAM or FLASH, or a part of non-volatile memory such as battery-backed RAM or FLASH that has already been installed for other purposes The control method was explained.

Embodiment 7 FIG.
In the above embodiment, the number of times that self-diagnosis execution is omitted after power-on or reset execution and the time elapsed since the self-diagnosis succeeded, as well as the temperature of the environment in which the embedded device operates, control the execution of self-diagnosis. Although the embodiment in the case where it is put in the condition to perform is shown, here the embodiment in the case where the humidity is put in the condition instead of the temperature is shown.

FIG. 7 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 7, reference numeral 40 denotes a humidity measuring unit such as a humidity sensor, 41 denotes an upper limit humidity setting unit for setting an upper limit humidity at which the occurrence rate is increased due to hardware when the humidity is exceeded, and 42 denotes a humidity abnormality occurrence flag. It is. The humidity measuring unit 40 is an example of an operating environment measuring unit.
In FIG. 7, the same reference numerals as those in FIG. 2 indicate the same parts or parts that perform equivalent functions.

Next, the operation will be described.
When the power of the embedded device 100 is turned on or reset is executed, the self-diagnosis program stored in the ROM 2 is read out and executed by the CPU 1. At this time, each element stored in the RAM 20 is also read out by the CPU 1 and becomes operable.
FIG. 23 is a flowchart showing the operation at this time, and the operation will be described with reference to FIG.

First, the self-diagnosis determination unit 15 reads the state of the startup success flag 10 (701).
Then, it is determined whether the startup success flag is set (702).
If the startup success flag is not set, the self-diagnosis determination unit 15 determines that the self-diagnosis has not ended normally, clears the startup success flag 10 (710), and continuously counts the number of successful startups. 11 is cleared (711).
Further, the self-diagnosis determination unit 15 clears the humidity abnormality occurrence flag 42 (720).
Then, the self-diagnosis program executes hardware self-diagnosis (712).
After executing the self-diagnosis, the self-diagnosis determination unit 15 checks whether an error has occurred in the self-diagnosis (713).
If no error occurs and the process ends normally, the self-diagnosis determination unit 15 sets a startup success flag (714), and the time set in the self-diagnosis non-execution period setting unit 13 at the time read from the RTC 4 Is set in the self-diagnosis non-execution time limit setting unit 14 (715).
Then, after the self-diagnosis determining unit 15 increments the content of the continuous startup success number counting unit 11 by 1 (716), the execution of the self-diagnosis program is terminated and the real system is started.
If an error occurs in the self-diagnosis, the self-diagnosis determination unit 15 does not set the start-up success flag 10, displays an error occurrence (717), and stops the system start-up.

On the other hand, if the startup success flag is set in step 702, the self-diagnosis determination unit 15 determines that the execution of the self-diagnosis has been normally completed at least once, and the contents of the continuous startup success count unit 11 And the contents of the self-diagnosis non-execution frequency setting unit 12 are compared (703).
When the content of the continuous startup success number counting unit 11 exceeds the content of the self-diagnosis non-execution frequency setting unit 22, the self-diagnosis determination unit 15 has omitted the execution of the self-diagnosis by the number of times already specified. After execution of the self-diagnosis is determined and the processing after the startup success flag 10 is cleared, the self-diagnosis program performs self-diagnosis (710).
If the content of the continuous startup success count unit 11 does not exceed the content of the self-diagnosis non-execution number setting unit 12, the self-diagnosis determination unit 15 reads the time read from the RTC 4 and the self-diagnosis non-execution time limit setting unit The time set in 14 is compared (704).
If the time read from the RTC 4 has passed the time set in the self-diagnosis non-execution deadline setting unit 14, the self-diagnosis has not been executed beyond the specified time, so the self-diagnosis determination unit 15 Decides to execute self-diagnosis, and after the processing after the startup success flag 10 is cleared, the self-diagnosis program performs self-diagnosis (710).
If the time read from the RTC 4 has not passed the time set in the self-diagnosis non-execution time limit setting unit 14, the self-diagnosis determination unit 15 checks the humidity abnormality occurrence flag 42 (705).
If the humidity abnormality flag is set, an abnormally high humidity state may have occurred and a hardware failure may have occurred. Therefore, the self-diagnosis determination unit 15 determines the execution of the self-diagnosis, and the startup success flag After the processing after 10 is cleared, the self-diagnostic program performs self-diagnosis (710).
If the humidity abnormality occurrence flag 42 is not set, the self-diagnosis determination unit 15 determines omission of self-diagnosis, increments the content of the continuous startup success count unit 11 by 1 (716), and the self-diagnosis program End and start up the actual system.

  Further, the self-diagnosis determination unit 15 periodically performs the process of the humidity abnormality monitoring 1 shown in FIG. 24 during the execution of the self-diagnosis and the system operation, and periodically monitors the occurrence of the humidity abnormality, When the value set in the upper limit humidity setting unit 41 is exceeded, the humidity abnormality occurrence flag 42 is set.

  The RTC 4 time, the number of self-diagnosis omissions to the self-diagnosis non-execution number setting unit 12, the self-diagnosis omission period to the self-diagnosis non-execution period setting unit 13, and the upper limit humidity setting to the upper limit humidity setting unit 41 are self-diagnosis. The user can set in advance by a program setting function or the like.

  As described above, in this embodiment, after successful self-diagnosis, if it operates under abnormally high humidity even if it does not reach the determined number of times and the determined period, the next power-on or reset Since the self-diagnosis is executed at the time of execution, the failure of the hardware can be surely pointed out when a hardware failure occurs due to the occurrence of abnormally high humidity, so that the reliability of the system can be improved.

  As described above, in the present embodiment, the humidity measuring means for measuring the humidity of the operating environment and the upper limit humidity setting means for setting the upper limit humidity at which the hardware failure rate increases when the humidity exceeds a certain humidity, and the occurrence of abnormal humidity A flag is provided, and if the humidity measurement result during operation by the humidity measurement means exceeds the value set in the upper limit humidity setting means, a humidity abnormality occurrence flag is set, and at the next power on or reset execution, A self-diagnosis execution control method for an embedded device that executes a self-diagnosis when the humidity abnormality occurrence flag is set even if the continuous startup success frequency counting means and the self-diagnosis non-execution deadline setting means both satisfy the conditions explained.

Embodiment 8 FIG.
In the eighth embodiment, in addition to the seventh embodiment, an embodiment in which the number of occurrences of humidity abnormality is included in the conditions for controlling the execution of the self-diagnosis is shown.

