JP2009053037A - Fluorescent x-ray analyzer - Google Patents

Fluorescent x-ray analyzer Download PDF

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JP2009053037A
JP2009053037A JP2007220017A JP2007220017A JP2009053037A JP 2009053037 A JP2009053037 A JP 2009053037A JP 2007220017 A JP2007220017 A JP 2007220017A JP 2007220017 A JP2007220017 A JP 2007220017A JP 2009053037 A JP2009053037 A JP 2009053037A
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sample
chamber
filter
procedure
opening
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Shigeo Kamata
繁生 鎌田
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Rigaku Corp
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Rigaku Industrial Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an inexpensive fluorescent X-ray analyzer allowing a filter to be simply and easily replaced manually. <P>SOLUTION: This fluorescent X-ray analyzer 100 comprises an X-ray tube 1, a sample chamber 3 having a lid 2, a sample chamber leak valve 41, a spectroscopy chamber 5 having a detecting means 4 for detecting fluorescent X-rays 12, a spectroscopy chamber leak valve 51, a vacuum shutter 6 for opening and closing an opening 10 between the sample chamber 3 and the spectroscopy chamber 5, a filter moving means to which a filter 7 for filtering primary X-rays 11 is attached replaceably, a sample replacing machine 20, and a controlling means 30 for controlling the X-ray tube 1, the lid 2, a vacuum pump 9, the sample chamber leak valve 41, the spectroscopy chamber leak valve 51, the vacuum shutter 6, the filter moving means 8, and the sample replacing machine 20. The controlling means 30 executes a filter replacement preparing procedure in response to a first command, and executes an initializing procedure of returning the state to the state before the execution of the procedure in response to a second command. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、試料にX線管等のX線源から1次X線をフィルタでろ波して照射し、発生した蛍光X線の強度を検出器等の検出手段で測定して、試料の成分の含有率や膜厚等を分析する蛍光X線分析において、フィルタの交換を容易に行うことができる蛍光X線分析装置に関する。   In the present invention, a sample is irradiated with primary X-rays filtered from an X-ray source such as an X-ray tube, and the intensity of the generated fluorescent X-rays is measured by a detection means such as a detector. The present invention relates to a fluorescent X-ray analyzer capable of easily exchanging a filter in fluorescent X-ray analysis for analyzing the content rate, film thickness, and the like of the liquid.

従来から蛍光X線分析において、分析目的に応じて適切な1次X線をろ波するフィルタを選択して試料を分析することは行われており、フィルタの交換を容易にするために、自動のフィルタ交換機などが蛍光X線分析装置に備えられている(特許文献1参照)。しかし、このように複数のフィルタを自動で交換できる自動フィルタ交換機を有する蛍光X線分析装置では、自動フィルタ交換機の占める体積が大きくなり、フィルタを収容する分光室である真空チャンバが大きくなり、装置が大型化し高額な装置となる。さらに、分光室の真空排気に長時間を要する。そこで、フィルタの交換を頻繁に行う必要のない分析用の簡易で安価な装置として、自動フィルタ交換機を備えないで、手動でフィルタを交換できる蛍光X線分析装置がある。
特開2001−349851号公報
Conventionally, in fluorescent X-ray analysis, a sample is analyzed by selecting a filter that filters an appropriate primary X-ray according to the purpose of analysis. Are equipped with a fluorescent X-ray analyzer (see Patent Document 1). However, in such a fluorescent X-ray analyzer having an automatic filter exchanger that can automatically replace a plurality of filters, the volume occupied by the automatic filter exchanger increases, and the vacuum chamber that is a spectroscopic chamber that accommodates the filter increases. Becomes larger and more expensive. Furthermore, it takes a long time to evacuate the spectroscopic chamber. Therefore, as a simple and inexpensive apparatus for analysis that does not require frequent filter replacement, there is an X-ray fluorescence analyzer that can replace a filter manually without providing an automatic filter exchanger.
JP 2001-349851 A

