JP2007324008A - Electro-spray ion source and mass spectrometer equipped with it - Google Patents

Electro-spray ion source and mass spectrometer equipped with it Download PDF

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JP2007324008A
JP2007324008A JP2006154142A JP2006154142A JP2007324008A JP 2007324008 A JP2007324008 A JP 2007324008A JP 2006154142 A JP2006154142 A JP 2006154142A JP 2006154142 A JP2006154142 A JP 2006154142A JP 2007324008 A JP2007324008 A JP 2007324008A
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ion source
voltage
mass spectrometer
tip
nozzle
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Kazutomi Sato
一臣 佐藤
Susumu Watanabe
進 渡辺
Makoto Hashimoto
誠 橋本
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
Hitachi High Tech Corp
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<P>PROBLEM TO BE SOLVED: To provide an electro-spray ion source which ionizes a sample by emitting the sample from a nozzle by impressing voltage and a mass spectrometer, in which the voltage impressed is automatically adjusted to a specified value so that a liquid drop is not generated at the nozzle tip. <P>SOLUTION: The mass spectrometer comprises a CCD camera with light receiving sensor which monitors the tip of an ESI chip and sends a signal to an air spray device when a liquid drop with an established radius or more is generated at the tip of the ESI chip, the air spray device which blows out the liquid drop by automatically spraying air when it receives a signal from the CCD camera with light receiving sensor. When the air spray device blows out the liquid drop, a signal is received and the voltage is automatically increased for an established portion and voltage increase is repeated until the liquid drop is no more generated. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は質量分析計に適用されるエレクトロスプレイイオン源、及びそれを備えた質量分析計に係り、特に装置の立ち上げ準備が容易なエレクトロスプレイイオン源及びそれを備えた質量分析計に関する。   The present invention relates to an electrospray ion source applied to a mass spectrometer and a mass spectrometer equipped with the electrospray ion source, and more particularly, to an electrospray ion source that can be easily set up for an apparatus and a mass spectrometer equipped with the electrospray ion source.

液体試料を質量分析計で測定する従来の技術の一つには図1に示すような、液体クロマトグラフ(LC)1と、液体試料を注入するオートサンプラ2と、カラム3と、エレクトロスプレーインターフェース(以下ESI)チップと、質量分析計5から構成されるシステム(LC−ESI−MS)がある。図に示すように液体クロマトグラフ(LC)1は2種類の溶媒(b,c)とそれを送りだすポンプaから成り、質量分析計5はイオン源d,分析計e,検出器fから成る。このシステムにおいて溶媒或いは液体試料は質量分析計5のイオン源dに到達する際、200〜300℃の高温と1〜4kVの加電圧によって気化し、イオン化された状態となる。本実施例では、質量分析計は1価イオン当たりの質量数(m/z)を測定している。LC−ESI−MS或いはLC−ESI−MS/MSにおいては試料を測定する前にまず、溶媒のみを流した状態で安定してイオン化する条件、特に電圧の値を設定する。この際、適切な電圧の場合には溶媒は気化し、質量分析計5のイオン源dへ入っていくが、電圧が低い場合には溶媒は十分に気化できず溶液のままなので、チップの先に液玉となって溜まってしまう。液のまま質量分析計5のイオン源dに入ってしまうと、液に汚染物質が混入していた場合にはイオン源dを汚してしまい、洗浄作業をしなければならない場合がある。   One conventional technique for measuring a liquid sample with a mass spectrometer is a liquid chromatograph (LC) 1 as shown in FIG. 1, an autosampler 2 for injecting a liquid sample, a column 3, and an electrospray interface. There is a system (LC-ESI-MS) composed of (hereinafter referred to as ESI) chip and mass spectrometer 5. As shown in the figure, the liquid chromatograph (LC) 1 is composed of two kinds of solvents (b, c) and a pump a that sends them out, and the mass spectrometer 5 is composed of an ion source d, an analyzer e, and a detector f. In this system, when the solvent or liquid sample reaches the ion source d of the mass spectrometer 5, it is vaporized by a high temperature of 200 to 300 ° C. and an applied voltage of 1 to 4 kV to be in an ionized state. In this example, the mass spectrometer measures the mass number per monovalent ion (m / z). In LC-ESI-MS or LC-ESI-MS / MS, before measuring a sample, first, conditions for stable ionization in a state in which only a solvent is passed, particularly a voltage value, are set. At this time, when the voltage is appropriate, the solvent evaporates and enters the ion source d of the mass spectrometer 5. However, when the voltage is low, the solvent cannot be sufficiently evaporated and remains in solution, so It becomes a liquid ball and accumulates. If the liquid enters the ion source d of the mass spectrometer 5 in a liquid state, if the contaminant is mixed in the liquid, the ion source d may be contaminated and a cleaning operation may be required.