FIG. 8 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 8, reference numeral 43 is a humidity abnormality occurrence count section for counting the number of occurrences of humidity abnormality, and 44 is a humidity abnormality self-diagnosis execution threshold setting section.
The humidity abnormality occurrence count section 43 is an example of a count count section together with the continuous startup success count section 11. The number of occurrences of humidity abnormality counted by the number of occurrences of humidity abnormality count unit 43 is an example of the number of consecutive abnormal values.
In FIG. 8, the same reference numerals as those in FIG. 7 denote the same parts or parts that perform the same function.

After power-on and reset execution, the processing of FIG. 25 is performed.
FIG. 25 differs from the process of FIG. 23 only in that a step (809) for clearing the humidity abnormality occurrence count section 43 is added, and the other processes are the same as FIG.

In addition, in order to monitor the occurrence of humidity abnormality, the self-diagnosis determination unit 15 periodically performs the process of humidity abnormality monitoring 2 shown in FIG. 26 during the execution of the self-diagnosis and the system operation.
That is, first, the self-diagnosis determination unit 15 reads the humidity from the humidity measurement unit 40 (850).
The read humidity is compared with the value set in the upper limit humidity setting unit 41 (851).
When the humidity read from the humidity measuring unit 40 does not exceed the humidity set in the upper limit humidity setting unit 41, the self-diagnosis determination unit 15 stores the current humidity as the previous humidity (856), and the humidity abnormality monitoring 2 End the process.
If the humidity read from the humidity measuring unit 40 exceeds the humidity set in the upper limit humidity setting unit 41, the previous humidity is checked (852).
When the previous humidity exceeds the humidity set in the upper limit humidity setting unit 41, the self-diagnosis determination unit 15 determines that the abnormally high humidity state continues, and uses the current humidity as the previous humidity. Store (856) and end the process of humidity abnormality monitoring 2.
In step 852, if the previous humidity did not exceed the humidity set in the upper limit humidity setting unit 41, it is determined that a new humidity abnormality has occurred, and the humidity abnormality occurrence count counter 43 is set to 1. Increase (853).
Then, the value of the humidity abnormality occurrence count section 43 is compared with the value set in the humidity abnormality self-diagnosis execution threshold setting section 44 (854).
When the value of the humidity abnormality occurrence count unit 43 does not exceed the value set in the humidity abnormality self-diagnosis execution threshold setting unit 44, the self-diagnosis determination unit 15 stores the current humidity as the previous humidity (856). ) The humidity abnormality monitoring 2 process is terminated.
In step 854, when the value of the humidity abnormality occurrence count section 43 exceeds the value set in the humidity abnormality self-diagnosis execution threshold setting unit 44, the self-diagnosis determination unit 15 sets the humidity abnormality occurrence flag 42 ( 855).
Then, the current humidity is stored as the previous humidity (856), and the process of the humidity abnormality monitoring 2 is terminated.

  The time of the RTC 4, the number of times of self-diagnosis omitted to the self-diagnosis non-execution number setting unit 12, the self-diagnosis omission period to the self-diagnosis non-execution period setting unit 13, the upper limit humidity to the upper humidity setting unit 41 and the humidity abnormality self-diagnosis The setting of the humidity abnormality occurrence frequency threshold value in the execution threshold value setting unit 44 can be set in advance by the user using a setting function of a self-diagnosis program.

  As described above, in this embodiment, even when operating under abnormally high humidity, self-diagnosis at power-on or reset execution is not executed unless the number of times exceeds the specified value. It becomes possible to prevent the time required for system startup from becoming long.

  As described above, according to the present embodiment, the humidity abnormality occurrence frequency counting means for counting the number of occurrences of humidity abnormality and the humidity abnormality self-diagnosis execution threshold setting means are provided, and the humidity measurement result during operation by the humidity measurement means is set to the upper limit humidity setting. When the value is within the value set in the means and exceeds it, the humidity abnormality occurrence count counting means is increased by 1, and the value of the humidity abnormality occurrence count counting means is set in the humidity abnormality self-diagnosis execution threshold setting means. If the value exceeds the value, the humidity abnormality occurrence flag is set, and the next time the power is turned on or reset, even if the continuous startup success count counting means and the self-diagnosis non-execution deadline setting means both satisfy the conditions, the humidity A self-diagnosis execution control method for an embedded device that executes a self-diagnosis by setting an abnormality occurrence flag has been described.

Embodiment 9 FIG.
In the ninth embodiment, an embodiment in which the time during which the humidity abnormality continues is included in the condition for controlling the execution of the self-diagnosis will be described.

FIG. 9 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 9, 45 is a humidity abnormality occurrence time measuring unit for measuring the time after the humidity abnormality occurrence state, and 46 is a humidity abnormality grace time setting unit.
The humidity abnormality occurrence time measuring unit 45 is an example of a timer unit together with the RTC 4, the self-diagnosis non-execution period setting unit 13, and the self-diagnosis non-execution deadline setting unit 14. The humidity abnormality occurrence time measured by the humidity abnormality occurrence time measuring unit 45 is an example of an abnormal value duration.
In FIG. 9, the same reference numerals as those in FIG. 7 denote the same parts or parts that perform the same function.

After power-on and reset execution, the processing of FIG. 27 is performed.
FIG. 27 differs from the process in FIG. 23 only in that a step (909) for clearing the humidity abnormality occurrence time measurement unit 45 is added, and the other processes are the same as those in FIG.

In order to monitor the occurrence of humidity abnormality, the self-diagnosis determination unit 15 periodically performs the process of humidity abnormality monitoring 3 shown in FIG. 28 during the execution of the self-diagnosis and the system operation.
That is, first, the self-diagnosis determination unit 15 reads the humidity from the humidity measurement unit 40 (950).
Next, the self-diagnosis determination unit 15 compares the read humidity with the value set in the upper limit humidity setting unit 41 (951).
If the humidity read from the humidity measuring unit 40 does not exceed the humidity set in the upper limit humidity setting unit 41, the self-diagnosis determination unit 15 ends the process of the humidity abnormality monitoring 3.
On the other hand, if the humidity read from the humidity measuring unit 40 exceeds the humidity set in the upper limit humidity setting unit 41 in step 951, the humidity abnormality occurrence time measuring unit 45 is increased by 1 (952).
Then, the self-diagnosis determination unit 15 compares the value of the humidity abnormality occurrence time measurement unit 45 with the value set in the humidity abnormality grace time setting unit 46 (953).
When the value of the humidity abnormality occurrence time measurement unit 45 does not exceed the value set in the humidity abnormality grace time setting unit 46, the self-diagnosis determination unit 15 ends the process of the humidity abnormality monitoring 3.
In step 953, when the value of the humidity abnormality occurrence time measuring unit 45 exceeds the value set in the humidity abnormality grace time setting unit 46, the self-diagnosis determination unit 15 sets the humidity abnormality occurrence flag 42 ( 954).
And the process of the humidity abnormality monitoring 3 is complete | finished.

