JP2009270917A - Mounting structure of laser type gas analysis meter - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a mounting structure of a laser type gas analysis meter for reducing the load of maintenance while securing the exact measurement result. <P>SOLUTION: In this mounting structure of the laser type gas analysis meter, two sensor units are attached to a closed gas channel 30 in which gas to be measured flows so that the gas channel 30 is gripped horizontally. A flange section for damming the liquid toward a window 14 is formed on a purge pipe 15 included in the sensor unit. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a laser gas analyzer mounting structure, and more particularly to a laser gas analyzer mounting structure for detecting the concentration of a measurement object in a measurement gas.

  2. Description of the Related Art Conventionally, a laser type gas analyzer that detects the concentration of a measurement object in a measurement gas by irradiating the measurement gas with laser light is known.

For example, in Japanese Patent Laid-Open No. 2000-19109 (Patent Document 1), a semiconductor laser is used as a light source, an absorption spectrum of a measurement gas is measured, and an object to be measured in the measurement gas is identified from the spectrum. Methods for analyzing ratios and concentrations are described.
Japanese Unexamined Patent Publication No. 2000-19109

  The laser gas analyzer as described above is configured, for example, by attaching two sensor units to a gas flow path through which a measurement gas flows so as to sandwich the gas flow path in the horizontal direction. A window for protecting the light projecting unit and the light receiving unit is provided between the light projecting unit for projecting the laser light, the light receiving unit for receiving the laser light, and the gas flow path through which the measurement gas flows. . Further, a purge gas is supplied between the window portion and the gas flow path in order to suppress the contamination of the window portion due to condensation or adhering substances.

  As described above, by attaching the two sensor units so as to sandwich the gas flow path in the horizontal direction, liquid such as dew condensation water or oil contained in the measurement gas can flow from the front end side of the purge pipe through which the purge gas flows to the window section. It is suppressed that it flows in toward.

  In this way, even if the two sensor units are arranged in the horizontal direction, if the optical axes of the light projecting unit and the light receiving unit are aligned while absorbing the error at the installation site, the sensor unit is completely horizontal. In most cases, the sensor unit cannot be installed. However, even in such a case, it has been considered that the inflow of the liquid into the purge pipe is suppressed because the purge pipe is attached substantially horizontally even if it is not completely horizontal.

  However, in reality, there has been a situation in which foreign matter or moisture adheres to the window part at an earlier stage than initially assumed. The purge gas contained no foreign matter or moisture, and it was unclear why the foreign matter or moisture adhered to the window. On the other hand, due to the investigation by the inventors of the present application, the inflow of condensed water or oil occurs even in the purge pipe mounted substantially horizontally, and this becomes mist and adheres to the window portion by the ejection of the purge gas. It became clear that

  There is a concern that the deposits as described above hinder the normal light projecting operation and light receiving operation of the laser light and affect the measurement result. Therefore, in the laser analyzer in which deposits easily adhere to the window portion, it is necessary to increase the frequency of maintenance for removing deposits on the window portion in order to perform accurate measurement.

  The present invention has been made in view of the above problems, and an object of the present invention is to attach a laser gas analyzer capable of reducing the maintenance burden while ensuring an accurate measurement result. To provide a structure.

  The mounting structure of the laser type gas analyzer according to the present invention is a laser in which a first sensor unit and a second sensor unit are attached to a sealed gas passage through which a measurement gas flows so as to sandwich the gas passage in the horizontal direction. It is a mounting structure of a gas analyzer.

  The “horizontal direction” mentioned here is not limited to a complete horizontal direction, but is a concept including a substantially horizontal direction having a slight inclination angle (for example, about 2 ° or less).

  In the mounting structure, the first sensor unit projects a laser beam toward the gas flow channel, and is located on the gas flow channel side with respect to the light projecting unit, and transmits the laser beam from the light projecting unit. A first laser beam path, a first laser beam path positioned between the first window unit and the gas flow path, and a first laser beam path provided in the vicinity of the first window unit, And a first purge gas supply unit that ejects the purge gas toward the target. The second sensor unit includes a light receiving portion that receives the laser light projected from the light projecting portion, and a second window portion that is located on the gas flow path side with respect to the light receiving portion and transmits the laser light directed to the light receiving portion. And a second laser beam passage located between the second window portion and the gas flow path, and a second laser beam passage in the vicinity of the second window portion, and a purge gas is ejected toward the second laser beam passage A second purge gas supply unit. And the blocking part which dams the liquid which goes to the 1st window part side and the 2nd window part side is formed on the 1st laser beam path and the 2nd laser beam path, respectively.

