JP2010025869A - Material analyzer - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a material analyzer for conveniently inspecting whether a product can cope with an European RoHS directive in a manufacturing line or a product form at a high speed, and screening the product exceeding a regulation value. <P>SOLUTION: The material analyzer 1000 includes: a combined microwave and plasma generation means 1003 for assisting a microplasma generated by a high voltage discharge from a spark plug with microwave energy, and converting at least a portion of a to-be-measured object into a plasma; and a spectroscopic analysis means. The plasma is generated by the plasma generation means. At least a portion of the to-be-measured object is converted into the plasma. A particular material is detected by an emission analysis using the spectroscopic analysis means. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a substance analysis apparatus for detecting a specific substance in a production line or a product form in order to inspect whether or not a product can comply with, for example, the European RoHS directive.

  In the European Union (EU), in February 2003, RoHS (“Directive 2002/95 / EC of the European Parliament and of council of 27 January 2003 on the Restriction of the use of certain Hazardous Substances in electrical and electronic equipment ”-“ European Parliament / Council Directive 2002/95 / EC dated 27 January 2003 on restrictions on the use of certain hazardous substances in electrical and electronic equipment ”was promulgated and from 1 July 2006 It has been enforced.

  Restrictions on the use of RoHS require that EU member states comply with the “Directive” of the EU legal system. Unlike the “regulation”, which is legally binding on the entire member country at the same time as the “directive” comes into effect, the “directive” itself is not legally binding. When EU member states issue a “directive”, it is necessary to comply with the content of the directive by enacting, amending, or abolishing national laws.

  However, this directive limits the use of six specific hazardous substances (four heavy metals and two brominated flame retardants) at all stages from the production and disposal of electrical and electronic equipment sold in the EU. Yes, not only companies in the EU member countries but also companies outside the EU that sell products in the EU.

  In Japan, overseas exports still dominate in the industrial field. For this reason, the RoHS Directive has a great influence on the Japanese industry even though it is a “Directive”. In recent years, toxic substances are detected in toys and parts, and there are concerns about the effects on the human body, which has become an international problem.

  Under such a background, as described in Patent Document 1, the present applicant has already achieved a high efficiency based on a photo-ignition plasma spectroscopic measurement technique for performing measurement in a combustion chamber for developing an automobile engine. Developed and proposed a compact, low-cost microwave-assisted spark-induced breakdown spectroscopy (SIBS).

JP 2007-113570 A

  The conventional substance analyzer is not only expensive (for example, 6 million yen to 14 million yen), but also has a determination time on the order of several tens of seconds to several minutes. Have difficulty.

  If the microwave-assisted spark-induced breakdown spectroscopy (SIBS) proposed by the applicant of the present application can be applied to a material analyzer, a specific substance can be detected easily and at high speed. A substance analyzer can be configured.

  Therefore, the present invention has been proposed in view of the above-described circumstances. For example, whether or not a product can comply with the European RoHS directive can be determined simply and quickly on a production line or product form. An object of the present invention is to provide a substance analyzer that can be inspected and screened for substances exceeding the regulation value.

  The substance analyzing apparatus according to the present invention uses a microwave combined SIBS that assists the microplasma generated by the spark plug with the microwave in order to improve the above-described disadvantages. By combining a spark plug and a small microwave generator, plasma can be generated inexpensively and easily, a part of the object to be measured is converted into plasma, and emission analysis is performed to specify a specific material such as a RoHS substance. Substances can be detected and compared with the regulation values at high speed.

  That is, the substance analysis apparatus according to the present invention includes any one of the following configurations.

[Configuration 1]
Electromagnetic wave combined plasma generating means for assisting the microplasma generated by high voltage discharge with electromagnetic energy to excite or plasma at least a part of the object to be measured, and spectroscopic analyzing means, and generating plasma by the plasma generating means, It is characterized in that at least a part of the object to be measured is converted into plasma and a specific substance is detected by spectral analysis of excitation light or light emission by a spectral analysis means.

[Configuration 2]
In the substance analyzing apparatus having the configuration 1, the electromagnetic wave energy is generated by a magnetron.

[Configuration 3]
A material analyzing apparatus having the configuration 1 or the configuration 2, wherein a plurality of light collecting means for collecting light from a plurality of observation regions, respectively, and a light collecting means for receiving light from the light collecting means, respectively. Comprising a plurality of connected spectroscopic means, a detecting means for detecting light wavelength-dispersed by each of the spectroscopic means for each wavelength component, and an arithmetic means for performing analysis processing on a detection result by the detecting means, Is characterized in that the detection result by the detection means is time-divided and the analysis process is performed on the detection result at each time in each observation region.

[Configuration 4]
In the substance analyzing apparatus having the configuration 3, a correspondence table showing a relationship between a phenomenon occurring in each observation region and a time zone in which the phenomenon occurs is prepared in advance, and the calculation means generates the detection result by time division. The detection results of each observation region and each time are classified and analyzed for each phenomenon.

