JP2006194981A - Microscopic observation system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a photomicrographing apparatus capable of obtaining a distinct image from a living body showing dynamic behavior, especially, moving in a short cycle. <P>SOLUTION: The microscopic observation system 1 is equipped with; a microscopic observation device 4 equipped with an objective unit 3 arranged proximately to a sample A; a stabilizer 5 brought into contact with the sample A and allowing the movement of the sample A in an observation range along the direction of the optical axis 3a of the objective unit 3, while restricting the movement thereof in the other directions; and an action restricting means 6 restricting the action range of the stabilizer 5 within the depth of a focus of the objective unit 3. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a microscope observation system.

In recent years, in biological research, it has become possible to visualize ion concentration, membrane potential, etc. with a fluorescent probe using an optical microscope. So-called in-vivo observation for observing organs and the like has been performed. In in-vivo observation, the observation target has movements such as pulsation and respiratory movement, so that the observation position shifts and the focus is likely to be blurred.
As a method for eliminating such observation position deviation and out-of-focus blur, an apparatus is known in which an entire microscope including an imaging unit is made to follow the movement of an observation target (see, for example, Patent Document 1).
JP-A-7-222754

  However, the apparatus of Patent Document 1 has a problem that it cannot be operated at high speed because it is necessary to drive an entire microscope having an imaging means and having a large weight. For example, when observing the heart, the heart rate of the rat is about 350 times / minute and the heart rate of the mouse is about 620 times / minute, and it is extremely difficult for the device of Patent Document 1 to follow these heart rates. Have difficulty.

  The present invention has been made in view of the above-described circumstances, and an object of the present invention is to provide a microscope image capturing apparatus that can obtain a clear image from a living body that exhibits dynamic behavior and moves in a particularly short cycle.

In order to achieve the above object, the present invention provides the following means.
The present invention provides a microscope observation apparatus including an objective unit disposed in proximity to a sample, and a sample closely attached to the sample, allowing movement of the observation range of the sample along the optical axis direction of the objective unit, while moving in the other direction. There is provided a microscope observation system comprising a stabilizer for restraining movement, and an operation restriction means for restricting the movement range of the stabilizer so that the position of the observation range is arranged within the range of the focal depth of the objective unit.

According to the present invention, by attaching the stabilizer to the sample, movement other than the movement along the optical axis direction of the observation range of the sample is restrained. If the observation range of the sample is displaced in the direction intersecting the optical axis, the image may be blurred. However, according to the present invention, the observation range of the sample can be moved only in the direction along the optical axis direction by the stabilizer. Permissible. Therefore, there is no blurring in the image acquired by the microscope observation apparatus.
In addition, since the operation range of the stabilizer is limited by the operation of the operation limiting means, and the position of the observation range is arranged within the range of the focal depth of the objective unit, the image acquired by the microscope observation device is always in focus. It can be kept in the state.

  Further, the present invention provides a microscope observation apparatus including an objective unit disposed in proximity to a sample, and the other direction while allowing the movement of the observation range of the sample along the optical axis direction of the objective unit while being in close contact with the sample. A stabilizer for restraining the movement of the stabilizer, an attenuating means for attenuating the displacement along the operation direction of the stabilizer, a displacement amount detecting means for detecting the displacement amount of the stabilizer, and a displacement of the stabilizer detected by the displacement amount detecting means There is provided a microscope observation system including a control device that causes the microscope observation apparatus to pick up an image when the position of the observation range calculated based on the amount is arranged within the focusing range of the objective unit.

  According to the present invention, by attaching the stabilizer to the sample, movement other than the movement along the optical axis direction of the observation range of the sample is restrained. Thereby, the blurring which arises in the image acquired by a microscope observation apparatus can be suppressed. And the displacement amount of a stabilizer is detected by the action | operation of a displacement amount detection means. Since the stabilizer is in close contact with the sample and displaced together with the sample, the position of the observation range of the sample can be easily calculated from the amount of displacement of the stabilizer. By the operation of the control device, when the calculated observation range position of the sample is placed in the in-focus range of the objective unit, imaging is performed by the microscope observation device, so that an always focused image is acquired. Will be.

