JP2010047726A - Epoxy resin composition, cured product thereof, prepreg, copper-clad laminate, and resin composition for build-up adhesive film - Google Patents
Epoxy resin composition, cured product thereof, prepreg, copper-clad laminate, and resin composition for build-up adhesive film Download PDFInfo
- Publication number
- JP2010047726A JP2010047726A JP2008215209A JP2008215209A JP2010047726A JP 2010047726 A JP2010047726 A JP 2010047726A JP 2008215209 A JP2008215209 A JP 2008215209A JP 2008215209 A JP2008215209 A JP 2008215209A JP 2010047726 A JP2010047726 A JP 2010047726A
- Authority
- JP
- Japan
- Prior art keywords
- epoxy resin
- resin composition
- resin
- composition according
- copper
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000003822 epoxy resin Substances 0.000 title claims abstract description 126
- 229920000647 polyepoxide Polymers 0.000 title claims abstract description 126
- 239000000203 mixture Substances 0.000 title claims abstract description 71
- 239000002313 adhesive film Substances 0.000 title claims abstract description 28
- 239000011342 resin composition Substances 0.000 title claims description 25
- 239000003795 chemical substances by application Substances 0.000 claims abstract description 50
- 229920003986 novolac Polymers 0.000 claims abstract description 44
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 36
- 239000005011 phenolic resin Substances 0.000 claims abstract description 36
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims abstract description 35
- 239000011889 copper foil Substances 0.000 claims abstract description 22
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 20
- 125000003118 aryl group Chemical group 0.000 claims abstract description 13
- -1 ester compound Chemical class 0.000 claims description 29
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 29
- 239000000463 material Substances 0.000 claims description 22
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical class [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 claims description 14
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 11
- 238000010030 laminating Methods 0.000 claims description 10
- PASDCCFISLVPSO-UHFFFAOYSA-N benzoyl chloride Chemical compound ClC(=O)C1=CC=CC=C1 PASDCCFISLVPSO-UHFFFAOYSA-N 0.000 claims description 9
- 125000004432 carbon atom Chemical group C* 0.000 claims description 9
- 125000001997 phenyl group Chemical class [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 9
- 229910052698 phosphorus Inorganic materials 0.000 claims description 9
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 claims description 8
- 239000002253 acid Substances 0.000 claims description 8
- 229930003836 cresol Natural products 0.000 claims description 8
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 7
- 125000004437 phosphorous atom Chemical group 0.000 claims description 7
- 239000000835 fiber Substances 0.000 claims description 5
- 229920001568 phenolic resin Polymers 0.000 claims description 5
- 125000001624 naphthyl group Chemical group 0.000 claims description 3
- 125000001118 alkylidene group Chemical group 0.000 claims description 2
- 229910052799 carbon Inorganic materials 0.000 claims description 2
- 150000002989 phenols Chemical class 0.000 abstract description 12
- 230000003578 releasing effect Effects 0.000 abstract 1
- 229920005989 resin Polymers 0.000 description 47
- 239000011347 resin Substances 0.000 description 47
- 238000001723 curing Methods 0.000 description 46
- 238000000034 method Methods 0.000 description 39
- 239000010410 layer Substances 0.000 description 21
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 18
- 239000011229 interlayer Substances 0.000 description 17
- 239000000047 product Substances 0.000 description 17
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 14
- 239000004065 semiconductor Substances 0.000 description 14
- 229910052802 copper Inorganic materials 0.000 description 13
- 239000010949 copper Substances 0.000 description 13
- 239000011810 insulating material Substances 0.000 description 13
- 239000003960 organic solvent Substances 0.000 description 13
- 239000000758 substrate Substances 0.000 description 13
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 12
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 11
- WSFSSNUMVMOOMR-UHFFFAOYSA-N formaldehyde Natural products O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 11
- 238000005259 measurement Methods 0.000 description 11
- 239000000243 solution Substances 0.000 description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 10
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 10
- 239000002585 base Substances 0.000 description 10
- 230000032050 esterification Effects 0.000 description 10
- 238000005886 esterification reaction Methods 0.000 description 10
- 238000010438 heat treatment Methods 0.000 description 9
- 238000004519 manufacturing process Methods 0.000 description 9
- 238000002156 mixing Methods 0.000 description 9
- 229910052757 nitrogen Inorganic materials 0.000 description 8
- 239000002966 varnish Substances 0.000 description 8
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 7
- 239000004305 biphenyl Substances 0.000 description 7
- 235000010290 biphenyl Nutrition 0.000 description 7
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 7
- 150000001875 compounds Chemical class 0.000 description 7
- 238000003786 synthesis reaction Methods 0.000 description 7
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 description 6
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 6
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 6
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 239000008393 encapsulating agent Substances 0.000 description 6
- 239000002783 friction material Substances 0.000 description 6
- 239000011256 inorganic filler Substances 0.000 description 6
- 229910003475 inorganic filler Inorganic materials 0.000 description 6
- 230000001681 protective effect Effects 0.000 description 6
- 239000002994 raw material Substances 0.000 description 6
- 239000002904 solvent Substances 0.000 description 6
- 239000000853 adhesive Substances 0.000 description 5
- 230000001070 adhesive effect Effects 0.000 description 5
- 239000003513 alkali Substances 0.000 description 5
- 239000011230 binding agent Substances 0.000 description 5
- 239000003054 catalyst Substances 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 4
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical compound C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 4
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 4
- 239000004793 Polystyrene Substances 0.000 description 4
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 4
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 4
- 239000007864 aqueous solution Substances 0.000 description 4
- 239000007795 chemical reaction product Substances 0.000 description 4
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 4
- 230000018044 dehydration Effects 0.000 description 4
- 238000006297 dehydration reaction Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 125000003700 epoxy group Chemical group 0.000 description 4
- 239000004744 fabric Substances 0.000 description 4
- 239000000945 filler Substances 0.000 description 4
- 239000003063 flame retardant Substances 0.000 description 4
- 239000005350 fused silica glass Substances 0.000 description 4
- 229910052739 hydrogen Inorganic materials 0.000 description 4
- 239000001257 hydrogen Substances 0.000 description 4
- 238000000465 moulding Methods 0.000 description 4
- 229920002223 polystyrene Polymers 0.000 description 4
- 239000000565 sealant Substances 0.000 description 4
- 229920001187 thermosetting polymer Polymers 0.000 description 4
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- 239000000654 additive Substances 0.000 description 3
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 3
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 150000002148 esters Chemical class 0.000 description 3
- 238000011049 filling Methods 0.000 description 3
- 239000011888 foil Substances 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 150000002460 imidazoles Chemical class 0.000 description 3
- 238000005470 impregnation Methods 0.000 description 3
- 239000012796 inorganic flame retardant Chemical class 0.000 description 3
- 238000003475 lamination Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 150000003512 tertiary amines Chemical class 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- RXYPXQSKLGGKOL-UHFFFAOYSA-N 1,4-dimethylpiperazine Chemical compound CN1CCN(C)CC1 RXYPXQSKLGGKOL-UHFFFAOYSA-N 0.000 description 2
- PAMIQIKDUOTOBW-UHFFFAOYSA-N 1-methylpiperidine Chemical compound CN1CCCCC1 PAMIQIKDUOTOBW-UHFFFAOYSA-N 0.000 description 2
- LLPKQRMDOFYSGZ-UHFFFAOYSA-N 2,5-dimethyl-1h-imidazole Chemical compound CC1=CN=C(C)N1 LLPKQRMDOFYSGZ-UHFFFAOYSA-N 0.000 description 2
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 2
- OGRULRAOMCDCBO-UHFFFAOYSA-N 2-[[1-(oxiran-2-ylmethoxy)naphthalen-2-yl]oxymethyl]oxirane Chemical compound C1OC1COC1=CC=C2C=CC=CC2=C1OCC1CO1 OGRULRAOMCDCBO-UHFFFAOYSA-N 0.000 description 2
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 2
- XLLIQLLCWZCATF-UHFFFAOYSA-N 2-methoxyethyl acetate Chemical compound COCCOC(C)=O XLLIQLLCWZCATF-UHFFFAOYSA-N 0.000 description 2
- GSKNLOOGBYYDHV-UHFFFAOYSA-N 2-methylphenol;naphthalen-1-ol Chemical compound CC1=CC=CC=C1O.C1=CC=C2C(O)=CC=CC2=C1 GSKNLOOGBYYDHV-UHFFFAOYSA-N 0.000 description 2
- 239000005711 Benzoic acid Substances 0.000 description 2
- CPELXLSAUQHCOX-UHFFFAOYSA-M Bromide Chemical compound [Br-] CPELXLSAUQHCOX-UHFFFAOYSA-M 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- 229920000877 Melamine resin Polymers 0.000 description 2
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- JLTDJTHDQAWBAV-UHFFFAOYSA-N N,N-dimethylaniline Chemical compound CN(C)C1=CC=CC=C1 JLTDJTHDQAWBAV-UHFFFAOYSA-N 0.000 description 2
- SMWDFEZZVXVKRB-UHFFFAOYSA-N Quinoline Chemical compound N1=CC=CC2=CC=CC=C21 SMWDFEZZVXVKRB-UHFFFAOYSA-N 0.000 description 2
- XFSBVAOIAHNAPC-WSORPINJSA-N acetylbenzoylaconine Chemical compound O([C@H]1[C@]2(O)C[C@H]3C45[C@@H]6[C@@H]([C@@]([C@H]31)(OC(C)=O)[C@@H](O)[C@@H]2OC)[C@H](OC)C4[C@]([C@@H](C[C@H]5OC)O)(COC)CN6CC)C(=O)C1=CC=CC=C1 XFSBVAOIAHNAPC-WSORPINJSA-N 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- 125000005907 alkyl ester group Chemical group 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000004760 aramid Substances 0.000 description 2
- 229920003235 aromatic polyamide Polymers 0.000 description 2
- 150000007860 aryl ester derivatives Chemical class 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- 235000010233 benzoic acid Nutrition 0.000 description 2
- JWAZRIHNYRIHIV-UHFFFAOYSA-N beta-hydroxynaphthyl Natural products C1=CC=CC2=CC(O)=CC=C21 JWAZRIHNYRIHIV-UHFFFAOYSA-N 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 2
- 125000000524 functional group Chemical group 0.000 description 2
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- 239000010439 graphite Substances 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 150000002366 halogen compounds Chemical class 0.000 description 2
- VKYKSIONXSXAKP-UHFFFAOYSA-N hexamethylenetetramine Chemical compound C1N(C2)CN3CN1CN2C3 VKYKSIONXSXAKP-UHFFFAOYSA-N 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 239000012774 insulation material Substances 0.000 description 2
- VTHJTEIRLNZDEV-UHFFFAOYSA-L magnesium dihydroxide Chemical compound [OH-].[OH-].[Mg+2] VTHJTEIRLNZDEV-UHFFFAOYSA-L 0.000 description 2
- 239000000347 magnesium hydroxide Substances 0.000 description 2
- 229910001862 magnesium hydroxide Inorganic materials 0.000 description 2
- JDSHMPZPIAZGSV-UHFFFAOYSA-N melamine Chemical compound NC1=NC(N)=NC(N)=N1 JDSHMPZPIAZGSV-UHFFFAOYSA-N 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000003607 modifier Substances 0.000 description 2
- VSWALKINGSNVAR-UHFFFAOYSA-N naphthalen-1-ol;phenol Chemical compound OC1=CC=CC=C1.C1=CC=C2C(O)=CC=CC2=C1 VSWALKINGSNVAR-UHFFFAOYSA-N 0.000 description 2
- 125000004433 nitrogen atom Chemical group N* 0.000 description 2
- 239000004843 novolac epoxy resin Substances 0.000 description 2
- ZWLPBLYKEWSWPD-UHFFFAOYSA-N o-toluic acid Chemical compound CC1=CC=CC=C1C(O)=O ZWLPBLYKEWSWPD-UHFFFAOYSA-N 0.000 description 2
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- 150000003003 phosphines Chemical group 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 2
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- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
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- 239000000454 talc Substances 0.000 description 2
- 229910052623 talc Inorganic materials 0.000 description 2
- JRMUNVKIHCOMHV-UHFFFAOYSA-M tetrabutylammonium bromide Chemical compound [Br-].CCCC[N+](CCCC)(CCCC)CCCC JRMUNVKIHCOMHV-UHFFFAOYSA-M 0.000 description 2
- IMNIMPAHZVJRPE-UHFFFAOYSA-N triethylenediamine Chemical compound C1CN2CCN1CC2 IMNIMPAHZVJRPE-UHFFFAOYSA-N 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- YWWDBCBWQNCYNR-UHFFFAOYSA-N trimethylphosphine Chemical compound CP(C)C YWWDBCBWQNCYNR-UHFFFAOYSA-N 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- LTVUCOSIZFEASK-MPXCPUAZSA-N (3ar,4s,7r,7as)-3a-methyl-3a,4,7,7a-tetrahydro-4,7-methano-2-benzofuran-1,3-dione Chemical compound C([C@H]1C=C2)[C@H]2[C@H]2[C@]1(C)C(=O)OC2=O LTVUCOSIZFEASK-MPXCPUAZSA-N 0.000 description 1
- MUTGBJKUEZFXGO-OLQVQODUSA-N (3as,7ar)-3a,4,5,6,7,7a-hexahydro-2-benzofuran-1,3-dione Chemical compound C1CCC[C@@H]2C(=O)OC(=O)[C@@H]21 MUTGBJKUEZFXGO-OLQVQODUSA-N 0.000 description 1
- KMOUUZVZFBCRAM-OLQVQODUSA-N (3as,7ar)-3a,4,7,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C=CC[C@@H]2C(=O)OC(=O)[C@@H]21 KMOUUZVZFBCRAM-OLQVQODUSA-N 0.000 description 1
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- KCTAHLRCZMOTKM-UHFFFAOYSA-N tripropylphosphane Chemical compound CCCP(CCC)CCC KCTAHLRCZMOTKM-UHFFFAOYSA-N 0.000 description 1
- KOWVWXQNQNCRRS-UHFFFAOYSA-N tris(2,4-dimethylphenyl) phosphate Chemical compound CC1=CC(C)=CC=C1OP(=O)(OC=1C(=CC(C)=CC=1)C)OC1=CC=C(C)C=C1C KOWVWXQNQNCRRS-UHFFFAOYSA-N 0.000 description 1
- QLORRTLBSJTMSN-UHFFFAOYSA-N tris(2,6-dimethylphenyl) phosphate Chemical compound CC1=CC=CC(C)=C1OP(=O)(OC=1C(=CC=CC=1C)C)OC1=C(C)C=CC=C1C QLORRTLBSJTMSN-UHFFFAOYSA-N 0.000 description 1
- WTLBZVNBAKMVDP-UHFFFAOYSA-N tris(2-butoxyethyl) phosphate Chemical compound CCCCOCCOP(=O)(OCCOCCCC)OCCOCCCC WTLBZVNBAKMVDP-UHFFFAOYSA-N 0.000 description 1
- BIKXLKXABVUSMH-UHFFFAOYSA-N trizinc;diborate Chemical compound [Zn+2].[Zn+2].[Zn+2].[O-]B([O-])[O-].[O-]B([O-])[O-] BIKXLKXABVUSMH-UHFFFAOYSA-N 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
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Abstract
Description
本発明は、硬化物の耐熱性と、銅箔剥離性とを高度に兼備させた、特に銅張積層板絶縁材料に適したエポキシ樹脂組成物及びその硬化物に関する。 TECHNICAL FIELD The present invention relates to an epoxy resin composition that combines heat resistance of a cured product and copper foil peelability at a high level, and particularly suitable for a copper-clad laminate insulating material, and a cured product thereof.
