JP2009097914A - Electrical leakage detection method - Google Patents

Electrical leakage detection method Download PDF

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JP2009097914A
JP2009097914A JP2007267862A JP2007267862A JP2009097914A JP 2009097914 A JP2009097914 A JP 2009097914A JP 2007267862 A JP2007267862 A JP 2007267862A JP 2007267862 A JP2007267862 A JP 2007267862A JP 2009097914 A JP2009097914 A JP 2009097914A
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circuit
potential
voltage
voltage system
leakage
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JP4983527B2 (en
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Takashi Yamashita
貴史 山下
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Denso Corp
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Denso Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an electrical leakage detection method which can easily detect electrical leakage. <P>SOLUTION: The electrical leakage detection method is for an electric circuit, having a second high-potential voltage system 22, through which higher voltage electricity passes than a first high-potential voltage system 11 and a low-potential circuit, which are electrically insulated from two-channel high-voltage power source which obtains a high voltage and a high voltage obtained by boosting it, and comprises a first high-potential voltage system resistance circuit 4, which connects the high-potential voltage system 11 to a set potential through at least two resistors Ra, Rb; a second high-potential voltage system resistance circuit 5 which connects the second high-potential voltage system 22 to a set potential through at least two resistors Rc, Rd; and a connecting circuit which connects the neutral point of the two resistors Ra, Rb and the neutral point of the two resistors Rc, Rd, detecting an electrical leakage in a high-voltage circuit, on the basis of the potential of the connecting circuit. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、高電圧回路と低電圧回路とを独立して備えた回路において漏電を検出する漏電検出方法に関する。   The present invention relates to a leakage detection method for detecting leakage in a circuit including a high voltage circuit and a low voltage circuit independently.

近年、電気自動車やハイブリッド自動車といった電力を用いて走行できる車両においては、駆動力を発生するための電気には高電圧の電気が用いられている。このように高電圧の電気が流れる回路(高電圧回路)は、人が高圧電源にふれても感電しないように、車両のボデーグランドから分離されたフローティング状態になっている。そして、絶縁破壊が起きている場合、人が高圧系に触れると電流が流れるパスができるため感電する。このため、絶縁破壊による漏電を検出することが重要となっている。   2. Description of the Related Art In recent years, high-voltage electricity is used as electricity for generating driving force in vehicles that can run using electric power, such as electric vehicles and hybrid vehicles. Thus, the circuit through which high voltage electricity flows (high voltage circuit) is in a floating state separated from the body ground of the vehicle so as not to get an electric shock even if a person touches a high voltage power source. When dielectric breakdown occurs, an electric shock is generated because a current flows when a person touches the high voltage system. For this reason, it is important to detect leakage due to dielectric breakdown.

高電圧回路の漏電を検出する方法としては、たとえば、高電圧回路にカップリングコンデンサを介して漏電検出回路を接続し、カップリングコンデンサに入力したパルスの波形値の低下で漏電を検出する方法がある。この検出装置では、高電圧回路を流れる電気の電圧が変動した場合にもパルスの波形値が変化するため、誤検知が発生する等の漏電の検知が十分でないという問題があった。また、漏電検知のために漏電検出回路を新たに接続する必要があり、装置の体格およびコストが増加するという問題もあった。   As a method for detecting a leakage in a high voltage circuit, for example, a method for detecting a leakage by connecting a leakage detection circuit to a high voltage circuit via a coupling capacitor and reducing the waveform value of a pulse input to the coupling capacitor. is there. This detection device has a problem that the detection of electric leakage such as erroneous detection is not sufficient because the waveform value of the pulse changes even when the voltage of electricity flowing through the high-voltage circuit fluctuates. In addition, it is necessary to newly connect a leakage detection circuit for leakage detection, which increases the physique and cost of the apparatus.

別の高電圧回路の漏電を検出する検出装置が、特許文献1に開示されている。   Japanese Patent Application Laid-Open No. H10-228688 discloses a detection device that detects a leakage of another high voltage circuit.

