JP2009075073A5 - - Google Patents

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Publication number
JP2009075073A5
JP2009075073A5 JP2008168013A JP2008168013A JP2009075073A5 JP 2009075073 A5 JP2009075073 A5 JP 2009075073A5 JP 2008168013 A JP2008168013 A JP 2008168013A JP 2008168013 A JP2008168013 A JP 2008168013A JP 2009075073 A5 JP2009075073 A5 JP 2009075073A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2008168013A
Other languages
Japanese (ja)
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JP2009075073A (en
JP5371295B2 (en
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Application filed filed Critical
Priority to JP2008168013A priority Critical patent/JP5371295B2/en
Priority claimed from JP2008168013A external-priority patent/JP5371295B2/en
Priority to US12/196,224 priority patent/US7869036B2/en
Publication of JP2009075073A publication Critical patent/JP2009075073A/en
Publication of JP2009075073A5 publication Critical patent/JP2009075073A5/ja
Application granted granted Critical
Publication of JP5371295B2 publication Critical patent/JP5371295B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2008168013A 2007-08-31 2008-06-27 Electromagnetic wave analysis device Expired - Fee Related JP5371295B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008168013A JP5371295B2 (en) 2007-08-31 2008-06-27 Electromagnetic wave analysis device
US12/196,224 US7869036B2 (en) 2007-08-31 2008-08-21 Analysis apparatus for analyzing a specimen by obtaining electromagnetic spectrum information

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007224941 2007-08-31
JP2007224941 2007-08-31
JP2008168013A JP5371295B2 (en) 2007-08-31 2008-06-27 Electromagnetic wave analysis device

Publications (3)

Publication Number Publication Date
JP2009075073A JP2009075073A (en) 2009-04-09
JP2009075073A5 true JP2009075073A5 (en) 2011-02-17
JP5371295B2 JP5371295B2 (en) 2013-12-18

Family

ID=40610164

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008168013A Expired - Fee Related JP5371295B2 (en) 2007-08-31 2008-06-27 Electromagnetic wave analysis device

Country Status (1)

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JP (1) JP5371295B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101230377B1 (en) 2008-12-31 2013-02-06 에어로플렉스 리미티드 Data reduction method and data reduction device
JP6391155B2 (en) * 2014-09-22 2018-09-19 国立大学法人東北大学 Absolute angle measuring device and absolute angle measuring method
JP5901721B2 (en) * 2014-10-01 2016-04-13 三菱日立パワーシステムズ株式会社 Gas analyzer
DE112017006565B4 (en) 2016-12-26 2022-10-13 Mitsubishi Electric Corporation Measuring device for biological material
JP6425861B1 (en) 2018-02-02 2018-11-21 三菱電機株式会社 Biological substance measuring device

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56137227A (en) * 1980-03-31 1981-10-27 Nippon Kogaku Kk <Nikon> Crystal spectroscope
JPS57111422A (en) * 1980-12-29 1982-07-10 Shimadzu Corp Spectrum measuring device
JPS6199824A (en) * 1984-10-22 1986-05-17 Japan Atom Energy Res Inst Spectroscope
JPH02116723A (en) * 1988-10-27 1990-05-01 Shimadzu Corp Automatic adjustment mechanism of spectro-photometer
JPH0626930A (en) * 1992-03-24 1994-02-04 Nec Corp Spectrophotometer
JPH06273322A (en) * 1993-03-17 1994-09-30 Hitachi Ltd Camera, spectroscopic system and combustion evaluating system employing them
US7177515B2 (en) * 2002-03-20 2007-02-13 The Regents Of The University Of Colorado Surface plasmon devices
DE10130862A1 (en) * 2001-06-28 2003-01-23 Conducta Endress & Hauser Process measuring point
US7075645B2 (en) * 2002-05-09 2006-07-11 Euro-Celtique S.A. Spectroscopic analyzer for blender
JP2004085359A (en) * 2002-08-27 2004-03-18 Tochigi Nikon Corp Terahertz pulse light measuring device
JP2004219376A (en) * 2003-01-17 2004-08-05 Kubota Corp Quality evaluation system for fruits and vegetables
JP2005121574A (en) * 2003-10-20 2005-05-12 Nippon Telegr & Teleph Corp <Ntt> Near-infrared spectral instrument
US20070146866A1 (en) * 2004-03-31 2007-06-28 Japan Science And Technology Agency Optical converter
JP2006258641A (en) * 2005-03-17 2006-09-28 Nec Corp Optical measuring method
JP2007139632A (en) * 2005-11-21 2007-06-07 Olympus Corp Reflectivity measuring instrument and reflectivity measuring method

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