エポキシ樹脂及びその硬化剤を必須成分とするエポキシ樹脂組成物は、その硬化物において優れた耐熱性と絶縁性を発現することから、半導体や銅張積層板などの電子部品用途において広く用いられている。 An epoxy resin composition containing an epoxy resin and a curing agent as an essential component exhibits excellent heat resistance and insulation in the cured product, and is therefore widely used in electronic component applications such as semiconductors and copper-clad laminates. Yes.
この電子部品用途のなかでも銅張積層板絶縁材料やビルドアップ用接着フィルムといった電子部品材料の技術分野では、近年、各種電子機器における信号の高速化、高周波数化が進んでいる。しかしながら、信号の高速化、高周波数化に伴って、十分に低い誘電率を維持しつつ低い誘電正接を得ることが困難となりつつある。
そこで、高速化、高周波数化された信号に対しても、十分に低い誘電率を維持しつつ十分に低い誘電正接を発現する硬化体を得ることが可能な熱硬化性樹脂組成物、樹脂シート及び積層体を提供が望まれている。これらの低誘電率・低誘電正接を実現可能な材料として、フェノールノボラック樹脂中のフェノール性水酸基をアリールエステル化して得られる活性エステル化合物をエポキシ樹脂用硬化剤として用いる技術が知られている(特許文献1参照)。
然し乍ら、電子部品における高周波化や小型化の傾向から銅張積層板絶縁材料やビルドアップ用接着フィルム用材料にも極めて高度な耐熱性が求められているところ、前記したフェノールノボラック樹脂中のフェノール性水酸基をアリールエステル化して得られる活性エステル化合物は、硬化物の耐熱性が十分でないものであった。一方、通常、ノボラック樹脂をエポキシ樹脂用硬化剤として使用する場合、該ノボラック樹脂の分子量を高めることにより耐熱性を向上させることができるものの、この場合には銅張積層板やビルドアップ用接着フィルムにおける銅箔との密着性に劣ったものとなり、実用に供することができなくなる為、耐熱性と密着性とは両立が困難なものであった。
Among these electronic component applications, in the technical field of electronic component materials such as copper-clad laminate insulating materials and build-up adhesive films, in recent years, the speed of signals and the frequency of various electronic devices have been increasing. However, with the increase in signal speed and frequency, it is becoming difficult to obtain a low dielectric loss tangent while maintaining a sufficiently low dielectric constant.
Therefore, a thermosetting resin composition and a resin sheet capable of obtaining a cured body that exhibits a sufficiently low dielectric loss tangent while maintaining a sufficiently low dielectric constant even with respect to high-speed and high-frequency signals It is desirable to provide a laminate. As a material capable of realizing these low dielectric constants and low dielectric loss tangents, a technique using an active ester compound obtained by aryl esterifying a phenolic hydroxyl group in a phenol novolac resin as a curing agent for an epoxy resin is known (patent) Reference 1).
However, due to the trend toward higher frequency and smaller size in electronic parts, copper-clad laminate insulating materials and build-up adhesive film materials are required to have extremely high heat resistance. The active ester compound obtained by aryl esterifying a hydroxyl group is one in which the heat resistance of the cured product is not sufficient. On the other hand, when a novolac resin is used as a curing agent for an epoxy resin, heat resistance can be improved by increasing the molecular weight of the novolak resin, but in this case, a copper-clad laminate or an adhesive film for build-up is used. Since the adhesiveness with the copper foil is inferior and cannot be practically used, it is difficult to achieve both heat resistance and adhesiveness.
従って、本発明が解決しようとする課題は、硬化物における耐熱性と銅箔剥離性とを高度に兼備したエポキシ樹脂組成物、その硬化物、プリプレグ、銅張積層板、及びビルドアップ接着フィルム用樹脂組成物を提供することにある。 Therefore, the problem to be solved by the present invention is an epoxy resin composition having a high degree of both heat resistance and copper foil peelability in a cured product, the cured product, a prepreg, a copper clad laminate, and a build-up adhesive film. The object is to provide a resin composition.
本発明者等は上記課題を解決すべく鋭意検討を重ねた結果、分子量の高いノボラック型フェノール樹脂のフェノール性水酸基の所定の数をアルキルエステル化又はアリールエステル化することにより、多層プリント基板の分野において優れた耐熱性と、銅箔剥離性とを高度に兼備した絶縁材料が得られることを見出し、本発明を完成するに至った。 As a result of intensive studies to solve the above-mentioned problems, the present inventors have conducted the field of multilayer printed circuit boards by alkylating or arylesterifying a predetermined number of phenolic hydroxyl groups of a novolak type phenolic resin having a high molecular weight. The inventors have found that an insulating material having a combination of excellent heat resistance and copper foil peelability can be obtained, and the present invention has been completed.
即ち、本発明は、エポキシ樹脂(A)及び硬化剤(B)を必須成分とするエポキシ樹脂組成物であって、前記硬化剤(B)が、ノボラック型フェノール樹脂の全フェノール性水酸基の40〜95%をアルキルエステル化又はアリールエステル化した分子構造を有し、かつ、その軟化点が100〜140℃の範囲にある変性フェノール樹脂であることを特徴とするエポキシ樹脂脂組成物に関する。
本発明は、更に、前記エポキシ樹脂組成物を硬化してなる硬化物に関する。
本発明は、更に、前記エポキシ樹脂組成物を繊維基材に含浸してなるプリプレグに関する。
本発明は、更に、プリプレグを成型してなる構造体に関する。
本発明は、更に、前記エポキシ樹脂組成物からなることを特徴とするビルドアップ接着フィルム用樹脂組成物に関する。
That is, this invention is an epoxy resin composition which has an epoxy resin (A) and a hardening | curing agent (B) as an essential component, Comprising: The said hardening | curing agent (B) is 40 ~ of all phenolic hydroxyl groups of a novolak-type phenol resin. The present invention relates to an epoxy resin fat composition having a molecular structure in which 95% is alkylesterified or arylesterified, and a modified phenol resin having a softening point in the range of 100 to 140 ° C.
The present invention further relates to a cured product obtained by curing the epoxy resin composition.
The present invention further relates to a prepreg obtained by impregnating a fiber base material with the epoxy resin composition.
The present invention further relates to a structure formed by molding a prepreg.
The present invention further relates to a resin composition for a build-up adhesive film, characterized by comprising the epoxy resin composition.
本発明によれば、硬化物における耐熱性と銅箔剥離性とを高度に兼備したエポキシ樹脂組成物、その硬化物、プリプレグ、銅張積層板、及びビルドアップ接着フィルム用樹脂組成物を提供できる。 ADVANTAGE OF THE INVENTION According to this invention, the epoxy resin composition which combined heat resistance and copper foil peelability in hardened | cured material highly, the hardened | cured material, a prepreg, a copper clad laminated board, and the resin composition for buildup adhesive films can be provided. .
本発明のエポキシ樹脂組成物で用いるエポキシ樹脂(A)としては、例えば、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂等のビスフェノール型エポキシ樹脂;ビフェニル型エポキシ樹脂、テトラメチルビフェニル型エポキシ樹脂等のビフェニル型エポキシ樹脂;フェノールノボラック型エポキシ樹脂、クレゾールノボラック型エポキシ樹脂、ビスフェノールAノボラック型エポキシ樹脂、フェノール類とフェノール性水酸基を有する芳香族アルデヒドとの縮合物のエポキシ化物、ビフェニルノボラック型エポキシ樹脂等のノボラック型エポキシ樹脂;トリフェニルメタン型エポキシ樹脂;テトラフェニルエタン型エポキシ樹脂;ジシクロペンタジエン−フェノール付加反応型エポキシ樹脂;フェノールアラルキル型エポキシ樹脂;ナフトールノボラック型エポキシ樹脂、
ナフトールアラルキル型エポキシ樹脂、ナフトール−フェノール共縮ノボラック型エポキシ樹脂、ナフトール−クレゾール共縮ノボラック型エポキシ樹脂、ジグリシジルオキシナフタレン、下記構造式
Examples of the epoxy resin (A) used in the epoxy resin composition of the present invention include bisphenol type epoxy resins such as bisphenol A type epoxy resins and bisphenol F type epoxy resins; biphenyl type epoxy resins and tetramethylbiphenyl type epoxy resins. Biphenyl type epoxy resin; phenol novolak type epoxy resin, cresol novolak type epoxy resin, bisphenol A novolak type epoxy resin, epoxidized product of condensate of phenol and aromatic aldehyde having phenolic hydroxyl group, biphenyl novolak type epoxy resin, etc. Novolac type epoxy resin; Triphenylmethane type epoxy resin; Tetraphenylethane type epoxy resin; Dicyclopentadiene-phenol addition reaction type epoxy resin; Phenol aralkyl type Epoxy resins; naphthol novolak type epoxy resin,
Naphthol aralkyl epoxy resin, naphthol-phenol co-condensed novolac epoxy resin, naphthol-cresol co-condensed novolac epoxy resin, diglycidyloxynaphthalene, structural formula
で表される4官能ナフタレン型エポキシ樹脂等の分子構造中にナフタレン骨格を有するエポキシ樹脂;リン原子含有エポキシ樹脂等が挙げられる。また、これらのエポキシ樹脂は単独で用いてもよく、2種以上を混合してもよい。
ここで、リン原子含有エポキシ樹脂としては、9,10−ジヒドロ−9−オキサ−10−ホスファフェナントレン−10−オキサイド(以下、「HCA」と略記する。)のエポキシ化物、HCAとキノン類とを反応させて得られるフェノール樹脂のエポキシ化物、フェノールノボラック型エポキシ樹脂をHCAで変性したエポキシ樹脂、クレゾールノボラック型エポキシ樹脂をHCAで変性したエポキシ樹脂、また、ビスフェノールA型エポキシ樹脂を、HCAとキノン類とを反応させて得られるフェノール樹脂で変成して得られるエポキシ樹脂、及びビスフェニールA型エポキシ樹脂を、HCAとキノン類とを反応させて得られるフェノール樹脂で変成して得られるエポキシ樹脂等が挙げられる。
上記したエポキシ樹脂(A)のなかでも、特に耐熱性の点から、分子構造中にナフタレン骨格を有するエポキシ樹脂、分子構造中にリン原始を有するエポキシ樹脂であることが好ましい。
An epoxy resin having a naphthalene skeleton in a molecular structure such as a tetrafunctional naphthalene type epoxy resin represented by: a phosphorus atom-containing epoxy resin. Moreover, these epoxy resins may be used independently and may mix 2 or more types.
Here, as the phosphorus atom-containing epoxy resin, epoxidized product of 9,10-dihydro-9-oxa-10-phosphaphenanthrene-10-oxide (hereinafter abbreviated as “HCA”), HCA and quinones Epoxy product of phenol resin obtained by reacting phenolic resin, epoxy resin obtained by modifying phenol novolac type epoxy resin with HCA, epoxy resin obtained by modifying cresol novolac type epoxy resin with HCA, and bisphenol A type epoxy resin using HCA and quinone Resin obtained by modification with a phenol resin obtained by reacting with a phenol, an epoxy resin obtained by modifying a bisphenyl A type epoxy resin with a phenol resin obtained by reacting an HCA with a quinone, etc. Is mentioned.
Among the above-described epoxy resins (A), particularly from the viewpoint of heat resistance, an epoxy resin having a naphthalene skeleton in the molecular structure and an epoxy resin having a phosphorus primitive in the molecular structure are preferable.
また、エポキシ樹脂組成物の硬化物のガラス転移温度を高くして耐熱性を高めるには、エポキシ樹脂(B)のエポキシ基当量は1,000g/当量以下、中でも700g/当量以下、とりわけ500g/当量以下であることが好ましい。 Moreover, in order to raise the glass transition temperature of the hardened | cured material of an epoxy resin composition and to improve heat resistance, the epoxy group equivalent of an epoxy resin (B) is 1,000 g / equivalent or less, Especially 700 g / equivalent or less, Especially 500 g / It is preferable that it is below an equivalent.
これらのなかでも特にビフェニル型エポキシ樹脂、ナフタレン型エポキシ樹脂、フェノールアラルキル型エポキシ樹脂、ビフェニルノボラック型エポキシ樹脂及びキサンテン型エポキシ樹脂が、難燃性や誘電特性に優れる点から特に好ましい。 Of these, biphenyl type epoxy resins, naphthalene type epoxy resins, phenol aralkyl type epoxy resins, biphenyl novolac type epoxy resins and xanthene type epoxy resins are particularly preferred because of their excellent flame retardancy and dielectric properties.
