JP2007171030A5 - Analysis chip and analysis method of test substance - Google Patents

Analysis chip and analysis method of test substance Download PDF

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Publication number
JP2007171030A5
JP2007171030A5 JP2005370319A JP2005370319A JP2007171030A5 JP 2007171030 A5 JP2007171030 A5 JP 2007171030A5 JP 2005370319 A JP2005370319 A JP 2005370319A JP 2005370319 A JP2005370319 A JP 2005370319A JP 2007171030 A5 JP2007171030 A5 JP 2007171030A5
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selective binding
analysis chip
binding substance
cover member
test substance
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JP2005370319A
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JP2007171030A (en
JP4797619B2 (en
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Priority to JP2005370319A priority Critical patent/JP4797619B2/en
Priority claimed from JP2005370319A external-priority patent/JP4797619B2/en
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Publication of JP2007171030A5 publication Critical patent/JP2007171030A5/en
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Claims (7)

凹部及び凸部からなる凹凸部を表面に有し、前記凸部表面に選択結合性物質が固定化され、少なくとも前記凹部底面は粗面化されており、粗面化された領域の表面粗さはＲａ値（中心線平均粗さ）が０．０１μｍ以上、１μｍ以下である選択結合性物質固定化基材と、
該基材の表面を覆い該基材と接着されたカバー部材とを備え、
該基材と該カバー部材との間に空隙を有することを特徴とする分析チップ。 The surface of the surface is provided with an uneven portion consisting of a concave portion and a convex portion, the selective binding substance is immobilized on the surface of the convex portion, and at least the bottom surface of the concave portion is roughened. A selective binding substance-immobilized base material having an Ra value (center line average roughness) of 0.01 μm or more and 1 μm or less;
And a cover member bonded with the base material covers the surface of the substrate,
Analysis chip characterized by having a gap between said substrate and said cover member. 前記粗面化された領域の表面粗さは、Ｒｚ値（最大高さ）が０．１μｍ以上、３０μｍ以下であることを特徴とする、請求項１に記載の分析チップ。 The analysis chip according to claim 1, wherein the surface roughness of the roughened region is such that an Rz value (maximum height) is 0.1 μm or more and 30 μm or less. 前記空隙内に、移動可能に格納された微粒子を更に含むことを特徴とする、請求項１または２に記載の分析チップ。 The analysis chip according to claim 1 or 2 , further comprising microparticles movably stored in the space . 前記カバー部材が、前記基材と前記カバー部材との間の空隙に連通する１つ以上の貫通孔を有する、請求項１から３のいずれか一項に記載の分析チップ。The analysis chip according to any one of claims 1 to 3, wherein the cover member has one or more through holes communicating with a space between the base and the cover member. 請求項４に記載の分析チップと、前記カバー部材に貼付し前記貫通孔を封止する封止部材とをさらに備えることを特徴とする分析用キット。An analysis kit comprising the analysis chip according to claim 4 and a sealing member attached to the cover member to seal the through hole. 凹部及び凸部からなる凹凸部を表面に有し、前記凸部表面に選択結合性物質が固定化され、少なくとも前記凹部底面は粗面化されており、粗面化された領域の表面粗さはＲａ値（中心線平均粗さ）が０．０１μｍ以上、１μｍ以下である選択結合性物質固定化基材に、被検物質を含む溶液を攪拌して調製された被検溶液を接触させ、前記被検物質を前記選択結合性物質に選択的に結合させ、前記基材上に前記選択結合性物質を介して結合した前記被検物質の量を測定することを特徴とする、被検物質の分析方法。 The surface of the surface is provided with an uneven portion consisting of a concave portion and a convex portion, the selective binding substance is immobilized on the surface of the convex portion, and at least the bottom surface of the concave portion is roughened. A test solution prepared by stirring a solution containing a test substance is brought into contact with a selective binding substance-immobilized substrate having an Ra value (center line average roughness) of 0.01 μm or more and 1 μm or less , wherein a test substance is selectively coupled to the selective binding substance, and measuring the amount of the analyte bound via the selective binding substance on the substrate, the test substance Analysis method. 請求項４に記載の分析チップに、前記貫通孔から被検物質をアプライし、前記カバー部材に封止部材を貼付して前記貫通孔を封止し、前記被検物質を前記分析チップを構成する前記選択結合性物質に選択的に結合させ、更に前記基材上に前記選択結合性物質を介して結合した前記被検物質の量を測定することを特徴とする、被検物質の分析方法。 A test substance is applied to the analysis chip according to claim 4 from the through hole, a sealing member is attached to the cover member to seal the through hole, and the test substance is configured as the analysis chip. the selective binding substance selectively bound to, further characterized by measuring the amount of the analyte bound via the selective binding substance on the substrate, method for analyzing a test substance to .
JP2005370319A 2005-12-22 2005-12-22 Analysis chip and analysis method of test substance Active JP4797619B2 (en)

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JP2005370319A JP4797619B2 (en) 2005-12-22 2005-12-22 Analysis chip and analysis method of test substance

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JP2005370319A JP4797619B2 (en) 2005-12-22 2005-12-22 Analysis chip and analysis method of test substance

Publications (3)

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JP2007171030A JP2007171030A (en) 2007-07-05
JP2007171030A5 true JP2007171030A5 (en) 2009-02-12
JP4797619B2 JP4797619B2 (en) 2011-10-19

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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5145752B2 (en) * 2006-04-14 2013-02-20 東レ株式会社 Analysis chip
JP5642361B2 (en) * 2008-07-03 2014-12-17 ジョンソン・アンド・ジョンソン・アーベー Methods for analysis of circulating antibodies
CN102242053B (en) * 2011-04-01 2014-06-04 沈越 Biochip with polymer three-dimensional nanostructure
NL2019044B1 (en) 2017-05-11 2018-11-15 Illumina Inc Protective surface coatings for flow cells

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3886140T2 (en) * 1987-08-27 1994-05-19 Biotrack Inc Device and method for diluting and mixing liquid samples.
JP3806022B2 (en) * 2001-10-30 2006-08-09 住友ベークライト株式会社 Microchip substrate
JP2004069355A (en) * 2002-08-02 2004-03-04 Toto Ltd Microarray substrate and its manufacturing method
CN1289904C (en) * 2003-08-01 2006-12-13 博奥生物有限公司 Micro array reaction unit and its use
JP4473007B2 (en) * 2004-02-20 2010-06-02 三菱レイヨン株式会社 Hybridization method
JP4420020B2 (en) * 2004-03-23 2010-02-24 東レ株式会社 How to stir the solution

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