JP2007264243A - Method for inspecting electro-optical device, and electronic apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for inspecting an electro-optical device, which is capable of improving the detection accuracy of pixels showing poor light-emitting performance, and to provide an electronic apparatus provided with the electro-optical device inspected by this method. <P>SOLUTION: Red pixels R, green pixels G, and blue pixels B arranged in stripe forms are lit by every other row, and respective light-emitting states of lit read pixels R, green pixels G, and blue pixels B are inspected by visual observation. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to an inspection method for an electro-optical device and an electronic apparatus.

Conventionally, liquid crystal displays, organic EL displays, and the like have attracted attention as display displays from the viewpoint of weight reduction and thickness reduction. In a liquid crystal display, pixels having liquid crystal elements are arranged in a matrix on a substrate, and a color filter including a red conversion layer, a green conversion layer, and a blue conversion layer is provided for each pixel. .

In general, the red, green, and blue conversion layers of the color filter are arranged in stripes so that the color conversion layers of the same color are along the column direction. Then, the light emitted from each pixel is transmitted through each color conversion layer to be converted into red light, green light, and blue light, thereby displaying a desired color image.

Incidentally, in general, the various displays described above are inspected for whether each pixel emits light with an appropriate luminance before shipment. Specifically, as shown in FIG.
Among the plurality of pixels, only the pixel (red pixel) R facing the red conversion layer is turned on, and the red pixel R with poor light emission is detected by visually checking the state. Next, as shown in FIG. 8B, only the pixel (green pixel) G facing the green conversion layer is turned on and the state thereof is visually observed to detect the green pixel G with a defective light emission. After that, as shown in FIG. 8C, only the pixel (blue pixel) facing the blue conversion layer is turned on, and the state thereof is visually observed to detect the blue pixel B having a poor light emission ( For example, see Patent Document 1).
JP 2000-137200 A

However, in recent years, there has been an increasing demand for display displays that can display high-definition images. For this reason, the pixels are arranged at a high density by reducing the size of each pixel and the arrangement pitch of each pixel. I have to. Accordingly, the arrangement pitch of adjacent pixels of the same color is also narrowed. Therefore, in the inspection process for each pixel, the light from each pixel in a predetermined column and the other adjacent light emitting the same color as the pixel are emitted. The light from the columns of pixels will mix. As a result, even if a defective pixel does not emit light, it appears as if the defective pixel is shining with appropriate luminance by the light from the adjacent pixel. Therefore, it is difficult to specify the position of the pixel with poor light emission, and there is a problem that the detection accuracy of the pixel with poor light emission is lowered.

The present invention has been made in view of the above problems, and an inspection method for an electro-optical device capable of improving the detection accuracy of a pixel having a light emission failure, and an electron including the electro-optical device inspected by the inspection method. To provide equipment.

The electro-optical device inspection method according to the present invention includes an electro-optical device including an electro-optical panel in which a plurality of pixels arranged in a column direction and a plurality of pixels that emit light of the same color are arranged on a substrate. In this inspection method, at least every other column of pixels emitting the same color light is lit, and the light emission state of each pixel in the lit pixel column is detected.

According to this, since the pixel columns that emit light of a predetermined color among a plurality of pixels are caused to emit light at least every other column, the interval between the pixel columns of the same color to be lit is widened. Therefore, even when the pixel arrangement pitch that enables high-definition image display is narrow, the light from each pixel arranged along a given column is arranged along the other column. Therefore, it is easy to detect the position of a defective pixel that does not emit light. As a result, detection accuracy can be improved.

In this electro-optical device inspection method, the pixel array in which the plurality of pixels are arranged includes a pixel array of red pixels that emits red light, a pixel array of green pixels that emits green light, and a blue pixel array. The pixel array of blue pixels that emit light, the pixel array of red pixels, the pixel array of green pixels, and the pixel array of blue pixels are repeatedly arranged in a predetermined order in the row direction. May be.

According to this, it becomes easy to detect the position of a defective pixel that does not emit light in an electro-optical panel of an electro-optical device that emits red, green, and blue light to perform full-color display.
In the inspection method of the electro-optical device, when detecting the light emission state of the pixel column of each pixel that emits light of a color different from the pixel column of the pixel that has been lit and detected earlier, the light is lit first. A light emitting state of each pixel may be detected by lighting a pixel group in a column not adjacent to the pixel column of the pixel.