次に、本発明で用いる硬化剤(B)は、前記した通り、ノボラック型フェノール樹脂のフェノール性水酸基の40〜95%をアルキルエステル化又はアリールエステル化した分子構造を有し、かつ、その軟化点が100〜140℃の範囲にある変性フェノール樹脂である。ここで、変性フェノール樹脂の軟化点は、「JIS K7234−86」に準拠する環球法(昇温速度:5℃/分)によって測定される値である。 Next, as described above, the curing agent (B) used in the present invention has a molecular structure in which 40 to 95% of the phenolic hydroxyl group of the novolak type phenol resin is alkyl esterified or aryl esterified, and its softening. It is a modified phenolic resin having a point in the range of 100 to 140 ° C. Here, the softening point of the modified phenolic resin is a value measured by a ring and ball method (temperature increase rate: 5 ° C./min) in accordance with “JIS K7234-86”.
本発明では、このように軟化点が100〜140℃の範囲、好ましくは120〜130℃の範囲にある変性フェノール樹脂を硬化剤として使用することから、硬化物に優れた耐熱性を付与することができる。更に、前記した通りノボラック型フェノール樹脂をアルキルエステル化又はアリールエステル化することで目的とする変性フェノール樹脂を得ることができるが、この際、前記ノボラック型フェノール樹脂中のフェノール性水酸基の40〜95%、好ましくは60〜95%の割合でアルキルエステル化又はアリールエステル化することにより、銅張積層板用途やビルドアップ用接着フィルム用途における銅箔剥離強度が良好なものとなる。特に銅張積層板用途においては、銅箔剥離強度のみならず、多層積層板における層間強度も飛躍的に向上する。このように、ノボラック型フェノール樹脂中のフェノール性水酸基の所定量をエステル化することにより、銅箔剥離強度、特に銅張積層板用途における層間強度が飛躍的に改善される点は特筆すべき点であり、結果として耐熱性と銅箔剥離強度、更に層間強度とを高度に兼備させることができる。前記した通り、ノボラック樹脂をエポキシ樹脂用硬化剤として使用する場合、耐熱性と銅箔剥離強度・層間強度とは相互に背反する性能であった為、これらの性能を両立できたことは顕著な効果であるといえる。 In the present invention, since a modified phenol resin having a softening point in the range of 100 to 140 ° C., preferably in the range of 120 to 130 ° C. is used as a curing agent, excellent heat resistance is imparted to the cured product. Can do. Further, as described above, the target modified phenol resin can be obtained by alkyl esterifying or aryl esterifying the novolak type phenol resin. At this time, 40 to 95 of the phenolic hydroxyl group in the novolak type phenol resin can be obtained. %, Preferably 60 to 95% of the alkyl ester or aryl ester, the copper foil peel strength in copper-clad laminate applications and build-up adhesive film applications is good. Especially for copper clad laminates, not only the copper foil peel strength but also the interlayer strength in the multilayer laminate is dramatically improved. In this way, it is worth mentioning that the esterification of a predetermined amount of phenolic hydroxyl group in the novolak-type phenolic resin dramatically improves the copper foil peel strength, particularly the interlayer strength in copper clad laminate applications. As a result, heat resistance, copper foil peel strength, and interlayer strength can be combined at a high level. As described above, when novolak resin is used as a curing agent for epoxy resin, heat resistance and copper foil peel strength / interlaminar strength were mutually contradictory performances, so it was remarkable that both of these performances could be achieved. It can be said that it is an effect.
ここで、フェノール性水酸基をアルキルエステル化又はアリールエステル化して得られるアルキルエステル又はアリールエステルを構成するアルキル基又はアリール基としては、具体的には、メチル、エチル、n−プロピル、i−プロピル、t−ブチル等の炭素原子数1〜4のアルキル基、或いは、フェニル基、ビフェニル基、メチルフェニル基、エチルフェニル基、n−プロピルフェニル基、i−プロピルフェニル基、t−ブチルフェニル基等の炭素原子数1〜4のアルキル基で核置換したフェニル基が挙げられる。これらのなかでも特に耐熱性の点から、アリール基であることが好ましい。 Here, as the alkyl group or aryl group constituting the alkyl ester or aryl ester obtained by alkyl esterifying or aryl esterifying a phenolic hydroxyl group, specifically, methyl, ethyl, n-propyl, i-propyl, an alkyl group having 1 to 4 carbon atoms such as t-butyl, or a phenyl group, biphenyl group, methylphenyl group, ethylphenyl group, n-propylphenyl group, i-propylphenyl group, t-butylphenyl group, etc. And a phenyl group having a nucleus substituted with an alkyl group having 1 to 4 carbon atoms. Among these, an aryl group is preferable from the viewpoint of heat resistance.
かかる、変性フェノール樹脂の構造は、具体的には、下記構造式1 Specifically, the structure of the modified phenolic resin is represented by the following structural formula 1
(式中、R1は、炭素原子数1〜4のアルキル基、フェニル基、炭素原子数1〜4のアルキル基で核置換されたフェニル基を表し、R2は水素原子又は炭素原子数1〜4のアルキル基を表す。)
で表される構造部位Iと、下記構造式2
(In the formula, R 1 represents an alkyl group having 1 to 4 carbon atoms, a phenyl group, and a phenyl group nucleus-substituted with an alkyl group having 1 to 4 carbon atoms, and R 2 represents a hydrogen atom or 1 carbon atom. Represents an alkyl group of ˜4.)
And a structural site I represented by the following structural formula 2
(式中、R2は水素原子又は炭素原子数1〜4のアルキル基を表す。)
で表される構造部位IIとが、下記構造式3
(In the formula, R 2 represents a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.)
Structural site II represented by the following structural formula 3
(式中、R3は、メチル基又は水素原子を表し、R4は、メチル基、フェニル基、水素原子を表す。)
で表されるアルキリデン構造部位IIIで結節された分子構造を有するものであることが、銅箔剥離強度、更に銅張積層板用途における層間強度が一層良好なものとなる点から好ましい。
(In the formula, R 3 represents a methyl group or a hydrogen atom, and R 4 represents a methyl group, a phenyl group, or a hydrogen atom.)
It is preferable that it has the molecular structure knotted by the alkylidene structure site III represented by the following, since the copper foil peel strength and the interlayer strength in the use of a copper clad laminate are further improved.
また、前記変性フェノール樹脂の平均核体数、即ち、前記構造部位Iと前記構造部位IIの合計が1分子あたりの平均は6〜9となる割合で存在していることが好ましく、また、前記構造部位Iと前記構造部位IIの合計数に対して、前記構造部位Iが40〜95%、好ましくは60〜95%となる割合で存在していることが好ましい。 Moreover, it is preferable that the average number of nuclei of the modified phenolic resin, that is, the total of the structural site I and the structural site II is present in an average of 6 to 9 per molecule, It is preferable that the structural site I is present in a proportion of 40 to 95%, preferably 60 to 95%, based on the total number of the structural site I and the structural site II.
ここで、前記変性フェノール樹脂の平均核体数は、原料となるフェノール樹脂中の平均核体数に一致するため、この原料となるフェノール樹脂の平均核体数をGPCにて測定することにより求めることができる。かかるGPC測定に基づくフェノール樹脂の平均核体数の求め方は以下の通りである。
[平均核体数の求め方]
下記の条件にて行ったGPC測定によりn=1、n=2、n=3、n=4のそれぞれに対応するスチレン換算分子量(α1、α2、α3、α4)と、n=1、n=2、n=3、n=4のそれぞれの理論分子量(β1、β2、β3、β4)との比率(β1/α1、β2/α2、β3/α3、β4/α4)を求め、これら(β1/α1〜β4/α4)の平均値を求める。GPCで求めた数平均分子量(Mn)にこの平均値を掛け合わせた数値を平均分子量として、核体数を算出する。
Here, since the average number of nuclei of the modified phenol resin coincides with the average number of nuclei in the phenol resin as a raw material, the average number of nuclei of the phenol resin as a raw material is obtained by measuring by GPC. be able to. The method for obtaining the average number of nuclei of the phenol resin based on the GPC measurement is as follows.
[How to find the average number of nuclei]
According to GPC measurement performed under the following conditions, styrene equivalent molecular weights (α1, α2, α3, α4) corresponding to n = 1, n = 2, n = 3, and n = 4, and n = 1 and n = The ratios (β1 / α1, β2 / α2, β3 / α3, β4 / α4) to the respective theoretical molecular weights (β1, β2, β3, β4) of 2, n = 3, and n = 4 were determined, and these (β1 / The average value of α1 to β4 / α4) is obtained. The number of nuclei is calculated using the value obtained by multiplying the average value by the number average molecular weight (Mn) determined by GPC as the average molecular weight.
(GPC測定条件)
測定装置 :東ソー株式会社製「HLC−8220 GPC」、
カラム:東ソー株式会社製ガードカラム「HXL−L」
+東ソー株式会社製「TSK−GEL G2000HXL」
+東ソー株式会社製「TSK−GEL G2000HXL」
+東ソー株式会社製「TSK−GEL G3000HXL」
+東ソー株式会社製「TSK−GEL G4000HXL」
検出器: RI(示差屈折径)
データ処理:東ソー株式会社製「GPC−8020モデルIIバージョン4.10」
測定条件: カラム温度 40℃
展開溶媒 テトラヒドロフラン
流速 1.0ml/分
標準 : 前記「GPC−8020モデルIIバージョン4.10」の測定マニュアルに準拠して、分子量が既知の下記の単分散ポリスチレンを用いた。
(使用ポリスチレン)
東ソー株式会社製「A−500」
東ソー株式会社製「A−1000」
東ソー株式会社製「A−2500」
東ソー株式会社製「A−5000」
東ソー株式会社製「F−1」
東ソー株式会社製「F−2」
東ソー株式会社製「F−4」
東ソー株式会社製「F−10」
東ソー株式会社製「F−20」
東ソー株式会社製「F−40」
東ソー株式会社製「F−80」
東ソー株式会社製「F−128」
試料 : 樹脂固形分換算で1.0質量%のテトラヒドロフラン溶液をマイクロフィルターでろ過したもの(50μl)。
(GPC measurement conditions)
Measuring device: “HLC-8220 GPC” manufactured by Tosoh Corporation
Column: Guard column “H XL -L” manufactured by Tosoh Corporation
+ "TSK-GEL G2000HXL" manufactured by Tosoh Corporation
+ "TSK-GEL G2000HXL" manufactured by Tosoh Corporation
+ Tosoh Corporation “TSK-GEL G3000HXL”
+ Tosoh Corporation “TSK-GEL G4000HXL”
Detector: RI (Differential refraction diameter)
Data processing: “GPC-8020 Model II version 4.10” manufactured by Tosoh Corporation
Measurement conditions: Column temperature 40 ° C
Developing solvent Tetrahydrofuran
Flow rate: 1.0 ml / min Standard: The following monodisperse polystyrene having a known molecular weight was used in accordance with the measurement manual of “GPC-8020 Model II version 4.10”.
(Polystyrene used)
“A-500” manufactured by Tosoh Corporation
"A-1000" manufactured by Tosoh Corporation
"A-2500" manufactured by Tosoh Corporation
"A-5000" manufactured by Tosoh Corporation
“F-1” manufactured by Tosoh Corporation
"F-2" manufactured by Tosoh Corporation
“F-4” manufactured by Tosoh Corporation
“F-10” manufactured by Tosoh Corporation
“F-20” manufactured by Tosoh Corporation
“F-40” manufactured by Tosoh Corporation
“F-80” manufactured by Tosoh Corporation
“F-128” manufactured by Tosoh Corporation
Sample: A 1.0 mass% tetrahydrofuran solution filtered in terms of resin solids and filtered through a microfilter (50 μl).
また、ノボラック型フェノール樹脂のフェノール性水酸基の40〜95%をアルキルエステル化又はアリールエステル化した分子構造とは、原料として用いたノボラック型フェノール樹脂のフェノール性水酸基1モルに対してエステル化剤(塩化ベンゾイル)が0.40〜0.95モルとなる割合で反応して得られる分子構造であり、そのエステル化の割合は、GPC測定による平均分子量から算出される水酸基当量値から、仕込み原料フェノール樹脂中の水酸基数(モル数)を算出し、この水酸基のモル数に対する反応に供されたエステル化剤(塩化ベンゾイル)のモル数の比率から求めることができる。 The molecular structure in which 40 to 95% of the phenolic hydroxyl group of the novolak type phenol resin is alkylesterified or arylesterified is an esterifying agent (based on 1 mol of the phenolic hydroxyl group of the novolak type phenol resin used as a raw material). Benzoyl chloride) is a molecular structure obtained by reacting at a ratio of 0.40 to 0.95 mol, and the esterification ratio is determined from the hydroxyl equivalent value calculated from the average molecular weight by GPC measurement, and the raw material phenol The number of hydroxyl groups (number of moles) in the resin can be calculated and determined from the ratio of the number of moles of the esterifying agent (benzoyl chloride) subjected to the reaction to the number of moles of hydroxyl groups.
以上詳述した硬化剤(B)は、具体的には、ノボラック型フェノール樹脂をアルキルエステル化剤又はアリールエステル化剤と反応させることによって製造することができる。 Specifically, the curing agent (B) detailed above can be produced by reacting a novolac type phenol resin with an alkyl esterifying agent or an aryl esterifying agent.
ここで、ノボラック型フェノール樹脂としては、具体的には、下記構造式4 Here, as the novolac type phenol resin, specifically, the following structural formula 4
(式中、R2は水素原子又は炭素原子数1〜4のアルキル基を表し、R3は、メチル基又は水素原子を表し、R4は、メチル基、フェニル基、水素原子を表し、nは繰り返し単位の平均で4〜7である。)
上記構造式4で表されるフェノール樹脂のなかでも特に銅箔剥離強度、更には層間強度の改善効果が顕著である点からフェノールノボラック樹脂、クレゾールノボラック樹脂であることが好ましい。
(In the formula, R 2 represents a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, R 3 represents a methyl group or a hydrogen atom, R 4 represents a methyl group, a phenyl group, or a hydrogen atom, n Is an average of 4 to 7 repeating units.)
