JP2008544541A - 発光ダイオード - Google Patents
発光ダイオード Download PDFInfo
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- JP2008544541A JP2008544541A JP2008518041A JP2008518041A JP2008544541A JP 2008544541 A JP2008544541 A JP 2008544541A JP 2008518041 A JP2008518041 A JP 2008518041A JP 2008518041 A JP2008518041 A JP 2008518041A JP 2008544541 A JP2008544541 A JP 2008544541A
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- Prior art keywords
- light emitting
- layer
- light
- wavelength conversion
- emitting diode
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- 238000006243 chemical reaction Methods 0.000 claims abstract description 110
- 239000004065 semiconductor Substances 0.000 claims abstract description 75
- 238000000034 method Methods 0.000 claims abstract description 43
- 239000000758 substrate Substances 0.000 claims abstract description 43
- 229910052761 rare earth metal Inorganic materials 0.000 claims abstract description 23
- 150000004767 nitrides Chemical class 0.000 claims abstract description 11
- 229910052691 Erbium Inorganic materials 0.000 claims abstract description 6
- 229910052693 Europium Inorganic materials 0.000 claims abstract description 5
- 229910052775 Thulium Inorganic materials 0.000 claims abstract description 5
- 238000005229 chemical vapour deposition Methods 0.000 claims description 16
- 238000002248 hydride vapour-phase epitaxy Methods 0.000 claims description 7
- 239000000126 substance Substances 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 238000001451 molecular beam epitaxy Methods 0.000 claims description 3
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 claims 3
- 238000000407 epitaxy Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 10
- 239000003086 colorant Substances 0.000 abstract description 4
- 239000010410 layer Substances 0.000 description 197
- 239000000463 material Substances 0.000 description 13
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 8
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 7
- 150000001875 compounds Chemical class 0.000 description 7
- 239000004593 Epoxy Substances 0.000 description 6
- 239000013078 crystal Substances 0.000 description 5
- 239000002019 doping agent Substances 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 238000009826 distribution Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 239000000843 powder Substances 0.000 description 4
- 238000007740 vapor deposition Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000005274 electronic transitions Effects 0.000 description 3
- 238000000295 emission spectrum Methods 0.000 description 3
- 239000004850 liquid epoxy resins (LERs) Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 229910002704 AlGaN Inorganic materials 0.000 description 2
- 238000005253 cladding Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910005540 GaP Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910010199 LiAl Inorganic materials 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- 150000004678 hydrides Chemical class 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 239000010981 turquoise Substances 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/08—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a plurality of light emitting regions, e.g. laterally discontinuous light emitting layer or photoluminescent region integrated within the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/32—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Abstract