According to this, the pixel column of the pixel that emits light of a color different from the pixel column of the previously inspected pixel is not inspected subsequent to the pixel in the adjacent pixel column that is lit earlier. . Therefore,
Visual recognition of afterimages can be eliminated. As a result, the electrodes of the pixels in the adjacent pixel columns are electrically connected to each other, and as a result, it is possible to improve the detection accuracy of a so-called connection defect that emits light lower than the desired luminance. .

In the inspection method of the electro-optical device, the electro-optical panel may be a liquid crystal panel.
According to this, it is possible to improve the detection accuracy of the defective pixel in the liquid crystal panel.

The electronic apparatus of the present invention includes the electro-optical device inspected by the above-described electro-optical device inspection method.
According to this, since the electro-optical device detects the defective pixel of the light emission by the inspection method, the electro-optical device includes a pixel having almost no defective light emission. Accordingly, an electronic device that can display a high-quality image can be provided.

(First embodiment)
Hereinafter, a first embodiment of the present invention will be described with reference to FIGS. First, a liquid crystal display as an electro-optical device inspected by the inspection method of the present invention will be described.

FIG. 1 is a perspective view of a liquid crystal display, and FIG. 2 is a cross-sectional view taken along line AA of FIG.
In FIG. 1, a liquid crystal display 1 is a known liquid crystal display, and includes a liquid crystal panel 2 as an electro-optical panel, and a planar light that is provided on the side of the liquid crystal panel 2 in the direction of the arrow Z in FIG. An irradiation device (not shown) for irradiating Lo (see FIG. 2) is provided.

The liquid crystal panel 2 includes an element substrate 3 as a substrate, a counter substrate 4 and a color filter 5.
The element substrate 3 → the counter substrate 4 → the color filter 5 are stacked in this order from the irradiation apparatus side, that is, in the direction opposite to the arrow Z in FIG. In FIG. 1, for convenience of explanation, the counter substrate 4 and the color filter 5 are drawn separately.

As shown in FIG. 1, the element substrate 3 is a square plate-like non-alkali glass substrate, and the side surface (element formation surface 3a) on the counter substrate 4 side has an X arrow direction (row direction) in FIG. N scanning lines 6 extending along the line are formed at a predetermined pitch. Each scanning line 6 is electrically connected to a scanning line driving circuit (not shown), and a corresponding scanning signal is supplied from the scanning line driving circuit at a predetermined timing.

Further, m data lines 7 extending along the Y arrow direction (column direction) in FIG. 1 orthogonal to each scanning line 6 are formed on the element forming surface 3a at a predetermined pitch. Each data line 7 is electrically connected to a data line driving circuit (not shown). Each data line 7 has
A data signal based on image data is supplied from the data line driving circuit at a timing at which a scanning signal is supplied to each scanning line 6.

Further, a pixel region 8 is formed at a position corresponding to the intersection of each scanning line 6 and data line 7. In each pixel region 8, a control element (not shown) including a pixel electrode 9 (see FIG. 2), a thin film transistor (TFT), and the like is formed. The pixel electrode 9 is made of, for example, a light transmissive conductive material such as tin-indium oxide (ITO). That is, n × m pixel regions 8 are formed in a matrix on the element substrate 3. As shown in FIG. 2, an alignment film 10 that has been subjected to an alignment process such as a rubbing process is laminated below the data line 7 (scanning line 6) and the pixel electrode 9 (on the side of the counter electrode formation surface 4a). Has been.

As shown in FIG. 1, the counter substrate 4 is a non-alkali glass substrate having a square plate shape substantially the same size as the element substrate 3, and as shown in FIG. Forming surface 4a
The counter electrode 11 is laminated. The counter electrode 11 is made of, for example, a light transmissive conductive material such as tin-indium oxide (ITO). Further, the counter electrode 11 is electrically connected to a power circuit (not shown), and a predetermined common voltage is supplied from the power circuit. Further, an alignment film 12 that has been subjected to an alignment process such as a rubbing process is laminated on the upper side of the counter electrode 11 (on the element substrate 3 side).

