JP2009110639A - Wavefront aberration inspection apparatus, optical pickup assembly adjustment device, lens evaluation device, lens assembly device, objective lens actuator assembly adjustment device, optical pickup, optical disk drive, and optical information recording and reproducing device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an optical pickup wavefront aberration inspection apparatus highly accurately measuring an optical pickup having satisfactory aberration performance in a short period of time by a simple optical system, to provide an optical pickup assembly adjustment device and to provide a lens evaluation device, a lens assembly device and an objective lens actuator assembly adjustment device for the optical pickup. <P>SOLUTION: In the wavefront aberration inspection apparatus, a position in the horizontal direction of the optical pickup is adjusted to minimize the tilt component of a phase wavefront of light emitted from the optical pickup detected by the wavefront aberration detection means, to measure the wavefront aberration of the light emitted from the optical pickup. Thereby, e.g. an optical pickup wavefront measuring device for highly accurately measuring wavefront aberration of the light emitted from the optical pickup can be constituted with a simple system and alignment in a horizontal direction during aberration measurement can be performed in a short period of time. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to an optical pickup used for recording or reproducing information with respect to an optical information medium typified by an optical disc, and more particularly to a wavefront aberration inspection device, an optical pickup assembly adjustment device, a lens evaluation device, and a lens assembly for an optical pickup. The present invention relates to an objective lens actuator assembly adjustment apparatus for an optical pickup.

  In recent years, optical disk devices have been actively developed as means for recording and reproducing large amounts of data, and approaches for achieving higher recording density have been made.

  In addition to conventional CDs (compact discs) and DVDs (digital multipurpose discs), recently, as the recording capacity of optical information media has further increased, the wavelength of the light source has been shortened, and the NA of the focusing optical system has been increased (NA: aperture). The digital information of about 25 GB with single-sided single layer and about 50 GB with double-sided single layer can be recorded or played back, about 20 GB with single-sided single layer, and about 40 GB with single-sided layer. An HD DVD (High Definition DVD) capable of recording or reproducing information has already been put into practical use.

  With the increase in capacity of this optical disk device, the optical pickup that is the main component is required to have very high performance. Among them, the aberration performance that determines the light collection performance of the light collection optical system is as follows. As the wavelength used is shortened and the NA of the objective lens is increased, extremely severe performance close to the diffraction limit, which is the theoretical limit of wave optics, is required.

  In order to realize the performance, it is necessary to increase the processing accuracy of the optical component that is a component of the optical pickup, but the assembly adjustment accuracy when the optical component is assembled to the optical base of the optical pickup, and Higher accuracy is also required for the aberration measurement accuracy for inspecting the aberration performance of the assembled optical pickup.

  In this optical pickup adjustment process, the optical axis of the laser beam, which is ideally the light source, and the optical axis of the objective lens are arranged so as to coincide with each other, and the light is emitted with respect to the optical axis of the laser light emitted from the objective lens. Adjustment is performed so that the optical disk, which is an information medium, has a vertical posture.

  However, since coma aberration is usually generated in the light emitted from the objective lens due to assembly errors of the optical components that are constituent elements and coma aberration of the optical components alone, the objective lens is attached to the laser. An adjustment method is generally used in which the coma aberration is canceled by inclining with respect to the optical axis of light.

  The adjustment of the tilt of the objective lens of the optical pickup and the inspection of aberration performance are performed based on the observation results obtained by observing the emitted light of the optical pickup with an observation device. Based on this result, it is an adjustment device when adjusting the tilt of the objective lens and the like, and when it is not adjusted, it can be used as an inspection device. A conventional example will be described.

  As a conventional optical pickup inspection apparatus, there is an apparatus using a spot analyzer as disclosed in Patent Document 1.

  This spot analyzer uses a collimator lens to pick up light emitted from an objective lens of an optical pickup, forms an image on a CCD camera, and detects the magnitude and direction of coma from the spot image of the CCD camera. Specifically, in the spot image projected on the monitor, the coma aberration amount is visually or by image analysis based on the roundness of the 0th-order light image and the uniformity of the ring-shaped image by the 1st-order diffracted light. To get.

  The adjustment device using the spot analyzer has an advantage that the configuration is simple, but the aberration of the device itself may affect the measurement result. Therefore, the aberration of the device must be eliminated as much as possible. Since crosstalk between components cannot be completely removed, there is a problem that it is difficult to measure each aberration component independently with high accuracy, and the performance is high for adjustment and inspection of recent optical pickups for high-density recording. That's not enough. Therefore, recently, a method of detecting aberrations with high accuracy using an adjustment device using an interferometer is also used.

  Patent Document 2 discloses an aberration inspection apparatus using a Mach-Zehnder interferometer, in which light emitted from an optical pickup is incident on a Mach-Zehnder interferometer, and a phase is applied to an interference wavefront obtained from the Mach-Zehnder interferometer. By applying the modulation, the wavefront aberration of the light emitted from the optical pickup is obtained.

  The adjustment device using this Mach-Zehnder interferometer has the advantage that the optical pickup can be inspected with high accuracy because it can measure the wavefront aberration with high accuracy, but it can interfere with the optical pickup with high accuracy to obtain the reference light. The optical axis position of the meter must be adjusted (a few microns or less), the coherence of the light to be measured must be high, the influence of interference is very strong, and the measurement accuracy when noise light is superimposed on the interference wavefront However, it is difficult to use as a practical manufacturing apparatus because the optical system is complicated and the apparatus itself is very expensive.

  However, Patent Document 3 discloses an optical pickup wavefront measuring apparatus using the Shack-Hartmann method, and as a method capable of eliminating the drawbacks of the wavefront measuring apparatus using the interferometer, In recent years, it has attracted attention.

  A wavefront measuring apparatus using the Shack-Hartmann method makes light to be measured incident on a lens array, and the light to be measured is determined by a difference between a focal position of each lens constituting the lens array and a spot position on which the light to be measured is condensed. Hereinafter, the principle of the Shack-Hartmann method will be briefly described with reference to FIG.

  A) in FIG. 3 is a phase wavefront distribution of the light to be measured. Region 1, region 2, region 3, region 4,. . . In the microlenses L1, L2, L3, L4,. . . Respectively incident on. Each microlens has a focal length f.

  In general, when collimated light is incident on a lens, the displacement Δx of the spot position is proportional to fθ if the wavefront of the incident light has a tilt of θ.

  Therefore, the local wavefront inclination of each region is obtained from the amount of deviation of the spot position of each microlens from the focal position (Δx1, Δx2, Δx3, Δx4,... The phase wavefront of the light to be measured is synthesized (FIG. 6b)).

  Since this Shack-Hartmann method is not a wavefront detection method by interference, it is difficult to be affected by the coherence of the light to be measured and interference by noise light, and the reference light that can be configured at low cost due to its simple structure. There is an advantage that the optical system to be generated is unnecessary and the optical system can be simplified.

  Hereinafter, the configuration of a conventional optical pickup wavefront measuring apparatus using the Shack-Hartmann method will be described with reference to FIG.

  In FIG. 9, the light emitted from the optical pickup 16 is converted into parallel light by the collimator lens 1 and then incident on the lens array 7 via the third beam splitter 41, and the convergent light from the lens array 7 is CCD. A plurality of spots are formed on the camera 8.

