JP2009224733A - Package of semiconductor, and packaging method - Google Patents

Package of semiconductor, and packaging method Download PDF

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Publication number
JP2009224733A
JP2009224733A JP2008070507A JP2008070507A JP2009224733A JP 2009224733 A JP2009224733 A JP 2009224733A JP 2008070507 A JP2008070507 A JP 2008070507A JP 2008070507 A JP2008070507 A JP 2008070507A JP 2009224733 A JP2009224733 A JP 2009224733A
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hole
metal heat
sealing resin
semiconductor element
semiconductor
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Teppei Wakayasu
哲平 若安
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Panasonic Corp
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Panasonic Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/50Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/50Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Wire Bonding (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide an extremely low-cost semiconductor device that has high heat radiation properties in addition to electrical reliability such as electrical insulation properties, and can be further reduced in size and increased in the number of pins. <P>SOLUTION: A semiconductor element 6 is mounted on a tape carrier, the semiconductor element 6 is sealed by a sealing resin 13 and a metal heat sink 7 is also stuck to the tape carrier by the sealing resin 13 filled into a through-hole 14 of the metal heat sink 7, an anchor effect is achieved by the sealing resin 13 filled into a back counter sink hole 11 in the metal heat sink 7, thermal conductivity to the metal heat sink 7 is improved by containing a heat-radiating filler in the sealing resin 13, and thermal conductivity is further improved while mainlining high insulation properties. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、半導体の実装体および実装方法に関し、テレビ等のディスプレイ用途に多用されるテープキャリアパッケージのコストダウン、小型化に有効な構造に係るものである。   The present invention relates to a semiconductor mounting body and a mounting method, and relates to a structure effective for cost reduction and miniaturization of a tape carrier package frequently used for a display application such as a television.

現在、IC部品、半導体製品の多くの製品単価は非常に安く、常にコストダウンを要求されている。そのような中で、TCP(Tape Carrier Package)やCOF(Chip On Film)等のパッケージに対しても同様に更なるコストダウンや製品の小型化、多ピン化が求められている。   Currently, the unit price of many IC components and semiconductor products is very low, and there is a constant demand for cost reduction. Under such circumstances, further cost reduction, product miniaturization, and increase in the number of pins are demanded for packages such as TCP (Tape Carrier Package) and COF (Chip On Film).

その結果、製品の小型化に伴って、半導体素子上で局所的に発生する発熱量は増大傾向にある。発熱、蓄熱は回路等の耐久性に悪影響を及ぼすので、半導体の実装体には電気絶縁性等の電気的信頼性に加えて、従来よりも高い放熱性が要求される。   As a result, the amount of heat generated locally on the semiconductor element tends to increase as the product becomes smaller. Since heat generation and heat storage adversely affect the durability of the circuit and the like, the semiconductor mounting body is required to have higher heat dissipation than the conventional one in addition to electrical reliability such as electrical insulation.

放熱方法としては、熱伝導性が高い金属性フィンや金属放熱板と、半導体素子とを接触させて取り付ける方法が一般化している。しかしながら、コスト的に見合わない場合が多くある。   As a heat dissipating method, a method of attaching a metal element having a high thermal conductivity or a metal heat dissipating plate and a semiconductor element in general is common. However, there are many cases where the cost is not met.

図6は、一般的なテープキャリアを示す平面図である。図7は、図6のテープキャリアに半導体素子および金属放熱板を装着したTCPの平面図である。図8は、図7におけるC−C´断面図である。   FIG. 6 is a plan view showing a general tape carrier. FIG. 7 is a plan view of a TCP in which a semiconductor element and a metal heat sink are mounted on the tape carrier of FIG. 8 is a cross-sectional view taken along the line CC ′ in FIG.

図6〜図8に示すように、一般的なテープキャリア101は、ポリイミドフィルム等のフィルム基材102の上に導体パターン103を設け、導体パターン103をソルダーレジスト104で被覆したものであり、アウターリード105がソルダーレジスト104から露出している。導体パターン103は、一端がフィルム基材102のデバイスホール102aの内側に突出するインナーリード(フライングリード)103aと、フィルム基材102の上に延在するパターンリード104bと、ソルダーレジスト104から露出する前述のアウターリード105からなる。   As shown in FIGS. 6 to 8, a general tape carrier 101 is obtained by providing a conductor pattern 103 on a film base material 102 such as a polyimide film and covering the conductor pattern 103 with a solder resist 104. The lead 105 is exposed from the solder resist 104. The conductor pattern 103 is exposed from an inner lead (flying lead) 103 a whose one end protrudes inside the device hole 102 a of the film base 102, a pattern lead 104 b extending on the film base 102, and the solder resist 104. It consists of the aforementioned outer lead 105.

