JP2008217885A - Method and apparatus for positioning photodetector substrate for optical pickup - Google Patents

Method and apparatus for positioning photodetector substrate for optical pickup Download PDF

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JP2008217885A
JP2008217885A JP2007052723A JP2007052723A JP2008217885A JP 2008217885 A JP2008217885 A JP 2008217885A JP 2007052723 A JP2007052723 A JP 2007052723A JP 2007052723 A JP2007052723 A JP 2007052723A JP 2008217885 A JP2008217885 A JP 2008217885A
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disturbance
objective lens
signal
receiving element
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Hiroshi Kutsukake
浩 沓掛
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Hioki EE Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To perform focus adjustment (positioning of a photodetector substrate in the direction of an optical axis with respect to an objective lens) on the focus condition that the RF signal of an optical pickup is maximized. <P>SOLUTION: This apparatus is provided with a bias voltage application circuit 21 which applies a predetermined focus bias voltage to the focus actuator 12 of the objective lens 11, a disturbance signal generation circuit 22 which generates a sinusoidal disturbance signal and superimposes it on the focus bias voltage, a peak-to-peak value detection circuiit 23 which detects the peak-to-peak value of the RF signal outputted from the photodetector substrate 15, and a disturbance component extraction circuit 24 which performs synchronous detection of the output signal with the disturbance signal to extract a disturbance component. Thus, the photodetector substrate 15 is positioned in the direction of the optical axis with respect to the objective lens 11 so that the added value of respective positive and negative amplitude values of the disturbance component may become almost zero. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、光ピックアップにおける受光素子基板の位置調整方法およびその装置に関するもので、さらに詳しく言えば、光ピックアップの組み立て後において対物レンズに対する受光素子基板の位置を調整する技術に関する。   The present invention relates to a method and apparatus for adjusting the position of a light receiving element substrate in an optical pickup, and more particularly to a technique for adjusting the position of a light receiving element substrate with respect to an objective lens after assembly of the optical pickup.

光ピックアップは、レーザー光源,そのレーザー光源をハーフミラーを介して光ディスクに向けて照射する対物レンズ,光ディスクからの反射光を対物レンズおよびハーフミラーを介して受光する受光素子基板および対物レンズを駆動するフォーカスアクチュエータなどを基本的な構成部品として備え、その組み立て後に各種の調整が行われる。   The optical pickup drives a laser light source, an objective lens that irradiates the laser light source toward the optical disc through a half mirror, a light receiving element substrate that receives reflected light from the optical disc through the objective lens and the half mirror, and an objective lens. A focus actuator or the like is provided as a basic component, and various adjustments are made after the assembly.

その調整項目のひとつとして、対物レンズに対する光軸方向での受光素子基板の位置調整がある。従来、この位置調整には例えば特許文献1に記載されているジッター特性評価方法が適用され、その一例を図5および図6により説明する。   One of the adjustment items is the position adjustment of the light receiving element substrate in the optical axis direction with respect to the objective lens. Conventionally, for this position adjustment, for example, a jitter characteristic evaluation method described in Patent Document 1 is applied, and an example thereof will be described with reference to FIGS.

この位置調整時には、フォーカスサーボ制御系をオフとして、図示しないバイアス電圧印加回路から所定のフォーカスバイアス電圧Vaを出力させ、このフォーカスバイアス電圧Vaに外乱信号発生回路6から正弦波の外乱信号を重畳させてフォーカスアクチュエータ1に印加する。   During this position adjustment, the focus servo control system is turned off, a predetermined focus bias voltage Va is output from a bias voltage application circuit (not shown), and a sine wave disturbance signal is superimposed on the focus bias voltage Va from the disturbance signal generation circuit 6. Applied to the focus actuator 1.