しかし、従来の手動でフィルタを交換できる蛍光X線分析装置では、真空排気されている分光室内に収容されているフィルタを、試料室と分光室との隔壁として設けられている真空シャッタの開口から操作者が手を入れて手動で交換するためには、X線管の電源オフ、試料室および分光室の真空吸排気、試料を搬送する搬送アーム、試料室のリッドおよび真空シャッタの開閉などの各ステップ動作を、操作者がステップ毎に装置の入力手段で指示して行わなければならず、操作が煩雑であり、動作ステップを誤って指示すると装置の各構成部の干渉や過負荷により装置を破損させる恐れがある。   However, in a conventional fluorescent X-ray analysis apparatus in which the filter can be manually replaced, the filter housed in the spectral chamber being evacuated is removed from the opening of a vacuum shutter provided as a partition between the sample chamber and the spectral chamber. In order for the operator to manually replace the X-ray tube, the X-ray tube is turned off, the sample chamber and the spectroscopic chamber are evacuated and exhausted, the transport arm for transporting the sample, the lid of the sample chamber and the opening and closing of the vacuum shutter, etc. Each step operation must be performed by the operator by instructing the input means of the apparatus for each step, and the operation is complicated, and if the operation step is inadvertently specified, the apparatus is caused by interference or overload of each component of the apparatus. May be damaged.

このように、従来の簡易で安価な蛍光X線分析装置では、手動でのフィルタの交換操作が煩雑で、簡単かつ容易に交換することができなかった。   As described above, in the conventional simple and inexpensive fluorescent X-ray analyzer, the manual filter replacement operation is complicated and cannot be easily and easily replaced.

本発明は前記従来の問題に鑑みてなされたもので、手動でフィルタを簡単かつ容易に交換することができる安価な蛍光X線分析装置を提供することを目的とする。   The present invention has been made in view of the above-described conventional problems, and an object thereof is to provide an inexpensive X-ray fluorescence analyzer capable of easily and easily replacing a filter manually.

前記目的を達成するために、本発明の蛍光X線分析装置は、試料に1次X線を照射するX線管と、開閉自在のリッドを有し、前記リッドの閉状態時に真空ポンプによって真空排気される試料室と、開かれることにより前記試料室を大気に連通させる試料室リークバルブと、前記X線管からの1次X線が照射されて試料から発生する蛍光X線の強度を検出する検出手段が収納され、前記真空ポンプによって真空排気される分光室と、開かれることにより前記分光室を大気に連通させる分光室リークバルブと、前記試料室と前記分光室との間の隔壁に設けられた開口を開閉する真空シャッタと、前記X線管からの1次X線をろ波するフィルタが交換可能に取り付けられ、そのフィルタを前記X線管と試料との間の1次X線の通路に進退させるフィルタ進退手段と、試料が載置されるターレット、および試料を前記ターレットから前記試料室に搬送する搬送アームを有する試料交換機と、前記X線管、リッド、真空ポンプ、試料室リークバルブ、分光室リークバルブ、真空シャッタ、フィルタ進退手段および試料交換機を制御する制御手段と、を有する蛍光X線分析装置である。   In order to achieve the above object, an X-ray fluorescence analyzer of the present invention has an X-ray tube for irradiating a sample with primary X-rays and a lid that can be opened and closed, and is vacuumed by a vacuum pump when the lid is closed. Detect the intensity of fluorescent X-rays generated from the sample by evacuating the sample chamber, opening the sample chamber leak valve that opens and connects the sample chamber to the atmosphere, and irradiating the primary X-ray from the X-ray tube A spectroscopic chamber that is housed and is evacuated by the vacuum pump, a spectroscopic chamber leak valve that opens and connects the spectroscopic chamber to the atmosphere, and a partition wall between the sample chamber and the spectroscopic chamber A vacuum shutter that opens and closes the provided opening and a filter that filters primary X-rays from the X-ray tube are interchangeably attached, and the filter is connected to the primary X-ray between the X-ray tube and the sample. To advance and retreat into the aisle Sample advancement / retraction means, a turret on which a sample is placed, a sample exchanger having a transfer arm for transferring the sample from the turret to the sample chamber, the X-ray tube, a lid, a vacuum pump, a sample chamber leak valve, a spectroscopic chamber A fluorescent X-ray analyzer having a leak valve, a vacuum shutter, a filter advance / retreat means, and a control means for controlling the sample exchanger.

