JP2009293933A - Probe support member and magnetic field distribution measuring device using the same - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To easily support a measuring probe at an optional height (space position), when supporting the measuring probe for measuring the intensity of electromagnetic waves. <P>SOLUTION: A pole 12, constituted of a non-magnetic and non-conductive material, having a height higher than that of measurement range in the vertical (perpendicular) direction is erected on a member base 11. A moving member 13, constituted of a non-magnetic and non-conductive material, capable of positioning at an optional position is set at the pole 12, and a measurement probe 2 is attached to the moving member 13. Thus, only by moving the moving member 13 on the pole 12, the positioning at an optional height (spatial position) of the measuring probe 2 can be performed easily and accurately, to accurately measure the electromagnetic waves. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a device for measuring the distribution of a magnetic field generated in an electrical product such as a communication device or a household electrical appliance, and a member used in the device for supporting a measurement probe.

  Conventionally, there is a concern about the influence of exposure to the human body of electromagnetic waves emitted from the electrical products. About the measuring method of the electromagnetic waves emitted from a household appliance, it was enacted by IEC (International Electrotechnical Commission) in October, 2005 (nonpatent literature 1). Among the home appliances, IH cookers are also included.

According to the measuring method, for example, with the IH cooker, as shown in FIG. 6, at a position 30 cm away from the entire circumference in the horizontal direction (positions A, B, C, D) It is stipulated that it must be measured in range. In the case of a mobile phone, measurement is performed at a position 22 cm away in the horizontal direction. In such measurement, in the prior art, a tripod is used as a probe support member, and the measurement probe is fixed to the tripod for measurement.
IEC62233 (Measurement method of electromagnetic field of electric appliances for household and similar uses related to human exposure)

  In the above-described prior art, in order to be affected by the electromagnetic field, the tripod cannot be made of metal in the vicinity of the measurement probe and on the front side, and uses a non-metal such as wood or resin. There is a need. There are also tripods using such materials in many parts, but such tripods are not equipped with elevators, and it is difficult to raise and lower them in the wide range mentioned above. The actual situation is changing the height. In such a case, the position of the tripod itself changes, and there is a problem that accurate positioning cannot be performed and high-precision measurement cannot be performed. There is also a problem that the work is complicated.

  An object of the present invention is to provide a probe support member that can easily position a measurement probe easily and a magnetic field distribution measurement apparatus using the probe support member.

  A probe support member according to one aspect of the present invention is a member that supports a measurement probe that measures the intensity of electromagnetic waves, and is a base that is installed on a floor surface, and is erected on the base and is nonmagnetic and non-magnetic. A column made of a conductive material and having a height not less than the vertical measurement range, and a column made of the non-magnetic and non-conductive material, which can move on the column and can be positioned at any position, and the measurement And a moving member to which the probe is attached (Claim 1).

  According to the above configuration, when supporting the measurement probe for measuring the intensity of electromagnetic waves, it is erected on the base, is made of a non-magnetic and non-conductive material, and has a height higher than the measurement range in the vertical (vertical) direction. A column having a thickness is used. A moving member made of the non-magnetic and non-conductive material and positioned at an arbitrary position is provided on the support column, and the measurement probe is attached to the moving member. Therefore, it is possible to easily perform accurate positioning at an arbitrary height (spatial position) of the measurement probe and perform high-precision measurement only by moving the moving member along the support column.

  In the above configuration, the support piece extending forward from the vicinity of the upper end of the support column, and the first index indicating the height is attached after passing from the vicinity of the free end of the support piece and passing near the front end of the measurement probe. It is desirable to further comprise a wire (Claim 2).

  According to said structure, the 1st parameter | index (scale) showing height is attached | subjected to the wire which consists of nonmagnetic and nonelectroconductive materials, such as a thread | yarn of a natural or synthetic fiber, and a resin thread | yarn, for example Then, the wire is suspended from the vicinity of the upper end of the column to the vicinity of the front end of the measurement probe by the support piece. Therefore, it is possible to easily confirm at which height (space position) the front end of the measurement probe is located.

