JP2008001595A - Glass for laser beam machining - Google Patents

Glass for laser beam machining Download PDF

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JP2008001595A
JP2008001595A JP2007245825A JP2007245825A JP2008001595A JP 2008001595 A JP2008001595 A JP 2008001595A JP 2007245825 A JP2007245825 A JP 2007245825A JP 2007245825 A JP2007245825 A JP 2007245825A JP 2008001595 A JP2008001595 A JP 2008001595A
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glass
laser beam
processing
laser
tio
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JP4709194B2 (en
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Hirotaka Komochi
広隆 小用
Tadashi Koyama
正 小山
Keiji Tsunetomo
啓司 常友
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Nippon Sheet Glass Co Ltd
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Nippon Sheet Glass Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To solve the problem wherein silver ions are difficult to diffuse into the inside of glass since the silver ions are reduced in the vicinity of a glass surface in an attempt to lower a laser beam machining threshold value by introducing the silver ions into glass containing an alkali metal by silver ion exchange so that an effective laser beam machining region is restricted within the vicinity of the glass surface to make the processing of the inside of the glass, such as formation of through-holes in the glass, difficult. <P>SOLUTION: The glass for a laser beam machining substantially has the following composition in terms of mol%: 20≤SiO<SB>2</SB>+B<SB>2</SB>O<SB>3</SB>≤50 (provided that 10≤B<SB>2</SB>O<SB>3</SB>≤50), 25≤TiO<SB>2</SB>≤40, 5≤Li<SB>2</SB>O+Na<SB>2</SB>O+K<SB>2</SB>O+Rb<SB>2</SB>O+Cs<SB>2</SB>O+MgO+CaO+SrO+BaO≤40. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、レーザ光照射によるガラスのレーザ加工に関し、特にレーザ加工に適したガラスの組成に関する。   The present invention relates to laser processing of glass by laser light irradiation, and particularly to a glass composition suitable for laser processing.

光通信等に用いる光学部品やディスプレイ装置に組み込むマイクロレンズなど、ガラス基板に微細加工を施した部材は広い分野で用いられている。このようなガラス基板に微細加工を施す方法としては、従来、フッ酸等のエッチング液を用いたウェットエッチング(化学エッチング)、あるいは反応性イオンエッチング等のドライエッチング(物理エッチング)によるのが一般的であった。   A member obtained by finely processing a glass substrate such as an optical component used for optical communication or a microlens incorporated in a display device is used in a wide range of fields. As a method for finely processing such a glass substrate, conventionally, wet etching (chemical etching) using an etching solution such as hydrofluoric acid or dry etching (physical etching) such as reactive ion etching is generally used. Met.

しかしながら、ウェットエッチングにはエッチング液の組成管理と廃液処理の問題がある。またドライエッチングには真空設備等が必要であり、またフォトリソグラフィー技術によってパターンマスク等を形成するなど複雑な工程を必要とし効率的でないという問題点がある。   However, wet etching has problems of etching solution composition management and waste liquid treatment. In addition, dry etching requires a vacuum facility and the like, and has a problem that it is not efficient because it requires a complicated process such as forming a pattern mask or the like by a photolithography technique.

他方、レーザ光を材料に照射し、加熱、溶融、蒸発、アブレーションなどの物理的変化を起こし、その変化を利用する直接加工技術も進展している。レーザ光は極めて小さなスポットに絞ることができるので、微細加工に適している。完全な物理的加工であるのでウェットエッチングのような問題はなく、また空気中での加工、レーザ光の走査による加工が可能であるので、従来のドライエッチングのような問題点もない。   On the other hand, direct processing technology that uses physical changes such as heating, melting, evaporation, and ablation by irradiating a material with laser light has also been developed. Since the laser beam can be focused to an extremely small spot, it is suitable for fine processing. Since it is a complete physical process, there is no problem like wet etching, and since it can be processed in the air or by scanning with laser light, there is no problem like conventional dry etching.