特許文献1には、高圧直流電源と、この高圧直流電源のプラス及びマイナス側の間に直列に結線された複数の保護用抵抗及び検出用抵抗と、これらの検出用抵抗の一端を電気自動車、電車などのボデーグランドへ接地するスイッチと、電気自動車、電車などの漏電を判定する漏電判定部とを備えた漏電検出装置が開示されている。   Patent Document 1 discloses a high-voltage DC power supply, a plurality of protective resistors and detection resistors connected in series between the positive and negative sides of the high-voltage DC power supply, and one end of these detection resistors connected to an electric vehicle, There is disclosed a leakage detection device including a switch that is grounded to a body ground such as a train and a leakage determination unit that determines leakage of an electric vehicle or a train.

この漏電検出装置においても、漏電判定部や複数の抵抗およびスイッチなどの新たな装置を回路に接続する必要があり、コストが増加するという問題があった。
特開平6−153301号公報
Also in this leakage detection device, it is necessary to connect a new device such as a leakage determination unit, a plurality of resistors and switches to the circuit, and there is a problem that the cost increases.
Japanese Patent Laid-Open No. 6-153301

本発明は上記実状に鑑みてなされたものであり、簡単に漏電の検出をできる漏電検出方法を提供することを課題とする。   This invention is made | formed in view of the said actual condition, and makes it a subject to provide the leak detection method which can detect a leak easily.

上記課題を解決するために本発明者は高電圧回路の漏電検出について検討を重ねた結果本発明をなすに至った。   In order to solve the above-mentioned problems, the present inventor has made studies of the present invention as a result of repeated studies on detection of leakage in a high voltage circuit.

すなわち、請求項1に記載の本発明の漏電検出方法は、絶縁された低電位回路と高電位回路を有する回路で、該高電位回路は電源電圧とそれを昇圧した昇圧電源の、第一高電位電圧系回路と第二高電位電圧系回路を有し、該低電位回路と該高電位回路の間の漏電検出方法であって、少なくとも第一高電位電圧系回路の電圧を二つの抵抗Ra,Rbを介して該低電位回路の所定電位に接続する第一高電位電圧系回路抵抗回路と、少なくとも第二高電位系回路の電圧を二つの抵抗Rc,Rdを介して該低電位回路の所定電位に接続する第二高電位電圧系抵抗回路と、二つの抵抗Ra,Rbの中性点と二つの抵抗Rc,Rdの中性点とを接続する接続回路と、を有し、該接続回路の電位に基づいて該高電位回路の漏電を検出することを特徴とする。   In other words, the leakage detection method of the present invention according to claim 1 is a circuit having an insulated low-potential circuit and a high-potential circuit, and the high-potential circuit includes a power supply voltage and a booster power source that boosts the first high-voltage circuit. A method for detecting a leakage between the low potential circuit and the high potential circuit, comprising: a potential voltage system circuit and a second high potential voltage system circuit, wherein at least the voltage of the first high potential voltage system circuit is set to two resistors Ra , Rb, the first high-potential voltage circuit resistor circuit connected to the predetermined potential of the low-potential circuit, and at least the voltage of the second high-potential circuit circuit through the two resistors Rc, Rd. A second high potential voltage system resistor circuit connected to a predetermined potential, and a connection circuit connecting a neutral point of the two resistors Ra and Rb and a neutral point of the two resistors Rc and Rd, the connection The leakage of the high potential circuit is detected based on the potential of the circuit.

請求項2に記載の検出方法は、請求項1に記載の検出装置において、前記第一高電位電圧系回路と前記第二高電位電圧系回路は、前記低電位回路に並列に接続された回路であることを特徴とする。   The detection method according to claim 2 is the detection device according to claim 1, wherein the first high potential voltage system circuit and the second high potential voltage system circuit are connected in parallel to the low potential circuit. It is characterized by being.

請求項3に記載の検出方法は、請求項1〜2のいずれかに記載の検出方法において、前記第一高電位電圧系回路と前記第二高電位電圧系回路は、前記第一高電位電圧系回路または前記第二高電位電圧回路の電圧を差動検出する回路の一部を構成することを特徴とする。   The detection method according to claim 3 is the detection method according to claim 1, wherein the first high potential voltage system circuit and the second high potential voltage system circuit are the first high potential voltage. A part of the circuit for differentially detecting the voltage of the system circuit or the second high potential voltage circuit is constituted.