このテープキャリア101のデバイスホール102aに半導体素子106を配置し、ILB(Inner Lead Bonding)により半導体素子106とインナーリード103aとを接続し、インナーリード103aの保護のためにデバイスホール102aにアンダーフィル樹脂113(もしくは非導電性ペースト)を充填し、テープキャリア101と半導体素子106とのギャップを埋めるアンダーフィル樹脂113で半導体素子106を封止してTCP108を形成する。アンダーフィル樹脂113はデバイスホール102aの周辺のテープキャリア101の表面上まで延在する。   The semiconductor element 106 is disposed in the device hole 102a of the tape carrier 101, the semiconductor element 106 and the inner lead 103a are connected by ILB (Inner Lead Bonding), and an underfill resin is provided in the device hole 102a to protect the inner lead 103a. 113 (or non-conductive paste) is filled, and the semiconductor element 106 is sealed with an underfill resin 113 that fills the gap between the tape carrier 101 and the semiconductor element 106 to form the TCP 108. The underfill resin 113 extends to the surface of the tape carrier 101 around the device hole 102a.

金属放熱板107は、半導体素子106に対応する搭載位置に凹部107aを有しており、凹部107aに放熱グリス112を塗布してTCP108に装着する。すなわち、放熱グリス112を介してTCP108の半導体素子106の裏面に金属放熱板107を押し付けながら、粘着テープ109を用いてフィルム基材102と金属放熱板107とを互いに固着させる。TCP108と金属放熱板107とにはあらかじめ開口穴110が形成してあり、開口穴110の周囲にランド110aを形成したTCP108の上面側からネジ等の締結部材111を取り付け、締結部材111でTCP108と金属放熱板107とを締結して金属放熱板を装着したTCPを完成させる。
特開2006−243733号公報
The metal heat radiating plate 107 has a concave portion 107 a at a mounting position corresponding to the semiconductor element 106. The heat radiating grease 112 is applied to the concave portion 107 a and attached to the TCP 108. That is, the film base material 102 and the metal heat dissipation plate 107 are fixed to each other using the adhesive tape 109 while pressing the metal heat dissipation plate 107 against the back surface of the semiconductor element 106 of the TCP 108 via the heat dissipation grease 112. An opening hole 110 is formed in advance in the TCP 108 and the metal heat radiating plate 107, and a fastening member 111 such as a screw is attached from the upper surface side of the TCP 108 in which a land 110 a is formed around the opening hole 110. The metal heat sink 107 is fastened to complete the TCP with the metal heat sink attached.
JP 2006-243733 A

しかしながら、上記の従来の構成では、TCP108上面から開口穴110にネジ等の締結部材111を挿入し、締結部材111でTCP108に金属放熱板107を取り付ける際に、締結部材111の締め付けが強過ぎるとフィルム基材102が変形することがあり、このためにフィルム基材102上の導体パターン103が変形し、または断線するという課題があった。   However, in the conventional configuration described above, when the fastening member 111 such as a screw is inserted into the opening hole 110 from the upper surface of the TCP 108 and the metal heat radiating plate 107 is attached to the TCP 108 with the fastening member 111, the fastening member 111 is too tight. The film base material 102 may be deformed. For this reason, there is a problem that the conductor pattern 103 on the film base material 102 is deformed or disconnected.

また、金属放熱板107の凹部107aにおいて半導体素子106の周囲は放熱グリス112を除いて空洞であり、半導体素子106で発生する熱は、主として放熱グリス112を介して金属放熱板107に伝導する。このため、放熱グリス112と金属放熱板107との接触面積および放熱グリス112と半導体素子106との接触面積の多寡が放熱性に影響する要素となる。   Further, the periphery of the semiconductor element 106 is hollow except for the heat dissipation grease 112 in the recess 107 a of the metal heat dissipation plate 107, and heat generated in the semiconductor element 106 is mainly conducted to the metal heat dissipation plate 107 through the heat dissipation grease 112. For this reason, the contact area between the heat dissipation grease 112 and the metal heat dissipation plate 107 and the contact area between the heat dissipation grease 112 and the semiconductor element 106 are factors that affect heat dissipation.