レーザ技術の発展により、レーザパルス幅の短縮化、短波長化が実現され、ポリイミド等の有機物や金属の加工においてはマイクロメートルオーダでの加工が可能となっている。 しかしながら、ガラスは脆性材料であるため、加工時にクラックが発生しやすい。そのためガラス材料に関しては微細加工にレーザ加工を用いることは容易でなかった。   With the development of laser technology, shortening of the laser pulse width and shortening of the wavelength have been realized, and processing of organic matter such as polyimide and metal can be performed on the order of micrometers. However, since glass is a brittle material, cracks are likely to occur during processing. Therefore, it has not been easy to use laser processing for fine processing for glass materials.

例えば、特開平11−217237号公報には、このような問題を解決するため、ガラスに銀をイオン交換で導入することにより、レーザの加工しきい値を低減させ、クラックの発生しにくいガラスを提供する技術が開示されている。   For example, in Japanese Patent Laid-Open No. 11-217237, in order to solve such a problem, by introducing silver into the glass by ion exchange, a laser processing threshold value is reduced, and a glass that is not easily cracked is produced. Techniques to provide are disclosed.

しかしながら、多くのアルカリ金属を含むガラスでは、銀イオン交換によって銀イオンを内部に導入できるものの、銀イオンはガラス表面近傍で還元され、ガラス内部への拡散が阻害されるという現象が生じる。このため有効なレーザ加工領域がガラス表面近傍に限られ、ガラス板に貫通孔を開けるなどガラス内部に及ぶ加工は依然として困難である。また、イオン交換速度が遅く、安定にガラス内部までイオンを到達させることが困難であるという問題もあった。   However, in a glass containing many alkali metals, although silver ions can be introduced into the inside by silver ion exchange, silver ions are reduced in the vicinity of the glass surface and diffusion into the glass is inhibited. For this reason, an effective laser processing region is limited to the vicinity of the glass surface, and it is still difficult to process the inside of the glass such as making a through hole in the glass plate. In addition, there is a problem that the ion exchange rate is slow and it is difficult to stably reach the ions inside the glass.

上記課題を解決するために、本発明ではイオン交換せずに溶融時にガラス中に導入でき、且つ、加工しきい値を低くするような元素を含んだレーザ加工用ガラスを提供することを目的とする。   In order to solve the above problems, an object of the present invention is to provide a laser processing glass containing an element that can be introduced into a glass at the time of melting without ion exchange and lowers a processing threshold. To do.

本発明の、吸収したレーザ光エネルギーによるアブレーションあるいは蒸発を利用するレーザ加工に用いるレーザ加工用ガラスは、実質的に以下の酸化物からなる組成を有することを特徴とする。
モル%で表示して、
20≦SiO2+B23≦50(ただし、10≦B23≦50)、
25≦TiO2≦40、
5≦Li2O+Na2O+K2O+Rb2O+Cs2O+MgO+CaO+SrO+BaO≦40
The glass for laser processing used for laser processing utilizing ablation or evaporation by absorbed laser beam energy of the present invention has a composition substantially consisting of the following oxides.
Displayed in mol%
20 ≦ SiO 2 + B 2 O 3 ≦ 50 (where 10 ≦ B 2 O 3 ≦ 50),
25 ≦ TiO 2 ≦ 40,
5 ≦ Li 2 O + Na 2 O + K 2 O + Rb 2 O + Cs 2 O + MgO + CaO + SrO + BaO ≦ 40

本発明のレーザ加工用ガラスは、実質的に以下の酸化物からなる組成を有していてもよい。
モル%で表示して、
20≦SiO2+B23≦50(ただし、10≦B23≦50)、
25≦TiO2≦40、
5≦Li2O+Na2O+K2O+Rb2O+Cs2O≦40
また、実質的に以下の酸化物からなる組成を有していてもよい。
モル%で表示して、
20≦SiO2+B23≦50(ただし、10≦B23≦50)、
25≦TiO2≦40、
5≦Li2O+Na2O+K2O≦40
The laser processing glass of the present invention may have a composition substantially consisting of the following oxides.
Displayed in mol%
20 ≦ SiO 2 + B 2 O 3 ≦ 50 (where 10 ≦ B 2 O 3 ≦ 50),
25 ≦ TiO 2 ≦ 40,
5 ≦ Li 2 O + Na 2 O + K 2 O + Rb 2 O + Cs 2 O ≦ 40
Moreover, you may have a composition which consists of the following oxides substantially.
Displayed in mol%
20 ≦ SiO 2 + B 2 O 3 ≦ 50 (where 10 ≦ B 2 O 3 ≦ 50),
25 ≦ TiO 2 ≦ 40,
5 ≦ Li 2 O + Na 2 O + K 2 O ≦ 40

