JP2007024745A - Simplified metal discrimination meter - Google Patents

Simplified metal discrimination meter Download PDF

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JP2007024745A
JP2007024745A JP2005209674A JP2005209674A JP2007024745A JP 2007024745 A JP2007024745 A JP 2007024745A JP 2005209674 A JP2005209674 A JP 2005209674A JP 2005209674 A JP2005209674 A JP 2005209674A JP 2007024745 A JP2007024745 A JP 2007024745A
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metal
metal electrode
lead
inspected
potential difference
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Shigemi Mio
恵己 美尾
Tadao Murayama
忠雄 村山
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MARK DENSHI KK
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MARK DENSHI KK
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a portable, nondestructive, and simplified metal discrimination meter capable of easily discriminating lead-free solder from lead solder. <P>SOLUTION: The simplified metal discrimination meter is provided with an easily detachable electrolyte tip made of a material for absorbing and holding an electrolytic solution to be in contact with the surface of a metal to be inspected; a measuring probe having both an easily detachable reference metal electrode to be in contact with the electrolyte tip and an object metal contact terminal to be in contact with the surface of the metal to be inspected; and a function for detecting a potential difference between the reference metal electrode and the metal to be inspected and displaying the potential difference on a display part. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、例えば、エレクトロニクス製品を製造する事業所等に於いて、製品を構成する電子部品や電子基板に使用されている半田が鉛フリー半田(鉛を含まない半田)なのか、あるいは鉛半田(鉛を含む半田)なのかを簡単に、判別することに有用な簡易金属判別計に関する。   The present invention relates to, for example, whether a solder used for an electronic component or an electronic board constituting a product is a lead-free solder (a solder containing no lead) in a business place that manufactures an electronic product, or a lead solder. The present invention relates to a simple metal discriminator useful for easily discriminating whether it is (a solder containing lead).

近年、地球環境を守るため、環境に悪影響のある物質の使用規制が要求されており、具体的には2006年7月より、EU加盟国で流通する電気・電子機器に対する特定有害物質の使用を制限する指令が実施される。この指令は、Restriction of Hazardous Substances(有害物質制限)の頭文字を取って、RoHS(ロース)指令と呼ばれている。 In recent years, in order to protect the global environment, regulations on the use of substances that have a negative impact on the environment have been required. Specifically, from July 2006, the use of specific hazardous substances in electrical and electronic equipment distributed in EU member states Restriction directives are implemented. This directive is called the RoHS directive after taking the initials of Restriction of Hazardous Substances.

ここで特定有害物質とは鉛、水銀、カドミウム、六価クロム、ポリ臭化ビフェニール、ポリ臭化ジフェニルエーテルである。一般的な電気・電子機器では電子部品を電子基板に半田付けする時に用いる半田に含まれる鉛が問題となる。従来、一般的に広く使用された半田の組成は錫63%、鉛37%の鉛を含んだ鉛半田である。しかし、鉛半田の全廃適用は技術的・経済的に容易でなく、RoHS指令で適用除外となる電子部品、電子機器が存在することになった。具体的にはエレクトロニクス製品を製造する事業所に於いて、鉛フリー半田と鉛半田が共存することになる。従って、電子機器の管理上、電子部品、電子基板に使用されている半田が鉛半田か鉛フリー半田か不明な場合に、鉛半田か鉛フリー半田かを判別することが必要になってきたが、外観上では区別がつかず、簡単に判別することが困難であった。 Here, specific harmful substances are lead, mercury, cadmium, hexavalent chromium, polybrominated biphenyl, and polybrominated diphenyl ether. In general electric / electronic devices, lead contained in solder used when soldering an electronic component to an electronic board is a problem. Conventionally, the composition of solder that has been generally widely used is lead solder containing 63% tin and 37% lead. However, it is technically and economically difficult to completely eliminate the use of lead solder, and there are electronic parts and electronic devices that are exempted from the RoHS directive. Specifically, lead-free solder and lead solder coexist in an office that manufactures electronic products. Therefore, in the management of electronic equipment, when it is unclear whether the solder used for electronic components and electronic boards is lead solder or lead-free solder, it has become necessary to determine whether it is lead solder or lead-free solder. However, it was difficult to distinguish easily on the appearance.