さらに、本発明の蛍光X線分析装置は、前記制御手段が、操作者の第1指示に応じて、前記X線管に1次X線の照射を停止させる手順と、前記開口から前記搬送アームを退避させる手順と、前記真空ポンプの停止および前記試料室リークバルブの開放によって前記試料室内を大気圧にする手順と、前記真空ポンプの停止および前記分光室リークバルブの開放によって前記分光室内を大気圧にする手順と、前記試料室内を大気圧にする手順よりも後に前記リッドを開かせる手順と、前記搬送アームを退避させる手順よりも後に前記フィルタ進退手段に前記フィルタを前記開口の直下まで移動させる手順と、前記真空シャッタを開かせる手順とを含むフィルタ交換準備手順を実行し、操作者の第2指示に応じて、当該蛍光X線分析装置を前記フィルタ交換準備手順実行前の状態に戻す初期化手順を実行する。   Further, in the fluorescent X-ray analysis apparatus of the present invention, the control means stops the irradiation of the primary X-ray to the X-ray tube according to the first instruction of the operator, and the transfer arm from the opening. A procedure for evacuating the sample chamber, a procedure for bringing the sample chamber to atmospheric pressure by stopping the vacuum pump and opening the sample chamber leak valve, and a step for stopping the vacuum pump and opening the spectroscopic chamber leak valve. Move the filter to the filter advancing / retreating means just below the opening after the procedure for setting the pressure, the procedure for opening the lid after the procedure for setting the sample chamber to atmospheric pressure, and the procedure for retracting the transfer arm And a filter replacement preparation procedure including a procedure for opening the vacuum shutter, and in response to a second instruction from an operator, It performs an initialization procedure for returning to the state before data exchange preparing procedure execution.

本発明によれば、前記制御手段が、操作者による入力手段からの第1指示に応じて、前記X線管に1次X線の照射を停止させる手順と、前記開口から前記搬送アームを退避させる手順と、前記真空ポンプの停止および前記試料室リークバルブの開放によって前記試料室内を大気圧にする手順と、前記真空ポンプの停止および前記分光室リークバルブの開放によって前記分光室内を大気圧にする手順と、前記試料室内を大気圧にする手順よりも後に前記リッドを開かせる手順と、前記搬送アームを退避させる手順よりも後に前記フィルタ進退手段に前記フィルタを前記開口の直下まで移動させる手順と、前記真空シャッタを開かせる手順とを含むフィルタ交換準備手順を実行するので、操作者がステップ毎に装置の入力手段で指示を入力する必要はなく、装置の各構成部の干渉や過負荷により装置を破損させずに、真空排気されている分光室内のフィルタを、真空シャッタの開口から容易に手動で交換することができる。そして、操作者による前記入力手段からの第2指示によって、前記蛍光X線分析装置が前記フィルタ交換準備手順実行前の状態に初期化されるので、直ちに試料Sの測定を開始することができる。   According to the present invention, the control means is configured to stop the irradiation of the primary X-rays to the X-ray tube according to the first instruction from the input means by the operator, and retract the transfer arm from the opening. A procedure for bringing the sample chamber to atmospheric pressure by stopping the vacuum pump and opening the sample chamber leak valve; and bringing the spectral chamber to atmospheric pressure by stopping the vacuum pump and opening the spectrum chamber leak valve. A procedure for opening the lid after a procedure for setting the inside of the sample chamber to atmospheric pressure, and a procedure for moving the filter to the filter advancing / retreating means immediately below the opening after a procedure for retracting the transfer arm. And a procedure for preparing the filter replacement including the procedure for opening the vacuum shutter, the operator must input an instruction with the input means of the apparatus for each step. Rather, without damaging the apparatus due to interference or overload of the components of the device, the spectral indoor filter being evacuated can easily be exchanged manually from the opening of the vacuum shutter. Then, according to the second instruction from the input means by the operator, the X-ray fluorescence analyzer is initialized to the state before the execution of the filter replacement preparation procedure, so that the measurement of the sample S can be started immediately.

