JP2008210470A - Device and method for recording and playing back information - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a device for recording and playing back information, capable of accurately estimating the data destruction of a block unit by detecting a smaller defect. <P>SOLUTION: This device for recording and playing back information is provided with a gain adjusting means for entering a signal introduced from an RF signal being recorded to a medium to adjust a gain, a LPF means for processing the output of the gain adjusting means, an envelope detecting means for detecting an envelope wave from the output of the LPF means, a slice level setting means for setting a slice level with respect to the envelope wave detection result, a slicing means for slicing the envelope wave detection result based on the slice level to binarize it, and a control means for detecting a defect from the output of the slicing means and controlling a defect detection related operation based on the defect detection result. The defect detection related operation includes threshold determination processing of a stored information defect level. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to an information recording / reproducing apparatus and an information recording / reproducing method, and more particularly to an information recording / reproducing apparatus and an information recording / reproducing method for recording and reproducing information on a rewritable optical disc.

  2. Description of the Related Art Conventionally, an information recording medium such as an optical disk capable of recording information in a rewritable manner has a mechanism for compensating for a defective portion in recording that has occurred on the medium.

  As is well known, optical discs such as DVDs (digital versatile discs) are now widely used as digital recording media, and high reliability is desired for optical disc apparatuses that reproduce these. In such an optical disc, a storage area is provided on a spiral track, and the track information is included in the address information. In addition, user data can be recorded in the user data area in the track and its surroundings.

  Defects in recording that occur on the disc include so-called defects such as fingerprints, dirt, and scratches. As a mechanism for compensating for this, there is the following technique described in Patent Document 1.

  After normalizing the level of the reproduction RF signal, the high frequency component of the recording data is removed, and full wave rectification is performed to make the plus and minus defects in the same quadrant. Next, from the full-wave rectified signal, the clipping circuit cuts off the noise component and restricts the maximum absolute value of the large defect level. A large defect waveform portion is detected from the full-wave rectified signal, and a defect compensation pulse for compensating and adding the defect time of the large defect is generated. One block integration circuit performs integration for each block with respect to the output of the clipping circuit and the large defect compensation pulse. Then, the presence / absence of an EDC error is estimated from an integrated value of one block on the basis of an EDC (error detection code) error detection level.

  That is, the defect detection result is integrated to provide an error threshold value. As a problem of this conventional technique, although the defect threshold value is defined in the configuration for performing the above-described operation, the threshold value determination method may not be specified, and the following problems occur.

  Depending on the type of detection defect, the detection width and the degree of influence on the recording signal (for example, the degree of influence on the deterioration of the symbol error) differ. For example, as shown in FIG. 2 of Patent Document 1, it can be seen that the detection width of the defect detection result of the envelope detection signal for fingerprint smear varies depending on the defect detection site slice level.

  This is experimentally the most sensitive, that is, the result of slicing at the boundary between the defect signal and the normal envelope detection level (for example, the level shown in FIG. 2a as an example) does not always result in the correct defect detection width. I understand. That is, the degree of the defect, in this case, whether the thickness of the fingerprint stain affects the signal quality or not. In general, a narrow scratch such as a scratch has a greater influence on the pickup head (hereinafter referred to as PUH) control system than its shape, and the signal quality mostly affects more than the scratch width. When these defects are mixed, it is difficult to determine the threshold value. It is also conceivable that the sensitivity difference may occur due to different recording speeds even in the same recording medium. Also, the return optical power differs for each operation of recording laser power control, that is, generally optical power control (hereinafter referred to as OPC) or waveform edge jitter optimization adjustment (hereinafter referred to as strategy adjustment), resulting in different defect sensitivities. That is, Patent Document 1 does not take into account variations in defect detection sensitivity for each medium type and recording condition, and there is a concern that overdetection, omission of detection, and useless verify operation may occur. In addition, since the degree of influence that the effect caused by the type of scratch has on other control axes, for example, the servo control means for controlling the PUH, differs, the scratch width and depth are not necessarily equivalent to data loss. There is a concern that a fatal defect may be missed or an unnecessary verify operation may be performed only with an evaluation criterion such as a predetermined level or a predetermined width in the detection result. Also, the presence or absence of a noise component in the envelope detection result may be different between recording on a so-called blank area and recording on a track with almost data recorded (so-called overwrite recording). This is because, when there is already a pit row on the recording surface, the amount of reflected light differs between the laser irradiation of the recording mark and the laser irradiation of the recording space, so that the disc has a mixture of recorded and unrecorded tracks. When recording information, it is necessary to pay attention to the binarized slice level.

