JP2006262084A - High region replacement circuit - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To solve the problem that the influence of a defective pixel spreads to video signals of other channels when the defective pixel exists in an image pickup element of a channel to be an original signal for generating a high region replacement signal in the case of performing high region replacement processing for replacing a high region component of each channel with a high region replacement signal whose return component is eliminated in order to attain high image quality in an image pickup device that applies spatial pixel shifting. <P>SOLUTION: A low region and high region separating part 1 for dividing an input video signal into a low region and a high region of a frequency band, a high region signal generating part 2 for generating a high region replacement signal from a high region signal, an adding part 3 for adding the high region replacement signal to a low region signal, a flaw detecting part 4 for detecting a defective pixel and acquiring the channel information and position information of the defective pixel and a selecting part 5 for selecting an output of the adding part 3 and the low region signal outputted from the low region and high region separating part 1 are provided. The low region signal of each channel is controlled so as to be outputted as it is to a pixel at the position of the defective pixel by the channel information and position information of the defective pixel acquired by the flaw detecting part 4. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a high-frequency replacement circuit that performs high-frequency component replacement processing to obtain a high-quality image by shifting spatial pixels in an imaging device using a plurality of imaging elements.

  Conventionally, for example, in a three-plate type imaging device using a Charge Coupled Device type imaging device (hereinafter referred to as CCD), three CCDs perform photoelectric conversion of incident light of green (Gch), blue (Bch), and red (Rch), respectively. The obtained electric signal is subjected to various signal processing for high image quality.

  As one method for improving the image quality, there is a spatial pixel shift in which three CCDs are spatially shifted in advance so as to improve the apparent resolution by electrical signal processing. In an imaging apparatus to which spatial pixel shift is applied, for example, as shown in FIG. 14, the Gch CCD is spatially shifted with respect to the other Bch and Rch by an amount corresponding to 1/2 of the pixel pitch. And paste them together.

  On the other hand, the incident light of the CCD is incident upon being band-limited by an optical low-pass filter. As shown in FIG. 15, the characteristics of the optical low-pass filter are those having a wider band than the Nyquist frequency fs / 2 when the sampling frequency of the CCD is fs. This is because the optical low-pass filter cannot make the characteristics so steep, and if the characteristic is band-limited at the Nyquist frequency fs / 2, the high-frequency component of the obtained video signal is largely lost, and the resolution is lowered. It is.

  However, when the optical low-pass filter passes a signal having the Nyquist frequency fs / 2 or higher, the signal is folded back into the Nyquist frequency fs / 2 band as shown by the shaded portion in FIG. A signal component is generated.

  Therefore, as described above, the video signals obtained from the Gch CCD and the other Bch and Rch CCDs that are spatially shifted by a ½ pixel pitch as described above have their aliasing components out of phase with each other. For example, a new high-frequency replacement signal in which the aliasing component is canceled out by the addition average of the high-frequency component of the Gch video signal and the high-frequency component of the Rch video signal is generated. Performs high-frequency replacement processing to replace the frequency components.

  A conventional high-frequency replacement circuit will be described below.

  Conventionally, high-frequency replacement circuits described in Patent Document 1 and Patent Document 2 are known. FIG. 13 is a diagram for explaining the operation of a conventional high-frequency replacement circuit. In FIG. 13, 1 is a low-frequency high-frequency separation unit that separates an input video signal of each channel into a low-frequency signal of a low frequency band and a high-frequency signal of a high frequency band, and 2 is a high-frequency replacement signal from the high frequency signal. Is a high-frequency signal generating unit, and 3 is an adding unit that adds the high-frequency replacement signal to the low-frequency signal.

The conventional high-frequency replacement circuit shown in FIG. 13 performs predetermined signal processing after converting signals obtained by the Gch, Bch, and Rch image sensors to which spatial pixel shift is applied as described above into digital signals. The applied video signals of each channel are input as GIN, BIN, and RIN, respectively. The inputted GIN, BIN and RIN signals are separated into low-frequency signals GL1, BL1 and RL1 and high-frequency signals GH1, BH1 and RH1 by the low-frequency and high-frequency separation unit 1, respectively. The high-frequency signals GH1, BH1, and RH1 are input to the high-frequency signal generation unit 2, and the aliasing components are removed by calculating, for example, an average of GH1 and RH1 whose phases of the aliasing components are opposite to each other. A new high frequency replacement signal is generated. The adder 3 adds the high-frequency replacement signal and the low-frequency signals GL1, BL1, and RL1 of the respective channels, thereby obtaining video signals GOUT, BOUT, and ROUT from which aliasing components are removed.
JP-A-9-107553 JP 2004-72928 A

  However, in the conventional high-frequency replacement circuit, for example, when a defective pixel (scratched pixel) is present in the Rch CCD, the signal output from the defective pixel is often a high-frequency component. The high frequency signal RH1 separated by the unit 1 includes the signal component of the defective pixel. Even if there is a flaw correction circuit that corrects such defective pixels in the previous stage of this high-frequency replacement circuit, it is difficult to completely correct the defective pixels for all input images, and the correction traces are In the case of remaining, the influence may be included in the high frequency signal RH1. Since the high-frequency signal generation unit 2 generates a new high-frequency replacement signal using the high-frequency signal that remains affected by the defective pixel as an original signal, the high-frequency replacement signal also includes the influence of the defective pixel. Therefore, the video signal generated by adding the high-frequency replacement signal to the low-frequency signals GL1, BL1, and RL1 of each channel by the adder 3 includes not only the output signal ROUT after the Rch high-frequency replacement processing but also the originally defective pixel. The influence of defective pixels of Rch will spread to the output signals GOUT and BOUT after the high-frequency replacement processing of Gch and Bch.