これにより、光学系2に含まれている図示しない対物レンズがフォーカスバイアス電圧Vaに対応する位置を基準として外乱信号の振幅に応じて光軸方向に振動した状態で、光ディスクDからの反射光が光学系2に含まれている図示しないフォトダイオードなどからなる受光素子基板にて検出され、情報再生信号(RF信号)として出力される。   As a result, the reflected light from the optical disk D is reflected in a state where an objective lens (not shown) included in the optical system 2 vibrates in the optical axis direction according to the amplitude of the disturbance signal with reference to the position corresponding to the focus bias voltage Va. It is detected by a light receiving element substrate including a photodiode (not shown) included in the optical system 2 and is output as an information reproduction signal (RF signal).

この情報再生信号がジッターメータ3に入力されるが、情報再生信号は外乱信号により変動しているため、それに追随してジッターメータ3から出力されるジッター値も変動する。   This information reproduction signal is input to the jitter meter 3. Since the information reproduction signal varies due to the disturbance signal, the jitter value output from the jitter meter 3 also varies accordingly.

そこで、次段の外乱成分抽出回路(同期検波回路)4にて、ジッターメータ3の出力信号から外乱信号と同じ周波数成分を含む信号を抽出(検波)して、フォーカス特性検出回路5に与える。   Therefore, a disturbance component extraction circuit (synchronous detection circuit) 4 at the next stage extracts (detects) a signal including the same frequency component as the disturbance signal from the output signal of the jitter meter 3 and gives it to the focus characteristic detection circuit 5.

フォーカス特性検出回路5では、図6(a)に示すように、外乱信号の一方のピークでのジッター量aと他方のピークでのジッター量bとを検出し、図6(b)に示すように、ジッター量が最小(a=b)となるようなフォーカスバイアス電圧Vbをフォーカス調整信号として出力する。   As shown in FIG. 6A, the focus characteristic detection circuit 5 detects the jitter amount a at one peak and the jitter amount b at the other peak of the disturbance signal, as shown in FIG. 6B. In addition, a focus bias voltage Vb that minimizes the jitter amount (a = b) is output as a focus adjustment signal.

上記受光素子基板の位置調整工程では、上記フォーカス調整信号がゼロになるように、対物レンズに対する光軸方向での受光素子基板の位置を調整する。これにより、外乱に対するジッター値のフォーカス特性が最良となる。   In the light receiving element substrate position adjusting step, the position of the light receiving element substrate in the optical axis direction with respect to the objective lens is adjusted so that the focus adjustment signal becomes zero. Thereby, the focus characteristic of the jitter value with respect to the disturbance becomes the best.

特開2003−99960号公報Japanese Patent Laid-Open No. 2003-99960

しかしながら、光ピックアップの出力信号(RF信号)が最大となるフォーカス条件と、ジッター値が最良になるフォーカス条件とが異なる場合があるため、RF信号が最大となるフォーカス条件でフォーカス調整を行いたい場合には、上記従来技術では対応することができない。   However, the focus condition that maximizes the output signal (RF signal) of the optical pickup may be different from the focus condition that yields the best jitter value, so focus adjustment should be performed under the focus condition that maximizes the RF signal. Cannot be handled by the above-mentioned conventional technology.

したがって、本発明の課題は、光ピックアップのRF信号が最大となるフォーカス条件でフォーカス調整(対物レンズに対する光軸方向での受光素子基板の位置調整)が行えるようにすることにある。   Accordingly, an object of the present invention is to enable focus adjustment (position adjustment of the light receiving element substrate in the optical axis direction with respect to the objective lens) under a focus condition that maximizes the RF signal of the optical pickup.