請求項1に記載の本発明の漏電検出方法は、第一高電位電圧系と第二高電位電圧系を含む高電位回路と低電位回路のそれぞれを所定電位に接続する第一高電位電圧系抵抗回路と第二高電位電圧系抵抗回路とをそれぞれの中性点で接続する接続回路の電位の変化から漏電の検出を行う構成となっている。本発明の漏電検出方法は、漏電による短絡が発生すると、Ra〜Rdのいずれかがバイパスされて、接続回路の電位が変化する。この電位の変化から漏電の検出を行うことができる。つまり、従来のように新たに漏電を検出するための装置を付加する必要がなくなっている。すなわち、本発明の漏電検出方法は、漏電検出回路を付加することなく回路の漏電を検出することができる。   According to a first aspect of the present invention, there is provided a first high potential voltage system in which a high potential circuit including a first high potential voltage system and a second high potential voltage system and a low potential circuit are connected to a predetermined potential. The leakage detection is performed from the change in the potential of the connection circuit that connects the resistance circuit and the second high potential voltage system resistance circuit at their neutral points. In the leakage detection method of the present invention, when a short circuit occurs due to leakage, any of Ra to Rd is bypassed, and the potential of the connection circuit changes. The leakage can be detected from this potential change. That is, it is no longer necessary to add a new device for detecting electric leakage as in the prior art. That is, the leakage detection method of the present invention can detect a leakage in a circuit without adding a leakage detection circuit.

また、本発明の漏電検出方法では、接続回路の電位の変化から漏電を検出するため、第一高電位電圧系回路および第二高電位電圧系回路の電圧が変動しても漏電の検出を行うことができる効果を発揮する。   Further, in the leakage detection method of the present invention, since the leakage is detected from the change in the potential of the connection circuit, the leakage is detected even if the voltages of the first high potential voltage system circuit and the second high potential voltage system circuit fluctuate. Demonstrate the effects that can be.

請求項2に記載の本発明の漏電検出方法によると、第一高電位電圧系及び第二高電位電圧系が低電位回路に並列に接続されたことで、所定電位を第一高電位電圧系、第二高電位電圧系の電位内とすることができ、所定電位を簡単に求めることができる。第一高電位電圧系抵抗回路及び第二高電位電圧系抵抗回路の所定の電位を、低電位電源の負極に接続することで、所定電位を低電位回路のGNDに設定することが可能となり、接続回路の電位を簡単に算出できるようになる。   According to the leakage detection method of the present invention described in claim 2, the first high potential voltage system and the second high potential voltage system are connected in parallel to the low potential circuit, so that the predetermined potential is supplied to the first high potential voltage system. Therefore, it can be within the potential of the second high potential voltage system, and the predetermined potential can be easily obtained. By connecting the predetermined potential of the first high potential voltage system resistor circuit and the second high potential voltage system resistor circuit to the negative electrode of the low potential power source, it becomes possible to set the predetermined potential to the GND of the low potential circuit, The potential of the connection circuit can be easily calculated.

請求項3に記載の本発明の漏電検出方法によると、従来から第一高電位電圧系回路及び第二高電位電圧系回路のそれぞれに組み付けられていた電圧検出回路を用いることができ、新たに回路装置を組み付ける必要がなくなる効果を発揮する。   According to the leakage detection method of the present invention described in claim 3, it is possible to use the voltage detection circuit that is conventionally assembled in each of the first high potential voltage system circuit and the second high potential voltage system circuit. The effect of eliminating the need to assemble the circuit device is exhibited.

以下、具体的な実施の形態を用いて本発明を説明する。   Hereinafter, the present invention will be described using specific embodiments.

(実施形態例)
本形態例においては、図1に示した構成を有する回路であって、高電圧回路1のバッテリ10の電圧を昇圧部3で昇圧して高電位電圧系22に高電圧を印加する昇圧回路を有する高電位系と低電位系の回路の漏電を検出した。図1に示した構成の回路は、ハイブリッド車や電気自動車の昇圧回路に用いられている。
(Example embodiment)
In the present embodiment, a circuit having the configuration shown in FIG. 1, which is a booster circuit that boosts the voltage of the battery 10 of the high voltage circuit 1 by the booster 3 and applies a high voltage to the high potential voltage system 22. The leakage of the high potential system circuit and the low potential system circuit is detected. The circuit having the configuration shown in FIG. 1 is used in a booster circuit of a hybrid vehicle or an electric vehicle.