  Further, the present invention provides a microscope observation apparatus including an objective unit disposed in proximity to a sample, and the other direction while allowing the movement of the observation range of the sample along the optical axis direction of the objective unit while being in close contact with the sample. The position of the observation range calculated based on the displacement amount of the stabilizer detected by the displacement amount detection means, the displacement amount detection means for detecting the displacement amount of the stabilizer, Provided is a microscope observation system comprising image selection means for selecting an image picked up by a microscope observation apparatus when arranged in a focusing range of a unit.

  According to this invention, movements other than the movement along the optical axis direction of the observation range of the sample are restrained by closely attaching the stabilizer to the sample. The microscope observation apparatus continues to capture an image of the observation range of the sample regardless of the operation of the sample, but the position of the observation range is always calculated based on the displacement detected by the operation of the displacement detection means, Since the image selection unit selects an image that is captured when the position of the calculated observation range is located in the focus range of the objective unit, the selected image is always in focus. .

  Further, the present invention provides a microscope observation apparatus including an objective unit disposed in proximity to a sample, and the other direction while allowing the movement of the observation range of the sample along the optical axis direction of the objective unit while being in close contact with the sample. Based on the position of the observation range calculated based on the amount of displacement of the stabilizer detected by the displacement amount detection means detected by the displacement amount detection means, the displacement amount detection means that detects the amount of displacement of the stabilizer, There is provided a microscope observation system including a focal position control device for adjusting a focal position of the objective unit.

  According to the present invention, when the stabilizer is brought into close contact with the sample, the sample is prevented from being displaced in the direction orthogonal to the optical axis of the objective unit, and blurring in the image is reduced. And since the focal position control device adjusts the focal position of the objective unit according to the position of the observation range calculated based on the displacement amount of the stabilizer detected by the displacement amount detection means, an image in a state of focus is always obtained. It can be acquired.

In the above invention, the stabilizer includes an adsorption pad having an adsorption surface that adsorbs to a sample, and a swing arm that rotates the adsorption pad in a plane substantially perpendicular to the adsorption surface, and the rotation center of the swing arm is It is good also as arrange | positioning in the substantially the same plane as the said adsorption | suction surface.
By rotating the swing arm, the suction pad is displaced in a plane substantially orthogonal to the suction surface. By making the rotation plane of the suction pad coincide with the plane including the optical axis of the objective unit, the suction pad can be displaced in a direction along the optical axis. In this case, since the center of rotation of the swing arm is arranged in the same plane as the suction surface, if the displacement width is set sufficiently small with respect to the length of the swing arm, the suction surface can be It can be displaced almost linearly along the optical axis of the unit. Therefore, only the displacement of the objective unit in the optical axis direction is allowed with respect to the sample adsorbed on the adsorption surface, and the displacement in the other direction can be restricted to obtain a blur-free image.

Moreover, in the said invention, it is preferable that the said swing arm is curving convexly in the reverse direction to the suction surface of the said suction pad.
When the sample is arranged inside the epidermis like an internal organ of an experimental small animal or the like, the epidermis is incised and a stabilizer is inserted into the epidermis to adsorb the adsorption pad to the internal organ. In this case, since the swing arm is convexly curved in the direction opposite to the suction surface of the suction pad, the swing arm is disposed so as to protrude from the incision portion of the epidermis with the suction pad being sucked by the internal organs. be able to. Therefore, the interference with the skin of the swing arm can be reduced, and the displacement along the optical axis direction of the sample can be allowed.

  In addition, the present invention allows a microscope observation apparatus including an objective unit disposed close to a sample, and movement of an observation range of the sample along a direction orthogonal to the optical axis direction of the objective unit, which is in close contact with the sample. While, a stabilizer that restrains the movement in the other direction, a displacement amount detection means that detects the displacement amount of the stabilizer, and a position of the observation range that is calculated based on the displacement amount of the stabilizer detected by the displacement amount detection means Is provided with an observation position control device that adjusts the observation position along a direction orthogonal to the optical axis direction.

  According to the present invention, by attaching the stabilizer to the sample, the movement other than the movement along the direction perpendicular to the optical axis direction of the observation range of the sample is restrained. Thereby, the focus shift | offset | difference which arises in the image acquired with a microscope observation apparatus can be suppressed. Then, the displacement amount of the stabilizer is detected by the operation of the displacement amount detection means, and the observation position of the objective unit is detected based on the position of the observation range of the sample calculated based on the operation of the observation position control device. It will be adjusted in the direction perpendicular to the axis. As a result, an image with reduced blurring can be obtained by moving the observation position by the amount that the observation range of the sample has moved.