上記課題を解決するため、請求項1に記載の発明は、光源からの光を光ディスクに向けて照射する対物レンズと、上記光ディスクからの反射光を上記対物レンズを介して受光する受光素子基板と、上記対物レンズを上記光ディスクに対して接近離反する方向に駆動するフォーカスアクチュエータとを含む光ピックアップにおける受光素子基板の位置調整方法において、上記フォーカスアクチュエータに所定のフォーカスバイアス電圧を印加するバイアス電圧印加回路と、ゼロ点を中心として正負方向に同振幅で振れる所定周波数の外乱信号を発生させて上記フォーカスバイアス電圧に重畳する外乱信号発生回路と、上記受光素子基板より出力される情報再生信号のピーク・トゥ・ピーク値を検出するピーク・トゥ・ピーク値検出回路と、上記ピーク・トゥ・ピーク値検出回路の出力信号を上記外乱信号で同期検波して外乱成分を抽出する外乱成分抽出回路とを備え、上記外乱成分抽出回路により抽出された外乱成分の正負の各振幅値の加算値がほぼゼロとなるように、上記対物レンズに対する上記受光素子基板の光軸方向の位置を調整することを特徴としている。   In order to solve the above-mentioned problems, an invention according to claim 1 includes an objective lens that irradiates light from a light source toward an optical disc, and a light-receiving element substrate that receives reflected light from the optical disc via the objective lens. A bias voltage application circuit for applying a predetermined focus bias voltage to the focus actuator in a method of adjusting the position of a light receiving element substrate in an optical pickup including a focus actuator that drives the objective lens in a direction in which the objective lens approaches and moves away from the optical disk A disturbance signal generation circuit for generating a disturbance signal having a predetermined frequency that swings in the positive and negative directions with the same amplitude around the zero point and superimposing it on the focus bias voltage, and a peak of the information reproduction signal output from the light receiving element substrate A peak-to-peak value detection circuit for detecting a to-peak value, and the above A disturbance component extraction circuit for synchronously detecting the output signal of the peak-to-peak value detection circuit with the disturbance signal and extracting the disturbance component, and each positive and negative amplitude of the disturbance component extracted by the disturbance component extraction circuit The position in the optical axis direction of the light receiving element substrate with respect to the objective lens is adjusted so that an added value of the values becomes substantially zero.

また、請求項2に記載の発明は、光源からの光を光ディスクに向けて照射する対物レンズと、上記光ディスクからの反射光を上記対物レンズを介して受光する受光素子基板と、上記対物レンズを上記光ディスクに対して接近離反する方向に駆動するフォーカスアクチュエータとを含む光ピックアップにおける受光素子基板の位置調整装置において、上記フォーカスアクチュエータに所定のフォーカスバイアス電圧を印加するバイアス電圧印加回路と、ゼロ点を中心として正負方向に同振幅で振れる所定周波数の外乱信号を発生させて上記フォーカスバイアス電圧に重畳する外乱信号発生回路と、上記受光素子基板より出力される情報再生信号のピーク・トゥ・ピーク値を検出するピーク・トゥ・ピーク値検出回路と、上記ピーク・トゥ・ピーク値検出回路の出力信号を上記外乱信号で同期検波して外乱成分を抽出する外乱成分抽出回路と、上記対物レンズに対する上記受光素子基板の光軸方向の位置を調整する基板位置調整手段と、少なくとも上記基板位置調整手段を制御する制御手段とを備え、上記制御手段は、上記外乱成分抽出回路により抽出された外乱成分の正負の各振幅値の加算値がほぼゼロとなるように、上記基板位置調整手段を介して上記対物レンズに対する上記受光素子基板の光軸方向の位置を調整することを特徴としている。   According to a second aspect of the present invention, there is provided an objective lens that irradiates light from a light source toward the optical disc, a light receiving element substrate that receives reflected light from the optical disc via the objective lens, and the objective lens. An apparatus for adjusting a position of a light receiving element substrate in an optical pickup including a focus actuator driven in a direction approaching and moving away from the optical disc, a bias voltage applying circuit for applying a predetermined focus bias voltage to the focus actuator, and a zero point A disturbance signal generation circuit that generates a disturbance signal having a predetermined frequency swinging with the same amplitude in the positive and negative directions as a center and superimposes it on the focus bias voltage, and a peak-to-peak value of an information reproduction signal output from the light receiving element substrate Detecting peak-to-peak value detection circuit and the above peak-to-peak value A disturbance component extraction circuit that synchronously detects an output signal of the value detection circuit with the disturbance signal and extracts a disturbance component; a substrate position adjustment unit that adjusts the position of the light receiving element substrate with respect to the objective lens in the optical axis direction; Control means for controlling the substrate position adjusting means, wherein the control means is arranged such that the sum of positive and negative amplitude values of the disturbance component extracted by the disturbance component extraction circuit is substantially zero. The position of the light receiving element substrate in the optical axis direction with respect to the objective lens is adjusted via an adjusting means.