上記のような課題を解決するために、鉛検出用治具(特許文献1)といった発明が紹介されている。
特開2001−208742
In order to solve the above problems, an invention such as a lead detection jig (Patent Document 1) has been introduced.
JP 2001-208742 A

ところで、上記のような従来の技術には、次のような解決すべき課題があった。それは鉛半田と鉛フリー半田を安全に簡単に外観を損なうことなく判別する検出用指示薬がないことである。鉛を検知すると言われている指示薬があるが、人体や電子部品への安全性等が不明な化学的反応性のある指示薬を使用しなければならないことや、鉛以外の物質にも鉛と同様に反応してしまうことや、半田面を磨く前処理が必要等、鉛半田と鉛フリー半田を簡単に安全に外観を損なうことなく安定して判別する指示薬がない。一方、従来から、蛍光X線検出分析装置や発光分析装置等の物質を特定する分析装置があるが、分析装置が高価であり、通常の電気・電子機器の製造事業所では簡便に用いることができないという問題があった。   By the way, the conventional techniques as described above have the following problems to be solved. That is, there is no indicator for detection that can distinguish between lead solder and lead-free solder safely and easily without impairing the appearance. There is an indicator that is said to detect lead, but it is necessary to use a chemically reactive indicator whose safety to the human body and electronic parts is unknown, and to substances other than lead as well as lead There is no indicator that can distinguish between lead solder and lead-free solder easily and safely without damaging the appearance, such as the need for pretreatment to polish the solder surface. On the other hand, there are conventional analyzers for identifying substances such as fluorescent X-ray detection analyzers and emission analyzers, but the analyzers are expensive and can be used easily at ordinary electrical and electronic equipment manufacturing establishments. There was a problem that I could not.

本発明は、以上の点に着目して、なされたもので、事業所規模の大小を問わず、どこの電気・電子機器の製造事業所でも簡便に用いることができ、鉛半田と鉛フリー半田を簡単に判別できる簡易金属判別計を提供することを目的とする。   The present invention has been made paying attention to the above points, and can be easily used at any electric or electronic equipment manufacturing establishment regardless of the scale of the establishment. Lead solder and lead-free solder An object of the present invention is to provide a simple metal discriminator that can easily discriminate between the two.

本発明は以上の点を解決するため次の構成を採用する。   The present invention adopts the following configuration in order to solve the above points.

〈構成1〉
検査対象の金属表面に接触して着脱が容易な電解質チップと電解質チップに接触して着脱が容易な基準金属電極及び検査対象金属の表面に接触する対象金属接触端子を有する一体型計測プローブで基準金属電極と検査対象金属間の電位差を検出し、表示部に金属種類毎に異なるイオン化傾向の違いに起因する電位差を表示する機能を備えたことを特徴とする簡易金属判別計で表面積の大きな金属表面の計測に適する。
<Configuration 1>
Standard with an integrated measuring probe that has an electrolyte tip that contacts the metal surface to be inspected and is easy to attach and detach, a reference metal electrode that contacts the electrolyte tip and is easy to attach and detach, and a target metal contact terminal that contacts the surface of the metal to be inspected A metal with a large surface area with a simple metal discriminator, which has the function of detecting the potential difference between the metal electrode and the metal to be inspected and displaying the potential difference due to the difference in ionization tendency that differs for each metal type on the display. Suitable for surface measurement.

〈構成2〉
検査対象の金属表面に接触して着脱が容易な電解質チップと電解質チップに接触して着脱が容易な基準金属電極を有する分割型計測プローブと検査対象金属の表面に接触する対象金属接触端子から基準金属電極と検査対象金属間の電位差を検出し、表示部に金属種類毎に異なるイオン化傾向の違いに起因する電位差を表示する機能を備えたことを特徴とする簡易金属判別計で、電子基板等の回路ネットが構成されている小さい金属表面の計測に適する。
<Configuration 2>
The reference from the target metal contact terminal that contacts the surface of the metal to be inspected and the split-type measuring probe that has the reference metal electrode that comes in contact with the surface of the metal to be inspected and can be easily attached and detached, and the electrolyte chip. This is a simple metal discriminator characterized by detecting the potential difference between the metal electrode and the metal to be inspected and displaying the potential difference due to the difference in ionization tendency that differs for each metal type on the display unit. It is suitable for measurement of small metal surfaces on which circuit nets are constructed.