しかしながら、金属放熱板107の凹部107aに放熱グリス112を塗布する際に、放熱グリス112の塗布量の管理が難しく、放熱グリス112の塗布量が過少である場合には、前述の接触面積の不足により放熱性が悪化するという課題があった。   However, when the heat radiation grease 112 is applied to the recess 107a of the metal heat radiating plate 107, it is difficult to manage the application amount of the heat radiation grease 112. If the application amount of the heat radiation grease 112 is too small, the contact area is insufficient. There was a problem that the heat dissipation deteriorated.

また、フィルム基材102に開口孔110を設けるために、開口孔110の存在によって導体パターン103の配線の引き回しのための領域が減少し、パッケージの小型化や多ピン化に適していないという課題があった。   In addition, since the opening hole 110 is provided in the film base material 102, the area for routing the wiring of the conductor pattern 103 is reduced due to the presence of the opening hole 110, which is not suitable for downsizing of the package or increasing the number of pins. was there.

本発明は上記した課題を解決するものであり、TCPと金属放熱板とをネジ等の締結部材を用いずに取り付けることができ、かつ優れた放熱性を実現でき、さらには生産設備を少なくすることで低コスト化が可能になり、パッケージの小型化や多ピン化に対応可能となり、かつ信頼性を確保した半導体装置を提供することを目的とする。   The present invention solves the above-described problems, and can attach a TCP and a metal heat radiating plate without using a fastening member such as a screw, can realize excellent heat dissipation, and further reduce production facilities. Accordingly, an object of the present invention is to provide a semiconductor device that can be reduced in cost, can cope with downsizing of a package and increase in the number of pins, and ensures reliability.

上記した課題を解決するために、本発明の半導体の実装体は、導体配線を配置したフレキシブルなベース基材と、前記ベース基材のデバイスホールに搭載する半導体素子と、前記デバイスホールに充填して前記半導体素子を封止する封止樹脂と、前記ベース基材に対向して配置する金属放熱板とを備え、前記金属放熱板が前記デバイスホールに連通する貫通孔を有し、前記封止樹脂を前記デバイスホールおよび前記貫通孔に充填して前記金属放熱板を前記ベース基材に固着させることを特徴とする。   In order to solve the above-described problems, a semiconductor mounting body according to the present invention includes a flexible base substrate on which conductor wiring is arranged, a semiconductor element mounted in a device hole of the base substrate, and the device hole filled. A sealing resin for sealing the semiconductor element, and a metal heat dissipating plate arranged to face the base substrate, the metal heat dissipating plate having a through hole communicating with the device hole, and the sealing The device hole and the through hole are filled with resin, and the metal heat radiating plate is fixed to the base substrate.

また、本発明の半導体の実装体において、前記金属放熱板は、前記貫通孔の一部をなし、かつ前記貫通孔より広い拡幅部を有する孔を備え、前記封止樹脂が前記拡幅部を満たすことを特徴とする。   In the semiconductor package of the present invention, the metal heat radiating plate includes a hole that forms a part of the through hole and has a widened portion wider than the through hole, and the sealing resin fills the widened portion. It is characterized by that.

また、本発明の半導体の実装体において、前記金属放熱板は、前記ベース基材と対向する面と表裏をなす反対側の主面に、前記貫通孔に連通し、かつ前記貫通孔より広い拡幅部を有する座ぐり孔を備え、前記封止樹脂が前記拡幅部を満たすことを特徴とする。   Further, in the semiconductor mounting body of the present invention, the metal heat dissipating plate communicates with the through hole on the opposite main surface opposite to the surface facing the base substrate, and is wider than the through hole. A countersunk hole having a portion, wherein the sealing resin fills the widened portion.

また、本発明の半導体の実装体において、前記金属放熱板は、表裏の主面に、前記貫通孔に連通し、かつ前記貫通孔より広い拡幅部を有する座ぐり孔を備え、前記封止樹脂が前記拡幅部を満たすことを特徴とする。   Further, in the semiconductor mounting body of the present invention, the metal heat radiating plate includes a counterbore hole that communicates with the through hole and has a widened portion wider than the through hole on the main surface of the front and back surfaces. Fills the widened portion.

また、本発明の半導体の実装体において、前記封止樹脂は、電気絶縁性と放熱性を兼ね備えることを特徴とする。
また、本発明の半導体の実装体において、前記封止樹脂は、放熱性のあるフィラーを含有することを特徴とする。
In the semiconductor package of the present invention, the sealing resin has both electrical insulation and heat dissipation.
In the semiconductor package of the present invention, the sealing resin contains a heat radiating filler.

