JP2008111161A - Vapor deposition apparatus - Google Patents

Vapor deposition apparatus Download PDF

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Publication number
JP2008111161A
JP2008111161A JP2006295144A JP2006295144A JP2008111161A JP 2008111161 A JP2008111161 A JP 2008111161A JP 2006295144 A JP2006295144 A JP 2006295144A JP 2006295144 A JP2006295144 A JP 2006295144A JP 2008111161 A JP2008111161 A JP 2008111161A
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vapor deposition
crucible
shielding plate
substrate
deposition apparatus
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Yasuhiro Iwano
康弘 岩野
Yoshiyuki Okazaki
禎之 岡崎
Kazuyoshi Honda
和義 本田
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a vapor deposition apparatus in which while radiant heat from a crucible is shielded, the falling of deposited material causing a variation in a vapor deposition rate and the generation of splashes can be prevented. <P>SOLUTION: The vapor deposition apparatus is provided with: a vacuum vessel 1 having an exhaust device 2; the crucible 8 storing a vapor deposition material 7; a heating apparatus melting and evaporating the evaporation material 7; and a substrate 4 on which the evaporated material is deposited. A plurality of shielding plate 13 each having an opening part are spaced at intervals each other above the crucible 8, and the opening area of the opening part in each shielding plate 13 is expanded as the shielding plate is close to the substrate 4. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は蒸発材料を基板に蒸着させる蒸着装置に関し、特に蒸着装置に含まれる蒸発源の構成に関するものである。   The present invention relates to an evaporation apparatus for evaporating an evaporation material on a substrate, and more particularly to the configuration of an evaporation source included in the evaporation apparatus.

近年、大面積・高速の薄膜製造方法として、蒸着装置を用いた薄膜製造が一般に広く利用されている。この蒸着装置を用いた薄膜製造による蒸着膜を、より安定した品質の高い蒸着膜にするということが、製造コスト低減の観点などから重要となっている。   In recent years, thin film production using a vapor deposition apparatus has been widely used as a large area / high speed thin film production method. From the viewpoint of reducing the manufacturing cost, it is important to change the deposited film produced by the thin film production using this deposition apparatus to a more stable and high quality deposited film.

以下、従来の蒸着装置について、図面を用いて説明する。図6は、従来の蒸着装置の一例を示す構成図である。図7〜図9は、従来の蒸着装置に備わる蒸発源の一例を模式的に示す断面図である。   Hereinafter, a conventional vapor deposition apparatus will be described with reference to the drawings. FIG. 6 is a configuration diagram illustrating an example of a conventional vapor deposition apparatus. 7-9 is sectional drawing which shows typically an example of the evaporation source with which the conventional vapor deposition apparatus is equipped.

図6に示すように、従来の蒸着装置は、真空容器1の内部に、薄膜状の基板4が巻かれた巻き出しロール3、走行ローラ5aおよび5b、基板冷却ロール6、蒸発材料7が入った坩堝8、坩堝8を照射するための電子ビーム照射装置9、巻き取りロール11、および、基板冷却ロール6と坩堝8の間に配置されたマスク10を備えている。また、真空容器1の外部には、排気装置2を備えている。   As shown in FIG. 6, the conventional vapor deposition apparatus includes an unwinding roll 3 around which a thin film substrate 4 is wound, traveling rollers 5 a and 5 b, a substrate cooling roll 6, and an evaporation material 7 inside a vacuum vessel 1. A crucible 8, an electron beam irradiation device 9 for irradiating the crucible 8, a take-up roll 11, and a mask 10 disposed between the substrate cooling roll 6 and the crucible 8 are provided. Further, an exhaust device 2 is provided outside the vacuum vessel 1.