以下、本発明の実施形態である蛍光X線分析装置について説明する。図1A、1Bに示すように蛍光X線分析装置100は、試料ホルダSHに入れられた試料Sに1次X線11を下方から照射するX線管1と、開閉自在のリッド2を有し、リッド2の閉状態時に真空ポンプ9によって真空排気される試料室3と、試料室3を大気に連通させる試料室リークバルブ41と、真空ポンプ9によって真空排気される分光室5と、分光室5を大気に連通させる分光室リークバルブ51と、試料室3と分光室5との間の隔壁として設けられた開口10を開閉する真空シャッタ6と、X線管1からの1次X線11をろ波する1次フィルタ7が交換可能に取り付けられ、フィルタ7を1次X線11の通路に進退するフィルタ進退手段8と、試料Sが入れられた試料ホルダSHを載置するターレット21、試料ホルダSHをターレット21から試料室3に搬送する搬送アーム22を有する試料交換機20と、X線管1、リッド2、真空ポンプ9、試料室リークバルブ41、分光室リークバルブ51、真空シャッタ6、フィルタ進退手段8および試料交換機20を制御する制御手段30とを有している。   Hereinafter, a fluorescent X-ray analyzer according to an embodiment of the present invention will be described. As shown in FIGS. 1A and 1B, a fluorescent X-ray analyzer 100 includes an X-ray tube 1 that irradiates a sample S placed in a sample holder SH with a primary X-ray 11 from below, and a lid 2 that can be freely opened and closed. The sample chamber 3 evacuated by the vacuum pump 9 when the lid 2 is closed, the sample chamber leak valve 41 for communicating the sample chamber 3 with the atmosphere, the spectroscopic chamber 5 evacuated by the vacuum pump 9, and the spectroscopic chamber A spectroscopic chamber leak valve 51 for communicating 5 with the atmosphere, a vacuum shutter 6 for opening and closing an opening 10 provided as a partition between the sample chamber 3 and the spectroscopic chamber 5, and primary X-rays 11 from the X-ray tube 1. A primary filter 7 for filtering the filter 7 is attached in a replaceable manner, a filter advance / retreat means 8 for moving the filter 7 back and forth in the path of the primary X-ray 11, and a turret 21 for placing a sample holder SH containing the sample S; Sample holder SH A sample changer 20 having a transfer arm 22 for transferring it from the chamber 21 to the sample chamber 3, an X-ray tube 1, a lid 2, a vacuum pump 9, a sample chamber leak valve 41, a spectroscopic chamber leak valve 51, a vacuum shutter 6, and a filter advance / retreat. Means 8 and control means 30 for controlling the sample changer 20 are provided.

制御手段30が操作者による入力手段31からの第1指示に応じて、X線管1に1次X線11の照射を停止させる手順と、開口10から搬送アーム22を退避させる手順と、真空ポンプ9の停止および試料室リークバルブ41の開放によって試料室3内を大気圧にする手順と、真空ポンプ9の停止および分光室リークバルブ51の開放によって分光室5内を大気圧にする手順と、試料室3内を大気圧にする手順よりも後にリッド2を開かせる手順と、搬送アーム22を退避させる手順よりも後にフィルタ進退手段8にフィルタ7を開口10の直下まで移動させる手順と、真空シャッタ6を開かせる手順とを含むフィルタ交換準備手順を実行する。フィルタ7の交換後、操作者による入力手段31からの第2指示に応じて、蛍光X線分析装置100をフィルタ交換準備手順実行前の状態に戻す初期化手順を実行する。   In response to a first instruction from the input means 31 by the operator, the control means 30 stops the irradiation of the primary X-ray 11 to the X-ray tube 1, retreats the transfer arm 22 from the opening 10, vacuum A procedure for bringing the inside of the sample chamber 3 to atmospheric pressure by stopping the pump 9 and opening the sample chamber leak valve 41; and a procedure for bringing the inside of the spectroscopic chamber 5 to atmospheric pressure by stopping the vacuum pump 9 and opening the spectroscopic chamber leak valve 51. A procedure for opening the lid 2 after a procedure for setting the inside of the sample chamber 3 to atmospheric pressure, a procedure for moving the filter 7 to the filter advance / retreat means 8 to a position immediately below the opening 10 after a procedure for retracting the transfer arm 22; A filter replacement preparation procedure including a procedure for opening the vacuum shutter 6 is executed. After the filter 7 is replaced, an initialization procedure for returning the X-ray fluorescence spectrometer 100 to a state before the filter replacement preparation procedure is executed is executed in accordance with a second instruction from the input means 31 by the operator.

試料室3は、真空シャッタ6が閉じられ、リッド2が閉じられたときに形成される真空室であり、試料ホルダSHが投入されるときは、試料室リークバルブ41により試料室3内に空気をリークさせて大気に連通後、リッド2が上方に開放される。試料ホルダSHが投入された後は、リッド2および試料室リークバルブ41が閉じられ真空ポンプ9により排気され真空に維持される。   The sample chamber 3 is a vacuum chamber formed when the vacuum shutter 6 is closed and the lid 2 is closed. When the sample holder SH is inserted, air is introduced into the sample chamber 3 by the sample chamber leak valve 41. The lid 2 is opened upward after communicating with the atmosphere. After the sample holder SH is inserted, the lid 2 and the sample chamber leak valve 41 are closed and evacuated by the vacuum pump 9 to be kept in vacuum.

