JP2007062456A - Wheel abnormality determination device, wheel and wheel abnormality determination method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To easily determine abnormality generated on a wheel. <P>SOLUTION: The wheel abnormality determination device is provided with a conductor 24 closely adhered to a skin layer part along a circumferential direction of a wheel rim 15 of the wheel 10; and a conduction state inspection device 60 including an abnormality determination part 64 for determining whether or not abnormality exists on the wheel 10 by inspecting the conduction state of the conductor 24. Thereby, by an easy method that the conduction state of the conductor 24 is inspected, for example, the abnormality of the wheel 10 can be easily determined from variation of the conduction state of the conductor 24 such as the case where the conductor 24 is cut accompanying with a crack generated on the skin layer part. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a wheel abnormality determination device for determining abnormality occurring in a wheel of a wheel, a wheel suitable for that purpose, and a wheel abnormality determination method.

  2. Description of the Related Art Conventionally, a tire lateral force sensor that detects a tire lateral force that attempts to deform a tire laterally is known (see, for example, Patent Document 1). This tire lateral force sensor is a tire that electrically detects a pressure-sensitive conductive rubber that is annularly abutted and held along the outer periphery of the wheel on a side wall portion of the tire that is fitted to the wheel, and a resistance value of the pressure-sensitive conductive rubber. And a lateral force detection circuit. In this tire lateral force sensor, the tire lateral force is detected by detecting a change in the resistance value of the pressure-sensitive conductive rubber due to the tire lateral force by a tire lateral force detection circuit.

  A wheel provided with a detection line embedded in the rubber layer of the tire is also known (see, for example, Patent Document 2). In this wheel, the detection line is cut with the progress of wear of the rubber layer of the tire. Therefore, the wear state of the rubber layer of the tire can be determined by inspecting the conduction state of the detection line.

Furthermore, a turbo-molecular pump that can detect whether a crack or expansion has occurred in a rotor blade by detecting whether or not a detection line placed in close contact with the rotor blade has been cut is also known. (For example, refer to Patent Document 3).
JP 63-242704 A JP-A-61-150804 JP 2004-68636 A

  By the way, when an abnormality such as a crack or deformation occurs in the wheel, it is desirable to repair the wheel or replace it with a normal wheel. In order to determine whether or not these abnormalities have occurred in the wheel, in general, an inspection by visual inspection or the like is performed after removing the wheel from the vehicle. However, it is not preferable to remove the wheel to inspect the abnormality of the wheel in terms of increasing the work load.

  Then, an object of this invention is to provide the wheel abnormality determination apparatus which can determine the abnormality of a wheel easily, the wheel suitable for it, and the wheel abnormality determination method.

  In order to solve the above-described problems, a wheel abnormality determination device according to an aspect of the present invention includes a conductor that is brought into close contact with a surface layer portion along a circumferential direction of a wheel rim, and a wheel by inspecting a conduction state of the conductor. An abnormality determination unit that determines whether or not there is an abnormality in the rim.

  According to this aspect, the conduction state of the conductor disposed along the circumferential direction of the wheel and in close contact with the surface layer portion of the wheel rim is inspected. When an abnormality occurs in the wheel rim, the conductive state of the conductor changes, for example, a crack is generated near the conductor and the conductor is cut. Therefore, the abnormality of the wheel rim and the abnormality of the wheel can be determined from the change in the conductive state of the conductor. Thus, the abnormality of the wheel can be easily determined by a simple method of inspecting the conductive state of the conductor.

  According to another aspect of the present invention, there is provided a wheel abnormality determination device, the first conductive layer being in close contact with the surface layer portion of the wheel, and disposed opposite the first conductive layer with a gap from the first conductive layer. A conductor including the second conductive layer formed, and inspecting at least one of a conductive state of the first conductive layer and a conductive state between the first conductive layer and the second conductive layer And an abnormality determination unit that determines whether there is an abnormality in the wheel.