  The time of the RTC 4, the number of times of self-diagnosis omitted to the self-diagnosis non-execution number setting unit 12, the self-diagnosis omission period to the self-diagnosis non-execution period setting unit 13, the upper limit humidity to the upper limit humidity setting unit 41, and an abnormal humidity grace time The setting of the humidity abnormality occurrence grace time in the setting unit 46 can be set in advance by the user using a setting function of the self-diagnosis program.

  As described above, in this embodiment, even when operating under abnormally high humidity, self-diagnosis at power-on or reset execution is not executed unless the total time exceeds the specified value. It becomes possible to prevent the time required for starting up the system from becoming long if necessary.

  As described above, in the present embodiment, the humidity abnormality occurrence time measuring means and the humidity abnormality time setting means for measuring the time after the humidity abnormality occurrence state is provided, and the humidity measurement result during operation by the humidity measurement means is obtained. When the value exceeds the value set in the upper limit humidity setting means, the time measurement by the humidity abnormality occurrence time measurement means is started, and the time measurement is stopped when the value returns within the value set in the humidity setting means. As a result, when the total humidity abnormality occurrence time exceeding the value set in the upper limit humidity setting means exceeds the value set in the humidity abnormality time setting means, the humidity abnormality occurrence flag is set and the power is turned on or reset next time. When executing the above, the humidity abnormality occurrence flag must be set even if the continuous startup success frequency counting means and the self-diagnosis non-execution deadline setting means both satisfy the conditions. It described a self-diagnosis execution control method to perform more self diagnosis.

Embodiment 10 FIG.
In the above seventh to ninth embodiments, the upper limit humidity setting unit 41, the humidity abnormality occurrence flag 42, the humidity abnormality occurrence count counter 43, the humidity abnormality self-diagnosis execution threshold setting unit 44, the humidity abnormality occurrence time measurement unit 45, and the humidity abnormality The grace time setting unit 46 is realized as individual hardware. Next, an embodiment in which these are stored in a small-capacity battery-backed RAM will be described.

FIG. 10 is a block diagram showing the configuration of the embedded device 100 in that case.
The predetermined addresses of the battery-backed RAM 20 are respectively set to an upper limit humidity setting unit 41, a humidity abnormality occurrence flag 42, a humidity abnormality occurrence count counter 43, a humidity abnormality self-diagnosis execution threshold setting unit 44, a humidity abnormality occurrence time measurement unit 45, and a humidity. Assigned as the abnormal grace time setting unit 46.
The operation is the same as in the seventh to ninth embodiments.
That is, when the self-diagnosis program stored in the ROM 2 is read by the CPU 1, each element stored in the RAM 20 is also read by the CPU 1 and becomes operable. Thereafter, the same procedure as in the seventh to ninth embodiments is performed. Determine whether self-diagnosis is necessary.

  As described above, according to the present embodiment, the amount of information to be stored for self-diagnosis execution control can be reduced, and self-diagnosis execution control can be realized using a small-capacity RAM. Can be realized at low cost. Furthermore, if the RAM built in the RTC is used, hardware dedicated for self-diagnosis execution control is not required, and an embedded device can be realized at a lower cost.

  As described above, in this embodiment, the upper limit humidity setting means, the humidity abnormality occurrence count counting means, the humidity abnormality self-diagnosis execution threshold setting means, the humidity abnormality occurrence time measuring means, the humidity abnormality time setting means, and the humidity abnormality occurrence flag are backed up by the battery. Self-diagnosis of embedded devices that share a small amount of non-volatile memory such as RAM or FLASH, or a part of non-volatile memory such as battery-backed RAM or FLASH that has already been installed for other purposes The control method was explained.

Embodiment 11 FIG.
In the above embodiment, the number of times the self-diagnosis execution is omitted after power-on or reset execution and the time that has elapsed since the self-diagnosis succeeds, as well as the humidity of the environment in which the embedded device operates, control the execution of the self-diagnosis. However, here, an embodiment in which vibration is put in the condition instead of humidity is shown.

FIG. 11 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 11, 50 is a vibration measuring unit such as a vibration sensor, and measures vibration (acceleration) of the embedded device 100. Reference numeral 51 denotes an upper limit acceleration setting unit for setting an upper limit acceleration at which the rate of occurrence increases due to hardware when the acceleration (vibration) of the embedded device 100 is exceeded, and 52 is a vibration abnormality occurrence flag. The vibration measurement unit 50 is an example of an operating environment measurement unit.
In FIG. 11, the same reference numerals as those in FIG. 2 indicate the same parts or parts that perform equivalent functions.

Next, the operation will be described.
When the power of the embedded device 100 is turned on or reset is executed, the self-diagnosis program stored in the ROM 2 is read out and executed by the CPU 1. At this time, each element stored in the RAM 20 is also read out by the CPU 1 and becomes operable.
FIG. 29 is a flowchart showing the operation at this time, and the operation will be described with reference to FIG.

First, the self-diagnosis determination unit 15 reads the state of the startup success flag 10 (1101).
Then, it is determined whether the startup success flag is set (1102).
If the start-up success flag is not set, the self-diagnosis determination unit 15 determines that the self-diagnosis has not ended normally, clears the start-up success flag 10 (1110), and continuously counts the number of successful start-ups. 11 is cleared (1111).
Further, the self-diagnosis determination unit 15 clears the vibration abnormality occurrence flag 52 (1120).
Then, the self-diagnosis program executes hardware self-diagnosis (1112).
After executing the self-diagnosis, the self-diagnosis determination unit 15 checks whether an error has occurred in the self-diagnosis (1113).
If no error occurs and the process ends normally, the self-diagnosis determination unit 15 sets a startup success flag (1114), and the time set in the self-diagnosis non-execution period setting unit 13 at the time read from the RTC 4 Is set in the self-diagnosis non-execution time limit setting unit 14 (1115).
Then, after the self-diagnosis determination unit 15 increments the content of the continuous startup success number counting unit 11 by 1 (1116), the execution of the self-diagnosis program is terminated and the start-up of the actual system is started.
If an error occurs in the self-diagnosis, the self-diagnosis determination unit 15 does not set the start-up success flag 10, displays an error occurrence (1117), and stops the system start-up.