本発明では、例えば、電気・電子機器の事業所において、ある電子部品の金属表面が鉛半田なのか、鉛フリー半田なのか特定したい場合、検査対象金属表面の汚れをアルコール等で充分に汚れを落とし、汚れに起因する誤差を防止することが望ましい。また本発明の簡易金属判別計で用いる電解質溶液は化学的に安定で計測する時間内で接触する検査対象金属と酸化、塩化等の化学反応を起こし難く、導電性を確保できる十分なイオンを供給できる電離度が大きい塩化ナトリウム水溶液等が望ましい。   In the present invention, for example, when it is desired to specify whether a metal surface of an electronic component is lead solder or lead-free solder at an electric / electronic equipment establishment, the metal surface to be inspected should be sufficiently soiled with alcohol or the like. It is desirable to prevent errors caused by dropping and dirt. In addition, the electrolyte solution used in the simple metal discriminator of the present invention is chemically stable and supplies sufficient ions that are difficult to cause chemical reactions such as oxidation and chlorination with the metal to be in contact within the time to be measured and can ensure conductivity. A sodium chloride aqueous solution having a high degree of ionization that can be used is desirable.

以下、本発明を実施例により詳細に説明する。 Hereinafter, the present invention will be described in detail with reference to examples.

図1は、本発明による一体型計測プローブ式の簡易金属判別計の実施例である。この簡易金属判別計は、電解質チップ11、基準金属電極12と対象金属接触端子15からなる一体型計測プローブ3、基準金属電極側ケーブル53、検査対象金属側ケーブル54、表示部6と操作部7からなる本体部5を備える。   FIG. 1 shows an embodiment of an integrated measuring probe type simple metal discriminator according to the present invention. This simple metal discriminator includes an electrolyte chip 11, an integrated measurement probe 3 including a reference metal electrode 12 and a target metal contact terminal 15, a reference metal electrode side cable 53, an inspection target metal side cable 54, a display unit 6 and an operation unit 7. A main body portion 5 is provided.

検査対象金属1は絶縁物2上に位置する。電解質チップ11に塩化ナトリウム等の電解質溶液を含ませて基準金属電極12及び検査対象金属1と接触し、電解質チップ11を介して検査対象金属1と基準金属電極12が電解質溶液のイオンにより電気的に接続される。電解質チップ11の各金属接触面の周りでの表面金属のイオン化により検査対象金属1と基準金属電極12のイオン化傾向の違いによる電位差が対象金属端子15と基準金属電極12との間に生じ、その電位差が基準金属電極側ケーブル53と検査対象金属側ケーブルを介して本体部5に伝えられ、表示部6にて、計測した電位差が表示される。 The inspection target metal 1 is located on the insulator 2. An electrolyte solution such as sodium chloride is included in the electrolyte chip 11 to come into contact with the reference metal electrode 12 and the inspection object metal 1, and the inspection object metal 1 and the reference metal electrode 12 are electrically connected by ions of the electrolyte solution through the electrolyte chip 11. Connected to. Due to the ionization of the surface metal around each metal contact surface of the electrolyte chip 11, a potential difference due to the difference in ionization tendency between the inspection target metal 1 and the reference metal electrode 12 occurs between the target metal terminal 15 and the reference metal electrode 12. The potential difference is transmitted to the main body 5 via the reference metal electrode side cable 53 and the inspection target metal side cable, and the measured potential difference is displayed on the display unit 6.

[一体型計測プローブ]
図2は本発明の一体型計測プローブ3の構成を示す構成図である。
[Integrated measurement probe]
FIG. 2 is a configuration diagram showing the configuration of the integrated measurement probe 3 of the present invention.