[Configuration 5]
In the substance analyzing apparatus having any one of Configurations 1 to 4, an electrode for discharge and an antenna for supplying electromagnetic energy in the electromagnetic wave combined plasma generating unit, and an optical system for collecting light in the spectroscopic analyzing unit It is characterized by forming a probe that is integrated and placed close to the object to be measured.

  In the substance analyzing apparatus according to the present invention having the configuration 1, at least a part of the object to be measured is converted into plasma by the microwave combined plasma generating means, and a specific substance is detected by emission analysis by the spectroscopic analyzing means. Whether or not a product can comply with the European RoHS Directive can be easily and quickly inspected on a production line or product form, and a product exceeding a regulation value can be screened.

  In the substance analyzing apparatus according to the present invention having the configuration 2, since the microwave energy is generated by the magnetron, the apparatus can be configured at low cost.

  In the substance analyzing apparatus according to the present invention having the configuration 3, the calculation means time-divides the detection result by the detection means and performs analysis processing on the detection result at each time in each observation region. It is possible to perform analysis divided into two.

  In the substance analyzing apparatus according to the present invention having the configuration 4, since the calculation means performs the analysis process by classifying the detection result of each observation region generated by time division and the detection result of each time, by phenomenon. Each time, analysis can be performed divided in time and space.

  In the substance analyzing apparatus according to the present invention having the configuration 5, since the electrode, the antenna, and the optical system for condensing to be arranged in the vicinity of the object to be measured are integrated to form a probe, the production line It can be easily applied to integration into a handheld or handheld analysis.

  That is, the present invention can, for example, easily and rapidly inspect whether or not a product can comply with the European RoHS directive on a production line or product form, and screen for products exceeding the regulation value. It is possible to provide a material analyzing apparatus that can perform the above.

  The present invention proposes a material analyzer that is small, simple, inexpensive and can be incorporated online.

  The measurement technique uses an electromagnetic wave applied SIBS that combines spark-induced breakdown spectroscopy (SIBS) and electromagnetic waves. SIBS is a technique for measuring substances contained in a sample by generating plasma by high-voltage discharge, atomizing and exciting the sample with the plasma, and measuring the emitted light.

  By supplying electromagnetic waves to plasma generated by high-voltage discharge, the plasma absorbs the energy of the electromagnetic waves and the plasma expands. With this electromagnetic wave application SIBS, it is possible to obtain a plasma having a high emission intensity that cannot be obtained with ordinary SIBS. By using electromagnetic waves, plasma can be generated with a small discharge energy (<50 mJ), and a large electrode and a large-capacity high-voltage power supply are not required.

  In addition, for generation of electromagnetic waves, a magnetron, which is highly efficient for microwave ovens, can be used at low cost. Therefore, the system can be simplified and the cost can be reduced.

[First Embodiment]
The best mode for carrying out the present invention will be described below with reference to the drawings.

  FIG. 1 is a block diagram showing a schematic configuration of a substance analyzing apparatus according to the present embodiment.

  As shown in FIG. 1, a substance analyzing apparatus 1000 according to the present invention includes a first input energy source 1001 that inputs energy for plasma formation by discharge, and a first input that inputs energy for adjusting and sustaining plasma. 2 input energy sources 1002 and a plasma forming unit 1003 that receives the energy input from the first input energy source 1001 and the second input energy source 1002 to form plasma.

  The plasma forming unit 1003 is joined with a condensing unit 1005 including a plurality of concentrators and optical fibers. The light collected by the condensing unit 1005 is wavelength-dispersed by the spectroscopic unit 1006. The light wavelength-dispersed by the spectroscopic unit 1006 is received by the detection unit 1007 and subjected to photoelectric conversion. An electric signal generated by photoelectric conversion by the detection unit 1007 is converted into digital data by the signal processing unit 1008. Digital data output from the signal processing unit 1008 is accumulated by the arithmetic unit 1009. The arithmetic unit 1009 outputs a result corresponding to the digital data by arithmetic processing according to a predetermined algorithm. In addition, the operation of each unit of the substance analysis apparatus 1000 is integrated and controlled by the control unit 1010.

  The control unit 1010 operates in response to a command from the outside, and gives a control signal to each unit of the substance analyzer 1000 at a predetermined timing. The control signal is specifically the following signal. That is, the control unit 1010 applies a voltage signal for a predetermined time as a control signal to the first input energy source 1001. In addition, the control unit 1010 applies an operation start signal and an end signal to the second input energy source 1002 as control signals. The control unit 1010 gives a photoelectric conversion start signal and an end signal to the detection unit 1007. The application time of the photoelectric conversion start signal is at the latest before the end time of the voltage signal application to the first input energy source 1001. The control unit 1010 notifies the calculation unit 1009 of the calculation unit 1009 at least when executing the first operation among the application operations of the control signals described above.