On the other hand, if the startup success flag is set in step 1102, the self-diagnosis determination unit 15 determines that the execution of the self-diagnosis has been normally completed at least once, and the contents of the continuous startup success count unit 11 And the contents of the self-diagnosis non-execution frequency setting unit 12 are compared (1103).
When the content of the continuous startup success number counting unit 11 exceeds the content of the self-diagnosis non-execution frequency setting unit 22, the self-diagnosis determination unit 15 has omitted the execution of the self-diagnosis by the number of times already specified. After execution of the self-diagnosis is determined and the processing after the startup success flag 10 is cleared, the self-diagnosis program performs self-diagnosis (1110).
If the content of the continuous startup success count unit 11 does not exceed the content of the self-diagnosis non-execution number setting unit 12, the self-diagnosis determination unit 15 reads the time read from the RTC 4 and the self-diagnosis non-execution time limit setting unit The time set to 14 is compared (1104).
If the time read from the RTC 4 has passed the time set in the self-diagnosis non-execution deadline setting unit 14, the self-diagnosis has not been executed beyond the specified time, so the self-diagnosis determination unit 15 Determines execution of self-diagnosis, and after the processing after clearing the startup success flag 10, the self-diagnosis program performs self-diagnosis (1110).
When the time read from the RTC 4 has not passed the time set in the self-diagnosis non-execution time limit setting unit 14, the vibration abnormality occurrence flag 52 is checked (1105).
If the vibration abnormality flag is set, abnormally strong vibration has occurred and a hardware failure may have occurred. Therefore, the self-diagnosis determination unit 15 determines execution of the self-diagnosis, and the startup success flag 10 After the process after clearing, the self-diagnosis program performs self-diagnosis (1110).
If the vibration abnormality occurrence flag 52 is not set, the self-diagnosis determination unit 15 determines that the self-diagnosis is omitted, and increments the content of the continuous startup success count unit 11 by 1 (1116). End and start up the actual system.

  In addition, the self-diagnosis determination unit 15 periodically performs the vibration abnormality monitoring 1 process shown in FIG. 30 during the self-diagnosis and the system operation, and periodically monitors the occurrence of the vibration abnormality, When the value set in the upper limit acceleration setting unit 51 is exceeded, the vibration abnormality occurrence flag 52 is set.

  The RTC 4 time, the number of self-diagnosis skips to the self-diagnosis non-execution setting unit 12, the self-diagnosis skip period to the self-diagnosis non-execution period setting unit 13, and the upper limit acceleration to the upper limit acceleration setting unit 51 are set by self-diagnosis. The user can set in advance by a program setting function or the like.

  As described above, in this embodiment, after successful self-diagnosis, if abnormally strong vibration occurs during operation even if the determined number of times and the determined period are not satisfied, the next power-on or Since the self-diagnosis is executed at the time of reset execution, it is possible to reliably point out a failure when a hardware failure occurs due to abnormally strong vibrations, thereby improving the reliability of the system.

  As described above, in the present embodiment, the vibration measuring means for measuring the vibration applied to the built-in device and the upper limit family degree setting means for setting the upper limit acceleration at which the hardware failure rate increases when the acceleration exceeds a certain acceleration If the vibration measurement result applied during operation by the vibration measurement means exceeds the value set in the upper limit acceleration setting means, the vibration abnormality occurrence flag is set and the next power Built-in device that executes self-diagnosis when the vibration abnormality occurrence flag is set, even if both the continuous startup success count counting means and the self-diagnosis non-execution deadline setting means do not satisfy the conditions at the time of turning on or resetting The self-diagnosis execution control method was explained.

Embodiment 12 FIG.
In the twelfth embodiment, in addition to the eleventh embodiment, an embodiment in which the number of occurrences of vibration abnormality is included in the conditions for controlling the execution of the self-diagnosis is shown.

FIG. 12 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 12, reference numeral 53 denotes a vibration abnormality occurrence number counting unit for counting the number of vibration abnormality occurrences, and 54 is a vibration abnormality self-diagnosis execution threshold setting unit.
The vibration abnormality occurrence count section 53 is an example of the count section together with the continuous startup success count section 11. Further, the vibration abnormality occurrence number counted by the vibration abnormality occurrence number counting unit 53 is an example of the abnormal value continuous number of times.
In FIG. 12, the same reference numerals as those in FIG. 11 denote the same parts or parts that perform the same function.

After power-on and reset execution, the processing of FIG. 31 is performed.
FIG. 31 differs from the process of FIG. 29 only in that a step (1209) for clearing the vibration abnormality occurrence count section 53 is added, and the other processes are the same as those in FIG.

Further, in order to monitor the occurrence of vibration abnormality, the self-diagnosis determination unit 15 periodically performs the process of vibration abnormality monitoring 2 shown in FIG. 32 during the execution of the self-diagnosis and the system operation.
That is, first, the acceleration that is the value of the vibration is read from the vibration measuring unit 50 (1250).
The read acceleration is compared with the value set in the upper limit acceleration setting unit 51 (1251).
If the acceleration read from the vibration measuring unit 50 does not exceed the value set in the upper limit acceleration setting unit 51, the current acceleration is stored as the previous acceleration (1256), and the processing of vibration abnormality monitoring 2 is terminated.
When the acceleration read from the vibration measuring unit 50 exceeds the value set in the upper limit acceleration setting unit 51, the previous acceleration is checked (1252).
If the previous acceleration exceeds the value set in the upper limit acceleration setting unit 51, it is determined that abnormally strong vibration continues, the current acceleration is stored as the previous acceleration (1256), and the vibration abnormality The monitoring 2 process is terminated. If the previous acceleration does not exceed the value set in the upper limit acceleration setting unit 51, it is determined that a new abnormal vibration has occurred, and the vibration abnormality occurrence count unit 53 is incremented by 1 (1253).
Then, the value of the vibration abnormality occurrence count section 53 is compared with the value set in the vibration abnormality self-diagnosis execution threshold setting section 54 (1254).
When the value of the vibration abnormality occurrence number counting unit 53 does not exceed the value set in the vibration abnormality self-diagnosis execution threshold setting unit 54, the self-diagnosis determination unit 15 stores the current acceleration as the previous acceleration (1256). ) The vibration abnormality monitoring 2 process is terminated.
In step 1254, if the value of the vibration abnormality occurrence count section 53 exceeds the value set in the vibration abnormality self-diagnosis execution threshold setting section 54, the vibration abnormality occurrence flag 52 is set (1255). Then, the current acceleration is stored as the previous acceleration (1256), and the vibration abnormality monitoring 2 process is terminated.