図2に示すように、電解質チップ11は基準金属電極12に着脱容易な構造で取り付き、押さえ留めネジ19で基準金属電極12に固定される。基準金属電極12は基準電極導体14に着脱容易な構造で取り付き、留めネジ13で固定される。留めネジ13は電解質チップ11に接触しない構造として留めネジ13の表面金属のイオン化による影響を防止する。基準電極導体14は基準金属電極側プローブコネクタ51に接続されている。一方、対象金属接触端子15は、検査対象金属1と安定した接触を得るため検査対象金属1の凹凸を吸収するコイルバネ16及び対象金属端子導体17を介して検査対象金属側プローブコネクタ52に接続されている。 As shown in FIG. 2, the electrolyte chip 11 is attached to the reference metal electrode 12 with a structure that can be easily attached and detached, and is fixed to the reference metal electrode 12 with a holding screw 19. The reference metal electrode 12 is attached to the reference electrode conductor 14 with a structure that can be easily attached and detached, and is fixed by a retaining screw 13. The retaining screw 13 has a structure that does not contact the electrolyte chip 11 and prevents the influence of ionization of the surface metal of the retaining screw 13. The reference electrode conductor 14 is connected to the reference metal electrode side probe connector 51. On the other hand, the target metal contact terminal 15 is connected to the test target metal side probe connector 52 via the coil spring 16 and the target metal terminal conductor 17 that absorb the unevenness of the test target metal 1 in order to obtain stable contact with the test target metal 1. ing.

電解質チップ11は保水性の大きい繊維素材や多孔質の高分子素材からなり、塩化ナトリウム等の電解質溶液を含ませて基準金属電極12及び検査対象金属1と接触する。このため、電解質チップ11が検査対象金属1に接触時に検査対象金属1の金属イオンに汚染されるので、計測毎に新しい電解質チップ11への交換が望ましく、着脱が容易な構造とする。また基準金属電極12も電解質溶液で汚染、劣化するので基準電極導体14に着脱容易な構造とする。   The electrolyte chip 11 is made of a fiber material having a large water retention property or a porous polymer material, and contains an electrolyte solution such as sodium chloride so as to come into contact with the reference metal electrode 12 and the inspection target metal 1. For this reason, since the electrolyte chip 11 is contaminated by metal ions of the inspection target metal 1 when contacting the inspection target metal 1, it is desirable to replace the electrolyte chip 11 with a new electrolyte chip 11 every measurement, and the structure can be easily attached and detached. Further, since the reference metal electrode 12 is also contaminated and deteriorated by the electrolyte solution, the reference electrode conductor 14 can be easily attached and detached.

特にイオン化傾向の類似した金属間では、計測される電位差が小さいので、計測の精度を高めるために、判別したい金属と同一組成の金属を基準金属電極12に選択できるように着脱容易な構造とする。例えば、鉛フリー半田か鉛半田かを判定する場合は鉛半田を基準金属電極12とすると、検査対象金属1が基準金属電極12と同一の鉛半田で、汚染による妨害イオンがない等の計測に最適な条件であれば計測される電位差は約0mVとなり、検査対象金属1が鉛半田と特定することが容易に判定できる。   In particular, since the potential difference to be measured is small between metals having similar ionization tendencies, a structure that can be easily attached and detached so that a metal having the same composition as that of the metal to be discriminated can be selected as the reference metal electrode 12 in order to improve measurement accuracy. . For example, when determining whether lead-free solder or lead solder is used as the reference metal electrode 12, the test target metal 1 is the same lead solder as the reference metal electrode 12, and there are no interference ions due to contamination. If the conditions are optimum, the measured potential difference is about 0 mV, and it can be easily determined that the inspection target metal 1 is identified as lead solder.

