JP2006189440A - 未知のスルー較正を使用したベクトルネットワークアナライザのミキサ較正 - Google Patents

未知のスルー較正を使用したベクトルネットワークアナライザのミキサ較正 Download PDF

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Publication number
JP2006189440A
JP2006189440A JP2005372695A JP2005372695A JP2006189440A JP 2006189440 A JP2006189440 A JP 2006189440A JP 2005372695 A JP2005372695 A JP 2005372695A JP 2005372695 A JP2005372695 A JP 2005372695A JP 2006189440 A JP2006189440 A JP 2006189440A
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JP
Japan
Prior art keywords
ftd
calibration
error
network analyzer
data
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JP2005372695A
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English (en)
Japanese (ja)
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JP2006189440A5 (enExample
Inventor
James C Liu
ジェイムス・シー・リウ
Kenneth H Wong
ケネス・エイチ・ウォン
David V Blackham
デイビッド・ダブリュー・ブラックハム
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2006189440A publication Critical patent/JP2006189440A/ja
Publication of JP2006189440A5 publication Critical patent/JP2006189440A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2005372695A 2005-01-03 2005-12-26 未知のスルー較正を使用したベクトルネットワークアナライザのミキサ較正 Pending JP2006189440A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/028,161 US6995571B1 (en) 2005-01-03 2005-01-03 Vector network analyzer mixer calibration using the unknown thru calibration

Publications (2)

Publication Number Publication Date
JP2006189440A true JP2006189440A (ja) 2006-07-20
JP2006189440A5 JP2006189440A5 (enExample) 2009-04-09

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ID=35734241

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JP2005372695A Pending JP2006189440A (ja) 2005-01-03 2005-12-26 未知のスルー較正を使用したベクトルネットワークアナライザのミキサ較正

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Country Link
US (1) US6995571B1 (enExample)
JP (1) JP2006189440A (enExample)
DE (1) DE102005058443A1 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2687980C1 (ru) * 2018-06-25 2019-05-17 Федеральное государственное бюджетное образовательное учреждение высшего образования "Кубанский государственный университет" (ФГБОУ ВО "КубГУ") Устройство для измерения комплексных коэффициентов передачи и отражения СВЧ-устройств с преобразованием частоты
EP2881732B2 (en) † 2013-12-06 2022-06-15 Rolls-Royce Corporation Thermographic inspection techniques
RU2839829C1 (ru) * 2024-12-16 2025-05-12 Акционерное общество "Научно-производственная фирма "Микран" Способ измерения коэффициента преобразования частотно-преобразующих устройств со встроенным неуправляемым гетеродином с использованием векторного анализатора цепей и автоматической подстройкой частоты
CN120294654A (zh) * 2025-05-22 2025-07-11 南京航空航天大学 一种基于互易特性校准器件的矢量混频器测量校准方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5242881B2 (ja) * 2004-02-23 2013-07-24 ローデ ウント シュワルツ ゲーエムベーハー ウント コー カーゲー ネットワークアナライザ、ネットワーク解析方法、プログラムおよび記録媒体
DE102006035827B4 (de) * 2006-03-15 2021-12-23 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Verfahren und Vorrichtung zur vektoriellen Messung der Streuparameter von frequenzumsetzenden Schaltungen
US7777497B2 (en) 2008-01-17 2010-08-17 Com Dev International Ltd. Method and system for tracking scattering parameter test system calibration
CN105242246A (zh) * 2015-09-08 2016-01-13 西安电子科技大学 一种雷达t/r组件自动测试系统及其方法
EP3242143B1 (en) * 2016-05-02 2023-03-01 Rohde & Schwarz GmbH & Co. KG Measurement apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0387856A (ja) * 1989-08-31 1991-04-12 Mita Ind Co Ltd 画像形成装置
JP2002202331A (ja) * 2000-11-09 2002-07-19 Agilent Technol Inc 周波数変換装置のベクトル特性化のための刺激および応答システム及び方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6300775B1 (en) * 1999-02-02 2001-10-09 Com Dev Limited Scattering parameter calibration system and method
US6690722B1 (en) * 2000-06-09 2004-02-10 Agilent Technologies, Inc. Method for characterizing frequency translation devices

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0387856A (ja) * 1989-08-31 1991-04-12 Mita Ind Co Ltd 画像形成装置
JP2002202331A (ja) * 2000-11-09 2002-07-19 Agilent Technol Inc 周波数変換装置のベクトル特性化のための刺激および応答システム及び方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2881732B2 (en) † 2013-12-06 2022-06-15 Rolls-Royce Corporation Thermographic inspection techniques
RU2687980C1 (ru) * 2018-06-25 2019-05-17 Федеральное государственное бюджетное образовательное учреждение высшего образования "Кубанский государственный университет" (ФГБОУ ВО "КубГУ") Устройство для измерения комплексных коэффициентов передачи и отражения СВЧ-устройств с преобразованием частоты
RU2839829C1 (ru) * 2024-12-16 2025-05-12 Акционерное общество "Научно-производственная фирма "Микран" Способ измерения коэффициента преобразования частотно-преобразующих устройств со встроенным неуправляемым гетеродином с использованием векторного анализатора цепей и автоматической подстройкой частоты
CN120294654A (zh) * 2025-05-22 2025-07-11 南京航空航天大学 一种基于互易特性校准器件的矢量混频器测量校准方法

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Publication number Publication date
US6995571B1 (en) 2006-02-07
DE102005058443A1 (de) 2006-07-27

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