  The time of the RTC 4, the number of times of self-diagnosis omitted to the self-diagnosis non-execution number setting unit 12, the self-diagnosis omission period to the self-diagnosis non-execution period setting unit 13, the upper limit acceleration to the upper limit acceleration setting unit 51 and the vibration abnormality self-diagnosis The setting of the vibration abnormality occurrence frequency threshold value in the execution threshold value setting unit 54 can be set in advance by the user using a setting function of a self-diagnosis program.

  As described above, in this embodiment, even if abnormally strong vibration occurs during operation, self-diagnosis at power-on or reset execution is not executed unless the number of times exceeds the specified value. Therefore, it is possible to prevent the time required for system startup from becoming long.

  As described above, in the present embodiment, the vibration abnormality occurrence frequency counting means for counting the number of vibration abnormality occurrences and the vibration abnormality self-diagnosis execution threshold setting means are provided, and the measurement result of vibration applied during the operation by the vibration measurement means is the upper limit acceleration. When the value set in the setting means is exceeded, the vibration abnormality occurrence number counting means is incremented by one, and the value of the vibration abnormality occurrence number counting means exceeds the value set in the vibration abnormality self-diagnosis execution threshold setting means When the vibration abnormality occurrence flag is set and the power is turned on or reset next time, the vibration abnormality occurrence flag is set even if the continuous startup success count counting means and the self-diagnosis non-execution deadline setting means both satisfy the conditions. The self-diagnosis execution control method of the embedded device that executes the self-diagnosis is explained.

Embodiment 13 FIG.
In the thirteenth embodiment, an embodiment in which the time during which abnormal vibration continues is included in the condition for controlling the execution of the self-diagnosis will be described.

FIG. 13 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 13, reference numeral 55 denotes a vibration abnormality occurrence time measuring unit for measuring the time after the vibration abnormality occurrence state, and 56 is a vibration abnormality grace time setting unit.
The vibration abnormality occurrence time measuring unit 55 is an example of a timer unit together with the RTC 4, the self-diagnosis non-execution period setting unit 13 and the self-diagnosis non-execution time limit setting unit 14. Further, the vibration abnormality occurrence time measured by the vibration abnormality occurrence time measuring unit 55 is an example of the abnormal value duration.
In FIG. 13, the same reference numerals as those in FIG. 11 indicate the same portions or portions that perform equivalent functions.

After power-on and reset execution, the processing of FIG. 33 is performed.
FIG. 33 differs from the process of FIG. 29 only in that a step (1309) for clearing the vibration abnormality occurrence time measurement unit 55 is added, and the other processes are the same as those in FIG.

Further, in order to monitor the occurrence of abnormal vibration, the self-diagnosis determination unit 15 periodically performs the process of vibration abnormality monitoring 3 shown in FIG. 34 during the execution of the self-diagnosis and the system operation.
That is, first, the acceleration that is the value of the vibration is read from the vibration measuring unit 50 (1350).
The read acceleration is compared with the value set in the upper limit acceleration setting unit 51 (1351).
If the acceleration read from the vibration measurement unit 50 does not exceed the value set in the upper limit acceleration setting unit 51, the self-diagnosis determination unit 15 ends the processing of the vibration abnormality monitoring 3.
On the other hand, if the acceleration read from the vibration measuring unit 50 exceeds the value set in the upper limit acceleration setting unit 51 in step 1351, the vibration abnormality occurrence time measuring unit 55 is incremented by 1 (1352).
Then, the value of the vibration abnormality occurrence time measuring unit 55 is compared with the value set in the vibration abnormality grace time setting unit 56 (1353).
If the value of the vibration abnormality occurrence time measuring unit 55 does not exceed the value set in the vibration abnormality grace time setting unit 56, the self-diagnosis determination unit 15 ends the processing of the vibration abnormality monitoring 3.
In step 1353, when the value of the vibration abnormality occurrence time measuring unit 55 exceeds the value set in the vibration abnormality grace time setting unit 56, the self-diagnosis determination unit 15 sets the vibration abnormality occurrence flag 52 ( 1354).
And the process of the vibration abnormality monitoring 3 is complete | finished.

  The time of the RTC 4, the number of times of self-diagnosis omitted to the self-diagnosis non-execution number setting unit 12, the self-diagnosis omission period to the self-diagnosis non-execution period setting unit 13, the upper limit acceleration to the upper limit acceleration setting unit 51, and the vibration abnormality grace time The setting of the vibration abnormality occurrence grace time in the setting unit 56 can be set in advance by the user using a setting function of the self-diagnosis program.

  As described above, in this embodiment, even when abnormally strong vibration occurs during operation, the self-diagnosis at power-on or reset execution is not executed unless the total generation time exceeds the specified value. It is possible to prevent an unnecessarily long time required for starting up the system.

  As described above, in this embodiment, the vibration abnormality occurrence time measuring means and the vibration abnormality time setting means for measuring the time after the vibration abnormality occurrence state is provided, and the vibration applied during the operation by the vibration measurement means is provided. When the measurement result exceeds the value set in the upper limit acceleration setting means, the time measurement by the vibration abnormality occurrence time measuring means is started, and when the measurement result returns within the value set in the upper limit acceleration setting means, the time measurement is stopped. Therefore, when the total vibration abnormality occurrence time exceeding the value set in the upper limit acceleration setting means exceeds the value set in the vibration abnormality time setting means, the vibration abnormality occurrence flag is set and the power is turned on or reset next time. The vibration abnormality occurrence flag is set even if the continuous startup success count counting means and the self-diagnosis non-execution deadline setting means both satisfy the conditions. It described a self-diagnosis execution control method of the embedded device to perform a self-diagnosis by there.