本発明によれば、受光素子基板より出力される情報再生信号のピーク・トゥ・ピーク値を検出するとともに、そのピーク・トゥ・ピーク出力を外乱信号で検波して外乱成分を抽出し、その外乱成分の正負の各振幅値の加算値がほぼゼロとなるように、対物レンズに対する受光素子基板の光軸方向の位置を調整することにより、光ピックアップの情報再生信号(出力信号;RF信号)が最大となるフォーカス条件でフォーカス調整を行うことができる。   According to the present invention, the peak-to-peak value of the information reproduction signal output from the light-receiving element substrate is detected, the peak-to-peak output is detected by the disturbance signal, and the disturbance component is extracted, and the disturbance is extracted. An information reproduction signal (output signal; RF signal) of the optical pickup is adjusted by adjusting the position of the light receiving element substrate in the optical axis direction with respect to the objective lens so that the added value of the positive and negative amplitude values of the components becomes substantially zero. Focus adjustment can be performed under the maximum focus condition.

次に、図1ないし図4により、本発明の実施形態について説明する。図1は本発明の光ピックアップにおける受光素子基板の位置調整装置の構成を示す模式図、図2は図1の(a)〜(e)の部分に現れる信号波形を示す波形図、図3a,図3bはフォーカス調整が完全でないときの図1の(d)(e)に現れる信号波形を示す波形図、図4は情報再生信号(RF信号)と外乱信号との関係を示すチャートである。   Next, an embodiment of the present invention will be described with reference to FIGS. FIG. 1 is a schematic diagram showing the configuration of a position adjusting device for a light receiving element substrate in an optical pickup of the present invention, FIG. 2 is a waveform diagram showing signal waveforms appearing in the parts (a) to (e) of FIG. 3B is a waveform diagram showing signal waveforms appearing in FIGS. 1D and 1E when the focus adjustment is not complete, and FIG. 4 is a chart showing the relationship between the information reproduction signal (RF signal) and the disturbance signal.

図1を参照して、まず、光ピックアップ10の構成を概略的に説明する。光ピックアップ10は、基本的な構成として、スピンドルモータMにて回転駆動される光ディスクMの情報記録面に対して光軸をほぼ垂直として配置される対物レンズ11と、レーザー光源13と、受光素子基板15とを備えている。   With reference to FIG. 1, first, the configuration of the optical pickup 10 will be schematically described. The optical pickup 10 basically has an objective lens 11 arranged with the optical axis substantially perpendicular to the information recording surface of the optical disk M that is rotationally driven by a spindle motor M, a laser light source 13, and a light receiving element. And a substrate 15.

対物レンズ11は、フォーカスアクチュエータ12により光軸方向に駆動される。なお、トラッキングアクチュエータは図示を省略している。レーザー光源13から出射された光は、ハーフミラー14および対物レンズ11を通りレーザービームとして光ディスクMの情報記録面に照射される。   The objective lens 11 is driven in the optical axis direction by the focus actuator 12. The tracking actuator is not shown. The light emitted from the laser light source 13 passes through the half mirror 14 and the objective lens 11 and is irradiated onto the information recording surface of the optical disc M as a laser beam.

