JP2010145319A5 - - Google Patents
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- JP2010145319A5 JP2010145319A5 JP2008325161A JP2008325161A JP2010145319A5 JP 2010145319 A5 JP2010145319 A5 JP 2010145319A5 JP 2008325161 A JP2008325161 A JP 2008325161A JP 2008325161 A JP2008325161 A JP 2008325161A JP 2010145319 A5 JP2010145319 A5 JP 2010145319A5
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008325161A JP5089568B2 (en) | 2008-12-22 | 2008-12-22 | Radioactive gas monitor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008325161A JP5089568B2 (en) | 2008-12-22 | 2008-12-22 | Radioactive gas monitor |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010145319A JP2010145319A (en) | 2010-07-01 |
JP2010145319A5 true JP2010145319A5 (en) | 2011-03-03 |
JP5089568B2 JP5089568B2 (en) | 2012-12-05 |
Family
ID=42565903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008325161A Active JP5089568B2 (en) | 2008-12-22 | 2008-12-22 | Radioactive gas monitor |
Country Status (1)
Country | Link |
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JP (1) | JP5089568B2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5421823B2 (en) * | 2010-03-03 | 2014-02-19 | 三菱電機株式会社 | Radioactive gas monitor |
JP5780997B2 (en) * | 2012-04-02 | 2015-09-16 | 三菱電機株式会社 | Radiation monitoring system and diagnostic method for calibration conditions thereof |
JP6448466B2 (en) | 2015-05-21 | 2019-01-09 | 三菱電機株式会社 | Radioactive gas monitoring device |
CN109298442B (en) * | 2016-10-26 | 2020-03-27 | 中国疾病预防控制中心辐射防护与核安全医学所 | Rapid measurement method of environmental sample |
KR102441660B1 (en) * | 2022-07-18 | 2022-09-15 | 대한민국 | Sample Container For Analysis Of Radioisotope and Conservation Method of Using It |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS568582A (en) * | 1979-07-02 | 1981-01-28 | Mitsubishi Electric Corp | Checking radiation source unit |
JP2000098038A (en) * | 1998-09-24 | 2000-04-07 | Mitsubishi Electric Corp | Radiation detector and radiation monitor |
JP4157389B2 (en) * | 2003-02-06 | 2008-10-01 | 三菱電機株式会社 | Radiation monitor |
JP4528547B2 (en) * | 2004-03-30 | 2010-08-18 | 株式会社東芝 | Degradation abnormality detector for semiconductor radiation detector |
JP2006029986A (en) * | 2004-07-16 | 2006-02-02 | Fuji Electric Systems Co Ltd | Radiation measuring device |
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2008
- 2008-12-22 JP JP2008325161A patent/JP5089568B2/en active Active