JP2008224533A - Electrolytic capacitor degradation diagnosis system and electrolytic capacitor degradation diagnosis method - Google Patents

Electrolytic capacitor degradation diagnosis system and electrolytic capacitor degradation diagnosis method Download PDF

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JP2008224533A
JP2008224533A JP2007065497A JP2007065497A JP2008224533A JP 2008224533 A JP2008224533 A JP 2008224533A JP 2007065497 A JP2007065497 A JP 2007065497A JP 2007065497 A JP2007065497 A JP 2007065497A JP 2008224533 A JP2008224533 A JP 2008224533A
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electrolytic capacitor
tan
dielectric loss
loss tangent
diagnostic
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JP2008224533A5 (en
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Yoshio Shigee
良男 重枝
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Yaskawa Electric Corp
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Yaskawa Electric Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an electrolytic capacitor degradation diagnosis system and an electrolytic capacitor degradation diagnosis method for externally diagnosing degradation in an electrolytic capacitor built in a controller, without having to remove it from a circuit, and to quickly, efficiently and automatically diagnose a plurality of the electrolytic capacitors to be diagnosed in the controller. <P>SOLUTION: An estimate equation is previously obtained from a relative relation between a dielectric tangent tan δs in a stand-alone state and a dielectric tangent tan δsm, in a state where a plurality of the electrolytic capacitors 2s with different dielectric tangents are respectively mounted on component circuits 3, and stored. A dielectric tangent tan δm of the to-be-diagnosed capacitor 2 is measured, in a state where it is mounted on the component circuit 3. A dielectric tangent tan δ of the to-be-diagnosed electrolytic capacitor 2 in the stand-alone state is estimated from the measurement value and information for identifying the component circuit 3. The degree of degradation is diagnosed by comparing a previously-stored degradation determination value. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、電解コンデンサの劣化度を診断する電解コンデンサ劣化診断システムおよび電解コンデンサ劣化診断方法に関する。   The present invention relates to an electrolytic capacitor deterioration diagnosis system and an electrolytic capacitor deterioration diagnosis method for diagnosing the deterioration degree of an electrolytic capacitor.

従来の電解コンデンサの劣化度診断は、電解コンデンサに流れる電流リップル、および電圧リップルの大小により劣化度を診断している(たとえば、特許文献1参照)。
また、電解コンデンサ単体の状態で、予め電解コンデンサの特性である静電容量、tanδ、インピーダンスのいずれかを時系列に測定したデータを準備し、被診断電解コンデンサの測定値と比較し、電解コンデンサの劣化度を診断するものもある(例えば、特許文献2参照)。
In the conventional deterioration degree diagnosis of an electrolytic capacitor, the deterioration degree is diagnosed based on the magnitude of current ripple and voltage ripple flowing in the electrolytic capacitor (see, for example, Patent Document 1).
In addition, in the state of the electrolytic capacitor alone, prepare data in which any one of the capacitance, tan δ, and impedance, which are the characteristics of the electrolytic capacitor, is measured in time series, and compare with the measured value of the electrolytic capacitor to be diagnosed. There is also one that diagnoses the degree of deterioration (see, for example, Patent Document 2).

図5は、第1従来技術を示す電解コンデンサの劣化診断システムの機能ブロック図である。
図5において、52は順変換回路、53は逆変換回路、54は電解コンデンサ、55は電流検出用ホール素子、56aは電圧検出部、56bは電流検出部、57a、57bは比較器、58a、58bはANDである。
以下、図5を用いて、第1従来技術である電解コンデンサの劣化診断システムの機能を説明する。
電圧検出部56aは、電圧リップルを検出し、電流検出部56bは、電流リップルを検出している。比較器57aは、検出した電圧リップル値と電圧リップル判定値を比較し、比較器57bは、検出した電流リップル値と電流リップル判定値を比較している。
FIG. 5 is a functional block diagram of an electrolytic capacitor deterioration diagnosis system showing the first prior art.
In FIG. 5, 52 is a forward conversion circuit, 53 is an inverse conversion circuit, 54 is an electrolytic capacitor, 55 is a current detection Hall element, 56a is a voltage detection unit, 56b is a current detection unit, 57a and 57b are comparators, 58a, 58b is an AND.
Hereinafter, the function of the electrolytic capacitor deterioration diagnosis system according to the first prior art will be described with reference to FIG.
The voltage detection unit 56a detects a voltage ripple, and the current detection unit 56b detects a current ripple. The comparator 57a compares the detected voltage ripple value with the voltage ripple determination value, and the comparator 57b compares the detected current ripple value with the current ripple determination value.

図6は、第2従来技術を示す電解コンデンサの劣化診断システムの構成図である。
図6において、62は被診断電解コンデンサ、63は計測部、64は劣化判定部、65は時系列に測定された測定値のデータベース、66は診断部、67は判定結果の表示部である。
以下、図6を用いて、第2従来技術である電解コンデンサの劣化診断システムの動作を説明する。
計測部63で単体の電解コンデンサ62の静電容量、tanδ、漏れ電流、インピーダンスのいずれかの電気的特性値を計測した結果を時系列的にデータベース65に記憶する。
劣化判定部64は、被測定電解コンデンサ62を単体の状態で測定し、測定値とデータベース65に記憶された計測結果と比較して電解コンデンサの劣化を判定している。
FIG. 6 is a configuration diagram of an electrolytic capacitor deterioration diagnosis system showing the second prior art.
In FIG. 6, 62 is a diagnostic electrolytic capacitor, 63 is a measurement unit, 64 is a deterioration determination unit, 65 is a database of measured values measured in time series, 66 is a diagnosis unit, and 67 is a determination result display unit.
Hereinafter, the operation of the electrolytic capacitor deterioration diagnosis system according to the second prior art will be described with reference to FIG.
The measurement unit 63 stores the result of measuring the electrical characteristic value of any one of the capacitance, tan δ, leakage current, and impedance of the single electrolytic capacitor 62 in the database 65 in time series.
The deterioration determination unit 64 measures the electrolytic capacitor 62 to be measured in a single state, and compares the measured value with the measurement result stored in the database 65 to determine the deterioration of the electrolytic capacitor.