  Note that each function of the control unit 1010 is realized by computer hardware, a program executed on the computer hardware, and data that can be read or written by the computer hardware. Each of these functions and operations can be realized by a person skilled in the art based on the description in this specification. Such a program is also a piece of data and can be stored in a storage medium and distributed.

  FIG. 2 is a block diagram showing the configuration of the first input energy source 1001.

  As shown in FIG. 2, the first input energy source 1001 includes an ignition switch 1021 composed of an npn-type transistor and having a base connected to the control unit 1010 and an emitter grounded, and one of the terminals on the primary side is connected to the DC power supply 1020. An ignition coil 1022 connected to the collector of the ignition switch 1021, the rectifier 1023 connected to the secondary side of the ignition coil 1022, and a connector 1024 responsible for connection to the plasma forming unit 1003 in the subsequent stage of the rectifier 1023 Is provided.

  When a control signal is applied to the base of the ignition switch 1021, a current flows to the primary side of the ignition coil 1022, the magnetic field in the ignition coil 1022 changes, and charges are accumulated. In this state, when the voltage application to the base of the ignition switch 1021 is finished, the charge flows into the secondary side of the ignition coil 1022, and a high potential difference is generated between the ground side and the connector 1024 side on the secondary side. As a result, a high voltage ignition signal is generated.

  FIG. 3 is a block diagram showing the configuration of the second input energy source 1002.

  As shown in FIG. 3, the second input energy source 1002 includes an oscillator 1030 that oscillates and generates an electromagnetic wave having a predetermined frequency by receiving power, and a power supply that supplies power to the oscillator 1030 according to a command from the control unit 1010. Device 1031. The oscillator 1030 may be either a feedback type or a relaxation type. Moreover, what is called a high frequency generator may be used. Note that a 2.45 GHz oscillation magnetron is inexpensive and has high output, and is suitable as the oscillator 1030.

  The power supply apparatus 1031 may be appropriately selected according to the oscillator 1030 to be used. However, the power supply apparatus 1031 needs to start and end at least power supply to the oscillator 1030 in accordance with a command from the control unit 1010. As the power supply apparatus 1031, an inverter-type pulse power supply apparatus may be used.

  When a command signal is applied to the second input energy source, the power supply apparatus 1031 starts to supply power to the oscillator 1030. The oscillator 1031 oscillates upon receiving this power supply, and generates and outputs an electromagnetic wave. When the application of the command signal is finished, the power feeding device 1031 finishes the power feeding, and the oscillator 1030 finishes the oscillation. Note that generation of electromagnetic waves by the second input energy source 1002 may be continuous or intermittent.

  FIG. 4 is a perspective view showing the configuration of the plasma forming unit 1003.

  As shown in FIG. 4, the plasma forming unit 1003 is made of a substantially rod-shaped conductor, and a cathode 1040 connected to a connector 1024 (see FIG. 2) at one end along the central axis of the conductor, and a cathode 1040. And an insulator 1041 surrounding the cathode 1040 with both ends thereof exposed. The plasma forming unit 1003 includes an anode 1042 made of a conductor spaced apart from the cathode 1041 through the insulator 1041, an electromagnetic wave transmission path 1043 made of a coaxial line passing through the insulator 1041 and the anode 1042, and an electromagnetic wave transmission path 1043. And an antenna 1044 connected to the.

  In FIG. 4, the anode 1043 is screwed to the body 1050 so as to surround the cathode 1041, the insulator 1042, and the electromagnetic wave transmission path 1043, and the body 1050 so as to surround the tip of the cathode 1041 and the antenna 1044. And a cap 1051 made of a conductive material. The cap 1051 has a cylindrical shape that is constricted on the opposite side to the screwed portion, and the space inside and outside the cap via a constricted ejection hole (hereinafter referred to as “opening”) 1052. Communicate. The cap 1051 has the shortest insulation distance in the vicinity of the cathode 1041 and the opening 1052. The member in the vicinity of the opening 1052 of the cap 1051 is molded so as to become thinner as it approaches the opening 1052. Further, the cap 1052 is provided with an openable / closable introduction hole 1053 for introducing the atomized or vaporized sample or plasma working gas.

  The sample is introduced from the cap 1052 through the introduction hole 1053 and discharged from the opening 1052. Alternatively, it is arranged in a space near the opening 1052 outside the cap 1052. This sample may be any of a solid phase, a liquid phase, and a gas phase. Moreover, you may form the multiphase flow by the combination of those phases. The sample may be composed of a single atom, a mixture of a plurality of types of atoms, or a plurality of types of atoms constituting a molecule.

  When the plasma forming unit 1003 receives a high voltage from the first input energy source 1001, a discharge is performed. That is, a strong electric field is generated between the cathode 1040 and the anode 1043, and electrons are emitted from the tip of the cathode 1040. The emitted electrons are attracted to the anode side and collide with surrounding materials. The material receiving the energy of the collision is ionized or excited. As a result, the material between the tip of the cathode 1040 and the wall surface near the opening 1052 of the cap 1051 breaks down. In the discharge, a rapid capacity discharge is first performed, and then a slow induction discharge is performed.

