JP2010096673A - Logic signal-use multi-bit probe tip - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To obtain a logic signal-use multi-bit probe tip, capable of being readily inserted into and pulled out of a multi-pole pin connector, using a small number of parts. <P>SOLUTION: The logic signal-use multi-bit probe tip, configured such that lateral faces of its probe tip section are arranged so as to contact with each other, includes: a holder having projection parts which are arranged at a regular interval of Δp in the arrangement direction of the probe tip section, so as to be comb-teeth shape, and positioned on the lower surface of a holding section; and the probe tip section, having a logic signal-side socket positioned on the backside of its lower surface, a ground-side socket positioned on the front side of the lower surface and a cable positioned on its upper surface where a fitting section to be fit in a groove section formed in between the projection parts of the holder is disposed on the front side of the upper surface of the probe tip section. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  More specifically, the present invention relates to a multi-bit probe tip for logic signals in which side surfaces of probe tips are arranged in contact with each other, and more specifically, a multi-bit for logic signals that can be easily inserted into and removed from a multipolar pin connector with a small number of components. This relates to the probe tip.

  In a waveform measuring apparatus (for example, a digital oscilloscope, a logic analyzer, etc.), a probe for physically and electrically connecting to the object to be measured and transmitting an electric signal from the object to be measured to the waveform measuring apparatus main body is essential. (For example, refer to Patent Document 1).

  In addition, a portion of the probe that is physically and electrically connected to the measurement target is referred to as a probe head or a probe tip. Then, the electrical signal from the probe tip is transmitted to the waveform measuring device main body by a coaxial cable or the like.

  In particular, when the electrical signal to be measured is a binary logic signal, only one bit is rarely measured, many multi-bit measurements are performed, and many probe tips are provided (for example, Patent Documents) 2-3).

  In the case of a logic signal, measurement may be performed by connecting a probe to a multipolar pin connector provided on a substrate. In addition, since it is a binary logic signal (L or H), the number of signals and the number of leading ends may be represented by bits.

FIG. 11 is a perspective view showing a configuration of a tip portion of a conventional logic signal probe (hereinafter abbreviated as “probe tip portion” or “tip portion”).
In FIG. 11, a signal side socket (female side receptacle) 1 a and a ground side socket (female side receptacle) 1 b are provided on the bottom surface of the distal end portion 1. A coaxial cable connection cable 2 for transmitting an electrical signal to the waveform measuring device is provided on the top surface of the tip 1.

  FIG. 12 is a diagram showing the configuration of a conventional probe tip 1 for logic signals and a substrate connected to the tip 1.

  In FIG. 12, a multipolar pin connector (male side pin) 4 is provided on a substrate 3. 16 pins × 2 rows are arranged on the upper surface portion of the multipolar pin connector 4 (so-called pin header). One column is a pin 4 a connected to the signal line side of the logic circuit on the substrate 3, and the other column is a pin 4 b connected to the ground on the substrate 3.

  Then, the signal side socket 1a of the tip 1 and the signal line side pin 4a are combined, and the GND side socket 1b and the GND side pin 4b are combined to connect one bit at a time. At this time, the width of the tip portion 1 in the arrangement direction is the same as the pitch of the pins 4a and 4b, and can be continuously inserted in the arrangement direction.

FIG. 13 is a diagram showing another configuration of a conventional probe tip 1 for logic signals and a substrate connected to the tip 1.
In FIG. 13, all the pins 4a and 4b are connected to the signal line side of the logic circuit. The GND pin 5 is provided at a different position on the substrate 3 from the multipolar pin connector 4 and is connected to the ground of the substrate 3.

  The probe ground contact portion 6 is provided on the cable 2 and bundles the cables 2 from the tip portions 1 of the multi-bits, and also bundles the cable 7 dedicated to the ground. The cable 7 dedicated to the ground is connected to the GND pin 5.

  Then, the signal side socket 1a of the tip end portion 1 and the pin 4b of the other row on the signal line side are matched, and the tip end portion 1 is connected bit by bit. Note that nothing is connected to the GND side socket 1b. Then, the ground dedicated cable 7 and the GND pin 5 are connected. As shown in FIGS. 11 and 13, the pins 4 a in one row cannot physically connect the other tip 1.