In addition, as shown in FIG. 2, a rectangular frame shape is formed between the element substrate 3 (alignment film 10) and the counter substrate 4 (alignment film 12) along the outer edge of the counter substrate 4 (element substrate 3). And spacer 13a
A sealing material 13 having The sealing material 13 is formed in a square frame shape along the outer edges of the substrates 3 and 4, so that the element substrate 3 (element forming surface 3a) and the counter substrate 4 (counter electrode forming surface 4a) are spaced apart from each other by a certain distance. They are separated by (the outer diameter of the spacer 13a). A liquid crystal layer 15L filled with liquid crystal 15 is formed in a space partitioned and sealed by the element substrate 3 (alignment film 10), the counter substrate 4 (alignment film 12), and the sealing material 13.

When the scanning lines 6 are sequentially selected one by one based on line sequential scanning by the scanning line driving circuit, the control elements in the pixel region 8 are sequentially turned on only during the selection period, and at that timing, A data signal output from the data line driving circuit is output to the corresponding pixel electrode 9 via the corresponding data line 7 and the control element. Then, the alignment state of the liquid crystal 15 disposed between the pixel electrode 9 and the counter electrode 11 in the selected pixel region 8 is controlled according to the potential difference between the pixel electrode 9 and the counter electrode 11. As a result, the planar light Lo emitted from the irradiation device is modulated according to the alignment state of the liquid crystal 15, passes through the counter substrate 4, and is emitted toward the color filter 5.

As shown in FIG. 1, the color filter 5 includes a red color conversion layer 16R, a green color conversion layer 16G, and a blue color conversion layer 16B that are elongated along the Y arrow direction (column direction). That means
The red conversion layer 16R, the green conversion layer 16G, and the blue conversion layer 16B are arranged along the X arrow direction (row direction), the red conversion layer 16R → the green conversion layer 16G → the blue conversion layer 16B → the red conversion layer 16R → the green conversion layer 16G. → ... → The blue conversion layer 16B is repeatedly arranged at an equal pitch. Each of the color conversion layers 16R, 16G, and 16B is disposed at a position facing the n pixel regions 8 group arranged along the Y arrow direction (column direction). As shown in FIG. 1, the arrangement pitch between other adjacent color conversion layers is indicated by a symbol “Do”.

The red conversion layer 16R is a color conversion layer that converts light emitted from the pixel region 8 facing the red conversion layer 16R into red light LR. Further, the green color conversion layer 16G is the green color conversion layer 16G.
Is a color conversion layer that converts the light emitted from the pixel region 8 facing to green light LG, and the blue conversion layer 16B converts the light emitted from the pixel region 8 facing the blue conversion layer 16B to blue light. It is a color conversion layer that converts light LB.

As shown in FIG. 2, each pixel region 8 at a position facing the red conversion layer 16R becomes a red pixel R, and each pixel region 8 at a position facing the green conversion layer 16G becomes a green pixel G. ,
Each pixel region 8 at a position facing the blue conversion layer 16B becomes a blue pixel B. As described above, the liquid crystal panel 2 has n red pixels R that emit the same red light, n green pixels G that emit green light, and blue along the Y arrow direction (column direction). N pixels G for emitting blue light are arranged, and m pixels R, G, and B emitting light of different colors are repeated along the X arrow direction (row direction). Has been placed. That is, in each of the pixels R, G, and B, pixels of the same color are arranged in a stripe shape along the column direction.

The light transmitted through each pixel region 8 and emitted from the counter substrate 4 is incident on the color filter 5, whereby a desired full color image is displayed on the color filter 5.
Next, a method for inspecting the liquid crystal panel 2 configured as described above will be described with reference to FIGS.

3 and 4 are top views of the above-described liquid crystal panel 2 as viewed from the color filter 5 side, and show inspection display patterns for the red, green, and blue pixels R, G, and B, respectively. .
First, as shown in FIG. 3A, the scanning line driving circuit and the data line driving circuit are driven, and one column of red pixels R arranged repeatedly along the X arrow direction (row direction) is provided. Turn on every other. In the present embodiment, the red pixel R groups arranged in the first column, the seventh column, the thirteenth column,... From the left end side in FIG. That is, among the all red pixels R, the fourth eye,
By turning off the red pixel R groups arranged in the 10th, 16th column,..., Half the number of red pixels R are turned on. Then, the light emission state is visually confirmed to determine whether or not there is a red pixel R that is defective in light emission, and the position thereof is specified.