  If the substance to be ionized is a molecule composed of a plurality of atoms, ions composed of one or a plurality of atoms are first generated. When the discharge continues, ions generated by ionization are further ionized to the atomic level. In the vicinity of the edge of the plasma due to the discharge or in the time zone in which the discharge shifts to a slow induction discharge and approaches the end gradually, the electron density is low, and excitation is superior to ionization. As a result, when a molecule composed of a plurality of atoms exists, orbital transition occurs in the electrons in the molecule, that is, is excited. If the discharge continues further, the region where the plasma exists is heated to a high temperature. As a result, thermal excitation is performed in or around the plasma. As described above, the ionized or excited substance emits light by the transition of the electron orbit after that. At this time, if fine particles are present, light is scattered.

  If the plasma forming unit 1003 receives an electromagnetic wave input from the first input energy source 1001 within a period during which the discharge is performed, the electromagnetic wave is radiated from the antenna 1044 into the cap. Electromagnetic waves give energy to charged particles in the plasma. Charged particles, especially electrons, are accelerated by receiving energy and collide with other substances to ionize the substances. Electrons generated by ionization also receive energy and accelerate. By this chain, plasma expansion by so-called electron avalanche is performed. That is, the material is turned into plasma in an avalanche manner, and the region where plasma is formed is expanded. Even in this expansion process, ionization from the ion level to the atomic level progresses, and light emission becomes dominant in this order. In the edge portion where the electron density is low or in the time zone just before the end, excitation becomes dominant over ionization, and molecular light emission occurs.

  When energy supply by electromagnetic waves continues with the introduction hole 1053 closed, the inside of the cap 1051 is heated by the energy, and the pressure inside the cap 1051 rises. When a pressure difference is generated between the inside and the outside of the cap 1051, the substance and plasma in the cap 1051 are ejected from the opening 1052. When a substance is present in the space where the plasma is ejected, the substance is also exposed to charged particles in the plasma and is ionized or excited.

  When the supply of electromagnetic waves is changed, the volume of the region from which plasma is ejected, the duration of plasma ejection, and the temperature of the plasma change. That is, the control of the second input energy source 1002 adjusts the volume of the region from which plasma is ejected, the plasma ejection time, and the plasma temperature. In addition, the shape of the plasma region formed by the ejection changes according to the shape of the member near the cap 1051 and its opening 1052. In other words, the shape of the plasma region can be adjusted by the shape of the cap 1051 and the members near the opening 1052.

  Here, attention is focused on the fact that the light emission in and around the plasma is a combination of light emission due to various phenomena as described above. If light is collected by dividing it into a plurality of parts (hereinafter referred to as “observation region”) and the light is subjected to spectroscopic measurement and calculation, calculation according to the phenomenon in each observation region can be performed. It becomes possible. Therefore, in the present embodiment, the light collecting unit 1005 collects light emitted from the plasma formed by the plasma forming unit 1004 by dividing it into a plurality of light guide paths.

  FIG. 5 is a cross-sectional view showing a cross section of the cap 1051 and a schematic configuration of the light collecting unit 1005.

  As shown in FIG. 5, the condensing unit 1005 condenses light from each part of the inside of the cap, the outside of the cap, and the opening 1052 for each observation region. The condensing unit 1005 is disposed in the light guide path 1061 composed of a plurality of optical fibers inserted into the cap 1051 up to the vicinity of the opening 1052, and the portion from each tip of the optical fiber to the outer surface of the cap 1051, respectively. And a concentrator 1062 for guiding the light into the corresponding optical fiber. Specifically, the condenser 1062 is an optical system constituted by a mirror, a lens, or a combination thereof having a focal point at a predetermined point. This optical system may be a combination of a plurality of mirrors such as a Cassegrain type optical system. Furthermore, the space between the primary mirror and the secondary mirror of the Cassegrain optical system may be filled with a translucent medium.

  As shown in FIG. 5, the concentrator 1062 may have a configuration in which one optical system is arranged for one optical fiber, or a configuration in which one optical system is arranged for a plurality of optical fibers. Also good. Note that it is desirable that the observation region is arranged in a row so as to be away from the region where discharge occurs, and the row may be a plurality of rows. If high spatial resolution is not required, the light to be measured may be introduced directly from the end of the optical fiber without passing through the condenser 1062.

  Here, attention is paid to the fact that the light emission in and around the plasma is a combination of light emission due to various phenomena if it is subdivided in the time direction. If the collected light is divided in the time direction and subjected to spectroscopic measurement and calculation, it is possible to perform calculation according to the phenomenon in that time zone in that region. Therefore, in the present embodiment, the light collecting unit 1005 performs spectroscopic measurement in a form that can divide the light emission caused by the plasma formed by the plasma forming unit 1004 in the time direction.