  The condensing position information of the plurality of spots received by the CCD camera 8 is sent to the image processing device 13, and the information processing device 15 calculates the phase wavefront by the Shack-Hartmann method.

  The information processing device 15 detects the magnitude and direction of various aberration components from the phase wavefront, and displays each information on the screen.

  By the way, in the initial state in which the optical pickup is disposed, the position of the objective lens 5 is usually largely deviated. Therefore, the parallel light from the collimator lens 1 is observed by the autocollimator 6, and the position of the optical pickup 16 is observed. Is adjusted to move the position of the objective lens 5 to a predetermined position range.

  Specifically, the position of the objective lens 5 in the horizontal direction is adjusted according to the position of the spot image displayed on the autocollimator 6, and the position of the objective lens 5 in the focus direction is adjusted according to the size of the spot image. I do.

  Further, the collimated light from the collimator lens 1 partially extracted by the first beam splitter 2 is condensed on the first light receiving element 12 by the cylindrical lens 11 and generally used well for an optical pickup or the like. A focus error signal is generated by the focus / tracking error generator 14 using the astigmatism method.

  Further, the collimated light from the collimator lens 1 partially extracted by the second beam splitter 3 is condensed on the second light receiving element 10 by the lens 9, and the light condensing on the light receiving surface of the light receiving element 10. A tracking error signal is generated from the position of the spot by the focus / tracking error generator 14.

Based on the focus error signal and the tracking error signal, the objective lens actuator 20 is driven in the focus direction and the tracking direction, respectively, and the position of the objective lens 5 is controlled.
Japanese Patent No. 3792218 JP 2004-271365 A JP 2005-353262 A

  The conventional optical pickup aberration inspection apparatus using the Shack-Hartmann method has an advantage that an optical system for generating reference light is unnecessary as compared with the conventional optical pickup aberration inspection apparatus using an interferometer. There is a problem that the measurement optical system is easily influenced by the off-axis characteristics of the collimator lens.

  The above problem will be described below with reference to FIG. 4 shows a part of the optical system of FIG. 9. In FIG. 4, reference numeral 23 denotes an objective lens of an optical pickup, 24 denotes a divergent light from the objective lens 23, which is converted into parallel light, and the Shack-Hartmann method is used. It is a collimator lens for detecting wavefront aberration and guiding it to a lens array (not shown). The center line of each lens indicates the optical axis of the lens.

  FIG. 4A shows a state in which the respective lenses are ideally arranged in a state where the optical axes of the objective lens 23 and the collimator lens 24 coincide with each other.

  However, when the optical axes of the objective lens 23 and the collimator lens 24 are shifted as shown in FIG. 4B, the light passing through the collimator lens 24 is inclined and emitted.

  When light is emitted with an inclination from the optical axis in this way, an aberration commonly called off-axis aberration is generated in the collimator lens, and in particular, an optical pickup for high-density recording with a short wavelength and a large NA is measured. It appears prominently. As a result, an off-axis aberration of several mλ is generated for a positional shift of about 1 micron, and an error is generated in the aberration measurement result.

  In the current optical pickup for high-density recording, the aberration inspection specification may be about 15 mλ or less in order to obtain a sufficient condensing spot, and the influence of the measurement error is large, and the objective lens 23 and the collimator It is necessary to suppress the optical axis shift of the lens 24. In order to perform this optical axis deviation with high accuracy, it is necessary to provide a complicated dedicated position detection means. For example, an autocollimator is used as the position detection means.

  However, the position detection means usually has a trade-off relationship between the detection range and the detection resolution. Therefore, measurement of conventional optical pickups for DVDs and CDs, assembling of telescopes and the like that have been used with the Shack-Hartmann method, are relatively inaccurate position adjustments and only require a coarse detection resolution. Therefore, an autocollimator with a wide detection range and a low detection resolution was sufficient. However, when high-precision position adjustment is required like the optical pickup for high-density recording, an autocollimator is necessary. There is a problem that a high detection resolution cannot be realized.

  In addition, a position adjustment unit with a narrow detection range and high detection resolution is provided separately. Position adjustment by a position detection unit with a wide detection range and low detection resolution and a position by a position detection unit with a narrow detection range and high detection resolution. In the case where the position adjustment is performed by two steps of fine adjustment, there is a problem that the adjustment tact increases.

  The present invention solves the above-described problems, and an optical pickup wavefront aberration inspection apparatus, an optical pickup assembly adjustment apparatus, which measures an optical pickup with good aberration performance with high accuracy in a short time with a simple optical system, and Provides a lens evaluation device, a lens assembly device, and an objective lens actuator assembly adjustment device for an optical pickup.

  In order to solve the above problems and achieve the object, an invention according to claim 1 of the present invention includes a laser light source, and an objective lens for condensing the laser light generated from the laser light source onto an optical information medium. And an objective lens actuator that drives the objective lens in a focus direction and a tracking direction, and a wavefront aberration inspection that measures the wavefront aberration of the measured light using the emitted light from the objective lens as the measured light. The wavefront aberration inspection apparatus includes a collimator lens that converts the measured light into parallel light, and a lens array, and the measured light that has passed through the collimator lens is incident on the lens array, The wavefront aberration of the light to be measured from the difference between the focal position of each lens constituting the lens array and the spot position on which the light to be measured is condensed And detecting a wavefront aberration of the phase of the light to be measured, which is detected by the wavefront aberration detecting means when measuring the wavefront aberration of the light to be measured. Furthermore, the wavefront aberration inspection apparatus is characterized in that the horizontal position of the optical pickup is adjusted.

  As a result, for example, an optical pickup wavefront measuring apparatus that measures the wavefront aberration of the light emitted from the optical pickup with high accuracy can be configured with a simple system, and alignment in the horizontal direction during aberration measurement can be realized in a short time.

  According to a second aspect of the present invention, there is provided a laser light source, an objective lens for condensing the laser light generated from the laser light source onto an optical information medium, and the objective lens in a focus direction and a tracking direction. And a wavefront aberration inspection device for measuring wavefront aberration of the light to be measured using the light emitted from the objective lens as light to be measured. Has a collimator lens that converts the light to be measured into parallel light and a lens array, and the light to be measured that has passed through the collimator lens is incident on the lens array, and the focal points of the lenses that constitute the lens array Wavefront aberration detecting means for detecting a wavefront aberration of the light to be measured from a difference between a position and a spot position on which the light to be measured is condensed. Then, when measuring the wavefront aberration of the measured light, the position of the optical pickup in the focus direction so as to minimize the power component of the phase wavefront of the measured light detected by the wavefront aberration detecting means It is a wavefront aberration inspection apparatus characterized by performing adjustment.

  As a result, for example, the optical pickup wavefront measuring apparatus that measures the wavefront aberration of the light emitted from the optical pickup with high accuracy can be configured with a simple system, and focus adjustment at the time of aberration measurement can be realized in a short time.

  The invention according to claim 3 of the present invention minimizes the power component of the phase wavefront of the measured light detected by the wavefront aberration detecting means when measuring the wavefront aberration of the measured light. The wavefront aberration inspection apparatus according to claim 1, wherein the position of the optical pickup in the focus direction is adjusted.