真空容器1の内部は、排気装置2により真空排気されることで、所定の真空度に保持される。真空容器1内において、巻き出しロール3から基板4が、走行ローラ5a、基板冷却ロール6の順に、図6中の矢印の方向に走行する。基板4が基板冷却ロール6を通過する際、電子ビーム照射装置9により電子ビームを照射された坩堝8から、蒸発材料7を溶解・蒸発させることで、蒸発材料7を基板4に対して所定の角度範囲内で蒸着させる。その後、蒸着された基板4は、走行ローラ5bに導かれて、最終的には巻き取りロール11により巻き取られる。   The inside of the vacuum vessel 1 is kept at a predetermined degree of vacuum by being evacuated by the exhaust device 2. In the vacuum container 1, the substrate 4 from the unwinding roll 3 travels in the direction of the arrow in FIG. 6 in the order of the traveling roller 5 a and the substrate cooling roll 6. When the substrate 4 passes through the substrate cooling roll 6, the evaporation material 7 is dissolved and evaporated from the crucible 8 irradiated with the electron beam by the electron beam irradiation device 9, so that the evaporation material 7 is given to the substrate 4 in a predetermined manner. Vapor deposition within an angular range. Thereafter, the vapor-deposited substrate 4 is guided to the traveling roller 5 b and finally taken up by the take-up roll 11.

しかしながら、上記蒸着装置では、高融点材料の蒸着時に、蒸発源である坩堝8からの輻射熱が基板4に悪影響を与えるという問題が発生する場合がある。例えば、リチウムイオン二次電池用の電極を形成する場合、カーボン製坩堝(昇華点3367℃)に入れた蒸発材料のシリコン(融点1410℃)を電子ビームにて溶解・蒸発させることで、銅箔基板(融点1085℃)上にシリコンを蒸着させるのだが、このとき、前記溶解されたシリコンの溶湯ならびにカーボン坩堝8の表面は、約2000℃の高温となる。このため、蒸発源と銅箔基板間の距離にもよるが、その輻射熱が銅箔基板を加熱し、形成された電極に皺が入る、形成された膜が剥離する、銅箔基板が破断するという問題が発生する場合がある。   However, in the above vapor deposition apparatus, there may be a problem that radiant heat from the crucible 8 serving as an evaporation source adversely affects the substrate 4 during vapor deposition of the high melting point material. For example, when an electrode for a lithium ion secondary battery is formed, a copper foil is obtained by dissolving and evaporating silicon (melting point: 1410 ° C.) of an evaporation material placed in a carbon crucible (sublimation point 3367 ° C.) with an electron beam. Silicon is vapor-deposited on a substrate (melting point: 1085 ° C.). At this time, the molten silicon melt and the surface of the carbon crucible 8 are at a high temperature of about 2000 ° C. For this reason, although depending on the distance between the evaporation source and the copper foil substrate, the radiant heat heats the copper foil substrate, so that the formed electrode is wrinkled, the formed film is peeled off, or the copper foil substrate is broken. May occur.

上記問題の発生を低減するため、図7〜図9に示すように、坩堝8表面に遮蔽板13を配置した蒸発装置が、順次提案されている。   In order to reduce the occurrence of the above problems, as shown in FIGS. 7 to 9, an evaporation apparatus in which a shielding plate 13 is arranged on the surface of the crucible 8 has been proposed sequentially.

図7の構成では、遮蔽板13、および遮蔽板13の上に冷却管12を設置することで、坩堝8表面からの輻射熱の遮蔽はできるが、遮蔽板13が薄いため、遮蔽板13表面まで高温となり、前記遮蔽板13表面からの輻射熱が無視できない。   In the configuration of FIG. 7, radiation heat from the surface of the crucible 8 can be shielded by installing the cooling plate 12 on the shielding plate 13 and the shielding plate 13. However, since the shielding plate 13 is thin, the surface of the shielding plate 13 is reached. The temperature becomes high and the radiant heat from the surface of the shielding plate 13 cannot be ignored.