第一高電位電圧系11は、バッテリ10と昇圧部3と、を電気的に接続した回路である。   The first high potential voltage system 11 is a circuit in which the battery 10 and the booster 3 are electrically connected.

第二高電位電圧系22は、昇圧部3により昇圧された高電圧が印加される回路である。図1においては、インバータINVを介してモータMが接続されている。   The second high potential voltage system 22 is a circuit to which a high voltage boosted by the boosting unit 3 is applied. In FIG. 1, a motor M is connected via an inverter INV.

第一高電位電圧系11には、第一高電位電圧系抵抗回路4が接続されている。第一高電位電圧系抵抗回路4は、第一高電位電圧系11の高電位側の点Aを二つの抵抗R,Rを介して設定電位に接続する経路4Aと、第一高電位電圧系11の低電位側の点Bを二つの抵抗R,Rを介して設定電位に接続する経路4Bと、経路4Aの二つの抵抗R,Rの中性点と経路4Bの二つの抵抗R,Rの中性点との差から電圧を検出する電圧計40と、を有している。すなわち、低電圧回路1は、電圧計40により差動で電圧が検知されている。 The first high potential voltage system resistor circuit 4 is connected to the first high potential voltage system 11. The first high potential voltage system resistor circuit 4 includes a path 4A for connecting a point A on the high potential side of the first high potential voltage system 11 to a set potential via two resistors R 1 and R 3 , and a first high potential A path 4B connecting the point B on the low potential side of the voltage system 11 to the set potential via the two resistors R 2 and R 4 , a neutral point of the two resistors R 1 and R 3 of the path 4A and the path 4B And a voltmeter 40 that detects a voltage from the difference between the neutral points of the two resistors R 2 and R 4 . That is, in the low voltage circuit 1, the voltage is differentially detected by the voltmeter 40.

第二高電位電圧系22には、第二高電位電圧系抵抗回路5が接続されている。第二高電位電圧系抵抗回路5は、第二高電位電圧系2の高電位側の点Cを二つの抵抗R,Rを介して設定電位に接続する経路5Aと、高電位電圧系22の低電位側の点Dを二つの抵抗R,Rを介して設定電位に接続する経路5Bと、経路5Aの二つの抵抗R,Rの中性点と経路5Bの二つの抵抗R,Rの中性点との差から電圧を検出する電圧計50と、を有している。すなわち、第二高電位電圧系回路2は、電圧計50により差動で電圧が検知されている。 The second high potential voltage system resistor circuit 5 is connected to the second high potential voltage system 22. The second high potential voltage system resistor circuit 5 includes a path 5A for connecting a high potential side point C of the second high potential voltage system 2 to a set potential via two resistors R 5 and R 7 , and a high potential voltage system. The path 5B connecting the point D on the low potential side 22 to the set potential via the two resistors R 6 and R 8 , the neutral point of the two resistors R 5 and R 7 in the path 5A, and the two paths 5B A voltmeter 50 that detects a voltage from the difference between the neutral points of the resistors R 6 and R 8 . That is, in the second high potential voltage system circuit 2, a voltage is differentially detected by the voltmeter 50.

高圧系回路において、四つの経路4A,4B,5A,5Bが接続される設定電位は、低いずれも同じ電位であり、低電位系の回路の所定の電位である。   In the high voltage system circuit, the set potential to which the four paths 4A, 4B, 5A, and 5B are connected is the same potential in all of the low levels, and is a predetermined potential of the low potential system circuit.

(漏電の検出)
図1に示した高電位回路の第一高電位電圧系抵抗回路4および第二高電位電圧系抵抗回路5の構成は、図2に示した回路構成と考えることができる。なお、図2中のVl:高電位回路1の点Aでの電位、Vh:高電位回路2の点Cでの電位、高圧GND:高電圧回路2の点D、点Bでの電位、設定GND:低電位系の設定電位を示す。
(Leakage detection)
The configuration of the first high potential voltage system resistor circuit 4 and the second high potential voltage system resistor circuit 5 of the high potential circuit shown in FIG. 1 can be considered as the circuit configuration shown in FIG. 2, Vl: potential at point A of high potential circuit 1, Vh: potential at point C of high potential circuit 2, high voltage GND: potential at points D and B of high voltage circuit 2, setting GND: Indicates the set potential of the low potential system.