  The present invention solves the above-mentioned conventional problems, and even when a defective pixel is present in an image sensor, a high-quality image can be obtained without affecting the signal of a channel in which the defective pixel is not present. An object is to provide a band replacement circuit.

  The invention according to claim 1 of the present invention newly generates a high-frequency signal in the frequency band of the video signal of each channel obtained by a plurality of image sensors and converted into a digital signal and subjected to predetermined signal processing. The high-frequency replacement circuit is characterized in that processing for replacement by a high-frequency replacement signal is controlled by information on defective pixels of the plurality of image sensors, and when a defective pixel exists in an image sensor for a specific channel Has an effect that the high-frequency replacement processing can be controlled by the information of the defective pixel.

  The invention according to claim 2 of the present invention is the high-frequency replacement circuit according to claim 1, wherein the information of the defective pixel is channel information and position information of the defective pixel. When a defective pixel exists in the image sensor, the high-frequency replacement process can be controlled by channel information and position information of the defective pixel.

  According to a third aspect of the present invention, a video signal of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into a digital signal is converted into a low frequency signal and a high frequency signal in a frequency band. A low-frequency high-frequency separation unit for separating; a first high-frequency signal generation unit for generating a first high-frequency replacement signal from the high-frequency signal; and adding the first high-frequency replacement signal to the low frequency signal Based on the information on the defective pixels acquired by the first flaw detection unit, the first flaw detection unit that acquires information on defective pixels of the plurality of image sensors, and the output of the addition unit 3. A high-frequency replacement circuit according to claim 1, further comprising a selection unit that selects a low-frequency signal, and an imaging device for a channel that is an original signal for generating the high-frequency replacement signal. If there is a defective pixel in the For the signal it has the effect that it is possible to output a low frequency signal that does not include the effects of defective pixels.

  According to a fourth aspect of the present invention, a video signal of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into a digital signal is converted into a low frequency signal and a high frequency signal in a frequency band. A low-frequency high-frequency separation unit for separating, a second high-frequency signal generation unit for generating a second high-frequency replacement signal from the high-frequency signal, and adding the second high-frequency replacement signal to the low frequency signal And a second flaw detection unit that obtains information on defective pixels of the plurality of image sensors, and the second high detection unit based on information on the defective pixels obtained by the second flaw detection unit. 3. The high frequency replacement circuit according to claim 1, wherein a process of generating the second high frequency replacement signal of the high frequency signal generation unit is controlled. If there is a defective pixel in the image sensor for the channel that is the signal, information on the defective pixel An effect that enables control of the process of generating the second high-frequency replacement signal to be added to the signal of the position of the pixel.

  According to a fifth aspect of the present invention, the second high-frequency replacement signal generated by the second high-frequency signal generation unit based on the information of the defective pixel is a high-frequency channel that does not include a defective pixel. 5. A high-frequency replacement signal generated by selecting a high-frequency signal as an original signal, or a high-frequency replacement circuit according to claim 4, wherein the high-frequency replacement signal is an original signal for generating a high-frequency replacement signal. If there is a defective pixel in the image sensor for the channel, a channel that does not include the defective pixel at the second high-frequency replacement signal that is added to the signal at the position of the pixel based on the information on the defective pixel The high-frequency replacement signal generated by selecting the high-frequency signal as the original signal can be set to zero or zero.

  According to a sixth aspect of the present invention, a video signal of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into a digital signal is converted into a low frequency signal and a high frequency signal in a frequency band. A low-frequency high-frequency separation unit that separates, a first high-frequency signal generation unit that generates a first high-frequency replacement signal from the high-frequency signal, and a first high-frequency replacement signal are added to the low-frequency signal An adder, a first flaw detector that acquires information on defective pixels of the plurality of image sensors, an output of the adder based on information on the defective pixels acquired by the first flaw detector, and the respective 3. A high-frequency replacement circuit according to claim 1, further comprising a selection unit that selects a video signal of a channel, and imaging for a channel that is an original signal for generating a high-frequency replacement signal. If there is a defective pixel in the element, the information on the defective pixel For signals of the position of the element it has the effect that it is possible to directly output the original video signal of each channel.

  According to the seventh aspect of the present invention, the video signal of each channel obtained by a plurality of image sensors and converted into a digital signal and subjected to predetermined signal processing is converted into a low frequency signal and a high frequency signal in the frequency band. A low-frequency high-frequency separation unit for separating, a third high-frequency signal generation unit for generating a third high-frequency replacement signal from the high-frequency signal, and adding the third high-frequency replacement signal to the low frequency signal And a second flaw detection unit that obtains information on defective pixels of the plurality of image sensors, and the third high level is obtained based on the information on the defective pixels obtained by the second flaw detection unit. 3. The high frequency replacement circuit according to claim 1, wherein a process of generating the third high frequency replacement signal of the high frequency signal generation unit is controlled. If there is a defective pixel in the image sensor for the channel that is the signal, information on the defective pixel An effect that enables control of the process of generating the second high-frequency replacement signal to be added to the signal of the position of the pixel.