  Referring again to FIG. 1, the spectroscopic unit 1006 includes a plurality of spectroscopes 1071 </ b> A,..., N connected to receive light from the optical fibers of the condensing unit 1005. The spectroscopes 1071A,..., N are either those that perform wavelength dispersion by a diffraction grating, those that are performed by a refractive element such as a prism, or those that are performed by a multistage filter or dichroic mirror. There may be.

  The detection unit 1007 includes an optical sensor array installed for each of the spectroscopes 1071A,..., N so that the spectroscopes 1071A,. The optical sensor array has at least one row of photoelectric conversion elements arranged on the path of light wavelength-dispersed by the spectrometer 1071. The photoelectric conversion elements constituting this photoelectric conversion element array may be, for example, those using a solid-state imaging element such as an electric field coupling element (CCD), a complementary metal oxide semiconductor element (CMOS), a photodiode, A phototransistor or the like may be used. For example, a photomultiplier tube (PMT), an imaging tube, or the like may be used. However, in the present embodiment, as the phenomenon progresses, the light received by the detection unit 1007 is subdivided in the time direction and the spatial direction. Therefore, it is preferable to select a photoelectric conversion element having at least one of time response and sensitivity as the detection unit 1007. The start and end of the operation of these photoelectric conversion elements are performed according to the start and end signals of photoelectric conversion from the control unit 1010. Note that the photoelectric conversion element rows do not necessarily need to be one row. For example, they may be arranged in a matrix.

  Note that the spectroscopic unit 1006 and the detection unit 1007 may operate in a so-called kinetic mode in order to perform temporal decomposition. In this case, the optical system constituting the spectroscopic unit 1006 and the photoelectric conversion element of the detection unit 1006 have various configurations and arrangements for performing an operation in the kinetic mode. These are well known and will not be described here.

  Specifically, the signal processing unit 1008 is a multi-channel A / D converter. Each channel of the signal processing unit 1008 corresponds to an optical sensor array. The intensity of the output signal of each photoelectric conversion element constituting the detection unit 1006 is converted into digital data and output. At this time, the signal processing unit 1008 collects the digital data as a data set for each photosensor array that outputs the signal and for each signal input time, and represents the data indicating the channel and the signal input time in each data set. Append and output data. One data set represents a spectral spectrum of light received by a spectroscope corresponding to this data. In other words, this data set represents the intensity of each wavelength band component included in the light at a certain time from the portion corresponding to this data set in the plasma formation region and its vicinity.

  Hereinafter, calculation processing by the calculation unit 1009 will be described. Note that each function of the arithmetic unit 1009 described below is realized by computer hardware, a program executed on the computer hardware, and data that can be read or written by the computer hardware. Each of these functions and operations can be realized by a person skilled in the art based on the description in this specification. Such a program is also a piece of data and can be stored in a storage medium and distributed.

  FIG. 6 is a block diagram illustrating a functional configuration of the calculation unit 1009.

  As shown in FIG. 6, the calculation unit 1009 counts and stores the reception time of the notification by the control unit 1010, and the elapsed time from the reception time for each data set based on the input time given to the data set An elapsed time giving unit 1081 for giving and outputting data representing time and a storage unit 1082 for accumulating a data set outputted by the elapsed time giving unit 1081 are provided.

  In the storage unit 1082, in addition to the data set to be accumulated, a correspondence table 1083 representing the relationship between the elapsed time for each channel and the phenomenon related to light emission in the region corresponding to the channel is prepared and stored in advance. Yes. The correspondence table 1083 shows that for each channel described above, the phenomenon being performed at each time is any one of ion emission, atomic emission, molecular emission, scattering, bremsstrahlung, thermal excitation, excitation by collision of charged particles, and the like. Indicates whether or not The phenomena listed in these correspondence tables may be appropriately selected according to the usage environment and sample of the material analyzer 1000.

  The calculation unit 1009 further determines a phenomenon corresponding to each data set stored in the storage unit 1082 based on a plurality of analysis units 1084A,..., M that perform analysis processing corresponding to each phenomenon and a correspondence table 1083. , And a selector 1086 that distributes the data set to the analysis units 1084A,..., M based on the determination result by the determination unit 1085.

  The analysis units 1084A,..., M collate reference information 1090 such as a calibration curve, calibration curve, emission spectrum pattern for each chemical species, and the like, which are referred to when performing the assigned analysis processing, and the data set and reference information 1090. For example, a collation unit 1091 that generates a result of the analysis processing in charge and an output unit 1092 that integrates and outputs the processing result of the result generation unit 1091 are provided. For example, the reference information 1090 of the analysis unit corresponding to the ion emission includes a spectral pattern referred to at the time of ion identification, a calibration curve referred to for ion quantification, the height or height ratio of each peak, It includes information about emission of ions, such as a calibration curve representing the relationship between spectral characteristics such as width, duration, or peak wavelength deviation, and physical states such as ion concentration, mixing ratio, temperature, and the like.