【解決手段】本発明による発光ダイオードは、基板と、前記基板の上に形成されたN型半導体層及びP型半導体層を含む発光層と、前記発光層の上に形成された波長変換層と、を備え、前記波長変換層は、希土類元素によりドープされた第III族窒化物半導体であることを特徴とする。前記希土類元素は、Tm、Er、Euのうち少なくともいずれか1種を含んでもよい。
【選択図】 図1
Description
好ましくは、前記基板は透光性または半透光性の基板であり、前記発光層の上には反射電極がさらに形成されている。
より好ましくは、前記波長変換層が2層またはそれ以上の層からなり、波長の短い光を発する波長変換層が最初に形成される。
前記波長変換層は、P型半導体層、N型半導体層及び基板の側面まで延設されていてもよい。
前記波長変換層は、有機金属化学蒸着法(MOCVD)、化学蒸着法(CVD)、プラズマ化学蒸着法(PCVD)、分子線エピタキシャル成長(epitaxy、以下単に「成長」という)法(MBE)及び水素化物気相成長法(HVPE)のうちいずれかの方法により成長してもよい。
また、波長変換方式を応用する発光ダイオードにおいて、既存の半導体工程を延ばして活用することにより製造が容易であり、工程を単純化させて工程コスト及び工程時間を削減することができる他、製品を小型化することができるというメリットがある。
例えば、上述した基板の上に発光層、波長変換層が順次に積層された形状の垂直型発光ダイオードだけではなく、水平型発光ダイオードにも本発明の波長変換層を形成することができる。基板の上にN型半導体層、活性層、P型半導体層を順次に積層した後、マスクを用いた写真エッチング工程を行うことにより、N型半導体層の一部を露出させる。前記P型半導体層と露出されたN型半導体層の上に希土類元素がドープされたGaN半導体を成長させて波長変換層を形成し、この波長変換層が発光層から発光する1次光を波長変換して所望の色の光を実現することができる。もちろん、本発明は上述した例に限定された構造ではなく、種々の他の構造が採用可能である。
20 N型半導体層
30 活性層
40 P型半導体層
50 発光層
60、61、62、63 波長変換層
Claims (9)
- 基板と、
前記基板の上に形成されたN型半導体層及びP型半導体層を含む発光層と、
前記発光層の上に形成された波長変換層と、を備え、
前記波長変換層は、希土類元素によりドープされた第III族窒化物半導体であることを特徴とする発光ダイオード。 - 基板と、
前記基板の上に形成されたN型半導体層及びP型半導体層を含む発光層と、
前記基板の背面の上に形成された波長変換層と、を備え、
前記波長変換層は、希土類元素によりドープされた第III族窒化物半導体であることを特徴とする発光ダイオード。 - 前記基板は透光性または半透光性の基板であり、前記発光層の上には反射電極がさらに形成されていることを特徴とする請求項2に記載の発光ダイオード。
- 前記希土類元素は、Tm、Er及びEuのうち少なくともいずれか1種を含むことを特徴とする請求項1から3のいずれかに記載の発光ダイオード。
- 前記波長変換層は、少なくとも1層により前記発光層から発せられる光の波長よりも長い波長の光を発することを特徴とする請求項1から3のいずれかに記載の発光ダイオード。
- 前記波長変換層が2層またはそれ以上の層からなり、波長の短い光を発する波長変換層が最初に形成されることを特徴とする請求項1から3のいずれかに記載の発光ダイオード。
- 前記発光層は、前記N型半導体層と前記P型半導体層との間に挟持された活性層をさらに含むことを特徴とする請求項1から3のいずれかに記載の発光ダイオード。
- 前記波長変換層は、P型半導体層、N型半導体層及び基板の側面まで延設されていることを特徴とする請求項1から3のいずれかに記載の発光ダイオード。
- 前記波長変換層は、有機金属化学蒸着法(MOCVD、Metal Organic Chemical Vapor Deposition)、化学蒸着法(CVD、Chemical Vapor Deposition)、プラズマ化学蒸着法(PCVD、Plasma−enhanced Chemical Vapor Deposition)、分子線エピタキシャル成長(epitaxy、以下単に「成長」という)法(MBE、Molecular Beam Epitaxy)及び水素化物気相成長法(HVPE、Hydride Vapor Phase Epitaxy)のうちいずれかの方法により成長することを特徴とする請求項1から3のいずれかに記載の発光ダイオード。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2005-0055035 | 2005-06-24 | ||
KR1020050055035A KR100646634B1 (ko) | 2005-06-24 | 2005-06-24 | 발광 다이오드 |
PCT/KR2006/002437 WO2006137715A1 (en) | 2005-06-24 | 2006-06-23 | Light emitting diode |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008544541A true JP2008544541A (ja) | 2008-12-04 |
JP4975024B2 JP4975024B2 (ja) | 2012-07-11 |
Family
ID=37570686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008518041A Active JP4975024B2 (ja) | 2005-06-24 | 2006-06-23 | 発光ダイオード |
Country Status (4)
Country | Link |
---|---|
US (1) | US9024339B2 (ja) |
JP (1) | JP4975024B2 (ja) |
KR (1) | KR100646634B1 (ja) |
WO (1) | WO2006137715A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7781779B2 (en) * | 2007-05-08 | 2010-08-24 | Luminus Devices, Inc. | Light emitting devices including wavelength converting material |