上記の組成のガラスにおいては、レーザ光を吸収した際にガラスの構造の変化若しくは吸収率の変化が生じ、アブレーションあるいは蒸発が生じる。この現象を利用すればガラスの特定部分を除去する加工を施すことができ、加工に必要なエネルギーが少ない低加工しきい値ガラスが得られる。また、本発明のレーザ加工用ガラスは、ガラス表面近傍の加工にとどまらず、ガラス板に貫通孔を開けるなどガラス内部に及ぶ加工も容易に行うことができる。   In the glass having the above composition, when the laser beam is absorbed, the glass structure changes or the absorptance changes, and ablation or evaporation occurs. If this phenomenon is utilized, the process which removes the specific part of glass can be performed, and the low process threshold glass with little energy required for a process is obtained. Further, the laser processing glass of the present invention is not limited to processing in the vicinity of the glass surface, and processing that extends to the inside of the glass, such as opening a through hole in a glass plate, can be easily performed.

本発明の目的は、ガラスのレーザ加工性の改善にあり、その本質はより低いエネルギーによる加工が、ガラス表面から内部にわたって行えることにある。このようなレーザ加工性を評価する指標として、ガラス表面および内部における加工しきい値を用いた。   The object of the present invention is to improve the laser processability of glass, and the essence is that processing with lower energy can be performed from the glass surface to the inside. As an index for evaluating such laser processability, processing threshold values on the glass surface and inside were used.

加工しきい値は図2に示す光学系を用いて測定した。レーザ光源10としてはNd: YAGレーザの第3高調波(波長:355nm)および第4高調波(波長:266nm)の紫外光を用いた。このレーザ光源の繰り返し周波数は20Hzで、パルス幅は5〜8nsとした。レーザ光は焦点距離100mmのレンズ(図示しない)で集光し、試料ステージ20上の試料ホルダー30に固定したガラス試料40に照射した。照射時間は照射シャッタ50で制御し、2秒とした。   The processing threshold was measured using the optical system shown in FIG. As the laser light source 10, ultraviolet light of the third harmonic (wavelength: 355 nm) and the fourth harmonic (wavelength: 266 nm) of an Nd: YAG laser was used. The repetition frequency of this laser light source was 20 Hz, and the pulse width was 5 to 8 ns. The laser beam was condensed by a lens (not shown) having a focal length of 100 mm, and irradiated to the glass sample 40 fixed to the sample holder 30 on the sample stage 20. The irradiation time was controlled by the irradiation shutter 50 and set to 2 seconds.

レーザ光のエネルギーは照射シャッタを閉じた状態で、パワーメータをレーザ光の光路に入れて測定した。このエネルギーを種々変えて試料を照射し、アブレーションが起こる限界のエネルギーを求め、加工しきい値とした。   The energy of the laser beam was measured by putting a power meter in the optical path of the laser beam with the irradiation shutter closed. The sample was irradiated with this energy in various ways, the limit energy at which ablation occurred was determined and used as the processing threshold.

なお、レーザ光源12は高エネルギービームを発生するので、安全確保のため、遠隔操作可能とし、レーザ光源12への電源・冷却水供給装置14をリモートコントローラ16により操作する。特に図示していないが、レーザ光源12自身もシャッタを内蔵し、これも遠隔操作が可能である。また試料20を透過したレーザ光はビームダンパ18で吸収する。   Since the laser light source 12 generates a high energy beam, it can be remotely operated to ensure safety, and the power / cooling water supply device 14 to the laser light source 12 is operated by the remote controller 16. Although not specifically shown, the laser light source 12 itself has a built-in shutter, which can also be remotely operated. The laser light transmitted through the sample 20 is absorbed by the beam damper 18.