  According to the present invention, since the mechanical movable part is only the stabilizer or only the stabilizer and some optical elements, it is possible to easily follow the movement of the sample and obtain a clear image even if the movement period of the sample is short. it can. Moreover, since the microscope observation is performed in a state where the movement of the sample is allowed in one direction and suppressed in the other direction by the stabilizer closely attached to the sample, the burden on the sample during the observation can be reduced. Therefore, when observing a sample alive, it is possible to observe in a more natural state than when observing in a completely restrained state. In addition, with respect to the permitted operation direction, by adjusting the focal position of the objective unit, it is possible to suppress blurring and obtain a clear and focused image. In addition, there is an effect that observation can be performed during dynamic behavior, instead of selecting and observing a stationary state.

Hereinafter, a microscope observation system according to a first embodiment of the present invention will be described with reference to FIGS.
As shown in FIG. 1, the microscope observation system 1 according to the present embodiment is provided with a sample A such as a cell of a mammal such as an experimental small animal, a biological tissue such as a muscle, or various organs such as a heart and a liver. A stage 2 to be placed, a microscope observation apparatus 4 provided on the stage 2, arranged opposite to the sample A on the stage 2, and provided with an objective unit 3 having a predetermined depth of focus, and a microscope observation apparatus 4 is provided with a stabilizer 5 arranged in the vicinity of 4 and an operation limiting means 6 for limiting the operating range of the stabilizer 5.

The stage 2 includes an adjustment dial 7, and by operating the adjustment dial 7, the sample can be moved in two horizontal directions, for example, X and Y directions.
The microscope observation device 4 is attached to a support column 9 extending vertically from a base 8 by an elevating mechanism 10 so as to be movable up and down. By disposing the objective unit 3 vertically downward, the sample A on the stage 2 can be observed. Further, by operating the elevating mechanism 10, the objective unit 3 can be moved closer to and away from the sample A and the focus can be adjusted.

  The stabilizer 5 is similarly attached to a support column 11 extending vertically from the base 8 by an elevating mechanism 12 so as to be movable up and down. The stabilizer 5 is further attached to the elevating mechanism 12 and is supported around the horizontal axis 13a, that is, swingably supported in the vertical plane, and the suction pad disposed at the tip of the swing arm 13 14 and a suction pump 16 that sucks air through a tube 15 connected to the swing arm 13. As shown in FIG. 2, the suction pad 14 is formed in an annular shape with the suction surface 14a disposed vertically downward. The suction pad 14 has a central hole 14c larger than the observation range B (chain line in the figure) of the objective unit 3, and prevents the suction pad 14 from entering the observation range B.

  The swing arm 13 and the suction pad 14 have a hollow structure. As shown in FIG. 3, the suction surface 14a on the lower side of the suction pad 14 is provided with a plurality of suction holes 14b. When the suction pump 16 is operated, the air sucked from the suction hole 14 b is sucked through the suction pad 14, the swing arm 13 and the tube 15. That is, by operating the suction pump 16 with the suction pad 14 in contact with the sample A so as to close all the suction holes 14b of the suction surface 14a, the inside of the suction pad 14, the swing arm 13 and the tube 15 is large. The low pressure state is lower than the atmospheric pressure, and the sample A is maintained in the suction state on the suction surface 14 a of the suction pad 14.

Further, as shown in FIG. 2, the swing arm 13 of the stabilizer 5 is formed in a shape that once protrudes upward and convex upward from the suction pad 14 toward the rotation center 13 a.
The rotation center 13a of the swing arm 13 is disposed in a plane extending from the suction surface 14a of the suction pad 14. The suction surface 14 a of the suction pad 14 is arranged substantially orthogonal to the optical axis 3 a of the objective unit 3. In the present embodiment, the optical axis 3a of the objective unit 3 is arranged along a substantially vertical direction, and the suction surface 14a of the suction pad 14 is arranged along a substantially horizontal direction. Therefore, the suction surface 14 a of the suction pad 14 is displaced substantially linearly along the vertical direction, that is, the direction of the optical axis 3 a of the objective unit 3 by swinging the swing arm 13.