  According to the above configuration, when the liquid flows into the first laser beam path and the second laser beam path by forming the damming portion that dams the liquid toward the first window portion side and the second window portion side. Moreover, it can suppress that the said liquid reaches | attains the 1st window part and the 2nd window part vicinity. As a result, dirt on the first window portion and the second window portion can be suppressed, and the burden of maintenance can be reduced while ensuring an accurate measurement result.

  In one aspect, in the above laser gas analyzer mounting structure, the first laser beam passage and the second laser beam passage each have a pipe portion and a flange portion, and the damming portion has a flange portion of the pipe portion. It is formed by protruding toward the inner diameter side. By doing in this way, a laser beam path and a damming part can be comprised by one member.

  Here, preferably, the end of the pipe portion on the flange portion side is expanded in diameter. By doing in this way, since a recessed part can be formed in the front surface of a damming part, the damming effect of the liquid by a damming part can be heightened.

  In another aspect, in the laser gas analyzer mounting structure, the first laser beam passage and the second laser beam passage each have two tubular members, and the damming portion has an inner diameter of the two tubular members. It is formed by making them different from each other. By doing in this way, a dam part can be easily formed using the internal-diameter difference of two tubular members.

  Preferably, the laser gas analyzer mounting structure further includes a discharge unit that discharges the liquid blocked by the blocking unit to the gas channel on the gas channel side with respect to the blocking unit. By doing so, the liquid that has flowed into the first laser light path and the second laser light path and has reached the damming portion can be returned to the gas flow path. Reaching the window can be more reliably suppressed.

  According to the present invention, in the laser gas analyzer mounting structure, it is possible to reduce the maintenance burden while ensuring an accurate measurement result.

  Embodiments of the present invention will be described below. Note that the same or corresponding parts are denoted by the same reference numerals, and the description thereof may not be repeated.

  Note that in the embodiments described below, when referring to the number, amount, and the like, the scope of the present invention is not necessarily limited to the number, amount, and the like unless otherwise specified. In the following embodiments, each component is not necessarily essential for the present invention unless otherwise specified. In addition, when there are a plurality of embodiments below, it is planned from the beginning to appropriately combine the configurations of the embodiments unless otherwise specified.

Applications of the laser gas analyzer according to the present embodiment are various. For example, the combustion process can be controlled by measuring the O ₂ concentration in a furnace such as a garbage incinerator. As another specific example, for example, safety monitoring can be performed by measuring the O ₂ concentration in the combustible gas in an oil plant or the like. As yet another specific example, the amount of NH ₃ input can be controlled, for example, by measuring the NH ₃ concentration downstream of the denitration facility in a thermal power plant or the like. Furthermore, it can also be used for safety monitoring by measuring CO concentration, measuring H ₂ O concentration in chlorine gas, and measuring NH ₃ concentration in exhaust gas. Below, the example which measures a process gas component in a chemical plant etc. is demonstrated.

FIG. 1 is a system diagram of a laser gas analyzer including a laser gas analyzer mounting structure according to the present embodiment. In FIG. 1, “P _T ” indicates a phototransistor, and “E / O” indicates an electrical / optical converter.

  Referring to FIG. 1, the laser gas analyzer according to the present embodiment is an analyzer that measures the concentration of a measurement gas (process gas) at a sample point. The laser gas analyzer includes a central unit 100, a cable 200, and a measurement unit 300.

  The central unit 100 includes a diode laser 110, an optical coupler 120, a reference cell 130, a signal processing unit 140, and a CPU 150. The cable 200 includes three cables 210, 220, and 230. The measurement unit 300 includes three measurement units 310 (channel 1), 320 (channel 2), and 330 (channel 3).

Next, the operation principle of the laser gas analyzer shown in FIG. 1 will be described. Molecules such as O ₂ , CO, CO ₂ , HF, NH ₃ , HCl, and H ₂ O contained in the process gas, which is a measurement gas, have characteristics of absorbing laser light in the near infrared region. It is possible to detect the concentration of specific molecules contained in the process gas from the absorption intensity of the laser light projected toward the gas. Since this absorption band (wavelength) is different for each molecule, by projecting a laser beam that matches the absorption wavelength of the molecule to be measured, the gas concentration of a specific component can be measured without interference from other molecules. can do.

