JP2007163360A - 蛍光x線による溶液中元素の高精度分析方法 - Google Patents
蛍光x線による溶液中元素の高精度分析方法 Download PDFInfo
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- JP2007163360A JP2007163360A JP2005361829A JP2005361829A JP2007163360A JP 2007163360 A JP2007163360 A JP 2007163360A JP 2005361829 A JP2005361829 A JP 2005361829A JP 2005361829 A JP2005361829 A JP 2005361829A JP 2007163360 A JP2007163360 A JP 2007163360A
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Abstract
本発明は、溶液中に含まれる元素を蛍光X線分析法で高精度に定量分析する手法を提供し、飲料の品質管理や、河川水や湖・沼水、地下水などの陸水に関しての環境評価等の化学分析分野で活用するものであり、実験室内で高精度溶液分析を実施する溶液試料中の元素濃度を簡便にスクリーニングする手法としても利用可能である。
【構成】
疎水剤を塗布した有機高分子膜上に溶液試料を滴下・乾固させて、その残渣を蛍光X線分析法によって分析することで、溶液中の元素の濃度を定量分析する方法であり、標準溶液を前述した方法で調整・分析し、X線強度と濃度との相関関係を明らかにすることで、定量の下限と精度の検証を行う構成。
【選択図】 図1
Description
各装置におけるセレン、カドミウム、鉛の溶液中濃度とX線強度との関係を図2〜7に、有機高分子膜を疎水化せずに同様の実験を行った結果と併せて示す。
2……エネルギー分散型蛍光X線分析用試料容器
3……エネルギー分散型蛍光X線分析用試料容器に有機高分子膜を固定するための
リング
4……疎水剤(フッ素樹脂系カーワックス)
5……セレン、カドミウム、鉛の混合標準溶液
6……マイクロピペット
Claims (3)
- マイラー膜やポリプロピレン膜などの有機高分子膜表面に疎水剤を塗布することで有機高分子膜の疎水性を高めることを特徴とする蛍光X線による溶液中元素の高精度分析方法。
- 請求項1により得られる疎水性を高めた有機高分子膜上に溶液試料を滴下し、溶液が乾固後に形成される残渣を小範囲に集中させることを特徴とする蛍光X線による溶液中元素の高精度分析方法。
- 請求項1又は請求項2の方法で作成された試料を蛍光X線分析用試料として用いることで、残渣部が一次X線に不均一に照射されるのを最小限に抑制し、溶液中の元素を高精度に定量分析可能とすることを特徴とする蛍光X線による溶液中元素の高精度分析方法。
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012096684A1 (en) * | 2011-01-14 | 2012-07-19 | Diversey, Inc. | Systems and methods for automated mapping and analysis of a region |
CN103105407A (zh) * | 2011-11-15 | 2013-05-15 | 江苏天瑞仪器股份有限公司 | 测定液体样品中重金属的含量的装置、方法及应用 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07297245A (ja) * | 1994-04-27 | 1995-11-10 | Piyuaretsukusu:Kk | 分析用試料板 |
US5958345A (en) * | 1997-03-14 | 1999-09-28 | Moxtek, Inc. | Thin film sample support |
JP2005291823A (ja) * | 2004-03-31 | 2005-10-20 | Horiba Ltd | 液体試料の濃縮方法及び濃縮用保持台とそれを用いた微量元素分析方法 |
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2005
- 2005-12-15 JP JP2005361829A patent/JP2007163360A/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07297245A (ja) * | 1994-04-27 | 1995-11-10 | Piyuaretsukusu:Kk | 分析用試料板 |
US5958345A (en) * | 1997-03-14 | 1999-09-28 | Moxtek, Inc. | Thin film sample support |
JP2005291823A (ja) * | 2004-03-31 | 2005-10-20 | Horiba Ltd | 液体試料の濃縮方法及び濃縮用保持台とそれを用いた微量元素分析方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012096684A1 (en) * | 2011-01-14 | 2012-07-19 | Diversey, Inc. | Systems and methods for automated mapping and analysis of a region |
CN103105407A (zh) * | 2011-11-15 | 2013-05-15 | 江苏天瑞仪器股份有限公司 | 测定液体样品中重金属的含量的装置、方法及应用 |
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