  According to this aspect, the conduction state of the first conductive layer or the conduction state between the first conductive layer and the second conductive layer is inspected to determine a wheel abnormality. As a result, two types of abnormalities, a wheel abnormality that changes the conduction state of the first conductive layer and a wheel abnormality that changes the conduction state between the first conductive layer and the second conductive layer, are detected. The presence or absence can be determined. Therefore, the state of abnormality of the wheel can be determined in more detail.

  At this time, the abnormality determining unit determines that the wheel is cracked when the first conductive layer is not conductive when the conductive state of the first conductive layer is inspected, and the first conductive layer When the conduction state between the second conductive layer and the second conductive layer is inspected, if there is conduction between the first conductive layer and the second conductive layer, it may be determined that the wheel is deformed. . In this way, it is possible to determine the presence / absence of two different types of abnormalities such as cracks and deformation of the wheel.

  Further, the conductor may be in close contact with the flange portion of the wheel rim. Since stress concentration occurs in the flange portion of the wheel rim, an abnormality is likely to occur in the flange portion of the wheel rim, for example, a starting point of a crack. Therefore, by bringing the conductor into close contact with the flange portion, it is possible to increase the sensitivity of detecting wheel abnormality such as cracks and deformation.

  Furthermore, a continuity test terminal disposed on the design surface side of the wheel and connected to the conductor may be further provided, and the conductor may be connected to the abnormality determination unit via the continuity test terminal. In this way, even when the wheel is attached to the vehicle, the conductor can be easily connected to, for example, an abnormality determination unit provided outside the vehicle via the continuity inspection terminal disposed on the design surface side. can do. Therefore, it is possible to more easily determine a wheel abnormality.

  Yet another embodiment of the present invention is a wheel. This wheel has a disk-shaped disc with one surface formed as a design surface, and a flange portion is formed on the outer edge portion spaced apart from the design surface toward the outer side in the radial direction of the disc. A fixed inner rim, a conductor closely adhered to the surface layer portion of the flange along the circumferential direction of the inner rim, and a conductor connected to inspect the conductive state of the conductor and disposed on the design surface side A continuity testing terminal.

  Yet another embodiment of the present invention is also a wheel. The wheel includes a disk-shaped disk, a rim that is annularly fixed to the outer periphery of the disk, a first conductive layer that is in close contact with the surface layer of the disk or rim, and a gap from the first conductive layer. A conductor including a second conductive layer disposed opposite to the first conductive layer.

  According to these aspects, the conductive state of the conductor can be inspected, for example, by connecting the conductor to an abnormality determination unit or the like appropriately provided outside the wheel. Therefore, since it is not necessary to provide these abnormality determination units in the wheel, an increase in the weight of the wheel is suppressed.

  Yet another embodiment of the present invention is a wheel abnormality determination method. In this method, the conduction state of the conductor adhered to the surface layer portion along the circumferential direction of the wheel rim is inspected, and when there is conduction, it is determined that the wheel rim is normal, and when there is no conduction. May determine that the wheel rim is cracked.

  Yet another embodiment of the present invention is also a wheel abnormality determination method. In this method, a first conductive layer in close contact with the surface layer portion of the wheel, a second conductive layer disposed opposite to the first conductive layer with a gap from the first conductive layer, If the continuity between the first conductive layer and the second conductive layer is conductive, it may be determined that the wheel is deformed.

  According to the present invention, it is possible to easily determine a wheel abnormality.

  Hereinafter, the best mode for carrying out the present invention will be described in detail with reference to the drawings.

  FIG. 1 is a perspective view showing an outline of a wheel 10 according to the first embodiment of the present invention. The wheel 10 includes a disk-shaped disk 12 and a cylindrical wheel rim 15 that is annularly fixed to the outer periphery of the disk 12. A design surface 13 is formed on one surface of the disk 12, and the wheel 10 is attached to the vehicle with the design surface 13 facing the outside of the vehicle. The wheel rim 15 includes an outer rim 14 and an inner rim 16, and the tire 11 is held by the outer rim 14 and the inner rim 16 (see FIG. 3). The outer rim 14 is annularly fixed to the outer periphery of the disk 12 of the wheel 10. The inner rim 16 extends from the outer periphery of the disk 12 in a direction toward the inside of the vehicle in a state where the wheel 10 is attached to the vehicle. A flange 18 that protrudes outward in the radial direction of the wheel 10 is formed at the annular edge of the inner rim 16 that is farthest from the design surface 13.

