JP2007248423A - Imaging plate iron analyzer using photostimulable phosphor - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an ion analyzer, different from a conventional ion analyzer that uses a solid track detecting element, eliminating the need for preprocesings, and that enables high-speed reading. <P>SOLUTION: The imaging plate ion analyzer eliminates the need for preprocessing ions and enables the high-speed reading, by using an imaging plate formed from a photostimulable phosphor as the detecting element. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to an imaging plate ion analyzer using a stimulable illuminant relating to an ion beam evaluation apparatus.

Conventionally, solid state detection elements such as CR-39 have been mainly used in ion analyzers as detection elements. FIG. 1 shows a configuration diagram of a conventional ion analyzer. However, the reading by the measurement system using the solid track detecting element 6 has a technical problem that pre-processing, that is, etching is required and reading takes time. In addition, although an ion beam is not an object of analysis, there is already an analyzer that uses an electron beam as an object of analysis and that uses a detection element.
JP 2003-45367 A

  An object of the present invention is to provide an ion analyzer that can perform high-speed reading without the need for the pretreatment.

  In order to solve the above problem, the imaging plate ion analyzer of the present invention is characterized in that ions can be read at high speed without the need for pretreatment by using an imaging plate, which is a stimulable luminescent material, as a detection element. . The imaging plate used in the present invention is made of, for example, a BaFBrI: Eu phosphor having a fluorescent layer of 50 microns without a protective layer on its surface, and model number BAS-TR manufactured by Fuji Film Co., Ltd. is used.

  In the present invention, as shown in FIG. 2, the imaging plate 7 is arranged on the trajectory of ions that are deflected in two dimensions in accordance with the energy and mass by the analysis unit constituted by the magnet 4 and the electrode 5. It is characterized by. The imaging plate 7 is a stimulable luminescent material, and an image having a spatial intensity distribution corresponding to the direct ion intensity is obtained as digital information by the reading device 8. By performing an intensity correction calculation on the image using the analysis device 9, the number of ions is found and preprocessing is unnecessary, and high-speed reading can be achieved.

  That is, the present invention uses an imaging plate made of a stimulable phosphor as a detection element in an ion analyzer composed of an ion source, a pinhole, a magnet, an electrode, a detection element, a detection element reading device, and an analysis device. Then, the ion beam from the ion source passes through the pinhole, the magnetic field and the electric field generated by the magnet and the electrode, and the trajectory of each ion of the ion beam is bent and recorded on the imaging plate, and this spatial separation is performed. The recorded ion beam is stored as digital information by the imaging plate reader, and the stored information is output as information corresponding to the energy, nuclide, and ionization degree of each ion by the analyzer, Exposure remaining on the stimulable illuminant using white light on the imaging plate It is characterized in that to erase distribution.

    By using the ion analyzer of the present invention, it is not necessary to pre-process the solid track detection element as compared with the conventional method, so that the labor of the analysis work process can be saved. Furthermore, since the reading is faster than the conventional method, the analysis work can be performed efficiently.

  The imaging plate ion analyzer of the present invention will be described with reference to the drawings. FIG. 3 shows an imaging plate ion analyzer as an example according to an embodiment of the present invention. The present embodiment includes an ion source 2, a pinhole 3, a magnet 4, an electrode 5, an imaging plate 7, an imaging plate reader 8, and an analyzer 9.

  The ion beam 1 emitted from the ion source 2 passes through the pinhole 3, thereby suppressing beam divergence and making the beam cross section minute. The beam is deflected by a magnetic field generated by the magnet 4 and an electric field obtained by supplying a voltage to the electrode 5. At this time, since the magnitude of the deflection depends on the ion energy, nuclide, and ionization degree, the ion beam is spatially separated according to the energy, nuclide, and ionization degree. This spatially separated ion beam is recorded by the imaging plate 7. This imaging plate is stored as digital information by the imaging plate reader 8 and output as number information of ions corresponding to the ion energy, nuclide, and ionization degree by the analyzer 9.

