JP2006038596A - Inspection method and inspection support system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection method capable of reducing the mistake of an inspection target, the leak of inspection, the missing of a trouble place, the erroneous judgment of quality and the like by emphasizing the inspection target, and an inspection support system low in cost and having high general-purpose properties. <P>SOLUTION: A worker arranges a liquid crystal panel 23 so as to cover a circuit board 5 having electronic parts 51, 52, etc. arranged thereon in a spaced-apart state with respect to the circuit board 5. The liquid crystal panel 23 displays a pattern 231 wherein a high light pervious region 231a and a low light pervious region 231b both of which corresponds to the position of the electronic part 51 are included. The worker inspects the electronic part 51 seen through the highlight pervious region 231a in the pattern 231 displayed on the liquid crystal panel 23. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to an inspection method for performing inspection such as visual appearance inspection of a circuit board, and an inspection support system for supporting the inspection.

  In the production process of a circuit board on which a plurality of electronic components are mounted, a visual appearance inspection is performed to determine whether the circuit board is good or not by directly observing the circuit board by an operator or through a microscope or a magnifying glass. ing. In order to reduce oversight of defects in visual appearance inspections, misjudgment of pass / fail, etc., at production sites, division of labor by multiple workers, unification of inspection procedures with inspection instructions, and documentation of precautions for inspection itself Posts are being made.

  When inspecting only a specific part of a circuit board, in order to emphasize the part to be inspected, a jig (template) in which a hole is formed at a position corresponding to the inspection part of the circuit board may be used. Is formed of a plastic plate, cardboard or the like. The operator puts the template on the circuit board to be inspected, and inspects only the inspection portion visible from the hole portion of the template. In such a template, notes on inspection, inspection items, inspection order, and the like are posted.

In addition, an inspection support system that supports an operator's appearance inspection by imaging a circuit board with an imaging device and displaying the captured image on a display device has been proposed (see Patent Documents 1 to 4).
JP-A-11-304721 JP 2000-161931 A JP 2000-171224 A JP 2001-305075 A

  A conventionally proposed inspection support system includes one or a plurality of imaging devices that image a circuit board to be inspected and a display device that displays the captured image, and further changes the relative position of the circuit board with respect to the imaging device. For this reason, it is necessary to provide a movable table or a robot for changing the relative position of the imaging device with respect to the circuit board. Therefore, the system configuration is complicated and the cost is high.

  On the other hand, although the template is simple and inexpensive, there is a problem that, when inspecting the entire circuit board, for example, it is necessary to use a plurality of templates properly. Further, there is a problem that the template has to be manufactured for each different type of circuit board. Further, the template has a problem that it is difficult to change the formation position of the hole portion due to the design change of the circuit board and to correct the precautions regarding the inspection.

  The present invention has been made in view of such circumstances, and covers an inspection object that is seen through a highly light-transmissive region in a pattern displayed on the liquid crystal panel by covering the space in which the inspection object is arranged with a liquid crystal panel. To provide inspection methods that can reduce mistakes in inspection targets, inspection omissions, oversight of defective parts, misjudgment of pass / fail, etc. by inspection, and a low-cost and highly versatile inspection support system Objective.

  Another object of the present invention is to inspect an inspection object that can be seen through from a high light-transmitting area in each pattern that is sequentially displayed on the liquid crystal panel. Another object of the present invention is to provide an inspection method that can reduce oversight of defective parts, misjudgment of pass / fail, etc., and an inspection support system that does not need to prepare and use a plurality of liquid crystal panels that display different patterns.

  Another object of the present invention is that the liquid crystal panel is configured to display information such as characters and images in addition to a pattern in which a high light-transmitting region and a low light-transmitting region are mixed. To provide an inspection support system that can display information related to inspections such as items on a liquid crystal panel, and can further reduce mistakes in inspection targets, inspection omissions, oversight of defective parts, misjudgment of pass / fail, etc. It is in.

  Another object of the present invention is to operate the information on the inspection results such as the number of non-defective products and defective products, the location of defects, etc. by configuring the liquid crystal panel to display patterns and to store information according to the operation. It is to provide an inspection support system that does not require a person to record.

  Another object of the present invention is to display the pattern on the liquid crystal panel, and to count the information according to the operation and output the information according to the counting result, so that the number of good products and defective products, There is no need for the operator to aggregate information on the inspection results, such as the ratio of the number of defective products to the number of inspection objects (hereinafter referred to as the defect rate), and information according to the aggregation results An object of the present invention is to provide an inspection support system that can automatically notify an administrator or the like.

  Still another object of the present invention is to provide a configuration in which a liquid crystal panel sequentially displays a plurality of different patterns each time an operation is received, thereby eliminating the need to prepare and use a plurality of liquid crystal panels that display different patterns, Another object of the present invention is to provide an inspection support system in which an operator can determine the timing for switching patterns.

  The inspection method according to the first aspect of the present invention is a method for optically inspecting an inspection object, wherein a space in which one or a plurality of inspection objects are arranged in a plane is covered with a liquid crystal panel, and the liquid crystal panel is placed at the position of the inspection object. A pattern in which corresponding high light-transmitting regions and low light-transmitting regions are mixed is displayed, and the inspection object is optically inspected through the high light-transmitting regions.

  The inspection method according to the second invention is characterized in that a plurality of different patterns are displayed in order on the liquid crystal panel.

  An inspection support system according to a third aspect of the present invention provides a liquid crystal panel to be arranged so as to cover a space in which one or a plurality of inspection objects are arranged in a plane and a pattern in which regions having different transmissivities are mixed. An inspection support system comprising pattern display means for displaying on a panel, wherein the pattern display means displays a pattern in which a high light-transmitting area and a low light-transmitting area corresponding to the position of the inspection object are mixed on the liquid crystal panel. It is made to let it be made to be characterized.

  The inspection support system according to a fourth aspect of the invention is characterized in that the pattern display means displays a plurality of different patterns in order on the liquid crystal panel.