図2に示した回路における設定電位は、下記に記載したように求められる。   The set potential in the circuit shown in FIG. 2 is obtained as described below.

まず、図2に示した構成の回路を、図3に示した回路として考える。すなわち、Ra:R,Rの合成抵抗、Rb:R,Rの合成抵抗、Rc:R,Rの合成抵抗、Rc:R,Rの合成抵抗、Ia:Raを流れる電気の電流、Ic:Rcを流れる電気の電流、Ie:RbとRdの合成抵抗を流れる電気の電流、である。 First, the circuit having the configuration shown in FIG. 2 is considered as the circuit shown in FIG. That, Ra: the combined resistance of the R 1, R 3, Rb: the combined resistance of the R 2, R 4, Rc: the combined resistance of the R 5, R 7, Rc: the combined resistance of the R 6, R 8, Ia: the Ra The electric current that flows, Ic: the electric current that flows through Rc, and Ie: the electric current that flows through the combined resistance of Rb and Rd.

設定GNDの電位をVとしたときに、下記数1〜4式が成り立つ。   When the potential of the set GND is V, the following formulas 1 to 4 are established.

数1〜4式からは、下記数5式が導かれる。   From the formulas 1 to 4, the following formula 5 is derived.

数5式に示したように、設定GNDの電位(設定電位)Vを構成するVhおよびVlは、第一高電位電圧系抵抗回路4および第二高電位電圧系抵抗回路5のそれぞれの差動による電圧計40,50で得られ、それぞれの抵抗値は回路を形成するときに求められる。すなわち、昇圧回路を有する高電圧系においては既知の値であり、この昇圧回路の設定電位を求めることができる。   As shown in Formula 5, Vh and Vl constituting the potential (setting potential) V of the setting GND are the differentials of the first high potential voltage system resistance circuit 4 and the second high potential voltage system resistance circuit 5, respectively. Are obtained by the voltmeters 40 and 50, and the respective resistance values are obtained when the circuit is formed. That is, it is a known value in a high voltage system having a booster circuit, and the set potential of this booster circuit can be obtained.

そして、設定GNDの電位の測定値と、算出された設定電位の比較から、漏電の検出(判定)を行うことができる。漏電の判定は、たとえば、測定値と予め設定されたしきい値との比較から行うことができる。   Then, the leakage detection (determination) can be performed from the comparison between the measured value of the potential of the set GND and the calculated set potential. The determination of leakage can be made, for example, by comparing the measured value with a preset threshold value.

(実施例)
より具体的に、漏電の検出方法について説明する。
(Example)
More specifically, a method for detecting leakage will be described.

図2に示した回路において、Ra,Rb,Rc,Rd:8MΩ、Vlの電位:250V、Vhの電位:650Vの場合(図4)には、設定GNDの電位(設定電位)Vが(250+650)/4=225Vとなる。   In the circuit shown in FIG. 2, when Ra, Rb, Rc, Rd: 8 MΩ, Vl potential: 250 V, and Vh potential: 650 V (FIG. 4) (FIG. 4), the potential (setting potential) V of the set GND is (250 + 650). ) / 4 = 225V.

そして、第二高電位電圧系抵抗回路2の高電位側(C点近傍)に漏電(低電位回路(設定電位)との短絡)が生じたときには、図5に示したように、抵抗Rcと並列な経路で第二高電位電圧系22と設定GNDが接続された状態となる。この状態では、設定GNDにおける電位の測定値は、高電圧回路2の電位Vh=650Vとなる。つまり、漏電がない場合よりも測定値が大きくなっている。   When a leakage occurs (short circuit with the low potential circuit (set potential)) on the high potential side (near point C) of the second high potential voltage system resistor circuit 2, as shown in FIG. The second high potential voltage system 22 and the setting GND are connected through a parallel path. In this state, the measured value of the potential at the setting GND is the potential Vh = 650 V of the high voltage circuit 2. That is, the measured value is larger than when there is no leakage.