  By using the imaging plate, it is possible to analyze ions that require no pre-processing and can be read at high speed as compared with an analysis method using a conventional solid track detection element such as CR-39.

  Hereinafter, the present invention will be described more specifically with reference to actual examples. Experiments were performed with the configuration shown in FIG. For the ion source 2, a proton beam having an energy of up to 800 keV generated by laser-plasma interaction was used. For generation of this proton beam, a linearly polarized laser beam 10 having an energy per pulse of 250 mJ, a laser wavelength of 800 nm, a pulse width of 250 fs (full width at half maximum), and the like was used. This laser beam is focused and irradiated onto a 3um thick titanium thin film on which hydrogen carbide is adsorbed on the surface by an off-axis parabolic mirror of f = 650mm, and laser-plasma interaction is applied from the back of this target. A proton (hydrogen) beam is generated. The proton beam was incident on a pin hole having a diameter of 100 μm as an ion beam 1 and irradiated on the imaging plate 7 through an analysis unit constituted by an electric field and a magnetic field. This imaging plate 7 was read by the imaging plate reader 8 and was subjected to computer processing by the analyzer 9 to perform analysis at high speed without the need for pretreatment.

FIG. 4 shows image information of proton p ⁺ read as image information by the imaging plate. This image information is stored as a spectrum distribution shown in FIG. As a result of the analysis, a result equivalent to the ion analysis result obtained by the conventional solid state track detector shown in FIG. 6 and FIG. 7 is obtained. About preprocessing and reading that took about time, we achieved high-speed reading in about 10 minutes.

  4 and 6 show images of an ion beam deflected by an electric field and a magnetic field and imaged on an imaging plate (or solid track detection element), respectively. In addition to the proton beam (dark line), the image also includes a carbon beam (thinly a plurality of thin lines) generated secondary in the above experiment. The scale on the horizontal axis represents the energy of the proton beam, and the image appears on the imaging plate (or solid track detection element) at a position corresponding to this scale. The number per energy can be counted according to the brightness in the case of an imaging plate and the number of etch pits (holes) in the case of a solid track detection element.

It is a figure which shows the ion analyzer of a prior art example. It is a figure which shows the conceptual diagram of the ion analyzer structure of this invention. The block diagram of the ion analyzer structure as an example concerning embodiment of this invention is shown. It is a figure which shows the image of the ion analysis result in this invention. It is a figure which shows the ion analysis result in this invention. It is a figure which shows the image of the ion analysis result in a prior art example. It is a figure which shows the ion analysis result in a prior art example.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Ion beam 2 ... Ion source 3 ... Pinhole 4 ... Magnet 5 ... Electrode 6 ... Solid track detection element 7 ... Imaging plate 8 ... Imaging plate reader 9 ... Analyzer 10 ... Laser beam

Claims (4)

  An ion analyzer for evaluating at least one of ion energy, nuclide, and ionization degree, and performing mass spectrometry by bending the trajectory of each ion of the ion beam by passing it in an electric field or magnetic field By providing an energy / mass analyzer that includes holes and an imaging unit that accumulates ions and records spatially energy / mass-resolved images on an imaging plate, the energy and nuclides of ions can be obtained with high contrast in a short time. -An ion analyzer using a photostimulable luminescent material that can analyze the degree of ionization.   2. The photostimulable illuminant according to claim 1, wherein the information of the ion beam recorded by the imaging plate is stored as digital information of the signal intensity of the ions exposed by the imaging plate reading device. Ion analyzer.   2. The ion using the stimulable luminescent material according to claim 1, wherein the intensity information stored electronically is extracted as an absolute measurement number in each energy, nuclide, and ionization state of the ion of the ion beam by computer processing. Analysis equipment. The photostimulability according to claim 1, wherein the imaging plate after reading can be used reproducibly by erasing exposure information remaining in the photostimulable illuminant using white light. An ion analyzer using a light emitter.