この洗浄作業を容易にする技術が特許文献1に記載されている。   A technique for facilitating this cleaning operation is described in Patent Document 1.

このような洗浄作業をさけるため、イオン化が安定するまでは常時、チップの先を監視して液玉ができた場合にはエアー吹きで液玉を飛ばし電圧を少しずつ上げる作業を操作者が行うのが一般的である。   In order to avoid such cleaning work, until ionization stabilizes, the operator always performs the work of monitoring the tip of the chip and blowing the liquid ball by air blowing to raise the voltage little by little when the liquid ball is made. Is common.

特開2005−259477号公報JP 2005-259477 A

前述したイオン化を安定させる作業においてはチップの先を監視して液玉ができた場合にはエアー吹きで液玉を飛ばし、電圧が適切になるまで人が監視しなければならない。このため、安定してイオン化する電圧条件設定作業に時間がかかっていた。本発明の目的は、人手を要さずにイオン化の安定化作業が可能な機構を備えた質量分析計を提供することにある。   In the above-described work for stabilizing ionization, if a liquid ball is formed by monitoring the tip of the chip, the liquid ball must be blown off by air blowing and monitored by a person until the voltage becomes appropriate. For this reason, it took time to set voltage conditions for stable ionization. The objective of this invention is providing the mass spectrometer provided with the mechanism in which the stabilization operation | work of ionization is possible without requiring a manual labor.

上記目的を達成するための本発明の構成は以下の通りである。   The configuration of the present invention for achieving the above object is as follows.

エレクトロスプレイイオン源のサンプルを放出するノズル先端を光学的に監視する監視手段と、該監視手段が、前記ノズル先端に液玉が発生したことを検出したことに応じて、該ノズルに気流を吹き付ける気流吹き付け手段と、を備えたエレクトロスプレイイオン源。   A monitoring means for optically monitoring the tip of the nozzle that discharges the sample of the electrospray ion source, and the monitoring means blows an airflow to the nozzle in response to detecting that a liquid ball is generated at the nozzle tip. An electrospray ion source comprising:

監視手段はCCDカメラであることがコストの点から好ましいが、ノズル先端を光学的に監視できるものであればどのようなものでも良い。ノズル(ESIチップ)の先端を監視し、ESIチップの先端に設定した半径以上の液玉ができると、エアー吹き装置に信号を送り、信号を受けたエアー吹き装置は自動でエアーを吹くことにより液玉を吹き飛ばす。続いて、エアー吹き装置が液玉を吹き飛ばすと、信号が質量分析計に送られ、設定した分だけ自動で電圧上昇し、液玉ができなくなるまで電圧上昇を繰り返す機能があっても良い。また、質量分析計の電圧が上がりすぎた場合にはアラームで異常を知らせる機能も持つことが好ましい。   The monitoring means is preferably a CCD camera from the viewpoint of cost, but any monitoring means can be used as long as it can optically monitor the nozzle tip. The tip of the nozzle (ESI chip) is monitored, and when a liquid ball larger than the radius set at the tip of the ESI chip is produced, a signal is sent to the air blowing device, and the air blowing device that receives the signal automatically blows air. Blow off the liquid ball. Subsequently, when the air blowing device blows off the liquid ball, a signal may be sent to the mass spectrometer, and the voltage may be automatically increased by a set amount and repeated until the liquid ball is no longer formed. It is also preferable to have a function of notifying abnormality by an alarm when the voltage of the mass spectrometer is excessively increased.