また、第二高電位電圧系回路2の低電位側(D点近傍)に漏電(低電位回路(設定電位)との短絡)が生じたときには、図6に示したように、抵抗Rdと並列な経路で高圧GNDと設定GNDが接続された状態となる。この状態では、設定GNDにおける電位の測定値は、高圧GNDの電位=0Vとなる。つまり、漏電がない場合よりも測定値が小さくなっている。   Further, when a leakage (short circuit with the low potential circuit (set potential)) occurs on the low potential side (near point D) of the second high potential voltage system circuit 2, as shown in FIG. 6, it is in parallel with the resistor Rd. The high voltage GND and the setting GND are connected through a simple path. In this state, the measured value of the potential at the setting GND is the potential of the high voltage GND = 0V. That is, the measured value is smaller than when there is no leakage.

このように、漏電が発生すると、設定GNDにおける電位の測定値は、大きく変化する。このため、図7に示したようなしきい値を設定して判定を行うことで、漏電の判定を行うことができる。   As described above, when leakage occurs, the measured value of the potential at the set GND changes greatly. For this reason, it is possible to determine the leakage by setting the threshold as shown in FIG.

ここで、上記の形態では、短絡経路が0Ωでの短絡による漏電を用いて説明したが、漏電経路が抵抗値を有する場合においても同様に漏電の判定を行うことができる。   Here, in the above embodiment, the explanation has been made using the leakage due to a short circuit with a short-circuit path of 0Ω. However, even when the leakage path has a resistance value, the determination of the leakage can be performed similarly.

(その他の形態)
上記の形態例では、設定電位を測定することで漏電の判定を行っていたが、図1中のE点の電位を測定して漏電の判定を行ってもよい。
(Other forms)
In the above embodiment, the leakage is determined by measuring the set potential. However, the leakage may be determined by measuring the potential at point E in FIG.

上記の数5式からは、数6式に示した図1のE点における電圧Veを導くことができる。   From the above formula 5, the voltage Ve at the point E in FIG. 1 shown in the formula 6 can be derived.

数6式に示したように、E点における電圧Veは、Vh,Vおよび抵抗R,Rから求めることができる。つまり、設定GNDの電位(設定電位)よりも、電位の測定が容易な高電圧系回路5中の点で電位の測定を行うことができる。 As shown in Equation 6, the voltage Ve at the point E can be obtained from Vh and V and the resistors R 5 and R 7 . That is, the potential can be measured at a point in the high-voltage circuit 5 where the potential can be measured more easily than the potential of the set GND (set potential).

より具体的には、図4に示した場合でのE点における電圧Veは、(650−225)×(R,Rの抵抗分圧値)となり、上記形態の場合と同様に算出できる。すなわち、本実施形態例では、より簡単に電位(電圧)を測定することができるため、より簡単に漏電の検出を行うことができる。 More specifically, the voltage Ve at the point E in the case shown in FIG. 4 is (650-225) × (resistance divided value of R 5 , R 7 ), and can be calculated in the same manner as in the above embodiment. . That is, in the present embodiment example, since the potential (voltage) can be measured more easily, the leakage can be detected more easily.

実施形態例の回路の構成を示した図である。It is the figure which showed the structure of the circuit of the example of an embodiment. 第一及び第二高電位電圧系抵抗回路の構成を示した図である。It is the figure which showed the structure of the 1st and 2nd high potential voltage type | system | group resistance circuit. 第一及び第二高電位電圧系抵抗回路の構成を示した図である。It is the figure which showed the structure of the 1st and 2nd high potential voltage type | system | group resistance circuit. 第一及び第二高電位電圧系抵抗回路の構成を示した図である。It is the figure which showed the structure of the 1st and 2nd high potential voltage type | system | group resistance circuit. 漏電時の第一及び第二高電位電圧系抵抗回路の構成を示した図である。It is the figure which showed the structure of the 1st and 2nd high potential voltage type | system | group resistance circuit at the time of an electric leakage. 漏電時の第一及び第二高電位電圧系抵抗回路の構成を示した図である。It is the figure which showed the structure of the 1st and 2nd high potential voltage type | system | group resistance circuit at the time of an electric leakage. 設定電位の測定値としきい値を示したグラフである。It is the graph which showed the measured value and threshold value of the setting potential.