このように、従来の電解コンデンサ劣化診断システムでは、電圧と電流のリップル値を判定値と比較して診断している。あるいは、電解コンデンサが単体の状態で測定し、時系列の記録されたデータと比較し、判定しているものもある。
特開平7−222436号公報(第2−3頁、第1図) 特開2002−267708号公報(第3頁、第1図)
Thus, in the conventional electrolytic capacitor deterioration diagnosis system, the voltage and current ripple values are compared with the determination values for diagnosis. Alternatively, some electrolytic capacitors are measured in a single state and compared with time-series recorded data for determination.
JP 7-222436 A (page 2-3, FIG. 1) Japanese Patent Laid-Open No. 2002-267708 (page 3, FIG. 1)

しかしながら、従来の電解コンデンサ劣化診断システムは、電解コンデンサ単体において診断するもので、制御装置に組み込まれている状態では、診断不可能であるという問題があった。
本発明はこのような問題点に鑑みてなされたものであり、制御装置に組み込まれた電解コンデンサを回路から取り外すことなく、制御装置の外部から劣化診断を可能とする電解コンデンサ劣化診断システムおよび電解コンデンサ劣化診断方法を提供することを目的とする。さらに、制御装置内の複数個の被診断コンデンサを短時間に効率よく自動的に診断を行う電解コンデンサ劣化診断システムおよび電解コンデンサ劣化診断方法を提供することを目的とする。
However, the conventional electrolytic capacitor deterioration diagnosis system diagnoses the electrolytic capacitor alone, and there is a problem that it cannot be diagnosed when it is incorporated in the control device.
The present invention has been made in view of such problems, and provides an electrolytic capacitor deterioration diagnosis system and an electrolytic method capable of performing deterioration diagnosis from outside the control device without removing the electrolytic capacitor incorporated in the control device from the circuit. An object of the present invention is to provide a capacitor deterioration diagnosis method. It is another object of the present invention to provide an electrolytic capacitor deterioration diagnosis system and an electrolytic capacitor deterioration diagnosis method that automatically and efficiently diagnose a plurality of capacitors to be diagnosed in a control device in a short time.

上記問題を解決するため、本発明は、次のようにしたのである。
請求項1に記載の発明は、被診断電解コンデンサを有する複数の構成回路を備えた制御装置と、前記被診断電解コンデンサの誘電正接を測定する計測器と、前記被診断電解コンデンサの誘電正接の劣化判定値を記憶し、前記被診断電解コンデンサの誘電正接と前記劣化判定値を比較して劣化度を判定するパーソナルコンピュータと、を備えた電解コンデンサ劣化診断システムにおいて、前記複数の構成回路が有する前記被診断電解コンデンサの誘電正接測定用の出力部を前記制御装置に有し、前記被診断電解コンデンサの誘電正接測定時に前記出力部と接続する測定専用治具と、前記測定専用治具を介して接続される前記複数の構成回路を切り替えて前記計測器の測定入力部に出力する入力切替装置と、を備える構成とし、前記パーソナルコンピュータは、予め、複数の異なる誘電正接の電解コンデンサについて単体で測定した誘電正接と前記複数の構成回路に装着して前記計測器で測定した誘電正接に基づいて、前記単体での誘電正接とそれぞれの前記構成回路に搭載された状態での誘電正接との相関関係から推定式を前記構成回路毎にそれぞれ求めて記憶し、前記計測器は、前記入力切替装置からの信号に基づいて前記構成回路に搭載された状態での前記被診断電解コンデンサの静電正接を測定し、前記パーソナルコンピュータは、前記計測器で測定した前記被診断電解コンデンサの誘電正接と測定時の前記構成回路を特定する情報から前記被診断電解コンデンサ単体時の誘電正接を前記推定式に基づいて推定し、前記劣化判定値と比較することにより劣化度を診断することを特徴としている。
In order to solve the above problem, the present invention is as follows.
According to the first aspect of the present invention, there is provided a control device including a plurality of constituent circuits having a diagnostic electrolytic capacitor, a measuring instrument for measuring a dielectric tangent of the diagnostic electrolytic capacitor, and a dielectric tangent of the diagnostic electrolytic capacitor. In the electrolytic capacitor deterioration diagnosis system comprising: a personal computer that stores a deterioration determination value and compares a dielectric loss tangent of the electrolytic capacitor to be diagnosed with the deterioration determination value to determine a deterioration degree. The control device has an output unit for measuring the dielectric loss tangent of the diagnostic electrolytic capacitor, and is connected to the output unit when measuring the dielectric loss tangent of the diagnostic electrolytic capacitor via the measurement dedicated jig. An input switching device that switches the plurality of constituent circuits connected to each other and outputs the result to the measurement input unit of the measuring instrument. Based on the dielectric loss tangent measured in advance for a plurality of electrolytic capacitors having different dielectric loss tangents and the dielectric loss tangent measured by the measuring instrument mounted on the plurality of constituent circuits, the computer is configured to have a An estimation formula is obtained and stored for each of the constituent circuits from the correlation with the dielectric loss tangent in the state of being mounted on the constituent circuit, and the measuring instrument is based on the signal from the input switching device. Information for specifying the dielectric tangent of the electrolytic capacitor to be measured measured by the measuring instrument and the constituent circuit at the time of measurement. From the above, the dielectric loss tangent of the electrolytic capacitor to be diagnosed alone is estimated based on the estimation formula, and the deterioration degree is diagnosed by comparing with the deterioration determination value. It is a symptom.

また、請求項2に記載の発明は、請求項1に記載の電解コンデンサ劣化診断システムにおいて、前記パーソナルコンピュータは、前記入力切替回路に対して前記測定器へ出力する前記構成回路を選択する動作と、前記測定器に誘電正接の測定開始及び終了の指示および選択した前記構成回路と誘電正接測定値から成るデータを送信する指令を行い前記データを記憶する動作と、前記データと前記推定式に基づいて前記被診断電解コンデンサ単体時の誘電正接を推定し、前記劣化判定値と比較して劣化判定する動作と、を自動的に前記構成回路の数だけ実行するプログラムを備えたことを特徴としている。   According to a second aspect of the present invention, in the electrolytic capacitor deterioration diagnosis system according to the first aspect, the personal computer selects the component circuit to be output to the measuring device with respect to the input switching circuit. Instructing the measuring device to start and end measurement of dielectric loss tangent and commanding to transmit data comprising the selected constituent circuit and dielectric loss tangent measurement value, storing the data, and based on the data and the estimation formula And an operation for estimating the dielectric loss tangent of the electrolytic capacitor to be diagnosed alone and determining the deterioration by comparing with the deterioration determination value. .