  According to an eighth aspect of the present invention, the third high-frequency replacement signal generated by the third high-frequency signal generation unit based on the information of the defective pixel is based on the high-frequency signal as an original signal. 8. The high-frequency replacement circuit according to claim 7, wherein the high-frequency replacement signal is generated, or the high-frequency replacement signal according to claim 7, wherein the channel image pickup device is an original signal for generating the high-frequency replacement signal. When there is a defective pixel, the high-frequency signal of each channel can be output as it is as a third high-frequency replacement signal to be added to the signal at the position of the defective pixel based on the defective pixel information. Have

  The invention according to claim 9 of the present invention is characterized in that the first and second flaw detectors acquire information on defective pixels of the plurality of image pickup devices from video signals of the respective channels. 1 is a high-frequency replacement circuit described in 1 to 8, and has an effect that information can be acquired by detecting defective pixels included in the original video signal.

  According to a tenth aspect of the present invention, from the first aspect, the first and second flaw detection units obtain information on defective pixels of the plurality of image sensors from the high frequency signal. The high-frequency replacement circuit according to 8, which has an effect that information can be acquired by detecting an influence of a defective pixel included in a high-frequency signal.

  According to an eleventh aspect of the present invention, a video signal of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into a digital signal is converted into a low frequency signal and a high frequency signal in a frequency band. A low-frequency high-frequency separation unit for separating; a first high-frequency signal generation unit for generating a first high-frequency replacement signal from the high-frequency signal; and adding the first high-frequency replacement signal to the low frequency signal Output from the addition unit based on information on the defective pixels stored in the first flaw information storage unit, a first flaw information storage unit that stores information on defective pixels of the plurality of image sensors And a selection unit that selects the low-frequency signal. 3. The high-frequency replacement circuit according to claim 1, wherein the high-frequency replacement circuit is for a channel that is an original signal for generating a high-frequency replacement signal. If there are defective pixels in the image sensor, the information For signals of the position of the element has the effect that it is possible to output a low frequency signal that does not include the effects of defective pixels.

  According to a twelfth aspect of the present invention, a video signal of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into a digital signal is converted into a low frequency signal and a high frequency signal in a frequency band. A low-frequency high-frequency separation unit for separating, a second high-frequency signal generation unit for generating a second high-frequency replacement signal from the high-frequency signal, and adding the second high-frequency replacement signal to the low frequency signal And a second flaw information storage unit that stores information on defective pixels of the plurality of image sensors, and the second flaw information storage unit stores information on the defective pixels stored in the second flaw information storage unit. 3. The high-frequency replacement circuit according to claim 1, wherein a process of generating the second high-frequency replacement signal of the high-frequency signal generation unit is controlled in order to generate a high-frequency replacement signal. If there are defective pixels in the channel image sensor that is the original signal of An effect that can control the process of generating the second high-frequency replacement signal to be added to the signal of the position of the pixel by pixel information.

  According to a thirteenth aspect of the present invention, the second high-frequency replacement signal generated by the second high-frequency signal generation unit based on the information on the defective pixel is a high-frequency channel that does not include a defective pixel. 13. The high-frequency replacement signal according to claim 12, wherein the high-frequency replacement signal is generated by selecting a high-frequency signal as an original signal, or is an original signal for generating a high-frequency replacement signal. If there is a defective pixel in the image sensor for the channel, a channel that does not include the defective pixel at the second high-frequency replacement signal that is added to the signal at the position of the pixel based on the information on the defective pixel The high-frequency replacement signal generated by selecting the high-frequency signal as the original signal can be set to zero or zero.

  According to a fourteenth aspect of the present invention, a video signal of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into a digital signal is converted into a low frequency signal and a high frequency signal in a frequency band. A low-frequency high-frequency separation unit for separating; a first high-frequency signal generation unit for generating a first high-frequency replacement signal from the high-frequency signal; and adding the first high-frequency replacement signal to the low frequency signal Output from the addition unit based on information on the defective pixels stored in the first flaw information storage unit, a first flaw information storage unit that stores information on defective pixels of the plurality of image sensors And a selection unit for selecting the video signal of each channel. 3. The high frequency replacement circuit according to claim 1, wherein the channel is an original signal for generating a high frequency replacement signal. If there is a defective pixel in the image sensor, the defective pixel For signals of the position of the pixel by multi-address it has the effect that it is possible to directly output the original video signal of each channel.

  According to a fifteenth aspect of the present invention, a video signal of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into a digital signal is converted into a low frequency signal and a high frequency signal in a frequency band. A low-frequency high-frequency separation unit for separating, a third high-frequency signal generation unit for generating a third high-frequency replacement signal from the high-frequency signal, and adding the third high-frequency replacement signal to the low frequency signal And a second flaw information storage unit that stores information on defective pixels of the plurality of image sensors, and the third flaw information is stored on the basis of information on the defective pixels stored in the second flaw information storage unit. 3. The high-frequency replacement circuit according to claim 1, wherein a process of generating the third high-frequency replacement signal of the high-frequency signal generation unit is controlled to generate a high-frequency replacement signal. 4. If there are defective pixels in the channel image sensor that is the original signal of An effect that can control the process of generating the second high-frequency replacement signal to be added to the signal of the position of the pixel by pixel information.

  According to a sixteenth aspect of the present invention, the third high-frequency replacement signal generated by the third high-frequency signal generation unit based on the information of the defective pixel is based on the high-frequency signal as an original signal. 16. The high-frequency replacement circuit according to claim 15, wherein the high-frequency replacement signal is generated, or the high-frequency replacement signal according to claim 15, wherein the channel image pickup device is an original signal for generating the high-frequency replacement signal. When there is a defective pixel, the high-frequency signal of each channel can be output as it is as a third high-frequency replacement signal to be added to the signal at the position of the defective pixel based on the defective pixel information. Have

  As described above, according to the present invention, since a defective pixel existing in an image sensor of a specific channel can be processed without affecting a video signal of another channel, whether or not a defective pixel exists in the image sensor is determined. Regardless, it is possible to provide a high-frequency replacement circuit that can obtain a high-quality video signal by spatial pixel shifting and high-frequency replacement processing.