JP-A-01-105173 JP 2003-227850 A JP 2007-121284 A

  In this manner, the probe tip 1 is inserted into the multipolar pin connector 4 bit by bit and physically and electrically connected.

  However, since the tip portions 1 for a plurality of bits cannot be inserted into and removed from the multipolar pin connector 4 in a lump, the work for starting the measurement is complicated, and it takes time to start the measurement. .

  On the other hand, as shown in Patent Documents 2 and 3, there are some that fix a predetermined number of tip portions, but there is a problem that the number of the tip portions is fixed and the number of parts is large, resulting in an increase in size.

  SUMMARY OF THE INVENTION An object of the present invention is to realize a multi-bit probe tip for a logic signal that can be easily inserted into and removed from a multipolar pin connector with a small number of components.

The invention described in claim 1
A multi-bit probe tip for logic signals arranged such that side surfaces of the probe tip are in contact with each other,
A holder in which protrusions are arranged in a comb tooth shape on the lower surface of the gripping part at equal intervals of Δp in the arrangement direction of the probe tip;
It has a logic signal side socket on the rear side of the lower surface, a ground side socket on the front side of the lower surface, and a probe tip portion on which the cable is provided on the upper surface,
The front end of the upper surface of the probe tip is provided with a fitting portion that fits into the groove between the protrusions of the holder.
The invention according to claim 2 is the invention according to claim 1,
Of the protrusions of the holder, the width in the arrangement direction of the protrusions at both ends is half the width in the arrangement direction of the protrusions other than both ends.
The invention according to claim 3 is the invention according to claim 1 or 2,
The front and rear surfaces of the holding part of the holder are characterized in that grooves are provided horizontally from one side surface to the other side surface along the arrangement direction of the probe tip portions.
The invention according to claim 4 is the invention according to any one of claims 1 to 3,
The rear surface of the probe tip is perpendicular to the upper and lower surfaces of the probe tip, and the distance from the center of the logic signal socket to the rear surface of the probe tip is Δp / 2 at the longest. Is.
The invention according to claim 5 is the invention according to any one of claims 1 to 4,
The probe tip portion has a convex portion on one side surface and a concave portion in which the convex portion on one side surface of the probe tip portion arranged next to the other side surface fits.
The invention according to claim 6 is the invention according to any one of claims 1 to 5,
A spacer having a fitting portion that fits into a groove between the protrusions of the holder is provided on the front side of the upper surface.
The invention according to claim 7 is the invention according to claim 6,
The spacer has a convex part on one side and a concave part on the other side, and the convex part and the concave part have the same shape as the convex part and concave part of the probe tip. It is.

The present invention has the following effects.
A comb-like protrusion is provided on the holding part of the holder. And the groove part formed by the projection part of a holder is fitted by the front fitting part of the upper surface of a front-end | tip part, and fixes the front-end | tip part of a several bit collectively. As a result, the multi-bit probe tip can be easily inserted into and removed from the multipolar pin connector with a small number of components.

Embodiments of the present invention will be described below with reference to the drawings.
1 to 4 are configuration diagrams showing an embodiment of the present invention. Here, the same components as those in FIGS. 11 and 12 are denoted by the same reference numerals, and description thereof is omitted.
FIG. 1 is a configuration diagram (perspective view) of the probe tip 10. FIG. 2 is an enlarged view of the lower portion of the probe tip 10. FIG. 3 is a configuration diagram (perspective view) of the holder 20 for holding the probe tip 10 for a plurality of bits. FIG. 4 is a configuration diagram (perspective view) of the multi-bit probe tip portion 100 in which the probe tip portion 10 and the holder 20 are fitted together.

  1A is a perspective view from the upper side of the probe tip 10 on the right side, and FIG. 1B is a perspective view from the lower side of the probe tip 10 on the left side. FIG.

  The probe tip 10 is a substantially hexahedron, has a mold part in which an RC circuit such as a resistor and a capacitor is incorporated, a signal side socket 11 for logic signals on the rear side of the lower surface, and a ground GND on the front side of the lower surface. The connection cable 2 is provided on the side socket 12 and the upper surface. The connection cable 2 is a coaxial cable that transmits an electrical signal from the distal end portion 10 to the waveform measuring device main body, and has the same function as that shown in FIG.