受光素子基板15は、対物レンズ11の光軸上に配置され、光ディスクMの情報記録面からの反射光を対物レンズ11およびハーフミラー14を介して受光する。受光素子基板15には、例えば4分割方式のフォトダイオードアレイ基板が用いられる。   The light receiving element substrate 15 is disposed on the optical axis of the objective lens 11 and receives the reflected light from the information recording surface of the optical disc M via the objective lens 11 and the half mirror 14. For the light receiving element substrate 15, for example, a quadrant type photodiode array substrate is used.

光ピックアップ10の組立後に各種の調整が行われる。受光素子基板15については、光軸と直交するX−Y方向の調整と、光軸に沿ったZ軸方向の調整とが行われるが、本発明の受光素子基板の位置調整装置20はZ軸方向の調整に適用される。   Various adjustments are made after the optical pickup 10 is assembled. The light receiving element substrate 15 is adjusted in the XY direction orthogonal to the optical axis and in the Z axis direction along the optical axis. Applies to direction adjustment.

本発明の受光素子基板の位置調整装置20は、フォーカスアクチュエータ12を駆動するため、バイアス電圧印加回路21と外乱信号発生回路22とを備えている。なお、この位置調整は、フォーカスサーボ制御系をオフとした状態で行われる。   The light receiving element substrate position adjusting device 20 of the present invention includes a bias voltage applying circuit 21 and a disturbance signal generating circuit 22 for driving the focus actuator 12. This position adjustment is performed with the focus servo control system turned off.

また、受光素子基板15は、基板位置調整手段26によりそのZ軸方向の位置が調整される。この例において、基板位置調整手段26は、受光素子基板15を支持する治具261と、治具261をZ軸方向に微動させる送りねじ軸を有するステッピングモータ262とから構成されている。   Further, the position of the light receiving element substrate 15 in the Z-axis direction is adjusted by the substrate position adjusting means 26. In this example, the substrate position adjusting means 26 includes a jig 261 that supports the light receiving element substrate 15 and a stepping motor 262 having a feed screw shaft that finely moves the jig 261 in the Z-axis direction.

バイアス電圧印加回路21は、所定のフォーカスバイアス電圧(直流電圧)を出力する。外乱信号発生回路22は、図2(a)に示すようなゼロ点を中心として正負方向に同振幅で振れる所定周波数の外乱信号(正弦波)を出力する。以下、図2(a)の(a)を採って外乱信号(a)とする。   The bias voltage application circuit 21 outputs a predetermined focus bias voltage (DC voltage). The disturbance signal generation circuit 22 outputs a disturbance signal (sine wave) having a predetermined frequency that swings in the positive and negative directions with the same amplitude around the zero point as shown in FIG. Hereinafter, (a) in FIG. 2 (a) is taken as a disturbance signal (a).

フォーカスアクチュエータ12には、フォーカスバイアス電圧Vbに外乱信号(a)が重畳された駆動信号が印加され、これにより、対物レンズ11は、フォーカスバイアス電圧に対応する位置を基準として外乱信号(a)の振幅に応じて光軸方向に振動する。   A drive signal in which the disturbance signal (a) is superimposed on the focus bias voltage Vb is applied to the focus actuator 12, whereby the objective lens 11 outputs the disturbance signal (a) with reference to the position corresponding to the focus bias voltage. It vibrates in the optical axis direction according to the amplitude.

受光素子基板15は、光ディスクMの情報記録面からの反射光を受光し、それに含まれている情報再生信号(RF信号)を出力する。このRF信号は、外乱信号(a)の影響を受けて図2(b)に示すように変動している。   The light receiving element substrate 15 receives reflected light from the information recording surface of the optical disc M, and outputs an information reproduction signal (RF signal) contained therein. This RF signal fluctuates as shown in FIG. 2B due to the influence of the disturbance signal (a).