At this time, the pitch DR of adjacent red pixel R groups that are lit for inspection is 6 × Do.
Thus, it becomes twice the pitch DB of the red pixel R group. Therefore, in the red pixel R group that is lit for inspection, the light LR from the red pixel R in a predetermined column and the light LR of the red pixel R in another adjacent column are mixed. Is avoided.

Next, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 3B, the green pixel G adjacent to the red pixel R group that has been lighted first and inspected the light emission state. Turn on the group. In the present embodiment, the second row, the eighth row, the fourteenth row from the left end side in FIG.
The green pixel group G arranged in... That is, the green pixel G group repeatedly arranged along the X arrow direction (row direction) is turned on every other column, and the light emission state of half the number of green pixels G out of all the green pixels G is changed. inspect.

At this time, the pitch DG of adjacent green pixels G that are lit for inspection is 6 × Do.
This is twice the pitch DB of the green pixel G group. Accordingly, in the green pixel G group that is lit for inspection, the light LG from the green pixel G in a predetermined column and the light LG of the green pixel G in another adjacent lit column are mixed. Is avoided.

Subsequently, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 3C, the blue pixel B group adjacent to the green pixel G that is lit first and inspected for the light emission state. Lights up. In the present embodiment, the third column, the ninth column, the fifteenth column from the left end side in FIG.
The blue pixel group B arranged in... In other words, the blue pixels B group repeatedly arranged along the X arrow direction (row direction) are turned on every other column, and the light emission states of half of the blue pixels B among the all blue pixels B are changed. inspect.

At this time, the pitch DB of the adjacent blue pixel B group that is turned on for inspection is 6 × Do.
Thus, it becomes twice the pitch DB of the blue pixel B group. Therefore, in the blue pixel B group that is lit for inspection, the light LB from the blue pixel B in a predetermined column and the light LB of the blue pixel B in another adjacent column are mixed. Is avoided.

Next, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 4A, the red line in the column adjacent to the red pixel R group which has been lit and inspected for the light emission state as shown in FIG. The pixel R group is turned on. In the present embodiment, the fourth, tenth, and sixteenth rows from the left end side in FIG.
The red pixel R group arranged in the row,... Is turned on. In other words, the light emission states of the remaining half of the red pixels R that are not inspected among the all red pixels B are inspected. At this time, as before,
The pitch DR between adjacent red pixel R groups that are lit for inspection is 6 × Do, which is twice the pitch DR of the red pixel R group. Therefore, in the red pixel R group that is lit for inspection, the light LR from the red pixel R in a predetermined column and the light LR of the red pixel R in another adjacent column are mixed. Is avoided.

Next, the scanning line driving circuit and the data line driving circuit are driven and, as shown in FIG. 4B, the green pixel G adjacent to the green pixel G group that has been lighted first and inspected the light emission state. Turn on the group. In the present embodiment, the green pixel group G arranged in the fifth column, the eleventh column, the seventeenth column,... From the left end side in FIG. In other words, among the all green pixels G, the light emission states of the remaining half of the green pixels G that are not inspected are inspected. At this time, as described above, the pitch DG of adjacent green pixel G groups that are lit for inspection is 6 × Do, which is twice the pitch DB of the green pixel G. Accordingly, in the green pixel G group that is lit for inspection, the light LG from the green pixel G in a predetermined column and the light LG of the green pixel R in another adjacent column to be lit.
Is avoided.

Subsequently, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 4C, the blue pixel B adjacent to the blue pixel B group that is first lit and inspected for the light emission state. Turn on the group. In the present embodiment, the blue pixel B group arranged in the sixth column, the twelfth column,... From the left end side in FIG. That is, the light emission states of the remaining half of the blue pixels B that are not inspected are inspected. At this time, similarly to the above, the pitch DB of adjacent blue pixel B groups that are lit for inspection is 6 × Do, which is twice that of the blue pixel B. Therefore, in the blue pixel B group that is lit for inspection, the light LB from the blue pixel B in a predetermined column and the light LB of the blue pixel B in another adjacent column are mixed. Is avoided.

Thus, the inspection of the light emission states of all the red, green, and blue pixels R, G, and B is completed.
As described above, according to the present embodiment, the following effects are obtained.
(1) According to the present embodiment, the red pixels R arranged in stripes are turned on every other column,
The light emission state of each red pixel R that was turned on was visually inspected. Therefore, compared to the conventional case where all the red pixels R are turned on at the same time and inspected, the arrangement pitch of the red pixel R groups to be turned on can be doubled. In the red pixel R group that has been turned on, light LR from the red pixel R arranged along a predetermined column;
Mixing with the light LR of the red pixel R arranged along the other columns is avoided. As a result, it is possible to improve the detection accuracy of the red pixel R for which light emission is defective.