本発明によれば、LC−ESI−MSにおいて安定してイオン化する電圧条件設定作業を自動で行う事ができる。   According to the present invention, it is possible to automatically perform voltage condition setting work for stable ionization in LC-ESI-MS.

以下、発明の実施例を図面を用いて説明する。   Embodiments of the present invention will be described below with reference to the drawings.

図1は本発明に関わる質量分析装置の一般的な構成図を示している。本実施例では液体クロマトグラフ(LC)1としてmichrom BioResources社製のHPLC MAGIC2002、オートサンプラ2としてCTCアナリティカル社製のHTS−Pal、及び質量分析計5としてサーモエレクトロン社製のLCQdecaXPを使用している。   FIG. 1 shows a general configuration diagram of a mass spectrometer according to the present invention. In this example, HPLC MAGIC2002 manufactured by michrom BioResources is used as the liquid chromatograph (LC) 1, HTS-Pal manufactured by CTC Analytical is used as the autosampler 2, and LCQdecaXP manufactured by Thermo Electron is used as the mass spectrometer 5. Yes.

図2はLC−ESI−MSのESIイオン源及び、今回の発明で新たに設置された装置(エアー吹き装置6,受光センサ付きCCDカメラ7,モニター8,ESIチップ先端に光を投射する光源9)を示した。図中の矢印(1)(2)は信号の流れを示す。(1)
ESIチップ先端の溶媒が液玉化すると光源からの光は液玉に反射または吸収され、受光センサ付きCCDカメラ7が感知し、像がモニター8に映し出される。モニター8では
ESIチップ先端部に対して0点を合わせ、0点からESIチップ先端部に形成される液滴半径を監視する。受光センサ付きCCDカメラ7は液玉の半径が使用者の設定した値以上になると信号をエアー吹き装置6に送る。(2)エアー吹き装置6は受光センサ付き
CCDカメラ7から信号を受けるとエアーを吹き、エアーが吹かれると信号がエアー吹き装置6から質量分析計に送られ、質量分析計は電圧が低いと判断して自動で電圧を使用者が設定した値だけ上昇する。
FIG. 2 shows an ESI ion source of LC-ESI-MS, and a newly installed device (air blowing device 6, CCD camera 7 with a light receiving sensor, monitor 8, light source 9 for projecting light on the tip of the ESI chip. )showed that. Arrows (1) and (2) in the figure indicate the flow of signals. (1)
When the solvent at the tip of the ESI chip becomes liquid droplets, the light from the light source is reflected or absorbed by the liquid balls, sensed by the CCD camera 7 with a light receiving sensor, and an image is displayed on the monitor 8. The monitor 8 aligns the 0 point with respect to the ESI tip end, and monitors the radius of the droplet formed on the ESI tip from the 0 point. The CCD camera 7 with a light receiving sensor sends a signal to the air blowing device 6 when the radius of the liquid ball becomes equal to or greater than the value set by the user. (2) When the air blowing device 6 receives a signal from the CCD camera 7 with the light receiving sensor, it blows air. When the air is blown, the signal is sent from the air blowing device 6 to the mass spectrometer, and the mass spectrometer has a low voltage. Judging and automatically increasing the voltage by the value set by the user.

図3はESIチップの設置位置とエアーを吹く角度(横から見た図)を示す。ESIチップの設置位置は液玉が飛んだ際に直接質量分析計内に入らないために、電圧のかかる方向からずれている方が良い。20〜40度くらいの角度がよく、本実施例では20度に設置した。また、エアーを吹く角度も液玉が飛んだ際に直接質量分析計内に入らないために、電圧のかかる方向からずれている方が良く、図2に示すようにチップに対して20度くらいが良い。   FIG. 3 shows the installation position of the ESI chip and the air blowing angle (viewed from the side). Since the position of the ESI chip does not directly enter the mass spectrometer when the liquid ball flies, it is better to deviate from the voltage application direction. An angle of about 20 to 40 degrees is good, and in this embodiment, the angle is set to 20 degrees. Also, the air blowing angle should not be directly in the mass spectrometer when the liquid ball flies, so it is better to deviate from the direction where the voltage is applied. As shown in FIG. Is good.