図8の構成では、遮蔽板13を厚くし、さらに遮蔽板13の内部に冷却管12を設置することで、冷却効果を高めている。このため、遮蔽板13表面の温度上昇は抑えられ、前記遮蔽板13表面からの輻射熱の遮蔽は十分である。しかしながら、蒸着が進むにつれ、
前記遮蔽板13に接した蒸発粒子が、図8のように、付着物14として遮蔽板13上に付着する。前記付着物14は、時間経過と共に遮蔽板13上に堆積し、蒸発材料7の溶湯面上部の空間を塞いでいく。このため、蒸発材料7への電子ビーム照射領域が減少して蒸発量が減少し、蒸発粒子の基板への到達量も減少する。また、前記付着物14が再び溶融し、坩堝8内に落下することにより、蒸着レートが変動したり、スプラッシュが発生したりする。
In the configuration of FIG. 8, the shielding effect is enhanced by increasing the thickness of the shielding plate 13 and installing the cooling pipe 12 inside the shielding plate 13. For this reason, the temperature rise on the surface of the shielding plate 13 is suppressed, and the radiation heat from the surface of the shielding plate 13 is sufficiently shielded. However, as deposition progresses,
The evaporated particles in contact with the shielding plate 13 adhere to the shielding plate 13 as the deposit 14 as shown in FIG. The adhering matter 14 accumulates on the shielding plate 13 over time, and closes the space above the molten metal surface of the evaporating material 7. For this reason, the electron beam irradiation area | region to the evaporation material 7 reduces, evaporation amount reduces, and the arrival amount of the evaporation particle to the board | substrate also reduces. Further, the deposit 14 is melted again and falls into the crucible 8, whereby the deposition rate fluctuates and splash occurs.

図9の構成では、遮蔽板13を上方に突出する筒型とし、特にその筒型上端部の肉厚を薄くして遮蔽板13の側面を急峻な角度にすることで、前記付着物14の付着を低減している(例えば、特許文献1参照)。
特開2001−3158号公報
In the configuration of FIG. 9, the shielding plate 13 has a cylindrical shape protruding upward, and in particular, the thickness of the upper end of the cylindrical shape is reduced to make the side surface of the shielding plate 13 have a steep angle. Adhesion is reduced (see, for example, Patent Document 1).
Japanese Patent Laid-Open No. 2001-3158

しかしながら、改良された図9の構成でも、前記付着物14の落下に伴う蒸着レートの変動およびスプラッシュの発生という課題を依然として有している。   However, the improved configuration of FIG. 9 still has the problem of fluctuations in the deposition rate and the occurrence of splash due to the fall of the deposit 14.

本発明は、前記従来の課題を解決するもので、坩堝からの輻射熱の遮蔽を行いながら、蒸着レートの変動やスプラッシュの発生を招く付着物の落下を防止する蒸着装置を提供することを目的とする。   SUMMARY OF THE INVENTION The present invention solves the above-described conventional problems, and an object thereof is to provide a vapor deposition apparatus that prevents falling of deposits that cause fluctuations in vapor deposition rate and occurrence of splash while shielding radiant heat from a crucible. To do.

前記課題を解決するために、本発明の蒸着装置は、排気装置を備えた真空容器と、蒸発材料を収容する坩堝を設置する手段と、蒸発材料を溶融蒸発させる加熱装置と、蒸発した物質を付着させる基板を設置する手段とを備えた蒸着装置であって、前記坩堝の上部に開口部を有する複数の遮蔽板が相互に間隔を持って配置されており、前記複数の遮蔽板の各開口部の開口面積が基板に近いものほど大きくなる。   In order to solve the above-mentioned problems, a vapor deposition apparatus according to the present invention comprises a vacuum vessel provided with an exhaust device, a means for installing a crucible for storing an evaporation material, a heating device for melting and evaporating the evaporation material, and an evaporated substance. A plurality of shielding plates having openings at the top of the crucible, spaced apart from each other, and each opening of the plurality of shielding plates. The closer the opening area of the part is to the substrate, the larger.

本構成によって、坩堝からの輻射熱の遮蔽を行いながら、付着物の落下を防止することができる。   With this configuration, it is possible to prevent the deposits from falling while shielding the radiant heat from the crucible.

本発明の蒸着装置によれば、坩堝の上部に開口部を有する複数の遮蔽板が相互に間隔を持って配置され、前記遮蔽板の開口部の開口面積が基板に近づくとともに拡大する構成であるため、遮蔽板側壁に形成される付着物が落下しても、下部に位置する遮蔽板の上表面に受け止められることで、付着物が坩堝内に落下することによる蒸着レートの変動や、スプラッシュの発生を防ぐことができる。   According to the vapor deposition apparatus of the present invention, a plurality of shielding plates having openings at the upper part of the crucible are arranged with a space between each other, and the opening area of the openings of the shielding plates increases as the substrate approaches the substrate. Therefore, even if the deposit formed on the side wall of the shielding plate falls, it is received on the upper surface of the shielding plate located in the lower part, and the fluctuation of the deposition rate due to the deposit falling in the crucible, Occurrence can be prevented.