分光室5は、試料室3と分光室5との間の隔壁として設けられた真空シャッタ6の開口10により試料室3と連通している。図2が示すように、分光室5は、X線管1からの1次X線11が照射されて試料Sから発生する蛍光X線12の強度を検出する検出手段4を収納している。検出手段4は、蛍光X線である2次X線12を平行化する発散スリット41、その発散スリット41により平行化された2次X線を分光する分光素子42、その分光素子42で分光された2次X線を平行化する受光スリット43、受光スリット43で平行化された2次X線12を検出する検出器である、例えばシンチレーションカウンタ44を含んでいる。また、分光室5は、X線管1、フィルタ進退手段8も収納し、真空シャッタ6および分光室リークバルブ51が閉じられて真空ポンプ9により排気され真空に維持される。分光室5を大気に連通するときは、分光室リークバルブ51により空気がリークされる。   The spectroscopic chamber 5 communicates with the sample chamber 3 through an opening 10 of a vacuum shutter 6 provided as a partition wall between the sample chamber 3 and the spectroscopic chamber 5. As shown in FIG. 2, the spectroscopic chamber 5 houses detection means 4 that detects the intensity of fluorescent X-rays 12 generated from the sample S when the primary X-ray 11 from the X-ray tube 1 is irradiated. The detection means 4 has a divergence slit 41 that collimates the secondary X-ray 12 that is a fluorescent X-ray, a spectroscopic element 42 that splits the secondary X-ray parallelized by the divergence slit 41, and the spectroscopic element 42 splits the light. A light receiving slit 43 that parallelizes the secondary X-ray and a detector that detects the secondary X-ray 12 parallelized by the light receiving slit 43, for example, a scintillation counter 44 are included. The spectroscopic chamber 5 also houses the X-ray tube 1 and the filter advancing / retreating means 8, and the vacuum shutter 6 and the spectroscopic chamber leak valve 51 are closed, and the vacuum pump 9 exhausts the vacuum chamber and maintains the vacuum. When the spectroscopic chamber 5 communicates with the atmosphere, the spectroscopic chamber leak valve 51 leaks air.

フィルタ7は、例えばアルミニウム、鉄、バナジウムなどの箔や薄板で形成され、X線管1から放射されるターゲット材料の固有X線、不純線およびバックグラウンドを減少させるために使用される。図3に示すように、フィルタ7はフィルタ進退手段8に取り付けられている。試料S測定時に、1次X線11をろ波するときは1次X線11の通路にフィルタ7が進入し、ろ波しない時には後退するように、制御手段30によってフィルタ進退手段8が制御される。フィルタ7の交換時には、真空シャッタ6の開口10の位置にフィルタ7が移動するように、制御手段30によってフィルタ進退手段8が制御される。蛍光X線分析装置100は、下面照射型であって、かつ波長分散型の蛍光X線分析装置である。   The filter 7 is formed of a foil or a thin plate of aluminum, iron, vanadium or the like, for example, and is used to reduce intrinsic X-rays, impurity lines and background of the target material emitted from the X-ray tube 1. As shown in FIG. 3, the filter 7 is attached to the filter advance / retreat means 8. When the sample S is measured, the filter advancing / retreating means 8 is controlled by the control means 30 so that the filter 7 enters the passage of the primary X-ray 11 when filtering the primary X-ray 11 and retreats when not filtering. The When the filter 7 is replaced, the filter advance / retreat means 8 is controlled by the control means 30 so that the filter 7 moves to the position of the opening 10 of the vacuum shutter 6. The X-ray fluorescence analyzer 100 is a bottom surface irradiation type and wavelength dispersion type X-ray fluorescence analyzer.