  The conductor 24 is in close contact with the surface of the flange 18 of the inner rim 16 along the circumferential direction of the inner rim 16. The conductor 24 is in close contact with the surface of the flange 18 in an annular shape continuously over substantially the entire circumference. The conductor 24 is formed of a conductive material such as copper, for example, in a thin film shape having a width of 1 mm or less and a thickness of 0.1 mm or less, for example. The conductor 24 can be brought into close contact with the surface of the flange 18 by an appropriate thin film forming method such as vapor deposition or an appropriate adhesive method. It should be noted that it is desirable that the flange 18 and the conductor 24 are brought into close contact with each other by a sufficiently strong method so that the conductor 24 is cut along with the occurrence of cracks in the flange 18 of the wheel 10.

  FIG. 2 is a cross-sectional view showing a cross section of the conductor 24 according to the first embodiment. In the present embodiment, as shown in FIG. 2, the conductor 24 is bonded to the flange 18 of the inner rim 16 with an adhesive and is in close contact with the flange 18 via an adhesive layer 36. In the wheel 10, since the insulating coating 34 is applied on the conductive aluminum base 32, the conductor 24 is in close contact with the coating 34 via the adhesive layer 36. . Therefore, conduction between the aluminum substrate 32 and the conductor 24 is hindered by the insulating coating film 34.

  In this embodiment, the conductor 24 is exposed on the surface of the flange 18, but the conductor 24 may not be exposed on the surface of the flange 18. For example, the conductor 24 may be brought into close contact with the undercoat coating film, and the coating film may be further coated thereon so that the conductor 24 is not exposed on the surface. In addition, when the insulating coating 34 is not applied to the aluminum base 32, an insulating coating may be formed on the aluminum base 32, and the conductor 24 may be adhered to the coating.

  Returning to FIG. A continuity test terminal 30 is provided in the vicinity of the design surface 13 of the wheel 10. In the present embodiment, the continuity test terminal 30 is disposed on the surface of the disk 12 that faces the vehicle inner side that is not the design surface 13. The conductor 24 and the continuity test terminal 30 are connected by a lead wire 26 extending from the lead portion 28 of the conductor 24. The continuity test terminal 30 is connected to a continuity test device 60 provided outside the wheel 10 via a continuity test lead wire 62. The conduction state inspection device 60 includes a power source for inspecting the conduction state of the conductor 24, an abnormality determination unit 64 that determines whether or not the wheel 10 is abnormal from the conduction state of the conductor 24, and an abnormality determination unit. The display part etc. which display the determination result by 64 are comprised.

  In the present embodiment, the wheel 10 and the conduction state inspection device 60 provided outside the wheel 10 are connected by a conduction inspection conductor 62 when the conduction state of the conductor 24 is inspected. When the inspection is completed, the connection between the continuity test terminal 30 and the continuity test lead wire 62 is released, and the continuity test device 60 is removed from the wheel 10.

  FIG. 3 is a cross-sectional view showing the main part of the cross section of the wheel 10. The wheel rim 15 is appropriately fitted with a drive-in or affixed balance weight 17. A balance weight 17 is attached to the flange 18 of the inner rim 16 via a balance weight attachment member 23. The balance weight attaching member 23 is hooked and attached to a balance weight attaching groove 23 a provided on the top of the flange 18. Since a high stress is generated in the vicinity of the balance weight mounting groove 23a, it becomes a starting point when a crack occurs. Therefore, in this embodiment, the conductor 24 is in close contact with the balance weight mounting groove 23a.