  As a result, for example, an optical pickup wavefront measuring apparatus that accurately measures the wavefront aberration of light emitted from the optical pickup can be configured with a simple system, and horizontal alignment and focus adjustment during aberration measurement can be performed in a short time. Can be realized.

  The invention according to claim 4 of the present invention minimizes the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means when measuring the wavefront aberration of the measured light. The wavefront aberration inspection device according to claim 2, wherein the horizontal adjustment of the position of the optical pickup is performed.

  As a result, for example, an optical pickup wavefront measuring apparatus that accurately measures the wavefront aberration of light emitted from the optical pickup can be configured with a simple system, and horizontal alignment and focus adjustment during aberration measurement can be performed in a short time. Can be realized.

  According to a fifth aspect of the present invention, the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in the horizontal direction or the focus direction, respectively. The wavefront aberration inspection apparatus according to any one of Items 1 to 4.

  Thereby, for example, the wavefront measurement of the optical pickup in the optical pickup having a plurality of light sources can be performed in a short time and with high accuracy.

  According to a sixth aspect of the present invention, since the optical pickup corresponds to a plurality of optical information media, the optical pickup includes a plurality of the objective lenses and a plurality of the light sources, and a plurality of the objectives. 6. The wavefront aberration inspection apparatus according to claim 1, comprising a plurality of the collimator lenses corresponding to the lens.

  Thereby, for example, the wavefront measurement of the optical pickup in the optical pickup having a plurality of light sources can be performed with high accuracy in a short time.

  According to a seventh aspect of the present invention, there is provided a laser light source, an objective lens for condensing the laser light generated from the laser light source onto an optical information medium, and the objective lens in a focus direction and a tracking direction. An objective lens actuator that is driven by the optical pickup, the objective lens, or an optical pickup assembly adjusting device that performs tilt adjustment of the objective lens actuator, wherein the optical pickup assembly adjusting device is provided in the optical pickup, The output light from the objective lens is measured light, the collimator lens converts the measured light into parallel light, and a lens array, and the measured light that has passed through the collimator lens is incident on the lens array. The focal position of each lens constituting the lens array and the light to be measured are condensed Wavefront aberration detecting means for detecting the wavefront aberration of the light to be measured from the difference from the spot position to be measured, and when performing tilt adjustment of the objective lens or the objective lens actuator in the optical pickup, An optical pickup assembling / adjusting apparatus that adjusts a horizontal position of the optical pickup so as to minimize a tilt component of a phase wavefront of the measured light detected by the wavefront aberration detecting means. is there.

  Thereby, for example, the optical pickup assembly and adjustment apparatus that performs assembly and adjustment of the optical pickup with high accuracy can be configured with a simple system, and the horizontal alignment at the time of aberration measurement can be realized in a short time.

  According to an eighth aspect of the present invention, there is provided a laser light source, an objective lens for condensing laser light generated from the laser light source onto an optical information medium, and the objective lens in a focus direction and a tracking direction. An objective lens actuator that is driven by the optical pickup, the objective lens, or an optical pickup assembly adjusting device that performs tilt adjustment of the objective lens actuator, wherein the optical pickup assembly adjusting device is provided in the optical pickup, The output light from the objective lens is measured light, the collimator lens converts the measured light into parallel light, and a lens array, and the measured light that has passed through the collimator lens is incident on the lens array. The focal position of each lens constituting the lens array and the light to be measured are condensed Wavefront aberration detecting means for detecting the wavefront aberration of the light to be measured from the difference from the spot position to be measured, and when performing tilt adjustment of the objective lens or the objective lens actuator in the optical pickup, An optical pickup assembling / adjusting apparatus that adjusts a position of the optical pickup in a focus direction so as to minimize a power component of a phase wavefront of the light to be measured, which is detected by the wavefront aberration detecting unit. is there.

  As a result, for example, the optical pickup assembly adjusting apparatus that performs assembly adjustment of the optical pickup with high accuracy can be configured by a simple system, and focus adjustment at the time of aberration measurement can be realized in a short time.

  According to a ninth aspect of the present invention, in the optical pickup, the measured light detected by the wavefront aberration detecting means when adjusting the tilt of the objective lens or the objective lens actuator. 8. The optical pickup assembly adjusting apparatus according to claim 7, wherein the optical pickup is adjusted in position in the focus direction so as to minimize the power component of the phase wavefront.

  As a result, for example, an optical pickup assembly and adjustment device that performs assembly and adjustment of the optical pickup with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of aberration measurement can be realized in a short time. .

  According to a tenth aspect of the present invention, in the optical pickup, the measured light detected by the wavefront aberration detecting means when adjusting the tilt of the objective lens or the objective lens actuator. 9. The optical pickup assembling and adjusting apparatus according to claim 8, wherein the optical pickup is adjusted in a horizontal direction so that a tilt component of the phase wavefront is minimized.

  As a result, for example, an optical pickup assembly and adjustment device that performs assembly and adjustment of the optical pickup with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of aberration measurement can be realized in a short time. .

  According to an eleventh aspect of the present invention, the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in the horizontal direction or the focus direction, respectively. The optical pickup assembly adjusting apparatus according to any one of Items 7 to 10.

  As a result, for example, an optical pickup assembly and adjustment device that performs assembly and adjustment of the optical pickup with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of aberration measurement can be realized in a short time. .

  According to a twelfth aspect of the present invention, since the optical pickup corresponds to a plurality of optical information media, the optical pickup includes a plurality of the objective lenses and a plurality of the laser light sources. The optical pickup assembling / adjusting apparatus according to claim 7, further comprising a plurality of the collimator lenses with respect to the objective lens.

  Thereby, for example, the wavefront measurement of the optical pickup in the optical pickup having a plurality of light sources can be performed with high accuracy in a short time.

  According to a thirteenth aspect of the present invention, there is provided a lens evaluation device that measures the wavefront aberration of the light emitted from the lens and evaluates the aberration performance of the lens. The lens evaluation device includes a laser light source, A collimator lens that converts light to be measured as light to be measured emitted from the laser light source and passed through the lens, and a lens array, and the light to be measured that has passed through the collimator lens. Wavefront aberration detecting means for detecting a wavefront aberration of the light to be measured from a difference between a focal position of each lens constituting the lens array and a spot position on which the light to be measured is collected; When measuring the wavefront aberration of the light emitted from the lens, the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. And performing horizontal position adjustment of the lens, a lens evaluation device.

  Thereby, for example, a lens wavefront measuring apparatus that performs the wavefront aberration of the lens with high accuracy can be configured with a simple system, and horizontal alignment at the time of aberration measurement can be realized in a short time.

  The invention according to claim 14 of the present invention is a lens evaluation device that measures the wavefront aberration of the light emitted from the lens and evaluates the aberration performance of the lens. The lens evaluation device includes a laser light source, A collimator lens that converts light to be measured as light to be measured emitted from the laser light source and passed through the lens, and a lens array, and the light to be measured that has passed through the collimator lens. Wavefront aberration detecting means for detecting a wavefront aberration of the light to be measured from a difference between a focal position of each lens constituting the lens array and a spot position on which the light to be measured is collected; When measuring the wavefront aberration of the light emitted from the lens, the power component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. And performing focus direction position adjustment of the lens, a lens evaluation device.