Similarly to the above, for the green pixel G and the blue pixel B arranged in a stripe shape,
Each of the green pixels G and the blue pixels B that are lit is visually inspected every other column. Therefore, as compared with the conventional case where all the green pixels G and blue pixels B are turned on at the same time and inspected, the arrangement pitch between the green pixels G group to be lit and between the blue pixels B group is set. Therefore, the detection accuracy of the green pixel G and the blue pixel B that are defective in light emission can be improved for the green pixel G and the blue pixel B, respectively.
(2) According to the present embodiment, all the red pixels R, the green pixels G, and the blue pixels B are conventionally used.
As compared with the case of inspecting by lighting up all of them simultaneously, it is possible to double the arrangement pitch of the pixels R, G, and B to be lit. Therefore, even when the arrangement pitch of the pixels R, G, and B that enables high-definition image display is narrow, it is easy to detect the position of a defective pixel that does not emit light. As a result, it is possible to improve the detection accuracy of the defective pixels in the liquid crystal panel that enables high-definition image display.
(3) According to the present embodiment, the liquid crystal panel 2 includes the red pixels R, the green pixels G, and the blue pixels B in a stripe shape, and is emitted from each of the pixels R, G, and B according to image data. Light LR, LG
, LB is controlled to display a full color image. Therefore, it is possible to improve the detection accuracy of the defective pixels in the liquid crystal panel 2 capable of full color display.
(Second Embodiment)
Next, an inspection method for the liquid crystal panel 2 according to the second embodiment of the present invention will be described with reference to FIGS. Since the configuration of the liquid crystal display 1 used for the inspection is the same as that of the first embodiment, the description thereof is omitted.

FIGS. 5 and 6 show test display patterns for the red, green, and blue pixels R, G, and B, respectively, according to the second embodiment.
First, as shown in FIG. 5A, as in the first embodiment, the scanning line driving circuit and the data line driving circuit are driven and repeatedly arranged along the X arrow direction (row direction). The red pixel group R is turned on every other column. In the present embodiment, the red pixel R groups arranged in the first column, the seventh column, the thirteenth column,... From the left end side in FIG. Then, the light emission state is visually confirmed to determine whether or not there is a red pixel R that is defective in light emission, and the position thereof is specified.

Next, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 5 (b), for green that is not adjacent to the red pixel R group that is lighted first and inspected for the light emission state. The pixel group G is turned on. In the present embodiment, the fifth column, the eleventh column, and the seventeenth column from the left end side in FIG.
The green pixels G group arranged in the columns,... Then, the light emission state is visually confirmed to determine whether or not there is a green pixel G that is defective in light emission, and the position thereof is specified.

At this time, since the green pixel group G to be inspected is separated from the row of red pixels R that has been lit and inspected first, the light LR of the red pixel R that has been inspected first. Is not visually recognized by overlapping with the light LG of the green pixel group G to be inspected. Therefore, it is possible to accurately detect a light emission failure (connection defect) that occurs when the pixel electrodes 9 of the adjacent pixels R and G are electrically connected for some reason.

Subsequently, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 5C, the blue pixel not adjacent to the green pixel G which is lit first and inspected the light emission state. Turn on Group B. In the present embodiment, the blue pixels B group arranged in the third, ninth, fifteenth columns,... From the left end side in FIG. Then, the light emission state is visually confirmed to determine whether or not there is a blue pixel B having a poor light emission, and the position thereof is specified.

At this time, the column of the blue pixels B to be inspected is separated from the column of the green pixels G that have been lit and inspected first, so the light of the green pixel G that has been inspected first The afterimage of LG does not overlap with the light LB of the blue pixel B group to be inspected. Therefore, it is possible to accurately detect a light emission failure (connection defect) that occurs when the pixel electrodes 9 of the adjacent pixels G and B are electrically connected for some reason.