本発明の半導体の実装方法は、導体配線を配置したフレキシブルなベース基材のデバイスホールに半導体素子を配置し、前記ベース基材に対向して金属放熱板を配置し、前記金属放熱板を表裏に貫通して形成した貫通孔および前記デバイスホールに封止樹脂を充填し、前記封止樹脂で前記金属放熱板を前記ベース基材に固着させることを特徴とする。   In the semiconductor mounting method of the present invention, a semiconductor element is disposed in a device hole of a flexible base substrate on which conductor wiring is disposed, a metal heat sink is disposed opposite to the base substrate, and the metal heat sink is front and back. A sealing resin is filled in the through-holes and the device holes formed so as to penetrate the metal holes, and the metal heat radiating plate is fixed to the base substrate with the sealing resin.

また、本発明の半導体の実装方法は、前記封止樹脂が前記金属放熱板の前記貫通孔に形成した拡幅部を満たして樹脂アンカー部を形成することを特徴とする。   The semiconductor mounting method of the present invention is characterized in that the sealing resin fills a widened portion formed in the through hole of the metal heat radiating plate to form a resin anchor portion.

以上のように、本発明の半導体の実装体は、封止樹脂が半導体素子を封止するとともに、半導体素子を搭載したベース基材と金属放熱板とを固着させるので、金属放熱板を取り付ける際に、ネジ等の締結部材が不要となり、ネジの締め付けに起因するベース基材の変形、基材上の導体パターンの変形および断線といった現象が無くなり、且つネジ等の締結部材の配置領域をなくして小型化、多ピン化が可能になる。さらに、放熱グリスが不要となり、低コスト化を実現できる。   As described above, in the semiconductor mounting body of the present invention, the sealing resin seals the semiconductor element, and the base substrate on which the semiconductor element is mounted and the metal heat sink are fixed. In addition, there is no need for a fastening member such as a screw, the phenomenon of deformation of the base substrate, deformation of the conductor pattern on the substrate and disconnection due to the tightening of the screw is eliminated, and the arrangement area of the fastening member such as a screw is eliminated. It is possible to reduce the size and increase the number of pins. Furthermore, no heat radiation grease is required, and cost reduction can be realized.

半導体素子が、その全周囲において封止樹脂に接し、金属放熱板が貫通孔および拡幅部の全内壁面で封止樹脂と当接することで優れた放熱性を実現できる。また、封止樹脂に放熱性のあるフィラーを含有することで金属放熱板への熱伝導性を高めて、より高い絶縁性を持ったままでさらに熱伝導性を向上させることができる。   The semiconductor element is in contact with the sealing resin at the entire periphery thereof, and the metal heat radiating plate is in contact with the sealing resin at all the inner wall surfaces of the through hole and the widened portion, thereby realizing excellent heat dissipation. Moreover, the heat conductivity to a metal heat sink can be improved by containing the filler with heat dissipation in sealing resin, and heat conductivity can be improved further with having higher insulation.

よって、電気絶縁性等の電気的信頼性に加え、より高い放熱性を有し、且つ更なる小型化、多ピン化が可能になり、極めて低コストで半導体装置を提供することができる。   Therefore, in addition to electrical reliability such as electrical insulation, the semiconductor device can be provided at extremely low cost because it has higher heat dissipation and can be further reduced in size and increased in pin count.

以下本発明の実施の形態について、図面を参照しながら説明する。
(実施の形態1)
図1は、本発明の実施の形態1におけるテープキャリアを示す平面図である。図2は、本発明の実施の形態1における金属放熱板の平面図である。図3は、図2におけるA−A´断面図である。図4は、本発明の実施の形態1におけるテープキャリアに金属放熱板を装着したTCPを示す平面図である、図5は、図4におけるB−B´断面図である。
Embodiments of the present invention will be described below with reference to the drawings.
(Embodiment 1)
FIG. 1 is a plan view showing a tape carrier according to Embodiment 1 of the present invention. FIG. 2 is a plan view of the metal heat sink in the first embodiment of the present invention. 3 is a cross-sectional view taken along the line AA ′ in FIG. 4 is a plan view showing a TCP in which a metal heat sink is mounted on the tape carrier according to Embodiment 1 of the present invention. FIG. 5 is a cross-sectional view taken along the line BB ′ in FIG.