レーザ加工用ガラスは所定の原料を混合し、電気炉内で溶融後、徐冷することによって作製した。得られたガラスブロックを一般的な方法で切断研磨し、板状で表面が平滑な実験用レーザ加工用ガラス試料を準備した。以下、本発明を用いた実施例を示すが、本発明はこれらの実施例に限定されるものではない。   The glass for laser processing was produced by mixing predetermined raw materials, melting in an electric furnace, and then slowly cooling. The obtained glass block was cut and polished by a general method to prepare a glass sample for experimental laser processing having a plate shape and a smooth surface. Examples of the present invention will be described below, but the present invention is not limited to these examples.

[実施例]
本発明のレーザ加工用ガラスの実施例1〜11、参照例1〜7の組成を表1に示す。参照例1〜4、実施例1は、中間酸化物の量を変化させた組成である。参照例5、実施例2〜3は、実施例1の組成のうちTiO2の量を変えずに網目形成酸化物を変化させた例である。実施例4,5は、実施例1の組成のうちTiO2の量を変えずに修飾酸化物の添加量を変化させた例である。参照例6,7は網目形成酸化物のSiO2と中間酸化物のTiO2の量を大きく変えた組成である。実施例6〜11は、実施例1の組成のうちTiO2の量を変えずに修飾酸化物の種類を変化させた例である。
[Example]
Table 1 shows the compositions of Examples 1 to 11 and Reference Examples 1 to 7 of the laser processing glass of the present invention. Reference Examples 1 to 4 and Example 1 are compositions in which the amount of the intermediate oxide is changed. Reference Example 5 and Examples 2-3 are examples in which the network-forming oxide was changed without changing the amount of TiO 2 in the composition of Example 1. Examples 4 and 5 are examples in which the amount of the modified oxide added was changed without changing the amount of TiO 2 in the composition of Example 1. Reference examples 6 and 7 have compositions in which the amounts of network-forming oxide SiO 2 and intermediate oxide TiO 2 are greatly changed. Examples 6 to 11 are examples in which the type of the modified oxide was changed without changing the amount of TiO 2 in the composition of Example 1.

各成分の組成範囲は単位をモル%として次の範囲にある。
網目形成酸化物(SiO2、B23):20.0〜50.0
ただし、B23を10.0〜50.0モル%含有している。
中間酸化物(TiO2):25.0〜40.0
修飾酸化物(Li2O、Na2O、K2O、Rb2O、Cs2O、MgO、CaO、SrO、BaO):5.0〜40.0
本発明のレーザ加工ガラスは微量の不純物を除いて、実質的に上記の組成物のみからなる。また、TiO2、B23を除いて上記組成範囲を満たす限り、各成分は含有されなくてもよい。
The composition range of each component is in the following range with the unit as mol%.
Network-forming oxide (SiO 2 , B 2 O 3 ): 20.0 to 50.0
However, and the B 2 O 3 containing 10.0 to 50.0 mol%.
Intermediate oxide (TiO 2): 25.0~40.0
Modified oxides (Li 2 O, Na 2 O, K 2 O, Rb 2 O, Cs 2 O, MgO, CaO, SrO, BaO): 5.0 to 40.0
The laser-processed glass of the present invention consists essentially of the above composition except for a small amount of impurities. Moreover, as long as the composition range is satisfied except for TiO 2 and B 2 O 3 , each component may not be contained.