  Hereinafter, embodiments of the present invention will be described with reference to FIGS. Note that, here, the original signal for generating the high-frequency replacement signal in the high-frequency signal generation unit is normally the Gch high-frequency signal GH1 and the Rch high-frequency signal RH1, and the channel where the defective pixel exists is described as Rch. .

(Embodiment 1)
FIG. 1 is a diagram showing a schematic configuration of a high-frequency replacement circuit according to Embodiment 1 of the present invention. 1, 2, and 3 are the same as 1, 2, and 3 in the conventional high-frequency replacement circuit of FIG. . Reference numeral 4 denotes a video signal of each channel to detect defective pixels, and a flaw detection unit that acquires channel information and position information of the defective pixels. Reference numeral 5 denotes an output from the addition unit 3 and an output from the low-frequency and high-frequency separation unit 1. It is a selection part which selects the low-pass signal to be performed.

  Hereinafter, the high-frequency replacement circuit according to the first embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the first embodiment of the present invention, the Gch CCD is spatially arranged with the pixel positions shifted from the other Bch and Rch by an amount corresponding to 1/2 of the pixel pitch. The video signals of the respective channels that have been subjected to predetermined signal processing after the signals obtained by the Gch, Bch, and Rch image sensors to which pixel shifting is applied are converted into digital signals are input as GIN, BIN, and RIN, respectively. Is done. The inputted GIN, BIN and RIN signals are separated into low-frequency signals GL1, BL1 and RL1 and high-frequency signals GH1, BH1 and RH1 by the low-frequency and high-frequency separation unit 1, respectively. The high-frequency signals GH1, BH1, and RH1 are input to the high-frequency signal generation unit 2, and the aliasing components are removed by calculating, for example, an average of GH1 and RH1 whose phases of the aliasing components are opposite to each other. A new high frequency replacement signal is generated. Then, the adder 3 adds the high-frequency replacement signal and the low-frequency signals GL1, BL1, and RL1 of each channel, thereby obtaining a video signal from which the aliasing component is removed. Here, in the case where the Gch and Rch used when generating the high-frequency replacement signal in the high-frequency signal generation unit 2 are pixels that are not defective pixels, the selection unit 5 uses the aliasing component as GOUT, BOUT, and ROUT. A video signal with high image quality can be obtained by selecting a video signal from which is removed. On the other hand, when there is a defective pixel in Rch, the influence is included in the high-frequency replacement signal generated using this high-frequency signal RH1, and therefore, in the pixel at this position, GOUT, BOUT and ROUT are selected in the selector 5. By outputting the low-frequency signals GL1, BL1 and RL1 of each channel as they are without selecting the high-frequency replacement signal and the addition signal of the low-frequency signals GL1, BL1 and RL1 of each channel, the influence of defective pixels of Rch Will not spread to other channels. In addition, for Rch, the high frequency signal including the defective pixel component is discarded, so that the influence of the defective pixel may be reduced. The output of the adder 3 and the selection of the low-frequency signals GL1, BL1, and RL1 in the selector 5 are determined by channel information and position of defective pixels detected by the scratch detector 4 from the input video signals GIN, BIN, and RIN of each channel. Control by information.

  The flaw detection unit 4 may be included in the high-frequency replacement circuit according to the first embodiment of the present invention. If there is a flaw detection correction circuit or the like in the previous stage, channel information and position of the defective pixel from the flaw detection unit. Information may be received.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 2)
FIG. 2 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the second embodiment of the present invention. 1 and 3 are the same as 1 and 3 in the high-frequency replacement circuit according to the first embodiment of the present invention in FIG. It is. 7 is a flaw detection unit that receives a video signal of each channel to detect a defective pixel and acquires channel information and position information of the defective pixel, and 6 is a high level based on defective pixel information output from the flaw detection unit 7. This is a high-frequency signal generator that generates a high-frequency signal.

  Hereinafter, the high-frequency replacement circuit according to the second embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the second embodiment of the present invention, video signals of respective channels similar to those in the high-frequency replacement circuit according to the first embodiment of the present invention are input as GIN, BIN, and RIN, respectively, and low-frequency high-frequency separation is performed. Similarly, the low frequency signals GL1, BL1, and RL1 and the high frequency signals GH1, BH1, and RH1 are separated by the unit 1. If both Gch and Rch used for generating the high-frequency replacement signal are not defective pixels, the high-frequency signal generator 6 generates the high-frequency replacement signal from the high-frequency signals GH1 and RH1 as in the first embodiment of the present invention. By adding the new high-frequency replacement signal from which the aliasing component is removed and the low-frequency signals GL1, BL1, and RL1 of each channel, a video signal from which the aliasing component is removed is output as GOUT, BOUT, and ROUT. On the other hand, when there is a defective pixel in Rch, the high-frequency signal generator 6 selects the high-frequency signal BH1 of Bch instead of the high-frequency signal RH1 of Rch, which is a defective pixel, and adds and averages the high-frequency signal GH1 of Gch Is added to the low-frequency signals GL1, BL1, and RL1 of each channel as a high-frequency replacement signal to output GOUT, BOUT, and ROUT. Further, if there is a defective pixel at the same position as Rch in Bch or if there is a defective pixel in Gch, the high-frequency replacement signal output from the high-frequency signal generating unit 6 is set to zero and the low frequency signal GL1 of each channel. , BL1 and RL1 can be added to output the low frequency signals GL1, BL1 and RL1 as they are as GOUT, BOUT and ROUT. Whether the high-frequency replacement signal is generated by the high-frequency signal generation unit 6 or whether the high-frequency replacement signal is set to zero is determined by the scratch detection unit 7 according to the input video signals GIN, BIN and Control is performed based on channel information and position information of defective pixels detected from RIN.