また、本発明の蒸着装置によれば、複数の遮蔽板を用いる構成であるため、下部に位置する遮蔽板表面からの輻射熱を、その上部に位置する遮蔽板が吸収することで、前記上部に位置する遮蔽板表面からの輻射熱を、前記下部に位置する遮蔽板表面からの輻射熱よりも低減させることができ、さらには基板表面に到達する輻射熱を低減させることができる。   Moreover, according to the vapor deposition apparatus of the present invention, since it is configured to use a plurality of shielding plates, the shielding plate located in the upper part absorbs radiant heat from the surface of the shielding plate located in the lower part. Radiant heat from the surface of the shielding plate located can be reduced more than radiation heat from the surface of the shielding plate located in the lower part, and further radiation heat reaching the substrate surface can be reduced.

以下、本発明の実施の形態について、図面を参照しながら説明する。   Hereinafter, embodiments of the present invention will be described with reference to the drawings.

なお、本発明の実施の形態では、電子ビーム蒸着装置に適用した例を述べているが、これに限られることなく、本発明は、排気装置を備えた真空容器と、蒸発材料を収容する坩
堝と、蒸発材料を溶融・蒸発させる加熱装置と、蒸発した物質を付着させる基板とを備えた蒸着装置全般に適用され得る。また、本発明の実施の形態においては、蒸発源の構造以外の蒸着装置の基本的構成は、図6に示した従来の蒸着装置と同様であるため、以下、異なる点のみを説明する。
In the embodiment of the present invention, an example applied to an electron beam vapor deposition apparatus is described. However, the present invention is not limited to this, and the present invention is not limited to this. In addition, the present invention can be applied to any vapor deposition apparatus including a heating apparatus that melts and evaporates the evaporation material and a substrate to which the evaporated substance is attached. Further, in the embodiment of the present invention, the basic configuration of the vapor deposition apparatus other than the structure of the evaporation source is the same as that of the conventional vapor deposition apparatus shown in FIG.

(実施の形態1)
図10は、本発明の実施の形態1における蒸着装置の概略断面図であり、図1は、図10の蒸着装置の蒸発源付近の拡大断面図である。図2は、本発明の実施の形態1における蒸着装置に備わる遮蔽板の斜視図である。図10、図1ならびに図2において、図7と同じ構成要素については同じ符号を用いる。
(Embodiment 1)
FIG. 10 is a schematic cross-sectional view of the vapor deposition apparatus according to Embodiment 1 of the present invention, and FIG. 1 is an enlarged cross-sectional view of the vicinity of the evaporation source of the vapor deposition apparatus of FIG. FIG. 2 is a perspective view of a shielding plate provided in the vapor deposition apparatus according to Embodiment 1 of the present invention. 10, 1, and 2, the same reference numerals are used for the same components as those in FIG. 7.

本実施形態の蒸着装置は、図10および図1に示すように、排気装置2を備えた真空容器1と、蒸発材料7を収容する坩堝8を設置する手段と、蒸発材料7を溶融蒸発させる加熱装置9と、蒸発した物質を付着させる基板4を設置する手段とを備えている。巻き出しロール3より巻き出された基板4は、走行ローラ5a、基板冷却ロール6、走行ローラ5bを経由して、巻き取りロール11に巻き取られる。この間、基板4は、基板冷却ロール6上で、冷却されながら、蒸発材料7より蒸発した蒸発原子が蒸着される。   As shown in FIG. 10 and FIG. 1, the vapor deposition apparatus of the present embodiment melts and evaporates the evaporation material 7, the vacuum vessel 1 provided with the exhaust device 2, the means for installing the crucible 8 that stores the evaporation material 7, and A heating device 9 and means for installing the substrate 4 to which the evaporated substance is attached are provided. The substrate 4 unwound from the unwinding roll 3 is wound around the winding roll 11 via the traveling roller 5a, the substrate cooling roll 6, and the traveling roller 5b. During this time, while the substrate 4 is cooled on the substrate cooling roll 6, evaporated atoms evaporated from the evaporation material 7 are deposited.