図4はESIチップ、とエアーを吹く角度(上から見た図)を示す。本実施例ではESIチップの設置位置は20度に設置し、エアーを吹く角度は20度に設置した。設置する角度を定めた理由は図3の説明で前述したのと同じ理由である。   FIG. 4 shows the ESI chip and the air blowing angle (viewed from above). In the present embodiment, the installation position of the ESI chip was set at 20 degrees, and the air blowing angle was set at 20 degrees. The reason for determining the installation angle is the same reason as described above with reference to FIG.

図5は受光センサ付きCCDカメラ7と光源9の設置位置を示す。イオン化の邪魔にならなく、液玉が飛んだ時に当たらない位置であればよい。本実施例では図5に示すように電圧のかかる方向に対して垂直方向に設置した。また、受光センサ付きCCDカメラ7からESIチップ先端までの距離と光源9からESIチップ先端までの距離は本実施例では共に10cmとした。   FIG. 5 shows the installation positions of the CCD camera 7 with the light receiving sensor and the light source 9. Any position that does not interfere with ionization and does not hit when the liquid ball flies is acceptable. In this embodiment, as shown in FIG. 5, it is installed in a direction perpendicular to the direction in which the voltage is applied. In this embodiment, the distance from the CCD camera 7 with the light receiving sensor to the ESI chip tip and the distance from the light source 9 to the ESI chip tip are both 10 cm.

図6は本実施例のフローチャートを示す。   FIG. 6 shows a flowchart of this embodiment.

本発明の実施例を図6のフロー図を元に説明する。   An embodiment of the present invention will be described based on the flowchart of FIG.

まず、使用者はエアー吹き装置と質量分析計の設定を行う。エアー吹き装置に関してはエアーを吹く基準として液玉の球の半径rが使用者の設定した値を超えた時とするが、本実施例では0.5mmとした。また、エアーの吹き方は0.5〜1.0cm3/秒で2秒とした。次に質量分析計に関する設定を行う。実施するイオン化の安定化作業の開始時の最低電圧m,最高電圧Mを設定する。最高電圧は高すぎる電圧だと、ESIチップを損傷する可能性があるため、それ以上電圧が上がるとESIチップを損傷する値を設定する。また、一回エアーが吹かれると上昇する電圧上昇値δ、イオン化の安定時間Tを設定する。本実施例では最低電圧mを1.8kV、最高電圧Mを4.0kV、電圧上昇値δを0.1kV 、イオン化の安定時間Tを15分間に設定した。 First, the user sets an air blowing device and a mass spectrometer. Regarding the air blowing device, when the radius r of the liquid ball exceeds the value set by the user as a reference for blowing air, it is set to 0.5 mm in this embodiment. Air was blown at 0.5 to 1.0 cm 3 / sec for 2 seconds. Next, make settings for the mass spectrometer. The minimum voltage m and the maximum voltage M at the start of the ionization stabilization work to be performed are set. If the maximum voltage is too high, the ESI chip may be damaged. Therefore, a value that damages the ESI chip when the voltage further increases is set. Further, a voltage increase value δ that increases when air is blown once and an ionization stabilization time T are set. In this embodiment, the minimum voltage m is set to 1.8 kV, the maximum voltage M is set to 4.0 kV, the voltage increase value δ is set to 0.1 kV, and the ionization stabilization time T is set to 15 minutes.