  The inspection support system according to a fifth aspect of the present invention is characterized in that the pattern display means displays information in addition to the pattern.

  An examination support system according to a sixth aspect of the present invention includes an operation receiving unit that receives an operation, and an information storage unit that stores information according to the operation received by the operation receiving unit.

  An examination support system according to a seventh aspect of the present invention outputs an operation accepting unit that accepts an operation, an aggregating unit that aggregates information according to the operation accepted by the operation accepting unit, and information according to the aggregation result of the aggregating unit Output means.

  An examination support system according to an eighth aspect of the present invention includes operation receiving means for receiving an operation, and the pattern display means displays a plurality of different patterns in order on the liquid crystal panel each time the operation receiving means receives an operation. It is characterized by being.

  In the first invention and the third invention, the liquid crystal panel is arranged so as to cover a space in which one or a plurality of inspection objects are arranged in a plane. Further, the pattern display means displays a pattern in which regions having different transmissivities are mixed on the liquid crystal panel, and specifically includes a high light-transmitting region and a low light-transmitting region corresponding to the position to be inspected. Display the pattern on the LCD panel.

  When optically inspecting an inspection object, for example, an operator manually places a liquid crystal panel on a circuit board on which electronic components to be inspected are mounted, or places a circuit board under a fixed liquid crystal panel. By automatically carrying in with a belt conveyor, the space in which one or a plurality of inspection objects are arranged in a plane is covered with a liquid crystal panel. Further, for example, the pattern display means displays on the liquid crystal panel a pattern in which a high light-transmitting area and a low light-transmitting area corresponding to the position to be inspected are mixed. In this case, the liquid crystal panel displays a pattern in which a high light-transmitting area corresponding to the position of the inspection object and a low light-transmitting area are mixed, so that the inspection object can be seen through the high light-transmitting area.

  An operator looks at the inspection object from the upper side of the liquid crystal panel, sees the inspection object from the high light-transmitting area in the pattern displayed on the liquid crystal panel, and optically inspects the inspection object. In this case, the worker visually inspects and inspects the inspection object directly or visually through a microscope, a magnifying glass, or the like, or by an image captured by an imaging device.

  In the second and fourth inventions, the pattern display means displays a plurality of different patterns in order on the liquid crystal panel. In this case, the liquid crystal panel sequentially displays a pattern in which a high light-transmitting region and a low light-transmitting region where the inspection target can be seen are mixed. That is, a plurality of different patterns are sequentially switched and displayed on the liquid crystal panel. Note that the pattern display means may display information such as characters and images on the liquid crystal panel simultaneously with the pattern, and the information may be switched each time the pattern is switched. You may switch between displaying only

  When optically inspecting an inspection object, for example, an operator covers a space in which the inspection object is arranged with a liquid crystal panel. The liquid crystal panel displays one pattern. An operator optically inspects an inspection object that can be seen through from a high light-transmitting area in one pattern displayed on the liquid crystal panel. Next, the liquid crystal panel ends the display of one pattern and displays another pattern. The operator performs an optical inspection by seeing an inspection target from a highly light-transmitting area in another pattern displayed on the liquid crystal panel.

  In the fifth invention, the liquid crystal panel is arranged so as to cover a space in which one or a plurality of inspection objects are arranged in a plane. The pattern display means also displays information such as characters and images on a liquid crystal panel on which a pattern in which a high light-transmitting region and a low light-transmitting region corresponding to the position to be inspected are mixed is displayed. In this case, the liquid crystal panel displays a pattern in which a high light-transmitting region and a low light-transmitting region through which the inspection object can be seen are mixed, and also displays information in addition to this pattern. This information is preferably information to be presented to the operator, such as precautions regarding inspection and inspection items. The operator visually inspects the information displayed on the liquid crystal panel and optically inspects the inspection object from the high light transmission area of the pattern displayed on the liquid crystal panel.

  In the sixth invention, when optically inspecting an inspection object, for example, an operator covers a space in which the inspection object is arranged with a liquid crystal panel. The liquid crystal panel displays a pattern in which a high light-transmitting region and a low light-transmitting region through which an inspection target can be seen are mixed, or a pattern and information. An operator optically inspects an inspection object seen through a high light-transmitting area in the pattern displayed on the liquid crystal panel, and operates the operation receiving unit. The operation accepting unit accepts an operation, and the information storage unit stores information corresponding to the operation accepted by the operation accepting unit.

  In the seventh invention, when optically inspecting an inspection object, for example, an operator covers a space in which the inspection object is arranged with a liquid crystal panel. The liquid crystal panel displays a pattern in which a high light-transmitting region and a low light-transmitting region through which an inspection target can be seen are mixed, or a pattern and information. An operator optically inspects an inspection object seen through a high light-transmitting area in the pattern displayed on the liquid crystal panel, and operates the operation receiving unit. The operation accepting means accepts the operation, the information according to the operation accepted by the operation accepting means is aggregated by the aggregation means, and the output means outputs information according to the aggregation result of the aggregation means.

  In the eighth invention, the liquid crystal panel displays a pattern in which a high light-transmitting region and a low light-transmitting region through which an inspection target can be seen are mixed, or a pattern and information. The operation accepting unit accepts an operation. Further, the pattern display means displays a plurality of different patterns in order on the liquid crystal panel every time the operation accepting means accepts the operation. In this case, the liquid crystal panel sequentially displays different patterns each time the operation receiving unit receives an operation.

  When optically inspecting an inspection object, for example, an operator covers a space in which the inspection object is arranged with a liquid crystal panel. The liquid crystal panel displays one pattern. The operator optically inspects an inspection object that can be seen through from a high light-transmitting area in one pattern displayed on the liquid crystal panel, and operates the operation receiving means. In this case, the liquid crystal panel finishes displaying one pattern and displays another pattern. The operator performs an optical inspection by seeing an inspection target from a highly light-transmitting area in another pattern displayed on the liquid crystal panel.