  Thereby, for example, a lens wavefront measuring apparatus that performs the wavefront aberration of the lens with high accuracy can be configured with a simple system, and focus adjustment at the time of aberration measurement can be realized in a short time.

  According to the fifteenth aspect of the present invention, the power component of the phase wavefront of the measured light detected by the wavefront aberration detecting means when measuring the wavefront aberration of the light emitted from the lens. The lens evaluation device according to claim 13, wherein the position of the lens in the focus direction is adjusted so as to be minimized.

  Thereby, for example, a lens wavefront measuring apparatus that performs the wavefront aberration of the lens with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of aberration measurement can be realized in a short time.

  According to the sixteenth aspect of the present invention, the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means when measuring the wavefront aberration of the light emitted from the lens. The lens evaluation apparatus according to claim 14, wherein the position of the lens in the horizontal direction is adjusted so as to be minimized.

  Thereby, for example, a lens wavefront measuring apparatus that performs the wavefront aberration of the lens with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of aberration measurement can be realized in a short time.

  According to a seventeenth aspect of the present invention, the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in the horizontal direction or the focus direction, respectively. The lens evaluation device according to any one of Items 13 to 16.

  Thereby, for example, the wavefront measurement of the optical pickup lens in the optical pickup can be performed with high accuracy in a short time.

  According to an eighteenth aspect of the present invention, there is provided a lens assembling apparatus for assembling an assembled lens composed of a plurality of optical components, wherein the lens assembling apparatus emits a laser light source and the laser light source. A collimator lens that converts the light to be measured into parallel light, and a lens array, and the light to be measured that has passed through the collimator lens is incident on the lens array. And a wavefront aberration detecting means for detecting a wavefront aberration of the measured light from a difference between a focal position of each lens constituting the lens array and a spot position where the measured light is condensed, When assembling the group lens, the horizontal position adjustment of the group lens is performed so as to minimize the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. Characterized Ukoto a lens assembly apparatus.

  Thereby, for example, a lens assembly adjusting device for assembling a lens with high accuracy can be configured with a simple system, and horizontal alignment at the time of adjustment can be realized in a short time.

  According to a nineteenth aspect of the present invention, there is provided a lens assembling apparatus for assembling a combined lens composed of a plurality of optical components, wherein the lens assembling apparatus emits a laser light source and the laser light source. A collimator lens that converts the light to be measured into parallel light, and a lens array, and the light to be measured that has passed through the collimator lens is incident on the lens array. And a wavefront aberration detecting means for detecting a wavefront aberration of the measured light, the difference between a focal position of each lens constituting the lens array and a spot position where the measured light is condensed, When assembling the group lens, the position of the group lens in the focus direction so as to minimize the power component of the phase wavefront of the measured light detected by the wavefront aberration detector. And performing an integer, a lens assembly apparatus.

  Thereby, for example, a lens assembly adjusting device for assembling a lens with high accuracy can be configured with a simple system, and focus adjustment at the time of adjustment can be realized in a short time.

  In the invention according to claim 20 of the present invention, the power component of the phase wavefront of the measured light detected by the wavefront aberration detecting means when the assembled lens is assembled is minimized. The lens assembly apparatus according to claim 18, wherein the position adjustment of the group lens in the focus direction is performed.

  Thereby, for example, a lens assembly adjusting device for assembling a lens with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of adjustment can be realized in a short time.

  The invention according to claim 21 of the present invention is such that, when the assembled lens is assembled, the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means is minimized. The lens assembly apparatus according to claim 19, wherein the horizontal position of the group lens is adjusted.

  Thereby, for example, a lens assembly adjusting device for assembling a lens with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of adjustment can be realized in a short time.

  According to a twenty-second aspect of the present invention, the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in the horizontal direction or the focus direction, respectively. The lens assembly device according to any one of Items 18 to 21.

  Thereby, for example, a lens assembly adjusting device for assembling a lens with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of adjustment can be realized in a short time.

  According to a twenty-third aspect of the present invention, there is provided an objective lens actuator assembly / adjustment device in which an objective lens of an optical pickup is attached to an objective lens actuator that drives the objective lens. Includes a laser light source, a collimator lens that converts the light to be measured into parallel light, using the light emitted from the laser light source and passing through the objective lens as light to be measured, and a lens array, and the collimator lens The measured light that has passed through is incident on the lens array, and the wavefront aberration of the measured light is determined by the difference between the focal position of each lens constituting the lens array and the spot position where the measured light is condensed. Wavefront aberration detecting means for detecting, and the objective lens in the optical pickup is connected to the objective lens activator. Adjusting the horizontal position of the objective lens so as to minimize the tilt component of the phase wavefront of the light to be measured, which is detected by the wavefront aberration detection means when attached to the eta, It is an objective lens actuator assembly adjustment apparatus.

  Thereby, for example, the objective lens actuator assembly and adjustment apparatus for assembling the objective lens actuator with high accuracy can be configured with a simple system, and the horizontal alignment at the time of adjustment can be realized in a short time.

  According to a twenty-fourth aspect of the present invention, there is provided an objective lens actuator assembly / adjustment device in which an objective lens of an optical pickup is attached to an objective lens actuator that drives the objective lens. Includes a laser light source, a collimator lens that converts the light to be measured into parallel light, using the light emitted from the laser light source and passing through the objective lens as light to be measured, and a lens array, and the collimator lens The measured light that has passed through is incident on the lens array, and the wavefront aberration of the measured light is determined by the difference between the focal position of each lens constituting the lens array and the spot position where the measured light is condensed. Wavefront aberration detecting means for detecting, and the objective lens in the optical pickup is connected to the objective lens activator. An objective that adjusts the focus direction of the objective lens so as to minimize the power component of the phase wavefront of the light to be measured, which is detected by the wavefront aberration detecting means when attached to the eta. It is a lens actuator assembly adjustment device.

  Thereby, for example, the objective lens actuator assembly adjusting apparatus for assembling the objective lens actuator with high accuracy can be configured with a simple system, and the focus adjustment at the time of adjustment can be realized in a short time.

  According to a twenty-fifth aspect of the present invention, the phase wavefront of the measured light detected by the wavefront aberration detecting means when the objective lens is attached to the objective lens actuator in the optical pickup. 24. The objective lens actuator assembly adjusting device according to claim 23, wherein the position of the objective lens in the focus direction is adjusted so as to minimize the power component of the objective lens actuator.

  Thereby, for example, the objective lens actuator assembly and adjustment apparatus for assembling the objective lens actuator with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of adjustment can be realized in a short time.

  According to a twenty-sixth aspect of the present invention, the phase wavefront of the measured light detected by the wavefront aberration detecting means when the objective lens is attached to the objective lens actuator in the optical pickup. 25. The objective lens actuator assembly adjusting device according to claim 24, wherein the position of the objective lens in the horizontal direction is adjusted so as to minimize the tilt component.

  Thereby, for example, the objective lens actuator assembly and adjustment apparatus for assembling the objective lens actuator with high accuracy can be configured with a simple system, and horizontal alignment and focus adjustment at the time of adjustment can be realized in a short time.