  In any one of the configurations described above, a weight is provided at the tip of the wire, and the base has a second index for ensuring the vertical of the column by aligning the tip of the weight on the upper surface. The bottom surface is preferably provided with a height-adjustable pedestal (claim 3).

  According to said structure, weights, such as a cone shape, are provided in the front-end | tip of a wire, and the front-end | tip of the said weight is provided by providing the 2nd parameter | index of a point or a ring on the upper surface of a base corresponding to this. By aligning with this second index, the vertical of the column can be secured. In order to perform such vertical alignment, three or more height-adjustable pedestals are provided on the bottom surface of the base. Thereby, the verticality of the column can be easily ensured regardless of the state of the floor surface.

  In any one of the above-described configurations, the support column further includes a spacing member that is separately attached to the moving member so as to be positioned at an arbitrary position, and the spacing member is made of the nonmagnetic and nonconductive material. It is desirable that the distance in the horizontal direction between the measurement probe and the measurement target device is kept constant by contacting the measurement target device with the tip.

  According to this configuration, the distance in the horizontal direction can be easily adjusted by matching the height of the interval holding member with the measurement target device and bringing its tip into contact with the measurement target device.

  In any one of the configurations described above, the support column includes a pair of left and right guide rails having a U-shaped horizontal cross section and openings facing each other, and a rack rail provided on at least one front surface of the guide rail. The movable member includes a support member on which the measurement probe is mounted and a pair of left and right slides that are fitted inside the guide rail and are slidable in the vertical direction while supporting the support member horizontally. It is desirable that the moving piece and the supporting member be pivotally supported on the base end side and the free end side be provided with a wedge piece fitted into the rack of the rack rail.

  According to said structure, height adjustment can be easily performed within the range of the stage of a rack by inserting a wedge piece in the arbitrary racks of a rack rail.

  A magnetic field distribution measuring device according to another aspect of the present invention includes a measurement probe that measures the intensity of electromagnetic waves, a data collection device that collects measurement results of the measurement probe, and any one of claims 1 to 5. The probe support member described above is provided (claim 6).

  According to said structure, the magnetic field distribution which can perform exact positioning in arbitrary heights (space position) of a measurement probe easily, and can perform a highly accurate measurement by using the said probe support member. A measuring device can be realized.

  According to the probe support member and the magnetic field distribution measurement apparatus using the probe support member according to the present invention, it is possible to easily and accurately measure the measurement probe at an arbitrary height (spatial position) only by moving the moving member along the support column. Accurate positioning can be performed. Therefore, the electromagnetic wave measurement according to the IEC standard can be performed accurately.

  FIG. 1 is a side view of a probe support member 1 according to an embodiment of the present invention, FIG. 2 is a rear view thereof, and FIG. 3 is a plan view thereof. The magnetic field distribution measurement apparatus according to the present embodiment is described with reference to FIG. 6 described above, the measurement probe 2 that measures the intensity of electromagnetic waves, the data collection apparatus 3 that collects and analyzes the measurement results of the measurement probe 2, and The probe support member 1 that supports the measurement probe 2 is provided. Since the configuration other than the probe support member 1 is already present, the description thereof is omitted. Moreover, in the magnetic field distribution measuring apparatus of this embodiment, although used as an example for the measurement of the electromagnetic field from the IH cooker 4 as shown in FIG. 6, it is used for the measurement of the electromagnetic field from other electrical products. It goes without saying that it may be done. The measurement probe 2 and the data collection device 3 measure electromagnetic waves in the range of 10 Hz to 400 kHz, for example.