符号の説明Explanation of symbols

1:高電圧回路 10:バッテリ
11:第一高電位電圧系
22:第二高電位電圧系
3:昇圧部
4:第一高電位電圧系抵抗回路
5:第二高電位電圧系抵抗回路
1: high voltage circuit 10: battery 11: first high potential voltage system 22: second high potential voltage system 3: boosting unit 4: first high potential voltage system resistor circuit 5: second high potential voltage system resistor circuit

Claims (3)

絶縁された低電位回路と高電位回路を有する回路で、該高電位回路は電源電圧とそれを昇圧した昇圧電源の、第一高電位電圧系回路と第二高電位電圧系回路を有し、該低電位回路と該高電位回路の間の漏電検出方法であって、
少なくとも第一高電位電圧系回路の電圧を二つの抵抗Ra,Rbを介して該低電位回路の所定電位に接続する第一高電位電圧系回路抵抗回路と、
少なくとも第二高電位系回路の電圧を二つの抵抗Rc,Rdを介して該低電位回路の所定電位に接続する第二高電位電圧系抵抗回路と、
二つの抵抗Ra,Rbの中性点と二つの抵抗Rc,Rdの中性点とを接続する接続回路と、
を有し、
該接続回路の電位に基づいて該高電位回路の漏電を検出することを特徴とする漏電検出方法。
A circuit having an insulated low-potential circuit and a high-potential circuit, the high-potential circuit having a first high-potential voltage system circuit and a second high-potential voltage system circuit of a power source voltage and a boosted power source that boosts the power source voltage; A leakage detection method between the low potential circuit and the high potential circuit,
A first high-potential voltage system circuit resistor circuit that connects at least the voltage of the first high-potential voltage system circuit to a predetermined potential of the low-potential circuit via two resistors Ra and Rb;
A second high potential voltage system resistor circuit for connecting at least the voltage of the second high potential system circuit to a predetermined potential of the low potential circuit via two resistors Rc and Rd;
A connection circuit connecting the neutral points of the two resistors Ra and Rb and the neutral points of the two resistors Rc and Rd;
Have
A leakage detection method, comprising: detecting leakage in the high potential circuit based on the potential of the connection circuit.
前記第一高電位電圧系回路と前記第二高電位電圧系回路は、前記低電位回路に並列に接続された回路である請求項1記載の漏電検出方法。   The leakage detection method according to claim 1, wherein the first high potential voltage system circuit and the second high potential voltage system circuit are circuits connected in parallel to the low potential circuit. 前記第一高電位電圧系回路と前記第二高電位電圧系回路は、前記第一高電位電圧系回路または前記第二高電位電圧回路の電圧を差動検出する回路の一部を構成する請求項1〜2のいずれかに記載の漏電検出方法。   The first high potential voltage system circuit and the second high potential voltage system circuit constitute part of a circuit for differentially detecting the voltage of the first high potential voltage system circuit or the second high potential voltage circuit. Item 3. The leakage detection method according to any one of Items 1 and 2.
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JP2019030099A (en) * 2017-07-28 2019-02-21 住友電気工業株式会社 Dc power supply system and earth determination method

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JP2004212376A (en) * 2002-11-11 2004-07-29 Matsushita Electric Works Ltd Leakage detecting device

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JPH07274303A (en) * 1994-03-31 1995-10-20 Nissan Motor Co Ltd Power supply controller for vehicle
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Publication number Priority date Publication date Assignee Title
CN102019855A (en) * 2009-09-17 2011-04-20 通用汽车环球科技运作公司 Functional high-voltage interlock system and method
CN102019855B (en) * 2009-09-17 2013-08-21 通用汽车环球科技运作公司 Functional high-voltage interlock system and method
JP2019030099A (en) * 2017-07-28 2019-02-21 住友電気工業株式会社 Dc power supply system and earth determination method
JP6996895B2 (en) 2017-07-28 2022-01-17 住友電気工業株式会社 DC power supply system and ground fault determination method

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