  The collation unit 1091 performs collation processing as a target of collation with a data set to which only corresponding reference information is given, and as a result, component identification, quantification, physical state in the observation region and time corresponding to the data set Etc. are estimated. Various known methods may be used for component identification, quantification, physical state estimation, and the like. The method may use an arithmetic method such as multivariate analysis or pattern matching.

  The output unit 1092 receives the processing results of the matching unit 1091 for each data set, performs integration, averaging, or various statistical processes on the data sets, and outputs the results. The result output by the collation unit 1091 is an analysis result for a specific phenomenon that occurs when plasma is triggered.

[Preferred effects]
As described above, in the present embodiment, the plasma is expanded, sustained, and stabilized by the energy supply to the discharge plasma by electromagnetic waves and the plasma ejection mechanism from the cap. Therefore, it is possible to predict the progress of the phenomenon in each observation region in the time direction. In addition, it becomes possible to perform processing by decomposing light information in and near the plasma for each observation region and in the time direction. Then, based on the prediction of the progress in the time direction of the phenomenon in each observation region, it becomes possible to estimate which phenomenon corresponds to the light information from each observation region at each time. Furthermore, based on this estimation, the light information can be sorted for each phenomenon regardless of time and space.

  By performing an analysis process corresponding to the phenomenon on a group of information classified for each phenomenon, the number of combinations of information such as calibration curves and calibration curves and spectra is reduced. Therefore, the analysis process is speeded up. In addition, since interference of light information due to a plurality of phenomena is avoided, higher quality analysis becomes possible. Furthermore, since the spectrum is classified and processed for each phenomenon, for example, a sample such as protein or sugar whose molecular structure easily changes can be analyzed using plasma caused by discharge.

  Moreover, in the substance analyzer 1000 according to the present embodiment, the electromagnetic wave is confined in the cap by the cap, and leakage of the electromagnetic wave to the outside is suppressed. Therefore, the present invention can be applied to a sample or installation location that is easily affected by electromagnetic waves. In addition, the sensor probe portion composed of the plasma forming portion 1003 and the light condensing portion 1005 can be substantially configured with the same size as a spark plug for an internal combustion engine. It can be applied to various usage conditions such as mounting on a hand-held system or robot arm.

  In the above-described embodiment, the plasma is formed, controlled, and maintained by discharge and electromagnetic radiation. Control of discharge and electromagnetic wave radiation can be realized by an electric circuit and does not require a mechanical controller. Therefore, it is easy to construct a system with higher response than that using laser light that is turned on and off by a Q switch or the like.

  Further, according to the material analyzing apparatus 1000 according to the present embodiment, the plasma is expanded by electromagnetic waves. As the volume of the plasma increases, the amount of information obtained by focusing and spectroscopy increases. Therefore, high definition and high quality analysis becomes possible.

[Modification of First Embodiment]
In the above-described embodiment, the first input energy source 1001 has the same configuration as a general ignition signal source for an internal combustion engine, but the present invention is not limited to this. For example, if the power supply voltage is sufficiently high, boosting by the ignition coil may not be performed. Moreover, the energy for discharge does not necessarily need to be direct current, and may be alternating current.

  The second input energy source 1002 supplies an electromagnetic wave generated by electrical oscillation using an oscillation circuit such as a magnetron to the plasma forming unit 1003, but the present invention is not limited to this. For example, a laser beam or radiation may be supplied.

  In the above-described embodiment, the plasma forming unit 1003 transmits the energy from the first input energy source 1001 and the energy from the second input energy source 1002 to separate regions where plasma is formed. However, the present invention is not limited to this. For example, the energy from the first input energy source 1001 and the energy from the second input energy source 1002 may be superimposed and transmitted on the same path.

  In the above-described embodiment, the results of the analysis processing are collectively output for each phenomenon, but the present invention is not limited to this. If it is desired to obtain knowledge regarding the temporal change of the phenomenon or the spatial distribution of the phenomenon, the result of the analysis processing by the matching unit 1091 may be output without being integrated. Alternatively, the analysis results may be rearranged and output for each time or each observation region. For example, if the results of the analysis processing by the matching unit 1091 are output without being integrated, knowledge about the plasma spreading speed and the time evolution of the plasma extinction phenomenon can be obtained. Further, the correspondence table 1083 may be corrected / changed based on such information output without being integrated.

  In the above-described embodiment, the substance analyzing apparatus 1000 is operated by one-way process control from the control unit 1010 to each unit. However, the present invention is not limited to this, and the result of the arithmetic processing by the arithmetic unit 1009 may be fed back to the control of the control unit 1010. The feedback control makes it possible to adjust the time delay, the adjustment of the plasma scale, the optimization of the energy input operation with the control target of improving the S / N ratio, and the like. Further, for example, an analysis may be performed to detect that dirt is attached to the surface of the light collecting unit 1005 facing the plasma, and the result may be fed back. Furthermore, by controlling to change the intensity of electromagnetic wave radiation or the like, dirt may be removed by using the plasma itself or a shock wave generated by the generation of plasma.