また、請求項3に記載の発明は、各仕様の電解コンデンサについて単体での誘電正接の劣化判定値を記憶し、被診断電解コンデンサの誘電正接と前記劣化判定値を比較して劣化度を判定する手順を備え、前記被診断電解コンデンサを有する複数の構成回路を備えた制御装置における電解コンデンサ劣化診断方法において、予め、複数の異なる誘電正接の電解コンデンサをサンプルとして用い単体で第1の誘電正接を測定するステップと、予め、前記複数の異なる誘電正接の電解コンデンサを前記構成回路に装着した状態で第2の誘電正接を測定するステップと、予め、全ての前記構成回路について、前記第1の誘電正接と前記第2の誘電正接との相関関係から推定式を求めて記憶するステップと、前記被診断電解コンデンサの誘電正接を前記構成回路に装着されたままの状態で測定するステップと、測定した前記被診断電解コンデンサの誘電正接および測定時の前記構成回路を特定する情報から前記被診断電解コンデンサ単体時の誘電正接を前記推定式に基づいて推定するステップと、推定した前記被診断電解コンデンサ単体時の誘電正接と前記劣化判定値と比較することにより劣化度を診断するステップと、を備えたことを特徴としている。   Further, the invention according to claim 3 stores the degradation judgment value of the dielectric tangent alone for each specification electrolytic capacitor, and compares the dielectric loss tangent of the diagnostic electrolytic capacitor with the degradation judgment value to judge the degree of degradation. In a method for diagnosing electrolytic capacitor degradation in a control device including a plurality of constituent circuits having a diagnostic electrolytic capacitor, a first dielectric loss tangent alone using a plurality of electrolytic capacitors having different dielectric loss tangents as a sample in advance. Measuring the second dielectric loss tangent in a state in which the plurality of different dielectric loss tangent electrolytic capacitors are mounted on the component circuit in advance, and the first circuit for all the component circuits in advance. Obtaining and storing an estimation equation from the correlation between the dielectric loss tangent and the second dielectric loss tangent, and calculating the dielectric loss tangent of the diagnostic electrolytic capacitor The estimation of the dielectric loss tangent of the diagnostic electrolytic capacitor as a single unit from the step of measuring while attached to the circuit, and the information specifying the measured dielectric loss tangent of the diagnostic electrolytic capacitor and the component circuit at the time of measurement And a step of diagnosing the degree of deterioration by comparing the estimated dielectric loss tangent of the electrolytic capacitor to be diagnosed with the deterioration judgment value.

また、請求項4の発明は、請求項3に記載の電解コンデンサ劣化診断方法において、前記被診断電解コンデンサの誘電正接を前記構成回路に装着されたままの状態で測定する前記ステップ、測定した前記被診断電解コンデンサの誘電正接および測定時の前記構成回路を特定する情報から前記被診断電解コンデンサ単体時の誘電正接を前記推定式に基づいて推定する前記ステップ、推定した前記被診断電解コンデンサ単体時の誘電正接と前記劣化判定値と比較することにより劣化度を診断する前記ステップ、を予め定めた順番に従って、前記被診断電解コンデンサを搭載した前記構成回路の数だけ自動的に繰り返すステップを有することを特徴としている。   Further, the invention of claim 4 is the electrolytic capacitor degradation diagnosis method according to claim 3, wherein the step of measuring the dielectric loss tangent of the electrolytic capacitor to be diagnosed while being mounted on the constituent circuit is measured. The step of estimating the dielectric loss tangent of the diagnostic electrolytic capacitor alone based on the estimation equation from the information specifying the dielectric tangent of the diagnostic electrolytic capacitor and the constituent circuit at the time of measurement, and the estimated diagnostic electrolytic capacitor single time The step of diagnosing the degree of deterioration by comparing the dielectric loss tangent of the capacitor and the deterioration judgment value, in accordance with a predetermined order, and the step of automatically repeating the number of the constituent circuits equipped with the diagnostic electrolytic capacitor It is characterized by.

請求項1に記載の発明によると、制御装置に組み込まれた電解コンデンサを回路から取り外すことなく、制御装置の外部から劣化診断を可能とする電解コンデンサ劣化診断システムが得られる。   According to the first aspect of the present invention, it is possible to obtain an electrolytic capacitor deterioration diagnosis system that enables deterioration diagnosis from outside the control device without removing the electrolytic capacitor incorporated in the control device from the circuit.

また、請求項2に記載の発明によると、請求項1に記載の発明の効果に加え、制御装置内の複数個の被診断コンデンサを短時間に効率よく自動的に診断を行う電解コンデンサ劣化診断システムが得られる。   According to the invention described in claim 2, in addition to the effect of the invention described in claim 1, electrolytic capacitor deterioration diagnosis for automatically and efficiently diagnosing a plurality of capacitors to be diagnosed in the control device in a short time. A system is obtained.

また、請求項3に記載の発明によると、制御装置に組み込まれた電解コンデンサを回路から取り外すことなく、制御装置の外部から劣化診断を可能とする電解コンデンサ劣化診断方法が得られる。   According to the third aspect of the present invention, there is obtained an electrolytic capacitor deterioration diagnosis method that allows deterioration diagnosis from outside the control device without removing the electrolytic capacitor incorporated in the control device from the circuit.

また、請求項4に記載の発明によると、請求項3に記載の発明の効果に加え、制御装置内の複数個の被診断コンデンサを短時間に効率よく自動的に診断を行う電解コンデンサ劣化診断方法が得られる。   According to the invention described in claim 4, in addition to the effect of the invention described in claim 3, electrolytic capacitor deterioration diagnosis that automatically and efficiently diagnoses a plurality of capacitors to be diagnosed in the control device in a short time. A method is obtained.

以下、本発明の方法の具体的実施例について、図に基づいて説明する。   Hereinafter, specific examples of the method of the present invention will be described with reference to the drawings.

図1は、本発明の第1実施例を示す電解コンデンサ劣化診断システムの構成図である。
図1において、1は制御装置、2は 被診断電解コンデンサ、3は構成回路、4は測定用専用治具、5は入力切替装置、6は電解コンデンサの誘電正接を測定するLCRメータなどの測定器、7は パーソナルコンピュータ、8は出力端子、9は測定ケーブル、10はRS232Cの通信ケーブル、11は通信用端子、15は出力部である。
以下、図1を用いて、本実施例の電解コンデンサ劣化診断システムの構成を説明する。
制御装置1は、被診断電解コンデンサ2が組み込まれた構成回路3を複数備えている。
測定用専用治具4は、複数の構成回路3と入力切替装置5の接続を容易にするものである。
入力切替装置5の出力端子8は測定ケーブル9により測定器6に入力するようになっている。
パーソナルコンピュータ7は、RS232Cの通信ケーブル10により、測定器6の通信用端子11と、入力切替装置5の通信用端子11に繋がっている。また、パーソナルコンピュータ7は、仕様の異なる被診断電解コンデンサ2毎に、それぞれ単体での誘電正接tanδの劣化判定値を記憶している。
FIG. 1 is a configuration diagram of an electrolytic capacitor deterioration diagnosis system showing a first embodiment of the present invention.
In FIG. 1, 1 is a control device, 2 is an electrolytic capacitor to be diagnosed, 3 is a component circuit, 4 is a measurement jig, 5 is an input switching device, and 6 is an LCR meter for measuring the dielectric loss tangent of the electrolytic capacitor. , 7 is a personal computer, 8 is an output terminal, 9 is a measurement cable, 10 is an RS232C communication cable, 11 is a communication terminal, and 15 is an output unit.
Hereinafter, the configuration of the electrolytic capacitor deterioration diagnosis system of the present embodiment will be described with reference to FIG.
The control device 1 includes a plurality of constituent circuits 3 in which a diagnostic electrolytic capacitor 2 is incorporated.
The dedicated measurement jig 4 facilitates connection between the plurality of component circuits 3 and the input switching device 5.
The output terminal 8 of the input switching device 5 is input to the measuring instrument 6 through the measurement cable 9.
The personal computer 7 is connected to the communication terminal 11 of the measuring instrument 6 and the communication terminal 11 of the input switching device 5 by an RS232C communication cable 10. In addition, the personal computer 7 stores a deterioration determination value of the dielectric loss tangent tan δ for each diagnostic electrolytic capacitor 2 having different specifications.