  The probe tip 10 has a concave portion 13 on the right side surface and a convex portion 14 on the left side surface, and there is no protruding portion other than the convex portion 14 on both side surfaces. The concave portion 13 is fitted to the convex portion 14 and is used for alignment and temporary fixing in the vertical direction and the front-rear direction when a plurality of tip portions 10 are arranged in the left-right direction (arrangement direction).

  The rear surface of the probe tip 10 has no protruding portion and is formed perpendicular to the upper surface and the lower surface. That is, the rear surface and the rear surface of the tip portion 10 are in surface contact.

  A fitting portion 15 is provided on the front side of the upper surface of the probe tip 10 (the upper surface portion located between the position where the cable 2 on the upper surface of the probe tip 10 is connected and the front surface of the probe tip 10). This is the part that mates with the holder 20 shown in FIG.

The dimensions of the probe tip 10 will be described (see FIG. 2).
The multipolar pin connectors 4 are usually arranged in the left-right direction and the front-rear direction at an interval Δp (= 2.54 [mm]) defined by the standard. In order to connect to such a connector 4, the distance between the center of the signal side socket 11 and the center of the GND side socket 12 is Δp, and the distance from the center of the signal side socket 11 to the rear surface of the tip portion 10 is Δp / 2. It is. The distance between the left and right side surfaces of the tip portion 10 is also Δp.

  In FIG. 3, the holder 20 has a grip portion 21, a protrusion portion 22, a removal groove portion 23, and a groove portion 24 formed by the protrusion portion 22, and is for holding a plurality of bits of the tip portion 10.

  The gripping portion 21 is a substantially rectangular parallelepiped, and on the lower surface of the gripping portion 21, substantially rectangular parallelepiped protrusions 22 are arranged in comb teeth at equal intervals of Δp in the arrangement direction of the tip end portions 10. Further, the fitting portion 15 of the tip portion 10 is fitted into the groove portion 24 formed between the protruding portions 22.

  The distance in the arrangement direction between the protrusion 22 and the adjacent protrusion 22 is Δp (= 2.54 [mm]). Among the plurality of protrusions 22 arranged, the arrangement of protrusions other than both ends is arranged. If the width in the direction is Δq, only the protrusions at both ends in the arrangement direction have a width in the arrangement direction of Δq / 2.

  The removal groove portion 23 is provided on the front surface and the rear surface of the grip portion 21, and is provided along the arrangement direction of the distal end portion 10 from one side surface to the other side surface.

  As apparent from FIG. 3, the holder 20 is an object in the front-rear direction and the left-right direction, and the holder 20 can fix the tip portion 10 in the same way in either the front-rear direction or the left-right direction.

The operation of such an apparatus will be described.
The right side surface and the left side surface of the adjacent front end portions 10 are aligned. At this time, of the adjacent front end portions 10, the front end portion 10 located to the right of the reference front end portion 10 is the reference front end portion 10. The convex portion 14 on the left side surface of the right end portion 10 is aligned with the concave portion 13 on the right side surface.

  In addition, the tip portion 10 located to the left of the reference tip portion 10 aligns the concave portion 13 on the right side surface of the tip portion 10 adjacent to the left side with the convex portion 14 on the left side surface of the reference tip portion 10.

  Thereafter, the fitting portions 15 of the plurality of tip portions 10 temporarily fixed by the concave portions 13 and the convex portions 14 are fitted from the tips of the projection portions 21 of the holder 20, and the fitting portions 15 are provided up to the groove portions 24 between the projection portions 21. Fit and fix.

  Here, FIG. 4 is a view showing a configuration of a multi-bit probe tip portion 100 in which a plurality of bit tip portions 10 and a holder 20 are fitted together, and FIG. 5 is a cross section of the multi-bit probe tip portion 100. . FIG. 5A is a cross-sectional view in a state where the holder 20 is present, and FIG. 5B is a cross-sectional view in a state where the holder 20 is not present (a state in which the concave portion 13 and the convex portion 14 are temporarily fixed).

  As shown in FIG. 5A, since the width of the protrusions 22 at both ends of the protrusions 22 of the holder 20 is Δq / 2, the holder 20 is fitted to the tip part 10 in a state where the holder 20 is fitted with the tip part 10. It does not protrude from the 10 side.