Among the phenol resins represented by the structural formula 4, a phenol novolac resin and a cresol novolac resin are preferable from the viewpoint that the effect of improving the copper foil peel strength and the interlayer strength is particularly remarkable.
また、ノボラック型フェノール樹脂に反応させるアルキルエステル化剤又はアリールエステル化剤としては、安息香酸、或いは、フェニル安息香酸、メチル安息香酸、エチル安息香酸、n−プロピル安息香酸、i−プロピル安息香酸及びt−ブチル安息香酸等のアルキル安息香酸、並びにこれらの酸フッ化物、酸塩化物、酸臭化物、酸ヨウ化物等の酸ハロゲン化物が挙げられるが、フェノール性水酸基との反応性が良好なものとなる点から安息香酸塩化物又はアルキル安息香酸塩基物であることが好ましい。 Examples of the alkyl esterifying agent or aryl esterifying agent to be reacted with the novolak type phenol resin include benzoic acid, phenyl benzoic acid, methyl benzoic acid, ethyl benzoic acid, n-propyl benzoic acid, i-propyl benzoic acid and Alkylbenzoic acids such as t-butylbenzoic acid, and acid halides such as acid fluorides, acid chlorides, acid bromides, and acid iodides are mentioned, and those having good reactivity with phenolic hydroxyl groups From this point, a benzoic acid chloride or an alkylbenzoic acid base is preferable.
そして、ノボラック型フェノール樹脂と、アルキルエステル化剤又はアリールエステル化剤とを反応させる方法は、具体的には、これらの各成分をアルカリ触媒の存在下に反応させることができる。
ここで使用し得るアルカリ触媒としては、水酸化ナトリウム、水酸化カリウム、トリエチルアミン、ピリジン等が挙げられる。これらのなかでも特に水酸化ナトリウム、水酸化カリウムが水溶液の状態で使用することができ、生産性が良好となる点から好ましい。
And the method of making a novolak-type phenol resin react with an alkyl esterifying agent or an aryl esterifying agent can specifically make these each component react in presence of an alkali catalyst.
Examples of the alkali catalyst that can be used here include sodium hydroxide, potassium hydroxide, triethylamine, and pyridine. Of these, sodium hydroxide and potassium hydroxide are particularly preferred because they can be used in the form of an aqueous solution and the productivity is good.
前記反応は、具体的には有機溶媒の存在下、ノボラック型フェノール樹脂と、アルキルエステル化剤又はアリールエステル化剤とを混合し、前記アルカリ触媒又はその水溶液を連続的乃至断続的に滴下しながら反応させる方法が挙げられる。その際、アルカリ触媒の水溶液の濃度は、3.0〜30%の範囲であることが好ましい。また、ここで使用し得る有機溶媒としては、トルエン、ジクロロメタンなどが挙げられる。 Specifically, the reaction is carried out by mixing a novolak-type phenol resin with an alkyl esterifying agent or an aryl esterifying agent in the presence of an organic solvent, and dropping the alkali catalyst or an aqueous solution thereof continuously or intermittently. The method of making it react is mentioned. At that time, the concentration of the aqueous solution of the alkali catalyst is preferably in the range of 3.0 to 30%. Examples of the organic solvent that can be used here include toluene and dichloromethane.
反応終了後は、アルカリ触媒の水溶液を用いている場合には、反応液を静置分液し、水層を取り除き、残った有機層を洗浄後の水層がほぼ中性になるまで繰り返し、目的とする樹脂を得ることができる。 After completion of the reaction, if an aqueous solution of an alkali catalyst is used, the reaction solution is allowed to stand for separation, the aqueous layer is removed, and the remaining organic layer is repeated until the aqueous layer after washing becomes almost neutral, The target resin can be obtained.
このようにして得られる変性フェノール樹脂は、通常、有機溶媒溶液として得られる為、銅張積層板用ワニスやビルドアップ用接着フィルムとして用いる場合には、そのままで他の配合成分と混合し、更に、適宜、有機溶媒量を調節して目的とするエポキシ樹脂組成物を製造することができる。 Since the modified phenolic resin thus obtained is usually obtained as an organic solvent solution, when used as a copper-clad laminate varnish or a build-up adhesive film, it is mixed with other ingredients as it is, The target epoxy resin composition can be produced by appropriately adjusting the amount of the organic solvent.
本発明のエポキシ樹脂組成物において、前記エポキシ樹脂用硬化剤(B)の配合量は、前記エポキシ樹脂(A)中のエポキシ基と、硬化剤(B)中の活性水素とエステル結合との合計との比率が、前者のエポキシ基/後者の活性水素及びエステル結合のモル比で0.7〜1.2となる配合割合であることが、耐熱性及び銅箔剥離強度、更に層間強度に優れる点から好ましい。 In the epoxy resin composition of the present invention, the amount of the epoxy resin curing agent (B) is the sum of the epoxy group in the epoxy resin (A), the active hydrogen in the curing agent (B) and the ester bond. Is a blending ratio in which the molar ratio of the former epoxy group / the latter active hydrogen and the ester bond is 0.7 to 1.2, it is excellent in heat resistance, copper foil peel strength, and interlayer strength. It is preferable from the point.
本発明のエポキシ樹脂組成物では、エポキシ樹脂用硬化剤として前記硬化剤(B)の他、本発明の効果を損なわない範囲でアミン系化合物、アミド系化合物、酸無水物系化合物、フェノ−ル系化合物など、その他のエポキシ樹脂用硬化剤(B’)を併用してもよい。この場合、硬化剤(B’)は、前記硬化剤(B)の一部を硬化剤(B’)に置き換えて使用することができる。即ち、硬化剤(B’)を併用する場合、該硬化剤(B’)中の活性水素と、硬化剤(B)中の活性水素及びエステル結合との合計が、エポキシ樹脂(A)中のエポキシ基1モルに対して、0.7〜1.2となる割合であることが好ましい。
また、硬化剤(B’)は、硬化剤(B)との合計質量に対して、50質量%以下となる割合で使用することができる。
In the epoxy resin composition of the present invention, in addition to the curing agent (B) as an epoxy resin curing agent, an amine compound, an amide compound, an acid anhydride compound, phenol as long as the effects of the present invention are not impaired. You may use together other hardening | curing agents for epoxy resins (B '), such as a system compound. In this case, the curing agent (B ′) can be used by replacing a part of the curing agent (B) with the curing agent (B ′). That is, when the curing agent (B ′) is used in combination, the total of the active hydrogen in the curing agent (B ′) and the active hydrogen and ester bond in the curing agent (B) is in the epoxy resin (A). The ratio is preferably 0.7 to 1.2 with respect to 1 mol of the epoxy group.
Moreover, a hardening | curing agent (B ') can be used in the ratio used as 50 mass% or less with respect to the total mass with a hardening | curing agent (B).
ここで使用し得る、アミン系化合物は、ジアミノジフェニルメタン、ジエチレントリアミン、トリエチレンテトラミン、ジアミノジフェニルスルホン、イソホロンジアミン、イミダゾ−ル、BF3−アミン錯体、グアニジン誘導体等が挙げられる。
アミド系化合物は、ジシアンジアミド、リノレン酸の2量体とエチレンジアミンとより合成されるポリアミド樹脂等が挙げられる。
Examples of amine compounds that can be used here include diaminodiphenylmethane, diethylenetriamine, triethylenetetramine, diaminodiphenylsulfone, isophoronediamine, imidazole, BF 3 -amine complex, and guanidine derivatives.
Examples of the amide compounds include polyamide resins synthesized from dimer of dicyandiamide and linolenic acid and ethylenediamine.
酸無水物系化合物は、無水フタル酸、無水トリメリット酸、無水ピロメリット酸、無水マレイン酸、テトラヒドロ無水フタル酸、メチルテトラヒドロ無水フタル酸、無水メチルナジック酸、ヘキサヒドロ無水フタル酸、メチルヘキサヒドロ無水フタル酸等が挙げられる。 Acid anhydride compounds include phthalic anhydride, trimellitic anhydride, pyromellitic anhydride, maleic anhydride, tetrahydrophthalic anhydride, methyltetrahydrophthalic anhydride, methyl nadic anhydride, hexahydrophthalic anhydride, methylhexahydroanhydride Examples include phthalic acid.
フェノール系化合物は、フェノールノボラック樹脂、クレゾールノボラック樹脂、芳香族炭化水素ホルムアルデヒド樹脂変性フェノール樹脂、ジシクロペンタジエンフェノール付加型樹脂、フェノールアラルキル樹脂、α−ナフトールアラルキル樹脂、β−ナフトールアラルキル樹脂、ビフェニルアラルキル樹脂、トリメチロールメタン樹脂、テトラフェニロールエタン樹脂、ナフトールノボラック樹脂、ナフトール−フェノール共縮ノボラック樹脂、ナフトール−クレゾール共縮ノボラック樹脂、アミノトリアジン変性フェノール樹脂等が挙げられる。また、前記アミノトリアジン変性フェノール樹脂は、具体的には、メラミンやベンゾグアナミン等のアミノ基含有トリアジン化合物と、フェノール、クレゾール等のフェノール類と、ホルムアルデヒドとの共重合体が挙げられる。 Phenol compounds include phenol novolac resin, cresol novolac resin, aromatic hydrocarbon formaldehyde resin-modified phenol resin, dicyclopentadiene phenol addition resin, phenol aralkyl resin, α-naphthol aralkyl resin, β-naphthol aralkyl resin, biphenyl aralkyl resin. , Trimethylolmethane resin, tetraphenylolethane resin, naphthol novolak resin, naphthol-phenol co-condensed novolak resin, naphthol-cresol co-condensed novolak resin, aminotriazine-modified phenol resin, and the like. Specific examples of the aminotriazine-modified phenol resin include copolymers of formaldehyde and amino group-containing triazine compounds such as melamine and benzoguanamine, phenols such as phenol and cresol, and formaldehyde.
これらの中でも、特に、硬化物の線膨張係数がより低くなり、熱的衝撃及び物理的衝撃に強く靱性に優れる点から多価フェノール系化合物が好ましく、フェノールノボラック樹脂、クレゾールノボラック樹脂、フェノールアラルキル樹脂、α−ナフトールアラルキル樹脂、β−ナフトールアラルキル樹脂、ビフェニルアラルキル樹脂、アミノトリアジン変性フェノール樹脂が好ましい。 Among these, polyhydric phenol compounds are particularly preferred because the linear expansion coefficient of the cured product is lower, and they are resistant to thermal and physical impacts and are excellent in toughness. Phenol novolac resins, cresol novolac resins, phenol aralkyl resins Α-naphthol aralkyl resin, β-naphthol aralkyl resin, biphenyl aralkyl resin, and aminotriazine-modified phenol resin are preferable.
本発明のエポキシ樹脂組成物は、上記した各成分に加え、更に、硬化促進剤(C)を併用してもよい。 The epoxy resin composition of the present invention may further contain a curing accelerator (C) in addition to the components described above.
ここで使用し得る硬化促進剤(C)は、イミダゾール類、三級アミン類、三級ホスフィン類等が挙げられる。 Examples of the curing accelerator (C) that can be used here include imidazoles, tertiary amines, and tertiary phosphines.
ここでイミダゾール類としては、具体的には2−エチル−4−メチルイミダゾール、2−メチルイミダゾール、2−エチルイミダゾール、2,4−ジメチルイミダゾール、2−ウンデシルイミダゾール、2−ヘプタデシルイミダゾール、2−フェニルイミダゾール、2−フェニル−4−メチルイミダゾール、1−ベンジル−2−メチルイミダゾール、2−フェニル−4,5−ジヒドロキシメチルイミダゾール、2−フェニル−4−メチル−5−ヒドロキシメチルイミダゾール、1−ビニル−2−メチルイミダゾール、1−プロピル−2−メチルイミダゾール、2−イソプロピルイミダゾール、1−シアノメチル−2−メチル−イミダゾール、1−シアノエチル−2−エチル−4−メチルイミダゾール、1−シアノエチル−2−ウンデシルイミダゾール、1−シアノエチル−2−フェニルイミダゾール等の他、マスク化イミダゾール類が挙げられる。 Specific examples of imidazoles include 2-ethyl-4-methylimidazole, 2-methylimidazole, 2-ethylimidazole, 2,4-dimethylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 2 -Phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 1- Vinyl-2-methylimidazole, 1-propyl-2-methylimidazole, 2-isopropylimidazole, 1-cyanomethyl-2-methyl-imidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 1-cyanoethyl-2- Undecyl Imi Tetrazole, another such 1-cyanoethyl-2-phenylimidazole, masking imidazoles and the like.
三級アミン類としては、具体的にはトリメチルアミン、トリエチルアミン、トリプロピルアミン、トリブチルアミン、テトラメチルブタンジアミン、テトラメチルペンタンジアミン、テトラメチルヘキサジアミン、トリエチレンジアミン、N,N−ジメチルベンジルアミン、N,N−ジメチルアニリン、N,N−ジメチルトルイジン、N,N−ジメチルアニシジン、ピリジン、ピコリン、キノリン、N,N′−ジメチルアミノピリジン、N−メチルピペリジン、N,N′−ジメチルピペラジン、1,8−ジアザビシクロ−[5,4,0]−7−ウンデセン(DBU)等が挙げられる。 Specific examples of the tertiary amines include trimethylamine, triethylamine, tripropylamine, tributylamine, tetramethylbutanediamine, tetramethylpentanediamine, tetramethylhexadiamine, triethylenediamine, N, N-dimethylbenzylamine, N, N-dimethylaniline, N, N-dimethyltoluidine, N, N-dimethylanisidine, pyridine, picoline, quinoline, N, N'-dimethylaminopyridine, N-methylpiperidine, N, N'-dimethylpiperazine, 1, And 8-diazabicyclo- [5,4,0] -7-undecene (DBU).
三級ホスフィン類として具体的には、トリメチルホスフィン、トリエチルホスフィン、トリプロピルホスフィン、トリブチルホスフィン、トリフェニルホスフィン、ジメチルフェニルホスフィン、メチルジフェニルホスフィン等が挙げられる。これらの中でも、硬化物の耐熱性がより高くなる点から三級アミン類が好ましい。 Specific examples of the tertiary phosphines include trimethylphosphine, triethylphosphine, tripropylphosphine, tributylphosphine, triphenylphosphine, dimethylphenylphosphine, and methyldiphenylphosphine. Among these, tertiary amines are preferable from the viewpoint of higher heat resistance of the cured product.