図2は、本発明の第1実施例を示す電解コンデンサ劣化診断方法のフローチャートであり、制御装置1内に組み込まれた被診断電解コンデンサ2の誘電正接tanδを推定する処理手順を示すフローチャートである。
以下、図1、2を用いて本発明の電解コンデンサ劣化診断方法について順を追って説明する。尚、誘電正接の記号として、被診断電解コンデンサ2の単体時の誘電正接をtanδ、被診断電解コンデンサ2を構成回路3に搭載した状態で測定した誘電正接をtanδm、複数の異なる誘電正接の電解コンデンサをサンプルとして用いその単体時の誘電正接をtanδsすなわち、n個の時はそれぞれtanδs1、tanδs2・・・tanδsn、複数の異なる誘電正接の電解コンデンサをサンプルとして用い構成回路3に搭載した状態で測定した誘電正接をtanδsmすなわち、n個の時はそれぞれtanδsm1、tanδsm2・・・tanδsmnとする。
先ず、予め、ステップST1で、複数の異なる誘電正接の電解コンデンサをサンプルとして用い単体で誘電正接tanδsを測定し、ステップST2で、測定用専用時具4で制御装置1と入力切替装置5を接続し、全ての構成回路3に対してそれぞれ、入力切替装置5の端子出力8から測定器6で、複数の異なる誘電正接の電解コンデンサについて誘電正接tanδsmを測定し、ステップST3で、全ての構成回路3各々について、誘電正接tanδsと誘電正接tanδsmとの相関関係からtanδの推定式を求めて記憶する。すなわち、予め、サンプル電解コンデンサ単体の tanδsと構成回路3の容量、抵抗と 測定専用治具4と入力切替装置5の抵抗の影響を受けた制御装置1の外部の測定結果であるtanδsmを複数個測定し、その相関関係から被診断電解コンデンサ2のtanδと制御装置外部の測定結果tanδsmに関するtanδの推定式を次式のように作成する。
tanδの推定式=(tanδsm−D)/A、但し、DおよびAは定数である。
尚、このようにして作成した推定式は、実験によって、寄与率が1に近い(通常0.98以上)ことを確認しており、統計的に信頼できる推定式である。
次に、ステップST4で、測定用専用時具4で制御装置1と入力切替装置5を接続し、入力切替装置5の端子出力8から測定器6で、被診断電解コンデンサ2の誘電正接を構成回路3に装着されたままの状態で測定する。この被診断電解コンデンサ2単体の tan δは、構成回路の容量、抵抗と 測定専用治具4と入力切替装置5の抵抗の影響をうけて、制御装置外部の測定結果であるtanδmとなる。
次に、ステップST5で、測定した被診断電解コンデンサ2の誘電正接tanδmおよび測定時の構成回路3を特定する構成回路番号などの情報から被診断電解コンデンサ2単体時の誘電正接tanδをtanδの推定式に代入して求める。
次に、ステップST6で、推定した被診断電解コンデンサ2単体時の誘電正接tanδと予め記憶している対象とするコンデンサの劣化判定値と比較することにより劣化度を診断する。
次にステップST7で、診断結果を画面表示あるいは印刷出力する。
以上のステップST4からステップST7を、被診断電解コンデンサ2を搭載している構成回路3の数だけ繰り返す。
FIG. 2 is a flowchart of the electrolytic capacitor deterioration diagnosis method according to the first embodiment of the present invention, showing a processing procedure for estimating the dielectric loss tangent tan δ of the diagnostic electrolytic capacitor 2 incorporated in the control device 1. .
Hereinafter, the electrolytic capacitor deterioration diagnosis method of the present invention will be described in order with reference to FIGS. In addition, as a symbol of dielectric loss tangent, the dielectric loss tangent of the diagnostic electrolytic capacitor 2 as a single unit is tan δ, the dielectric loss tangent measured with the diagnostic electrolytic capacitor 2 mounted on the constituent circuit 3 is tan δm, and electrolysis of a plurality of different dielectric loss tangents. Using a capacitor as a sample, the dielectric loss tangent of the single unit is tan δs, that is, when n, tan δs1, tan δs2... Tan δsn, each of which is measured with a plurality of electrolytic capacitors having different dielectric loss tangents as samples. The tangent dielectric loss tangent is tan δsm, that is, tan δsm1, tan δsm2,.
First, in step ST1, a plurality of different dielectric loss tangent electrolytic capacitors are used as samples to measure the dielectric loss tangent tan δs alone, and in step ST2, the control device 1 and the input switching device 5 are connected using the measuring tool 4. Then, the dielectric tangent tan δsm is measured with respect to a plurality of electrolytic capacitors having different dielectric loss tangents from the terminal output 8 of the input switching device 5 with the measuring device 6 for all the structural circuits 3, and all the structural circuits are measured in step ST3. For each of the three, an estimation formula of tan δ is obtained from the correlation between the dielectric loss tangent tan δs and the dielectric loss tangent tan δsm and stored. That is, a plurality of tan δsm, which are measurement results external to the control device 1 affected by the resistance of the sample electrolytic capacitor alone, tan δs of the component circuit 3, resistance, resistance of the measurement dedicated jig 4, and input switching device 5, in advance. Based on the correlation, an estimation formula of tan δ relating to tan δ of the electrolytic capacitor 2 to be diagnosed and the measurement result tan δsm outside the control device is created as follows.
Estimation formula of tan δ = (tan δsm−D) / A, where D and A are constants.
The estimation formula created in this way has been confirmed by experiments to have a contribution rate close to 1 (usually 0.98 or more), and is a statistically reliable estimation formula.
Next, in step ST4, the control device 1 and the input switching device 5 are connected by the measuring tool 4 for measurement, and the dielectric tangent of the diagnostic electrolytic capacitor 2 is configured from the terminal output 8 of the input switching device 5 by the measuring device 6. Measurement is performed with the circuit 3 mounted. The tan δ of the diagnostic electrolytic capacitor 2 itself is tan δm, which is a measurement result outside the control device, under the influence of the capacitance and resistance of the constituent circuits, the resistance of the measurement dedicated jig 4 and the input switching device 5.
Next, in step ST5, the dielectric loss tangent tan δ of the diagnostic electrolytic capacitor 2 alone is estimated from the information such as the measured dielectric loss tang tan δm of the electrolytic capacitor 2 to be diagnosed and the component circuit number for specifying the component circuit 3 at the time of measurement. Substitute into an expression
Next, in step ST6, the degree of deterioration is diagnosed by comparing the estimated dielectric loss tangent tan δ of the electrolytic capacitor 2 to be diagnosed with the deterioration determination value of the target capacitor stored in advance.
In step ST7, the diagnosis result is displayed on a screen or printed out.
The above steps ST4 to ST7 are repeated as many times as the number of component circuits 3 on which the diagnostic electrolytic capacitor 2 is mounted.