上記の組成のガラスにおいては、ガラスの網目形成酸化物であるSiO2またはB23を20〜79モル%含むことによってガラスとしての骨格を維持することができる。修飾酸化物であるLiO2、Na2O、K2O、Rb2O、Cs2O、MgO、CaO、SrO、またはBaOは、ガラスの網目構造を一部破壊するので、高温での粘性を弱めることや粘性の温度傾斜を緩くするために用いる成分である。5〜60モル%の添加範囲であればガラスを作製することができる。Al23またはTiO2は中間酸化物であり、網目形成酸化物であるSiO2またはB23と、修飾酸化物であるLiO2、Na2O、K2O、Rb2O、Cs2O、MgO、CaO、SrO、またはBaOのバランスに応じて、網目酸化物としても修飾酸化物としてもガラス中で存在することができる。特に中間酸化物のTiO2は後述のようにレーザ加工しきい値を下げるために必須の成分である。 In the glass having the above composition, the skeleton as glass can be maintained by containing 20 to 79 mol% of SiO 2 or B 2 O 3 which is a network-forming oxide of glass. The modified oxides LiO 2 , Na 2 O, K 2 O, Rb 2 O, Cs 2 O, MgO, CaO, SrO, or BaO partially destroy the glass network structure. It is a component used to weaken or loosen the temperature gradient of viscosity. A glass can be produced within an addition range of 5 to 60 mol%. Al 2 O 3 or TiO 2 is an intermediate oxide, and is a network-forming oxide SiO 2 or B 2 O 3 and modified oxides LiO 2 , Na 2 O, K 2 O, Rb 2 O, Cs Depending on the balance of 2 O, MgO, CaO, SrO, or BaO, both network oxides and modified oxides can be present in the glass. In particular, TiO 2 as an intermediate oxide is an essential component for lowering the laser processing threshold as will be described later.

上記の組成に溶融したレーザ加工用ガラス試料に照射エネルギーを変えながら波長266nmのレーザ光を照射した。この結果得られた表面加工しきい値を表2に示す。次にレーザ光の波長を355nmにして同様の実験を行った。その結果得られた表面加工しきい値を表3に示す。   The laser beam having a wavelength of 266 nm was irradiated to the glass sample for laser processing melted in the above composition while changing the irradiation energy. Table 2 shows the surface processing threshold values obtained as a result. Next, the same experiment was performed with the wavelength of the laser beam set to 355 nm. Table 3 shows the surface processing threshold values obtained as a result.

なお、波長266nmのレーザ光照射時のパワーメータで測定可能な最小パワーは15mWであり、その値以下の優劣は比較できなかった。また、波長355nmのレーザ光照射時においては、レーザの安定性の問題により100mW以下を精密に測定できなかった。   In addition, the minimum power measurable with the power meter at the time of laser beam irradiation with a wavelength of 266 nm is 15 mW, and superiority or inferiority below that value cannot be compared. Further, when irradiating a laser beam having a wavelength of 355 nm, 100 mW or less could not be accurately measured due to a problem of laser stability.

中間酸化物の量を変化させた参照例1〜4、実施例1では、図1に示すように、TiO2の量が増えるほど、加工しきい値が低くなっており、実施例1(TiO2:25モル%)では測定限界まで加工しきい値が低下している。実施例1の組成のうちTiO2の量を変えずに網目形成酸化物を変化させた参照例5、実施例2〜3では、網目形成酸化物であるSiO2とB23の割合を変化させても、しきい値は測定限界以下で変わらない。実施例1の組成のうちTiO2の量を変えずに修飾酸化物の添加量を変化させた実施例4,5では、修飾酸化物であるNa2Oの量を変化させても、しきい値は測定限界以下で変わらなかった。網目形成酸化物のSiO2と中間酸化物のTiO2の量を大きく変えた参照例6,7組成では、これらの組成でも加工しきい値は、比較例1、2よりも低く、Ti添加の効果がはたらいている。実施例1の組成のうちTiO2の量を変えずに修飾酸化物の種類を変化させた実施例6〜11では、修飾酸化物の種類を変化させても、しきい値は測定限界以下で変わらなかった。 In Reference Examples 1 to 4 and Example 1 in which the amount of the intermediate oxide is changed, as shown in FIG. 1, the processing threshold decreases as the amount of TiO 2 increases. 2 : 25 mol%), the processing threshold is lowered to the measurement limit. In Reference Example 5 and Examples 2 to 3 in which the network-forming oxide was changed without changing the amount of TiO 2 in the composition of Example 1, the ratio of SiO 2 and B 2 O 3 which are network-forming oxides was changed. Even if it is changed, the threshold value does not change below the measurement limit. In Examples 4 and 5 in which the amount of the modified oxide added was changed without changing the amount of TiO 2 in the composition of Example 1, the threshold was changed even when the amount of Na 2 O as the modified oxide was changed. The value did not change below the measurement limit. In the compositions of Reference Examples 6 and 7 in which the amounts of the network forming oxide SiO 2 and the intermediate oxide TiO 2 are greatly changed, the processing threshold is lower than those of Comparative Examples 1 and 2 even in these compositions. The effect is working. In Examples 6 to 11 in which the type of the modified oxide was changed without changing the amount of TiO 2 in the composition of Example 1, the threshold value was below the measurement limit even if the type of the modified oxide was changed. It didn't change.