また、硬化促進剤(C)の添加量は、目標とする硬化時間等によって適宜調整することができるが、前記したエポキシ樹脂成分、硬化剤成分及び前記硬化促進剤(C)の総質量に対して0.1〜2質量%となる範囲であることが好ましい。 Moreover, although the addition amount of a hardening accelerator (C) can be suitably adjusted with the target hardening time etc., with respect to the total mass of an above-described epoxy resin component, a hardening | curing agent component, and the said hardening accelerator (C). It is preferable that it is the range used as 0.1-2 mass%.
本発明のエポキシ樹脂組成物は、使用用途に応じて、上記した各成分に加え、更に有機溶剤(D)を使用することができる。例えば、エポキシ樹脂組成物を銅張積層板用ワニスとして用いる場合には基材への含浸性が改善される他、ビルドアップ接着フィルムとして用いる場合には、基材シートへの塗工性が良好になる。ここで使用し得る有機溶剤(D)は、例えば、メタノール、エタノール、イソプロピルアルコール、メチルセロソルブ、エチルセロソルブ、プロピレングリコールモノメチルエーテル等のアルコール性溶媒、アセトン、メチルエチルケトン、メチルイソブチルケトン、シクロヘキサノン等のケトン類、酢酸エチル、酢酸ブチル、セロソルブアセテート、プロピレングリコールモノメチルエーテルアセテート、カルビトールアセテート等の酢酸エステル類、セロソルブ、ブチルカルビトール等のカルビトール類、トルエン、キシレン等の芳香族炭化水素類、ジメチルホルムアミド、ジメチルアセトアミド、N−メチルピロリドン等が挙げられる。有機溶剤(D)の使用量は、銅張積層板用ワニスとして用いる場合には基材への含浸性が改善される他、組成物中の不揮発分が50〜70質量%となる範囲であることが好ましい。一方、ビルドアップ接着フィルム用ワニスとして用いる場合、組成物中の不揮発分が30〜60質量%となる範囲であることが好ましい。 The epoxy resin composition of the present invention can further use an organic solvent (D) in addition to the above-described components, depending on the intended use. For example, when the epoxy resin composition is used as a varnish for a copper clad laminate, the impregnation property to the base material is improved, and when used as a build-up adhesive film, the coating property to the base material sheet is good. become. Examples of the organic solvent (D) that can be used here include alcoholic solvents such as methanol, ethanol, isopropyl alcohol, methyl cellosolve, ethyl cellosolve, and propylene glycol monomethyl ether, and ketones such as acetone, methyl ethyl ketone, methyl isobutyl ketone, and cyclohexanone. , Ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, acetate esters such as carbitol acetate, carbitols such as cellosolve and butyl carbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, Examples thereof include dimethylacetamide and N-methylpyrrolidone. When the organic solvent (D) is used as a varnish for a copper clad laminate, the impregnation property to the base material is improved and the nonvolatile content in the composition is in a range of 50 to 70% by mass. It is preferable. On the other hand, when using as a varnish for buildup adhesive films, it is preferable that the nonvolatile content in the composition is in a range of 30 to 60% by mass.
本発明のエポキシ樹脂組成物は、使用用途に応じ、上記した各成分の他、適宜、無機質充填材、改質剤、難燃付与剤等を配合してもよい。 The epoxy resin composition of the present invention may contain an inorganic filler, a modifier, a flame retardant, and the like as appropriate in addition to the components described above, depending on the intended use.
ここで用いる前記無機質充填材は、例えば、溶融シリカ、結晶シリカ、アルミナ、窒化珪素、水酸化アルミ、水酸化マグネシウム等が挙げられる。これらのなかでも特に溶融シリカが無機充填材の充填率を高めることができる点から好ましい。ここで、溶融シリカは破砕状、球状のいずれでも使用可能であるが、溶融シリカの配合量を高め且つ成形材料の溶融粘度の上昇を抑制するためには、球状のものを主に用いる方が好ましい。更に球状シリカの配合量を高めるためには、球状シリカの粒度分布を適当に調整することが好ましい。 Examples of the inorganic filler used here include fused silica, crystalline silica, alumina, silicon nitride, aluminum hydroxide, and magnesium hydroxide. Among these, fused silica is particularly preferable from the viewpoint that the filling rate of the inorganic filler can be increased. Here, the fused silica can be used in either crushed or spherical shape, but in order to increase the blending amount of the fused silica and to suppress the increase in the melt viscosity of the molding material, it is preferable to mainly use the spherical one. preferable. In order to further increase the blending amount of the spherical silica, it is preferable to appropriately adjust the particle size distribution of the spherical silica.
無機充填材の配合割合は用途や所望特性によって、望ましい範囲が異なるが、例えば半導体封止材用途に使用する場合は、線膨張係数や難燃性を鑑みれば高い方が好ましく、エポキシ樹脂組成物全体量に対して65〜95質量%の範囲、特に85〜95質量%の範囲であることが好ましい。また導電ペーストや導電フィルムなどの用途に使用する場合は、銀粉や銅粉等の導電性充填剤を用いることができる。 The desired range of the blending ratio of the inorganic filler varies depending on the application and desired characteristics. For example, when used for a semiconductor sealing material, a higher ratio is preferable in view of the linear expansion coefficient and flame retardancy, and the epoxy resin composition It is preferable that it is the range of 65-95 mass% with respect to the whole quantity, especially the range of 85-95 mass%. Moreover, when using for uses, such as an electrically conductive paste and an electrically conductive film, electroconductive fillers, such as silver powder and copper powder, can be used.
前記改質剤として使用される熱硬化性樹脂および熱可塑性樹脂としては種々のものが全て使用できるが、例えばフェノキシ樹脂、ポリアミド樹脂、ポリイミド樹脂、ポリエーテルイミド樹脂、ポリエーテルサルホン樹脂、ポリフェニレンエーテル樹脂、ポリフェニレンスルフィド樹脂、ポリエステル樹脂、ポリスチレン樹脂、ポリエチレンテレフタレート樹脂などが例示できる。 Various types of thermosetting resins and thermoplastic resins can be used as the modifier. For example, phenoxy resin, polyamide resin, polyimide resin, polyetherimide resin, polyethersulfone resin, polyphenylene ether Examples thereof include resins, polyphenylene sulfide resins, polyester resins, polystyrene resins, and polyethylene terephthalate resins.
前記難燃付与剤は、例えば、ハロゲン化合物、燐原子含有化合物や窒素原子含有化合物や無機系難燃化合物などが挙げられる。具体的には、テトラブロモビスフェノールA型エポキシ樹脂やブロム化フェノールノボラック型エポキシ樹脂などのハロゲン化合物、トリメチルホスフェート、トリエチルホスフェート、トリブチルホスフェート、トリ−2−エチルヘキシルホスフェート、トリブトキシエチルホスフェート、トリフェニルホスフェート、トリクレジルホスフェート、トリキシレニルホスフェート、クレジルジフェニルホスフェート、キシレニルジフェニルホスフェート、2−エチルヘキシルジフェニルホスフェート、トリス(2,6ジメチルフェニル)ホスフェート、レゾルシンジフェニルホスフェートなどのリン酸エステル、ポリリン酸アンモニウム、ポリリン酸アミド、赤リン、リン酸グアニジン、ジアルキルヒドロキシメチルホスホネートなどの縮合リン酸エステル化合物などの燐原子含有化合物、メラミンなどの窒素原子含有化合物、水酸化アルミニウム、水酸化マグネシウム、硼酸亜鉛、硼酸カルシウムなどの無機系難燃化合物が挙げられる。
然しながら、本発明のエポキシ樹脂組成物は、環境負荷の高いハロゲン系の難燃剤を使用しなくとも優れた難燃効果を発現することを特徴とする為、上記した難燃付与剤を用いる場合には、燐原子含有化合物や窒素原子含有化合物や無機系難燃化合物を用いることが好ましい。
Examples of the flame retardant imparting agent include halogen compounds, phosphorus atom-containing compounds, nitrogen atom-containing compounds, and inorganic flame retardant compounds. Specifically, halogen compounds such as tetrabromobisphenol A type epoxy resin and brominated phenol novolak type epoxy resin, trimethyl phosphate, triethyl phosphate, tributyl phosphate, tri-2-ethylhexyl phosphate, tributoxyethyl phosphate, triphenyl phosphate, Phosphate esters such as tricresyl phosphate, trixylenyl phosphate, cresyl diphenyl phosphate, xylenyl diphenyl phosphate, 2-ethylhexyl diphenyl phosphate, tris (2,6 dimethylphenyl) phosphate, resorcin diphenyl phosphate, ammonium polyphosphate, Condensation of polyphosphate amide, red phosphorus, guanidine phosphate, dialkylhydroxymethylphosphonate, etc. Phosphorus atom-containing compounds such as phosphate ester compounds, nitrogen-containing compounds such as melamine, aluminum hydroxide, magnesium hydroxide, zinc borate, and inorganic flame retardant compounds such as calcium borate.
However, the epoxy resin composition of the present invention is characterized by exhibiting an excellent flame retardant effect without using a halogen-based flame retardant having a high environmental load. It is preferable to use a phosphorus atom-containing compound, a nitrogen atom-containing compound, or an inorganic flame retardant compound.
本発明のエポキシ樹脂組成物の熱硬化の条件は特に制限されるものではなく、通常のフェノール樹脂を硬化させる条件で硬化せしめることが可能であり、樹脂成分が軟化する温度以上であれば問題なく、通常、120℃以上250℃以下の温度で行うことができる。特に成形性が良好となる点から170〜220℃の温度範囲であることが好ましい。 The conditions for thermosetting the epoxy resin composition of the present invention are not particularly limited, and can be cured under conditions for curing a normal phenol resin. Usually, it can carry out at the temperature of 120 to 250 degreeC. In particular, a temperature range of 170 to 220 ° C. is preferable from the viewpoint of good moldability.
以上詳述した本発明のエポキシ樹脂組成物は、上記した通り、銅張積層板用樹脂組成物、ビルドアッププリント基板の層間絶縁材料、ビルドアップ用接着フィルム等として有用であるが、これらの他、電子部品の封止材用樹脂組成物、レジストインキ用樹脂組成物、摩擦材用結合剤、導電ペースト、樹脂注型材料、接着剤、絶縁塗料等のコーティング材料等に用いることもできる。 As described above, the epoxy resin composition of the present invention described in detail above is useful as a resin composition for copper-clad laminates, an interlayer insulating material for build-up printed boards, an adhesive film for build-up, and the like. It can also be used as a resin composition for encapsulants of electronic parts, a resin composition for resist ink, a binder for friction material, a conductive paste, a resin casting material, an adhesive, a coating material such as an insulating paint, and the like.
本発明のエポキシ樹脂組成物から銅張積層板用樹脂組成物を製造する方法は、具体的には、前記エポキシ樹脂(A)、及び前記硬化剤(B)を必須成分とし、更に、必要により、有機溶剤(D)、硬化促進剤(C)を配合してワニス化する方法が挙げられる。ここで該ワニスは不揮発分が50〜70質量%となる範囲であることが繊維基材への含浸性とプリプレグの生産性の点から好ましい。 The method for producing a resin composition for a copper clad laminate from the epoxy resin composition of the present invention specifically comprises the epoxy resin (A) and the curing agent (B) as essential components, and further if necessary. And a method of blending an organic solvent (D) and a curing accelerator (C) to form a varnish. Here, the varnish preferably has a nonvolatile content in a range of 50 to 70% by mass from the viewpoint of impregnation into a fiber base material and prepreg productivity.
次に、上記銅張積層板用樹脂組成物から銅張積層板を製造する方法は、具体的には、以下の方法が挙げられる。 Next, specific examples of the method for producing a copper clad laminate from the above resin composition for copper clad laminate include the following methods.
上記方法により得られたワニスを紙、ガラス布、ガラス不織布、アラミド紙、アラミド布、ガラスマット、ガラスロービング布などの繊維基材に含浸させ、用いた溶剤種に応じた加熱温度、好ましくは50〜170℃で加熱することによって、硬化物であるプリプレグを得ることができる。この際、用いるエポキシ樹脂組成物と補強基材の配合割合は、通常、プリプレグ中の樹脂分が20〜60質量%となるように調整することが好ましい。 The varnish obtained by the above method is impregnated into a fiber substrate such as paper, glass cloth, glass nonwoven fabric, aramid paper, aramid cloth, glass mat, glass roving cloth, and the heating temperature according to the solvent type used, preferably 50 By heating at ˜170 ° C., a prepreg that is a cured product can be obtained. Under the present circumstances, it is preferable to adjust normally the compounding ratio of the epoxy resin composition to be used and a reinforcement base material so that the resin content in a prepreg may be 20-60 mass%.
得られたプリプレグを積層し、更に銅箔を重ねて、加熱圧着させることにより、目的とする銅張積層板を得ることができる。ここで加熱圧着させる方法は、具体的には、1〜10MPaの加圧下に170〜250℃なる温度条件で行う方法が挙げられる。また、加熱圧着は、10分〜3時間行うことが好ましい。 By laminating the obtained prepreg, further stacking copper foil, and heat-pressing it, a target copper-clad laminate can be obtained. Specific examples of the method of thermocompression bonding include a method of performing a temperature condition of 170 to 250 ° C. under a pressure of 1 to 10 MPa. The thermocompression bonding is preferably performed for 10 minutes to 3 hours.
また、本発明のエポキシ樹脂組成物は、更に、ビルドアッププリント基板の層間絶縁材料としても極めて有用である。
かかるビルドアッププリント基板の層間絶縁材料は、前記したワニス化の方法のなかでも、特に、前記エポキシ樹脂(A)、前記硬化剤(B)を必須成分とし、更に、必要により、前記有機溶剤(D)、硬化促進剤(C)、前記無機質充填材を配合する方法により調整することができる。ここで該ワニスは不揮発分が30〜60質量%となる範囲であることが、特に塗工性やフィルム成形性の点から好ましい。このようにして得られたビルドアップ基板用層間絶縁材料からビルドアップ基板を製造する方法は、具体的には、以下の方法が挙げられる。
Moreover, the epoxy resin composition of the present invention is extremely useful as an interlayer insulating material for build-up printed circuit boards.
