JP2010021243A5 - - Google Patents
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- JP2010021243A5 JP2010021243A5 JP2008178863A JP2008178863A JP2010021243A5 JP 2010021243 A5 JP2010021243 A5 JP 2010021243A5 JP 2008178863 A JP2008178863 A JP 2008178863A JP 2008178863 A JP2008178863 A JP 2008178863A JP 2010021243 A5 JP2010021243 A5 JP 2010021243A5
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- plasma processing
- dielectric plate
- holding table
- injector base
- processing apparatus
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Description
図4に示すように、インジェクターベース81は、誘電体板16の下面63に達しない範囲で、保持台14に対向する壁面82から保持台14側に延びる突出部83を含む。具体的には、図4中に示す保持台14の上面84から誘電体板16の下面63までの距離L1よりも、保持台14の上面84から突出部83の先端部85までの距離L2の方が長く構成されている。また、突出部83の先端部85には、供給孔86が設けられている。 As shown in FIG. 4, the injector base 81 includes a protruding portion 83 extending from the wall surface 82 facing the holding table 14 toward the holding table 14 in a range not reaching the lower surface 63 of the dielectric plate 16. Specifically, the distance L from the upper surface 84 of the holding table 14 to the tip 85 of the protrusion 83 is larger than the distance L 1 from the upper surface 84 of the holding table 14 to the lower surface 63 of the dielectric plate 16 shown in FIG. 2 is longer. In addition, a supply hole 86 is provided at the distal end portion 85 of the protruding portion 83 .
Claims (5)
前記処理容器内に配置され、その上に前記被処理基板を保持する保持台と、
プラズマ励起用のマイクロ波を発生させるマイクロ波発生器と、
前記保持台と対向する位置に設けられ、マイクロ波を前記処理容器内に導入する誘電体板と、
前記保持台に保持された前記被処理基板の中央領域に向かってプラズマ処理用の反応ガスを供給する反応ガス供給部とを備えるプラズマ処理装置であって、
前記反応ガス供給部は、前記保持台と対向する前記誘電体板の壁面よりも前記誘電体板の内方側の後退した位置に配置されるインジェクターベースを含み、
前記インジェクターベースには、プラズマ処理用の反応ガスを前記処理容器内に供給する供給孔が設けられている、プラズマ処理装置。 A processing container for performing plasma processing on the substrate to be processed therein;
A holding table disposed in the processing container and holding the substrate to be processed thereon;
A microwave generator for generating microwaves for plasma excitation;
A dielectric plate provided at a position facing the holding table, and for introducing a microwave into the processing container;
A plasma processing apparatus comprising: a reactive gas supply unit configured to supply a reactive gas for plasma processing toward a central region of the substrate to be processed held by the holding table;
The reaction gas supply unit includes an injector base disposed at a position retracted inward of the dielectric plate from the wall surface of the dielectric plate facing the holding table,
The plasma processing apparatus, wherein the injector base is provided with a supply hole for supplying a plasma processing reaction gas into the processing container.
前記インジェクターベースには、前記供給孔が前記誘電体板の径方向中央に位置するように設けられている、請求項1〜3のいずれかに記載のプラズマ処理装置。 The plasma processing apparatus according to claim 1, wherein the injector base is provided so that the supply hole is positioned at a radial center of the dielectric plate.
前記処理容器内に配置され、その上に前記被処理基板を保持する保持台と、 A holding table disposed in the processing container and holding the substrate to be processed thereon;
プラズマ励起用のマイクロ波を発生させるマイクロ波発生器と、 A microwave generator for generating microwaves for plasma excitation;
前記保持台と対向する位置に設けられ、マイクロ波を前記処理容器内に導入する誘電体板と、 A dielectric plate provided at a position facing the holding table, and for introducing a microwave into the processing container;
前記保持台に保持された前記被処理基板の中央領域に向かってプラズマ処理用の反応ガスを供給する反応ガス供給部とを備えるプラズマ処理装置であって、 A plasma processing apparatus comprising: a reactive gas supply unit configured to supply a reactive gas for plasma processing toward a central region of the substrate to be processed held by the holding table;
前記反応ガス供給部は、前記保持台と対向する前記誘電体板の壁面よりも前記誘電体板の内方側の後退した位置に配置されるインジェクターベースを含み、 The reaction gas supply unit includes an injector base disposed at a position retracted inward of the dielectric plate from the wall surface of the dielectric plate facing the holding table,
前記インジェクターベースの材質は、アルマイト処理を施したアルミニウムまたはY The injector base material is anodized aluminum or Y 22 OO 33 (イットリア)コートアルミニウムであり、(Yttria) is coated aluminum,
前記インジェクターベースは、前記誘電体板に設けられた前記インジェクターベースを収容するベース収容部に収容されており、 The injector base is housed in a base housing portion that houses the injector base provided on the dielectric plate,
前記インジェクターベースと前記ベース収容部との間には、Oリングが介在しており、 An O-ring is interposed between the injector base and the base accommodating portion,
前記インジェクターベースには、プラズマ処理用の反応ガスを前記処理容器内に供給する供給孔が設けられており、 The injector base is provided with a supply hole for supplying a reaction gas for plasma processing into the processing container,
前記供給孔は、前記保持台と対向する前記誘電体板の壁面である前記誘電体板の下面よりも上方側に設けられている、プラズマ処理装置。 The plasma processing apparatus, wherein the supply hole is provided above a lower surface of the dielectric plate which is a wall surface of the dielectric plate facing the holding table.
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008178863A JP5304061B2 (en) | 2008-07-09 | 2008-07-09 | Plasma processing equipment |
PCT/JP2009/060916 WO2010004836A1 (en) | 2008-07-09 | 2009-06-16 | Plasma processing device |
CN200980125715.7A CN102084469B (en) | 2008-07-09 | 2009-06-16 | Plasma processing device |
KR1020107028917A KR101174277B1 (en) | 2008-07-09 | 2009-06-16 | Plasma processing device |
US13/003,102 US8800484B2 (en) | 2008-07-09 | 2009-06-16 | Plasma processing apparatus |
TW98123004A TWI425883B (en) | 2008-07-09 | 2009-07-08 | Plasma processing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008178863A JP5304061B2 (en) | 2008-07-09 | 2008-07-09 | Plasma processing equipment |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010021243A JP2010021243A (en) | 2010-01-28 |
JP2010021243A5 true JP2010021243A5 (en) | 2012-02-23 |
JP5304061B2 JP5304061B2 (en) | 2013-10-02 |
Family
ID=41705873
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008178863A Expired - Fee Related JP5304061B2 (en) | 2008-07-09 | 2008-07-09 | Plasma processing equipment |
Country Status (1)
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JP (1) | JP5304061B2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5955062B2 (en) * | 2011-04-25 | 2016-07-20 | 東京エレクトロン株式会社 | Plasma processing equipment |
JP5525504B2 (en) * | 2011-11-08 | 2014-06-18 | 東京エレクトロン株式会社 | Plasma processing method and plasma processing apparatus |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5082229B2 (en) * | 2005-11-29 | 2012-11-28 | 東京エレクトロン株式会社 | Plasma processing equipment |
JP4833778B2 (en) * | 2006-02-13 | 2011-12-07 | 東京エレクトロン株式会社 | Substrate processing apparatus and substrate processing method |
KR101204614B1 (en) * | 2008-02-20 | 2012-11-23 | 도쿄엘렉트론가부시키가이샤 | Gas supply device |
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2008
- 2008-07-09 JP JP2008178863A patent/JP5304061B2/en not_active Expired - Fee Related
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