Next, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 6A, the red pixel R adjacent to the red pixel R group which has been lighted first and inspected the light emission state. Turn on the group. In other words, the light emission states of the remaining half of the red pixels R that are not inspected among the all red pixels B are inspected. In the present embodiment, the red pixel R groups arranged in the fourth column, the tenth column, the sixteenth column,... From the left end side in FIG.

Next, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 6B, the green pixel G adjacent to the green pixel G group that has been lighted first and inspected the light emission state. The group is turned on, and the light emission states of the remaining half of the green pixels G that are not inspected are inspected. In the present embodiment, the green pixel group G arranged in the second column, the eighth column, the fourteenth column,... From the left end side in FIG. At this time, in the same manner as described above, the column of green pixels G to be inspected is separated from the column of red pixels R that have been lit and inspected first. The afterimage of the light LR of the working pixel R does not overlap with the light LG of the green pixel G group to be inspected. Therefore, it is possible to accurately detect a light emission failure (connection defect) that occurs when the pixel electrodes 9 of the adjacent pixels R and G are electrically connected for some reason.

Subsequently, the scanning line driving circuit and the data line driving circuit are driven, and as shown in FIG. 6C, the blue pixel B adjacent to the blue pixel B group that is first lit and inspected for the light emission state. The group is turned on, and the light emission states of the remaining half of the blue pixels B that are not inspected are inspected. In this embodiment, the blue pixel B group arranged in the sixth column, the twelfth column,... From the left end side in FIG. At this time, similarly to the above, the column of green pixels G to be inspected is separated from the column of green pixels G to be inspected after being lit, so The afterimage of the light LG of the working pixel G does not overlap with the light LB of the blue pixel B group to be inspected. Therefore, it is possible to accurately detect a light emission failure (connection defect) that occurs when the pixel electrodes 9 of the adjacent pixels G and B are electrically connected for some reason.

As described above, according to the present embodiment, the following effects are obtained.
(1) According to the present embodiment, as in the first embodiment, the red pixels R arranged in a stripe shape are turned on every other column, and the light emission state of each of the lit red pixels R is visually observed. Inspected by. Thereafter, the row of green pixels G that is not adjacent to the row of red pixels R previously inspected is turned on, and the light emission state of each green pixel G is visually inspected. Therefore,
When the light emission state of each green pixel G is visually inspected, the light L from the red pixel R previously inspected
The influence of the afterimage of R can be eliminated.

As a result, in the same manner as in the first embodiment, in addition to improving the detection of the light emission failure of the red pixel R, the detection accuracy of the connection defect generated between the adjacent pixels R and G can be improved. Can be improved.
(2) According to the present embodiment, as described above, the green pixels G arranged in stripes are turned on every other column, and the light emission state of each of the green pixels G that are turned on is visually inspected. I made it. Thereafter, the column of blue pixels B that is not adjacent to the column of green pixels G that was previously inspected is turned on, and the light emission state of each blue pixel B is visually inspected. Therefore, each blue pixel B
When the light emission state is visually inspected, it is possible to eliminate the influence of the afterimage of the light LG from the green pixel G inspected earlier.

As a result, in the same manner as in the first embodiment, in addition to improving the detection of the light emission failure of the green pixel G, the detection accuracy of the connection defect generated between the adjacent pixels G and B can be improved. Can be improved.
(Third embodiment)
Next, application of the electronic device of the liquid crystal display 1 inspected by the inspection method described in the first and second embodiments will be described with reference to FIG. The liquid crystal display 1 can be applied to various electronic devices such as a mobile personal computer, a mobile phone, and a digital camera.

FIG. 7 is a perspective view of the mobile phone 20. The mobile phone 20 includes a display unit 21 on which the liquid crystal display 1 is mounted, a call port 22, and a plurality of operation buttons 23. Even in this case, the display unit 21 using the liquid crystal display 1 can display an image having no display defect because the defect is detected with high accuracy.

In addition, embodiment of invention is not limited to the said embodiment, You may implement as follows.
In the first embodiment, the red pixel R column, the green pixel G column, and the blue pixel B column are turned on every other column, but the present invention is not limited to this. Pixel R for each color
, G, and B may be turned on every second row or every third row. In this way, the same effect as in the first embodiment can be obtained.

In the first and second embodiments, the present invention is applied to the liquid crystal display 1 including the liquid crystal panel 2 as an electro-optical device. However, the present invention is not limited to this. You may apply to the organic electroluminescent display provided with the luminescent element. In short, any one having an electro-optical panel in which pixels for red, green, and blue are arranged in stripes can be obtained, and the same effect as in the first and second embodiments can be obtained. Can do.