  According to a twenty-seventh aspect of the present invention, the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in the horizontal direction or the focus direction, respectively. 27. The objective lens actuator assembly adjusting device according to any one of items 23 to 26.

  Thereby, for example, assembly adjustment of the optical pickup objective lens actuator in the optical pickup can be performed with high accuracy in a short time.

  According to a twenty-eighth aspect of the present invention, since the objective lens actuator corresponds to a plurality of optical information media, the objective lens actuator has a plurality of objective lenses, and a plurality of objective lenses are provided. The objective lens actuator assembly adjusting apparatus according to any one of claims 23 to 27, further comprising the collimator lens.

  Thereby, for example, assembly adjustment of the optical pickup objective lens actuator in the optical pickup having a plurality of light sources can be performed with high accuracy in a short time.

  The invention according to claim 29 of the present invention is an optical pickup assembled by the optical pickup assembling / adjusting apparatus according to claim 12, wherein the plurality of optical information media are a Blu-ray disc and an HD DVD. , DVD, CD, Blu-ray disc uses a first light source and a first objective lens for recording or playback, and HD DVD, DVD and CD each use a common second objective lens The optical pickup is characterized in that recording or reproduction is performed.

  Thereby, for example, an optical pickup capable of recording or reproducing with high accuracy on each optical information medium of Blu-ray disc, HDDVD, DVD, and CD can be configured.

  The invention according to claim 30 of the present invention is an optical pickup assembled by the optical pickup assembling / adjusting device according to claim 12, wherein the plurality of optical information media are a Blu-ray disc and an HD DVD. The optical pickup is a DVD, a CD, and records or reproduces each optical information medium using a common objective lens.

  Thereby, for example, a high-performance optical pickup capable of recording or reproducing on each optical information medium of Blu-ray disc, HDDVD, DVD, and CD can be configured by a single common lens.

  According to a thirty-first aspect of the present invention, there is provided an optical disc drive wherein the optical information medium is recorded or reproduced by the optical pickup of the twenty-ninth or thirty-third aspect.

  Thereby, for example, a high-performance optical disk drive can be configured.

  According to a thirty-second aspect of the present invention, there is provided an optical information recording / reproducing apparatus for recording or reproducing the optical information medium by the optical disc drive according to the thirty-first aspect.

  Thereby, for example, a high-performance optical information processing system can be configured.

  As described above, according to the configuration of the present invention, highly accurate wavefront aberration measurement can be configured with a simple system, and alignment at the time of aberration measurement can be realized in a short time.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

(Embodiment 1)
FIG. 1 is a configuration diagram showing an example of a wavefront aberration inspection device for light emitted from an optical pickup according to Embodiment 1 of the present invention.

  In FIG. 1, the light emitted from the optical pickup 16 is converted into parallel light by the collimator lens 1 and then incident on the lens array 7 via the reflection mirror 4. The convergent light from the lens array 7 is reflected on the CCD camera 8. A plurality of spots are formed.

  Here, a cover glass (not shown) having a thickness optically equivalent to a protective layer of an optical information medium on which the optical pickup 16 performs recording or reproduction is disposed on the incident surface side of the collimator lens. The cover glass is switched according to the corresponding optical information medium.

  Next, the condensing position information of the plurality of spots received by the CCD camera 8 is sent to the image processing device 13, and the information processing device 15 calculates the phase wavefront by the Shack-Hartmann method.

  The information processing device 15 calculates the magnitude and direction of various aberration components from the phase wavefront and displays each information on the screen.

  As a procedure for deriving the magnitude and direction of each aberration component, a method is usually used in which the phase wavefront is expanded by Zernike polynomials in polar coordinates and obtained from the values of each Zernike expansion coefficient. And an algorithm for performing calculation processing using numerical integration has already been established, and details thereof are omitted here.

  Among the aberration components, components often used as analysis targets of the optical pickup are third-order coma aberration, third-order astigmatism, tilt, power, third-order spherical aberration, fifth-order coma aberration, and fifth-order astigmatism. 5th order spherical aberration and the like, coma, astigmatism, and tilt have directionality and are treated as vector values.

  Now, in the initial state where the optical pickup is disposed, the position of the objective lens 5 of the optical pickup 16 is usually deviated from the optimum position for measurement. The optimum position for measurement is a position where the optical axes and the focal points of the objective lens 5 and the collimator lens 1 coincide.

  When the objective lens 5 is displaced by x (mm) in the horizontal direction with respect to the optical axis of the collimator lens 1, the light to be measured that has passed through the collimator lens 1 is inclined by θ with respect to the optical axis of the collimator lens 1. If the focal length of the collimator lens 1 is f (mm), the relationship x = f · tan θ is satisfied. According to the theory of wave optics, it is known that the slope θ is proportional to the coefficients of the second and third terms of the Zernike polynomial, and this term is called the phase wavefront tilt component. Accordingly, if the optical pickup 16 is aligned in the horizontal direction so that the tilt component obtained from the analysis result of the phase wavefront is zero, the optical axis direction of the light emitted from the collimator lens 1 is The collimator lens 1 can be made to coincide with the optical axis direction.

  Therefore, the off-axis aberration generated by the collimator lens 1 can be eliminated, and the measurement error due to the positional deviation of the optical pickup 16 can be reduced.

  The tilt component is very sensitive, and has a detection sensitivity of 0.1 microns or less for a sufficiently measurable value of, for example, 0.1λrms.

  By the way, as a conventional method for evaluating the light emitted from the objective lens of the optical pickup, a method of observing a spot image or a method of measuring aberration using a Mach-Zehnder interferometer is generally used. Although it is necessary to capture the light emitted from the objective lens using a lens, there is a problem that an image of non-measurement light cannot be obtained unless the deviation of the optical axes of the objective lens and the collimator lens is suppressed within several microns.

  However, since the initial positional deviation between the optical pickup and the aberration measurement system can only be suppressed to several hundred microns by mechanical positioning, in order to reduce the positional deviation to several microns or less by the conventional method, Separately, it is necessary to provide a dedicated misalignment detection means and perform position adjustment.

  However, in the configuration of the present invention, as described above, since aberration detection is detected from the spot array of the lens array, aberration detection is possible in a wide range where the spot array can be observed, for example, in the range of about several hundred microns. There is the feature that it is.

  Therefore, even if the optical pickup 16 is displaced from the optimal position by several hundred microns, the position adjustment can be performed using the tilt component. In this case, an error occurs in the aberration component in accordance with the position shift, but the error decreases as it converges to the optimum position, and when the position shift finally converges to about several microns, accurate aberration is measured. It becomes possible.

  That is, by using the tilt component as the position shift detection means, position shift detection over a wide range from several hundred microns to sub-microns can be performed, so there is no need to provide a dedicated position shift detection means separately. It is possible to simplify the measurement, and it is not necessary to operate a dedicated misregistration detection means, so that the measurement tact can be shortened.

  The position adjustment may be performed manually, but since precise position control is required, the tilt information is sent to the position control interface 17 and the optical pickup 16 is driven electrically by the optical pickup position adjusting means 18. This is a practical method. The optical pick position adjusting means 18 uses a stepping motor, a piezoelectric element, or the like as power.