次に、本発明の実施形態である蛍光X線分析装置100の動作について、図4に示すフロー図のステップにしたがって説明する。図4は試料室3内に試料ホルダSHが収納されていない場合のフロー図である。ステップS1では、操作者が制御手段30の入力手段31から、フィルタ7交換の準備をすべき旨の第1指示を入力する。第1指示が入力されると、ステップS2で、X線管1の電源がオフされる。ステップS3では、試料交換機20の搬送アーム22が退避位置に移動する。ステップS4では、真空ポンプ9を停止させる。ステップS5で、所定の真空圧力に維持されている試料室3内を試料室リークバルブ41でリークさせて大気圧にする。ステップS6では、所定の真空圧力に維持されている分光室5内を分光室リークバルブ51でリークさせて大気圧にする。試料室3と分光室5が大気圧の状態になると、ステップS7に進む。ステップS7では、試料室3のリッド2を開け、試料室3を開放させる。ステップS8では、フィルタ7をフィルタ進退手段8で移動させて真空シャッタ6の開口10の直下の位置まで移動させる。ステップS9では、真空シャッタ6を開ける。   Next, the operation of the fluorescent X-ray analysis apparatus 100 according to the embodiment of the present invention will be described according to the steps of the flowchart shown in FIG. FIG. 4 is a flowchart when the sample holder SH is not accommodated in the sample chamber 3. In step S <b> 1, the operator inputs a first instruction to prepare for replacement of the filter 7 from the input unit 31 of the control unit 30. When the first instruction is input, the power of the X-ray tube 1 is turned off in step S2. In step S3, the transfer arm 22 of the sample changer 20 moves to the retracted position. In step S4, the vacuum pump 9 is stopped. In step S5, the inside of the sample chamber 3 maintained at a predetermined vacuum pressure is leaked by the sample chamber leak valve 41 to the atmospheric pressure. In step S6, the inside of the spectroscopic chamber 5 maintained at a predetermined vacuum pressure is leaked by the spectroscopic chamber leak valve 51 to the atmospheric pressure. When the sample chamber 3 and the spectroscopic chamber 5 are at atmospheric pressure, the process proceeds to step S7. In step S7, the lid 2 of the sample chamber 3 is opened, and the sample chamber 3 is opened. In step S <b> 8, the filter 7 is moved by the filter advancing / retreating means 8 to a position immediately below the opening 10 of the vacuum shutter 6. In step S9, the vacuum shutter 6 is opened.

このとき、リッド2、搬送アーム22が真空シャッタの開口10から退避しており、真空シャッタ6も開放されている。ステップS10では、操作者が、リッド2の外側を覆っている装置カバー(図示なし)を上に開け、真空シャッタ6の開口10から図3に示すフィルタ進退手段8に固定ねじ71で固定されたフィルタ7を目視し、開口10に手を入れて固定ねじ71を外し、使用していたフィルタ7を取り外し、次に使用するフィルタ7をフィルタ進退手段8に固定ねじ71で固定し、装置カバーを下げて閉じる。ステップS11では、操作者が入力手段31から蛍光X線分析装置100を初期化すべき旨の第2指示を入力する。第2指示が入力されると、ステップS12で、制御装置30の表示部32に「初期化中」と表示されて蛍光X線分析装置100が初期化され、第1指示が入力される前の状態、すなわち試料Sの測定開始前の状態にセットされる。   At this time, the lid 2 and the transfer arm 22 are retracted from the opening 10 of the vacuum shutter, and the vacuum shutter 6 is also opened. In step S10, the operator opens an apparatus cover (not shown) covering the outside of the lid 2 and fixes the filter cover 8 to the filter advance / retreat means 8 shown in FIG. Look at the filter 7, put a hand in the opening 10, remove the fixing screw 71, remove the used filter 7, fix the filter 7 to be used next to the filter advancing / retreating means 8 with the fixing screw 71, and attach the device cover. Close and close. In step S <b> 11, the operator inputs a second instruction to the effect that the fluorescent X-ray analysis apparatus 100 should be initialized from the input unit 31. When the second instruction is input, in step S12, “Initializing” is displayed on the display unit 32 of the control device 30, the X-ray fluorescence analyzer 100 is initialized, and before the first instruction is input. The state, that is, the state before starting the measurement of the sample S is set.