  In the present embodiment, the wheel 10 is equipped with a TPMS valve 20 that functions as a valve for adjusting the air pressure of the tire 11. The TPMS valve 20 is attached to a mounting hole 21 provided in the wheel rim 15 via a grommet 19 made of elastic rubber, a washer, and a bolt. The grommet 19 has a predetermined rigidity and keeps the tire internal space airtight. The valve cap 20a of the TPMS valve 20 protrudes outside the wheel rim 15. If the valve cap 20a is removed and a hose of an air supply device is connected to a valve port (not shown), air is introduced into the tire interior space. Supply is possible. The TPMS valve 20 has a housing 22 that protrudes into the tire internal space. The housing 22 accommodates an air pressure sensor for detecting the air pressure in the tire internal space, a power source, and the like. The present invention can also be applied to a wheel having a valve that does not have an air pressure sensor or the like.

  The lead wire 26 extends from the lead portion 28 of the conductor 24 toward the continuity inspection terminal 30 provided in the vicinity of the design surface 13 along the tire 11 side surface on the radially outer side of the inner rim 16. In the present embodiment, in order to maintain the airtightness of the tire internal space, the lead wire 26 is inserted into the housing 22 of the TPMS valve 20 in an airtight manner, and is pulled out from the TPMS valve 20 through the inside of the housing 22 for continuity inspection. Connected to terminal 30. Note that the lead line 26 may extend toward the continuity testing terminal 30 on the surface of the wheel rim 15 facing the radially inner side.

  FIG. 4 is a diagram for explaining the configuration of the drawing portion 28. In the lead-out portion 28, the conductor 24 is not connected in the circumferential direction of the wheel rim 15, and the conductor end portion 40 is opposed to the minute gap 42. The tips of the opposing conductor end portions 40 overlap with each other in the central axis direction of the wheel 10 (the direction of arrow A in FIG. 4). In the present embodiment, the tip of the conductor end portion 40 has a width narrower than that of the conductor 24, and the total width of the two opposing conductor end portions 40 and the width of the conductor 24 are approximately the same. . Leaders 26 extend from the tips of the respective conductor end portions 40 on the surface of the wheel rim 15 in parallel to each other toward the design surface 13 in a direction substantially perpendicular to the conductors 24. Further, an insulating layer 38 is laminated on one conductor end 40, and a lead line 26 connected to the other conductor end 40 is further laminated thereon. This is because the insulating layer 38 prevents conduction between the one conductor end 40 and the lead wire 26 connected to the other conductor end 40.

  It should be noted that the tip of the conductor end portion 40 overlaps with respect to the central axis direction of the wheel 10 so that the conductor 24 is cut even when a crack occurs at the interval 42 so that the occurrence of the crack can be detected. It is to make it. As shown in FIG. 5, a configuration in which the end of the conductor end 40 does not overlap in the central axis direction of the wheel 10 but simply faces the conductor end 40 across the interval 42 is also employed in this embodiment. Yes. In this case, the conductor 24 is not cut when a crack occurs at the interval 42. For this reason, the former structure (FIG. 4) in which the conductor end portions 40 overlap is preferable in terms of increasing the accuracy of crack detection. On the other hand, in the former configuration, it is necessary to laminate an insulating layer 38 between the conductor end portion 40 and the lead wire 26. Therefore, the latter configuration (FIG. 5) simplifies the manufacturing process of the lead portion 28. This is preferable.

  A description will be given with reference to FIG. 4 again. Each lead line 26 from each conductor end 40 is connected in parallel to each terminal portion 31 of the continuity test terminal 30. Each terminal portion 31 is connected to a power source inside the continuity test device 60 via a continuity test lead wire 62. In this way, a closed circuit is formed between the power supply inside the conduction state inspection device 60 and the conductor 24.