Further, as shown in FIG. 1, the operation restricting means 6 includes stoppers 17 and 18 that are provided in the elevating mechanism 12 and are disposed so as to contact the rear end of the swing arm 13 from above and below. Yes. The stoppers 17 and 18 are arranged at intervals in the vertical direction. The stoppers 17 and 18 are configured to set an upper limit position and a lower limit position of the swing arm 13. The upper limit position and the lower limit position of the stoppers 17 and 18 are always within the range of the focal depth of the objective unit 3 by the suction surface 14 a of the suction pad 14. It is set to be placed inside.
In FIG. 1, reference numeral 19 is a balance spring for balancing the swing arm 13.

The operation of the microscope observation system 1 according to this embodiment configured as described above will be described below.
In order to observe the sample A such as an experimental small animal using the microscope observation system 1 according to the present embodiment, first, as shown in FIG. After exposing A, the lifting mechanism 12 is operated to lower the stabilizer 5, and the suction surface 14 a of the suction pad 14 of the stabilizer 5 is brought into close contact with the surface of the sample A. Next, the suction pump 16 is operated, the air in the tube 15 and the swing arm 13 is sucked, and the sample A is adsorbed by the suction hole 14b. Then, in this state, the objective unit 3 of the microscope observation device 4 is brought close to the observation range B arranged in the central hole 14 c of the suction pad 14 by the operation of the lifting mechanism 10, and focusing is performed by the microscope observation device 4. Make observations.

  According to the microscope observation system 1 according to the present embodiment, the dynamic behavior of the observation range B of the sample A adsorbed on the stabilizer 5 is suppressed by the stabilizer 5. In other words, the stabilizer 5 is displaced integrally with the sample A with the suction surface 14a in close contact with the sample A, but is supported so as to be swingable only around the horizontal axis 13a. Only the displacement of the sample A along the 3a direction (Z direction) is allowed, and the displacement in the other direction (X, Y direction) is restricted. Therefore, it is possible to prevent the sample A from being displaced in the direction intersecting the optical axis 3a of the objective unit 3, and to suppress image blurring.

  In this case, since the mechanical movable part is only the swing arm 13, the swing arm 13 is made of a light material such as plastic, thereby reducing the burden on the sample A and at the same time the period of movement of the sample A. Even if it is short, the movement can be easily followed and a clear image can be obtained.

  Further, according to the microscope observation system 1 according to the present embodiment, since the suction pad 14 of the stabilizer 5 has the central hole 14c slightly larger than the observation range B of the objective unit 3, the suction pad 14 is the field of view of the objective unit 3. A sufficient observation range B can be ensured by preventing entry into the range. In addition, since the fluctuation of the sample A is suppressed at a position sufficiently close to the observation range B, it is possible to effectively prevent image blurring.

  Further, according to the microscope observation system 1 according to the present embodiment, the operation range of the swing arm 13 is limited by the operation of the operation limiting unit 6, and thereby the observation range of the sample A that operates integrally with the suction pad 14. The position of B is limited within the range of the focal depth of the objective unit 3. Therefore, the image acquired by the microscope observation device 4 is always a clear image in focus.

  Further, in the microscope observation system 1 according to the present embodiment, since the swing arm 13 is curved upwardly, the swing center 13a of the swing arm 13 is placed in the same plane as the suction surface 14a while swinging. The arm 13 can be arranged so as to be adsorbed to the internal sample A without interfering with the incised outer skin C.

  As described above, according to the microscope observation system 1 according to the present embodiment, the operation of the sample A is not completely restricted, but only the displacement of the objective unit 3 along the optical axis 3a direction is allowed. There is an advantage that the living sample A can be observed in a more natural state as compared with the case of doing so.

In the present embodiment, the suction pad 14 is described by taking an annular one as an example, but instead, a suction pad 14 having an arbitrary shape such as a U shape may be adopted.
Further, instead of the stoppers 17 and 18, a spring that applies a force to the balance spring 19 that balances the swing arm 13 in a horizontal state in a direction that suppresses displacement according to the amount of displacement from the horizontal position of the swing arm 13. Such other operation restriction means (not shown) may be provided. By doing so, the amplitude of the operation of the sample A can be reduced, and the swing arm 13 can be swung within a range where the swing arm 13 is not brought into contact with the stoppers 17 and 18. By contacting the stoppers 17 and 18, it is possible to prevent a sudden load from being applied to the sample A.