図1〜図5において、1はテープキャリア、2はフィルム基材、2aはデバイスホール、3は導体パターン、3aはパターンリード、4はソルダーレジスト、5はアウターリード、6は半導体素子、7は金属放熱板、8はTCP(Tape Carrier Package)、9は粘着テープ、10は金属放熱板の半導体素子搭載用座ぐり孔、11は金属放熱板の裏面座ぐり孔、12はインナーリード、13は樹脂、14は金属放熱板の貫通孔を各々示している。   1 to 5, 1 is a tape carrier, 2 is a film substrate, 2a is a device hole, 3 is a conductor pattern, 3a is a pattern lead, 4 is a solder resist, 5 is an outer lead, 6 is a semiconductor element, 7 is Metal heat sink, 8 is TCP (Tape Carrier Package), 9 is adhesive tape, 10 is a counterbore hole for mounting a semiconductor element of the metal heat sink, 11 is a counterbore hole on the back surface of the metal heat sink, 12 is an inner lead, 13 is Resin 14 indicates through holes of the metal heat sink.

図1〜図5に示すように、テープキャリア1は、ポリイミドフィルム等のフィルム基材2の上に導体パターン3を設け、導体パターン3をソルダーレジスト4で被覆したものであり、アウターリード5がソルダーレジスト4から露出している。   As shown in FIGS. 1 to 5, the tape carrier 1 is obtained by providing a conductor pattern 3 on a film substrate 2 such as a polyimide film, and covering the conductor pattern 3 with a solder resist 4. It is exposed from the solder resist 4.

導体パターン3は、一端がフィルム基材2のデバイスホール2aの内側に突出するインナーリード(フライングリード)12と、フィルム基材2の上に延在するパターンリード3aと、ソルダーレジスト4から露出する前述のアウターリード5からなる。   The conductor pattern 3 is exposed from an inner lead (flying lead) 12 whose one end protrudes inside the device hole 2 a of the film base 2, a pattern lead 3 a extending on the film base 2, and the solder resist 4. It consists of the aforementioned outer lead 5.

図2および図3に示すように、金属放熱板7は、表裏の主面間を貫通する貫通孔14を有し、テープキャリア1に対向する主面に半導体素子搭載用座ぐり孔10を有し、テープキャリア1と対向する主面と表裏をなす反対側の主面に裏面座ぐり孔11を有している。   As shown in FIGS. 2 and 3, the metal heat radiating plate 7 has a through hole 14 that penetrates between the main surfaces of the front and back sides, and has a counterbore 10 for mounting a semiconductor element on the main surface facing the tape carrier 1. In addition, a back face counterbore 11 is provided on the main surface opposite to the main surface facing the tape carrier 1.

半導体素子搭載用座ぐり孔10は半導体素子6を格納するためのもので、貫通孔14の一部なすとともに、貫通孔14より広い拡幅部に、後述する樹脂アンカー部を受け止める座10aを形成している。裏面座ぐり孔11は貫通孔14の一部をなすとともに、貫通孔14より広い拡幅部に、後述する樹脂アンカー部を受け止める座11aを形成している。   The counterbore 10 for mounting the semiconductor element is used to store the semiconductor element 6. The counterbore 10 for forming the semiconductor element is formed as a part of the through hole 14, and a seat 10 a for receiving a resin anchor portion described later is formed in a widened portion wider than the through hole 14. ing. The back face counterbore 11 forms a part of the through hole 14, and a seat 11 a that receives a resin anchor portion described later is formed in a widened portion wider than the through hole 14.

図4および図5に示すTCP8の製造工程では、最初に、テープキャリア1のデバイスホール2aに半導体素子6を配置し、インナーリード12に半導体素子6をボンディングする。   In the manufacturing process of the TCP 8 shown in FIGS. 4 and 5, first, the semiconductor element 6 is disposed in the device hole 2 a of the tape carrier 1, and the semiconductor element 6 is bonded to the inner lead 12.

次に、テープキャリア1の裏面側に対向して金属放熱板7を配置し、テープキャリア1に実装した半導体素子6を金属放熱板7の半導体素子搭載用座ぐり孔10に格納するように金属放熱板7を位置合わせし、粘着テープ9でテープキャリア1の下部に金属放熱板7を固着する。   Next, a metal heat dissipating plate 7 is disposed facing the back side of the tape carrier 1, and the semiconductor element 6 mounted on the tape carrier 1 is placed in the metal heat dissipating plate 7 in a counterbore 10 for mounting semiconductor elements. The heat radiating plate 7 is aligned, and the metal heat radiating plate 7 is fixed to the lower part of the tape carrier 1 with the adhesive tape 9.