図3は、本発明の第1実施例を示す電解コンデンサ劣化診断システムにおける推定式作成方法の説明図である。
図3において、2sはサンプル電解コンデンサ、13はサンプル電解コンデンサ単体で測定した誘電正接tanδsのデータ、14は入力切替装置5の出力端子8で測定したサンプル電解コンデンサ2sの誘電正接tanδsmのデータ、16は誘電正接tanδの構成回路毎の推定式である。尚、図1と同じ説明符号のものは図1と同じ構成要素を示すものとし、その説明は省略する。
以下、図3を用いて本実施例の電解コンデンサ劣化診断システムにおける誘電正接tanδの推定式の作成方法を説明する。
先ず、異なる誘電正接tanδsのサンプル電解コンデンサ2sを複数個(例えば、n個のC1、C2、・・・Cn)用意し、測定器6で誘電正接を測定し、サンプル電解コンデンサ2s単体の誘電正接tanδsのデータ13を複数個(tanδs1、tanδs2、・・・tanδsn)を得る。
次に、制御装置1の被診断電解コンデンサ2を有する構成回路3の被診断電解コンデンサ2の取付位置に、先に単体で誘電正接tanδsを測定したサンプル電解コンデンサ2s(C1、C2、・・・Cn)を順に取付け、制御装置1の構成回路3の出力部と入力切替装置5を接続する測定用専用治具4を装着し、測定器6により制御装置1に実装した状態で測定した誘電正接tanδsmのデータ14を複数個(tanδsm1、tanδsm2、・・・tanδsmn)得る。
サンプル電解コンデンサ2s単体のtanδsのデータ13(tanδs1、tanδs2、・・・tanδsn)と、測定器6により制御装置1に実装した状態で測定したtanδsmのデータ14(tanδsm1、tanδsm2、・・・tanδsmn)の相関関係から、被診断電解コンデンサ2を制御装置に実装した状態で測定した誘電正接tanδmから被診断電解コンデンサ2単体時での誘電正接tanδを推定する推定式16を求める。これを構成回路3の数だけ繰り返し、構成回路3の識別番号とともにその推定式を記憶する。
このように、本実施例に係る電解コンデンサ劣化診断システムは、サンプルコンデンサ2s単体でのtanδsと構成回路3および測定用専用ケーブル4を介して実測したtanδmにより推定式16を求めているので、いかなる構成回路3においても被診断電解コンデンサ2のtanδを推定することができ、前述したように寄与率が1に近いので、信頼度の高い推定が可能になるのである。
尚、本実施例では、複数の異なる誘電正接の電解コンデンサをサンプルとして用いたが、1つの電解コンデンサに直列に抵抗、例えば0.1オーム〜1オーム程度を接続して、単体のtanδを変更したものをサンプルとして用いてもよい。
FIG. 3 is an explanatory diagram of an estimation formula creation method in the electrolytic capacitor deterioration diagnosis system according to the first embodiment of the present invention.
In FIG. 3, 2s is a sample electrolytic capacitor, 13 is data of dielectric loss tangent tan δs measured with the sample electrolytic capacitor alone, 14 is data of dielectric loss tangent tan δsm of the sample electrolytic capacitor 2s measured at the output terminal 8 of the input switching device 5, Is an estimation formula for each constituent circuit of the dielectric loss tangent tan δ. The same reference numerals as those in FIG. 1 indicate the same components as those in FIG. 1, and the description thereof is omitted.
Hereinafter, a method for creating an estimation formula for the dielectric loss tangent tan δ in the electrolytic capacitor deterioration diagnosis system of the present embodiment will be described with reference to FIG.
First, a plurality of sample electrolytic capacitors 2s (for example, n C1, C2,... Cn) having different dielectric loss tangents tan δs are prepared, the dielectric loss tangent is measured by the measuring device 6, and the dielectric loss tangent of the sample electrolytic capacitor 2s alone. A plurality of data tan δs 13 (tan δs1, tan δs2,... tan δsn) are obtained.
Next, a sample electrolytic capacitor 2s (C1, C2,...) Having previously measured the dielectric loss tangent tan δs alone at the mounting position of the diagnostic electrolytic capacitor 2 of the component circuit 3 having the diagnostic electrolytic capacitor 2 of the control device 1. The dielectric loss tangent measured in the state where Cn) is mounted in order, the measurement dedicated jig 4 for connecting the output part of the component circuit 3 of the control device 1 and the input switching device 5 is mounted, and mounted on the control device 1 by the measuring device 6 A plurality of tan δ sm data 14 (tan δ sm1, tan δ sm2,... tan δ smn) are obtained.
Tan δs data 13 (tan δs1, tan δs2,. From the above correlation, an estimation formula 16 for estimating the dielectric loss tangent tan δ when the diagnostic electrolytic capacitor 2 alone is obtained from the dielectric loss tangent tan δm measured with the diagnostic electrolytic capacitor 2 mounted on the control device. This is repeated by the number of component circuits 3, and the estimation formula is stored together with the identification number of the component circuit 3.
As described above, the electrolytic capacitor deterioration diagnosis system according to the present embodiment obtains the estimation equation 16 from tan δs of the sample capacitor 2s alone and tan δm actually measured through the constituent circuit 3 and the measurement dedicated cable 4. The component circuit 3 can also estimate tan δ of the electrolytic capacitor 2 to be diagnosed, and since the contribution rate is close to 1 as described above, it is possible to estimate with high reliability.
In this example, a plurality of different dielectric loss tangent electrolytic capacitors were used as samples. However, a single tan δ was changed by connecting a resistance, for example, about 0.1 ohm to 1 ohm in series with one electrolytic capacitor. You may use what you did as a sample.