  According to the inspection method of the first invention and the inspection support system of the third invention, the inspection object is a liquid crystal panel that displays a pattern in which a high light-transmitting area corresponding to the position of the inspection object and a low light-transmitting area are mixed. Covers the arranged space. The operator can optically inspect the inspection object by seeing through the inspection object from the high light-transmitting area in the pattern displayed on the liquid crystal panel.

  In addition, an inspection support system in which a liquid crystal panel arranged so as to cover a space where an inspection object is arranged displays a pattern in which a high light-transmitting area and a low light-transmitting area through which the inspection object can be seen is displayed. The system configuration is simple because it is not necessary to include one or a plurality of imaging devices for imaging the object, a movable table for changing the position of the inspection object, a robot for changing the position of the imaging device, and the like. And it is low cost.

  Furthermore, as if the inspection object is seen from the hole of the template, the inspection object is emphasized by seeing through the inspection object from the high light transmission area, the object to be inspected is mistaken, the inspection omission, the oversight of the defective part, It is possible to reduce misjudgment of pass / fail. Furthermore, by changing the pattern displayed on the liquid crystal panel, the arrangement of the high light-transmitting regions can be easily changed. For this reason, for example, one worker has a plurality of liquid crystals for different types of inspection objects. There is no need to prepare and use panels.

  In addition, since each of the plurality of workers uses the same type of liquid crystal panel and displays a different pattern on each liquid crystal panel, the division of inspection can be easily performed at low cost. Further, the shape of the high light-transmitting region provided by displaying a pattern on the liquid crystal panel is more flexible than the shape of the template hole formed by cutting out a plastic plate, cardboard, or the like.

  That is, according to the inspection support system of the present invention, the liquid crystal panel can be used as a highly versatile template.

  According to the inspection method of the second invention and the inspection support system of the fourth invention, the space in which the inspection object is arranged is covered with the liquid crystal panel that sequentially switches and displays different patterns. The operator visually inspected the inspection object from the high light-transmitting area of the one pattern displayed on the liquid crystal panel, optically inspected the one inspection object, and displayed next to the one pattern. It is possible to optically inspect the other inspection object by seeing the inspection object from the highly transparent region in the other pattern. Each inspection object can be highlighted by sequentially seeing through the corresponding highly transparent area, so that each inspection object can be emphasized, mistakes in the object to be inspected or inspection order, inspection omission, oversight of defective parts, It is possible to reduce misjudgment of pass / fail.

  Further, the liquid crystal panel sequentially displays different patterns each time a predetermined time elapses, for example. For this reason, the operator does not need to prepare and use a plurality of liquid crystal panels that display different patterns. As a result, the convenience for the operator and the efficiency of the inspection can be improved.

  According to the inspection support system of the fifth invention, the liquid crystal panel arranged so as to cover the space where the inspection object is arranged has a pattern in which the high light-transmitting region and the low light-transmitting region where the inspection object can be seen are mixed. The information to be presented to the worker is displayed simultaneously. For this reason, it is possible to clearly indicate the inspection precautions, inspection items, images of non-defective samples to be compared with the inspection target, etc. on the liquid crystal panel, and the operator can easily and accurately inspect the inspection target. . As a result, it is possible to reduce misunderstanding of objects to be inspected, omission of inspection, oversight of defective parts, misjudgment of quality, and the like.

  In addition, the arrangement, content, and the like of information to be displayed on the liquid crystal panel can be easily changed. For example, one worker does not have to prepare and use a plurality of liquid crystal panels for different types of inspection objects.

  That is, according to the inspection support system of the present invention, the liquid crystal panel can be used as a template with higher versatility.

  According to the inspection support system of the sixth aspect of the invention, it is possible to receive an operation of the worker and store information according to the received operation. Since the operator can store information related to the inspection, such as the number of non-defective products and defective products, defective portions, etc., in the information storage means via the operation accepting means simultaneously with the inspection of the inspection object, information related to the inspection Is not required to be recorded by the operator. As a result, the convenience of the operator, the efficiency of the inspection, and the accuracy of the information related to the inspection can be improved.

  Also, the information stored in the information storage means can be easily summed up, reused, etc., compared to the information recorded by the operator by hand. For this reason, for example, information relating to the inspection can be processed, and further efficiency improvement of the inspection, a method for reducing the defective portion, and the like can be considered.

  According to the inspection support system of the seventh aspect of the invention, the operator's operation is received, information corresponding to the received operation is totaled, and information corresponding to the total result is output. The operator aggregates information related to the inspection, such as the number of non-defective products and defective products, the defect rate, etc. simultaneously with the inspection of the inspection object or after the inspection is completed, and information according to the aggregation result is recorded, for example, on a liquid crystal panel By outputting the data on a sheet or the like, the operator himself / herself or the system administrator can be notified. For this reason, it is not necessary for the operator to add up the information related to the inspection by himself / herself, and it is not necessary to notify the other person of the information corresponding to the result of the calculation. As a result, it is possible to improve the convenience of the operator, the efficiency of the inspection, and the accuracy of the counting result.

  According to the inspection support system of the eighth aspect of the invention, the liquid crystal panel sequentially displays different patterns each time an operator's operation is received. For this reason, the operator does not need to prepare and use a plurality of liquid crystal panels that display different patterns. In addition, for example, every time a predetermined time elapses, the liquid crystal panel that sequentially displays different patterns instead of the liquid crystal panel that sequentially displays different patterns, by using a liquid crystal panel that sequentially displays different patterns, The timing for switching the pattern displayed on the liquid crystal panel can be determined. As a result of the above, the present invention has excellent effects such as improvement of operator convenience and inspection efficiency.

  Hereinafter, the present invention will be described in detail with reference to the drawings illustrating embodiments thereof.