However, Patent Document 1 has a problem that a defect detection threshold value determining means, for example, a specific algorithm is not disclosed.
JP 2006-99863 A (page 9, FIG. 2)

  SUMMARY OF THE INVENTION An object of the present invention is to provide an information recording / reproducing apparatus capable of accurately detecting a block-by-block data failure by detecting a smaller defect.

  In order to solve the above problems, an information recording / reproducing apparatus according to the present invention includes a gain adjusting means for adjusting a gain by inputting a signal derived from an RF signal being recorded on a medium, and an LPF for processing an output of the gain adjusting means. Means, envelope detection means for performing envelope detection from the output of the LPF means, slice level setting means for setting a slice level for the envelope detection result, and slicing and binarizing the envelope detection result by the slice level Slice means and control means for performing defect detection from the output of the slice means and controlling the defect detection related operation according to the defect detection result, the defect detection related operation includes a threshold value determination process for the degree of stored information defect. It is characterized by that.

  According to the present invention, it is possible to accurately estimate a block data failure by detecting a smaller defect.

  Examples of the present invention will be described below.

A first embodiment of the present invention will be described with reference to FIGS. An example of a device that handles DVD + RW will be described.
FIG. 1 is a diagram showing a data structure of one ECC (Error Check Correction) block of DVD + RW. Parity 16 bytes are added to all 172 columns in the vertical direction to form 172 bytes x 192 bytes mainly consisting of user data to form an outer code (hereinafter referred to as PO), and 10 bytes of parity is added to all 208 rows including the horizontal PO rows. In addition, an inner code (hereinafter referred to as PI) is formed. The data structure E1 is sometimes called a so-called product code structure. This 1ECC block is interleaved to form one sector S1 as a 13-row data string. From S2, a total of 16 sectors are formed from one ECC block. As can be seen from the diagram of sector S1, user data in which 12 bytes + 4 bytes = 16 bytes such as parity and ID are omitted from 172 bytes × 12 rows = 2064 bytes is 2K (2048) bytes in one sector.

FIG. 2 is a block diagram showing an embodiment of the present invention and an explanatory diagram of signal transition of defect detection.
As seen mainly in the upper half of the block configuration diagram of FIG. 2A, when recording is performed by irradiating the recording surface with the recording pulse during recording on DVD + RW, recording of the recording pulse on the optical disk OD is performed. Light detecting means 1 for detecting reflected light reflected from the surface, means 2 for amplifying the reflected light, amplifier means 3 for detecting the signal amplitude of the reflected light amplification signal (hereinafter referred to as RF envelope) and LPF ( Low Pass Filter) means 4 and envelope detection means 5, slice means 6 for binarizing the envelope detection signal detected by the envelope detection, and slice level setting means 7 for setting a slice level for the slice means 6. I have. The amplifier means 3 may be replaced with an attenuating means by further increasing the amplification factor of the means 2 for amplifying. The amplifier means and the attenuating means are collectively referred to as gain adjusting means.

  Further, a defect count means 8 that counts a binary slice signal that is an output of the slicing means 6 with an optical disk recording rate reference clock, and a timing generation that generates a predetermined timing based on the recording rate reference clock and the recording data timing signal. Comprehensively the means 9, the latch means 10 for latching the defect count value at the timing generated by the timing generation means 9, the address decoding means 11 for detecting the physical address of the optical disc, and the defect detection operation of the present invention. A control means 12 for controlling, an optical disk pickup unit 13 that also serves as the light detection means 1, a servo control unit 14 for controlling the optical disk pickup unit 13, and recording data in the optical disk pickup unit 13 The recording data generation unit 15 to be transmitted to the optical disc, the reference clock generation unit 16 that generates a reference clock from the optical disc physical information (physical address information and sync information obtained by decoding the wobble signal) from the address decoding unit 11, and user data from the optical disc And an adjusting means 17 that performs equalization, binarization, and ECC decoding of a reproduction signal when reproducing the signal.

  FIG. 2B shows an example of signal transition of each part in FIG. A to E indicate signals before and after the defect detection, and are waveforms at points A to E in the block diagram. Eventually, as in E, the defect detection width becomes a value counted by a predetermined clock, and is input to the controller which is the defect determination unit. In this example, a count value, for example, 70 for a time t determined by the rise timing of D after the start of the low level of C is taken into the latch 10 at the fall timing of D.