本実施例は第1実施例における電解コンデンサ劣化診断の処理手順のうち、ステップST4からステップST7を被診断電解コンデンサ2を搭載した構成回路3の数だけ自動的に繰り返し実施するようにしたものである。
図4は、本発明の第2実施例を示す電解コンデンサ劣化診断方法の処理手順の説明図である。
図4において、12は記憶装置、18は被診断電解コンデンサのtanδ推定部、20は劣化判定部、21は出力部、22はプログラム、23は回路切替制御部、24は測定オン/オフおよびデータ送信の指令、26は構成回路と測定データ、27は構成回路毎の推定式、28は電解コンデンサの仕様毎の劣化判定値である。尚、図1と同じ説明符号のものは、図1と同じ構成要素を示すものとし、その説明は省略する。
以下、図4を用いて本実施例の電解コンデンサ劣化診断方法の処理手順を説明する。
先ず、診断をスタートすると、パーソナルコンピュータ7の プログラム22により、回路切替制御がなされ最初の構成回路3を選択し、測定器6に測定オン/オフおよびデータ送信の指令24 を行う。測定器6により測定された誘電正接のデータは、構成回路3毎に付けられた構成回路番号25とともに構成回路と測定データ26として、パーソナルコンピュータ7の記憶装置12に記憶される。
次に、被診断電解コンデンサtanδ推定部18は、構成回路と測定データ26と予め第1実施例で述べた手順で作成され記憶している構成回路毎の推定式27を読み出し、被診断電解コンデンサ2のtanδを推定する。
次に、劣化判定部20は、記憶装置12より電解コンデンサの仕様毎の劣化判定値28を読み出し、被診断電解コンデンサ2の劣化判定を行う。
以上の動作を自動的に被診断電解コンデンサを搭載した構成回路3の数だけ実行し、出力部21は、判定結果を画面表示または印刷出力する。
In this embodiment, among the electrolytic capacitor deterioration diagnosis processing procedure in the first embodiment, steps ST4 to ST7 are automatically repeated for the number of component circuits 3 on which the electrolytic capacitor 2 to be diagnosed is mounted. is there.
FIG. 4 is an explanatory diagram of the processing procedure of the electrolytic capacitor deterioration diagnosis method according to the second embodiment of the present invention.
In FIG. 4, 12 is a storage device, 18 is a tan δ estimation unit of the electrolytic capacitor to be diagnosed, 20 is a deterioration determination unit, 21 is an output unit, 22 is a program, 23 is a circuit switching control unit, 24 is measurement on / off and data A transmission command, 26 is a component circuit and measurement data, 27 is an estimation formula for each component circuit, and 28 is a deterioration determination value for each specification of the electrolytic capacitor. The same reference numerals as those in FIG. 1 indicate the same components as those in FIG. 1, and the description thereof is omitted.
Hereinafter, the processing procedure of the electrolytic capacitor deterioration diagnosis method of the present embodiment will be described with reference to FIG.
First, when diagnosis is started, circuit switching control is performed by the program 22 of the personal computer 7, the first component circuit 3 is selected, and a measurement on / off and data transmission command 24 is sent to the measuring instrument 6. The data of the dielectric loss tangent measured by the measuring device 6 is stored in the storage device 12 of the personal computer 7 as the configuration circuit and measurement data 26 together with the configuration circuit number 25 assigned to each configuration circuit 3.
Next, the diagnosing electrolytic capacitor tan δ estimation unit 18 reads out the constituent circuit, the measurement data 26 and the estimation formula 27 for each constituent circuit that has been created and stored in advance according to the procedure described in the first embodiment. Tan δ of 2 is estimated.
Next, the deterioration determination unit 20 reads the deterioration determination value 28 for each specification of the electrolytic capacitor from the storage device 12 and determines the deterioration of the diagnostic electrolytic capacitor 2.
The above operation is automatically executed by the number of component circuits 3 on which the electrolytic capacitors to be diagnosed are mounted, and the output unit 21 displays the determination result on the screen or prints it out.

このように、本実施例に係る電解コンデンサ劣化診断システムおよび電解コンデンサ劣化診断方法は、自動的に被診断電解コンデンサ2を搭載した構成回路3の数だけ診断する手順をとるので、短時間に診断することができる。   As described above, the electrolytic capacitor deterioration diagnosis system and the electrolytic capacitor deterioration diagnosis method according to the present embodiment take the procedure of automatically diagnosing the number of component circuits 3 on which the electrolytic capacitor 2 to be diagnosed is mounted. can do.

本発明の電解コンデンサ劣化診断システムおよび電解コンデンサ劣化診断方法は、被診断電解コンデンサと測定点までの様々な測定値を変化させる要因をことごとく含めた条件で推定式を作るという手順をとるため、いかなる構成回路に組み込まれた電解コンデンサにも適用することができて、統計的に高い寄与率を有する推定式を作成可能なため、新製品や既設の制御盤の電解コンデンサに寿命劣化診断機能を組み込むという用途にも適用できる。電解コンデンサを有する新設および既設いずれの制御盤の予防診断装置にも好適である。   The electrolytic capacitor deterioration diagnosis system and the electrolytic capacitor deterioration diagnosis method according to the present invention take a procedure of making an estimation formula under conditions including all the factors to change the measured electrolytic capacitor and various measured values up to the measurement point. It can also be applied to electrolytic capacitors built into component circuits, and can be used to create estimation formulas that have a statistically high contribution rate, so the life deterioration diagnosis function is built into the electrolytic capacitors of new products and existing control panels. It can also be used for such purposes. It is suitable for preventive diagnosis devices for both new and existing control panels having electrolytic capacitors.

本発明の第1実施例を示す電解コンデンサ劣化診断システムの構成図1 is a configuration diagram of an electrolytic capacitor deterioration diagnosis system showing a first embodiment of the present invention. 本発明の第1実施例を示す電解コンデンサ劣化診断方法のフローチャートThe flowchart of the electrolytic capacitor degradation diagnostic method which shows 1st Example of this invention. 本発明の第1実施例を示す電解コンデンサ劣化診断システムにおける推定式作成方法の説明図Explanatory drawing of the estimation formula preparation method in the electrolytic capacitor degradation diagnostic system which shows 1st Example of this invention 本発明の第2実施例を示す電解コンデンサ劣化診断方法の処理手順の説明図Explanatory drawing of the process sequence of the electrolytic capacitor degradation diagnostic method which shows 2nd Example of this invention. 第1従来技術を示す電解コンデンサの劣化診断システムの機能ブロック図Functional block diagram of the electrolytic capacitor deterioration diagnosis system showing the first prior art 第2従来技術を示す電解コンデンサの劣化診断システムの構成図Configuration diagram of electrolytic capacitor deterioration diagnosis system showing the second prior art