Embodiment 1.
FIG. 1 is a perspective view showing a configuration of an inspection support system according to Embodiment 1 of the present invention, and FIG. 2 is a block diagram of the same. In the figure, reference numeral 5 denotes a rectangular circuit board, and the circuit board 5 is an inspection object in the visual appearance inspection. On the circuit board 5, J pieces (J is a natural number) of electronic components 51, 52, 53,. The circuit board 5 is placed on a work table (not shown). Further, the display device 2 is arranged at an appropriate distance so as to cover the circuit board 5 from above.

  The display device 2 includes a rectangular liquid crystal panel 23 having a size larger than the size of the circuit board 5 and a frame body 26 fitted to the periphery of the liquid crystal panel 23. Inside the frame 26, a data storage unit 21, a panel drive unit 22, and the like are provided.

  The data storage unit 21 stores pattern data. The pattern data is data indicating the level of transmissivity of each pixel of the liquid crystal panel 23, that is, each pixel of the liquid crystal panel 23 is a transparent high translucent region, a translucent low translucent region, or black. This is data indicating whether it is a light shielding area. When a display signal to be described later is input to the panel drive unit 22 itself, the panel drive unit 22 responds to a plurality of pixel electrodes (not shown) of the liquid crystal panel 23 according to pattern data stored in the data storage unit 21. A high voltage / low voltage is applied to the voltage, or no voltage is applied.

  The display device 2 is connected to the hub 3 by wire via a communication cable, and the hub 3 is further connected to the control device 1 by wire via a communication cable. The I / F 24 of the display device 2 is an interface that connects the display device 2 and the hub 3, and pattern data and display signals output from the control device 1 are input to the display device 2 via the hub 3. The pattern data input to the display device 2 is stored in the data storage unit 21, and the display signal input to the display device 2 is input to the panel drive unit 22.

  The operation unit 25 of the display device 2 includes an OK key 251 and an NG key 252 which are hard keys provided on the frame body 26. When the keys 251 and 252 are operated, different signals (hereinafter referred to as an OK signal, NG). Signal) is output to the control device 1 via the hub 3.

  The inspection support system includes a plurality of display devices 2, 2,. Each of the display devices 2, 2,... Has unique identification information (for example, a MAC address). The hub 3 is a switching hub having a plurality of connections (ports), and stores the number of the port to which the display devices 2, 2,... Are connected and the identification information of the display devices 2, 2,. is doing. The hub 3 receives the signal output from the display device 2, and sends the received signal and identification information of the display device 2 that has output the signal to the control device 1.

  From the control device 1 to the hub 3, pattern data and display signals to be given to the display device 2 and identification information of the display device 2 to which these are given are sent. The hub 3 receives the pattern data and display signal sent from the control device 1 and the identification information, and outputs the received pattern data and display signal to the display device 2 having the received identification information.

  The control device 1 uses a personal computer, and controls the operations of the display devices 2, 2,. The CPU 10 is a control center of the control device 1 and is connected to each part of the control device 1 such as a ROM 11 and a RAM 12 via a bus or a signal line. The CPU 10 controls each unit according to the control program and data stored in the ROM 11 and executes various processes using the RAM 12 as a work area. In this case, the CPU 10 sends a signal and data for operating each unit to each unit, and each unit operates according to the received signal and data.

  The display unit 15 of the control device 1 uses a liquid crystal panel, a CRT display, or the like, and is controlled by the CPU 10 to operate the display devices 2, 2,..., The operator of the control device 1 (for example, an operator, an inspection support system). An input instruction to an administrator, etc.), information notifying that the defect rate is high, and the like are displayed. The operation unit 16 of the control device 1 uses a keyboard, a mouse or the like, and the operator of the control device 1 gives various data to the control device 1 using the operation unit 16.

  The hard disk (HDD) 14 of the control device 1 is a built-in hard disk and relates to the inspection results of the inspection storage unit 141 and the electronic components 51, 52,... It has a total storage unit 142 that is a storage region for storing data, and a pattern storage unit 143 that is a storage region for storing pattern data. Further, the HDD 14 also stores the number J of electronic components 51, 52,... On one circuit board 5 and identification information of the display devices 2, 2,. Further, in the visual appearance inspection in the present embodiment, a plurality of workers inspect each of I circuit boards (I is a natural number) 5, 5,... Using the display device 2 in parallel. For this reason, the HDD 14 also stores the number I of circuit boards 5, 5,.

  FIG. 3 is a schematic diagram illustrating an example of data stored in the HDD 14 of the control device 1. As shown in FIG. 3A, data such as “inspection object”, “position of inspection object”, “inspection order”, “inspection information”, and “pattern data” are stored in the inspection storage unit 141 in association with each other. Is done. In the present embodiment, the types, positions, etc. of the electronic components 51, 52,... Arranged on the I circuit boards 5, 5,. Therefore, data relating to one circuit board 5 is stored in the inspection storage unit 141.

  In the column “inspected”, data such as the names and identification numbers of the J electronic components 51, 52,... To be inspected are stored, and arranged in the circuit board 5 in the “inspected position” column. The virtual coordinates corresponding to the positions of the electronic components 51, 52,. This coordinate is a coordinate of each of a plurality of points that specify a range corresponding to the size of each of the electronic components 51, 52,... (Projected area with respect to the circuit board 5), and in particular, the size of each of the electronic components 51, 52,. If they are substantially the same, the coordinates indicating the center point of each of the electronic components 51, 52,. Further, in the column “inspection order”, the inspection order of each of the electronic components 51, 52,.

  In the “inspection information” column, inspection notes, inspection items, etc. (hereinafter referred to as inspection information) are stored as information to be presented to the operator by displaying on the liquid crystal panel 23 during the visual appearance inspection. The As the inspection information, not only text such as characters and symbols but also an image of a non-defective sample of the electronic component 53 to be compared with the electronic component 53 to be inspected, for example, is used. Further, although not shown, the display position of the inspection information on the liquid crystal panel 23 is also stored in the inspection storage unit 141 corresponding to the inspection information. When the display position is not stored in the examination storage unit 141, the CPU 10 may calculate the display position as appropriate.