  Note that one of the conductor end portions 40 may be connected to the continuity test terminal 30 by the lead wire 26 and the other end of the conductor end portion 40 may be connected to the aluminum base 32 of the wheel 10 so as to be conductive. In this case, the continuity state of the conductor 24 is inspected by connecting a desired location near the design surface 13 from which the insulating coating film 34 has been peeled off and the continuity inspection terminal 30 to the continuity state inspection device 60. can do.

  In the configuration as described above, the abnormality determination unit 64 in the conduction state inspection device 60 inspects the conduction state of the conductor 24. The abnormality determination unit 64 determines that the wheel 10 is normal when the conductor 24 is conductive. On the other hand, the abnormality determination unit 64 determines that the wheel 10 is abnormal when the conductor 24 is not conductive. This is because, when the conductor 24 is not conductive, it is considered that the conductor 24 is cut at any location as a crack occurs in the wheel 10. The determination result by the abnormality determination unit 64 is output and displayed on a display unit provided in the conduction state inspection device 60 or a display device provided as appropriate.

  As described above, according to the present embodiment, the abnormality of the wheel 10 can be determined by a simple method of inspecting the conduction state of the conductor 24. Further, by bringing the conductor 24 into close contact with the high stress portion of the flange 18 of the inner rim 16, it is possible to detect cracks in the wheel with high sensitivity.

  Furthermore, the conductor 24 can be connected to the continuity test device 60 provided outside the wheel 10 via the continuity test terminal 30 to determine the abnormality of the wheel 10. Therefore, it is not necessary to provide the conduction state inspection device 60 inside the wheel 10, and an increase in the weight of the wheel 10 can be suppressed. At this time, since the continuity test terminal 30 is provided in the vicinity of the design surface 13, even when the wheel 10 is attached to the vehicle, the continuity test device 60 and the continuity test are provided outside. It is easy to inspect the conduction state of the conductor 24 by connecting to the terminal 30. Therefore, when performing the operation | work which determines the abnormality of the wheel 10, it can carry out quickly and easily, without removing the wheel 10 from a vehicle.

  Subsequently, a second embodiment of the present invention will be described. In the second embodiment, the configuration of the conductor 24 is different from that of the first embodiment. FIG. 6 is a cross-sectional view showing a cross section of the conductor 24 in the second embodiment. In the following description, the description of the same parts as in the first embodiment will be omitted as appropriate.

  As shown in FIG. 6, in the second embodiment, the conductor 24 includes a first conductive layer 50 and a second conductive layer 52. The first conductive layer 50 is in close contact with the surface of the flange 18 of the inner rim 16 along the circumferential direction of the inner rim 16 in an annular manner continuously over substantially the entire circumference. The first conductive layer 50 is bonded to the flange 18 of the inner rim 16 with an adhesive, and is in close contact with the flange 18 via the adhesive layer 36. Since the first conductive layer 50 is in close contact with the insulating coating 34 applied to the aluminum base 32 of the wheel 10, the conduction between the aluminum base 32 and the first conductive layer 50 is an insulating coating. 34.

  An insulator 54 is disposed in the gap 56 between the first conductive layer 50 and the second conductive layer 52. The insulator 54 is continuously provided in an annular shape on the first conductive layer 50 over the entire circumference in the circumferential direction of the inner rim 16. The insulator 54 is bonded and fixed to each of the first conductive layer 50 and the second conductive layer 52. The insulator 54 is deformed in accordance with the deformation of the inner rim 16 to bring the first conductive layer 50 and the second conductive layer 52 into contact with each other. In the present embodiment, the insulator 54 is, for example, a tube-shaped resin-made thin tube having a hollow central portion, and the two tube-shaped thin tubes are arranged on the first conductive layer 50 in parallel.

  The second conductive layer 52 is disposed to face the first conductive layer 50 with a gap 56 from the first conductive layer 50. In the present embodiment, the gap 56 between the first conductive layer 50 and the second conductive layer 52 is, for example, about 0.5 mm. The second conductive layer 52 is bonded to the insulator 54, and is continuously provided in an annular shape along the first conductive layer 50 over substantially the entire circumference of the inner rim 16.