本実施形態の蛍光X線分析装置100によれば、制御手段30が、操作者による入力手段31からの第1指示に応じて、X線管1に1次X線11の照射を停止させる手順と、開口10から搬送アーム22を退避させる手順と、真空ポンプ9の停止および試料室リークバルブ41の開放によって試料室3内を大気圧にする手順と、真空ポンプ9の停止および分光室リークバルブ51の開放によって分光室5内を大気圧にする手順と、試料室3内を大気圧にする手順よりも後にリッド2を開かせる手順と、搬送アーム22を退避させる手順よりも後にフィルタ進退手段8にフィルタ7を開口10の直下まで移動させる手順と、真空シャッタ6を開かせる手順とを含むフィルタ交換準備手順を実行するので、操作者がステップ毎に装置の入力手段31で指示を入力する必要はなく、蛍光X線分析装置100の各構成部の干渉や過負荷により蛍光X線分析装置を破損させずに、真空排気されている分光室5内のフィルタ7を、真空シャッタ6の開口10から容易に手動で交換することができる。そして、操作者による入力手段31からの第2指示によって、蛍光X線分析装置100がフィルタ交換準備手順実行前の状態に初期化されるので、直ちに試料Sの測定を開始することができる。   According to the fluorescent X-ray analysis apparatus 100 of the present embodiment, the control unit 30 stops the irradiation of the primary X-ray 11 on the X-ray tube 1 in response to the first instruction from the input unit 31 by the operator. A procedure for retracting the transfer arm 22 from the opening 10; a procedure for stopping the vacuum pump 9 and opening the sample chamber leak valve 41 to bring the inside of the sample chamber 3 to atmospheric pressure; and a procedure for stopping the vacuum pump 9 and the spectroscopic chamber leak valve. Filter opening / retracting means after opening the lid 51 after opening the chamber 51 by opening 51, opening the lid 2 after opening the sample chamber 3 at atmospheric pressure, and retracting the transfer arm 22 8, the filter replacement preparation procedure including the procedure of moving the filter 7 to the position immediately below the opening 10 and the procedure of opening the vacuum shutter 6 is executed. Therefore, the operator inputs the input means 3 of the apparatus for each step. The filter 7 in the spectroscopic chamber 5 that has been evacuated without damaging the fluorescent X-ray analyzer due to interference or overload of each component of the fluorescent X-ray analyzer 100 can be used. It can be easily replaced manually from the opening 10 of the vacuum shutter 6. Then, according to the second instruction from the input means 31 by the operator, the X-ray fluorescence analyzer 100 is initialized to the state before the execution of the filter replacement preparation procedure, so that the measurement of the sample S can be started immediately.

本実施形態では、下面照射型であって、かつ波長分散型の蛍光X線分析装置について説明したが、上面照射型であっても、エネルギ分散型であってもよい。また、試料室3内に試料ホルダSHが収納されていない場合の動作フローについて説明したが、試料室3内に試料ホルダSHが収納されている場合は、試料室3内から試料ホルダSHを排出させる動作を行った後、本実施形態の動作フローを行えばよい。   In the present embodiment, the bottom-illuminated and wavelength-dispersed X-ray fluorescence analyzer has been described, but the top-illuminated type or the energy-dispersed type may be used. The operation flow when the sample holder SH is not accommodated in the sample chamber 3 has been described. However, when the sample holder SH is accommodated in the sample chamber 3, the sample holder SH is discharged from the sample chamber 3. After performing the operation to be performed, the operation flow of this embodiment may be performed.

本発明の実施形態の蛍光X線分析装置の概略正面図である。1 is a schematic front view of a fluorescent X-ray analyzer according to an embodiment of the present invention. 同装置の概略平面図である。It is a schematic plan view of the apparatus. 同装置の分光室の概略側面図である。It is a schematic side view of the spectroscopic chamber of the apparatus. 同装置のフィルタ進退手段の平面図である。It is a top view of the filter advance / retreat means of the same apparatus. 同装置の動作フロー図である。It is an operation | movement flowchart of the same apparatus.

符号の説明Explanation of symbols

1 X線管
2 リッド
3 試料室
4 検出手段
5 分光室
6 真空シャッタ
7 フィルタ
8 フィルタ進退手段
9 真空ポンプ
10 真空シャッタの開口
11 1次X線
12 蛍光X線 2次X線
20 試料交換機
21 ターレット
22 搬送アーム
30 制御手段
31 入力手段
41 試料室リークバルブ
51 分光室リークバルブ
100 蛍光X線分析装置
S 試料
1 X-ray tube 2 Lid 3 Sample chamber 4 Detection means 5 Spectroscopic chamber
6 Vacuum shutter 7 Filter 8 Filter advance / retreat means 9 Vacuum pump 10 Vacuum shutter opening 11 Primary X-ray 12 Fluorescent X-ray Secondary X-ray 20 Sample exchanger 21 Turret 22 Transfer arm 30 Control means 31 Input means 41 Sample chamber leak valve 51 Spectroscopic leak valve 100 X-ray fluorescence analyzer S Sample