  When detaching the tip portion 10 and the holder 20, the grip portion 21 of the holder 20 is held and the tip portion 10 is pulled upward. Or you may insert a flathead screwdriver, a ruler, etc. in the removal groove part 23 formed in the holding part 21 of the holder 20, and may pull out the holder 20 upwards.

  Next, the operation of inserting / removing the multi-bit probe tip 100 shown in FIG. 4 into / from the multipolar pin connector (8 × 2 rows) 4 ′ will be described with reference to FIG. 6.

  A multipolar pin connector 4 ′ is mounted on the substrate 3. On the upper surface portion of the multipolar pin connector 4 ', 8 pins are arranged in 2 rows. One column is a pin 4 a ′ connected to the signal line side of the logic circuit on the substrate 3, and the other column is a pin 4 b ′ connected to the ground on the substrate 3.

  The user holds both side surfaces (or front and rear surfaces) of the front end portion 10 of the 8-bit multi-bit probe 100, aligns the signal side socket 11 of the front end portion 10 with the pin 4a 'on the signal line side, and connects the GND side socket 12 And the pin 4b ′ on the GND side are combined and connected to the connector 4 ′ from the lower surface side of the tip portion 10 in a batch of 8 bits. Alternatively, the sockets 11 and 12 may be lightly inserted into the pins 4 a ′ and 4 b ′, and then the upper surface of the grip portion 21 of the holder 20 may be pushed and inserted into the connector 4 to the end.

  When pulling out, hold the both side surfaces of the tip portion 10 of the multi-bit probe 100 and pull out 8 bits at a time on the upper surface side of the tip portion 10.

  In this way, the comb-like protrusion 22 is provided on the grip 21 of the holder 20. And the groove part 24 formed of the projection part 22 of the holder 20 is fitted with the fitting part 15 of the upper surface front side of the front-end | tip part 10, and fixes the front-end | tip part 10 of several bits collectively. As a result, the multi-bit probe tip can be easily inserted into and removed from the multipolar pin connector with a small number of components.

  Next, the operation of inserting the multi-bit probe tip 100 shown in FIG. 4 into the multipolar pin connector (16 × 2 rows) 4 will be described with reference to FIG.

  A multipolar pin connector 4 is mounted on the substrate 3. 16 pins × 2 rows are arranged on the upper surface portion of the multipolar pin connector 4. One column is a pin 4 a connected to the signal line side of the logic circuit on the substrate 3, and the other column is a pin 4 b connected to the ground on the substrate 3.

  The user holds both side surfaces (or front and rear surfaces) of the tip portion 10 of the first multi-bit probe 100, aligns the tip portion 10 with one side surface of the connector 4, and sets the signal side socket 11 of the tip portion 10. And the signal line side pin 4a, the GND side socket 12 and the GND side pin 4b are combined, and the 8-bit batch connection is made to the connector 4 from the lower surface side of the distal end portion 10. Of course, the holder 20 may be pushed and inserted.

  Further, holding the front surface and the rear surface of the distal end portion 10 of the second multi-bit probe 100, the distal end portion 10 is aligned with the other side surface of the connector 4, and the signal side socket 11 of the distal end portion 10 is connected to the signal line side. The pins 4a are aligned, the GND side socket 12 and the GND side pins 4b are aligned, and the 8-bit batch connection is made to the connector 4 from the lower surface side of the tip portion 10. Of course, the holder 20 may be pushed and inserted.

  As described above, the holder 20 of the multi-bit probe tip portion 100 does not protrude from the right side surface and the left side surface of the tip portion 10. As a result, even if the multi-bit probe tip portion 100 in which a plurality of bits are bundled side by side in the left-right direction (arrangement direction of the tip portion 10), the pins 4a that cannot be physically connected in the arrangement direction of the pins 4a, 4b of the connector 4 4b does not exist, and the measurement can be performed for the multipolar pin 4 having the number of pins of the multi-bit probe tip 100 (for 8 bits) or more.

Next, another operation for inserting the multi-bit probe tip portion 100 shown in FIG. 4 into the multipolar pin connector (16 × 2 rows) 4 will be described with reference to FIG.
In FIG. 8, all the pins 4a and 4b are connected to the signal line side of the logic circuit.