  Near-infrared wavelength laser light generated by the diode laser 110 built in the central unit 100 reaches the measuring units 310, 320, and 330 via the optical coupler 120 and the cables 210, 220, and 230, respectively, and projects the light. Irradiated into the process gas from the sensor and detected as an electrical signal in a phototransistor that is a light receiving sensor. The electrical signal detected here is converted into an optical signal again and transmitted to the signal processing unit 140 of the central unit 100 via the cables 210, 220, and 230. In the signal processing unit 140, the concentration of a specific component in the process gas can be measured by comparing the irradiated laser beam with the received laser beam. The CPU 150 controls signal processing in the signal processing unit 140.

  The central unit 100 incorporates a reference cell 130 filled with a process gas, and automatic calibration is always performed using the reference cell 130. The laser light that has passed through the reference cell 130 is detected as an electrical signal in the phototransistor, and the electrical signal detected here is also transmitted to the signal processing unit 140. The CPU 150 performs the automatic calibration by controlling the laser controller 160 based on the signal transmitted from the reference cell 130.

  Next, the structure of the laser gas analyzer mounting structure according to the present embodiment will be described with reference to FIG.

  Referring to FIG. 2, the laser gas analyzer has a mounting structure in which the gas flow path 30 is sandwiched in the horizontal direction by the first sensor unit 10 and the second sensor unit 20. The laser beam generated by the central unit 100 is projected from the first sensor unit 10 toward the second sensor unit 20. At this time, the laser light passes through the process gas flowing in the gas flow path 30. Thereby, the density | concentration of the specific component in process gas is measured.

  In order to perform the above measurement, in order for the second sensor unit 20 to receive the laser light projected from the first sensor unit 10, the sensor optical axis of the first sensor unit 10 and the sensor of the second sensor unit 20 are used. It is necessary to match the optical axis. As described above, the laser gas analyzer according to the present embodiment is based on the premise that the first sensor unit 10 and the second sensor unit 20 are arranged in the horizontal direction, but the first sensor unit 10 and the second sensor are arranged. In order to align the sensor optical axes of the units 20 with each other, a slight angle adjustment is required. Therefore, even if “horizontal” is described, a slight inclination (for example, an inclination angle of about 2 ° or less) occurs.

  Next, the internal structure of the first and second sensor units 10 and 20 included in the laser gas analyzer mounting structure according to the present embodiment will be described with reference to FIGS.

  Referring to FIG. 3, the first sensor unit 10 includes a housing 11, a light projecting unit 12, a lens 13, a window 14, a purge pipe 15, a purge gas supply port 16, and a pressure flange 17. .

  The housing 11 houses the light projecting unit 12. The housing 11 has a flange portion 11 </ b> A, and the first sensor unit 10 gasses by coupling the flange portion 11 </ b> A of the housing 11 and the flange portion 30 </ b> A of the gas flow path 30 via the pressure flange 17. It is attached to the flow path 30.

  The light projecting unit 12 projects laser light toward the gas flow path 30. The lens 13 and the window 14 transmit the laser light. The window 14 is a member provided to isolate the light projecting unit 12 from the gas flow path 30 in order to protect the light projecting unit 12.

  The laser light that has passed through the window 14 passes through the purge pipe 15 and reaches the gas flow path 30. A purge gas is ejected from the purge gas supply port 16 into the purge pipe 15. Thereby, it can suppress that process gas contacts the window 14, and can suppress the dirt of the window 14. FIG. In addition, by providing the purge pipe 15, it is possible to suppress the turbulent flow of the process gas in the vicinity of the first sensor unit 10 and the process gas from being easily brought into contact with the window 14. The contamination of the window 14 hinders accurate analysis. On the other hand, as described above, accurate analysis can be performed by suppressing the contamination of the window 14. The diameter of the purge pipe 15 is preferably as small as possible within a range that does not hinder the laser light transmission path in order to secure the flow rate of the purge gas.

  With reference to FIG. 4, the second sensor unit 20 generally has the same structure as the first sensor unit 10. That is, the second sensor unit 20 includes a housing 21, a light receiving unit 22, a lens 23, a window 24, a purge pipe 25, a purge gas supply port 26, and a pressure flange 27.