  The flaw detection unit 7 may be included in the high-frequency replacement circuit according to the second embodiment of the present invention. If there is a flaw detection correction circuit or the like in the previous stage, channel information and position of the defective pixel from the flaw detection unit. Information may be received.

  Even when the defective pixel is included only in one channel, the high-frequency replacement signal may be zero.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 3)
FIG. 3 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the third embodiment of the present invention. 1, 2, 3, 4 and 5 are high-frequency replacement circuits according to the first embodiment of the present invention in FIG. 1, 2, 3, 4 and 5.

  Hereinafter, the high-frequency replacement circuit according to the third embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the third embodiment of the present invention, all operations other than the selection unit 5 are the same as those of the high-frequency replacement circuit according to the first embodiment of the present invention. When the Gch and Rch used in generating the high-frequency replacement signal in the high-frequency signal generating unit 2 are pixels that are not defective pixels, the selection unit 5 removes the aliasing components as GOUT, BOUT, and ROUT. By selecting the processed video signal, a high-quality video signal can be obtained. On the other hand, if there is a defective pixel in the Rch, the selection unit 5 outputs the input video signals GIN, BIN, and RIN of each channel as they are as the GOUT, BOUT, and ROUT in the pixel at this position. The effect will not spread to other channels. The selection unit 5 selects the output of the addition unit 3 and the input video signals GIN, BIN, and RIN of each channel by the flaw detection unit 4 from the channel of the defective pixel detected from the input video signals GIN, BIN, and RIN of each channel. Control by information and position information.

  The flaw detection unit 4 may be included in the high-frequency replacement circuit according to the third embodiment of the present invention. If there is a flaw detection correction circuit or the like in the previous stage, channel information and position of the defective pixel from the flaw detection unit. Information may be received.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 4)
FIG. 4 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the fourth embodiment of the present invention. 1, 3 and 7 are 1, 3 and 7 in the high-frequency replacement circuit according to the second embodiment of the present invention in FIG. And 7. Reference numeral 8 denotes a high-frequency signal generation unit that generates a high-frequency replacement signal based on information on defective pixels output from the scratch detection unit 7.

  Hereinafter, the high-frequency replacement circuit according to the fourth embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the fourth embodiment of the present invention, the operations of the low-frequency high-frequency separation unit 1 and the flaw detection unit 7 are the same as those of the high-frequency replacement circuit according to the second embodiment of the present invention. If both Gch and Rch used for generating the high frequency replacement signal are not defective pixels, the high frequency signal generator 8 turns back from the high frequency signals GH1 and RH1 as in the second embodiment of the present invention. A new high-frequency permutation signal from which the component has been removed is generated and output to Gch, Bch, and Rch, and is added to the low-frequency signals GL1, BL1, and RL1 of each channel in the adder 3, whereby GOUT, BOUT, and ROUT The video signal from which the aliasing component is removed is output. On the other hand, if there is a defective pixel in Rch, the high-frequency signal generator 8 outputs the high-frequency signals GH1, BH1, and RH1 of each channel as Gch, Bch, and Rch as high-frequency replacement signals, and the adder 3 outputs each channel. Are added to the original low-frequency signals GL1, BL1, and RL1 to become the original input video signals GIN, BIN, and RIN of the respective channels and output as GOUT, BOUT, and ROUT. The high frequency signal generator 8 determines whether the output signal is a high frequency replacement signal from which the aliasing component is removed or the high frequency signals GH1, BH1, and RH1 of each channel. Control is performed based on channel information and position information of defective pixels detected from the signals GIN, BIN, and RIN.

  The flaw detection unit 7 may be included in the high-frequency replacement circuit according to the fourth embodiment of the present invention. If there is a flaw detection correction circuit or the like in the previous stage, channel information and position of the defective pixel from the flaw detection unit. Information may be received.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 5)
FIG. 5 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the fifth embodiment of the present invention. 1, 2, 3, and 5 are 1 in the high-frequency replacement circuit according to the first embodiment of the present invention in FIG. Same as 2, 3, and 5. Reference numeral 9 denotes a flaw detection unit that receives a high-frequency signal that is an output of the low-frequency high-frequency separation unit 1, detects a defective pixel, and acquires channel information and position information of the defective pixel.

  Hereinafter, the high-frequency replacement circuit according to the fifth embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the fifth embodiment of the present invention, all operations other than the flaw detection unit 9 are the same as those of the high-frequency replacement circuit according to the first embodiment of the present invention, and defective pixels detected by the flaw detection unit 9 are detected. The selector 5 selects the output of the adder 3 and the low-frequency signals GL1, BL1, and RL1 under the control of the channel information and the position information.

  The flaw detection unit 9 detects defective pixels from the high-frequency signals GH1, BH1, and RH1 that are the outputs of the low-frequency high-frequency separation unit 1, so that each channel used as an original signal in the high-frequency signal generation unit 2 is detected. High-frequency replacement processing can be performed depending on the presence or absence of the influence of defective pixels that are directly included in the high-frequency signal.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 6)
FIG. 6 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the sixth embodiment of the present invention. 1, 3 and 6 are 1, 3 and 6 in the high-frequency replacement circuit according to the second embodiment of the present invention shown in FIG. And 6. Reference numeral 10 denotes a flaw detection unit that receives a high-frequency signal that is an output of the low-frequency high-frequency separation unit 1, detects a defective pixel, and acquires channel information and position information of the defective pixel.