  The probe support member 1 is generally a base 11 installed on the floor, and is erected on the base 11 and is made of a material that is nonmagnetic and nonconductive, for example, has substantially the same permeability as air, and is vertical. The measurement probe 2 is attached to the support column 12 having a height equal to or greater than the measurement range H in the direction, and made of the non-magnetic and non-conductive material, which can move on the support column 12 and be positioned at an arbitrary position. The moving member 13 is provided. As described above, the measurement range H is a range obtained by combining the upper H1 = 1 m and the lower H2 = 50 cm in the IH cooker 4.

  In supporting the measurement probe 2 in this way, a support column 12 is erected on the base 11, a movable member 13 that can be positioned at an arbitrary position is provided on the support column 12, and the measurement probe 2 is attached to the movable member 13. It has been. For this reason, it is possible to easily perform accurate positioning of the measurement probe 2 at an arbitrary height (spatial position) only by moving the moving member 13 along the column 12. And since such exact positioning is made | formed, a highly accurate electromagnetic wave measurement can be performed with the measurement probe 2. FIG.

  FIG. 4 is a perspective view showing one structural example of the moving member 13 assembled to one side of the support column 12. The column 12 has a U-shaped horizontal cross section and a pair of left and right guide rails 12a and 12b whose openings are opposed to each other, a connecting member 12c that connects the upper ends of the guide rails 12a and 12b to a gate shape, And a rack rail 12d provided on the front surface of at least one of the guide rails 12a and 12b.

  On the other hand, the moving member 13 fits inside the support member 13a on which the measurement probe 2 is mounted and the guide rails 12a and 12b, and is slidable in the vertical direction while supporting the support member 13a horizontally. A pair of sliding pieces 13b, 13c, and a wedge piece 13d whose base end side is pivotally supported by the support member 13a and whose free end side is fitted in the rack of the rack rail 12d are configured. The measurement probe 2 is appropriately attached to the support member 13a by belt fastening or clamping by a clamper.

  Positioning of the moving member 13 is simply achieved by fitting the wedge piece 13d into an arbitrary rack of the rack rail 12d. Therefore, the user can easily adjust the height of the moving member 13 within the range of the rack stage of the rack rail 12d.

  Referring to FIG. 3, a support piece 12 e is formed to extend forward from a connecting member 12 c provided at the upper end of the column 12. As shown in FIGS. 1 and 2, a wire 14 is suspended from the vicinity of the free end of the support piece 12e. The wire 14 is provided with a first index (scale) indicating the height, and this wire 14 passes near the front end of the measurement probe 2. The wire 14 is made of a non-magnetic and non-conductive material such as a natural or synthetic fiber thread or a resin thread. Thereby, it is possible to easily confirm at which height (space position) the front end of the measurement probe 2 is located.

  A conical weight 15 is attached to the tip of the wire 14. Corresponding to the weight 15, the top of the base 11 is aligned with the tip of the weight 15, as shown in FIG. The second index 16 is formed. Corresponding to this, height-adjustable leg bases 17 are provided at the four corners of the bottom surface of the base 11. By adjusting the height of each footrest 17 and adjusting the tip of the weight 15 to coincide with the second index 16, it is possible to easily ensure the vertical of the column 12 regardless of the state of the floor surface. Is possible.

  Separately from the moving member 13, a pair of left and right spacing members 18 are attached to the column 12. The spacing member 18 can be positioned at an arbitrary position of the support column 12 by a bolt 19 and is made of the nonmagnetic and nonconductive materials. As shown in FIG. 3, the distance W in the horizontal direction between the measurement probe 2 and the IH cooker 4 is determined by bringing the tip of the spacing member 18 into contact with the IH cooker 4 that is the measurement target device. Can be easily adapted. The distance W is 30 cm in the IH cooker 4 as described above. An index 20 indicating the height of the spacing member 18 from the floor is attached to the side surface of the support column 12.

  The procedure of electromagnetic wave measurement of the IH cooker 4 by the magnetic field distribution measuring apparatus of this embodiment will be described. Note that at least a scale of +1 m or more and −50 cm or more is attached to the wire 14 from the reference of 0 cm as a first index (scale).