Among the above-mentioned varnishing methods, the interlayer insulating material for such a build-up printed circuit board contains, in particular, the epoxy resin (A) and the curing agent (B) as essential components, and, if necessary, the organic solvent ( D), a hardening accelerator (C), and the method of mix | blending the said inorganic filler can adjust. Here, the varnish preferably has a nonvolatile content in the range of 30 to 60% by mass, particularly from the viewpoint of coating property and film formability. Specific examples of the method for producing a build-up substrate from the interlayer insulation material for a build-up substrate thus obtained include the following methods.
すなわち、該ビルドアップ基板用層間絶縁材料を、回路を形成した配線基板にスプレーコーティング法、カーテンコーティング法等を用いて塗布した後、硬化させ、次いで、必要に応じて所定のスルーホール部等の穴あけを行った後、粗化剤により処理し、その表面を湯洗することによって、凹凸を形成させ、銅などの金属をめっき処理する。前記めっき方法は、無電解めっき、電解めっき処理が好ましく、また前記粗化剤としては酸化剤、アルカリ、有機溶剤等が挙げられる。このような操作を所望に応じて順次繰り返し、樹脂絶縁層及び所定の回路パターンの導体層を交互にビルドアップして形成することにより、ビルドアップ基板を得ることができる。但し、スルーホール部の穴あけは、最外層の樹脂絶縁層の形成後に行うことが好ましく、また、銅箔上で当該樹脂組成物を半硬化させた樹脂付き銅箔を、回路を形成した配線基板上に、170〜250℃で加熱圧着することで、粗化面を形成、メッキ処理の工程を省き、ビルドアップ基板を作製することも可能である。 That is, the interlayer insulating material for a build-up substrate is applied to a wiring board on which a circuit is formed using a spray coating method, a curtain coating method, etc., and then cured, and then, if necessary, a predetermined through-hole portion or the like After drilling, the surface is treated with a roughening agent, and the surface is washed with hot water to form irregularities, and a metal such as copper is plated. The plating method is preferably electroless plating or electrolytic plating, and examples of the roughening agent include oxidizing agents, alkalis, and organic solvents. Such operations are sequentially repeated as desired, and a build-up substrate can be obtained by alternately building up and forming a resin insulating layer and a conductor layer having a predetermined circuit pattern. However, it is preferable to drill the through-hole portion after the outermost resin insulation layer is formed, and a wiring board on which a circuit is formed from a resin-coated copper foil obtained by semi-curing the resin composition on the copper foil. Further, it is possible to produce a build-up substrate by forming a roughened surface and omitting the plating process by thermocompression bonding at 170 to 250 ° C.
また、前記ビルドアッププリント基板の層間絶縁材料は、前記した塗料状の材料のみならずビルドアップ用接着フィルムとして用いることができる。本発明のエポキシ樹脂組成物は、樹脂成分自体が優れた耐熱性を発現することから、ビルドアップ用接着フィルムとして特に有用である。 Further, the interlayer insulating material of the build-up printed board can be used as an adhesive film for build-up as well as the paint-like material described above. The epoxy resin composition of the present invention is particularly useful as an adhesive film for buildup because the resin component itself exhibits excellent heat resistance.
本発明のエポキシ樹脂組成物からビルドアップ用接着フィルムを製造する方法は、例えば、本発明のエポキシ樹脂組成物を、支持フィルム上に塗布し樹脂組成物層を形成させて多層プリント配線板用の接着フィルムとする方法が挙げられる。 The method for producing an adhesive film for buildup from the epoxy resin composition of the present invention is, for example, applied to the support film by forming the epoxy resin composition of the present invention on a support film to form a resin composition layer. The method of setting it as an adhesive film is mentioned.
本発明のエポキシ樹脂組成物をビルドアップ用接着フィルムに用いる場合、該接着フィルムは、真空ラミネート法におけるラミネートの温度条件(通常70℃〜140℃)で軟化し、回路基板のラミネートと同時に、回路基板に存在するビアホール或いはスルーホール内の樹脂充填が可能な流動性(樹脂流れ)を示すことが肝要であり、このような特性を発現するよう上記各成分を配合することが好ましい。 When the epoxy resin composition of the present invention is used for a build-up adhesive film, the adhesive film is softened under the lamination temperature condition (usually 70 ° C. to 140 ° C.) in the vacuum laminating method, and at the same time as laminating the circuit board, It is important to show fluidity (resin flow) capable of filling the via hole or through hole in the substrate, and it is preferable to blend the above-described components so as to exhibit such characteristics.
ここで、多層プリント配線板のスルーホールの直径は通常0.1〜0.5mm、深さは通常0.1〜1.2mmであり、通常この範囲で樹脂充填を可能とするのが好ましい。なお回路基板の両面をラミネートする場合はスルーホールの1/2程度充填されることが望ましい。 Here, the diameter of the through hole of the multilayer printed wiring board is usually 0.1 to 0.5 mm, and the depth is usually 0.1 to 1.2 mm. It is usually preferable to allow resin filling in this range. When laminating both surfaces of the circuit board, it is desirable to fill about 1/2 of the through hole.
上記した接着フィルムを製造する方法は、具体的には、ワニス状の本発明のエポキシ樹脂組成物を調製した後、支持フィルム(Y)の表面に、このワニス状の組成物を塗布し、更に加熱、あるいは熱風吹きつけ等により有機溶剤を乾燥させてエポキシ樹脂組成物の層(X)を形成させることにより製造することができる。 Specifically, the method for producing the adhesive film described above is, after preparing the varnish-like epoxy resin composition of the present invention, coating the varnish-like composition on the surface of the support film (Y), and further It can be produced by drying the organic solvent by heating or blowing hot air to form the layer (X) of the epoxy resin composition.
形成される層(X)の厚さは、通常、導体層の厚さ以上とする。回路基板が有する導体層の厚さは通常5〜70μmの範囲であるので、樹脂組成物層の厚さは10〜100μmの厚みを有するのが好ましい。 The thickness of the formed layer (X) is usually not less than the thickness of the conductor layer. Since the thickness of the conductor layer of the circuit board is usually in the range of 5 to 70 μm, the thickness of the resin composition layer is preferably 10 to 100 μm.
なお、本発明における層(X)は、後述する保護フィルムで保護されていてもよい。保護フィルムで保護することにより、樹脂組成物層表面へのゴミ等の付着やキズを防止することができる。 In addition, the layer (X) in this invention may be protected with the protective film mentioned later. By protecting with a protective film, it is possible to prevent dust and the like from being attached to the surface of the resin composition layer and scratches.
前記した支持フィルム及び保護フィルムは、ポリエチレン、ポリプロピレン、ポリ塩化ビニル等のポリオレフィン、ポリエチレンテレフタレート(以下「PET」と略称することがある。)、ポリエチレンナフタレート等のポリエステル、ポリカーボネート、ポリイミド、更には離型紙や銅箔、アルミニウム箔等の金属箔などを挙げることができる。なお、支持フィルム及び保護フィルムはマッド処理、コロナ処理の他、離型処理を施してあってもよい。 The above-mentioned support film and protective film are made of polyolefin such as polyethylene, polypropylene and polyvinyl chloride, polyethylene terephthalate (hereinafter sometimes abbreviated as “PET”), polyester such as polyethylene naphthalate, polycarbonate, polyimide, and further. Examples thereof include metal foil such as pattern paper, copper foil, and aluminum foil. In addition, the support film and the protective film may be subjected to a release treatment in addition to the mud treatment and the corona treatment.
支持フィルムの厚さは特に限定されないが、通常10〜150μmの範囲であり、好ましくは25〜50μmの範囲で用いられる。また保護フィルムの厚さは1〜40μmの範囲であることが好ましい。 Although the thickness of a support film is not specifically limited, Usually, it is the range of 10-150 micrometers, Preferably it is used in the range of 25-50 micrometers. Moreover, it is preferable that the thickness of a protective film is the range of 1-40 micrometers.
上記した支持フィルム(Y)は、回路基板にラミネートした後に、或いは加熱硬化することにより絶縁層を形成した後に、剥離される。接着フィルムを加熱硬化した後に支持フィルム(Y)を剥離すれば、硬化工程でのゴミ等の付着を防ぐことができる。硬化後に剥離する場合、通常、支持フィルムには予め離型処理が施される。 The support film (Y) described above is peeled off after being laminated on a circuit board or after forming an insulating layer by heat curing. If the support film (Y) is peeled after the adhesive film is heat-cured, adhesion of dust and the like in the curing process can be prevented. In the case of peeling after curing, the support film is usually subjected to a release treatment in advance.
次に、上記のようして得られた接着フィルムを用いて多層プリント配線板を製造する方法は、例えば、層(X)が保護フィルムで保護されている場合はこれらを剥離した後、層(X)を回路基板に直接接するように、回路基板の片面又は両面に、例えば真空ラミネート法によりラミネートする。ラミネートの方法はバッチ式であってもロールでの連続式であってもよい。またラミネートを行う前に接着フィルム及び回路基板を必要により加熱(プレヒート)しておいてもよい。 Next, the method for producing a multilayer printed wiring board using the adhesive film obtained as described above is, for example, when the layer (X) is protected by a protective film, after peeling these layers ( X) is laminated on one side or both sides of the circuit board so as to be in direct contact with the circuit board, for example, by a vacuum laminating method. The laminating method may be a batch method or a continuous method using a roll. Further, the adhesive film and the circuit board may be heated (preheated) as necessary before lamination.
ラミネートの条件は、圧着温度(ラミネート温度)を好ましくは70〜140℃、圧着圧力を好ましくは1〜11kgf/cm2(9.8×104〜107.9×104N/m2)とし、空気圧20mmHg(26.7hPa)以下の減圧下でラミネートすることが好ましい。 The laminating conditions are preferably a pressure bonding temperature (laminating temperature) of 70 to 140 ° C. and a pressure bonding pressure of preferably 1 to 11 kgf / cm 2 (9.8 × 10 4 to 107.9 × 10 4 N / m 2 ). Lamination is preferably performed under a reduced pressure of 20 mmHg (26.7 hPa) or less.
また、前記した前記ビルドアッププリント基板の層間絶縁材料や、ビルドアップ用接着フィルム用途においては、本発明における優れた耐熱性を発現するという特質から、コンデンサ等の受動部品やICチップ等の能動部品を基板内に埋め込んだ所謂電子部品内蔵基板における絶縁材料としてとりわけ有用である。 In addition, in the above-described interlayer insulation material for build-up printed circuit boards and adhesive film for build-up, active components such as capacitors and passive components such as capacitors and active components such as IC chips are obtained due to the characteristic of exhibiting excellent heat resistance in the present invention. It is particularly useful as an insulating material in a so-called electronic component built-in substrate in which is embedded in a substrate.
本発明のエポキシ樹脂組成物は、前記した通り、銅張積層板用樹脂組成物、ビルドアッププリント基板の層間絶縁材料、ビルドアップ用接着フィルム等として有用であり、銅張積層板用樹脂組成物及びビルドアップ用接着フィルムとして特に有用である。更に、優れた層間強度を発現する点から銅張積層板用樹脂組成物として有用である。本発明のエポキシ樹脂組成物は、優れた耐熱性や金属材料への接着性に優れるという観点から、これらの他、電子部品の封止材用樹脂組成物、レジストインキ用樹脂組成物、摩擦材用結合剤、導電ペースト、接着剤、絶縁塗料、樹脂注型材料等に用いることもできる。 As described above, the epoxy resin composition of the present invention is useful as a resin composition for copper-clad laminates, an interlayer insulating material for build-up printed boards, an adhesive film for build-ups, and the like. It is particularly useful as an adhesive film for buildup. Furthermore, it is useful as a resin composition for copper clad laminates because it exhibits excellent interlayer strength. In addition to these, the epoxy resin composition of the present invention is excellent in heat resistance and adhesion to metal materials. In addition to these, a resin composition for encapsulants for electronic parts, a resin composition for resist ink, and a friction material It can also be used for binders, conductive pastes, adhesives, insulating paints, resin casting materials, and the like.
本発明のエポキシ樹脂組成物を電子部品の封止材用樹脂組成物として用いる場合の具体的用途は、半導体封止材料、半導体のテープ状封止剤、ポッティング型液状封止剤、アンダーフィル用樹脂、半導体の層間絶縁膜等が挙げられる。 Specific uses when the epoxy resin composition of the present invention is used as a resin composition for encapsulants of electronic components include semiconductor encapsulants, semiconductor tape encapsulants, potting liquid encapsulants, and underfill Examples thereof include resins and semiconductor interlayer insulating films.
本発明のエポキシ樹脂組成物を半導体封止材料用に調整するためには、前記前記エポキシ樹脂(A)、前記硬化剤(B)、必要に応じて配合されるその他のカップリング剤、離型剤などの添加剤や無機充填材などを予備混合した後、押出機、ニ−ダ、ロ−ル等を用いて均一になるまで充分に混合する手法が挙げられる。半導体のテープ状封止剤として使用する場合には、前述の手法によって得られた樹脂組成物を加熱して半硬化シートを作製し、封止剤テープとした後、この封止剤テープを半導体チップ上に置き、100〜150℃に加熱して軟化させ成形し、170〜250℃で完全に硬化させる方法を挙げることができる。 In order to adjust the epoxy resin composition of the present invention for a semiconductor sealing material, the epoxy resin (A), the curing agent (B), other coupling agents blended as necessary, and a mold release Examples thereof include a method in which an additive such as an agent or an inorganic filler is premixed and then sufficiently mixed until uniform using an extruder, a kneader, a roll or the like. When used as a semiconductor tape-like sealant, the resin composition obtained by the above-mentioned method is heated to prepare a semi-cured sheet, which is used as a sealant tape, and then this sealant tape is used as a semiconductor. A method of placing on a chip, heating to 100 to 150 ° C., softening and molding, and completely curing at 170 to 250 ° C. can be mentioned.