  Various types of data stored in the columns such as “inspection object”, “position of inspection object”, “inspection order”, “inspection information” as described above are used by the operator of the control device 1 using the operation unit 16, for example. The CPU 10 causes the examination storage unit 141 to store the given data.

  The CPU 10 uses the “inspection object position” data or the “inspection object position” data and the “inspection information” data among the data stored in the inspection storage unit 141. Pattern data is created using a buffer memory (not shown) as a work area. Further, the CPU 10 stores the created pattern data in the pattern storage unit 143, and further stores the address of the pattern data stored in the pattern storage unit 143 in the “pattern data” column of the inspection storage unit 141. Note that pattern data given from the outside may be stored in the pattern storage unit 143 without creating the pattern data in the control device 1.

  When the “inspection information” data is not associated with the “inspection target position” data stored in the inspection storage unit 141, the CPU 10 determines whether the high-transmission area and Pattern data of a pattern in which low light transmission regions are mixed is created. When the entire surface on which the electronic components 51, 52,... Of the circuit board 5 are arranged is covered with the liquid crystal panel 23 by the pattern data created here, for example, the electronic component 51 and the periphery of the electronic component 51 are supported. The pixel group of the liquid crystal panel 23 is a high light transmission region, and the pixel group other than the high light transmission region is a low light transmission region.

  When the “inspection information” data is associated with the “inspection position” data stored in the inspection storage unit 141, the CPU 10 determines that the “inspection position” data and the “inspection information” data Based on the above, pattern data of a pattern in which a light shielding region, a high light transmission region, and a low light transmission region are mixed is created. The inspection information in the present embodiment is displayed on the liquid crystal panel 23 as a light shielding region, and the light shielding region is provided, for example, in the vicinity of the high light transmission region.

  By the pattern data created here, for example, the pixel group of the liquid crystal panel 23 corresponding to the electronic component 52 and the periphery of the electronic component 52 becomes a highly light-transmitting region. A part of the pixel group in the vicinity of the light region serves as a light shielding region, and the pixel group other than the high light transmission region and the light shielding region serves as a low light transmission region. That is, the light-shielding region representing the inspection information, the high light-transmitting region, and the low light-transmitting region are provided as if the inspection information is superimposed on the low light-transmitting region near the high light-transmitting region. Note that the data of the position of the highly transparent region may be stored in the inspection storage unit 141 instead of the data of “position to be inspected”.

  The I / F 13 of the control device 1 is an interface that connects the control device 1 and the hub 3. The CPU 10 outputs to the hub 3 the pattern data read from the pattern storage unit 143, a display signal that is a signal for displaying the pattern on the liquid crystal panel 23, and identification information of the display device 2 to which the pattern data is to be given. Thus, the pattern data and the display signal are output to the display device 2 to which the pattern data and the display signal are to be supplied via the hub 3. Here, the display signal is a waveform signal that the panel drive unit 22 receives as a display signal, and is stored in the HDD 14 in advance, for example.

  Moreover, CPU10 determines with the received signal having been transmitted from the display apparatus 2 which has the received identification information by receiving the signal and identification information which were transmitted from the hub 3. FIG.

  As shown in FIG. 3B, data such as “inspection object”, “number of inspections”, “number of non-defective products”, “number of defective products”, “defective rate”, “remarks”, and the like are associated with the total storage unit 142. Is remembered. The J electronic parts 51, 52,... To be inspected are stored in the “inspection object” column, and the names, identification numbers, and the like are stored in the “inspection object” column. , 52,... Are stored. In the “number of non-defective products” / “number of defective products” column, the number of good / defective products among the electronic components 51, 52,.

  The data stored in the column “inspection object” as described above is given to the control device 1 by the operator of the control device 1 using the operation unit 16, and the CPU 10 stores the given data in the inspection storage unit 141. Further, the various data stored in the columns of “number of inspections”, “number of non-defective products” and “number of defective products” are “0” before the start of inspection, and when the CPU 10 receives an OK signal or an NG signal, The number of inspections and the number of non-defective products or the number of defective products are each incremented by “1”.

  Further, when receiving an NG signal, the CPU 10 is a defect rate that is a ratio of the number of defective products stored in the “number of defective products” column to the number of inspections stored in the “number of inspections” column. m (m is a real number of “0” or more and “100” or less) is calculated, and the calculation result is stored in the column of “Defect rate”. Furthermore, the CPU 10 compares the failure rate m with the upper limit value M of the failure rate (M is an appropriate real number that is greater than “0” and “100” or less), and in the “Remarks” column, Information indicating that the defect rate is too high is stored. The upper limit value M is given to the control device 1 in advance by the operator of the control device 1 via the operation unit 15, for example.

  When visual inspection is performed, the circuit board 5 is illuminated by a lighting device (not shown). In this case, the incident angle of the incident light from the illumination device to the circuit board 5 is adjusted so that the reflected light reflected on the circuit board 5 is appropriately incident on the liquid crystal panel 23.

  FIG. 4 is a schematic diagram illustrating an example of a pattern displayed on the liquid crystal panel 23, and is also a front view of the display device 2.

  FIG. 4A shows a pattern 231 displayed on the liquid crystal panel 23 when the electronic component 51 is inspected. The pattern 231 includes a low light-transmissive region 231 b provided on substantially the entire surface of the liquid crystal panel 23. The low light-transmitting region 231b is mixed with the high light-transmitting region 231a provided as if cut out in a rectangular shape. The highly light-transmissive region 231 a is provided so that an operator can visually check the electronic component 51 and the periphery of the electronic component 51 through the liquid crystal panel 23.