Embodiment 14 FIG.
In the above-described Embodiments 11 to 13, the upper limit acceleration setting unit 51, the vibration abnormality occurrence flag 52, the vibration abnormality occurrence number counting unit 53, the vibration abnormality self-diagnosis execution threshold setting unit 54, the vibration abnormality occurrence time measuring unit 55, the vibration abnormality The grace time setting unit 56 is realized as individual hardware. Next, an embodiment in which these are stored in a small-capacity battery-backed RAM will be described.

FIG. 14 is a block diagram showing the configuration of the embedded device 100 in that case.
The predetermined addresses of the battery-backed RAM 20 are respectively set to an upper limit acceleration setting unit 51, a vibration abnormality occurrence flag 52, a vibration abnormality occurrence count unit 53, a vibration abnormality self-diagnosis execution threshold setting unit 54, a vibration abnormality occurrence time measuring unit 55, and a vibration. Assigned as the abnormal grace time setting unit 56.

The operation is the same as in the case of the embodiments 11-13.
That is, when the self-diagnosis program stored in the ROM 2 is read by the CPU 1, each element stored in the RAM 20 is also read by the CPU 1 and becomes operable. Thereafter, the same procedure as in the embodiments 11 to 13 is performed. Determine whether self-diagnosis is necessary.

  As described above, according to the present embodiment, the amount of information to be stored for self-diagnosis execution control can be reduced, and self-diagnosis execution control can be realized using a small-capacity RAM. Can be realized at low cost. Furthermore, if the RAM built in the RTC is used, hardware dedicated for self-diagnosis execution control is not required, and an embedded device can be realized at a lower cost.

  As described above, in this embodiment, the upper limit acceleration setting means, vibration abnormality occurrence count counting means, vibration abnormality self-diagnosis execution threshold setting means, vibration abnormality occurrence time measuring means, vibration abnormality time setting means, and vibration abnormality occurrence flag are backed up by a battery. Self-diagnosis of embedded devices that share a small amount of non-volatile memory such as RAM or FLASH, or a part of non-volatile memory such as battery-backed RAM or FLASH that has already been installed for other purposes The control method was explained.

Embodiment 15 FIG.
In the fifteenth embodiment, in addition to the number of times the execution of self-diagnosis is omitted after power-on or reset execution and the time elapsed after successful self-diagnosis, all of the temperature, humidity and vibration of the environment in which the embedded device operates are An embodiment in the case where the conditions for controlling the execution of self-diagnosis are included will be described.

FIG. 15 is a block diagram showing the configuration of the embedded device 100 in that case.
In FIG. 15, the same reference numerals as those in FIGS. 1, 6, 10, and 14 denote the same or equivalent parts.

Next, with respect to the operation, the processing shown in FIG. 35 is performed after power-on and reset execution.
As the contents of the processing, only the temperature abnormality occurrence flag is checked in the fifth embodiment, only the humidity abnormality occurrence flag is checked in the ninth embodiment, and only the vibration abnormality occurrence flag is checked in the thirteenth embodiment. The temperature abnormality occurrence flag check (1505), the humidity abnormality occurrence flag check (1506), and the vibration abnormality occurrence flag check (1507) are all performed.
In addition, the temperature abnormality occurrence time measurement unit, the humidity abnormality occurrence time measurement unit, and the vibration abnormality occurrence time measurement unit are all cleared (1509) before the self-diagnosis is executed, except for the fifth embodiment. 9 and 13 are the same.

Further, in order to monitor the occurrence of temperature abnormality, humidity abnormality, and vibration abnormality, the self-diagnosis determination unit 15 periodically performs the process for monitoring environmental abnormality shown in FIG. 36 during the execution of the self-diagnosis and the system operation. To do.
About the content of a process, the same content as what was demonstrated in Embodiment 5, Embodiment 9, and Embodiment 13 is performed in series.

  As described above, according to the present embodiment, after successful self-diagnosis, any one of abnormally high temperature, abnormally high humidity, and abnormally strong vibration can be operated even if the predetermined number of times and the predetermined period are not reached. If this occurs, the self-diagnosis will be performed at the next power-on or reset, so that even if a hardware failure occurs due to any abnormality, the failure can be pointed out reliably. Reliability can be improved.

  As described above, in this embodiment, all of the temperature measurement means, the humidity measurement means, and the vibration measurement means are provided, and the upper limit temperature setting means, the temperature abnormality occurrence time measurement means, the temperature abnormality grace time setting means, the temperature abnormality occurrence flag, and the upper limit humidity are provided. Setting means, humidity abnormality occurrence time measurement means, humidity abnormality grace time setting means, humidity abnormality occurrence flag, upper limit acceleration setting means, vibration abnormality occurrence time measurement means, vibration abnormality grace time setting means, and vibration abnormality occurrence flag are backed up by a battery. By using a small-scale non-volatile memory such as RAM or FLASH, or a part of non-volatile memory such as a battery-backed RAM or FLASH that has already been installed for other purposes, temperature abnormalities and humidity Even if either an abnormality or vibration abnormality occurs, it is continuously started up at the next power-on or reset execution. Without meet both conditions Gong number counting means and the self-diagnosis is not executed limit setting means, it has been described a self-diagnosis execution control method of the embedded device to perform a self-diagnosis.

Embodiment 16 FIG.
In the sixteenth embodiment, an embodiment in which the user's request is confirmed immediately before the start of the self-diagnosis execution and during the self-diagnosis execution, and when the request is made, the execution of the self-diagnosis is stopped is shown.
The configuration is the same as that of the second embodiment and is shown in FIG.