  First, the upper surface of the spacing member 18 is generally adjusted to the height of the upper surface of the IH cooker 4. Then, the height of each leg base 17 is adjusted, and vertical alignment is performed so that the tip of the weight 15 matches the second index 16. If necessary, the height of the upper surface of the spacing member 18 is adjusted again. Thereafter, the wire 14 is wound up by a reel (not shown) provided on the support piece 12 e so that the reference of 0 cm coincides with the upper surface of the spacing member 18. Thereby, the relative height adjustment of the measurement probe 2 with respect to the IH cooker 4 can be easily performed on the basis of the scale of the wire 14.

  Thereafter, the moving member 13 is appropriately moved in the range of 0 cm to +1 m and 0 cm to −50 cm in accordance with the provisions of IEC62233, and the moving member 13 is positioned using the measurement probe 2 as a desired position. This positioning is simply achieved by fitting the wedge piece 13d into an arbitrary rack of the rack rail 12d as described above. With the measurement probe 2 positioned at a predetermined position, the measurement probe 2 is operated to perform electromagnetic wave measurement. The measurement result is collected by the data collection device 3. In the following, the height position of the measurement probe 2 is changed, and the same number of similar electromagnetic wave measurements are performed.

It is a side view of the probe support member concerning one embodiment of the present invention. It is a rear view of the probe support member. It is a top view of the probe support member. It is a perspective view which shows one structural example of the moving member on one side of the support | pillar in the said probe support member. It is a figure for demonstrating the vertical alignment of the said probe support member. It is a figure for demonstrating the measuring method of the electromagnetic waves in an IH cooking appliance.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Probe support member 2 Measurement probe 3 Data collection device 4 IH cooker 11 Base 12 Support | pillar 12a, 12b Guide rail 12c Connection member 12d Rack rail 12e Support piece 13 Moving member 13a Support member 13b, 13c Sliding piece 13d Wedge piece 14 Wire 15 Weight 16 Second indicator 17 Leg base 18 Spacing member 19 Bolt 20 Indicator

Claims (6)

A member that supports a measurement probe for measuring the intensity of electromagnetic waves,
A base installed on the floor;
Standing on the base, made of non-magnetic and non-conductive material, and having a height equal to or higher than the vertical measurement range;
A moving member made of the non-magnetic and non-conductive material, movable on the support column, positionable at an arbitrary position, and attached to the measurement probe;
A probe support member comprising: A support piece extending forward from near the upper end of the column;
A wire hanging from the vicinity of the free end of the support piece, passing near the front end of the measurement probe, and attached with a first index representing the height;
The probe support member according to claim 1, further comprising: A weight is provided at the tip of the wire,
The base is provided with a second index for ensuring the verticality of the column by aligning the tip of the weight on the upper surface thereof, and a leg base whose height can be adjusted on the bottom surface.
The probe support member according to claim 1 or 2, wherein In the support column, in addition to the moving member, the support column further includes a spacing member attached so as to be positioned at an arbitrary position,
The spacing member is made of the non-magnetic and non-conductive material, and the tip is in contact with the measurement target device, thereby maintaining a constant horizontal distance between the measurement probe and the measurement target device.
The probe support member according to any one of claims 1 to 3, wherein: The support column is configured to include a pair of left and right guide rails having a U-shaped horizontal cross section and openings facing each other, and a rack rail provided on the front surface of at least one of the guide rails,
The moving member includes a support member on which the measurement probe is mounted, a pair of left and right sliding pieces that are fitted inside the guide rail, and are slidable in the vertical direction while horizontally supporting the support member, The base end side is pivotally supported by the support member, and the free end side is configured to include a wedge piece that fits into the rack of the rack rail.
The probe support member according to any one of claims 1 to 4, wherein the probe support member is provided. A measurement probe for measuring the intensity of electromagnetic waves;
A data collection device for collecting measurement results of the measurement probe;
The probe support member according to any one of claims 1 to 5,
A magnetic field distribution measuring apparatus comprising:

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