  FIG. 4B shows a pattern 232 displayed on the liquid crystal panel 23 when the electronic component 52 is inspected. The pattern 232 includes a mixture of a low light transmission region 232b and a rectangular high light transmission region 232a. is doing. Further, in addition to the pattern 232, the inspection information 232c is provided so as to overlap with the low light transmission region 232b in the vicinity of the high light transmission region 232a. The high light transmission region 232 a is provided so that the user of the display device 2 can visually check the electronic component 52 and the periphery of the electronic component 52 through the liquid crystal panel 23. In addition, the inspection information 232c is a light-shielding region for forming characters indicating notes, for example. Note that the shape of the high light-transmitting regions 231a and 232a is not limited to a rectangle, and may be a circle, for example.

  The operator places one circuit board 5 on the work table among the circuit boards 5, 5,... To be visually inspected and displays the placed circuit board 5 with the liquid crystal panel 23. Hold the device 2. In this case, for example, it is desirable to fix a positional relationship between the circuit board 5 and the liquid crystal panel 23 by providing a guide member for alignment between the circuit board 5 and the liquid crystal panel 23 on the work table. Instead of holding the display device 2 by the operator, for example, a configuration may be adopted in which a leg portion is provided on the frame body 26 and the display device 2 is supported by the leg portion. In addition, the operator does not prepare the circuit board 5 and the display device 2 manually, but the display device 2 is fixed and the circuit board 5 is liquid crystald by a belt conveyor so that the circuit board 5 is covered with the liquid crystal panel 23. It may be configured to automatically carry in to the lower side of the panel 23.

  The operator first operates the OK key 251 before starting the inspection. In this case, the liquid crystal panel 23 displays the pattern 231 shown in FIG. The operator performs an appearance inspection while paying attention to the electronic component, in this case, the electronic component 51, that is visible through the high light transmissive region 231 a through the high light transmissive region 231 a included in the pattern 231. During this inspection, the electronic components 52, 53,... Other than the electronic component 51 are blocked by the low light transmission region 231b and cannot be seen by the operator. For this reason, the operator pays attention only to the electronic component 51 to be subjected to the visual inspection first, and as a result, an accurate inspection is executed. An operator who inspects the electronic component 51 and determines that the electronic component 51 is a non-defective product operates the OK key 251, and an operator who determines that the electronic component 51 is a defective product operates the NG key 252.

  When the operator operates the OK key 251, a pattern 232 shown in FIG. 4B is displayed on the liquid crystal panel 23. The operator gazes at the inspection information 232c included in the pattern 232, and further, through the high-transmission area 232a, looks at the electronic component that can be seen through the high-transmission area 232a, in this case, the electronic component 52, and performs an appearance inspection. Do.

  During the inspection, the electronic components 51, 53,... Other than the electronic component 52 are obstructed by the inspection information 232c and the low light-transmitting region 232b and are not visible to the operator. For this reason, the operator pays attention only to the electronic component 52 to be visually inspected second, and as a result, an accurate inspection is executed. In addition, the inspection information 232c alerts the operator, for example, to the inspection, and a more accurate inspection is performed. An operator who inspects the electronic component 52 and determines that the electronic component 52 is a non-defective product operates the OK key 251, and an operator who determines that the electronic component 52 is a defective product operates the NG key 252. When the operator operates the OK key 251, a new pattern for inspecting the electronic component 53 to be inspected third is displayed on the liquid crystal panel 23.

  When the above operations are repeated and the inspection of all J electronic components 51, 52,... On the circuit board 5 is completed, the inspection of the circuit board 5 is completed on the liquid crystal panel 23. Instruction information for instructing to exchange is displayed. The worker who visually recognizes the instruction information removes the circuit board 5 that has been inspected from the work table, places the circuit board 5 that has not yet been inspected, and places the circuit board 5 on the liquid crystal panel. 23, the display device 2 is gripped so as to be covered, and the OK key 251 is operated. In this case, the pattern 231 shown in FIG. 4A is displayed again on the liquid crystal panel 23.

  Further, when the operator operates the NG key 252, that is, when the operator determines that one of the electronic components 51, 52,... On the circuit board 5 is defective, the CPU 10 determines that the defective product is defective. The inspection of the mounted circuit board 5 is immediately terminated, and the inspection of a new circuit board 5 that has not been inspected is started. That is, since the inspection of the circuit board 5 has been completed, the liquid crystal panel 23 displays instruction information for instructing the next circuit board 5 to be replaced. The worker who visually recognizes the instruction information removes the circuit board 5 that has been inspected from the work table, places the circuit board 5 that has not yet been inspected, and places the circuit board 5 on the liquid crystal panel. 23, the display device 2 is gripped so as to be covered, and the OK key 251 is operated. In this case, the pattern 231 shown in FIG. 4A is displayed again on the liquid crystal panel 23.

  In addition, even when it is determined that the electronic components 51, 52,... On the circuit board 5 are defective, all the electronic components 51, 52,. . In this case, a defective portion of the circuit board 5 that is determined to be a defective product may be repaired in the downstream process of the visual appearance inspection.

  Further, for example, input means such as a numeric keypad or a barcode reader is provided in the operation unit 25, and before starting the inspection of the circuit board 5, the serial number of the circuit board 5 to be inspected is input and then the OK key 251 is operated. The serial number of the circuit board 5 and the inspection result of the circuit board 5 may be associated with each other and stored in the HDD 17. In this case, the circuit board 5 that is non-defective / defective is reliably identified.

  5 and 6 are flowcharts showing the procedure of pattern display processing executed by the CPU 10 of the control device 1. Below, the pattern display process with respect to one display apparatus 2 by CPU10 is illustrated, and the identification information which this display apparatus 2 has is called predetermined identification information below. Such pattern display processing is simultaneously executed on a plurality of display devices 2, 2,... Using the identification information of each display device 2 in combination.

  The CPU 10 first determines whether or not an OK signal and predetermined identification information have been received (S11). If the OK signal and predetermined identification information have not been received (NO in S11), it is determined that no pattern is displayed on the liquid crystal panel 23. Then, it waits until an OK signal is received. When the OK signal and the predetermined identification information are received (YES in S11), the CPU 10 reads from the inspection storage unit 141 the number I of the circuit boards 5, 5,... To be inspected and the electronic components 51, 52,. ... Are read (S12). Further, the CPU 10 sets “0” in each of the variables i and j (S13). The CPU 10 uses the variable i to count the number of circuit boards 5, 5,... That have been inspected, and uses the variable j to count the number of electronic components 51, 52,. .