受光センサ付きCCDカメラ,モニター,光源の電源をONにした状態で、エアー吹き装置と質量分析計をスタートさせる。最初電圧が低いと液玉ができ、その半径が基準値rを超えると、受光センサ付きCCDカメラからエアー吹き装置に信号が送られエアーを1回吹く。すると、今度は信号が質量分析計に送られ、電圧がδ上昇する。それでも、液玉ができた場合にはまた、液玉の半径がrを超えると再び受光センサ付きCCDカメラからエアー吹き装置に信号が送られエアーを1回吹き、信号が質量分析計に送られ、電圧がδ上昇する。この過程を繰り返すうちに適切な電圧になり液玉ができなくなり、質量分析計に信号受信のない時間すなわちイオン化の安定した時間がTに到達すると、イオン化が安定したことを知らせるアラームが使用者に通達される。また、イオン化の安定した時間がTに到達しない場合には再び電圧上昇を続ける。電圧が最高電圧Mに到達しても、イオン化が安定化しない場合には、異常を知らせるアラームが使用者に通達される。この場合電圧の設定以外の箇所に異常があることが考えられる。   With the CCD camera with light receiving sensor, monitor, and light source turned on, the air blowing device and mass spectrometer are started. When the voltage is initially low, a liquid ball is formed, and when the radius exceeds the reference value r, a signal is sent from the CCD camera with a light receiving sensor to the air blowing device to blow air once. This time, a signal is sent to the mass spectrometer and the voltage increases by δ. Still, when a liquid ball is formed, when the radius of the liquid ball exceeds r, a signal is sent again from the CCD camera with the light receiving sensor to the air blowing device, and air is blown once, and the signal is sent to the mass spectrometer. The voltage increases by δ. When this process is repeated, the voltage becomes appropriate and the liquid ball is no longer formed, and when the time when no signal is received by the mass spectrometer, that is, when the ionization stable time reaches T, an alarm is sent to the user informing that the ionization is stable. Be notified. Further, when the ionization stable time does not reach T, the voltage continues to rise again. If the ionization is not stabilized even when the voltage reaches the maximum voltage M, an alarm for notifying the user is notified. In this case, there may be an abnormality in a place other than the voltage setting.

以上の過程を電圧が適切な値になるまで、あるいは最高電圧に到達するまで繰り返す。   The above process is repeated until the voltage reaches an appropriate value or reaches the maximum voltage.

本発明に関わる質量分析装置の一般的な構成図。1 is a general configuration diagram of a mass spectrometer according to the present invention. LC−ESI−MSのESIイオン源及び、今回の発明で新たに設置された装置の概略図。Schematic of the ESI ion source of LC-ESI-MS and the apparatus newly installed by this invention. ESIチップの設置位置とエアーを吹く角度(横から見た図)を示す図。The figure which shows the installation position of an ESI chip | tip, and the angle (view seen from the side) which blows air. ESIチップ、とエアーを吹く角度(上から見た図)を示す図。The figure which shows the angle (view seen from the top) which blows an ESI chip | tip and air. 受光センサ付きCCDカメラ7と光源9の設置位置を示す図。The figure which shows the installation position of CCD camera 7 with a light receiving sensor, and the light source 9. FIG. 本実施例のフローチャートを示す図。The figure which shows the flowchart of a present Example.

符号の説明Explanation of symbols

1…液体クロマトグラフ(LC)、2…オートサンプラー、3…カラム、4…ESIチップ、5…質量分析計、6…エアー吹き装置、7…受光センサ付きCCDカメラ、8…モニター、9…光源、a…ポンプ、b…溶媒A、c…溶媒B、d…ESIイオン源、e…分析計、f…検出器。   DESCRIPTION OF SYMBOLS 1 ... Liquid chromatograph (LC), 2 ... Autosampler, 3 ... Column, 4 ... ESI chip, 5 ... Mass spectrometer, 6 ... Air blower, 7 ... CCD camera with a photo sensor, 8 ... Monitor, 9 ... Light source A ... pump, b ... solvent A, c ... solvent B, d ... ESI ion source, e ... analyzer, f ... detector.