[本体部]
図3は本発明の本体部5の構成を示す回路ブロック図である。一体型計測プローブ3で検出された電位差は基準金属電極側本体部コネクタ55及び検査対象金属側本体部コネクタ56に入力され、電位差をA/D変換部23の入力仕様に合わせた出力電圧に増幅する増幅回路22に入る。この増幅回路22は電位差の安定検出のため、電流が流れることにより、基準金属電極12及び検査対象金属1と電解質チップ11との接触面周辺で発生する電極反応の影響を避けるため入力電流が充分小さい増幅回路にする。増幅された電位差はA/D変換部23にてアナログ電圧からデジタル信号に変換され、操作部7から指定された表示内容に表示制御部24にて制御され、表示部6にて電位差がデジタル数値として表示される
[Main unit]
FIG. 3 is a circuit block diagram showing the configuration of the main body 5 of the present invention. The potential difference detected by the integrated measurement probe 3 is input to the reference metal electrode side main body connector 55 and the inspection target metal side main body connector 56, and the potential difference is amplified to an output voltage that matches the input specifications of the A / D converter 23. The amplifier circuit 22 is entered. The amplifier circuit 22 has a sufficient input current to avoid the influence of electrode reaction that occurs around the contact surface between the reference metal electrode 12 and the inspection target metal 1 and the electrolyte chip 11 when a current flows for stable detection of a potential difference. Use a small amplifier circuit. The amplified potential difference is converted from an analog voltage to a digital signal by the A / D conversion unit 23, and is controlled by the display control unit 24 according to the display content designated by the operation unit 7. The potential difference is converted into a digital numerical value by the display unit 6. Displayed as

[実施例2]
図4は、本発明による分割型計測プローブ式の簡易金属判別計の実施例である。
[Example 2]
FIG. 4 is an example of a split type measuring probe type simple metal discriminator according to the present invention.

この簡易金属簡易判別計は、電解質チップ11、基準金属電極12からなる分割型計測プローブ33、基準金属電極側ケーブル53、検査対象金属側ケーブル54、表示部6と操作部7からなる本体部5を備える。検査対象金属1とチップ部品の半田付け部31はプリント基板32上に位置する。電解質チップ11に塩化ナトリウム等の電解質溶液を含ませて基準金属電極12及び検査対象金属1と接触し、電解質チップ11を介して検査対象金属1と基準金属電極12が電解質溶液のイオンにより電気的に接続される。電解質チップ11を介して検査対象金属1のチップ部品の半田付け部31と基準金属電極12が電気的に接続され、半田付け部31と基準金属電極12の表面周りでの金属のイオン化により検査対象金属1のチップ部品の半田付け部31と基準金属電極12のイオン化傾向の違いによる電位差が半田付け部31と基準金属電極12間に発生する。検査対象金属1側は半田付け部31から導体回路パターン34を経由して接続端子クリップ35に伝わり、検査対象金属側ケーブル54を経由して本体部5の検査対象金属側本体部コネクタ56に接続される。基準金属電極12側は基準金属電極12から基準金属電極側プローブコネクタ51、基準金属電極側ケーブル53、本体部5の検査対象金属側本体部コネクタ55に伝えられ、表示部6にて、計測した電位差が表示される。 This simple metal simple discriminator includes an electrolyte chip 11, a split-type measuring probe 33 made up of a reference metal electrode 12, a reference metal electrode side cable 53, an inspection object metal side cable 54, a main body part 5 made up of a display unit 6 and an operation unit 7. Is provided. The inspection target metal 1 and the chip part soldering part 31 are located on a printed circuit board 32. An electrolyte solution such as sodium chloride is included in the electrolyte chip 11 to come into contact with the reference metal electrode 12 and the inspection object metal 1, and the inspection object metal 1 and the reference metal electrode 12 are electrically connected by ions of the electrolyte solution through the electrolyte chip 11. Connected to. The soldering part 31 of the chip component of the inspection object metal 1 and the reference metal electrode 12 are electrically connected via the electrolyte chip 11, and the inspection object is obtained by ionization of the metal around the surface of the soldering part 31 and the reference metal electrode 12. A potential difference is generated between the soldering portion 31 and the reference metal electrode 12 due to the difference in ionization tendency between the soldering portion 31 of the metal 1 chip component and the reference metal electrode 12. The inspection target metal 1 side is transmitted from the soldering portion 31 via the conductor circuit pattern 34 to the connection terminal clip 35 and connected to the inspection target metal side main body connector 56 of the main body portion 5 via the inspection target metal side cable 54. Is done. The reference metal electrode 12 side is transmitted from the reference metal electrode 12 to the reference metal electrode side probe connector 51, the reference metal electrode side cable 53, and the inspection target metal side main body connector 55 of the main body 5, and is measured by the display unit 6. The potential difference is displayed.