  Further, the CPU 10 resets the inspection result to be stored in the total storage unit 142 (S14). In this case, the CPU 10 resets the inspection results to be stored in the total storage unit 142, that is, values such as “number of inspections”, “number of non-defective products”, “number of defective products”, “defective rate”, etc. to “0”.

  The CPU 10 increments the variable j (S15), and reads the pattern data of the j-th electronic component to be inspected (hereinafter referred to as the j-th electronic component) (S16). In this case, the CPU 10 obtains the address of the pattern data associated with the j-th data stored in the “inspection order” column of the inspection storage unit 141, and based on the obtained address, the pattern data is stored in the pattern storage unit 143. Read data.

  Further, the CPU 10 outputs the pattern data and the predetermined identification information read from the HDD 14 to the hub 3 in order to write the pattern data read in S16 to the data storage unit 21 of the display device 2 (S17). Further, the CPU 10 outputs the display signal read from the HDD 14 and the predetermined identification information to the hub 3 so that the liquid crystal panel 23 of the display device 2 displays the pattern based on the pattern data output in S17 (S18).

  For example, when j = 1 at the time of S <b> 16, the CPU 10 associates with the data of the electronic component 51 with the first inspection order (“Part 1” of “Inspection target” in FIG. 3A) in the inspection storage unit 141. The address of the stored pattern data is read, and the pattern data stored in the pattern storage unit 143 is read based on the read address. Next, the CPU 10 sends the pattern data read from the pattern storage unit 143 and the predetermined identification information to the hub 3. The hub 3 receives the transmitted pattern data and predetermined identification information, and transmits the received pattern data to the display device 2 corresponding to the received predetermined identification information. Pattern data is input to the display device 2, and the input pattern data is stored in the data storage unit 21.

  Further, the CPU 10 sends a display signal and predetermined identification information to the hub 3. The hub 3 receives the transmitted display signal and the predetermined identification information, and transmits the received display signal to the display device 2 corresponding to the received predetermined identification information. A display signal is input to the display device 2, and the panel drive unit 22 that has received the input display signal sends the liquid crystal panel 23 a high light-transmitting area according to the pattern data stored in the data storage unit 21. A voltage is not applied to the pixel electrode corresponding to, and a low voltage / high voltage is applied to the pixel electrode corresponding to the low light transmission region / light shielding region. That is, when the process of S18 is completed, the liquid crystal panel 23 displays the pattern 231 shown in FIG.

  After completion of the processing of S18, the CPU 10 determines whether or not an OK signal and predetermined identification information have been received (S19). If the OK signal and predetermined identification information have not been received (NO in S19), the NG signal and predetermined identification information are determined. It is determined whether or not information has been accepted (S20), and if the NG signal and the predetermined identification information are not received (NO in S20), the process returns to S19 until the OK signal or NG signal and the predetermined identification information are received. stand by.

  When the OK signal and the predetermined identification information are received (YES in S19), the CPU 10 increments the values of “number of inspections” and “number of non-defective products” corresponding to the jth electronic component in the total storage unit 142 (S31). . For example, when j = 1 at the time of S31, the CPU 10 associates with the data of the electronic component 51 having the first inspection order (“component 1” of “inspection object” in FIG. 3A) in the total storage unit 142. “1” is added to each of the stored “number of inspections” and “number of non-defective products”.

  Next, the CPU 10 determines whether or not the variable j is greater than or equal to the number J (S32). If j <J (NO in S32), all the J electronic components for one circuit board 5 are inspected. Is determined to have not ended yet, and the process returns to S15. Thereafter, when the process of S18 is completed, a pattern 232 shown in FIG. 4B is displayed on the liquid crystal panel 23, for example. Further, when j ≧ J (YES in S32), the CPU 10 determines that the inspection of all the J electronic components 51, 52,.

  Next, the CPU 10 increments the variable i (S33), and determines whether or not the variable i is equal to or greater than the number I (S34). If i <I (NO in S34), the CPU 10 determines that the inspection of all the circuit boards 5, 5,... has not been completed, and the inspection of the circuit board 5 is completed for the operator. Therefore, data for displaying the instruction information on the display device 2 is output so that the instruction information for instructing the next circuit board 5 to be replaced is displayed on the liquid crystal panel 23 (S35).

  Further, the CPU 10 resets the variable j to “0” (S36), and then determines whether or not an OK signal and predetermined identification information have been received (S37), and has not received the OK signal and predetermined identification information. (NO in S37), waiting until an OK signal and predetermined identification information are received. When the OK signal and the predetermined identification information are received (YES in S37), the CPU 10 returns the process to S15. Thereafter, when the process of S18 is completed, a pattern 231 shown in FIG. If i ≧ I (YES in S34), the CPU 10 determines that all the inspections of all I circuit boards have been completed, and ends the pattern display process.

  When the NG signal and the predetermined identification information are received (YES in S20), the CPU 10 increments the values of “number of inspections” and “number of defective products” corresponding to the jth electronic component in the total storage unit 142 (S41). . For example, when j = 1 at the time of S41, the CPU 10 associates with the data of the electronic component 51 having the first inspection order (“component 1” of “inspection object” in FIG. 3A) in the total storage unit 142. “1” is added to each of the stored “number of inspections” and “number of defective products”. Further, the CPU 10 calculates the defect rate m using the “number of inspections” value and the “number of defective products” obtained in S41 (S42).