本発明では、受光素子基板15から出力されるRF信号がピーク・トゥ・ピーク値検出回路23に入力される。ピーク・トゥ・ピーク値検出回路23では、RF信号のピーク・トゥ・ピーク値を検出する。このピーク・トゥ・ピーク値信号も、外乱信号(a)の影響を受けて図2(c)に示すように変動している。   In the present invention, the RF signal output from the light receiving element substrate 15 is input to the peak-to-peak value detection circuit 23. The peak-to-peak value detection circuit 23 detects the peak-to-peak value of the RF signal. This peak-to-peak value signal also varies as shown in FIG. 2C due to the influence of the disturbance signal (a).

ピーク・トゥ・ピーク値検出回路23で検出されたピーク・トゥ・ピーク値信号は、次段の外乱成分抽出回路24に入力される。外乱成分抽出回路24では、ピーク・トゥ・ピーク値信号から外乱信号(a)と同じ周波数成分の外乱成分(変動成分)を抽出する。すなわち、ピーク・トゥ・ピーク値信号を外乱信号(a)にて同期検波して外乱成分を抽出する。   The peak-to-peak value signal detected by the peak-to-peak value detection circuit 23 is input to the disturbance component extraction circuit 24 at the next stage. The disturbance component extraction circuit 24 extracts a disturbance component (variation component) having the same frequency component as the disturbance signal (a) from the peak-to-peak value signal. That is, the disturbance component is extracted by synchronously detecting the peak-to-peak value signal with the disturbance signal (a).

外乱成分抽出回路24にて抽出された外乱成分は、次段の制御手段25に入力される。制御手段25には、例えばCPUやマイクロコンピュータなどが用いられてよい。   The disturbance component extracted by the disturbance component extraction circuit 24 is input to the control means 25 at the next stage. For the control means 25, for example, a CPU or a microcomputer may be used.

外乱成分は、図2(d)に示すように、外乱信号(a)と同じく正弦波であるため、レーザービームの焦点が光ディスクの情報記録面に存在し、フォーカス調整がうまくとれていれば、外乱成分の正の部分V(+)と負の部分V(−)は同一の電気量となり、その加算値は図2(e)に示すようにゼロ出力となる。   As shown in FIG. 2 (d), the disturbance component is a sine wave as with the disturbance signal (a). Therefore, if the focal point of the laser beam exists on the information recording surface of the optical disk, and the focus adjustment is successful, The positive part V (+) and the negative part V (−) of the disturbance component have the same amount of electricity, and the added value is zero output as shown in FIG.

これに対して、レーザービームの焦点が光ディスクの情報記録面に存在していない場合には、図3a,図3bに示すように、V(+)−V(−)>0もしくはV(+)−V(−)<0となり、図2(e)に示すようなゼロ出力とはならない。   On the other hand, when the focal point of the laser beam does not exist on the information recording surface of the optical disk, as shown in FIGS. 3a and 3b, V (+) − V (−)> 0 or V (+) −V (−) <0, and the zero output as shown in FIG.

そこで、制御手段25は、外乱成分に含まれているV(+)とV(−)とが等しくなるようにフォーカス調整信号を出力するが、本発明では、そのフォーカス調整信号をバイアス電圧印加回路21に対してではなく、基板位置調整手段26に出力して、受光素子基板15のZ軸方向の位置を調整する。   Therefore, the control unit 25 outputs a focus adjustment signal so that V (+) and V (−) included in the disturbance component are equal. In the present invention, the focus adjustment signal is output to the bias voltage application circuit. Output to the substrate position adjusting means 26 instead of 21 to adjust the position of the light receiving element substrate 15 in the Z-axis direction.

これにより、図4に示すように、光ピックアップ10のRF信号(出力信号)が最大となるフォーカス条件でフォーカス調整を行うことができる。なお、図5,図6で説明したジッター値を利用する方法と、本発明による出力電圧を利用した方法を組み合わせて搭載してもよい。   As a result, as shown in FIG. 4, focus adjustment can be performed under a focus condition that maximizes the RF signal (output signal) of the optical pickup 10. The method using the jitter value described in FIGS. 5 and 6 and the method using the output voltage according to the present invention may be combined and mounted.