In the electro-optical devices according to the first and second embodiments, the red pixel R is provided by providing the color filter 5 including the red, green, and blue conversion layers 16R, 16G, and 16B at a position facing the pixel region 8. Although the liquid crystal display 1 has realized the green pixel G and the blue pixel B, the present invention is not limited to this. Without using the color filter 5, each pixel region 8 is a red pixel R that emits red light LR, a green pixel G that emits green light LG, and a blue pixel B that emits blue light LB. You may apply to a certain electro-optical apparatus.

In the first embodiment, first, half of the red pixels R among the red pixels R are inspected, then half of the green pixels G are inspected, and further, Thereafter, half of the blue pixels B were inspected. After that, the remaining half of the red pixel R is inspected, the remaining half of the green pixel G is inspected, and then the remaining half of the blue pixel B is inspected. . First, after inspecting half of the red pixels R among the all red pixels R, the remaining half of the red pixels R are then inspected, thereby inspecting the all red pixels R. End. Then, after inspecting half of the green pixels G among the all green pixels G, the inspection of the all green pixels G is completed by subsequently inspecting the remaining half of the green pixels G. . After that, after the half blue pixel B is inspected among all the blue pixels B, the inspection of the all blue pixels B is completed by inspecting the remaining half of the blue pixels B. It is good to let you do. By doing in this way, the same effect as the first embodiment can be obtained.

In the first and second embodiments, the plurality of pixels are red pixels R that emit red light LR.
The green pixel G that emits the green light LG and the blue pixel B that emits the blue light LB. However, the present invention is applicable to pixels that emit light of colors other than red, green, and blue. Applicable.

1 is an overall perspective view of a liquid crystal display inspected by an inspection method for an electro-optical device of the invention. Sectional drawing of a liquid crystal display. (A), (b), (c) is the display pattern for a test | inspection of the liquid crystal display which concerns on 1st Embodiment, respectively. Similarly, (a), (b), and (c) are display patterns for inspection of the liquid crystal display according to the first embodiment, respectively. (A), (b), (c) is the display pattern for a test | inspection of the liquid crystal display which concerns on 2nd Embodiment, respectively. (A), (b), (c) is the display pattern for a test | inspection of the liquid crystal display which concerns on 2nd Embodiment, respectively. The perspective view of the mobile telephone carrying the liquid crystal display test | inspected by the test | inspection method of the electro-optical apparatus of this invention. (A), (b), (c) is the display pattern for a test | inspection of the conventional liquid crystal display, respectively.

Explanation of symbols

B ... Blue pixel, G ... Green pixel, R ... Red pixel, 1 ... Liquid crystal display as electro-optical device, 2 ... Liquid crystal panel as electro-optical panel, 3 ... Element substrate as substrate, 20 ... Electronic equipment As a mobile phone.

Claims (5)

In an inspection method for an electro-optical device provided with an electro-optical panel in which a plurality of pixels that emit light of the same color in the column direction are arranged on a substrate, the pixel columns being arranged in a plurality of rows.
An inspection method for an electro-optical device, wherein at least every other pixel row of pixels emitting the same color light is lit, and the light emission state of each pixel in the lit pixel row is detected. . The electro-optical device inspection method according to claim 1,
The pixel row in which the plurality of pixels are arranged includes a pixel row of red pixels that emits red light, a pixel row of green pixels that emits green light, and a pixel pixel of blue that emits blue light. An electro-optical device comprising: a pixel row of red pixels, a pixel row of green pixels, and a pixel row of blue pixels, which are repeatedly arranged in a predetermined order in a row direction. Inspection method. The inspection method for an electro-optical device according to claim 2,
When detecting the light emission state of the pixel column of each pixel that emits light of a color different from the pixel column of the pixel that was previously lit and detected, it is not adjacent to the pixel column of the previously lit pixel An inspection method for an electro-optical device, wherein a pixel group in a column is turned on to detect a light emission state of each pixel. In the inspection method of the electro-optical device according to any one of claims 1 to 3,
The method of inspecting an electro-optical device, wherein the electro-optical panel is a liquid crystal panel. An electronic apparatus comprising the electro-optical device inspected by the electro-optical device inspection method according to claim 1.

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