  FIG. 3 shows an example of recording RF input amplitude adjustment. The horizontal axis is time, and one unit (5 plots) represents 100 μSEC. The vertical axis represents the voltage value, and one unit (5 plots) indicates a floating range of 200 mV in B and a range of 0 to 5 V in C. B and C correspond to FIG. This is an example of fingerprint smearing, and the binary signal waveform is LOW (0) as seen by C in the setting of a certain slice level for B.

(Recording RF input amplitude adjustment related to defect detection in the embodiment)
FIG. 4 is a flowchart of the recording RF input amplitude adjusting means of the envelope detection circuit input of the proposed embodiment. The input amplitude adjusting means has a configuration in which peripheral means cooperate with the control means 12 as the center. Hereinafter, the operation of the control means 12 will be described.

  At the time of the operation of the block of FIG. 2A, a defect count value for each sector such as E in FIG. 2B is obtained in the latch means 10, and the control means 12 receives the interrupt signal from the timing generation means 9, This count value is taken in and an adjustment counter (internal sector number counter) described later is incremented (step S41).

  The control means 12 sets the slice level to the initial setting value for the slice level setting means 7, sets the RF signal input level to the initial value for the amplifier means 3, and clears an internal adjustment counter (not shown) to zero. Then, the internal adjustment mode state (not shown) is set to rough adjustment (step S42). There are other fine adjustments to the state. The adjustment phase includes rough adjustment (hereinafter rough) and fine adjustment (hereinafter fine), and the adjustment mode state corresponds to them.

Next, it is determined that the adjustment mode is rough (step S43), and then it is determined whether the adjustment counter has reached a predetermined amount N (step S44).
The number of measurement sectors at the time of rough adjustment is defined as N. Here, the numerical value of N is an appropriate integer (1 or more). For example, N = 2 is set to a small value. The meaning of this numerical value is to shorten the time required for coarse recording RF input amplitude adjustment.

  In addition, a noise slice ratio Z% is defined as a rough adjustment end threshold. This value is an appropriate value (a number greater than 0). The meaning of this numerical value is a threshold value for determining that the input amplitude of the recording RF input amplitude coarse adjustment has reached a predetermined level (that is, near the initial slice level).

  When the sector interrupt of step S41 occurs N times, the process proceeds to the next step S45. In step S45, N sectors are measured and it is determined whether or not the noise is visible in the above-mentioned Z% or more in all sectors. If YES, the process proceeds to the next step S46. In step S46, the adjustment counter is cleared, the adjustment mode is set to fine, and the process returns to node A. If NO in step S45, the adjustment mode is set to rough in the next step S47, the amplitude of the amplifier means 3 is lowered, and the process goes to node B.

  As shown in the flowchart to node B, until the noise slice is performed at a predetermined slice level, the amplitude is gradually lowered from the initial input level of the recording RF input amplitude (in this case, a gain value that saturates the envelope detection input may be used). . This operation is a movement of the waveform B as in the rough adjustment region R of FIG. Fine adjustment is performed after rough adjustment converges.

  The number of measurement sectors at the time of fine adjustment is defined as M. Here, the value of M is an integral multiple of the number of sectors in one round of the disk. The number depends on the radial position of the disk. The apparatus determines the radius position from the physical address of the disk and determines the number of sectors per circuit. When the sector interrupt of step S41 occurs M times, the process proceeds to the next step S49 (step S48).

  The determination phases at the time of fine adjustment include determination a, determination b, and determination c. The determination a assumes a case in which a signal including a real defect is detected and the amplitude is adjusted, and has an effect of removing the influence of a defect that is likely to have an influence. For example, assuming that the numerical value Xa is 40%, the numerical value Ya is 60%, and the numerical value Za is 70%, it is assumed that the noise component center of the envelope detection is sliced, and the influence of the defect is about 30% of the whole. Can be expected to be effective (step S49).

  The determination b is a determination performed after the determination a is passed, and this detects whether the recording RF input amplitude is appropriate or not by the average value of the defect slices. For example, when the numerical value Xb is 40%, the numerical value Yb is 60%, the numerical value Zb is 45%, and the numerical value Zbb is 55%, the envelope detection level obtained as a result of envelope detection of the input signal is a numerical value centered on a predetermined slice. It is shown that it has been adjusted to become (step S50). Next, go to node C.