本発明の光ピックアップにおける受光素子基板の位置調整装置の構成を示す模式図。The schematic diagram which shows the structure of the position adjustment apparatus of the light receiving element board | substrate in the optical pick-up of this invention. 図1の(a)〜(e)の部分に現れる信号波形を示す波形図。The wave form diagram which shows the signal waveform which appears in the part of (a)-(e) of FIG. フォーカス調整が完全でないときの図1の(d)(e)に現れる信号波形を示す波形図。The wave form diagram which shows the signal waveform which appears in (d) and (e) of Drawing 1 when focus adjustment is not perfect. フォーカス調整が完全でないときの図1の(d)(e)に現れる信号波形を示す波形図。The wave form diagram which shows the signal waveform which appears in (d) and (e) of Drawing 1 when focus adjustment is not perfect. 本発明の実施形態での情報再生信号(RF信号)と外乱信号との関係を示すチャート。The chart which shows the relationship between the information reproduction signal (RF signal) and disturbance signal in embodiment of this invention. ジッター特性評価方法による従来例を示すブロック図。The block diagram which shows the prior art example by the jitter characteristic evaluation method. 上記従来例でのジッター量と外乱信号との関係を示すチャート。The chart which shows the relationship between the jitter amount in the said prior art example, and a disturbance signal.

符号の説明Explanation of symbols

10 光ピックアップ
11 対物レンズ
12 フォーカスアクチュエータ
13 レーザー光源
15 受光素子基板
20 受光素子基板の位置調整装置
21 バイアス電圧印加回路
22 外乱信号発生回路
23 ピーク・トゥ・ピーク値検出回路
24 外乱成分抽出回路
25 制御手段
26 基板位置調整手段
DESCRIPTION OF SYMBOLS 10 Optical pick-up 11 Objective lens 12 Focus actuator 13 Laser light source 15 Light receiving element board | substrate 20 Position adjusting apparatus 21 of a light receiving element board | substrate 21 Bias voltage application circuit 22 Disturbance signal generation circuit 23 Peak-to-peak value detection circuit 24 Disturbance component extraction circuit 25 Control Means 26 Substrate position adjusting means

Claims (2)