  The housing 21 houses the light receiving unit 22. The housing 21 has a flange portion 21 </ b> A, and the second sensor unit 20 gasses by coupling the flange portion 21 </ b> A of the housing 21 and the flange portion 30 </ b> A of the gas flow path 30 via the pressure flange 27. It is attached to the flow path 30.

  The light receiving unit 22 receives the laser light projected from the light projecting unit 12 and passed through the gas flow path 30. The lens 23 and the window 24 transmit the laser light. The window 24 is a member provided to isolate the light receiving unit 22 from the gas flow path 30 in order to protect the light receiving unit 22.

  In the second sensor unit 20, similarly to the first sensor unit 10, the purge gas is ejected from the purge gas supply port 26 into the purge pipe 25 to suppress the process gas from contacting the window 24. The contamination of the window 24 is suppressed.

  As described above, in order to perform accurate gas analysis, it is necessary to adjust the angle of aligning the optical axes of the light projecting unit 12 and the light receiving unit 22, and therefore the first sensor unit 10 and the second sensor unit 20 are slightly The gas channel 30 is attached with an inclination angle. Therefore, oil and moisture flowing in the gas flow path may flow into the purge pipes 15 and 25 and flow toward the windows 14 and 24. When the liquid reaches the vicinity of the windows 14, 24, the liquid is atomized by the purge gas ejected from the purge gas supply ports 16, 26 and easily adheres to the windows 14, 24. If the liquid adheres to the windows 14 and 24, there is a concern that the windows 14 and 24 may become dirty and prevent accurate analysis.

  On the other hand, in the sensor unit according to the present embodiment, the purge pipes 15 and 25 are provided with a structure for preventing the liquid from adhering to the windows 14 and 24. Details thereof will be described below.

  FIG. 5 is a view for explaining the structure of the purge pipe included in the sensor unit shown in FIGS. In FIG. 5, the purge pipe 15 included in the first sensor unit 10 is shown, but the same applies to the purge pipe 25 included in the second sensor unit 20.

  Referring to FIG. 5, purge pipe 15 includes a pipe portion 15A and a flange portion 15B. 15 A of pipe parts have the small diameter part 15A1 located in the front end side (gas flow path 30 side), and the large diameter part 15A2 located in the root side (flange part 15B side). The flange portion 15B has a protruding portion 15B1 that protrudes toward the inner diameter side of the large-diameter portion 15A2. Thereby, a concave portion 15C is formed between the small diameter portion 15A1 and the flange portion 15B. A drain hole 15D is provided on the bottom surface of the recess 15C.

  With the above structure, the liquid that has flowed into the purge pipe 15 flows into the recess 15C and is returned to the gas flow path 30 from the drain hole 15D. That is, the liquid that has flowed into the purge pipe 15 is blocked by the protruding portion 15B1 of the flange portion 15B. Therefore, it is possible to suppress the liquid from adhering to the window 14 and to prevent the window 14 from becoming dirty. Therefore, the maintenance frequency of disassembling the first sensor unit 10 and cleaning the window 14 can be reduced.

  Note that the large-diameter portion 15A2 in the purge pipe 15 of FIG. 5 is not necessarily provided, and the pipe portion 15A may be configured by only the small-diameter portion 15A1. In this case, the protruding portion 15B1 of the flange portion 15B is formed so as to protrude toward the inner diameter side of the small diameter portion 15A1. Further, the drain hole 15D is not necessarily formed.

  The protruding portion 15B1 of the flange portion 15B may be formed over the entire circumference of the purge pipe 15, or may be formed in a semicircular shape only in the lower half of the purge pipe 15.

  In addition, if the process gas flows into the purge pipe 15, a measurement error is caused. Therefore, when the drain hole 15D is provided as described above, the process gas is sucked into the purge pipe through the drain hole 15D. It is necessary to suppress it. Under general conditions of use, it is difficult to think of sucking the process gas from the drain hole 15D (for example, about φ6) into the purge pipe 15, but it is necessary to greatly increase the flow rate of the purge gas, for example, in a high dust environment. Under certain conditions, the flow rate of the purge gas in the purge pipe 15 increases and the process gas is easily sucked. For this reason, it is preferable to thread the drain hole 15D (for example, about M6) so that the drain hole 15D can be closed with a hexagonal screw according to use conditions. The means for closing the drain hole 15D is not limited to the above-described screw processing, and the drain hole 15D may be closed by a cap, a rubber plug, or the like, for example.