次に、テープキャリア1のデバイスホール2aおよび金属放熱板7の半導体素子搭載用座ぐり孔10、貫通孔14、裏面座ぐり孔11に封止用の封止封止樹脂13を充填し、テープキャリア1および金属放熱板7と半導体素子6とのギャップを封止封止樹脂13で埋める。封止封止樹脂13の硬化により半導体素子6を封止して実装体としてのTCP8を形成する。   Next, the device hole 2a of the tape carrier 1 and the semiconductor element mounting counterbore hole 10, the through hole 14, and the back face counterbore hole 11 of the metal heat radiating plate 7 are filled with a sealing sealing resin 13 for sealing. The gap between the carrier 1 and the metal heat radiating plate 7 and the semiconductor element 6 is filled with a sealing sealing resin 13. The semiconductor element 6 is sealed by curing the sealing sealing resin 13 to form the TCP 8 as a mounting body.

封止封止樹脂13は、デバイスホール2aの周辺のテープキャリア1の表面上まで延在して樹脂アンカー部をなし、半導体素子搭載用座ぐり孔10を満たして拡幅部の座10aに当接する部位が樹脂アンカー部を形成し、さらに、裏面座ぐり孔11を満たして拡幅部の座11aに当接する部位がアンカーとして機能することで、テープキャリア1と金属放熱板7とを締結する。   The sealing and sealing resin 13 extends to the surface of the tape carrier 1 around the device hole 2a to form a resin anchor portion, fills the semiconductor element mounting counterbore 10 and contacts the widened portion seat 10a. The part forms a resin anchor part, and further, the part that fills the back face counterbore 11 and contacts the seat 11a of the widened part functions as an anchor, thereby fastening the tape carrier 1 and the metal heat sink 7.

よって、半導体素子6を封止封止樹脂13で封止する同時に金属放熱板7とテープキャリア1との固着が可能になり、従来のように、テープキャリア1と金属放熱板7とを締結するためのネジ等の締結部材が不要となるとともに、ネジ等の締結部材を用いての取り付け工程が不要となる。   Therefore, the semiconductor heat sink 7 is sealed with the sealing sealing resin 13 and the metal heat radiating plate 7 and the tape carrier 1 can be fixed at the same time, and the tape carrier 1 and the metal heat radiating plate 7 are fastened as in the prior art. Therefore, a fastening member such as a screw is not necessary, and an attachment process using a fastening member such as a screw is not necessary.

このため、従来において課題であった、ネジ等の締結部材の締め付けに起因するフィルム基材2の変形が生じず、導体パターン3の変形、断線の現象が無くなる。また、従来において必要であったネジ等の締結部材を配置するための開口孔をテープキャリア1に設ける必要がなくなるので、導体パターン3の配線引き回しのための領域が広くなり、TCP8の多ピン化、小型化が可能になる。   For this reason, the deformation | transformation of the film base material 2 resulting from clamping | tightening of fastening members, such as a screw which was a subject conventionally, does not arise, and the phenomenon of the deformation | transformation of the conductor pattern 3 and a disconnection is lose | eliminated. In addition, since it is not necessary to provide the tape carrier 1 with an opening hole for placing a fastening member such as a screw, which has been necessary in the prior art, the area for routing the conductor pattern 3 is widened, and the TCP 8 has multiple pins. It becomes possible to reduce the size.

本実施の形態では、金属放熱板7の表裏面に貫通孔14より広い拡幅部を形成し、拡幅部の座10a、11aで封止樹脂13の樹脂アンカー部を受け止めた。しかしながら、拡幅部は貫通孔14の軸心方向の途中位置に形成することも可能である。また、半導体素子搭載用座ぐり孔10、貫通孔14、裏面座ぐり孔11の形状は本実施の形態に示すものに限らず、種々の形状とすることが可能である。   In the present embodiment, wide portions wider than the through holes 14 are formed on the front and back surfaces of the metal heat radiating plate 7, and the resin anchor portions of the sealing resin 13 are received by the wide portion seats 10a and 11a. However, the widened portion can be formed at an intermediate position in the axial direction of the through hole 14. Moreover, the shape of the counterbore 10 for mounting a semiconductor element, the through hole 14, and the back face counterbore 11 is not limited to that shown in the present embodiment, and various shapes can be used.

従来においては、図8に示すように、放熱グリス112を用いるために、半導体素子106の半分程度がアンダーフィル樹脂113から露出していた。しかしながら、本実施の形態では、熱硬化樹脂などの接着性のある封止樹脂13を充填し、封止樹脂13により半導体素子6の全周囲を保持して強固に固定できる。   Conventionally, as shown in FIG. 8, about half of the semiconductor element 106 is exposed from the underfill resin 113 because the heat dissipating grease 112 is used. However, in the present embodiment, the sealing resin 13 having adhesiveness such as a thermosetting resin is filled, and the entire periphery of the semiconductor element 6 can be held and firmly fixed by the sealing resin 13.