Claims (5)

エレクトロスプレイイオン源のサンプルを放出するノズル先端を光学的に監視する監視手段と、
該監視手段が、前記ノズル先端に液玉が発生したことを検出したことに応じて、該ノズルに気流を吹き付ける気流吹き付け手段と、
を備えたことを特徴とするエレクトロスプレイイオン源。
Monitoring means for optically monitoring the nozzle tip emitting the sample of the electrospray ion source;
An airflow blowing means for blowing an airflow to the nozzle in response to detecting that the liquid ball is generated at the tip of the nozzle;
An electrospray ion source comprising:
請求項1記載のエレクトロスプレイイオン源において、
前記監視手段は、前記ノズル先端に発生した液玉が予め設定した半径以上になったかどうかを判断する判断手段を備え、該判断手段が前記液玉が前記半径以上になったことを判断したことに基づいて、前記気流吹き付け手段が気流を吹き付けるように制御する制御手段を備えたことを特徴とするエレクトロスプレイイオン源。
The electrospray ion source of claim 1
The monitoring unit includes a determination unit that determines whether or not the liquid ball generated at the tip of the nozzle is equal to or larger than a preset radius, and the determination unit determines that the liquid ball is equal to or larger than the radius. An electrospray ion source comprising control means for controlling the airflow blowing means to blow an airflow based on the above.
請求項1または2記載のエレクトロスプレイイオン源において、
前記気流吹き付け手段が気流を吹き付けたことに応じて、予め設定した電圧を前記ノズルに印加する電圧に加える電圧調整手段を備えたことを特徴とするエレクトロスプレイイオン源。
The electrospray ion source according to claim 1 or 2,
An electrospray ion source comprising voltage adjusting means for applying a preset voltage to a voltage applied to the nozzle in response to the air current blowing means blowing air current.
請求項2または3記載のエレクトロスプレイイオン源において、
前記ノズルに印加する電圧が予め設定した電圧を超えた場合には警告を発する警告発生手段を備えたことを特徴とするエレクトロスプレイイオン源。
The electrospray ion source according to claim 2 or 3,
An electrospray ion source comprising warning generating means for issuing a warning when a voltage applied to the nozzle exceeds a preset voltage.
請求項1〜4のいずれかに記載のエレクトロスプレイイオン源を備えたことを特徴とする質量分析計。   A mass spectrometer comprising the electrospray ion source according to claim 1.
JP2006154142A 2006-06-02 2006-06-02 Electro-spray ion source and mass spectrometer equipped with it Pending JP2007324008A (en)

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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121041A (en) * 1991-10-31 1993-05-18 Yokogawa Electric Corp High frequency induction coupling plasma mass spectrometer
JPH07248296A (en) * 1994-03-14 1995-09-26 Jeol Ltd Sample atomizer for plasma analyzer
JP2002015697A (en) * 2000-06-30 2002-01-18 Jeol Ltd Electrospray ion source
JP2003203599A (en) * 2003-02-03 2003-07-18 Hitachi Ltd Mass spectrometer
WO2003065405A1 (en) * 2002-01-31 2003-08-07 Hitachi High-Technologies Corporation Electro-spray ionization mass spectrometer and method therefor
JP2003329647A (en) * 2002-05-13 2003-11-19 Hitachi Ltd Explosive detection system
JP2004534354A (en) * 2001-05-24 2004-11-11 ニューオブジェクティブ,インク. Method and apparatus for feedback control of electrospray
JP2007127555A (en) * 2005-11-04 2007-05-24 Hitachi High-Tech Science Systems Corp Mass spectrometer

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121041A (en) * 1991-10-31 1993-05-18 Yokogawa Electric Corp High frequency induction coupling plasma mass spectrometer
JPH07248296A (en) * 1994-03-14 1995-09-26 Jeol Ltd Sample atomizer for plasma analyzer
JP2002015697A (en) * 2000-06-30 2002-01-18 Jeol Ltd Electrospray ion source
JP2004534354A (en) * 2001-05-24 2004-11-11 ニューオブジェクティブ,インク. Method and apparatus for feedback control of electrospray
WO2003065405A1 (en) * 2002-01-31 2003-08-07 Hitachi High-Technologies Corporation Electro-spray ionization mass spectrometer and method therefor
JP2003329647A (en) * 2002-05-13 2003-11-19 Hitachi Ltd Explosive detection system
JP2003203599A (en) * 2003-02-03 2003-07-18 Hitachi Ltd Mass spectrometer
JP2007127555A (en) * 2005-11-04 2007-05-24 Hitachi High-Tech Science Systems Corp Mass spectrometer

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