  The user holds both side surfaces (or front and rear surfaces) of the tip portion 10 of the first multi-bit probe 100, aligns the signal side socket 11 of the tip portion 10 with the pin 4a of one row on the signal line side, and the tip. 8 bits are collectively connected to the connector 4 from the lower surface side of the portion 10. Of course, the holder 20 may be pushed and inserted.

  Further, holding both side surfaces of the distal end portion 10 of the second multi-bit probe 100, the signal side socket 11 of the distal end portion 10 and the pin 4 b of the other row on the signal line side are aligned, and the lower surface side of the distal end portion 10 8 bits to connector 4 at a time. Of course, the holder 20 may be pushed and inserted.

  As described above, the distance from the signal side socket 11 of the distal end portion 10 constituting the multi-bit probe distal end portion 100 to the rear surface of the distal end portion 10 is Δp, and there is no protruding portion on the rear surface of the distal end portion 10. As a result, the multi-bit probe distal end portion 100 in which a plurality of bits are bundled in the connector 4 in which both pins 4a and 4b of the connector 4 are connected to the signal line side of the logic circuit can be moved in the front-rear direction (the distal end portion 10). There is no pin 4a that cannot be physically connected as shown in FIG. 13, and the signal side socket 11 can be connected to the pins 4a and 4b of both rows.

Next, FIG. 9 is a modification of the multi-bit probe tip 100.
In the waveform measuring apparatus main body, the number of bits to which a probe can be connected is limited, and the pins 4a and 4b to be measured may not be continuous in the arrangement direction. In such a case, it is conceivable that the unnecessary tip portion 10 is not fitted to the holder 20, but a gap may be formed between the tip portion 10 and the tip portion 10, and the strength may be insufficient.

  FIG. 9 is a configuration diagram (perspective view) of the spacer 30 for a portion corresponding to the pins 4a and 4b that do not require measurement. FIG. 9A is a perspective view from the upper side of the right side surface of the spacer 30, and FIG. 9B is a perspective view from the lower side of the left side surface of the spacer 30.

  In FIG. 9, the spacer 30 has the same width in the left-right direction and the depth in the front-rear direction with respect to the tip portion 10, but the sockets 11, 12 do not exist on the lower surface of the spacer 30, and the connection cable 20 also exists on the upper surface. not exist.

  On the other hand, the concave portion 31 on the right side surface of the spacer 30 fits with the convex portion 14 on the left side surface of the tip portion 10. The convex portion 32 on the left side surface of the spacer 30 fits into the concave portion 13 on the right side surface of the tip portion 10. The fitting part 33 on the front side of the upper surface of the spacer 30 has the same shape as the fitting part 15 of the tip part 10, and the groove part 24 formed by the protrusion part 21 and the protrusion part 21 of the holder 20 is fitted.

  Here, FIG. 10 is a diagram showing a configuration of the multi-bit probe tip portion 100 using the spacer 30. In addition, since there is no socket on the lower surface of the spacer 30, the spacer 30 does not physically contact (do not interfere with) the pins 4a and 4b.

  Thus, by using the spacers 30 at the positions of the pins 4a and 4b that do not require connection, only the tip 10 that is really necessary for measurement can be fitted into the holder 20, and the waveform measuring device can be used effectively. .

  In addition, the strength of the multi-bit probe tip 100 can be maintained by using the spacer 30.

  Then, the holding portion 21 of the holder 20 is provided with a comb-like protruding portion 22, and the groove portion 24 formed by the protruding portion 22 of the holder 20 includes the front end portion 10, the front fitting portion 15 on the upper surface of the spacer 30, 33, and a plurality of bits 10 and the spacer 30 are fixed together. As a result, the multi-bit probe tip can be easily inserted into and removed from the multipolar pin connector with a small number of components.

The present invention is not limited to this, and may be as shown below.
(1) Although the structure of the holder 20 that fixes the 8-bit tip portion 10 at a time is shown, the holder 20 may fix the tip portion 10 for any number of bits at a time as long as it is 2 bits or more. .

(2) The pitch of the protrusions 21 of the holder 20 is Δp = 2.54 [mm], and the distance between each part of the tip 10 is also Δp = 2.54 [mm], but the interval Δp may be any value. In short, what is necessary is just to match the pitch of the pins of the connectors 4 and 4 ′.

(3) A connector configured to connect one of the pins 4a and 4b to the GND side, that is, a configuration targeting a single-ended electrical signal is shown, but a differential signal may be targeted.