また、半導体素子6で発生する熱が封止樹脂13を介して放熱板7に伝導するに際して、半導体素子6の周囲と放熱板7との間を封止樹脂13が満たすことで、半導体素子6と封止樹脂13との接触面積および放熱板7と半導体素子6との接触面積を十分に確保することができ、十分な放熱性を実現できる。   Further, when the heat generated in the semiconductor element 6 is conducted to the heat radiating plate 7 through the sealing resin 13, the space between the periphery of the semiconductor element 6 and the heat radiating plate 7 is filled with the sealing resin 13. And the contact area between the sealing resin 13 and the contact area between the heat dissipation plate 7 and the semiconductor element 6 can be sufficiently secured, and sufficient heat dissipation can be realized.

さらに、金属放熱板7の半導体素子搭載用座ぐり孔10、貫通孔14、裏面座ぐり孔11の内壁面はエッチング等により粗面仕上げとすることで、封止樹脂13との接合強度が増すとともに、封止樹脂13との界面における熱伝導性が向上する。   Further, the inner wall surfaces of the counterbore 10 for mounting the semiconductor element, the through hole 14 and the back face counterbore 11 of the metal heat radiating plate 7 are roughened by etching or the like, thereby increasing the bonding strength with the sealing resin 13. At the same time, the thermal conductivity at the interface with the sealing resin 13 is improved.

また、ここで使用する封止樹脂13に放熱性のあるフィラーを含有することで金属放熱板7への熱伝導性を向上させることができる。このフィラーとしては、例えば特開2005−306718において公知の無機フィラーを多く充填することにより、高い絶縁性を持ったままで、さらに熱伝導性を向上させて優れた放熱性を実現できる。   Moreover, the thermal conductivity to the metal heat sink 7 can be improved by containing the filler with heat dissipation in the sealing resin 13 used here. As this filler, for example, by filling a large amount of a known inorganic filler in JP-A-2005-306718, it is possible to achieve excellent heat dissipation by further improving thermal conductivity while maintaining high insulation.

また、従来のような、ネジ等の締結部材を用いての取り付け工程が不要となり、かつ放熱グリス塗布工程がなくなるので、極めて低コストでの実装体を作成することが可能になる。   In addition, since a conventional attachment process using a fastening member such as a screw is not required, and a heat dissipating grease application process is eliminated, it is possible to create a mounting body at an extremely low cost.

本発明の半導体の実装体によれば、電気絶縁性等の電気的信頼性に加え、より高い放熱性を備えたTCPを形成することが可能になり、テレビ等のディスプレイ用途に有用である。   According to the semiconductor package of the present invention, it is possible to form a TCP having higher heat dissipation in addition to electrical reliability such as electrical insulation, which is useful for display applications such as televisions.

本発明の実施の形態1におけるテープキャリアの平面図The top view of the tape carrier in Embodiment 1 of this invention 本発明の実施の形態1における金属放熱板の平面図The top view of the metal heat sink in Embodiment 1 of this invention 図2におけるA−A´断面図AA 'sectional view in FIG. 本発明の実施の形態1における金属放熱板付きTCPの平面図Top view of TCP with metal heat sink in Embodiment 1 of the present invention 図4におけるB−B´断面図BB 'sectional view in FIG. 一般的なテープキャリアの平面図Top view of a typical tape carrier 従来の金属放熱板付のTCPの平面図Top view of conventional TCP with metal heat sink 図7におけるC−C´断面図CC 'sectional view in FIG.

符号の説明Explanation of symbols

1、101 テープキャリア
2、102 フィルム基材
2a、102a デバイスホール
3、103 導体パターン
3a、103b パターンリード
4、104 ソルダーレジスト
5、105 アウターリード
6、106 半導体素子
7、107 金属放熱板
8、108 TCP(Tape Carrier Package)
9、109 粘着テープ
10 金属放熱板の半導体素子搭載用座ぐり孔
11 金属放熱板の裏面座ぐり孔
12、103a インナーリード
13 封止樹脂
14 金属放熱板の貫通孔
107a 凹部
110 開口孔
111 ネジ等の締結部材
112 放熱グリス
113 アンダーフィル樹脂
DESCRIPTION OF SYMBOLS 1,101 Tape carrier 2,102 Film base material 2a, 102a Device hole 3,103 Conductor pattern 3a, 103b Pattern lead 4,104 Solder resist 5,105 Outer lead 6,106 Semiconductor element 7,107 Metal heat sink 8,108 TCP (Tape Carrier Package)
9, 109 Adhesive tape 10 Counterbore hole for mounting semiconductor element on metal heat sink 11 Back counterbore hole on metal heat sink 12, 103a Inner lead 13 Sealing resin 14 Through hole on metal heat sink 107a Recess 110 Open hole 111 Screw etc. Fastening member 112 Radiation grease 113 Underfill resin