図1に示す坩堝8は、例えばカーボン製であり、その内部に蒸発材料7を収容し、電子ビーム照射装置9により加熱・溶融させる。坩堝8の上部には、図2に示すように、坩堝8の開口縁と同一形状の開口部を有する3段の遮蔽板13が配置されている。遮蔽板13は、例えば銅製であり、相互に所定の間隔をもって、遮蔽板13開口部の開口面積が基板4に近づくとともに拡大するよう構成されている。なお、前記3段の遮蔽板13は、図示していないが、通常の支持機構により、坩堝8の表面と略平行に支持されている。   A crucible 8 shown in FIG. 1 is made of, for example, carbon, and contains an evaporating material 7 and is heated and melted by an electron beam irradiation device 9. As shown in FIG. 2, a three-stage shielding plate 13 having an opening having the same shape as the opening edge of the crucible 8 is disposed on the upper portion of the crucible 8. The shielding plate 13 is made of, for example, copper, and is configured such that the opening area of the opening portion of the shielding plate 13 increases as it approaches the substrate 4 with a predetermined interval therebetween. Although not shown, the three-stage shielding plate 13 is supported substantially parallel to the surface of the crucible 8 by a normal support mechanism.

本発明の実施の形態1における蒸着装置の構成によれば、電子ビームを照射して蒸発材料7を加熱・溶融し、蒸発させる際、遮蔽板13に堆積した付着物14が落下しても、下部に位置する遮蔽板13の上表面により受け止められることで、付着物14が坩堝8内に落下することによる蒸着レートの変動や、スプラッシュの発生を防ぐことができる。   According to the configuration of the vapor deposition apparatus in Embodiment 1 of the present invention, when the evaporating material 7 is heated and melted by being irradiated with an electron beam and evaporated, even if the deposit 14 deposited on the shielding plate 13 falls, By being received by the upper surface of the shielding plate 13 located in the lower part, it is possible to prevent the deposition rate from fluctuating due to the deposit 14 falling into the crucible 8 and the occurrence of splash.

また、本発明の実施の形態1における蒸着装置では、複数の遮蔽板13を用いることにより、下部に位置する遮蔽板13表面からの輻射熱を、その上部に位置する遮蔽板13が吸収することで、前記上部に位置する遮蔽板13表面からの輻射熱を、前記下部に位置する遮蔽板13表面からの輻射熱よりも低減させることができ、さらには基板4の表面に到達する輻射熱を低減させることができる。   Moreover, in the vapor deposition apparatus in Embodiment 1 of this invention, by using the some shielding board 13, the shielding board 13 located in the upper part absorbs the radiant heat from the surface of the shielding board 13 located in the lower part. The radiant heat from the surface of the shielding plate 13 located in the upper part can be reduced more than the radiant heat from the surface of the shielding plate 13 located in the lower part, and further the radiant heat reaching the surface of the substrate 4 can be reduced. it can.

本発明の実施の形態1における遮蔽板13の設置基準は、以下の通りである。   The installation standard of the shielding plate 13 in Embodiment 1 of the present invention is as follows.

遮蔽板13の設置枚数は、蒸着時の坩堝8の表面温度、遮蔽板13の厚み等から決まるのだが、坩堝8表面からの輻射熱を十分低減できる枚数があれば良い。必要以上の遮蔽板13を設置しても、装置コスト、蒸着後の清掃作業等に負荷を与えるだけである。   The number of the shielding plates 13 to be installed is determined by the surface temperature of the crucible 8 at the time of vapor deposition, the thickness of the shielding plate 13, and the like, but it is sufficient that the number of the shielding plates 13 can sufficiently reduce the radiant heat from the surface of the crucible 8. Even if the shielding plate 13 is installed more than necessary, it only gives a load to the apparatus cost, cleaning work after vapor deposition, and the like.