  Hereinafter, the high-frequency replacement circuit according to the sixth embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the sixth embodiment of the present invention, all operations except for the flaw detection unit 10 are the same as those in the high-frequency replacement circuit according to the second embodiment of the present invention, and the defective pixels detected by the flaw detection unit 10 are detected. The high-frequency signal generation unit 6 selects the original signal when generating the high-frequency replacement signal, or whether or not to set the high-frequency replacement signal to zero.

  The flaw detection unit 10 detects defective pixels from the high-frequency signals GH1, BH1, and RH1 that are the outputs of the low-frequency high-frequency separation unit 1, so that each channel used as an original signal in the high-frequency signal generation unit 6 is detected. High-frequency replacement processing can be performed depending on the presence or absence of the influence of defective pixels that are directly included in the high-frequency signal.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 7)
FIG. 7 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the seventh embodiment of the present invention. 1, 2, 3, and 5 are 1 in the high-frequency replacement circuit according to the third embodiment of the present invention in FIG. Same as 2, 3, and 5. Reference numeral 9 denotes a flaw detection unit that receives a high-frequency signal that is an output of the low-frequency high-frequency separation unit 1, detects a defective pixel, and acquires channel information and position information of the defective pixel.

  Hereinafter, the high-frequency replacement circuit according to the seventh embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the seventh embodiment of the present invention, all operations other than the flaw detection unit 9 are the same as those of the high-frequency replacement circuit according to the third embodiment of the present invention, and defective pixels detected by the flaw detection unit 9 are detected. The selector 5 selects the output of the adder 3 and the input video signals GIN, BIN, and RIN of each channel under the control of the channel information and position information.

  The flaw detection unit 9 detects defective pixels from the high-frequency signals GH1, BH1, and RH1 that are the outputs of the low-frequency high-frequency separation unit 1, so that each channel used as an original signal in the high-frequency signal generation unit 2 is detected. High-frequency replacement processing can be performed depending on the presence or absence of the influence of defective pixels that are directly included in the high-frequency signal.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 8)
FIG. 8 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the eighth embodiment of the present invention. 1, 3 and 8 are 1, 3 and 3 in the high-frequency replacement circuit according to the fourth embodiment of the present invention shown in FIG. And 8. Reference numeral 10 denotes a flaw detection unit that receives a high-frequency signal that is an output of the low-frequency high-frequency separation unit 1, detects a defective pixel, and acquires channel information and position information of the defective pixel.

  Hereinafter, the high-frequency replacement circuit according to the eighth embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the eighth embodiment of the present invention, all operations other than the flaw detection unit 10 are the same as those of the high-frequency replacement circuit according to the fourth embodiment of the present invention, and defective pixels detected by the flaw detection unit 10 are detected. The high-frequency permutation signal from which the high-frequency signal generator 8 has removed the aliasing component and the high-frequency signals GH1, BH1, and RH1 are selected.

  The flaw detection unit 10 detects defective pixels from the high-frequency signals GH1, BH1, and RH1 that are the outputs of the low-frequency high-frequency separation unit 1, so that each channel used as an original signal in the high-frequency signal generation unit 8 is detected. High-frequency replacement processing can be performed depending on the presence or absence of the influence of defective pixels that are directly included in the high-frequency signal.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 9)
FIG. 9 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the ninth embodiment of the present invention. 1, 2, 3 and 5 are the first embodiment of the present invention in FIG. 1 or the present invention in FIG. This is the same as 1, 2, 3, and 5 in the high-frequency replacement circuit of the fifth embodiment. A scratch information storage unit 11 stores channel information and position information of defective pixels.

  Hereinafter, the high-frequency replacement circuit according to the ninth embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the ninth embodiment of the present invention, all operations other than the flaw information storage unit 11 are the same as those of the high-frequency replacement circuit according to the first embodiment of the present invention or the fifth embodiment of the present invention. The selection unit 5 selects the output of the addition unit 3 and the low-frequency signals GL1, BL1, and RL1 under the control of the channel information and position information of the defective pixel stored in the information storage unit 11.

  By registering channel information and position information of defective pixels in advance in the flaw information storage unit 11, high-frequency replacement processing can be performed without providing a defective pixel detection unit.

  The flaw information storage unit 11 may be included in the high-frequency replacement circuit according to the ninth embodiment of the present invention. If there is a flaw detection correction circuit or the like in the previous stage, channel information of the defective pixel from the flaw information storage unit. And position information may be received.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 10)
FIG. 10 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the tenth embodiment of the present invention. 1, 3 and 6 are the second embodiment of the present invention shown in FIG. 2 or the implementation of the present invention shown in FIG. This is the same as 1, 3, and 6 in the high-frequency replacement circuit of aspect 6. A flaw information storage unit 12 stores channel information and position information of defective pixels.

  Hereinafter, the high-frequency replacement circuit according to the tenth embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the tenth embodiment of the present invention, all operations other than the flaw information storage unit 12 are the same as those of the high-frequency replacement circuit according to the second embodiment or the sixth embodiment of the present invention. Whether the high-frequency replacement signal is selected by the high-frequency signal generation unit 6 when the high-frequency replacement signal is generated or controlled by the channel information and position information of the defective pixel stored in the information storage unit 12 No is selected.