Next, the operation will be described with reference to FIG.
After power-on and reset execution, the self-diagnosis determination unit 15 first displays a message indicating that self-diagnosis is being executed on the display unit 6 (1600).
Next, the self-diagnosis determination unit 15 reads the state of the startup success flag 10 (1601).
Then, it is determined whether the startup success flag is set (1602).
If the startup success flag is not set, the self-diagnosis determination unit 15 determines that the self-diagnosis has not ended normally, clears the startup success flag 10 (1610), and continuously counts the number of successful startups. 11 is cleared (1611).
Here, it is checked whether a self-diagnosis stop request from the user has been input by the input unit 5 (1612).
If there is a cancel request, the self-diagnosis determination unit 15 deletes the message during execution of the self-diagnosis (1618), ends the execution of the self-diagnosis program, and starts to start up the actual system.
If there is no cancel request, the self-diagnosis program executes hardware self-diagnosis (1613).
Further, the self-diagnosis determination unit 15 periodically checks whether or not there is a cancel request even during execution of the self-diagnosis, and cancels the execution of the self-diagnosis when there is a cancel request. After executing the self-diagnosis, the self-diagnosis determination unit 15 first confirms whether or not the self-diagnosis determination unit 15 has been stopped by a self-diagnosis stop request (1614).
If the cancellation is due to the cancellation request, the processing from the self-diagnosis in-progress message deletion (1618) is performed.
If the cancellation is not due to the cancellation request, the self-diagnosis determination unit 15 checks whether an error has occurred in the self-diagnosis (1615).
If no error occurs and the process ends normally, the self-diagnosis determination unit 15 sets a startup success flag (1616), and the time set in the self-diagnosis non-execution period setting unit 13 at the time read from the RTC 4 Is set in the self-diagnosis non-execution time limit setting unit 14 (1617).
Then, the self-diagnosis determination unit 15 increments the content of the continuous startup success number counting unit 11 by 1 (1605), deletes the message during execution of the self-diagnosis (1618), ends the execution of the self-diagnosis program, Start up the real system.
If an error occurs in the self-diagnosis, the startup success flag 10 is not set, the error occurrence is displayed (1619), and the system startup is stopped.

In step 1602, if the startup success flag is set, the self-diagnosis determination unit 15 determines that the execution of the self-diagnosis has been normally completed at least once, and the contents of the continuous startup success count unit 11 And the contents of the self-diagnosis non-execution frequency setting unit 12 are compared (1603).
When the content of the continuous startup success number counting unit 11 exceeds the content of the self-diagnosis non-execution frequency setting unit 22, the self-diagnosis determination unit 15 has omitted the execution of the self-diagnosis by the number of times already specified. After execution of the self-diagnosis is determined and the processing after the startup success flag 10 is cleared, the self-diagnosis program performs self-diagnosis (1610).
If the content of the continuous startup success count unit 11 does not exceed the content of the self-diagnosis non-execution number setting unit 12, the self-diagnosis determination unit 15 reads the time read from the RTC 4 and the self-diagnosis non-execution time limit setting unit The time set to 14 is compared (1604).
When the time read from the RTC 4 has passed the time set in the self-diagnosis non-execution time limit setting unit 14, the self-diagnosis determination unit 15 has not performed the self-diagnosis beyond the specified time. Therefore, the self-diagnosis determination unit 15 determines execution of the self-diagnosis, and the self-diagnosis program performs self-diagnosis after processing after the startup success flag 10 is cleared (1610).
When the time read from the RTC 4 has not passed the time set in the self-diagnosis non-execution deadline setting unit 14, the self-diagnosis determination unit 15 determines omission of self-diagnosis, and the continuous startup success frequency counting unit 11 Is incremented by 1 (1605), the self-diagnosis execution display is deleted (1618), the self-diagnosis program is terminated, and the actual system is started.

  Here, in order to simplify the explanation, the embodiment in which the occurrence check of the temperature abnormality, the humidity abnormality, and the vibration abnormality is not performed has been described. However, in the third to fifteenth embodiments, the self-diagnosis is being executed immediately before the start of the self-diagnosis. This step is realized by adding a user request confirmation step added in this embodiment immediately before the start of self-diagnosis and during the execution of self-diagnosis and a step of deleting the self-diagnosis in-execution message before the end of self-diagnosis. Needless to say, the same effect can be obtained.

  As described above, according to this embodiment, the execution of self-diagnosis can be stopped by a user's request, so that it is possible to flexibly respond to such a request for a user who demands an early start-up of the system rather than the reliability of the system. It becomes like this.

  As described above, in the present embodiment, the self-diagnosis is being performed on the display means during the self-diagnosis, and when the self-diagnosis is to be stopped, an indication to stop the self-diagnosis is displayed by operating the input means such as a button. A self-diagnosis execution control method for an embedded device that interrupts the execution of the self-diagnosis and starts the normal system startup when a self-diagnosis interruption operation such as button depression is actually performed.

As described above, the embedded device 100 shown in the first to sixteenth embodiments includes a CPU, a ROM, a RAM, an HDD, an LCD, and other display units that execute programs, and an input unit such as a push button and a keyboard. .
For example, an operating system (OS), a program group, and a file group are stored in the HDD.
The programs in the program group are executed by the CPU using the operating system.
The program group includes “to part” described as a program in the first to sixteenth embodiments. These programs are read and executed by the CPU.

The RAM temporarily stores at least part of an operating system program and application programs to be executed by the CPU.
The RAM stores various data necessary for processing by the CPU.

In the HDD and RAM, as the file group, in the description of the first to sixteenth embodiments, “determination of”, “calculation of”, “comparison of”, “update of”, “setting of”, Information, data, signal values, variable values, and parameters indicating the results of the processing described as "Registering", "Selecting", etc. are stored as "~ File" and "~ Database" items. The
The arrows in the flowcharts described in Embodiments 1 to 16 mainly indicate input / output of data and signals, and the data and signal values are recorded in RAM, HDD, and other recording media. Data and signals are transmitted on-line via buses, signal lines, cables, and other transmission media.

  In addition, what is described as “to part” in the description of Embodiments 1 to 16 may be “to circuit”, “to device”, and “to device”, and “to step”, It may be “˜procedure” or “˜processing”. That is, what is described as “˜unit” may be realized by firmware stored in the ROM. Alternatively, it may be implemented only by software, or only by hardware such as elements, devices, substrates, and wirings, by a combination of software and hardware, or by a combination of firmware. Firmware and software are stored as programs in a recording medium such as a magnetic disk, a flexible disk, an optical disk, a compact disk, a mini disk, and a DVD.

  1 CPU, 2 ROM, 3 RAM, 4 RTC, 5 input section, 6 display section, 7 DVD / CD, 8 HDD, 9 battery, 10 startup success flag, 11 continuous startup success count section, 12 self-diagnosis non Number of executions setting unit, 13 Self-diagnosis non-execution period setting unit, 14 Self-diagnosis non-execution time limit setting unit, 15 Self-diagnosis determination unit, 20 RAM, 30 Temperature measurement unit, 31 Upper limit temperature setting unit, 32 Temperature abnormality occurrence flag, 33 Temperature abnormality occurrence count section, 34 Temperature abnormality self-diagnosis execution threshold setting section, 35 Temperature abnormality occurrence time measurement section, 36 Temperature abnormality grace time setting section, 40 Humidity measurement section, 41 Upper limit humidity setting section, 42 Humidity abnormality occurrence flag, 43 Humidity abnormality occurrence count section, 44 Humidity abnormality self-diagnosis execution threshold setting section, 45 Humidity abnormality occurrence time measurement section, 46 Humidity abnormality Grace time setting unit, 50 vibration measurement unit, 51 upper limit acceleration setting unit, 52 vibration abnormality occurrence flag, 53 vibration abnormality occurrence count counter, 54 vibration abnormality self-diagnosis execution threshold setting unit, 55 vibration abnormality occurrence time measurement unit, 56 vibration Abnormal grace time setting unit, 100 embedded device.