各遮蔽板13間の距離は、主として蒸着レート、蒸着時間から決まるのだが、所定の蒸着時間終了時に、付着物あるいは付着物の落下による堆積物が、各遮蔽板13間を接続しないだけの距離があれば良い。例えば、蒸着レート400nm毎秒の蒸発材料7を計8時間蒸着する場合、蒸着膜の厚さは、基板4が静止していたとして、約11.5mmとなるので、各遮蔽板13間の距離は15mmもあれば十分である。   The distance between the shielding plates 13 is mainly determined by the vapor deposition rate and the vapor deposition time. However, when the predetermined vapor deposition time is finished, the distance by which the deposits or deposits due to the fall of the deposits do not connect the shield plates 13 to each other. If there is. For example, when evaporating material 7 with a deposition rate of 400 nm per second is vapor-deposited for a total of 8 hours, the thickness of the vapor-deposited film is about 11.5 mm even when the substrate 4 is stationary. A length of 15 mm is sufficient.

各遮蔽板13の開口部サイズは、坩堝8の開口部とマスク10の開口部のサイズから決まる。図10に示すように、坩堝8の開口縁とマスク10の開口縁を結んだ内部の領域が
、蒸発粒子の基板4への入射領域Aとなる。各遮蔽板13は、各々の設置高さにおいて、少なくとも前記入射領域Aに接する開口部を持っている必要がある。これより小さいと、マスク10で規定した基板4への蒸着領域を狭めてしまうためである。また、あまりに拡げてしまうと、坩堝8あるいは遮蔽板13表面から基板4に到達する輻射熱が増大してしまうためである。したがって、遮蔽板13の開口部サイズは、面積にして、前記入射領域Aに接する開口部サイズの1.25倍を限度とすべきである。
The size of the opening of each shielding plate 13 is determined by the size of the opening of the crucible 8 and the opening of the mask 10. As shown in FIG. 10, an inner region connecting the opening edge of the crucible 8 and the opening edge of the mask 10 becomes an incident region A of the evaporated particles to the substrate 4. Each shielding plate 13 needs to have at least an opening in contact with the incident area A at each installation height. If it is smaller than this, the deposition area on the substrate 4 defined by the mask 10 is narrowed. Moreover, if it expands too much, it is because the radiant heat which reaches | attains the board | substrate 4 from the surface of the crucible 8 or the shielding board 13 will increase. Accordingly, the size of the opening of the shielding plate 13 should be limited to 1.25 times the size of the opening contacting the incident area A in terms of area.

(実施の形態2)
図3は、本発明の実施の形態2における蒸着装置に備わる蒸発源の断面図である。図3に示す本発明の実施の形態2の蒸発源は、実施の形態1と同様の構成であるので、図1と同じ構成要素については同じ符号を用い、以下には異なる部分のみを説明する。
(Embodiment 2)
FIG. 3 is a cross-sectional view of the evaporation source provided in the vapor deposition apparatus according to Embodiment 2 of the present invention. Since the evaporation source according to the second embodiment of the present invention shown in FIG. 3 has the same configuration as that of the first embodiment, the same reference numerals are used for the same components as in FIG. 1, and only different parts will be described below. .

図3に示すように、遮蔽板13は、その開口端部の断面形状が、坩堝8側端部よりも基板4側端部の方が開口面積が広い傾斜部15を備えるように構成されている。なお、図3では、傾斜部15を全面にわたって傾斜させている。しかし、複数の遮蔽板13の一部の遮蔽板に傾斜部を設けても、それなりに効果がある。また、一枚の遮蔽板においても、開口端部の一部に傾斜部15を設けた場合も、それなりの効果はある。   As shown in FIG. 3, the shielding plate 13 is configured such that the cross-sectional shape of the opening end is provided with an inclined portion 15 having a larger opening area at the substrate 4 side end than at the crucible 8 side end. Yes. In FIG. 3, the inclined portion 15 is inclined over the entire surface. However, even if an inclined portion is provided on a part of the plurality of shielding plates 13, there are some effects. In addition, even in the case where a single shielding plate is provided with the inclined portion 15 at a part of the opening end portion, there is a certain effect.

本発明の実施の形態2における蒸着装置の構成によれば、実施の形態1と同様の効果を奏する他、遮蔽板13の開口端部への付着物14の形成を遅らせることができ、前記開口端部に堆積する付着物14によって行く手を遮られる蒸発粒子を減少させることができる。その結果、長時間、より安定した品質の高い蒸着膜を形成することができる。   According to the structure of the vapor deposition apparatus in Embodiment 2 of this invention, besides having the same effect as Embodiment 1, formation of the deposit | attachment 14 to the opening edge part of the shielding board 13 can be delayed, and the said opening It is possible to reduce the evaporated particles that are blocked by the deposit 14 deposited on the end. As a result, it is possible to form a vapor deposition film that is more stable and has a higher quality for a long time.