  In each of the aberration components, the power component serves as an index that quantitatively indicates the parallelism of the parallel light emitted from the collimator lens 1, which includes the collimator lens 1, the objective lens 5 of the optical pickup 16, and the like. It is proportional to the displacement in the focus direction.

  Normally, when the collimator lens 1 and the objective lens 5 of the optical pickup 16 are displaced with respect to the focus direction, spherical aberration is generated in the collimator lens 1 in proportion to the amount of displacement in the focus direction.

  This relationship is SA ′ = SA + kΔf, where SA is the spherical aberration of the optical pickup that is the object to be measured, SA ′ is the spherical aberration of the light beam that has passed through the collimator lens 1, and Δf is the power component of the wavefront aberration. Here, k is a coefficient determined by the numerical aperture of the measurement object, the design of the collimator lens, and the like. For example, in the case of a collimator lens having a numerical aperture of 0.85, it is about 0.1.

  Therefore, since the positional deviation in the focus direction gives an error to the measured value of spherical aberration, the measurement accuracy of spherical aberration is improved by adjusting the focus position of the optical pickup 16 so that the power component becomes zero. It becomes possible.

  Therefore, by using the power component as the focus position deviation detection means, it is not necessary to provide a dedicated focus position detection means separately, and the optical system can be simplified.

  Incidentally, the objective lens 5 may be a plurality of objective lenses, and by moving the collimating lens 1, it is possible to measure aberrations of the plurality of objective lenses, but the plurality of objective lenses are different from each other. Since it corresponds to an optical information medium having a wavelength, NA, and protective layer thickness, the collimating lens 1 also needs to correspond to all wavelengths, NA, and protective layer thickness to be used. There is a problem that the lens structure is expensive.

  Further, during the measurement, the collimator lens 1 is moved with respect to each objective lens, and the cover glass having a thickness equivalent to the protective layer thickness disposed on the incident surface of the collimator lens 1 must be switched. There is also a problem that the operation of the apparatus becomes complicated.

  Therefore, instead of using a single collimating lens, if a dedicated collimating lens is arranged for each of the plurality of objective lenses, the structure of the collimating lens is simplified, the cost is reduced, and the collimating lens is moved. Tact can be shortened.

  Furthermore, if the cover glass corresponding to each of the plurality of objective lenses is integrated with the dedicated collimating lens, tact due to cover glass switching can be shortened.

  In the present embodiment, the case where the present invention is applied to the wavefront aberration inspection device for the light picked up from the optical pickup has been described. However, as shown in FIG. If the objective lens actuator 20 is adjusted by the objective lens actuator position adjusting means 19 so that the objective lens actuator 20 can be minimized, the objective lens actuator 20 can be used as an optical pickup assembly adjusting device that adjusts the inclination of the objective lens of the optical pickup 16. is there.

  In the present embodiment, the relative position of the collimator lens 1 and the objective lens 5 is adjusted by driving the optical pickup 16, but the position of the collimator lens 1 is adjusted. The collimator lens position adjusting means 21 may be controlled to adjust the relative position of the collimator lens 1 and the objective lens 5.

  Further, the relative position adjustment of the collimator lens 1 and the objective lens 5 can be performed by electrically driving the objective lens actuator 20 and moving it in the focus direction and the tracking direction.

(Embodiment 2)
FIG. 5 is a configuration diagram illustrating an example of a wavefront aberration inspection apparatus according to Embodiment 2 of the present invention.

  Unlike the first embodiment, an autocollimator 6 for detecting the position of the optical pickup 16 is disposed.

  As described in the first embodiment, the positional adjustment of the optical pickup 16 can be performed over a wide range from several hundred microns to a submicron by using the tilt component as the positional deviation detection means. In FIG. 3 illustrating the principle of the Shack-Hartmann method, when the position of each lens constituting the lens array 22 is displaced so as to come out of each region, the tilt cannot be accurately detected. . Specifically, in FIG. 3, when the incident light to the microlens L1 is greatly inclined and the spot of the microlens L1 is condensed in the region 2, the spot overlaps with the spot of the microlens L2, and an error occurs in wavefront detection. It will occur.

  Therefore, when the positional deviation in the initial state where the optical pickup 16 is disposed is large, the parallel light from the collimator lens 1 is observed by the autocollimator 6 and the position of the optical pickup 16 is moved to a predetermined position range. Thus, the coarse adjustment of the positional deviation is once performed.

  Specifically, the position of the objective lens 5 in the horizontal direction is adjusted according to the position of the spot image displayed on the autocollimator 6, and the position of the objective lens 5 in the focus direction is roughly adjusted according to the size of the spot image. Make adjustments.

  When the coarse position adjustment is completed within the predetermined range, the optical pickup is finely adjusted by the tilt component and the power component in the same procedure as in the first embodiment.

  When this configuration is used, the initial position accuracy of the optical pickup can be relaxed, and the equipment cost and tact can be reduced as the optical pickup wavefront aberration apparatus.

  The other contents are the same as those in the first embodiment, and can be used not only as a wavefront aberration apparatus but also as an optical pickup assembly adjustment apparatus that adjusts the inclination of the objective lens 5 of the optical pickup 16. It is.

(Embodiment 3)
FIG. 6 is a configuration diagram showing an example of a lens assembly adjusting device according to Embodiment 3 of the present invention.

  The configuration in FIG. 6 is for use in, for example, assembly adjustment of an optical pickup group objective lens or the like, which is composed of a plurality of lenses and optical elements, and is different from the first and second embodiments. The relative positions of the first lens 25 and the second lens 26, which are constituent elements of the group objective lens, are respectively set as the first position adjusting means 28 and the second position adjusting means 27. It is an apparatus which performs assembly adjustment using.

  A specific assembling procedure is that after the outgoing light from the parallel light source 29 that generates parallel light passes through the first lens 25 and the second lens 26, the outgoing light of the first lens Is detected by an optical system including a collimator lens 1, a reflection mirror 4, a lens array 7 and a CCD camera 8, and the first lens is detected so that the wavefront aberration becomes a minimum value or a predetermined value. 25 and the relative position of the second lens 26 are adjusted using the first position adjusting means 28 and the second position adjusting means 27, respectively, and the first lens 25 is adjusted. And the second lens 26 is joined.

  The other contents are the same as those in the first embodiment and the second embodiment.

  In the present embodiment, a configuration as a lens assembly adjusting device is shown, but the second position adjusting means 27 and the first position adjusting means 28 are omitted, and the lens assembling adjusting device is also used. It is possible.

(Embodiment 4)
FIG. 7 is a configuration diagram showing an example of an objective actuator assembling apparatus according to Embodiment 4 of the present invention.

  The assembly apparatus shown in FIG. 7 is used for assembly adjustment for attaching an objective lens for an optical pickup to an objective lens actuator. The objective lens 5 and the objective lens actuator 30 that are objects of assembly adjustment are respectively An objective lens position adjusting unit 32 and an objective lens actuator position adjusting unit 31 that perform position adjustment are arranged, and other configurations are the same as those in the third embodiment.

  The objective lens and the parallel light source are not limited to one, and the same applies to two or more cases. In FIG. 7, the coma aberration of the two objective lenses is zero with respect to the reference surface (bottom surface) of the objective lens actuator. As shown, an example of adjusting the tilt of each objective lens is shown.