  The determination c is a determination performed when the determinations a to b are not accepted, and is a process for determining whether the recording RF input amplitude is larger or smaller than the target value. For example, when the numerical value Xc is 30%, the numerical value Yc is 70%, and the numerical value Zc is 50%, whether the envelope detection level as a result of envelope detection of the input signal is larger or smaller than the numerical value about the predetermined slice. It can be determined (step S51). Next, when it is determined that the value is larger than the numerical value Zc, the adjustment mode is set to fine and the amplitude is increased (step S52). When it is determined that the value is not larger than the numerical value Zc, the adjustment mode is set to fine and the amplitude is decreased (step S53). Go to Node B respectively.

  The values of the numerical values Xn, Yn, and Zn may be appropriately changed according to the type of the recording medium. For example, when the numerical value Za of the determination a is set to 0%, the determination a is invalidated. This is because when the noise component amplitude of the envelope detection is small, the change of the noise slice with respect to the amplitude is sensitive and the influence of the defect is minimal, so that determination a may not be performed. In addition, by changing the numerical values of determination a, determination b, and determination c, it is possible to arbitrarily select the amplitude adjustment target as the upper end or lower end of the noise component of envelope detection. In particular, when the lower end of the noise is targeted, the value H (v) at the time of slice adjustment described later can be set small, and prevention of erroneous detection can be expected.

  If the fine adjustment is passed, the slice level is adjusted in step S54 in the flow of FIG. This is an operation for lowering the slice level by a predetermined amount. The operation amount may be an appropriate numerical value depending on the type of the recording medium. When this numerical value H (v) is small, defect detection is sensitive and false detection increases. When the numerical value H (v) is large, defect detection is insensitive and false detection is reduced.

  Below node B, the adjustment counter is first cleared (step S55). If the amplitude is to be reduced (step S56), it is determined whether the gain of the amplifier means 3 can be reduced (step S57). If it is determined to be possible, the prescribed amount F is decreased (step S58). Even if the envelope is minimized, the process ends abnormally because adjustment is impossible (step S59).

  If the amplitude is to be increased (step S56), it is determined whether the gain of the amplifier means 3 can be increased (step S60). If it is determined to be possible, the specified amount F is increased (step S61). Even if the input envelope is maximized, the adjustment is terminated abnormally (step S62).

  As an example of the fine adjustment movement, FIG. 5 shows an operation image of the fine adjustment area following the rough adjustment time area. The horizontal axis represents time, but 5 plots are 40 ms and 400 times longer than FIG. B and C on the vertical axis correspond to the signals B and C in FIG. The state monitor signal 1 indicates that the LOW level is the rough adjustment region R. The write gate signal 2 indicates that the HIGH level is being recorded on the medium.

  In the rough adjustment region R, N sectors are measured twice. In the first result, the amplitude is lowered and the process proceeds to node B in the flow of FIG.

  Subsequently, in the fine adjustment area F1, measurement of M sectors is performed, and in determination c, the amplitude is increased when the defect amount is large, and the measurement is performed to the node B. In the succeeding fine adjustment area F2, M sectors are also measured, and the defect amount is within the range in the determination b, and goes to the node C.

  In the example of the flow in FIG. 4, only the envelope detection input level is adjusted. For example, the rough adjustment is performed by adjusting the recording RF input amplitude so that the envelope detection waveform is adjusted to the vicinity of the initial slice level. May be a method of finely adjusting the slice level.

  FIG. 6 shows an example of this operation using a flow. Compared to FIG. 4, after determination c, the routine goes to node B ′. Parts similar to those in FIG. 4 are denoted by the same step numbers, and description thereof is omitted.

  If the determination is yes after step S51, the adjustment mode is fine and the slice level is lowered (step S52 '). If the determination is no, the adjustment mode is fine and the slice level is increased (step S53'), and then Each goes to Node B ′.

  Below node B ′, the adjustment counter is first cleared (step S65). When lowering the slice level (step S66), it is determined whether the slice level setting means 7 can reduce the slice level (step S67). If it is determined that the slice level can be decreased, the prescribed amount G is decreased (step S68). If not, even if the slice level is minimized, the control is terminated abnormally because the adjustment is impossible (step S69).

  If the slice level is to be increased (step S66), it is determined whether the slice level setting means 7 can increase the slice level (step S70). If it is determined that the slice level can be increased, the prescribed amount G is increased (step S71). If it is not judged, even if the slice level is maximized, the adjustment is terminated abnormally (step S72).