Claims (1)

試料に1次X線を照射するX線管と、
開閉自在のリッドを有し、前記リッドの閉状態時に真空ポンプによって真空排気される試料室と、
開かれることにより前記試料室を大気に連通させる試料室リークバルブと、
前記X線管からの1次X線が照射されて試料から発生する蛍光X線の強度を検出する検出手段が収納され、前記真空ポンプによって真空排気される分光室と、
開かれることにより前記分光室を大気に連通させる分光室リークバルブと、
前記試料室と前記分光室との間の隔壁に設けられた開口を開閉する真空シャッタと、
前記X線管からの1次X線をろ波するフィルタが交換可能に取り付けられ、そのフィルタを前記X線管と試料との間の1次X線の通路に進退させるフィルタ進退手段と、
試料が載置されるターレット、および試料を前記ターレットから前記試料室に搬送する搬送アームを有する試料交換機と、
前記X線管、リッド、真空ポンプ、試料室リークバルブ、分光室リークバルブ、真空シャッタ、フィルタ進退手段および試料交換機を制御する制御手段と、
を有する蛍光X線分析装置であって、
前記制御手段が、操作者の第1指示に応じて、前記X線管に1次X線の照射を停止させる手順と、前記開口から前記搬送アームを退避させる手順と、前記真空ポンプの停止および前記試料室リークバルブの開放によって前記試料室内を大気圧にする手順と、前記真空ポンプの停止および前記分光室リークバルブの開放によって前記分光室内を大気圧にする手順と、前記試料室内を大気圧にする手順よりも後に前記リッドを開かせる手順と、前記搬送アームを退避させる手順よりも後に前記フィルタ進退手段に前記フィルタを前記開口の直下まで移動させる手順と、前記真空シャッタを開かせる手順とを含むフィルタ交換準備手順を実行し、操作者の第2指示に応じて、当該蛍光X線分析装置を前記フィルタ交換準備手順実行前の状態に戻す初期化手順を実行する蛍光X線分析装置。
An X-ray tube that irradiates the sample with primary X-rays;
A sample chamber having an openable / closable lid, and evacuated by a vacuum pump when the lid is closed;
A sample chamber leak valve for communicating the sample chamber to the atmosphere by being opened; and
A spectroscopic chamber in which detection means for detecting the intensity of fluorescent X-rays generated from the sample by irradiation of primary X-rays from the X-ray tube is housed and evacuated by the vacuum pump;
A spectroscopic chamber leak valve that is opened to communicate the spectroscopic chamber to the atmosphere;
A vacuum shutter that opens and closes an opening provided in a partition wall between the sample chamber and the spectroscopic chamber;
A filter advancing and retracting means for exchanging a primary X-ray from the X-ray tube in a replaceable manner, and advancing and retracting the filter in a primary X-ray path between the X-ray tube and the sample;
A sample changer having a turret on which a sample is placed, and a transfer arm for transferring the sample from the turret to the sample chamber;
Control means for controlling the X-ray tube, lid, vacuum pump, sample chamber leak valve, spectroscopic chamber leak valve, vacuum shutter, filter advance / retreat means, and sample exchanger;
A fluorescent X-ray analysis apparatus comprising:
In accordance with a first instruction from an operator, the control means stops the irradiation of the primary X-rays to the X-ray tube, retracts the transfer arm from the opening, stops the vacuum pump; A procedure for bringing the sample chamber to atmospheric pressure by opening the sample chamber leak valve; a procedure for stopping the vacuum pump and opening the spectroscopic chamber leak valve; and A procedure for opening the lid after a procedure for making, a procedure for moving the filter to just below the opening in the filter advance / retreat means after a procedure for retracting the transfer arm, and a procedure for opening the vacuum shutter In response to the operator's second instruction, the X-ray fluorescence analyzer is first returned to the state before the filter replacement preparation procedure is executed. X-ray fluorescence spectrometer to perform the procedure.
JP2007220017A 2007-08-27 2007-08-27 Fluorescent x-ray analyzer Pending JP2009053037A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013217915A (en) * 2012-03-12 2013-10-24 Hitachi High-Tech Science Corp Fluorescent x-ray analyzer and fluorescent x-ray analysis method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013217915A (en) * 2012-03-12 2013-10-24 Hitachi High-Tech Science Corp Fluorescent x-ray analyzer and fluorescent x-ray analysis method

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