(4) FIG. 2 shows a configuration in which the width in the left-right direction of the tip 10 and the width in the left-right and front-rear directions of the sockets 11 and 12 are Δp. In consideration of expansion due to temperature and the like, in practice, it may be slightly shorter than the distance Δp (for example, a distance shorter by 0.04 to 0.1 [mm] than the distance Δp). Similarly, the distance Δp / 2 from the center of the signal side socket 11 to the rear surface of the tip portion 10 may be slightly shortened as well.

(5) In FIG. 3, the arrangement direction width of the projections other than both ends of the plurality of projections 22 arranged in the arrangement direction is Δq, and only the projections at both ends in the arrangement direction have the arrangement direction width Δq / 2. However, considering the manufacturing error and the expansion due to temperature as described above, the width of the protrusions at both ends is slightly shorter than Δq / 2 so that the holder 20 does not protrude from the side surface of the tip 10. May be.

It is the block diagram which showed the front-end | tip part of one Example of this invention. It is the figure which expanded a part of front-end | tip part of one Example of this invention. It is the block diagram which showed the holder of one Example of this invention. It is the block diagram which showed one Example (multi-bit probe front-end | tip part) of this invention. It is sectional drawing of the multi-bit probe front-end | tip part shown in FIG. It is a block diagram before and behind insertion to the connector of the multi-bit probe front-end | tip part shown in FIG. FIG. 5 is another configuration diagram before and after insertion of the tip portion of the multi-bit probe shown in FIG. 4 into the connector. FIG. 5 is another configuration diagram before and after insertion of the tip portion of the multi-bit probe shown in FIG. 4 into the connector. It is the block diagram which showed the spacer of one Example of this invention. It is a block diagram of the insertion state to the connector of the multi-bit probe front-end | tip part using the spacer shown in FIG. It is the figure which showed the structure of the conventional front-end | tip part. It is a block diagram before and behind insertion to the connector of the conventional front-end | tip part shown in FIG. It is the other block diagram before and behind insertion to the connector of the conventional front-end | tip part shown in FIG.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Tip part 11 Signal side socket 12 Ground side socket 13 Concave part 14 Convex part 15 Fitting part 20 Holder 21 Holding part 22 Protrusion part 23 Removal groove part 24 Groove part 30 Spacer 31 Concave part 32 Convex part 33 Fitting part

Claims (7)

A multi-bit probe tip for logic signals arranged such that side surfaces of the probe tip are in contact with each other,
A holder in which protrusions are arranged in a comb tooth shape on the lower surface of the gripping part at equal intervals of Δp in the arrangement direction of the probe tip;
It has a logic signal side socket on the rear side of the lower surface, a ground side socket on the front side of the lower surface, and a probe tip portion on which the cable is provided on the upper surface,
A multi-bit probe tip portion for a logic signal, wherein a fitting portion that fits into a groove portion between projections of the holder is provided on the front side of the upper surface of the probe tip portion.   2. The multi-bit probe for logic signals according to claim 1, wherein, of the protrusions of the holder, the width in the arrangement direction of the protrusions at both ends is half of the width in the arrangement direction of the protrusions other than both ends. Tip.   3. The logic signal use circuit according to claim 1, wherein the front and rear surfaces of the holding part of the holder are provided with a groove portion horizontally along the arrangement direction of the probe tip from one side surface to the other side surface. Multi-bit probe tip.   The rear surface of the probe tip is perpendicular to the upper and lower surfaces of the probe tip, and the distance from the center of the logic signal socket to the rear surface of the probe tip is Δp / 2 at the longest. A multi-bit probe tip for a logic signal according to claim 1.   The probe tip portion has a convex portion on one side surface and a concave portion in which the convex portion on one side surface of the probe tip portion arranged next to the other side surface fits. A multi-bit probe tip for a logic signal according to any one of the above.   6. A multi-bit probe tip for a logic signal according to claim 1, wherein a spacer having a fitting portion that fits into a groove between the protrusions of the holder is provided on the front side of the upper surface.   The spacer has a convex part on one side and a concave part on the other side, and the convex part and the concave part have the same shape as the convex part and concave part of the probe tip. Item 7. The multi-bit probe tip for logic signals according to item 6.

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