(Definition example of timing for starting recording RF input amplitude adjusting means related to defect detection of embodiment)
The operation related to defect detection will be described below with reference to FIG. It includes a threshold determination process for the degree of stored information defect.
FIG. 7 shows a timing chart for starting and adjusting the recording RF input amplitude automatic adjusting means. In this example, it is assumed that the amplitude adjustment is performed when user data is recorded. The reason is the radial position fluctuation of the recording RF input amplitude. That is, the recording RF input amplitude changes depending on the user data recording radius position, and the change depends on the radial position. Similarly, there can be a recording RF input amplitude due to a temperature change. For this reason, in the present embodiment, it is assumed that the operation is performed at a predetermined radius position or every predetermined time. The radius position and elapsed time may be set arbitrarily. When so-called random recording is performed, the recording RF input amplitude adjustment may be performed for each access.

  FIG. 7 will be described. The vertical axis indicates the type of operation, and each operation of A, B, and C is performed in order. The horizontal axis is an example of a hexadecimal address, and one range delimited by a vertical line represents one ECC block.

First, the recording operation with the recording RF input amplitude adjustment of A is performed. This stops at an arbitrary timing after the end of recording RF input amplitude adjustment. The data to be recorded at this time is user data. Next, B data verification is performed. This is a check of the number of symbols corrected by the ECC correction code (hereinafter referred to as recording quality value). If the recording quality NG level is deteriorated in the quality checking of B, the recording quality NG is notified to the host of the optical disk apparatus. Next, the process proceeds to the C recording operation. In this case, a paste margin of one recording unit (in this example, one block length of DVD) is provided. This also means that the adjustment value obtained by the recording RF input amplitude adjustment is input again during the recording of one recording unit, and a measure against a defect erroneous detection due to the amplitude gap between the reproduction envelope and the recording envelope. At the time of recording C, the first recording unit has been confirmed for the approximate recording quality by the verification. Thereafter, the defect can be detected immediately during the recording operation by detecting and determining the defect for each recording unit. In FIG. 7, the defect detection threshold value for C is set to an initial value 0, but this may be an arbitrary number as appropriate.

(Threshold determination method according to defect detection of embodiment)
FIG. 8 and FIG. 9 show a defect threshold value determination method related to defect detection. When the recording RF input amplitude is adjusted according to the procedure of FIG. 7 and the defect A is detected during the recording of the user data, that is, during the recording operation of FIG. 8C, one recording unit (in this case, the DVD) (1 block length) Recording stops after one recording unit after passing. This considers that when the defect detection position is at the end of one recording unit, the recording end operation cannot be immediately performed in the recording unit. Then, D is verified. This means that the degree of recording quality degradation caused by the defect A is compared with the quality of the preceding and subsequent recording units, and the meaning of determining whether one recording unit in which the defect A occurs is quality NG (stored information). Defect degree threshold determination processing). If the recording quality lowering value due to the addition of the defect A is found by the operation of D, the number means the deterioration value of the recording quality value due to the defect having the same width as the defect A. When a predetermined ratio of a value obtained by subtracting a steady recording quality value from a recording quality value allowable worst value, for example, a recording quality deterioration of 50% is used as a threshold value, the defect threshold T determined to be 50% deterioration is uniquely determined. it can. This is a number for predicting the quality of the defect B of the adjacent track which is the same defect. After performing the D quality determination, the recording operation is started again. E is the movement to resume the recording operation. The recording operation is started from one recording unit in which the signal quality is confirmed by verifying in D. As in the operation of FIG. 7, this means that the adjustment value obtained by the recording RF input amplitude adjustment is input again during recording of one recording unit, and countermeasures against erroneous detection of defects due to the amplitude gap between the reproduction envelope and the recording envelope. There is also a meaning. When the defect B is detected in the recording operation E, it is determined whether the defect width is larger or smaller than the threshold value T determined in D. If it is smaller, it is determined that recording is OK (E in FIG. 8), and if larger, recording is performed. It is determined that the quality is suspicious and the verify operation is performed again, and the threshold is changed if necessary (E, F, G in FIG. 9). The predetermined ratio of the value obtained by subtracting the steady recording quality value from the above-mentioned allowable recording quality value is 50%, but this value may be set as appropriate.

  The threshold values (for example, the threshold value T and the threshold value U) may be changed as appropriate. For example, the movement amount L (number of tracks) in the radial direction is determined, the threshold value T is set to 0 every time the L track moves, and the threshold value determination operation can be performed again when a defect is detected.