本発明のエポキシ樹脂組成物をレジストインキ用樹脂組成物として用いる方法としては、例えば、前記エポキシ樹脂(A)と、前記硬化剤(B)に、更に、有機溶剤(D)、顔料、タルク、及びフィラーを加えてレジストインキ用組成物とした後、スクリーン印刷方式にてプリント基板上に塗布した後、レジストインキ硬化物とする方法が挙げられる。ここで用いる有機溶剤(D)としては、例えば、メチルセロソルブ、エチルセロソルブ、メチルセロソルブアセテート、エチルセロソルブアセテート、シクロヘキサノン、ジメチルスルホキシド、ジメチルホルムアミド、ジオキソラン、テトラヒドロフラン、プロピレングリコ−ルモノメチルエーテルアセテート、エチルラクテート等が挙げられる。 As a method of using the epoxy resin composition of the present invention as a resist ink resin composition, for example, in addition to the epoxy resin (A) and the curing agent (B), an organic solvent (D), a pigment, talc, And a filler, and a composition for resist ink is applied to a printed circuit board by a screen printing method and then a resist ink cured product is used. Examples of the organic solvent (D) used here include methyl cellosolve, ethyl cellosolve, methyl cellosolve acetate, ethyl cellosolve acetate, cyclohexanone, dimethyl sulfoxide, dimethylformamide, dioxolane, tetrahydrofuran, propylene glycol monomethyl ether acetate, ethyl lactate and the like. Is mentioned.
本発明のエポキシ樹脂組成物を摩擦材用結着剤に用いる場合、前記エポキシ樹脂(I)、前記硬化剤(B)に加え、更に、ヘキサメチレンテトラミン、パラホルムアルデヒド等の加熱によりホルムアルデヒドを発生する物質を用い、その他、前記硬化促進剤を配合することによって摩擦材用結着剤を製造することができる。かかる摩擦材用結着剤を用いて摩擦材を調整するには、上記各成分に充填剤、添加剤等を添加、熱硬化させる方法、繊維基材に上記各成分を含浸させ熱硬化させる方法が挙げられる。ここで用いる充填剤、添加剤は、例えばシリカ、硫酸バリウム、炭酸カルシウム、炭化珪素、カシュー油重合物、二硫化モリブデン、水酸化アルミニウム、タルク、クレー、黒鉛、グラファイト、ゴム粒、アルミニウム粉、銅粉、真ちゅう粉等が挙げられる。 When the epoxy resin composition of the present invention is used as a binder for a friction material, in addition to the epoxy resin (I) and the curing agent (B), formaldehyde is further generated by heating hexamethylenetetramine, paraformaldehyde and the like. In addition, a binder for a friction material can be produced by using a substance and blending the curing accelerator. In order to adjust the friction material using such a binder for friction material, a method of adding a filler, an additive and the like to each of the above components and thermally curing, a method of impregnating each of the above components into a fiber substrate and thermosetting it Is mentioned. Fillers and additives used here are, for example, silica, barium sulfate, calcium carbonate, silicon carbide, cashew oil polymer, molybdenum disulfide, aluminum hydroxide, talc, clay, graphite, graphite, rubber particles, aluminum powder, copper Examples thereof include powder and brass powder.
更にポッティング型液状封止剤として使用する場合には、前述の手法によって得られた樹脂組成物を必要に応じて溶剤に溶解した後、半導体チップや電子部品上に塗布し、直接、硬化させればよい。 Further, when used as a potting type liquid sealant, the resin composition obtained by the above-mentioned method is dissolved in a solvent as necessary, and then applied onto a semiconductor chip or an electronic component and directly cured. That's fine.
本発明のエポキシ樹脂組成物をアンダーフィル用樹脂として使用する方法は、例えば、予め基板ないし半導体素子上にワニス状のエポキシ樹脂組成物を塗布、次いで半硬化させてから、加熱して半導体素子と基板を密着させ、完全硬化させるコンプレッションフロー法等が挙げられる。 The method of using the epoxy resin composition of the present invention as an underfill resin is, for example, by previously applying a varnish-like epoxy resin composition on a substrate or a semiconductor element, then semi-curing it, and heating to form a semiconductor element. For example, a compression flow method in which the substrate is brought into close contact and completely cured can be used.
本発明のエポキシ樹脂組成物を半導体の層間絶縁材料として使用する方法は、例えば、前記エポキシ樹脂(A)、前記硬化剤(B)に加え、硬化促進剤、シランカップリング剤を配合して組成物を調整し、これをシリコン基板上にスピンコーティング等により塗布する方法が挙げられる。この場合、硬化塗膜は半導体に直接接することになるため、高温環境下において線膨張率の差によるクラックが生じないよう、絶縁材の線膨張率を半導体の線膨張率に近づけることが好ましい。 The method of using the epoxy resin composition of the present invention as a semiconductor interlayer insulating material includes, for example, a composition comprising a curing accelerator and a silane coupling agent in addition to the epoxy resin (A) and the curing agent (B). There is a method in which an object is prepared and applied onto a silicon substrate by spin coating or the like. In this case, since the cured coating film is in direct contact with the semiconductor, it is preferable that the linear expansion coefficient of the insulating material be close to the linear expansion coefficient of the semiconductor so that cracks due to the difference in linear expansion coefficient do not occur in a high temperature environment.
次に、本発明のエポキシ樹脂組成物から導電ペーストを調整する方法は、例えば、微細導電性粒子を該エポキシ樹脂組成物中に分散させ異方性導電膜用組成物とする方法、室温で液状である回路接続用ペースト樹脂組成物や異方性導電接着剤とする方法が挙げられる。 Next, a method for preparing a conductive paste from the epoxy resin composition of the present invention is, for example, a method in which fine conductive particles are dispersed in the epoxy resin composition to form a composition for an anisotropic conductive film, which is liquid at room temperature. And a paste resin composition for circuit connection and an anisotropic conductive adhesive.
本発明のエポキシ樹脂組成物を接着剤用樹脂組成物に調整する方法は、例えば、前記エポキシ樹脂(A)、前記硬化剤(B)、必要に応じて樹脂類、硬化促進剤、溶剤、添加剤等を室温または加熱下で混合ミキサー等を用いて均一に混合する方法が挙げられ、各種の基材に塗布した後、加熱下に放置することによって基材の接着を行うことができる。 The method for adjusting the epoxy resin composition of the present invention to a resin composition for an adhesive is, for example, the epoxy resin (A), the curing agent (B), and if necessary, resins, a curing accelerator, a solvent, and an addition Examples include a method in which an agent or the like is uniformly mixed using a mixing mixer or the like at room temperature or under heating. The base material can be adhered by applying it to various base materials and then leaving it under heating.
本発明の硬化物は、以上詳述した本発明のエポキシ樹脂組成物を成形硬化させて得られるものであり、用途に応じて積層物、注型物、接着剤、塗膜、フィルム等として使用できる。前記した通り、プリント基板用の銅張積層板、及びビルドアップ用接着フィルムとして特に有用である。 The cured product of the present invention is obtained by molding and curing the epoxy resin composition of the present invention described in detail above, and is used as a laminate, cast product, adhesive, coating film, film, etc. depending on the application. it can. As described above, it is particularly useful as a copper-clad laminate for printed circuit boards and an adhesive film for buildup.
以下、実施例により本発明を詳細に説明する。各合成例における平均核体数は以下の通りにして求めた値である。
[軟化点測定法]
環球法(「JIS K7234−86」に準拠、昇温速度が5℃/分)にて測定した。
Hereinafter, the present invention will be described in detail by way of examples. The average number of nuclei in each synthesis example is a value determined as follows.
[Softening point measurement method]
It was measured by the ring and ball method (according to “JIS K7234-86”, heating rate 5 ° C./min).
[平均核体数の求め方]
下記の条件にて行ったGPC測定によりn=1、n=2、n=3、n=4のそれぞれに対応するスチレン換算分子量(α1、α2、α3、α4)と、n=1、n=2、n=3、n=4のそれぞれの理論分子量(β1、β2、β3、β4)との比率(β1/α1、β2/α2、β3/α3、β4/α4)を求め、これら(β1/α1〜β4/α4)の平均値を求める。GPCで求めた数平均分子量(Mn)にこの平均値を掛け合わせた数値を平均分子量として、核体数を算出する。
[How to find the average number of nuclei]
According to GPC measurement performed under the following conditions, styrene equivalent molecular weights (α1, α2, α3, α4) corresponding to n = 1, n = 2, n = 3, and n = 4, and n = 1 and n = The ratios (β1 / α1, β2 / α2, β3 / α3, β4 / α4) to the respective theoretical molecular weights (β1, β2, β3, β4) of 2, n = 3, and n = 4 were determined, and these (β1 / The average value of α1 to β4 / α4) is obtained. The number of nuclei is calculated using the value obtained by multiplying the average value by the number average molecular weight (Mn) determined by GPC as the average molecular weight.
(GPC測定条件)
測定装置 :東ソー株式会社製「HLC−8220 GPC」、
カラム:東ソー株式会社製ガードカラム「HXL−L」
+東ソー株式会社製「TSK−GEL G2000HXL」
+東ソー株式会社製「TSK−GEL G2000HXL」
+東ソー株式会社製「TSK−GEL G3000HXL」
+東ソー株式会社製「TSK−GEL G4000HXL」
検出器: RI(示差屈折径)
データ処理:東ソー株式会社製「GPC−8020モデルIIバージョン4.10」
測定条件: カラム温度 40℃
展開溶媒 テトラヒドロフラン
流速 1.0ml/分
標準 : 前記「GPC−8020モデルIIバージョン4.10」の測定マニュアルに準拠して、分子量が既知の下記の単分散ポリスチレンを用いた。
(使用ポリスチレン)
東ソー株式会社製「A−500」
東ソー株式会社製「A−1000」
東ソー株式会社製「A−2500」
東ソー株式会社製「A−5000」
東ソー株式会社製「F−1」
東ソー株式会社製「F−2」
東ソー株式会社製「F−4」
東ソー株式会社製「F−10」
東ソー株式会社製「F−20」
東ソー株式会社製「F−40」
東ソー株式会社製「F−80」
東ソー株式会社製「F−128」
試料 : 樹脂固形分換算で1.0質量%のテトラヒドロフラン溶液をマイクロフィルターでろ過したもの(50μl)。
(GPC measurement conditions)
Measuring device: “HLC-8220 GPC” manufactured by Tosoh Corporation
Column: Guard column “H XL -L” manufactured by Tosoh Corporation
+ "TSK-GEL G2000HXL" manufactured by Tosoh Corporation
+ "TSK-GEL G2000HXL" manufactured by Tosoh Corporation
+ Tosoh Corporation “TSK-GEL G3000HXL”
+ Tosoh Corporation “TSK-GEL G4000HXL”
Detector: RI (Differential refraction diameter)
Data processing: “GPC-8020 Model II version 4.10” manufactured by Tosoh Corporation
Measurement conditions: Column temperature 40 ° C
Developing solvent Tetrahydrofuran
Flow rate: 1.0 ml / min Standard: The following monodisperse polystyrene having a known molecular weight was used in accordance with the measurement manual of “GPC-8020 Model II version 4.10”.
(Polystyrene used)
“A-500” manufactured by Tosoh Corporation
"A-1000" manufactured by Tosoh Corporation
"A-2500" manufactured by Tosoh Corporation
"A-5000" manufactured by Tosoh Corporation
“F-1” manufactured by Tosoh Corporation
"F-2" manufactured by Tosoh Corporation
“F-4” manufactured by Tosoh Corporation
“F-10” manufactured by Tosoh Corporation
“F-20” manufactured by Tosoh Corporation
“F-40” manufactured by Tosoh Corporation
“F-80” manufactured by Tosoh Corporation
“F-128” manufactured by Tosoh Corporation
Sample: A 1.0 mass% tetrahydrofuran solution filtered in terms of resin solids and filtered through a microfilter (50 μl).
[原料フェノール樹脂の水酸基数に対するエステル化の割合の求め方]
GPC測定により算出した平均分子量から算出される水酸基当量値から、仕込み原料フェノール樹脂中の水酸基数(モル数)を算出する。この水酸基のモル数とエステル化剤(塩化ベンゾイル)の仕込み量(モル数)との比率からエステル化の割合を求めた。
[合成例1]
温度計、滴下ロート、冷却管、分留管、撹拌器を取り付けたフラスコにフェノールノボラック樹脂(DIC(株)製「TD−2090」、水酸基当量:105、軟化点120℃、平均核体数:8)105.0gとメチルイソブチルケトン(以下「MIBK」と略記する。)627gを仕込み、系内を減圧窒素置換し溶解させた。次いで、塩化ベンゾイル126.5g(0.90モル)を仕込み、系内を減圧窒素置換し溶解させた。その後、テトラブチルアンモニウムブロマイドの0.50gを溶解させ、窒素ガスパージを施しながら、系内を60℃以下に制御して、20%水酸化ナトリウム水溶液181.8gを3時間かけて滴下した。次いでこの条件下で1.0時間撹拌を続けた。反応終了後、静置分液し、水層を取り除いた。更に反応物が溶解しているMIBK層に水を投入して約15分間撹拌混合し、整地分液して水層を取り除いた。水層のpHが7になるまでこの操作を繰り返した。その後、デカンタ脱水で水分を除去し、続いて減圧脱水でMIBKを除去し、活性エステル樹脂(A−1)を合成した。この樹脂(A−1)の官能基当量(フェノール性水酸基とエステル結合との総計に基づく当量、以下、同様)199、軟化点は127℃、平均核対数は8、原料フェノールノボラックの水酸基数に対するエステル化の割合は90%であった。
[How to find the ratio of esterification to the number of hydroxyl groups in raw phenolic resin]
From the hydroxyl group equivalent value calculated from the average molecular weight calculated by GPC measurement, the number of hydroxyl groups (number of moles) in the raw material phenol resin is calculated. The ratio of esterification was determined from the ratio between the number of moles of the hydroxyl group and the charged amount (number of moles) of the esterifying agent (benzoyl chloride).
