JP2009075073A5 - - Google Patents
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- JP2009075073A5 JP2009075073A5 JP2008168013A JP2008168013A JP2009075073A5 JP 2009075073 A5 JP2009075073 A5 JP 2009075073A5 JP 2008168013 A JP2008168013 A JP 2008168013A JP 2008168013 A JP2008168013 A JP 2008168013A JP 2009075073 A5 JP2009075073 A5 JP 2009075073A5
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- JP
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008168013A JP5371295B2 (en) | 2007-08-31 | 2008-06-27 | Electromagnetic wave analysis device |
US12/196,224 US7869036B2 (en) | 2007-08-31 | 2008-08-21 | Analysis apparatus for analyzing a specimen by obtaining electromagnetic spectrum information |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007224941 | 2007-08-31 | ||
JP2007224941 | 2007-08-31 | ||
JP2008168013A JP5371295B2 (en) | 2007-08-31 | 2008-06-27 | Electromagnetic wave analysis device |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009075073A JP2009075073A (en) | 2009-04-09 |
JP2009075073A5 true JP2009075073A5 (en) | 2011-02-17 |
JP5371295B2 JP5371295B2 (en) | 2013-12-18 |
Family
ID=40610164
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008168013A Expired - Fee Related JP5371295B2 (en) | 2007-08-31 | 2008-06-27 | Electromagnetic wave analysis device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5371295B2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101230377B1 (en) | 2008-12-31 | 2013-02-06 | 에어로플렉스 리미티드 | Data reduction method and data reduction device |
JP6391155B2 (en) * | 2014-09-22 | 2018-09-19 | 国立大学法人東北大学 | Absolute angle measuring device and absolute angle measuring method |
JP5901721B2 (en) * | 2014-10-01 | 2016-04-13 | 三菱日立パワーシステムズ株式会社 | Gas analyzer |
DE112017006565B4 (en) | 2016-12-26 | 2022-10-13 | Mitsubishi Electric Corporation | Measuring device for biological material |
JP6425861B1 (en) | 2018-02-02 | 2018-11-21 | 三菱電機株式会社 | Biological substance measuring device |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56137227A (en) * | 1980-03-31 | 1981-10-27 | Nippon Kogaku Kk <Nikon> | Crystal spectroscope |
JPS57111422A (en) * | 1980-12-29 | 1982-07-10 | Shimadzu Corp | Spectrum measuring device |
JPS6199824A (en) * | 1984-10-22 | 1986-05-17 | Japan Atom Energy Res Inst | Spectroscope |
JPH02116723A (en) * | 1988-10-27 | 1990-05-01 | Shimadzu Corp | Automatic adjustment mechanism of spectro-photometer |
JPH0626930A (en) * | 1992-03-24 | 1994-02-04 | Nec Corp | Spectrophotometer |
JPH06273322A (en) * | 1993-03-17 | 1994-09-30 | Hitachi Ltd | Camera, spectroscopic system and combustion evaluating system employing them |
US7177515B2 (en) * | 2002-03-20 | 2007-02-13 | The Regents Of The University Of Colorado | Surface plasmon devices |
DE10130862A1 (en) * | 2001-06-28 | 2003-01-23 | Conducta Endress & Hauser | Process measuring point |
US7075645B2 (en) * | 2002-05-09 | 2006-07-11 | Euro-Celtique S.A. | Spectroscopic analyzer for blender |
JP2004085359A (en) * | 2002-08-27 | 2004-03-18 | Tochigi Nikon Corp | Terahertz pulse light measuring device |
JP2004219376A (en) * | 2003-01-17 | 2004-08-05 | Kubota Corp | Quality evaluation system for fruits and vegetables |
JP2005121574A (en) * | 2003-10-20 | 2005-05-12 | Nippon Telegr & Teleph Corp <Ntt> | Near-infrared spectral instrument |
US20070146866A1 (en) * | 2004-03-31 | 2007-06-28 | Japan Science And Technology Agency | Optical converter |
JP2006258641A (en) * | 2005-03-17 | 2006-09-28 | Nec Corp | Optical measuring method |
JP2007139632A (en) * | 2005-11-21 | 2007-06-07 | Olympus Corp | Reflectivity measuring instrument and reflectivity measuring method |
-
2008
- 2008-06-27 JP JP2008168013A patent/JP5371295B2/en not_active Expired - Fee Related
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