  In FIG. 7, the objective lens actuator 30 is disposed so that the bottom surface is perpendicular to the optical axis of the parallel light source 29, and the objective lens position adjusting means 32 holds the objective lens on the objective lens actuator 30. A lens 5 is arranged.

  Outgoing light from the parallel light source passes through the objective lens 5 and is converted into divergent light, and the wavefront aberration of the divergent light is caused by an optical system including the collimator lens 1, the reflection mirror 4, the lens array 7, and the CCD camera 8. Is detected.

  The objective lens 5 is fixed after the tilt of the objective lens 5 is adjusted so that the wavefront aberration becomes a minimum value or a predetermined value.

  Next, the objective lens position adjusting means 32 and the objective lens actuator position adjusting means 31 are translated, and the other objective lens different from the objective lens 5 that has been adjusted is adjusted and fixed in the same procedure. To do.

  Although the configuration of the objective actuator assembling apparatus is shown in the present embodiment, it can also be used as an objective actuator inspection apparatus that performs only the aberration performance inspection of the objective lens.

  Other contents are the same as those in the first to third embodiments.

(Embodiment 5)
FIG. 8 is a block diagram showing an example of an optical disc apparatus according to Embodiment 5 of the present invention.

  FIG. 8 is a diagram showing a configuration of an optical disk drive for explaining an application example of the optical pickup assembled by the assembly adjusting apparatus according to the first embodiment of the present invention. The optical pickup unit 36, the optical pickup unit 36 are shown. The optical information medium 33 includes a seek motor 38, a lead screw 37, a guide movement drive mechanism including a guide rail 35, a spindle motor 34 that rotationally drives the optical information medium 33, and the like. By moving 33 in the radial direction, information is read from and recorded on the optical disk.

  In FIG. 8, the present invention can also be applied to a case where there are two light sources or two or more objective lenses. As a specific configuration example, for example, a first laser (not shown) having a wavelength of 405 nm is used. A blue-violet laser, a second laser (not shown) is a red laser, a Blu-ray disc and an HD DVD disc are recorded or reproduced by the first objective lens 39, and a DVD and a DVD are recorded by the second objective lens 40. Record or play a CD.

  As another combination, for example, a Blu-ray disc uses a first light source and a first objective lens 39 to perform recording or reproduction, and HD DVD, DVD and CD each share a second A configuration in which recording or playback is performed using the objective lens 40, or a configuration in which recording or playback is performed using a common objective lens for a Blu-ray disc, HD DVD, DVD, or CD is conceivable.

  If the optical disk drive of FIG. 8 is applied to an optical information device, a compact and high-performance optical information device configuration can be realized.

  The other contents are the same as those in the first to fourth embodiments.

  The wavefront aberration inspection apparatus, the optical pickup assembly adjustment apparatus, etc. according to the present invention are an assembly of an optical pickup of an optical information recording / reproducing apparatus using a magneto-optical recording apparatus or an optical disk such as a CD, DVD, HD-DVD, Blu-ray disk apparatus. It is useful as an adjustment device or an inspection device. Further, the present invention can also be applied as an optical pickup assembly adjusting device or an inspection device of a hologram recording device or a future ultra-high density recording / reproducing device.

The block diagram which shows an example of the optical pick-up wavefront aberration inspection apparatus in Embodiment 1 of this invention The block diagram which shows an example of the optical pick-up adjustment apparatus in Embodiment 1 of this invention Illustration explaining the principle of the Shack-Hartmann method The figure which shows the positional relationship of a collimator lens and an objective lens, and the relationship with each optical axis The block diagram which shows an example of the optical pick-up wavefront aberration inspection apparatus in Embodiment 2 of this invention The block diagram which shows an example of the lens assembly adjustment apparatus in Embodiment 3 of this invention. The block diagram which shows an example of the objective actuator assembly apparatus in Embodiment 4 of this invention The block diagram which shows an example of the optical disk apparatus in Embodiment 5 of this invention The figure which shows the structure of the conventional optical pick-up wavefront aberration inspection apparatus

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Collimator lens 2 1st beam splitter 3 2nd beam splitter 4 Reflecting mirror 5 Objective lens 6 Autocollimator 7 Lens array 8 CCD camera 9 Lens 10 2nd light receiving element 11 Cylindrical lens 12 1st light receiving element 13 Image processing Device 14 Focus tracking signal generation device 15 Information processing device 16 Optical pickup 17 Position control interface 18 Optical pickup position adjusting means 19 Objective lens actuator position adjusting means 20 Objective lens actuator 21 Collimator lens position adjusting means 22 Lens array 23 Objective lens 24 Collimator Lens 25 First lens 26 Second lens 27 Second position adjusting means 28 First position adjusting means 29 Parallel light source 30 Objective lens actuator 31 Objective Lens actuator position adjusting means 32 Objective lens position adjusting means 33 Optical information medium 34 Spindle motor 35 Guide rail 36 Optical pickup unit 37 Lead screw 38 Seek motor 39 First objective lens 40 Second objective lens 41 Third beam splitter

Claims (32)