  Both the first conductive layer 50 and the second conductive layer 52 are made of a conductive material such as copper, for example, in a thin film shape having a width of, for example, 1 mm or less and a thickness of about 0.1 mm or less. Moreover, the 1st conductive layer 50 and the 2nd conductive layer 52 are connected to the terminal 30 for a continuity test similarly to 1st Embodiment. The first conductive layer 50 and the second conductive layer 52 are connected to the continuity test device 60 via the continuity test terminal 30.

  Since a tubular insulator 54 is disposed in the gap 56 between the first conductive layer 50 and the second conductive layer 52, in a normal state where the wheel 10 is not deformed, the first conductive layer A gap 56 between the layer 50 and the second conductive layer 52 is maintained by an insulator 54. On the other hand, when the wheel 10 is deformed by a predetermined size or more, the insulator 54 is also deformed along with the deformation, and the first conductive layer 50 and the second conductive layer come into contact with each other. Then, when the continuity between the first conductive layer 50 and the second conductive layer 52 is inspected, it is detected that there is continuity between the two.

  In the above-described configuration, the abnormality determination unit 64 in the conduction state inspection device 60 inspects the conduction state between the first conductive layer 50 and the second conductive layer 52. The abnormality determination unit 64 determines that there is an abnormality in the wheel 10 when there is conduction between the first conductive layer 50 and the second conductive layer 52. In this case, it is considered that the first conductive layer 50 and the second conductive layer 52 are in contact with each other because the wheel 10 is deformed.

  The abnormality determination unit 64 also inspects the conduction state of the first conductive layer 50. The abnormality determination unit 64 determines that the wheel 10 has an abnormality when the first conductive layer 50 is not conductive. This is because in this case, it is considered that the first conductive layer 50 is cut because the wheel 10 is cracked. On the other hand, the abnormality determination unit 64 determines that the wheel 10 is normal when there is no conduction between the first conductive layer 50 and the second conductive layer 52 and the first conductive layer 50 is conductive. .

  As described above, also according to the present embodiment, the abnormality of the wheel 10 can be determined by a simple method of inspecting the conduction state of the conductor 24. In this embodiment, the crack of the wheel 10 that changes the conduction state of the first conductive layer 50 and the deformation of the wheel 10 that changes the conduction state between the first conductive layer 50 and the second conductive layer 52 are different. It is possible to determine the presence or absence of two types of abnormalities. Therefore, the abnormal state of the wheel 10 can be determined in more detail. Also, since deformation usually occurs before a crack occurs, in this embodiment, it is possible to take measures such as repair when it is determined that the deformation has occurred, and the occurrence of a crack can be prevented. This is also preferable.

  In the second embodiment, the conduction state of the first conductive layer 50 is inspected in order to detect cracks in the wheel 10, but instead, abnormality determination in the conduction state inspection device 60 is determined. The unit 64 may inspect the conduction state of the second conductive layer 52.

  The insulator 54 is continuously provided on the first conductive layer 50 in an annular shape over the entire circumference in the circumferential direction of the inner rim 16. However, the present invention is not limited to this, and the insulator 54 is not continuous on the first conductive layer 50. May be provided. The second conductive layer 52 only needs to be supported by an insulating support member that makes the first conductive layer 50 and the second conductive layer 52 face each other with a predetermined gap 56 therebetween. The insulator 54 is not necessarily provided in the gap 56 with the conductive layer 52.

  The present invention is not limited to the above-described embodiments. Various modifications such as design changes can be added to each embodiment based on the knowledge of those skilled in the art, and embodiments to which such modifications are added can also be included in the scope of the present invention. Here are some examples.

  In the present embodiment, the conduction state inspection device 60 including the abnormality determination unit 64 is provided outside the wheel 10 and is connected to the wheel 10 at the time of inspection, but the present invention is not limited to this. . The conduction state inspection device 60 including the abnormality determination unit 64 may be fixed to the wheel 10. For example, a conduction state inspection unit including the abnormality determination unit 64 may be provided inside the housing 22 of the TPMS valve 20.