Claims (15)

An information processing apparatus capable of performing self-diagnosis during start-up processing and omitting self-diagnosis during start-up processing in a predetermined case,
A count unit that counts the number of start-up processes in which self-diagnosis is omitted continuously as a self-diagnosis skipped continuous number;
A timekeeping unit that counts the time during which self-diagnosis is not performed continuously as self-diagnosis skipping continuation time;
During start-up processing, it is determined whether or not the number of consecutive self-diagnosis skips counted by the number-of-times counting unit is greater than or equal to a threshold value, and whether or not the duration of self-diagnosis skipped time counted by the timing unit is greater than or equal to a threshold value An information processing apparatus comprising: a self-diagnosis determination unit that determines whether or not to perform self-diagnosis during the startup process. The self-diagnosis determination unit
2. The information according to claim 1, wherein when at least one of the number of consecutive self-diagnosis skipping times and the duration of self-diagnosis skipping is equal to or greater than a threshold value, it is determined to perform self-diagnosis at the start-up process. Processing equipment. The self-diagnosis determination unit
It manages whether or not the startup process has been completed normally at the previous startup process.If the startup process has not been completed normally at the previous startup process, 3. The information processing apparatus according to claim 1, wherein the self-diagnosis is determined to be performed during the start-up process without performing the comparison between the check time and the self-diagnosis omission duration and the threshold value. An information processing apparatus capable of performing self-diagnosis during start-up processing and omitting self-diagnosis during start-up processing in a predetermined case,
An operating environment measurement unit for measuring the operating environment during start-up processing;
During the start-up process, the operating environment measurement unit determines whether or not the measured value measured after the previous self-diagnosis execution has become an abnormal value, and performs the self-diagnosis during the start-up process. An information processing apparatus comprising: a self-diagnosis determination unit that determines whether or not. The self-diagnosis determination unit
When the measurement value measured after the previous self-diagnosis execution by the operating environment measurement unit has become an abnormal value during the start-up process, it is determined to perform the self-diagnosis during the start-up process. The information processing apparatus according to claim 4. The self-diagnosis determination unit
It manages whether or not the startup process has been completed normally during the previous startup process.If the startup process has not been completed normally during the previous startup process, the operating environment measurement unit The determination as to whether or not the self-diagnosis is performed at the start-up process without determining whether or not the measured value measured after the execution of the self-diagnosis has become an abnormal value has been made. 5. The information processing apparatus according to 5. The information processing apparatus further includes:
A count unit that counts the number of start-up processes in which self-diagnosis is omitted continuously as a self-diagnosis skipped continuous number;
A time keeping unit that keeps the time during which self-diagnosis is not performed continuously as the self-diagnosis omission continuation time,
The self-diagnosis determination unit
During the start-up process, it is determined whether or not the measurement value measured after the previous self-diagnosis execution by the operating environment measurement unit has become an abnormal value, and the self-diagnosis counted by the number-of-times counting unit It is determined whether or not self-diagnosis is performed during the start-up process by determining whether or not the number of consecutive omissions and the self-diagnosis omission continuation time measured by the timing unit are equal to or greater than the respective threshold values. The information processing apparatus according to any one of claims 4 to 6. The self-diagnosis determination unit
If the measured value measured after the previous self-diagnosis by the operating environment measurement unit during the start-up process has become an abnormal value, the number of consecutive self-diagnosis omissions is less than the threshold and the self-diagnosis is omitted. 8. The information processing apparatus according to claim 4, wherein, even if the duration time is less than a threshold value, it is determined to perform a self-diagnosis at the start-up process. The operating environment measuring unit is
The operating environment is measured at regular intervals.
The self-diagnosis determination unit
Each time the operating environment is measured by the operating environment measuring unit, it is determined whether the measured value is an abnormal value,
The information processing apparatus further includes:
A number counting unit that continuously counts the number of times the measured value is determined to be an abnormal value by the self-diagnosis determination unit as the abnormal value continuous number of times,
The self-diagnosis determination unit
In the start-up process, when the number of consecutive abnormal values counted by the number-of-times counting unit since the previous self-diagnosis execution is equal to or greater than a threshold value, the self-diagnosis is determined to be performed during the start-up process. The information processing apparatus according to any one of claims 4 to 8. The operating environment measuring unit is
The operating environment is measured at regular intervals.
The self-diagnosis determination unit
Each time the operating environment is measured by the operating environment measuring unit, it is determined whether the measured value is an abnormal value,
The information processing apparatus further includes:
Having a timekeeping unit that keeps the time when the measured value is determined to be an abnormal value by the self-diagnosis determining unit as the abnormal value duration time continuously,
The self-diagnosis determination unit
In the start-up process, when the abnormal value continuation time counted by the time measuring unit after the previous self-diagnosis execution is equal to or more than a threshold, it is determined to perform the self-diagnosis in the start-up process The information processing apparatus according to claim 4. The operating environment measuring unit is
The information processing apparatus according to claim 4, wherein temperature is measured as an operating environment during the startup process. The operating environment measuring unit is
The information processing apparatus according to any one of claims 4 to 11, wherein humidity is measured as an operating environment during start-up processing. The operating environment measuring unit is
The information processing apparatus according to claim 4, wherein a vibration amount of the information processing apparatus is measured as an operating environment during the startup process. The information processing apparatus further includes:
Having an input unit for inputting a self-diagnosis omission instruction to instruct omission of self-diagnosis from a user of the information processing apparatus;
The self-diagnosis determination unit
Even if it is determined that self-diagnosis is to be performed during start-up processing as a result of determination, if the input unit inputs the self-diagnosis omission instruction from the user, self-diagnosis is not performed during the start-up processing. The information processing apparatus according to claim 1, wherein the information processing apparatus is determined. The information processing apparatus includes:
The information processing apparatus according to claim 1, wherein the information processing apparatus is an embedded apparatus used in a harsh environment.

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