なお、本発明の実施の形態1、2においては、角柱型の坩堝を用い、坩堝材料としてカーボンを用いたが、所望の蒸発材料を収容でき、加熱装置による溶解・蒸発を安定かつ安全に行うことができるものであれば、その形状および材料は任意である。   In Embodiments 1 and 2 of the present invention, a prismatic crucible is used and carbon is used as a crucible material. However, a desired evaporation material can be accommodated, and dissolution and evaporation by a heating device can be performed stably and safely. As long as it can be used, its shape and material are arbitrary.

また、本発明の実施の形態1、2においては、加熱装置として電子ビーム照射装置を用いたが、所望の蒸発材料を加熱・溶解できるのであれば、抵抗加熱、誘導加熱等、他の加熱装置を用いても良い。   In the first and second embodiments of the present invention, the electron beam irradiation device is used as the heating device. However, if the desired evaporation material can be heated and dissolved, other heating devices such as resistance heating and induction heating can be used. May be used.

また、本発明の実施の形態1、2においては、銅製の遮蔽板を用いたが、所望の輻射熱低減効果を発揮できるのであれば、他の材料を用いても良い。さらに、輻射熱低減効果を高めるため、前記遮蔽板の内部あるいは基板側表面に、水や冷媒等を流す冷却管を備えても良い。   In Embodiments 1 and 2 of the present invention, a copper shielding plate is used. However, other materials may be used as long as a desired radiant heat reduction effect can be exhibited. Furthermore, in order to enhance the effect of reducing radiant heat, a cooling pipe for flowing water, a refrigerant, or the like may be provided inside the shielding plate or on the substrate side surface.

また、本発明の実施の形態1、2においては、遮蔽板13開口部の形成を、遮蔽板13に穴を開ける形態で記述したが、図4(a)、(b)に示すように、複数枚の板を組み合わせて開口部を形成しても良い。あるいは、図5(a)、(b)に示すように、遮蔽板13の開口部を井桁構造としても良い。井桁構造においても、本発明の実施の形態1、2と同様に、上部に位置する遮蔽板13からの再溶融落下物を、下部に位置する遮蔽板13で受け止め、坩堝8内への再溶融落下物による蒸発状態の急変、蒸着レートの変動、およびスプラッシュの発生を防止することができる。   Further, in Embodiments 1 and 2 of the present invention, the formation of the opening portion of the shielding plate 13 is described in the form of making a hole in the shielding plate 13, but as shown in FIGS. 4 (a) and 4 (b), A plurality of plates may be combined to form the opening. Or as shown to Fig.5 (a), (b), it is good also considering the opening part of the shielding board 13 as a cross-beam structure. Also in the cross-girder structure, as in the first and second embodiments of the present invention, the remelted fallen material from the upper shielding plate 13 is received by the lower shielding plate 13 and remelted into the crucible 8. It is possible to prevent sudden changes in the evaporation state due to falling objects, fluctuations in the deposition rate, and occurrence of splash.

本発明にかかる蒸着装置は、坩堝の上部に開口部を有する複数の遮蔽板を有し、坩堝からの輻射熱の遮蔽を行いながら、付着物の落下を防止することができる蒸着装置として有用である。   The vapor deposition apparatus according to the present invention has a plurality of shielding plates having openings at the top of the crucible, and is useful as a vapor deposition apparatus that can prevent falling of deposits while shielding radiant heat from the crucible. .