  In addition, you may use the substance analyzer 1000 which concerns on this embodiment for the measurement of the working fluid of an internal combustion engine. In this case, the plasma forming unit 1003 and the light collecting unit 1004 can be disposed in any region where the working fluid passes, such as in the combustor, cylinder head, cylinder wall, exhaust pipe, catalyst, and the like. is there. The flow of the working fluid may be turbulent or laminar, and the flow velocity may be high or low. There may be a change in the flow rate or it may be steady. In this case, the analysis may be selected so as to obtain a result relating to the internal combustion engine. For example, engine performance, mounting conditions, fuel conditions, oxygen concentration, oxygen pressure, air pressure, air moisture, dielectric constant, fuel species or mixed impurities, suspended matters such as dust, heavy metals and soot, temperature (electronic temperature, rotation Temperature, vibration temperature, excitation temperature, etc.), residual or recirculated exhaust concentration or temperature or pressure, cycle fluctuations, cylinder-to-cylinder fluctuations, pulsation of working fluid, deposits on flow path walls or filters, deterioration of oil, etc. You may make it perform the analysis regarding a state etc. Furthermore, these analysis results may be given to the controller of the internal combustion engine and used for controlling the internal combustion engine.

  In the above-described embodiment, the data set used for the analysis may be only a data set corresponding to the spectral analysis result of light generated by one plasma formation, or light generated by a plurality of plasma formations. It may correspond to the spectroscopic analysis result. For example, the S / N ratio can be effectively improved by performing analysis using the results of spectral analysis of light generated by a plurality of times of plasma formation and integrating the results. Further, the number of discharges and the number of times of electromagnetic wave emission do not necessarily have a one-to-one correspondence, and electromagnetic waves may be emitted multiple times for one discharge. Moreover, you may make it discharge in multiple times within the period which has radiated | emitted electromagnetic waves. In this case, if the position of the discharge is changed every time the discharge is performed, the position of the plasma can be changed.

  In the cap, stray light is generated by reflection on the wall surface, which may interfere with spectroscopic analysis. In order to reduce this, the cap inner wall may be painted, embossed, or the like. When coating is performed, a low-reflectance paint may be used as the paint, or a fluorescent paint that absorbs light and emits fluorescence of a specific wavelength may be used. When the fluorescent paint is used, the wavelength component of the fluorescence emitted from the fluorescent paint may be excluded from the processing target in the analysis process.

[Small plasma probe device]
In order to perform 100% inspection or the like in order to comply with the RoHS regulation or the like, it is preferable that the plasma forming unit 1003 be downsized so that it can be incorporated into a production line. Therefore, the inventors of the present invention have developed a small plasma probe device having functions of a plasma forming unit 1003 and a condensing unit 1005. In this small plasma probe apparatus, a microwave radiation antenna, a spark discharge electrode, and an optical sensor are unitized so that generation and measurement of microwave plasma can be performed by a single probe apparatus.

  In this small plasma probe device, electric field simulation is performed on the shape and material of each probe tip part for efficiently transmitting microwaves and absorbing microwave energy in the microwave plasma generated by the spark discharge electrode. What is necessary is just to perform optimization design, such as a wave antenna and a spark discharge electrode for electric field concentration. In addition, a probe design that maximizes the light emission characteristics of each substance is performed so that various substances can be easily detected. Furthermore, even if this small plasma probe apparatus is reduced in size, durability, heat resistance, operability, etc. are ensured.

[Analysis method (evaluation and correction method for background radiation, emission of impurities, noise, etc.)]
In addition to the test substance, plasma emission includes continuous light and radiation from substances contained in the material due to bremsstrahlung. In addition, noise due to the dark current of the detector affects the measurement accuracy. In order to detect the emission of the test substance and perform a highly accurate analysis, it is important to evaluate and correct these background radiation, emission of impurities, and background noise. Regarding the evaluation and correction of the background radiation, emission of impurities, noise, and the like, for example, among the data set accumulated in the storage unit 1082 in the calculation unit 1009, the main characteristics of the spectrum are braking radiation, background radiation, and impurities. What is caused by light emission, noise, etc. is selected and analyzed for them. It is also effective to correct the reference information 1090 of other analysis units and the correspondence table 1083 based on the result of the analysis.

You may make it measure the plasma produced | generated with the small plasma probe apparatus mentioned above using a commercially available detailed spectrometer. The power of the microwave and the pulse width may be adjusted to change the plasma state, and the change in spectrum at that time may be measured. The gas temperature of the plasma may be evaluated from the band spectrum of N ₂ or OH, and the electron temperature may be evaluated from the light emission of the metal atom to clarify the relationship between the plasma state and the light emission of the test substance. When the emission line of the base material exists in the vicinity of the emission line of the test substance, the influence is examined. As described above, it is possible to establish an inspection method that does not require high resolution.