電解質チップ11は保水性の大きい繊維素材や多孔質の高分子素材からなり、塩化ナトリウム等の電解質溶液を含ませて基準金属電極12及び検査対象金属1と接触するため、電解質チップ11は検査対象金属1に接触時に検査対象金属1の金属イオンに汚染されるので、計測毎に新しい電解質チップ11への交換が望ましく、着脱が容易な構造とする。
また基準金属電極12も電解質溶液で汚染、劣化するので基準電極導体14に着脱容易な構造とする。
The electrolyte chip 11 is made of a fiber material having a large water retention capacity or a porous polymer material, and contains an electrolyte solution such as sodium chloride so as to come into contact with the reference metal electrode 12 and the metal 1 to be inspected. Since the metal ions of the object metal 1 to be inspected are contaminated when contacting the metal 1, it is desirable to replace the electrolyte chip 11 with a new one every measurement, and the structure can be easily attached and detached.
In addition, since the reference metal electrode 12 is also contaminated and deteriorated by the electrolyte solution, the reference electrode conductor 14 can be easily attached and detached.

基準金属電極12は、特にイオン化傾向の類似した金属間では、電位差が小さいので、計測の精度を高めるために、判別したい金属と同一組成の金属を基準金属電極12に選択できるように着脱容易な構造とする。例えば、鉛フリー半田か鉛半田かを判定する場合は鉛半田を基準金属電極12とすると、検査対象金属1が基準金属電極12と同一の鉛半田で、汚染による妨害イオンがない等の計測に最適な条件であれば計測される電位差は約0mVとなり、検査対象金属1が鉛半田と特定することが容易に判定できる。   Since the reference metal electrode 12 has a small potential difference particularly between metals having similar ionization tendency, the reference metal electrode 12 can be easily attached and detached so that a metal having the same composition as the metal to be discriminated can be selected as the reference metal electrode 12 in order to improve measurement accuracy. Structure. For example, when determining whether lead-free solder or lead solder is used as the reference metal electrode 12, the test target metal 1 is the same lead solder as the reference metal electrode 12, and there are no interference ions due to contamination. If the conditions are optimum, the measured potential difference is about 0 mV, and it can be easily determined that the inspection target metal 1 is identified as lead solder.

[実施例3]
図5は、本発明によるプローブ付本体式の簡易金属判別計の実施例である。
[Example 3]
FIG. 5 shows an embodiment of a simple metal discriminator with a probe according to the present invention.

この簡易金属簡易判別計の構造は、図4の実施例2に対して、分割型計測プローブ33と本体部5とが一体となった構造でプローブ付本体41を構成している。接続端子クリップ35及び電解質チップ11、基準金属電極12及び表示部6と操作部7を備え、動作は実施例2と同じである。本実施例3のプローブ付本体41は実施例2に比べて、分割型計測プローブ33と本体部5とを一体構造にしたことにより、小型軽量で持ち運びが便利な構造になり、敷地面積の大きい事業所での使用や事業所外に持ち出しての使用に適する。 The structure of this simple metal simple discriminator constitutes the probe-equipped main body 41 with a structure in which the split measurement probe 33 and the main body 5 are integrated with respect to the second embodiment of FIG. The connection terminal clip 35, the electrolyte chip 11, the reference metal electrode 12, the display unit 6, and the operation unit 7 are provided, and the operation is the same as that of the second embodiment. Compared with the second embodiment, the probe-equipped main body 41 according to the third embodiment has a structure that is small and light and convenient to carry because the split measurement probe 33 and the main body 5 are integrated. Suitable for use at business sites or for use outside business sites.

[用途と効果]
本発明の簡易金属判別計は、例えば、エレクトロニクス製品を製造する事業所に於いて、部品受入検査工程で、受入した電子基板や電子部品が鉛フリー半田を使用しているか確認したい場合、あるいは製造工程の途中で、鉛フリー半田を使用しているか確認したい場合、高価な分析装置を用いることなく、本発明の簡易金属判別計を用いることで簡単に確認することができる。
[Uses and effects]
The simple metal discriminator of the present invention is manufactured, for example, in an establishment that manufactures electronic products, when it is desired to check whether the received electronic board or electronic component uses lead-free solder in the component acceptance inspection process. When it is desired to confirm whether lead-free solder is used during the process, it can be easily confirmed by using the simple metal discriminator of the present invention without using an expensive analyzer.