  Furthermore, according to the microscope observation system 1 according to the present embodiment, the stabilizer 5 that suppresses the dynamic behavior of the sample A is provided separately from the objective unit 3 of the microscope observation apparatus 4. The preparatory work for contact arrangement and the observation work by the microscope observation device 4 can be performed separately. Therefore, in the preparatory work, various treatments can be performed without the microscope observation device 4 being in the way.

In addition, the microscope observation system 1 which concerns on this invention is not limited to the said embodiment, The following structures are employable.
That is, in the above embodiment, the suction hole 14b is provided in the tip 5b of the stabilizer 5 to adsorb and fix the sample A, and the burden on the sample A is reduced. When the fluctuation amount of the dynamic behavior is relatively small, the dynamic behavior of the sample A may be suppressed only by the pressing pressure without providing the suction hole 14b.

  Moreover, although the case where the optical axis 3a of the objective unit 3 is arranged in the vertical direction has been described, the optical axis 3a may be arranged along an arbitrary direction instead. In this case, it is preferable to arrange the suction surface of the suction pad 14 including the rotation center 13a of the swing arm in a direction orthogonal to the optical axis 3a.

Next, a microscope observation system 20 according to a second embodiment of the present invention will be described below with reference to FIGS. 4 and 5.
In the description of the present embodiment, the same reference numerals are given to portions having the same configuration as the microscope observation system 1 according to the first embodiment described above, and the description thereof is omitted.

  As shown in FIG. 4, the microscope observation system 20 according to the present embodiment detects the displacement amount of the rear end of the stabilizer 5 instead of the stoppers 17 and 18 of the microscope observation system 1 according to the first embodiment. A displacement amount sensor 21 and a focus signal generating unit that generates a focus signal indicating whether or not the suction surface 14a of the suction pad 14 is within the range of the focal depth of the objective unit 3 based on the displacement amount sensor 21 ( An image selection unit (image selection unit) that selects an image while a focus signal is generated from an image sent from a CCD camera 23 provided in the microscope observation device 4. 24 and a frame memory 25 for storing the selected image.

The displacement sensor 21 is preferably a non-contact distance sensor such as an optical sensor.
For example, as illustrated in FIG. 5, the focus signal generation unit 22 generates a focus signal when the displacement amount signal Ed output from the displacement amount sensor 21 is disposed within the focus range Ed1 to Ed2. Ein is generated, and generation of the focus signal Ein is stopped when it is out of the range.

  According to the microscope observation system 20 according to the present embodiment configured as described above, the sample A along the optical axis 3a direction of the objective unit 3 by the stabilizer 5 as in the microscope observation system 1 according to the first embodiment. Since only the movement is allowed and the movement in the other direction is restricted, it is possible to prevent image blurring. Further, since the displacement amount Ed of the sample A is detected using the stabilizer 5 that restricts the operation of the sample A, the displacement amount is detected by a normal optical means such as a sample having a low light reflectance or a sample having a low contrast. Even when this is difficult, stable detection can be performed.

  Further, by the operation of the image selection unit 24, the observation range B of the objective unit 3 is determined from a moving image continuously captured by the CCD camera 23 of the microscope observation apparatus 4 or a still image captured at a predetermined time interval. Only the image while being arranged within the in-focus range is selected and stored in the frame memory 25. Therefore, an image out of focus is excluded from an image that is read from the frame memory 25 and observed later, and there is an effect that a clear image can be observed.

  In the present embodiment, the sample A is in the in-focus range of the objective unit 3 from images captured by the CCD camera 23 of the microscope observation apparatus 4 continuously or at predetermined time intervals over a predetermined time. The selected image is selected, but instead, the imaging operation by the CCD camera 23 is performed only during the time period in which the focus signal Ein from the focus signal generator 22 is received. Good.

  Further, only the image selected by the image selection unit 24 is stored in the frame memory 25. Instead, all the images and the focus signal Ein are stored in association with each other. May be. As a result, an image in focus can be selected later using the focus signal Ein as a clue, and an important image that is slightly out of focus can be observed later without omission.

Next, a microscope observation system 30 according to a third embodiment of the present invention will be described with reference to FIG.
In the description of the present embodiment, the same reference numerals are assigned to portions having the same configuration as the microscope observation system 20 according to the second embodiment described above, and the description thereof is omitted.