Claims (8)

導体配線を配置したフレキシブルなベース基材と、前記ベース基材のデバイスホールに搭載する半導体素子と、前記デバイスホールに充填して前記半導体素子を封止する封止樹脂と、前記ベース基材に対向して配置する金属放熱板とを備え、
前記金属放熱板が前記デバイスホールに連通する貫通孔を有し、前記封止樹脂を前記デバイスホールおよび前記貫通孔に充填して前記金属放熱板を前記ベース基材に固着させることを特徴とする半導体の実装体。
A flexible base substrate in which conductor wiring is arranged; a semiconductor element mounted in a device hole of the base substrate; a sealing resin that fills the device hole and seals the semiconductor element; and A metal heatsink disposed oppositely,
The metal heat radiating plate has a through hole communicating with the device hole, the sealing resin is filled in the device hole and the through hole, and the metal heat radiating plate is fixed to the base substrate. Semiconductor mounting body.
前記金属放熱板は、前記貫通孔の一部をなし、かつ前記貫通孔より広い拡幅部を有する孔を備え、前記封止樹脂が前記拡幅部を満たすことを特徴とする請求項1に記載の半導体の実装体。   The said metal heat sink has a hole which comprises a part of said through-hole and has a widened part wider than the said through-hole, and the said sealing resin fills the said widened part. Semiconductor mounting body. 前記金属放熱板は、前記ベース基材と対向する面と表裏をなす反対側の主面に、前記貫通孔に連通し、かつ前記貫通孔より広い拡幅部を有する座ぐり孔を備え、前記封止樹脂が前記拡幅部を満たすことを特徴とする請求項1に記載の半導体の実装体。   The metal heat radiating plate includes a counterbore hole communicating with the through hole and having a widened portion wider than the through hole on a main surface opposite to a surface facing the base substrate. The semiconductor mounting body according to claim 1, wherein a stop resin fills the widened portion. 前記金属放熱板は、表裏の主面に、前記貫通孔に連通し、かつ前記貫通孔より広い拡幅部を有する座ぐり孔を備え、前記封止樹脂が前記拡幅部を満たすことを特徴とする請求項1に記載の半導体の実装体。   The metal heat radiating plate includes counterbore holes that communicate with the through-holes and have a widened portion wider than the through-holes on the front and back main surfaces, and the sealing resin fills the widened portion. The semiconductor mounting body according to claim 1. 前記封止樹脂は、電気絶縁性と放熱性を兼ね備えることを特徴とする請求項1〜4の何れか1項に記載の半導体の実装体。   The semiconductor mounting body according to claim 1, wherein the sealing resin has both electrical insulation and heat dissipation. 前記封止樹脂は、放熱性のあるフィラーを含有することを特徴とする請求項5に記載の半導体の実装体。   The semiconductor packaging body according to claim 5, wherein the sealing resin contains a heat-dissipating filler. 導体配線を配置したフレキシブルなベース基材のデバイスホールに半導体素子を配置し、前記ベース基材に対向して金属放熱板を配置し、前記金属放熱板を表裏に貫通して形成した貫通孔および前記デバイスホールに封止樹脂を充填し、前記封止樹脂で前記金属放熱板を前記ベース基材に固着させることを特徴とする半導体の実装方法。   A semiconductor element is disposed in a device hole of a flexible base substrate on which conductor wiring is disposed, a metal heat sink is disposed opposite to the base substrate, and a through hole formed by penetrating the metal heat sink on the front and back sides; A semiconductor mounting method, wherein the device hole is filled with a sealing resin, and the metal heat sink is fixed to the base substrate with the sealing resin. 前記封止樹脂が前記金属放熱板の前記貫通孔に形成した拡幅部を満たして樹脂アンカー部を形成することを特徴とする請求項7に記載の半導体の実装方法。   The semiconductor mounting method according to claim 7, wherein the sealing resin fills a widened portion formed in the through hole of the metal heat radiating plate to form a resin anchor portion.
JP2008070507A 2008-03-19 2008-03-19 Package of semiconductor, and packaging method Withdrawn JP2009224733A (en)

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