本発明実施例1の簡易金属判別計の構成図である。It is a block diagram of the simple metal discriminator of Example 1 of this invention. 本発明の計測プローブの構成を示す構成図である。It is a block diagram which shows the structure of the measurement probe of this invention. 本発明の本体部の構成を示す回路ブロック図である。It is a circuit block diagram which shows the structure of the main-body part of this invention. 本発明実施例2の簡易金属判別計の構成図である。It is a block diagram of the simple metal discriminator of Example 2 of this invention. 本発明実施例3の簡易金属判別計の構成図であるIt is a block diagram of the simple metal discriminator of this invention Example 3.

符号の説明Explanation of symbols

1 検査対象金属
2 絶縁物
3 一体型計測プローブ
5 本体部
6 表示部
7 操作部
11 電解質チップ
12 基準金属電極
13 留めネジ
14 基準電極導体
15 対象金属接触端子
16 コイルバネ
17 対象金属端子導体
19 押さえ留めネジ
22 増幅回路
23 A/D変換部
24 表示制御部
31 半田付け部
32 プリント基板
33 分割型計測プローブ
34 導体回路パターン
35 接続端子クリップ
41 プローブ付本体
51 基準金属電極側プローブコネクタ
52 検査対象金属側プローブコネクタ
53 基準金属電極側ケーブル
54 検査対象金属側ケーブル
55 基準金属電極側本体部コネクタ
56 検査対象金属側本体部コネクタ
DESCRIPTION OF SYMBOLS 1 Test object metal 2 Insulator 3 Integrated measurement probe 5 Main body part 6 Display part 7 Operation part 11 Electrolytic chip 12 Reference metal electrode 13 Fastening screw 14 Reference electrode conductor 15 Target metal contact terminal 16 Coil spring 17 Target metal terminal conductor 19 Holding down Screw 22 Amplifying circuit 23 A / D conversion unit 24 Display control unit 31 Soldering unit 32 Printed circuit board 33 Split type measurement probe 34 Conductor circuit pattern 35 Connection terminal clip 41 Body with probe 51 Reference metal electrode side probe connector 52 Inspection target metal side Probe connector 53 Reference metal electrode side cable 54 Inspection target metal side cable 55 Reference metal electrode side main body connector 56 Inspection target metal side main body connector

Claims (1)

検査対象金属の表面に接触して、着脱容易な電位差測定の基準金属電極との間に電解質溶液を吸収保持する材料からなる着脱容易な電解質チップを介し、着脱が容易な基準金属電極の表面金属のイオン化による基準金属電極の電位と検査対象表面金属のイオン化による検査対象金属の電位との電位差を測定する手段を有し、どこでも持ち運び容易な携帯型であることを特徴とした簡易金属判別計。
The surface metal of the reference metal electrode that is easy to attach / detach via an easily attachable / detachable electrolyte chip made of a material that absorbs and holds the electrolyte solution between the surface of the metal to be inspected and the reference metal electrode for potential difference measurement that is easy to attach / detach A simple metal discriminator characterized in that it has a means for measuring the potential difference between the potential of the reference metal electrode due to ionization of the metal and the potential of the metal to be inspected due to ionization of the surface metal to be inspected, and is portable easily anywhere.
JP2005209674A 2005-07-20 2005-07-20 Simplified metal discrimination meter Pending JP2007024745A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005209674A JP2007024745A (en) 2005-07-20 2005-07-20 Simplified metal discrimination meter

Publications (1)

Publication Number Publication Date
JP2007024745A true JP2007024745A (en) 2007-02-01

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005209674A Pending JP2007024745A (en) 2005-07-20 2005-07-20 Simplified metal discrimination meter

Country Status (1)

Country Link
JP (1) JP2007024745A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101878564B1 (en) * 2016-10-18 2018-07-13 한국에너지기술연구원 Coating QC device for the electrical conductive cable and the operation thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101878564B1 (en) * 2016-10-18 2018-07-13 한국에너지기술연구원 Coating QC device for the electrical conductive cable and the operation thereof

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