本発明の実施の形態1における蒸着装置に備わる蒸発源の断面図Sectional drawing of the evaporation source with which the vapor deposition apparatus in Embodiment 1 of this invention is equipped 本発明の実施の形態1における蒸着装置に備わる遮蔽板の斜視図The perspective view of the shielding board with which the vapor deposition apparatus in Embodiment 1 of this invention is equipped. 本発明の実施の形態2における蒸着装置に備わる蒸発源の断面図Sectional drawing of the evaporation source with which the vapor deposition apparatus in Embodiment 2 of this invention is equipped (a)本発明に係る開口部構造の一例を示す斜視図 (b)本発明に係る開口部構造の一例を示す斜視図(A) The perspective view which shows an example of the opening part structure which concerns on this invention (b) The perspective view which shows an example of the opening part structure which concerns on this invention (a)本発明に係る開口部構造の一例を示す断面図 (b)(a)の斜視図(A) Sectional drawing which shows an example of opening part structure which concerns on this invention (b) Perspective view of (a) 従来の蒸着装置の一例を示す構成図Configuration diagram showing an example of a conventional vapor deposition apparatus 従来の蒸着装置に備わる蒸発源の一例を示す断面図Sectional drawing which shows an example of the evaporation source with which the conventional vapor deposition apparatus is equipped 従来の蒸着装置に備わる蒸発源の一例を示す断面図Sectional drawing which shows an example of the evaporation source with which the conventional vapor deposition apparatus is equipped 従来の蒸着装置に備わる蒸発源の一例を示す断面図Sectional drawing which shows an example of the evaporation source with which the conventional vapor deposition apparatus is equipped 本発明の実施の形態1における蒸着装置の断面図Sectional drawing of the vapor deposition apparatus in Embodiment 1 of this invention

符号の説明Explanation of symbols

1 真空容器
2 排気装置
3 巻き出しロール
4 基板
5a、5b 走行ローラ
6 基板冷却ロール
7 蒸発材料
8 坩堝
9 電子ビーム照射装置
10 マスク
11 巻き取りロール
12 冷却管
13 遮蔽板
14 付着物
15 傾斜部
DESCRIPTION OF SYMBOLS 1 Vacuum container 2 Exhaust device 3 Unwinding roll 4 Substrate 5a, 5b Traveling roller 6 Substrate cooling roll 7 Evaporating material 8 Crucible 9 Electron beam irradiation apparatus 10 Mask 11 Winding roll 12 Cooling tube 13 Shielding plate 14 Adhering matter 15 Inclined part

Claims (2)

排気装置を備えた真空容器と、蒸発材料を収容する坩堝を設置する手段と、蒸発材料を溶融蒸発させる加熱装置と、蒸発した物質を付着させる基板を設置する手段とを備えた蒸着装置であって、前記坩堝の上部に開口部を有する複数の遮蔽板が相互に間隔を持って配置されており、前記複数の遮蔽板の各開口部の開口面積が基板に近いものほど大きくなる蒸着装置。 A vapor deposition apparatus comprising a vacuum vessel provided with an exhaust device, a means for installing a crucible for storing the evaporation material, a heating apparatus for melting and evaporating the evaporation material, and a means for installing a substrate to which the evaporated substance is attached. A plurality of shielding plates having openings at the top of the crucible are spaced apart from each other, and the vapor deposition apparatus becomes larger as the opening area of each opening of the plurality of shielding plates is closer to the substrate. 前記遮蔽板の開口部が坩堝側端部および基板側端部を有し、前記基板側端部の開口面積が、坩堝側端部の開口面積よりも広い、請求項1に記載の蒸着装置。 The vapor deposition apparatus of Claim 1 with which the opening part of the said shielding board has a crucible side edge part and a substrate side edge part, and the opening area of the said substrate side edge part is wider than the opening area of a crucible side edge part.
JP2006295144A 2006-10-31 2006-10-31 Vapor deposition apparatus Pending JP2008111161A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008248301A (en) * 2007-03-30 2008-10-16 Canon Inc Vapor deposition apparatus and vapor deposition method
WO2011071154A1 (en) * 2009-12-10 2011-06-16 住友化学株式会社 Silicon film and lithium secondary cell
WO2012169625A1 (en) * 2011-06-08 2012-12-13 国立大学法人 東京大学 Method for producing film comprising si and metal m

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008248301A (en) * 2007-03-30 2008-10-16 Canon Inc Vapor deposition apparatus and vapor deposition method
WO2011071154A1 (en) * 2009-12-10 2011-06-16 住友化学株式会社 Silicon film and lithium secondary cell
JP2011122200A (en) * 2009-12-10 2011-06-23 Sumitomo Chemical Co Ltd Silicon film and lithium secondary battery
WO2012169625A1 (en) * 2011-06-08 2012-12-13 国立大学法人 東京大学 Method for producing film comprising si and metal m

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