A laser light source;
An objective lens for condensing the laser light generated from the laser light source onto an optical information medium;
An objective lens actuator for driving the objective lens in a focus direction and a tracking direction;
A wavefront aberration inspection apparatus for measuring the wavefront aberration of the light to be measured using the light emitted from the objective lens as the light to be measured in an optical pickup having:
The wavefront aberration inspection apparatus includes:
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
When measuring the wavefront aberration of the measured light, the horizontal position adjustment of the optical pickup is performed so as to minimize the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. A wavefront aberration inspection apparatus, characterized in that: A laser light source;
An objective lens for condensing the laser light generated from the laser light source onto an optical information medium;
An objective lens actuator for driving the objective lens in a focus direction and a tracking direction;
A wavefront aberration inspection apparatus for measuring the wavefront aberration of the light to be measured using the light emitted from the objective lens as the light to be measured in an optical pickup having:
The wavefront aberration inspection apparatus includes:
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
When measuring the wavefront aberration of the light under measurement, the position of the optical pickup in the focus direction is adjusted so as to minimize the power component of the phase wavefront of the light under measurement detected by the wavefront aberration detector. A wavefront aberration inspection apparatus, characterized in that: When measuring the wavefront aberration of the light under measurement, the position of the optical pickup in the focus direction is adjusted so as to minimize the power component of the phase wavefront of the light under measurement detected by the wavefront aberration detector. The wavefront aberration inspection apparatus according to claim 1, wherein the wavefront aberration inspection apparatus is performed. When measuring the wavefront aberration of the measured light, the horizontal position adjustment of the optical pickup is performed so as to minimize the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. The wavefront aberration inspection device according to claim 2, wherein the wavefront aberration inspection device is performed. The wavefront aberration according to any one of claims 1 to 4, wherein the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in a horizontal direction or a focus direction, respectively. Inspection device. The optical pickup includes a plurality of the objective lenses, a plurality of the light sources, and a plurality of the collimator lenses corresponding to the plurality of objective lenses in order to support a plurality of optical information media. The wavefront aberration inspection apparatus according to any one of claims 1 to 5. A laser light source;
An objective lens for condensing the laser light generated from the laser light source onto an optical information medium;
An objective lens actuator for driving the objective lens in a focus direction and a tracking direction;
An optical pickup assembly adjusting device that adjusts the inclination of the objective lens or the objective lens actuator in an optical pickup comprising:
The optical pickup assembly adjusting device is:
In the optical pickup, the light emitted from the objective lens is measured light,
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
In the optical pickup, when performing tilt adjustment of the objective lens or the objective lens actuator, the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. An optical pickup assembling / adjusting apparatus characterized by adjusting a horizontal position of the optical pickup. A laser light source;
An objective lens for condensing the laser light generated from the laser light source onto an optical information medium;
An objective lens actuator for driving the objective lens in a focus direction and a tracking direction;
An optical pickup assembly adjusting device that adjusts the inclination of the objective lens or the objective lens actuator in an optical pickup comprising:
The optical pickup assembly adjusting device is:
In the optical pickup, the light emitted from the objective lens is measured light,
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
In the optical pickup, when performing the tilt adjustment of the objective lens or the objective lens actuator, the power component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. An optical pickup assembling / adjusting apparatus characterized by adjusting a position of the optical pickup in a focus direction. In the optical pickup, when performing the tilt adjustment of the objective lens or the objective lens actuator, the power component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. 8. The optical pickup assembling / adjusting apparatus according to claim 7, wherein the optical pickup is adjusted in position in a focus direction. In the optical pickup, when performing tilt adjustment of the objective lens or the objective lens actuator, the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. 9. The optical pickup assembly adjusting apparatus according to claim 8, wherein the horizontal position adjustment of the optical pickup is performed. 11. The optical pickup according to claim 7, wherein the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in the horizontal direction or the focus direction, respectively. Assembly adjustment device. The optical pickup includes a plurality of objective lenses and a plurality of laser light sources in order to support a plurality of optical information media, and a plurality of collimator lenses for the plurality of objective lenses. The optical pickup assembly adjusting device according to any one of claims 7 to 11. A lens evaluation device for measuring the wavefront aberration of light emitted from a lens and evaluating the aberration performance of the lens,
The lens evaluation device includes:
A laser light source;
The light emitted from the laser light source and passed through the lens is measured light.
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
When measuring the wavefront aberration of the light emitted from the lens, the horizontal position adjustment of the lens is performed so as to minimize the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. A lens evaluation apparatus characterized by performing: A lens evaluation device for measuring the wavefront aberration of light emitted from a lens and evaluating the aberration performance of the lens,
The lens evaluation device includes:
A laser light source;
The light emitted from the laser light source and passed through the lens is measured light.
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
When measuring the wavefront aberration of the light emitted from the lens, the position of the lens in the focus direction is adjusted so that the power component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. A lens evaluation apparatus characterized by performing: When measuring the wavefront aberration of the light emitted from the lens, the position of the lens in the focus direction is adjusted so that the power component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. The lens evaluation device according to claim 13, wherein: When measuring the wavefront aberration of the light emitted from the lens, the horizontal position adjustment of the lens is performed so as to minimize the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. The lens evaluation device according to claim 14, wherein: The lens evaluation apparatus according to claim 13, wherein the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in a horizontal direction or a focus direction, respectively. . A lens assembling apparatus for assembling a combined lens composed of a plurality of optical components,
The lens assembly apparatus includes:
A laser light source;
The light emitted from the laser light source and passed through the assembled lens is measured light.
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
When assembling the group lens, the horizontal position adjustment of the group lens is performed so as to minimize the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. A lens assembly device. A lens assembling apparatus for assembling a combined lens composed of a plurality of optical components,
The lens assembly apparatus includes:
A laser light source;
The light emitted from the laser light source and passed through the assembled lens is measured light.
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. Wavefront aberration detecting means for detecting the wavefront aberration of the light to be measured;
Have
When assembling the group lens, the position adjustment in the focus direction of the group lens is performed so as to minimize the power component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. A lens assembly device. When assembling the group lens, the position adjustment in the focus direction of the group lens is performed so as to minimize the power component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. The lens assembly device according to claim 18. When assembling the group lens, the horizontal position adjustment of the group lens is performed so as to minimize the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detecting means. The lens assembly apparatus according to claim 19. The lens assembly apparatus according to any one of claims 18 to 21, wherein the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in a horizontal direction or a focus direction, respectively. . An objective lens actuator assembly and adjustment device for attaching an objective lens of an optical pickup to an objective lens actuator that drives the objective lens,
The objective lens actuator assembly adjusting device is
A laser light source;
Light emitted from the laser light source and passed through the objective lens is measured light,
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
In the optical pickup, when the objective lens is attached to the objective lens actuator, the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. An objective lens actuator assembling and adjusting apparatus characterized by performing horizontal position adjustment. An objective lens actuator assembly and adjustment device for attaching an objective lens of an optical pickup to an objective lens actuator that drives the objective lens,
The objective lens actuator assembly adjusting device is
A laser light source;
Light emitted from the laser light source and passed through the objective lens is measured light,
A collimator lens that converts the light to be measured into parallel light;
A difference between a focal position of each lens constituting the lens array and a spot position on which the measured light is condensed; and the measured light that has passed through the collimator lens is incident on the lens array. More, wavefront aberration detection means for detecting the wavefront aberration of the light to be measured,
Have
In the optical pickup, when the objective lens is attached to the objective lens actuator, the power component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. An objective lens actuator assembling and adjusting apparatus characterized by adjusting a focus direction. In the optical pickup, when the objective lens is attached to the objective lens actuator, the power component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. 24. The objective lens actuator assembly adjustment apparatus according to claim 23, wherein position adjustment in the focus direction is performed. When the objective lens in the optical pickup is attached to the objective lens actuator, the tilt component of the phase wavefront of the measured light detected by the wavefront aberration detector is minimized. 25. The objective lens actuator assembly adjusting apparatus according to claim 24, wherein the horizontal position adjustment is performed. 27. The objective lens actuator according to claim 23, wherein the horizontal position adjustment or the focus direction position adjustment is performed by driving the collimator lens in a horizontal direction or a focus direction, respectively. Assembly adjustment device. The objective lens actuator includes a plurality of the objective lenses in order to correspond to a plurality of optical information media, and a plurality of the collimator lenses with respect to the plurality of objective lenses. An objective lens actuator assembly adjusting device according to claim 1. An optical pickup assembled by the optical pickup assembly adjusting device according to claim 12,
The plurality of optical information media are Blu-ray disc, HD DVD, DVD, CD,
The Blu-ray disc is recorded or reproduced using a first light source and a first objective lens,
An optical pickup characterized in that HD DVD, DVD and CD are recorded or reproduced using a common second objective lens. An optical pickup assembled by the optical pickup assembly adjusting device according to claim 12,
The plurality of optical information media are Blu-ray disc, HD DVD, DVD, CD,
An optical pickup which records or reproduces each optical information medium using a common objective lens. 31. An optical disc drive for recording or reproducing the optical information medium by the optical pickup according to claim 29 or 30. 32. An optical information recording / reproducing apparatus for recording or reproducing the optical information medium by the optical disk drive according to claim 31.

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