  Further, in the present embodiment, the conductor 24 is in close contact with the high stress portion of the flange 18 of the inner rim 16 in an annular shape, but the conductor 24 may be provided at other portions of the surface layer portion of the wheel 10. For example, the conductors 24 may be provided on the outer rim 14 or may be provided radially on the surface layer portion of the disk 12. Alternatively, by providing a plurality of conductors 24 on the wheel 10 in, for example, a lattice shape, it is possible to detect where an abnormality has occurred in the wheel 10.

It is a perspective view showing an outline of a wheel concerning a 1st embodiment of the present invention. It is sectional drawing which shows the cross section of the conductor which concerns on 1st Embodiment. It is sectional drawing which shows the principal part of the cross section of a wheel. It is a figure for demonstrating the structure of a drawer | drawing-out part. It is a figure which shows the other example of a structure of a drawer | drawing-out part. It is sectional drawing which shows the cross section of the conductor in 2nd Embodiment.

Explanation of symbols

  10 wheel, 12 disk, 13 design surface, 15 wheel rim, 16 inner rim, 18 flange, 24 conductor, 30 continuity inspection terminal, 50 first conductive layer, 52 second conductive layer, 54 insulator, 56 gap, 60 Continuity state inspection device.

Claims (9)

A conductor adhered to the surface layer along the circumferential direction of the wheel rim;
An abnormality determination unit that determines whether or not the wheel rim has an abnormality by inspecting a conduction state of the conductor;
A wheel abnormality determination device comprising: A first conductive layer in close contact with a surface layer portion of the wheel; and a second conductive layer disposed opposite to the first conductive layer with a gap from the first conductive layer. A conductor;
It is determined whether or not the wheel has an abnormality by inspecting at least one of a conduction state of the first conductive layer and a conduction state between the first conductive layer and the second conductive layer. An abnormality determination unit to perform,
A wheel abnormality determination device comprising:   The abnormality determination unit determines that the wheel is cracked when the first conductive layer is not conductive when the conductive state of the first conductive layer is inspected, and the first conductive layer When the conduction state between the first conductive layer and the second conductive layer is inspected when the conduction state between the first conductive layer and the second conductive layer is inspected, the wheel is deformed. The wheel abnormality determination device according to claim 2, wherein   The wheel abnormality determination device according to any one of claims 1 to 3, wherein the conductor is in close contact with a flange portion of a wheel rim. A continuity test terminal disposed on the design surface side of the wheel and connected to the conductor;
5. The wheel abnormality determination device according to claim 1, wherein the conductor is connected to the abnormality determination unit via the continuity inspection terminal. A disk-shaped disc with one surface formed as a design surface;
A flange portion is formed toward the outer side in the radial direction of the disc at an outer edge portion separated from the design surface, and an inner rim that is annularly fixed to the outer peripheral portion of the disc;
A conductor closely adhered to a surface layer portion of the flange portion along a circumferential direction of the inner rim;
A terminal for continuity inspection connected to the conductor to inspect the continuity state of the conductor, and disposed on the design surface side;
A wheel characterized by comprising: A disk-shaped disc,
A wheel rim fixed annularly to the outer periphery of the disc;
A first conductive layer in close contact with a surface layer of the disk or the wheel rim, and a second conductive layer disposed opposite to the first conductive layer with a gap from the first conductive layer. A conductor comprising a layer;
A wheel characterized by comprising: Inspecting the conductive state of the conductor adhered to the surface layer along the circumferential direction of the wheel rim,
A wheel abnormality determination method comprising: determining that the wheel rim is normal when there is continuity; and determining that the wheel rim is cracked when there is no continuity. Between the first conductive layer in close contact with the surface layer portion of the wheel and the second conductive layer disposed opposite the first conductive layer with a gap from the first conductive layer Check the continuity,
A wheel abnormality determination method, comprising: determining that the wheel is deformed when there is conduction between the first conductive layer and the second conductive layer.

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