  By registering channel information and position information of defective pixels in advance in the flaw information storage unit 12, high-frequency replacement processing can be performed without providing a defective pixel detection unit.

  The flaw information storage unit 12 may be included in the high-frequency replacement circuit according to the tenth embodiment of the present invention. If there is a flaw detection correction circuit or the like in the previous stage, the flaw information channel unit stores defective channel information from the flaw information storage unit. And position information may be received.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 11)
FIG. 11 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the eleventh embodiment of the present invention. 1, 2, 3, and 5 are the third embodiment of the present invention in FIG. 3 or the present invention in FIG. This is the same as 1, 2, 3, and 5 in the high-frequency replacement circuit of the seventh embodiment. A scratch information storage unit 11 stores channel information and position information of defective pixels.

  Hereinafter, a high-frequency replacement circuit according to an eleventh embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the eleventh embodiment of the present invention, all operations other than the flaw information storage unit 11 are the same as those of the high-frequency replacement circuit according to the third embodiment of the present invention or the seventh embodiment of the present invention. The selector 5 selects the output of the adder 3 and the input video signals GIN, BIN, and RIN of each channel under the control of the channel information and position information of the defective pixel stored in the information storage unit 11.

  By registering channel information and position information of defective pixels in advance in the flaw information storage unit 11, high-frequency replacement processing can be performed without providing a defective pixel detection unit.

  The flaw information storage unit 11 may be included in the high-frequency replacement circuit according to the eleventh embodiment of the present invention. If there is a flaw detection correction circuit or the like in the previous stage, the channel information of the defective pixel from the flaw information storage unit. And position information may be received.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

(Embodiment 12)
FIG. 12 is a diagram showing a schematic configuration of the high-frequency replacement circuit according to the twelfth embodiment of the present invention. 1, 3 and 8 represent the fourth embodiment of the present invention shown in FIG. 4 or the implementation of the present invention shown in FIG. This is the same as 1, 3, and 8 in the high-frequency replacement circuit of aspect 8. A flaw information storage unit 12 stores channel information and position information of defective pixels.

  Hereinafter, a high-frequency replacement circuit according to a twelfth embodiment of the present invention will be described with reference to FIG.

  In the high-frequency replacement circuit according to the twelfth embodiment of the present invention, all operations other than the flaw information storage unit 12 are the same as those of the high-frequency replacement circuit according to the fourth embodiment or the eighth embodiment of the present invention. The high-frequency replacement signal, which is controlled by the channel information and position information of the defective pixel stored in the information storage unit 12 and the output signal is turned off in the high-frequency signal generation unit 8, and the high-frequency signals GH1 and BH1 of each channel And RH1 are selected.

  By registering channel information and position information of defective pixels in advance in the flaw information storage unit 12, high-frequency replacement processing can be performed without providing a defective pixel detection unit.

  The flaw information storage unit 12 may be included in the high-frequency replacement circuit according to the twelfth embodiment of the present invention. If there is a flaw detection correction circuit or the like in the previous stage, the flaw information channel unit stores defective channel information from the flaw information storage unit. And position information may be received.

  As described above, according to the present embodiment, even when a defective pixel is present in an image sensor of a specific channel, processing can be performed without affecting the video signal of another channel. A high-frequency replacement circuit that can obtain a high-quality video signal by shifting and high-frequency replacement processing can be realized.

  The high-frequency replacement circuit according to the present invention can process a defective pixel existing in an image sensor of a specific channel without affecting a video signal of another channel. The present invention is useful for an imaging apparatus to which spatial pixel shift for the purpose of obtaining a high-quality video signal is applied.

The figure explaining schematic structure of the high region replacement circuit in Embodiment 1 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 2 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 3 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 4 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 5 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 6 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 7 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 8 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 9 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 10 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 11 of this invention The figure explaining schematic structure of the high region replacement circuit in Embodiment 12 of this invention The figure explaining the schematic structure of the conventional high region replacement circuit The figure explaining arrangement | positioning of CCD of the imaging device to which spatial pixel shift is applied Diagram explaining aliasing of high frequency components above the Nyquist frequency

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Low-frequency high-frequency separation part 2, 6, 8 High-frequency signal generation part 3 Adder part 4, 7, 9, 10 Scratch detection part 5 Selection part 11, 12 Scratch information storage part

Claims (16)