  Next, a modified example of the internal structure of the first and second sensor units 10 and 20 will be described with reference to FIGS. Although FIG. 8 shows the purge pipe 15 included in the first sensor unit 10, the same applies to the purge pipe 25 included in the second sensor unit 20.

  With reference to FIGS. 6 to 8, the present modification is characterized in that the purge pipe 15 is constituted by two pipes 15E and 15F, and similarly, the purge pipe 25 is constituted by two pipes 25E and 25F. . Then, as shown in FIG. 8, in the purge pipe 15, a step 15G is formed by making the inner diameters of the two pipes 15E and 15F different, and the liquid flowing into the purge pipe 15 is blocked by the step 15G. ing.

  FIG. 9 is a sectional view showing a modification of the purge pipe 15 shown in FIG. Referring to FIG. 9, in this modification, a tapered portion 15H is formed instead of the step portion 15G. Even with such a structure, the liquid flowing into the purge pipe 15 can be blocked.

  According to the laser gas analyzer mounting structure according to the present embodiment, as described above, the flange portion 15B (FIG. 5), the step portion 15G (FIG. 8), which dams the liquid toward the windows 14 and 24, Alternatively, by forming the tapered portion 15H (FIG. 9), it is possible to suppress the liquid from reaching the windows 14 and 24 even when the liquid flows into the purge pipes 15 and 25. As a result, dirt on the windows 14 and 24 can be suppressed, and the burden of maintenance can be reduced while ensuring an accurate measurement result.

  The above contents are summarized as follows. That is, the laser gas analyzer mounting structure according to the present embodiment has the first sensor unit 10 and the first sensor unit 10 so as to sandwich the gas flow channel 30 in the horizontal direction in the sealed gas flow channel 30 through which the measurement gas flows. The first sensor unit 10 includes a light projecting unit 12 that projects laser light toward the gas flow path 30, and a light projecting unit 12. On the other hand, it is located on the gas flow path 30 side, the window 14 as a “first window section” that transmits the laser light from the light projecting section 12, and the “first” positioned between the window 14 and the gas flow path 30. A purge pipe 15 as a “laser beam passage” and a purge gas supply port 16 as a “first purge gas supply section” provided near the window 14 in the purge pipe 15 and ejecting the purge gas toward the purge pipe 15. No. The second sensor unit 20 receives the laser light projected from the light projecting unit 12, and the laser light that is positioned on the gas flow path 30 side with respect to the light receiving unit 22 and travels toward the light receiving unit 22. A window 24 as a “second window portion” that transmits light, a purge pipe 25 as a “second laser beam passage” positioned between the window 24 and the gas flow path 30, and the vicinity of the window 24 in the purge pipe 25 And a purge gas supply port 26 as a “second purge gas supply unit” that ejects the purge gas toward the purge pipe 25. Then, a flange portion 15B (FIG. 5), a step portion 15G (FIG. 8), or a taper portion 15H as a “damming portion” for damming the liquid toward the windows 14, 24 on the purge pipes 15, 25, respectively. (FIG. 9) is formed.

  In the example of FIG. 5, the purge pipe 15 has a pipe portion 15A and a flange portion 15B, and the “damming portion” is formed by projecting the flange portion 15B toward the inner diameter side of the pipe portion 15A. Further, in the example of FIG. 5, the concave portion 15C is formed on the front surface of the flange portion 15B by increasing the diameter of the end portion on the flange portion 15B side of the pipe portion 15A. Further, in the example of FIG. 5, a drain hole 15 </ b> D as a “discharge portion” that discharges the liquid blocked by the flange portion 15 </ b> B to the gas flow channel 30 is provided on the gas flow channel 30 side with respect to the flange portion 15 </ b> B. Yes.

  In the example of FIGS. 8 and 9, the purge pipe 15 has two “tubular members”, pipes 15E and 15F, and the “damming part” makes the inner diameters of the pipes 15E and 15F different from each other (more specifically, Specifically, the inner diameter of the pipe 15E is made smaller than the inner diameter of the pipe 15F).