光源からの光を光ディスクに向けて照射する対物レンズと、上記光ディスクからの反射光を上記対物レンズを介して受光する受光素子基板と、上記対物レンズを上記光ディスクに対して接近離反する方向に駆動するフォーカスアクチュエータとを含む光ピックアップにおける受光素子基板の位置調整方法において、
上記フォーカスアクチュエータに所定のフォーカスバイアス電圧を印加するバイアス電圧印加回路と、ゼロ点を中心として正負方向に同振幅で振れる所定周波数の外乱信号を発生させて上記フォーカスバイアス電圧に重畳する外乱信号発生回路と、上記受光素子基板より出力される情報再生信号のピーク・トゥ・ピーク値を検出するピーク・トゥ・ピーク値検出回路と、上記ピーク・トゥ・ピーク値検出回路の出力信号を上記外乱信号で同期検波して外乱成分を抽出する外乱成分抽出回路とを備え、上記外乱成分抽出回路により抽出された外乱成分の正負の各振幅値の加算値がほぼゼロとなるように、上記対物レンズに対する上記受光素子基板の光軸方向の位置を調整することを特徴とする光ピックアップにおける受光素子基板の位置調整方法。
An objective lens that irradiates light from a light source toward the optical disc, a light receiving element substrate that receives reflected light from the optical disc through the objective lens, and the objective lens is driven in a direction approaching and separating from the optical disc. In a method for adjusting the position of a light receiving element substrate in an optical pickup including a focus actuator
A bias voltage application circuit that applies a predetermined focus bias voltage to the focus actuator, and a disturbance signal generation circuit that generates a disturbance signal having a predetermined frequency that swings in the positive and negative directions with the same amplitude around the zero point and superimposes it on the focus bias voltage A peak-to-peak value detection circuit for detecting a peak-to-peak value of an information reproduction signal output from the light receiving element substrate, and an output signal of the peak-to-peak value detection circuit as the disturbance signal A disturbance component extraction circuit that extracts a disturbance component by synchronous detection, and the sum of positive and negative amplitude values of the disturbance component extracted by the disturbance component extraction circuit is substantially zero. Adjusting the position of the light receiving element substrate in an optical pickup, wherein the position of the light receiving element substrate in the optical axis direction is adjusted .
光源からの光を光ディスクに向けて照射する対物レンズと、上記光ディスクからの反射光を上記対物レンズを介して受光する受光素子基板と、上記対物レンズを上記光ディスクに対して接近離反する方向に駆動するフォーカスアクチュエータとを含む光ピックアップにおける受光素子基板の位置調整装置において、
上記フォーカスアクチュエータに所定のフォーカスバイアス電圧を印加するバイアス電圧印加回路と、ゼロ点を中心として正負方向に同振幅で振れる所定周波数の外乱信号を発生させて上記フォーカスバイアス電圧に重畳する外乱信号発生回路と、上記受光素子基板より出力される情報再生信号のピーク・トゥ・ピーク値を検出するピーク・トゥ・ピーク値検出回路と、上記ピーク・トゥ・ピーク値検出回路の出力信号を上記外乱信号で同期検波して外乱成分を抽出する外乱成分抽出回路と、上記対物レンズに対する上記受光素子基板の光軸方向の位置を調整する基板位置調整手段と、少なくとも上記基板位置調整手段を制御する制御手段とを備え、
上記制御手段は、上記外乱成分抽出回路により抽出された外乱成分の正負の各振幅値の加算値がほぼゼロとなるように、上記基板位置調整手段を介して上記対物レンズに対する上記受光素子基板の光軸方向の位置を調整することを特徴とする光ピックアップにおける受光素子基板の位置調整装置。
An objective lens that irradiates light from a light source toward the optical disc, a light receiving element substrate that receives reflected light from the optical disc through the objective lens, and the objective lens is driven in a direction approaching and separating from the optical disc. In a position adjustment device for a light receiving element substrate in an optical pickup including a focus actuator
A bias voltage application circuit that applies a predetermined focus bias voltage to the focus actuator, and a disturbance signal generation circuit that generates a disturbance signal having a predetermined frequency that swings in the positive and negative directions with the same amplitude around the zero point and superimposes it on the focus bias voltage A peak-to-peak value detection circuit for detecting a peak-to-peak value of an information reproduction signal output from the light receiving element substrate, and an output signal of the peak-to-peak value detection circuit as the disturbance signal A disturbance component extraction circuit for extracting a disturbance component by synchronous detection, a substrate position adjusting means for adjusting the position of the light receiving element substrate in the optical axis direction relative to the objective lens, and a control means for controlling at least the substrate position adjusting means; With
The control means is configured such that the addition value of the positive and negative amplitude values of the disturbance component extracted by the disturbance component extraction circuit is substantially zero through the substrate position adjustment means to the objective lens with respect to the objective lens. A position adjusting device for a light receiving element substrate in an optical pickup, characterized by adjusting a position in an optical axis direction.
JP2007052723A 2007-03-02 2007-03-02 Method and apparatus for positioning photodetector substrate for optical pickup Pending JP2008217885A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013094244A1 (en) * 2011-12-19 2013-06-27 シャープ株式会社 Method and apparatus for adjusting optical pickup module

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04251444A (en) * 1990-12-30 1992-09-07 Victor Co Of Japan Ltd Focusing device for optical pickup

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04251444A (en) * 1990-12-30 1992-09-07 Victor Co Of Japan Ltd Focusing device for optical pickup

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013094244A1 (en) * 2011-12-19 2013-06-27 シャープ株式会社 Method and apparatus for adjusting optical pickup module

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