[Miniaturization of spectroscopic optics]
In order to simplify the operation of the system and reduce the cost, it is preferable to reduce the size and simplify the spectroscopic optical system. When a commercially available detailed spectroscope is used to measure the emission of plasma, skill is required for its control, measurement result evaluation, etc., and the apparatus is also expensive. Therefore, it is preferable to use an inexpensive and simple spectroscopic optical system having only the minimum functions necessary for the inspection apparatus.

  That is, an optical system including the optical filter and the photodiode detector can be configured. In addition, a commercially available simple spectroscope may be incorporated.

[Configuration of optical system by optical filter and photodiode detector]
Based on the above-described inspection method, an optical filter suitable for the wavelength of the emission line of the inspection substance was selected to obtain a filter set for inspection of the RoHS command substance. The optical system was miniaturized by using a photodiode as a detector. In addition, the filter set is replaceable, and is designed to be compatible with regulations other than the RoHS directive.

[Create database]
In order to improve the quantitativeness of measurement, it is preferable to create a calibration curve and create a database. Plasma spectroscopic measurement is capable of simultaneous multi-element measurement and is excellent for qualitative analysis. On the other hand, there is a problem that it lacks quantitativeness in principle. Therefore, a calibration curve using a standard substance is created. In addition, since the RoHS directive covers all home appliances, there are a wide variety of products that need to be inspected. By measuring various substances and creating a database, and comparing them with the measurement results, quantitativeness can be improved. The calibration curve itself can be evaluated by a statistical method such as multivariate analysis or principal component analysis. This evaluation may be implemented in advance as software.

[Threshold of hazardous substances and analysis method]

  Further, the processing and operation after the light condensing can be applied to plasmas other than the plasma formed by the discharge. For example, the spectroscopic analysis and analysis processing according to the present embodiment may be applied to plasma formed in response to flame, laser-induced breakdown, emission of thermoelectrons due to heating, shock waves, and the like.

  The embodiment disclosed this time is merely an example, and the scope of the present invention is not limited to only the above-described embodiments. The scope of the present invention is indicated by each claim in the claims after considering the description of the specification and the drawings, and includes all modifications within the meaning and scope equivalent to the words described therein. It is a waste.

It is a block diagram which shows schematic structure of the substance analyzer which concerns on this invention. It is a block diagram which shows the structure of the 1st input energy source of the substance analyzer which concerns on this invention. It is a block diagram which shows the structure of the 2nd input energy source of the substance analyzer which concerns on this invention. It is a perspective view which shows the structure of the plasma formation part of the substance analyzer which concerns on this invention. It is sectional drawing which shows the schematic structure of the cross section of the cap of the substance analyzer which concerns on this invention, and a condensing part. It is a block diagram which shows the functional structure of the calculating part of the substance analyzer which concerns on this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1000 Material analyzer 1001 1st input energy source 1002 2nd input energy source 1003 Plasma formation part 1005 Condensing part 1006 Spectroscopic part 1007 Detection part 1008 Signal processing part 1009 Calculation part 1010 Control part

Claims (5)

Electromagnetic wave plasma generating means for assisting the microplasma generated by the high voltage discharge with electromagnetic energy and exciting or plasmaizing at least a part of the object to be measured;
Spectroscopic analysis means, and
A substance that generates plasma by the plasma generation means, excites or plasmas at least a part of an object to be measured, and detects a specific substance by spectroscopic analysis of excitation light or light emission by the spectroscopic analysis means Analysis equipment. The substance analysis apparatus according to claim 1, wherein the electromagnetic wave energy is generated by a magnetron. The spectroscopic analysis means includes:
A plurality of light collecting means for collecting light from a plurality of observation regions,
A plurality of spectroscopic means respectively connected to the light collecting means to receive light from the light collecting means;
Detecting means for detecting, for each wavelength component, light wavelength-dispersed by each of the spectroscopic means;
Computation means for performing analysis processing on the detection result by the detection means,
The substance analyzing apparatus according to claim 1, wherein the calculation unit divides the detection result of the detection unit in time and performs an analysis process on the detection result at each time in each observation region. Furthermore, a correspondence table showing the relationship between the phenomenon occurring in each observation area and the time zone in which the phenomenon occurs is prepared in advance.
The substance analyzing apparatus according to claim 3, wherein the calculation unit performs analysis processing by classifying the detection result of each observation region and each time generated by time division of the detection result for each phenomenon. The electrode for discharge and the antenna for supplying electromagnetic energy in the plasma generating means combined with the electromagnetic wave and the optical system for condensing in the spectroscopic analyzing means are integrated to form a probe arranged close to the object to be measured. The substance analyzing apparatus according to claim 1, wherein the substance analyzing apparatus is characterized in that:

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