[比較例1]
表4に示す組成(モル%)で原料を調合しガラス試料を作製した。このガラス試料は、実施例1〜5と良く似た組成であるが、実施例と同様に加工しきい値を求めると、レーザ光の波長が266nmの時の最大パワー1100mW、レーザ光の波長が355nmの時の最大パワー2100mWのどちらにおいても、アブレーション若しくは蒸発を起こさず、試料に変化はなかった。
[Comparative Example 1]
Raw materials were prepared with the composition (mol%) shown in Table 4 to prepare glass samples. This glass sample has a composition very similar to that of Examples 1 to 5. However, when the processing threshold is obtained in the same manner as in Examples, the maximum power is 1100 mW when the wavelength of the laser beam is 266 nm, and the wavelength of the laser beam is At either of the maximum powers of 2100 mW at 355 nm, no ablation or evaporation occurred, and the sample did not change.

[比較例2]
比較例として表5に示す組成(モル%)の材料を用いた。これは通常の窓ガラスなどに用いられる、いわゆるソーダライムガラスである。実施例と同様に加工しきい値を求めると、レーザ光の波長が266nmの時の最大パワー1100mW、レーザ光の波長が355nmの時の最大パワー2100mWのどちらにおいても、アブレーション若しくは蒸発を起こさず、試料に変化はなかった。
[Comparative Example 2]
As a comparative example, a material having a composition (mol%) shown in Table 5 was used. This is so-called soda lime glass used for ordinary window glass and the like. When the processing threshold is obtained in the same manner as in the example, ablation or evaporation does not occur in either of the maximum power 1100 mW when the wavelength of the laser beam is 266 nm and the maximum power 2100 mW when the wavelength of the laser beam is 355 nm, There was no change in the sample.

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以上より、酸化物ガラス中にチタンを添加することにより、紫外光におけるレーザ加工しきい値は顕著に減少することがわかる。またチタンの添加量が増大するほど加工しきい値は減少する。しかし網目形成酸化物や修飾酸化物の組成にはほとんど依存しない。なお、上記ではチタンはその酸化物の形態で表現しているが、その効果はチタンが原子、コロイドまたはイオンの形態であっても同様である。   From the above, it can be seen that the laser processing threshold in ultraviolet light is significantly reduced by adding titanium to the oxide glass. Further, the processing threshold value decreases as the amount of titanium added increases. However, it hardly depends on the composition of the network forming oxide or the modified oxide. In the above, titanium is expressed in the form of its oxide, but the effect is the same even if titanium is in the form of atoms, colloids or ions.

チタンはガラスの溶融時に添加できるので、添加量の制御は容易であり、したがってレーザ加工しきい値を制御しやすい。また溶融時の添加であるため、チタンはガラス中の濃度が均一である。このため、レーザ加工しきい値は被加工ガラス体中で一定であり、ガラス内部に及ぶ加工、例えば貫通孔の形成等が容易に行える。   Since titanium can be added when the glass is melted, the amount added is easy to control, and therefore the laser processing threshold can be easily controlled. Further, since it is added at the time of melting, the concentration of titanium in the glass is uniform. For this reason, the laser processing threshold is constant in the glass body to be processed, and processing that extends into the glass, for example, formation of through holes, can be easily performed.