符号の説明Explanation of symbols

1 制御装置
2 被診断電解コンデンサ
2s サンプル電解コンデンサ
3 構成回路
4 測定用専用治具
5 入力切替装置
6 測定器
7 パーソナルコンピュータ
8 出力端子
9 測定ケーブル
10 通信ケーブル
11 通信用端子
12 記憶装置
13 サンプル電解コンデンサ単体で測定したtanδsのデータ
14 入力切替装置5の出力端子8で測定したtanδsmのデータ
15 出力部
16、27 構成回路毎の推定式
18 被診断電解コンデンサのtanδ推定部
20、64 劣化判定部
21 出力部
22 プログラム
23 回路切替制御部
24 測定オン/オフおよびデータ送信の指令
26 構成回路と測定データ、
28 電解コンデンサの仕様毎の劣化判定値
52 順変換回路
53 逆変換回路
54 電解コンデンサ
55 電流検出用ホール素子
56a 電圧検出部
56b 電流検出部
57a、57b 比較器
58a、58b AND
62 被診断電解コンデンサ
63 計測部
65 データベース
66 診断部
67 判定結果の表示部
DESCRIPTION OF SYMBOLS 1 Control apparatus 2 Electrolytic capacitor to be diagnosed 2s Sample electrolytic capacitor 3 Configuration circuit 4 Jig for measurement 5 Input switching device 6 Measuring instrument 7 Personal computer 8 Output terminal 9 Measurement cable 10 Communication cable 11 Communication terminal 12 Storage device 13 Sample electrolysis Tan δs data measured by a single capacitor 14 tan δsm data measured at the output terminal 8 of the input switching device 5 15 output unit 16, 27 estimation formula for each constituent circuit 18 tan δ estimation unit 20, 64 degradation determination unit of the electrolytic capacitor to be diagnosed 21 Output unit 22 Program 23 Circuit switching control unit 24 Measurement on / off and data transmission command 26 Configuration circuit and measurement data,
28 Degradation judgment value for each specification of electrolytic capacitor 52 Forward conversion circuit 53 Reverse conversion circuit 54 Electrolytic capacitor 55 Hall element for current detection 56a Voltage detection unit 56b Current detection unit 57a, 57b Comparator 58a, 58b AND
62 Electrolytic capacitor to be diagnosed 63 Measuring unit 65 Database 66 Diagnosing unit
67 Judgment result display

Claims (4)