  As shown in FIG. 6, the microscope observation system 30 according to the present embodiment includes a focus servo mechanism 31 that adjusts the focal position of the objective unit 3 in the direction of the optical axis 3 a in the microscope observation apparatus 4. The focus servo mechanism 31 includes a control unit 33 that operates the servo mechanism 32 based on the displacement amount signal Ed from the displacement amount sensor 21. The servo mechanism 32 is, for example, a linear movement mechanism that moves the lens in the direction of the optical axis 3a.

  According to the microscope observation system 30 according to the present embodiment configured as described above, the optical axis 3a of the objective unit 3 is provided by the stabilizer 5 similarly to the microscope observation systems 1 and 20 according to the first and second embodiments. Only the displacement of the sample A along the direction is allowed, observation is possible while restraining the displacement in the other direction, and there is an effect that blurring of the image can be suppressed. Further, since the displacement amount Ein of the sample A is detected using the stabilizer 5 that restricts the operation of the sample A, the detection is more stable compared to the case of directly detecting the surface of the sample A that is shined by body fluid such as internal organs. It can be performed.

  In addition, since the focus position along the direction of the optical axis 3a is adjusted by the focus servo mechanism 31, observation in a focused state can be performed while allowing displacement of the sample A over a wider range. Therefore, the restraint of the sample A can be further suppressed to the minimum, and the burden on the sample A can be reduced.

Next, a microscope observation system 40 according to a fourth embodiment of the present invention will be described below with reference to FIGS.
In the description of the present embodiment, the same reference numerals are assigned to portions having the same configuration as the microscope observation system 30 according to the third embodiment described above, and the description thereof is omitted.

  In the microscope observation system 40 according to the present embodiment, as shown in FIG. 7, the stabilizer 41 is supported so as to be swingable around the vertical axis 42, and the displacement sensor 43 is in the horizontal direction at the rear end of the stabilizer 41. This is different from the microscope observation system 30 according to the third embodiment in that the displacement is detected and the servo mechanism 44 adjusts the observation position along the direction orthogonal to the optical axis 3a of the objective unit 3.

  Since the stabilizer 41 is supported so as to be able to swing around the vertical axis 42, the sample A is supported in the Y direction and the Z direction, and can be displaced only in the X direction. In the present embodiment in which the stabilizer 41 does not need to be rotated in the vertical plane, the shape of the swing arm 45 may even extend in the opposite direction with respect to the suction surface 14a in order to avoid interference with the outer skin C. That's fine.

  As shown in FIG. 8, the servo mechanism 44 includes a galvanometer mirror 48 disposed between the pupil relay lens 46 and the imaging lens 47, and a motor 49 that drives the galvanometer mirror 48. A controller 50 is connected to the motor 49. Based on the displacement amount Ein along the X direction of the rear end of the swing arm 45 detected by the displacement amount sensor 43, the control unit 50 calculates the displacement amount along the X direction of the suction pad 14, and accordingly, the amount of the image is increased. A rotation angle command Eout of the galvanometer mirror 48 that moves the position in the same X direction is output.

The operation of the microscope observation system 40 according to this embodiment configured as described above will be described.
According to the microscope observation system 40 according to the present embodiment, the stabilizer 41 allows only the displacement of the sample A along the X direction orthogonal to the optical axis 3a direction of the objective unit 3, and restrains the displacement in other directions. Observable. Therefore, the sample A can always be arranged within the range of the depth of focus of the objective unit 3, and a focused image can be obtained.

  As for the operation in the X direction, an image arranged at the center position of the observation range will be described using the example shown in FIG. 8 as follows. As shown by the solid line, the light emitted from the image arranged at the substantially central position of the sample A is converted into parallel light by the objective lens 3a, and then an intermediate image is formed by the pupil relay lens 46. In cooperation, the light is returned to parallel light, reflected by the galvanometer mirror 48, and imaged by the imaging lens 47 at a substantially central position of the CCD camera 23.

  From this state, when the sample A is displaced as indicated by a chain line, the motor 49 is driven by the operation of the control unit 50. Thus, by swinging the galvanometer mirror 48 as indicated by the chain line, the optical path from the galvanometer mirror 48 to the CCD camera 23 can be left unchanged, and the optical path from the galvanometer mirror 48 to the sample A can be shifted as indicated by the chain line. it can. Therefore, by swinging the galvanometer mirror 48 so that the displacement amount of the image position coincides with the displacement amount Ein of the sample, it is possible to obtain an almost stationary image regardless of the displacement of the sample A. That is, it is possible to prevent the image from blurring in the X direction by displacing the observation range in the X direction so as to coincide with the displacement of the sample A along the X direction.