本発明により、加工に必要なエネルギーが少ない、低加工しきい値ガラスが得られる。さらに溶融によってチタンをガラス中に導入することができるので、チタンの添加量を変えて加工しきい値を制御しやすく、また、均一な加工性を有する材料を得ることができる。   According to the present invention, a low processing threshold glass with less energy required for processing can be obtained. Furthermore, since titanium can be introduced into the glass by melting, the processing threshold can be easily controlled by changing the amount of titanium added, and a material having uniform workability can be obtained.

本発明のレーザ加工用ガラスの加工特性を示す図である。It is a figure which shows the processing characteristic of the glass for laser processing of this invention. レーザ加工しきい値測定用光学系を示す模式図である。It is a schematic diagram which shows the optical system for laser processing threshold value measurement.

符号の説明Explanation of symbols

10 レーザ光
12 レーザ光線
20 ガラス試料
22 試料ホルダ
24 試料ステージ
30 照射シャッタ
40 パワーメータ
DESCRIPTION OF SYMBOLS 10 Laser beam 12 Laser beam 20 Glass sample 22 Sample holder 24 Sample stage 30 Irradiation shutter 40 Power meter

Claims (3)

吸収したレーザ光エネルギーによるアブレーションあるいは蒸発を利用するレーザ加工に用いるレーザ加工用ガラスにおいて、
実質的に以下の酸化物からなる組成を有することを特徴とするレーザ加工用ガラス。
モル%で表示して、
20≦SiO2+B23≦50(ただし、10≦B23≦50)、
25≦TiO2≦40、
5≦Li2O+Na2O+K2O+Rb2O+Cs2O+MgO+CaO+SrO+BaO≦40
In laser processing glass used for laser processing using ablation or evaporation by absorbed laser light energy,
A laser processing glass characterized by having a composition substantially consisting of the following oxides.
Displayed in mol%
20 ≦ SiO 2 + B 2 O 3 ≦ 50 (where 10 ≦ B 2 O 3 ≦ 50),
25 ≦ TiO 2 ≦ 40,
5 ≦ Li 2 O + Na 2 O + K 2 O + Rb 2 O + Cs 2 O + MgO + CaO + SrO + BaO ≦ 40
前記組成が、実質的に以下の酸化物からなる、請求項1に記載のレーザ加工用ガラス。
モル%で表示して、
20≦SiO2+B23≦50(ただし、10≦B23≦50)、
25≦TiO2≦40、
5≦Li2O+Na2O+K2O+Rb2O+Cs2O≦40
The glass for laser processing according to claim 1, wherein the composition is substantially composed of the following oxide.
Displayed in mol%
20 ≦ SiO 2 + B 2 O 3 ≦ 50 (where 10 ≦ B 2 O 3 ≦ 50),
25 ≦ TiO 2 ≦ 40,
5 ≦ Li 2 O + Na 2 O + K 2 O + Rb 2 O + Cs 2 O ≦ 40
前記組成が、実質的に以下の酸化物からなる、請求項1に記載のレーザ加工用ガラス。
モル%で表示して、
20≦SiO2+B23≦50(ただし、10≦B23≦50)、
25≦TiO2≦40、
5≦Li2O+Na2O+K2O≦40
The glass for laser processing according to claim 1, wherein the composition is substantially composed of the following oxide.
Displayed in mol%
20 ≦ SiO 2 + B 2 O 3 ≦ 50 (where 10 ≦ B 2 O 3 ≦ 50),
25 ≦ TiO 2 ≦ 40,
5 ≦ Li 2 O + Na 2 O + K 2 O ≦ 40
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06115969A (en) * 1992-10-08 1994-04-26 Ohara Inc Optical glass
JP2000143285A (en) * 1998-11-06 2000-05-23 Toyo Glass Co Ltd Glass for substrate of information recording medium and glass substrate for information recording medium using same

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06115969A (en) * 1992-10-08 1994-04-26 Ohara Inc Optical glass
JP2000143285A (en) * 1998-11-06 2000-05-23 Toyo Glass Co Ltd Glass for substrate of information recording medium and glass substrate for information recording medium using same

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