被診断電解コンデンサ(2)を有する複数の構成回路(3)を備えた制御装置(1)と、
前記被診断電解コンデンサ(2)の誘電正接(tanδ)を測定する計測器(6)と、
前記被診断電解コンデンサ(2)の誘電正接(tanδ)の劣化判定値を記憶し、前記被診断電解コンデンサ(2)の誘電正接(tanδ)と前記劣化判定値を比較して劣化度を判定するパーソナルコンピュータ(7)と、
を備えた電解コンデンサ劣化診断システムにおいて、
前記複数の構成回路(3)が有する前記被診断電解コンデンサ(2)の誘電正接(tanδ)測定用の出力部(15)を前記制御装置(1)に有し、
前記被診断電解コンデンサ(2)の誘電正接(tanδ)測定時に前記出力部(15)と接続する測定専用治具(4)と、
前記測定専用治具(4)を介して接続される前記複数の構成回路(3)を切り替えて前記計測器(6)の測定入力部に出力する入力切替装置(5)と、を備える構成とし、
前記パーソナルコンピュータ(7)は、予め、複数の異なる誘電正接の電解コンデンサ(2s)について単体で測定した誘電正接(tanδs)と前記複数の構成回路(3)に装着して前記計測器(6)で測定した誘電正接(tanδsm)に基づいて、前記単体での誘電正接(tanδs)とそれぞれの前記構成回路(3)に搭載された状態での誘電正接(tanδsm)との相関関係から推定式を前記構成回路(3)毎にそれぞれ求めて記憶し、
前記計測器(6)は、前記入力切替装置(5)からの信号に基づいて前記構成回路(3)に搭載された状態での前記被診断電解コンデンサ(2)の静電正接(tanδm)を測定し、
前記パーソナルコンピュータ(7)は、前記計測器(6)で測定した前記被診断電解コンデンサ(2)の誘電正接(tanδm)と測定時の前記構成回路(3)を特定する情報から前記被診断電解コンデンサ(2)単体時の誘電正接(tanδ)を前記推定式に基づいて推定し、前記劣化判定値と比較することにより劣化度を診断することを特徴とする電解コンデンサ劣化診断システム。
A control device (1) comprising a plurality of constituent circuits (3) having a diagnostic electrolytic capacitor (2);
A measuring instrument (6) for measuring the dielectric loss tangent (tan δ) of the diagnostic electrolytic capacitor (2);
The deterioration determination value of the dielectric loss tangent (tan δ) of the diagnostic electrolytic capacitor (2) is stored, and the deterioration degree is determined by comparing the dielectric loss tangent (tan δ) of the diagnostic electrolytic capacitor (2) with the deterioration determination value. A personal computer (7);
In the electrolytic capacitor degradation diagnosis system with
The controller (1) has an output unit (15) for measuring a dielectric loss tangent (tan δ) of the diagnostic electrolytic capacitor (2) included in the plurality of constituent circuits (3),
A measurement-dedicated jig (4) connected to the output unit (15) at the time of dielectric loss tangent (tan δ) measurement of the diagnostic electrolytic capacitor (2);
An input switching device (5) for switching the plurality of component circuits (3) connected via the measurement-dedicated jig (4) and outputting the result to the measurement input unit of the measuring instrument (6). ,
The personal computer (7) is mounted in advance on the measuring device (6) by attaching a dielectric tangent (tan δs) measured separately for a plurality of electrolytic capacitors (2s) having different dielectric tangents and the plurality of constituent circuits (3). Based on the dielectric loss tangent (tan δsm) measured in Step 1, an estimation equation is obtained from the correlation between the dielectric tangent (tan δs) of the single unit and the dielectric loss tangent (tan δsm) mounted on each of the component circuits (3). Each of the constituent circuits (3) is obtained and stored,
The measuring instrument (6) determines an electrostatic tangent (tan δm) of the diagnostic electrolytic capacitor (2) in a state of being mounted on the component circuit (3) based on a signal from the input switching device (5). Measure and
The personal computer (7) uses the dielectric tangent (tan δm) of the electrolytic capacitor to be diagnosed (2) measured by the measuring instrument (6) and the information to specify the component circuit (3) at the time of measurement. An electrolytic capacitor deterioration diagnosis system characterized by diagnosing the degree of deterioration by estimating a dielectric loss tangent (tan δ) of a capacitor (2) alone based on the estimation formula and comparing it with the deterioration determination value.
前記パーソナルコンピュータ(7)は、
前記入力切替回路(5)に対して前記測定器(6)へ出力する前記構成回路(3)を選択する動作と、
前記測定器(6)に誘電正接の測定開始及び終了の指示および選択した前記構成回路(3)と誘電正接測定値から成るデータを送信する指令を行い前記データを記憶する動作と、
前記データと前記推定式に基づいて前記被診断電解コンデンサ(2)単体時の誘電正接(tanδ)を推定し、前記劣化判定値と比較して劣化判定する動作と、を自動的に前記構成回路(3)の数だけ実行するプログラム(22)を備えたことを特徴とする請求項1に記載の電解コンデンサ劣化診断システム。
The personal computer (7)
Selecting the component circuit (3) to be output to the measuring instrument (6) with respect to the input switching circuit (5);
An operation for instructing the measuring device (6) to start and end measurement of dielectric loss tangent, and a command to transmit data comprising the selected component circuit (3) and dielectric loss tangent measurement value, and storing the data;
An operation of estimating a dielectric loss tangent (tan δ) when the diagnostic electrolytic capacitor (2) is single based on the data and the estimation formula, and determining deterioration by comparing with the deterioration determination value is automatically performed in the component circuit. The electrolytic capacitor deterioration diagnosis system according to claim 1, further comprising a program (22) for executing the number of (3).
各仕様の電解コンデンサについて単体での誘電正接(tanδ)の劣化判定値を記憶し、
被診断電解コンデンサ(2)の誘電正接(tanδ)と前記劣化判定値を比較して劣化度を判定する手順を備え、
前記被診断電解コンデンサ(2)を有する複数の構成回路(3)を備えた制御装置(1)における電解コンデンサ劣化診断方法において、
予め、複数の異なる誘電正接の電解コンデンサ(2s)をサンプルとして用い単体で第1の誘電正接(tanδs)を測定するステップ(ST1)と、
予め、前記複数の異なる誘電正接の電解コンデンサ(2s)を前記構成回路(3)に装着した状態で第2の誘電正接(tanδsm)を測定するステップ(ST2)と、
予め、全ての前記構成回路(3)について、前記第1の誘電正接(tanδs)と前記第2の誘電正接(tanδsm)との相関関係から推定式を求めて記憶するステップ(ST3)と、
前記被診断電解コンデンサ(2)の誘電正接(tanδm)を前記構成回路(3)に装着されたままの状態で測定するステップ(ST4)と、
測定した前記被診断電解コンデンサ(2)の誘電正接(tanδm)および測定時の前記構成回路(3)を特定する情報から前記被診断電解コンデンサ(2)単体時の誘電正接(tanδ)を前記推定式に基づいて推定するステップ(ST5)と、
推定した前記被診断電解コンデンサ(2)単体時の誘電正接(tanδ)と前記劣化判定値と比較することにより劣化度を診断するステップ(ST6)と、を備えたことを特徴とする電解コンデンサ劣化診断方法。
Stores the degradation judgment value of dielectric tangent (tan δ) for each specification electrolytic capacitor alone,
A procedure for determining the degree of deterioration by comparing the dielectric loss tangent (tan δ) of the electrolytic capacitor to be diagnosed (2) and the deterioration determination value;
In the electrolytic capacitor deterioration diagnosis method in the control device (1) including a plurality of constituent circuits (3) having the electrolytic capacitor to be diagnosed (2),
Measuring a first dielectric loss tangent (tan δs) alone using a plurality of electrolytic capacitors (2s) having different dielectric loss tangents as a sample in advance (ST1);
Measuring a second dielectric loss tangent (tan δsm) in a state where the plurality of different dielectric loss tangent electrolytic capacitors (2s) are mounted on the component circuit (3) in advance (ST2);
For all the constituent circuits (3), a step (ST3) for obtaining and storing an estimation formula from the correlation between the first dielectric loss tangent (tan δs) and the second dielectric loss tangent (tan δsm);
Measuring the dielectric loss tangent (tan δm) of the diagnostic electrolytic capacitor (2) while being attached to the component circuit (3) (ST4);
From the measured dielectric loss tangent (tan δm) of the electrolytic capacitor to be diagnosed (2) and the information specifying the component circuit (3) at the time of measurement, the dielectric loss tangent (tan δ) of the diagnostic electrolytic capacitor (2) alone is estimated. Estimating based on the equation (ST5);
A step (ST6) of diagnosing the degree of deterioration by comparing the estimated dielectric loss tangent (tan δ) when the electrolytic capacitor to be diagnosed (2) alone and the deterioration determination value (ST6). Diagnosis method.
前記被診断電解コンデンサ(2)の誘電正接(tanδm)を前記構成回路(3)に装着されたままの状態で測定する前記ステップ(ST4)、測定した前記被診断電解コンデンサ(2)の誘電正接(tanδm)および測定時の前記構成回路(3)を特定する情報から前記被診断電解コンデンサ(2)単体時の誘電正接(tanδ)を前記推定式に基づいて推定する前記ステップ(ST5)、推定した前記被診断電解コンデンサ(2)単体時の誘電正接(tanδ)と前記劣化判定値と比較することにより劣化度を診断する前記ステップ(ST6)、を予め定めた順番に従って、前記被診断電解コンデンサ(2)を搭載した前記構成回路(3)の数だけ自動的に繰り返すステップを有することを特徴とする請求項3に記載の電解コンデンサ劣化診断方法。   The step (ST4) of measuring the dielectric loss tangent (tan δm) of the diagnostic electrolytic capacitor (2) while attached to the component circuit (3), and the measured dielectric loss tangent of the diagnostic electrolytic capacitor (2) Step (ST5) for estimating a dielectric loss tangent (tan δ) when the diagnostic electrolytic capacitor (2) is single from the information for specifying (tan δm) and the constituent circuit (3) at the time of measurement, and estimation The step of diagnosing the degree of deterioration by comparing the dielectric loss tangent (tan δ) when the electrolytic capacitor to be diagnosed (2) alone and the deterioration determination value (ST6) according to a predetermined order 4. The electrolytic capacitor inferiority according to claim 3, further comprising the step of automatically repeating the number of the component circuits (3) having (2) mounted thereon. Diagnostic methods.
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103180744A (en) * 2012-10-17 2013-06-26 华为技术有限公司 Method, apparatus and circuit for detecting super capacitor
EP2637030A1 (en) * 2012-03-05 2013-09-11 ebm-papst Mulfingen GmbH & Co. KG Method for life-cycle monitoring of an electrolyte condenser and device with a monitored electrolyte condenser
CN106841822A (en) * 2017-04-13 2017-06-13 山东汇能电气有限公司 Power capacitor running status on-line monitoring method based on dielectric dissipation factor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2637030A1 (en) * 2012-03-05 2013-09-11 ebm-papst Mulfingen GmbH & Co. KG Method for life-cycle monitoring of an electrolyte condenser and device with a monitored electrolyte condenser
CN103180744A (en) * 2012-10-17 2013-06-26 华为技术有限公司 Method, apparatus and circuit for detecting super capacitor
CN103180744B (en) * 2012-10-17 2015-07-08 华为技术有限公司 Method, apparatus and circuit for detecting super capacitor
CN106841822A (en) * 2017-04-13 2017-06-13 山东汇能电气有限公司 Power capacitor running status on-line monitoring method based on dielectric dissipation factor

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