[Synthesis Example 1]
A flask equipped with a thermometer, dropping funnel, condenser, fractionator, and stirrer was phenol novolac resin (“TD-2090” manufactured by DIC Corporation, hydroxyl equivalent: 105, softening point: 120 ° C., average number of nuclei: 8) 105.0 g and 627 g of methyl isobutyl ketone (hereinafter abbreviated as “MIBK”) were charged and the system was purged with nitrogen under reduced pressure to dissolve. Next, 126.5 g (0.90 mol) of benzoyl chloride was charged, and the inside of the system was purged with nitrogen under reduced pressure to be dissolved. Thereafter, 0.50 g of tetrabutylammonium bromide was dissolved, and the inside of the system was controlled to 60 ° C. or lower while performing a nitrogen gas purge, and 181.8 g of a 20% aqueous sodium hydroxide solution was added dropwise over 3 hours. Stirring was then continued for 1.0 hour under these conditions. After completion of the reaction, the solution was allowed to stand for separation, and the aqueous layer was removed. Further, water was added to the MIBK layer in which the reaction product was dissolved, and the mixture was stirred and mixed for about 15 minutes. This operation was repeated until the pH of the aqueous layer reached 7. Thereafter, water was removed by decanter dehydration, and subsequently MIBK was removed by vacuum dehydration to synthesize an active ester resin (A-1). Functional group equivalent of this resin (A-1) (equivalent based on the total of phenolic hydroxyl groups and ester bonds, hereinafter the same) 199, softening point is 127 ° C., average number of nuclear pairs is 8, relative to the number of hydroxyl groups of the raw material phenol novolac The rate of esterification was 90%.
[合成例2]
温度計、滴下ロート、冷却管、分留管、撹拌器を取り付けたフラスコにクレゾールノボラック樹脂(DIC(株)製「KA−1160」、水酸基当量:117、軟化点126℃、平均核体数:8)117.0gとMIBK631.8gとを仕込み、系内を減圧窒素置換し溶解させた。次いで、塩化ベンゾイル126.5g(0.90モル)を仕込み、系内を減圧窒素置換し溶解させた。その後、テトラブチルアンモニウムブロマイドの0.50gを溶解させ、窒素ガスパージを施しながら、系内を60℃以下に制御して、20%水酸化ナトリウム水溶液181.8gを3時間かけて滴下した。次いでこの条件下で1.0時間撹拌を続けた。反応終了後、静置分液し、水層を取り除いた。更に反応物が溶解しているMIBK相に水を投入して約15分間撹拌混合し、整地分液して水層を取り除いた。水層のpHが7になるまでこの操作を繰り返した。その後、デカンタ脱水で水分を除去し、続いて減圧脱水でMIBKを除去し、活性エステル樹脂(A−2)を合成した。この樹脂(A−2)の官能基当量210.6、軟化点は129℃、平均核対数は8、原料フェノールノボラックの水酸基数に対するエステル化の割合は90%であった。
[Synthesis Example 2]
A flask equipped with a thermometer, a dropping funnel, a condenser tube, a fractionating tube, and a stirrer was cresol novolak resin (“KA-1160” manufactured by DIC Corporation, hydroxyl equivalent: 117, softening point 126 ° C., average number of nuclei: 8) 117.0 g and MIBK 631.8 g were charged, and the inside of the system was purged with nitrogen under reduced pressure to be dissolved. Next, 126.5 g (0.90 mol) of benzoyl chloride was charged, and the inside of the system was purged with nitrogen under reduced pressure to be dissolved. Thereafter, 0.50 g of tetrabutylammonium bromide was dissolved, and the inside of the system was controlled to 60 ° C. or lower while performing a nitrogen gas purge, and 181.8 g of a 20% aqueous sodium hydroxide solution was added dropwise over 3 hours. Stirring was then continued for 1.0 hour under these conditions. After completion of the reaction, the solution was allowed to stand for separation, and the aqueous layer was removed. Further, water was added to the MIBK phase in which the reaction product was dissolved, and the mixture was stirred and mixed for about 15 minutes. This operation was repeated until the pH of the aqueous layer reached 7. Thereafter, water was removed by decanter dehydration, and subsequently MIBK was removed by vacuum dehydration to synthesize an active ester resin (A-2). This resin (A-2) had a functional group equivalent of 210.6, a softening point of 129 ° C., an average number of nuclear pairs of 8, and a ratio of esterification to the number of hydroxyl groups of the starting phenol novolac was 90%.
[合成例3]
塩化ベンゾイル42.2g(0.30モル)、MIBK408g、トラブチルアンモニウムブロマイドを0.34g、20%水酸化ナトリウム水溶液60.6gに変更するほかは、合成例1と同様に反応を行い、活性エステル樹脂(A−3)を合成した。この樹脂(A−3)のエステル化当量136、軟化点は122℃、平均核対数は8、原料フェノールノボラックの水酸基数に対するエステル化の割合は30%であった。
[Synthesis Example 3]
The active ester was reacted in the same manner as in Synthesis Example 1 except that 42.2 g (0.30 mol) of benzoyl chloride, 408 g of MIBK, 0.34 g of trabutylammonium bromide and 60.6 g of 20% aqueous sodium hydroxide solution were changed. Resin (A-3) was synthesized. This resin (A-3) had an esterification equivalent of 136, a softening point of 122 ° C., an average number of core pairs of 8, and a ratio of esterification to the number of hydroxyl groups of the starting phenol novolak was 30%.
[合成例4]
塩化ベンゾイル140.5g(1.00モル)、MIBK627g、トラブチルアンモニウムブロマイドを0.52g、20%水酸化ナトリウム水溶液202.0gに変更するほかは、合成例1と同様に反応を行い、活性エステル樹脂(A−3)を合成した。この樹脂(A−3)のエステル化当量206、軟化点は129℃、平均核対数は8、原料フェノールノボラックの水酸基数に対するエステル化の割合は100%であった。
[Synthesis Example 4]
The reaction was carried out in the same manner as in Synthesis Example 1 except that 140.5 g (1.00 mol) of benzoyl chloride, 627 g of MIBK, 0.52 g of trabutylammonium bromide and 202.0 g of 20% aqueous sodium hydroxide solution were used. Resin (A-3) was synthesized. This resin (A-3) had an esterification equivalent of 206, a softening point of 129 ° C., an average number of nuclear pairs of 8, and a ratio of esterification to the number of hydroxyl groups of the starting phenol novolak was 100%.
実施例1〜6及び比較例1〜4(エポキシ樹脂組成物の調整及び物性評価)
下記表1記載の配合に従い、エポキシ樹脂及びエステル化合物を配合し、最終的に各組成物の不揮発分(N.V.)が58質量%となるようにメチルエチルケトンを配合して調整した。
Examples 1 to 6 and Comparative Examples 1 to 4 (Adjustment of epoxy resin composition and evaluation of physical properties)
In accordance with the formulation shown in Table 1 below, an epoxy resin and an ester compound were blended, and methyl ethyl ketone was blended and adjusted so that the nonvolatile content (NV) of each composition was finally 58% by mass.
次いで、下記の如き条件で硬化させて積層板を試作し、各種の評価を行った。結果を表1に示す。
[積層板作製条件]
基材:日東紡績株式会社製 ガラスクロス「WEA 2116」
プライ数:6 プリプレグ化条件:160℃、銅箔 :18μm(古河サ−キットホイル株式会社製)
硬化条件 : 200℃、40kg/cm2で1.5時間、成型後板厚 : 0.8mm
[物性試験条件]
ガラス転移温度: エッチング処理を施し銅箔除去した後、DMA法にて測定。昇温スピード3℃/min。
銅箔剥離性 : JIS−K6481に準拠しピール強度を測定した。
層間剥離強度 : JIS−K6481に準拠した。
誘電率及び誘電正接 : JIS−C−6481に準拠した方法により、50×25×2mmのサイズに試験片を切り出し、アジレント・テクノロジー株式会社製インピーダンス・マテリアル・アナライザ「HP4291B」とフィクスチャーを用いて、絶乾後23℃、湿度50%の室内に24時間保管した後、試験片の1GHzでの誘電率および誘電正接を測定した。
Subsequently, it was hardened on the following conditions, the laminated board was made as an experiment, and various evaluation was performed. The results are shown in Table 1.
[Laminate production conditions]
Base material: Nitto Boseki Co., Ltd. glass cloth “WEA 2116”
Number of plies: 6 Pre-pregation conditions: 160 ° C., copper foil: 18 μm (Furukawa Sakit Foil, Inc.)
Curing conditions: 200 ° C., 40 kg / cm 2 for 1.5 hours, thickness after molding: 0.8 mm
[Physical property test conditions]
Glass transition temperature: Measured by DMA method after removing copper foil by etching. Temperature rising speed 3 ° C / min.
Copper foil peelability: The peel strength was measured according to JIS-K6481.
Interlaminar peel strength: Conforms to JIS-K6481.
Dielectric constant and dielectric loss tangent: A test piece was cut into a size of 50 × 25 × 2 mm by a method in accordance with JIS-C-6481, using an impedance material analyzer “HP4291B” manufactured by Agilent Technologies, Inc. and a fixture. After drying completely, the sample was stored in a room at 23 ° C. and 50% humidity for 24 hours, and then the dielectric constant and dielectric loss tangent of the test piece at 1 GHz were measured.
表1の各成分は、以下の通りである。
「HP−4032」:ジグリジシルオキシナフタレン
「HP−4700」:下記構造式
Each component of Table 1 is as follows.
“HP-4032”: Diglycidyloxynaphthalene “HP-4700”: Structural formula shown below
で表される4官能ナフタレン型エポキシ樹脂
「リン含有エポキシ」:HCA及びハイドロキノンの反応物と、ビスフェノール型エポキシ樹脂との反応生成物であるエポキシ樹脂(エポキシ当量475g/eq.、リン原子含有率3質量%)
「TD−2090」:フェノールノボラック樹脂60質量%MEK溶液
水酸基当量:105g/eq、軟化点120℃
A “phosphorus-containing epoxy”: an epoxy resin that is a reaction product of a reaction product of HCA and hydroquinone and a bisphenol-type epoxy resin (epoxy equivalent 475 g / eq., Phosphorus atom content 3) mass%)
“TD-2090”: phenol novolac resin 60 mass% MEK solution
Hydroxyl equivalent: 105 g / eq, softening point 120 ° C
Claims (11)
(式中、R1は、炭素原子数1〜4のアルキル基、フェニル基、炭素原子数1〜4のアルキル基で核置換されたフェニル基を表し、R2は水素原子又は炭素原子数1〜4のアルキル基を表す。)
で表される構造部位Iと、下記構造式2
(式中、R2は水素原子又は炭素原子数1〜4のアルキル基を表す。)
で表される構造部位IIとが、下記構造式3
(式中、R3は、メチル基又は水素原子を表し、R4は、メチル基、フェニル基、水素原子を表す。)
で表されるアルキリデン構造部位IIIで結節された分子構造を有するものである請求項1記載のエポキシ樹脂組成物。 The modified phenolic resin has the following structural formula 1
(In the formula, R 1 represents an alkyl group having 1 to 4 carbon atoms, a phenyl group, and a phenyl group nucleus-substituted with an alkyl group having 1 to 4 carbon atoms, and R 2 represents a hydrogen atom or 1 carbon atom. Represents an alkyl group of ˜4.)
And a structural site I represented by the following structural formula 2
(In the formula, R 2 represents a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.)
Structural site II represented by the following structural formula 3
(In the formula, R 3 represents a methyl group or a hydrogen atom, and R 4 represents a methyl group, a phenyl group, or a hydrogen atom.)
The epoxy resin composition according to claim 1, which has a molecular structure knotted at an alkylidene structure site III represented by:
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Cited By (4)
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JP2012102315A (en) * | 2010-11-05 | 2012-05-31 | Samsung Electro-Mechanics Co Ltd | Flame retardant resin composition for multilayer wiring board, and multilayer wiring board comprising the same |
JP2012251133A (en) * | 2011-05-10 | 2012-12-20 | Ajinomoto Co Inc | Resin composition |
JP2013253171A (en) * | 2012-06-07 | 2013-12-19 | Dic Corp | Curable resin composition, cured product of the same, and printed wiring board |
JP2014024978A (en) * | 2012-07-27 | 2014-02-06 | Dic Corp | Curable composition, cured product and printed wiring board |
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JPH09296026A (en) * | 1996-04-30 | 1997-11-18 | Dainippon Ink & Chem Inc | Curable epoxy resin composition |
JP2000169551A (en) * | 1998-12-08 | 2000-06-20 | Mitsui Chemicals Inc | Epoxy resin composition and its use |
JP2000327746A (en) * | 1999-05-20 | 2000-11-28 | Mitsui Chemicals Inc | Epoxy resin composition and its use |
JP2000327751A (en) * | 1999-05-20 | 2000-11-28 | Mitsui Chemicals Inc | Epoxy resin composition and its use |
WO2005100435A1 (en) * | 2004-04-14 | 2005-10-27 | Namics Corporation | Epoxy resin composition |
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JPH09296026A (en) * | 1996-04-30 | 1997-11-18 | Dainippon Ink & Chem Inc | Curable epoxy resin composition |
JP2000169551A (en) * | 1998-12-08 | 2000-06-20 | Mitsui Chemicals Inc | Epoxy resin composition and its use |
JP2000327746A (en) * | 1999-05-20 | 2000-11-28 | Mitsui Chemicals Inc | Epoxy resin composition and its use |
JP2000327751A (en) * | 1999-05-20 | 2000-11-28 | Mitsui Chemicals Inc | Epoxy resin composition and its use |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2012102315A (en) * | 2010-11-05 | 2012-05-31 | Samsung Electro-Mechanics Co Ltd | Flame retardant resin composition for multilayer wiring board, and multilayer wiring board comprising the same |
JP2012251133A (en) * | 2011-05-10 | 2012-12-20 | Ajinomoto Co Inc | Resin composition |
JP2017110228A (en) * | 2011-05-10 | 2017-06-22 | 味の素株式会社 | Resin composition |
JP2013253171A (en) * | 2012-06-07 | 2013-12-19 | Dic Corp | Curable resin composition, cured product of the same, and printed wiring board |
JP2014024978A (en) * | 2012-07-27 | 2014-02-06 | Dic Corp | Curable composition, cured product and printed wiring board |
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