The process of replacing the high-frequency signal in the frequency band of the video signal of each channel obtained by a plurality of image sensors and converted into digital signals after being subjected to predetermined signal processing with a newly generated high-frequency replacement signal A high-frequency replacement circuit controlled by information on defective pixels of the image pickup device. 2. The high-frequency replacement circuit according to claim 1, wherein the information of the defective pixel is channel information and position information of the defective pixel. A low-frequency high-frequency separation unit that separates video signals of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into digital signals into a low-frequency signal and a high-frequency signal in a frequency band; A first high-frequency signal generation unit that generates a first high-frequency replacement signal from the high-frequency signal, an addition unit that adds the first high-frequency replacement signal to the low-frequency signal, and defects in the plurality of image sensors A first flaw detection unit that obtains pixel information; and a selection unit that selects an output of the addition unit and the low-frequency signal based on information on the defective pixel obtained by the first flaw detection unit. The high-frequency replacement circuit according to claim 1, wherein: A low-frequency high-frequency separation unit that separates video signals of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into digital signals into a low-frequency signal and a high-frequency signal in a frequency band; A second high-frequency signal generating unit that generates a second high-frequency replacement signal from the high-frequency signal, an adding unit that adds the second high-frequency replacement signal to the low-frequency signal, and defects in the plurality of image sensors A second flaw detection unit that obtains pixel information, and the second high-frequency replacement of the second high-frequency signal generation unit based on information on the defective pixel obtained by the second flaw detection unit. 3. The high-frequency replacement circuit according to claim 1, wherein processing for generating a signal is controlled. The second high-frequency replacement signal generated by the second high-frequency signal generation unit based on the information of the defective pixel is generated by selecting a high-frequency signal of a channel not including the defective pixel as an original signal. 5. The high-frequency replacement circuit according to claim 4, wherein the high-frequency replacement signal is a region replacement signal or zero. A low-frequency high-frequency separation unit that separates video signals of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into digital signals into a low-frequency signal and a high-frequency signal in a frequency band; A first high-frequency signal generation unit that generates a first high-frequency replacement signal from the high-frequency signal, an addition unit that adds the first high-frequency replacement signal to the low-frequency signal, and defective pixels of the plurality of image sensors A first flaw detection unit that acquires the information of the first flaw detection unit, and a selection unit that selects the output of the addition unit and the video signal of each channel based on the information of the defective pixel acquired by the first flaw detection unit. The high-frequency replacement circuit according to claim 1, wherein the high-frequency replacement circuit is provided. A low-frequency high-frequency separation unit that separates video signals of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into digital signals into a low-frequency signal and a high-frequency signal in a frequency band; A third high-frequency signal generating unit that generates a third high-frequency replacement signal from the high-frequency signal, an adding unit that adds the third high-frequency replacement signal to the low-frequency signal, and defects in the plurality of imaging elements A second flaw detection unit that acquires pixel information, and the third high-frequency replacement of the third high-frequency signal generation unit based on the defective pixel information acquired by the second flaw detection unit 3. The high-frequency replacement circuit according to claim 1, wherein processing for generating a signal is controlled. The third high-frequency replacement signal generated by the third high-frequency signal generation unit based on information on the defective pixel is a high-frequency replacement signal that generates the high-frequency signal as an original signal, or the high-frequency signal. The high-frequency replacement circuit according to claim 7, wherein: 9. The high-frequency replacement circuit according to claim 1, wherein the first and second flaw detection units acquire information on defective pixels of the plurality of image sensors from video signals of the respective channels. 9. The high-frequency replacement circuit according to claim 1, wherein the first and second flaw detection units acquire information on defective pixels of the plurality of image sensors from the high-frequency signal. A low-frequency high-frequency separation unit that separates video signals of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into digital signals into a low-frequency signal and a high-frequency signal in a frequency band; A first high-frequency signal generation unit that generates a first high-frequency replacement signal from the high-frequency signal, an addition unit that adds the first high-frequency replacement signal to the low-frequency signal, and defects in the plurality of image sensors A first flaw information storage unit that stores pixel information; and a selection unit that selects an output of the addition unit and the low-frequency signal based on information on the defective pixel stored in the first flaw information storage unit. The high-frequency replacement circuit according to claim 1, further comprising a high-frequency replacement circuit. A low-frequency high-frequency separation unit that separates video signals of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into digital signals into a low-frequency signal and a high-frequency signal in a frequency band; A second high-frequency signal generating unit that generates a second high-frequency replacement signal from the high-frequency signal, an adding unit that adds the second high-frequency replacement signal to the low-frequency signal, and defects in the plurality of image sensors A second flaw information storage unit that stores pixel information, and the second high-frequency signal generation unit stores the second high-frequency signal generation unit based on information on the defective pixels stored in the second flaw information storage unit. 3. The high-frequency replacement circuit according to claim 1, wherein processing for generating a frequency replacement signal is controlled. The second high-frequency replacement signal generated by the second high-frequency signal generation unit based on the information of the defective pixel is generated by selecting a high-frequency signal of a channel not including the defective pixel as an original signal. 13. The high-frequency replacement circuit according to claim 12, wherein the high-frequency replacement signal is a region replacement signal or zero. A low-frequency high-frequency separation unit that separates video signals of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into digital signals into a low-frequency signal and a high-frequency signal in a frequency band; A first high-frequency signal generation unit that generates a first high-frequency replacement signal from the high-frequency signal, an addition unit that adds the first high-frequency replacement signal to the low-frequency signal, and defects in the plurality of image sensors A first flaw information storage unit that stores pixel information, and a selection unit that selects an output of the addition unit and a video signal of each channel based on information on defective pixels stored in the first flaw information storage unit The high-frequency replacement circuit according to claim 1, further comprising: A low-frequency high-frequency separation unit that separates video signals of each channel obtained by a plurality of image sensors and subjected to predetermined signal processing after being converted into digital signals into a low-frequency signal and a high-frequency signal in a frequency band; A third high-frequency signal generating unit that generates a third high-frequency replacement signal from the high-frequency signal, an adding unit that adds the third high-frequency replacement signal to the low-frequency signal, and defects in the plurality of imaging elements A second flaw information storage unit that stores pixel information, and the third high-frequency signal generation unit stores the third high-frequency signal generation unit based on information on the defective pixels stored in the second flaw information storage unit. 3. The high-frequency replacement circuit according to claim 1, wherein processing for generating a frequency replacement signal is controlled. The third high-frequency replacement signal generated by the third high-frequency signal generation unit based on information on the defective pixel is a high-frequency replacement signal that generates the high-frequency signal as an original signal, or the high-frequency signal. 16. The high-frequency replacement circuit according to claim 15, wherein:

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