  As described above, the microscope observation system 40 according to the present embodiment also has an effect that it is possible to obtain a clear image that is always in focus and has reduced blur.

1 is an overall configuration diagram showing a microscope observation system according to a first embodiment of the present invention. It is a perspective view which shows the relationship between the objective unit and stabilizer in the microscope observation system of FIG. It is a bottom view which shows the suction surface of the suction pad of the stabilizer of FIG. It is a whole block diagram which shows the microscope observation system which concerns on the 2nd Embodiment of this invention. It is a graph which shows an example of the focusing signal based on the displacement of the stabilizer of the microscope observation system of FIG. It is a whole block diagram which shows the microscope observation system which concerns on the 3rd Embodiment of this invention. It is a whole block diagram which shows the microscope observation system which concerns on the 4th Embodiment of this invention. It is a figure explaining the effect | action of the observation position control apparatus of FIG.

Explanation of symbols

A Sample B Observation range 1, 20, 30, 40 Microscope observation system 3 Objective unit 4 Microscope observation device 5, 41 Stabilizer 6 Operation restricting means 13, 45 Swing arm 14a Suction surface 14 Suction pad 21, 43 Displacement amount sensor (displacement amount) Detection means)
24 Image selection unit (image selection means)
31 Focus servo mechanism (focal position control device)
44 Servo mechanism (observation position controller)

Claims (7)

A microscope observation apparatus including an objective unit arranged close to the sample;
A stabilizer that is brought into close contact with the sample and restricts movement in the other direction while allowing movement of the observation range of the sample along the optical axis direction of the objective unit;
A microscope observation system comprising: an operation restriction unit that restricts an operation range of the stabilizer within a range of a focal depth of the objective unit. A microscope observation apparatus including an objective unit arranged close to the sample;
A stabilizer that is brought into close contact with the sample and restricts movement in the other direction while allowing movement of the observation range of the sample along the optical axis direction of the objective unit;
A displacement amount detecting means for detecting a displacement amount of the stabilizer;
A control device that causes the microscope observation device to take an image when the position of the observation range calculated based on the displacement amount of the stabilizer detected by the displacement amount detection means is disposed within the focusing range of the objective unit; A microscope observation system comprising: A microscope observation apparatus including an objective unit arranged close to the sample;
A stabilizer that is brought into close contact with the sample and restricts movement in the other direction while allowing movement of the observation range of the sample along the optical axis direction of the objective unit;
A displacement amount detecting means for detecting a displacement amount of the stabilizer;
Select the image captured by the microscope observation device when the position of the observation range calculated based on the displacement amount of the stabilizer detected by the displacement amount detection means is located within the focusing range of the objective unit A microscope observation system comprising image selection means for performing the operation. A microscope observation apparatus including an objective unit arranged close to the sample;
A stabilizer that is brought into close contact with the sample and restricts movement in the other direction while allowing movement of the observation range of the sample along the optical axis direction of the objective unit;
A displacement amount detecting means for detecting a displacement amount of the stabilizer;
A microscope observation system comprising: a focus position control device that adjusts the focus position of the objective unit based on the position of the observation range calculated based on the displacement amount of the stabilizer detected by the displacement amount detection means. The stabilizer includes a suction pad having a suction surface that sucks the sample, and a swing arm that rotates the suction pad in a plane substantially orthogonal to the suction surface,
The microscope observation system according to any one of claims 1 to 4, wherein a rotation center of the swing arm is disposed in a plane substantially the same as the suction surface.   The microscope observation system according to claim 5, wherein the swing arm is convexly curved in a direction opposite to a suction surface of the suction pad. A microscope observation apparatus including an objective unit arranged close to the sample;
A stabilizer that is brought into close contact with the sample and restricts movement in the other direction while allowing movement of the observation range of the sample along a direction orthogonal to the optical axis direction of the objective unit;
A displacement amount detecting means for detecting a displacement amount of the stabilizer;
Microscope observation provided with an observation position control device for adjusting the observation position along the direction orthogonal to the optical axis direction based on the position of the observation range calculated based on the displacement amount of the stabilizer detected by the displacement amount detection means system.

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