  As a modification of the present embodiment, for example, by forming the purge pipe in a horn shape, it is difficult for liquid such as condensed water to flow in, or the purge pipe is heated to prevent the occurrence of condensation. It is conceivable to prevent dust from adhering to the purge pipe. Furthermore, for the purpose of preventing dust from adhering to the purge pipe, a lining process or a buff process may be applied to the purge pipe.

  Although the embodiments of the present invention have been described above, the embodiments disclosed this time should be considered as illustrative in all points and not restrictive. The scope of the present invention is defined by the terms of the claims, and is intended to include any modifications within the scope and meaning equivalent to the terms of the claims.

1 is a system diagram of a laser gas analyzer including a laser gas analyzer mounting structure according to one embodiment of the present invention. FIG. It is a figure which shows schematically the structure of the attachment structure of the laser type gas analyzer which concerns on one embodiment of this invention. It is sectional drawing which shows the attachment part of the 1st sensor unit contained in the attachment structure of the laser type gas analyzer shown in FIG. It is sectional drawing which shows the attachment part of the 2nd sensor unit contained in the attachment structure of the laser type gas analyzer shown in FIG. It is sectional drawing which shows the purge pipe | tube contained in the 1st sensor unit shown in FIG. It is sectional drawing which shows the attachment part of the modification of the 1st sensor unit contained in the attachment structure of the laser type gas analyzer shown in FIG. It is sectional drawing which shows the attachment part of the modification of the 2nd sensor unit contained in the attachment structure of the laser type gas analyzer shown in FIG. It is sectional drawing which shows the purge pipe | tube contained in the 1st sensor unit shown in FIG. It is sectional drawing which shows the modification of the purge pipe | tube shown in FIG.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 10 1st sensor unit, 11 housing | casing, 11A flange part, 12 light projection part, 13 lens, 14 window, 15 purge pipe, 15A pipe part, 15A1 small diameter part, 15A2 large diameter part, 15B flange part, 15B1 protrusion part, 15C recessed portion, 15D drain hole, 15E, 15F pipe, 15G stepped portion, 15H tapered portion, 16 purge gas supply port, 17 pressure flange, 20 second sensor unit, 21 housing, 21A flange portion, 22 light receiving portion, 23 lens, 24 window, 25 purge pipe, 26 purge gas supply port, 27 pressure flange, 30 gas flow path, 30A flange, 100 central unit, 110 diode laser, 120 optical coupler, 130 reference cell, 140 signal processor, 150 CPU, 200 210, 220, and 230 cable, 300,310,320,330 measurement unit.

Claims (5)

A laser gas analyzer mounting structure in which a first sensor unit and a second sensor unit are attached to a sealed gas flow path through which a measurement gas flows so as to sandwich the gas flow path in a horizontal direction,
The first sensor unit is located on the gas flow path side with respect to the light projecting section, and a light projecting section that projects laser light toward the gas flow path. A first window portion to be transmitted; a first laser beam passage located between the first window portion and the gas flow path; provided in the vicinity of the first window portion in the first laser beam passage; A first purge gas supply unit that ejects a purge gas toward the first laser beam path,
The second sensor unit receives the laser light projected from the light projecting unit, and is positioned on the gas flow path side with respect to the light receiving unit, and transmits the laser light toward the light receiving unit. A second window portion to be provided, a second laser beam passage located between the second window portion and the gas flow path, and provided in the vicinity of the second window portion in the second laser beam passage, A second purge gas supply unit that ejects a purge gas toward the two laser beam passages,
A laser type gas is formed on the first laser beam path and the second laser beam path, respectively, in which blocking portions for blocking liquids directed toward the first window portion side and the second window portion side are formed. Analyzer mounting structure. The first laser light path and the second laser light path each have a pipe part and a flange part,
The laser gas analyzer mounting structure according to claim 1, wherein the damming portion is formed by projecting the flange portion toward an inner diameter side of the pipe portion.   3. The laser gas analyzer mounting structure according to claim 2, wherein an end of the pipe portion on the flange portion side is enlarged. Each of the first laser light path and the second laser light path has two tubular members,
2. The laser gas analyzer mounting structure according to claim 1, wherein the damming portion is formed by making the inner diameters of the two tubular members different from each other.   5. The apparatus according to claim 1, further comprising a discharge unit that discharges the liquid blocked by the blocking unit to the gas channel on the gas channel side with respect to the blocking unit. Mounting structure of laser gas analyzer as described.

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