  In the embodiment, the defect detection process, the amplitude adjustment unit, and the defect detection threshold determination unit are executed regardless of the unrecorded area and the recorded area. However, this is limited to the execution in the recorded area, for example. However, if there is a possibility of an unrecorded area, a read operation for checking the symbol error quality may be used in combination with the recording quality check. This is meaningful in consideration of the level difference between the recording pulse reflected light in the recording area and the recording pulse reflected light in the unrecorded area. In addition, as a method of determining whether a recorded area or an unrecorded area is included, for example, when recording is performed on the entire surface by so-called formatting processing, or for example, a background format of the Mount Rainier standard, the recording apparatus itself sets dummy information on the entire surface of the disk. You may judge based on having recorded. There is also a means for determining whether a file exists or not by a so-called file system by interpretation by the host device.

Further, the present invention may be applied to a rewritable medium other than DVD + RW.
By implementing the present invention, it is possible to provide a system capable of detecting defects during recording quickly and accurately. Thereby, the recording performance of the optical disk recording / reproducing apparatus and method can be expected to be improved. The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the invention.

Various inventions can be formed by appropriately combining a plurality of constituent elements disclosed in the above-described embodiments. For example, some components may be deleted from all the components shown in the embodiment. Furthermore, constituent elements according to different embodiments may be appropriately combined.

The figure which shows the data structure of 1ECC block of DVD + RW. The block block diagram which shows one Example of this invention, and the figure of signal transition description of a defect detection. Explanatory drawing of the envelope detection binarization slice level optimal value at the time of fingerprint dirt detection. The flowchart of the recording RF input amplitude adjustment means of the envelope detection circuit input of an Example. Operation explanatory diagram of recording RF input amplitude adjusting means of the envelope detector circuit input of the embodiment. The flowchart explaining another example of the recording RF input amplitude adjusting means of the envelope detector circuit input of the embodiment. Explanatory drawing of the recording RF input amplitude adjustment means implementation timing of the envelope detection circuit input of an Example. The figure explaining the defect detection during the data recording of an Example. The figure explaining the defect detection during the data recording of an Example.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Light detection means, 2 ... Amplifying means of reflected light, 3 ... Amplifier means, 4 ... LPF means, 5 ... Envelope detection means, 6 ... Slice means, 7 ... Slice level setting means, 8 ... Defect count means, 9 ... timing generation means, 10 ... latch means, 11 ... address decoding means, 12 ... control means, 13 ... optical disk pickup unit, 14 ... servo control section, 15 ... recording data generation section, 16 ... reference clock generation section.

Claims (9)

Gain adjusting means for adjusting the gain of a signal derived from an RF signal being recorded on the medium and input;
LPF means for low pass filtering the gain adjusted signal;
Envelope detection means for performing envelope detection from the low-pass filtered signal;
Slice level setting means for setting a slice level for the envelope detection result;
Slicing means for slicing and binarizing the envelope detection result according to the slice level;
Control means for detecting a defect from the output of the slicing means and controlling a defect detection-related operation according to the defect detection result, and the defect detection-related operation includes a threshold judgment process of a stored information defect degree. Recording / playback device.   The information recording / reproducing apparatus according to claim 1, wherein the threshold determination process is performed when user data is recorded.   3. The information recording / reproducing apparatus according to claim 2, wherein the user data recording is performed in units of a plurality of sectors, and the user data recorded during the threshold determination process is determined for recording quality by verification.   2. The information recording according to claim 1, wherein the defect detection means includes a level adjustment method for detecting an average level at the time of no defect level and normalizing the level and an analog threshold value adjustment method for defect detection. Playback device.   The level adjustment and the analog threshold adjustment are characterized in that the recording data unit of the medium is a sampling unit, and the integration result of at least one area of the medium is sampled, and the recording data unit is a multiple of the user data unit. The information recording / reproducing apparatus according to claim 4.   5. The information recording / reproducing apparatus according to claim 4, wherein the level adjustment and the analog threshold adjustment are performed using user data.   The information recording / reproducing apparatus according to claim 6, wherein the level adjustment and the analog threshold value adjustment are performed when user data is recorded.   8. The information recording / reproducing apparatus according to claim 7, wherein the recording quality is determined by verification at the time of recording the user data. Perform gain adjustment on the input signal derived from the RF signal being recorded on the medium,
Perform low-pass filter processing on the gain adjustment result,
Perform envelope detection from the result of the low-pass filter processing,
Set the slice level for the envelope detection result,
Slice the envelope detection result according to the slice level setting result and binarize it,
An information recording / reproducing method characterized in that a defect detection is performed from the slice result, and a defect detection related operation is controlled based on the defect detection result, and the defect detection related operation includes a threshold value determination process of a stored information defect degree.

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