JP5152502B2 (ja) * | 2008-06-09 | 2013-02-27 | スタンレー電気株式会社 | 灯具 |
TWI416757B (zh) * | 2008-10-13 | 2013-11-21 | Advanced Optoelectronic Tech | 多波長發光二極體及其製造方法 |
KR100992743B1 (ko) | 2008-12-26 | 2010-11-05 | 엘지이노텍 주식회사 | 발광소자 및 그 제조방법 |
KR101843501B1 (ko) * | 2011-03-30 | 2018-03-29 | 서울반도체 주식회사 | 발광장치 |
US8847198B2 (en) * | 2011-05-26 | 2014-09-30 | Micron Technology, Inc. | Light emitting devices with built-in chromaticity conversion and methods of manufacturing |
CN102931299B (zh) * | 2012-11-20 | 2017-05-10 | 无锡华润华晶微电子有限公司 | 一种发光二极管激光刻蚀方法 |
CN111312867B (zh) * | 2020-02-21 | 2023-12-15 | 湘能华磊光电股份有限公司 | 一种单芯片白光led的制备方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000031531A (ja) * | 1998-07-14 | 2000-01-28 | Toshiba Electronic Engineering Corp | 発光装置 |
JP2002208730A (ja) * | 2001-01-09 | 2002-07-26 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子 |
JP2002261325A (ja) * | 2001-03-02 | 2002-09-13 | Nichia Chem Ind Ltd | 発光装置およびその製造方法 |
JP2002368265A (ja) * | 2001-06-08 | 2002-12-20 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子 |
JP2005268775A (ja) * | 2004-02-19 | 2005-09-29 | Matsushita Electric Ind Co Ltd | 半導体発光素子及びその製造方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20050053798A (ko) * | 1996-06-26 | 2005-06-08 | 오스람 게젤샤프트 미트 베쉬랭크터 하프퉁 | 발광 변환 소자를 포함하는 발광 반도체 소자 |
US5952681A (en) * | 1997-11-24 | 1999-09-14 | Chen; Hsing | Light emitting diode emitting red, green and blue light |
JP2001339102A (ja) | 2000-05-29 | 2001-12-07 | Toyota Central Res & Dev Lab Inc | 窒化物系化合物半導体発光素子 |
US6642652B2 (en) * | 2001-06-11 | 2003-11-04 | Lumileds Lighting U.S., Llc | Phosphor-converted light emitting device |
JP2004047748A (ja) | 2002-07-12 | 2004-02-12 | Stanley Electric Co Ltd | 発光ダイオード |
KR20040011698A (ko) | 2002-07-30 | 2004-02-11 | 윤명진 | 저온장치를 이용한 사막화 및 황사 방지시스템 |
KR100499129B1 (ko) * | 2002-09-02 | 2005-07-04 | 삼성전기주식회사 | 발광 다이오드 및 그 제조방법 |
KR100764457B1 (ko) * | 2004-03-18 | 2007-10-05 | 삼성전기주식회사 | 모노리식 백색 발광소자 |
-
2005
- 2005-06-24 KR KR1020050055035A patent/KR100646634B1/ko active IP Right Grant
-
2006
- 2006-06-23 WO PCT/KR2006/002437 patent/WO2006137715A1/en active Application Filing
- 2006-06-23 US US11/993,955 patent/US9024339B2/en active Active
- 2006-06-23 JP JP2008518041A patent/JP4975024B2/ja active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000031531A (ja) * | 1998-07-14 | 2000-01-28 | Toshiba Electronic Engineering Corp | 発光装置 |
JP2002208730A (ja) * | 2001-01-09 | 2002-07-26 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子 |
JP2002261325A (ja) * | 2001-03-02 | 2002-09-13 | Nichia Chem Ind Ltd | 発光装置およびその製造方法 |
JP2002368265A (ja) * | 2001-06-08 | 2002-12-20 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子 |
JP2005268775A (ja) * | 2004-02-19 | 2005-09-29 | Matsushita Electric Ind Co Ltd | 半導体発光素子及びその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US20080197373A1 (en) | 2008-08-21 |
US9024339B2 (en) | 2015-05-05 |
JP4975024B2 (ja) | 2012-07-11 |
WO2006137715A1 (en) | 2006-12-28 |
KR100646634B1 (ko) | 2006-11-23 |
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