  Next, the CPU 10 determines whether or not the defect rate m obtained in S42 is equal to or higher than the upper limit M of the defect rate (S43). If m ≧ M (YES in S43), the defect rate is high. It is determined that the failure rate is too high, and high failure rate information indicating that the failure rate of the electronic component is too high is output (S44). In this case, the CPU 10 has information indicating that the defective rate is too high in the “remarks” column corresponding to the j-th electronic component in the total storage unit 142 (for example, “high defective rate” in FIG. 3B). In addition, information for notifying the operator of the control device 1 that the defect rate of the j-th electronic component is too high is displayed on the display unit 15. Further, the liquid crystal panel 23 displays information notifying the operator that the defective rate of the j-th electronic component is too high.

  If it is determined in S43 that the defect rate is too high, the pattern display process may be temporarily stopped or forcibly terminated. Even when it is determined in S43 that the defect rate is high, the number of j-th electronic components that have been inspected, that is, the value of the “number of inspections” of the j-th electronic component is below a predetermined lower limit value. Alternatively, it may be determined that there is a statistical bias and the high defect rate information is not output in S44. Further, when the defect rate m becomes equal to or higher than the upper limit value M and then falls below the upper limit value M, information notifying that the defect rate is within the allowable range may be output.

  After completion of the process of S44 or when m <M (NO in S43), the CPU 10 moves the process to S33. In this case, since the (j + 1) th to Jth electronic components of the circuit board 5 are not inspected, the inspection efficiency is improved.

  The panel driving unit 22 in the pattern display process as described above changes the level of the voltage applied to each pixel electrode of the liquid crystal panel 23 based on the pattern data stored in the data storage unit 21. As a result, the panel driving unit 22 displays a pattern in which regions having different transmittances are mixed on the liquid crystal panel 23 to be arranged so as to cover a space in which one or a plurality of inspection objects are arranged in a plane. It functions as a pattern display means.

  Specifically, the CPU 10 reads out pattern data relating to the inspection of the electronic component 51 from the inspection storage unit 141 in S16, and stores the pattern data read out in S16 in the data storage unit 21 in S17. 22 functions as a pattern display means for displaying on the liquid crystal panel 23 a pattern 231 in which a high light-transmissive region 231a and a low light-transmissive region 231b corresponding to the position of the electronic component 51 to be inspected are mixed.

  Further, after displaying the pattern 231, the CPU 10 reads pattern data related to the inspection of the electronic component 52 from the inspection storage unit 141 in S16, and stores the pattern data read in S16 in the data storage unit 21 in S17. The panel drive unit 22 displays a pattern display for displaying the inspection information 232c on the liquid crystal panel 23 in addition to the pattern 232 in which the high light-transmitting region 232a and the low light-transmitting region 232b corresponding to the position of the electronic component 52 to be inspected are mixed. Functions as a means.

  Such a panel drive unit 22 functions as a pattern display unit that sequentially displays a plurality of different patterns 231, 232,... On the liquid crystal panel 22.

  Further, the CPU 10 in S19 and S20 functions as an operation receiving unit that receives an operation via the operation unit 25. In addition, the total storage unit 142 in S31 and S41 functions as an information storage unit that stores information according to the operation received by the operation reception unit. Further, the CPU 10 in S31, S41, and S42 functions as a totaling unit that totals information according to the operation received by the operation receiving unit using the totaling storage unit 142, and the CPU 10 in S44 displays the totaling result of the totaling unit. It functions as output means for outputting the corresponding information.

  Further, the CPU 10 reads out pattern data relating to, for example, the inspection of the electronic component 52 from the inspection storage unit 141 in S16, stores the pattern data read out in S16 in the data storage unit 21 in S17, and then receives an OK signal in S19. If j <J or S <34 or i <I in S34, the pattern data relating to the inspection of the electronic component 53 is read again from the inspection storage unit 141 in S16, and S17 is received. The pattern data read in S16 is stored in the data storage unit 21. Accordingly, the panel drive unit 22 functions as a pattern display unit that sequentially displays a plurality of different patterns 231, 232,... On the liquid crystal panel 23 every time the operation receiving unit receives an operation.

  Using the inspection support system as described above, the operator optically inspects the inspection object. The operator covers the space in which one or a plurality of inspection objects are arranged in a plane, that is, the upper side of the circuit board 5 on which the electronic components 51, 52,... Are covered with the liquid crystal panel 23. A pattern 231 in which a high light-transmitting region corresponding to the position of the electronic component 51, for example, a high light-transmitting region 231a corresponding to the position of the electronic component 51 and a low light-transmitting region 231b are mixed, is displayed, and the electron is transmitted through the high light-transmitting region 231a. The appearance of the component 51 is visually inspected. Further, the operator operates the operation unit 25 to cause the liquid crystal panel 23 to display a plurality of different patterns 231, 232,.

  In this embodiment, each of a plurality of workers inspects I circuit boards 5, 5,... Using the display device 2, and the configuration of the circuit boards 5, 5,. The visual appearance inspection is the same, but the circuit boards 5, 5,... Having different configurations / numbers may be inspected for each operator.

  When using the inspection support system as described above, an operator can perform an inspection using the display device 2 in the same manner as a conventional template. At this time, since the electronic parts 51, 52,... Are emphasized by the high light-transmitting areas 231a, 232a,. Can be prevented.

  In addition, each time the operator operates the operation unit 25, the arrangement of the high light transmission region / low light transmission region, the contents of the inspection information, and the like are changed, and a pattern corresponding to the object to be inspected is displayed on the liquid crystal panel 23. Therefore, it is not necessary for the operator to perform an inspection while replacing a plurality of templates, for example, and the inspection is simple. Further, since the high light-transmitting regions 231a, 232a,... Are provided in the order to be inspected corresponding to the electronic components 51, 52,..., The operator does not need to consider the inspection order of the electronic components 51, 52,. Can concentrate on the inspection.

  In this way, since the patterns 231, 232,... Are switched according to the operation of the operation unit 25 by the operator, the timing at which the worker switches the patterns 231, 232,. In addition, after the display of one pattern, the structure which displays another pattern when predetermined time passes may be sufficient. In this case, for example, the operator only has to operate the NG key 252 when it is determined that the electronic components 51, 52,... Are defective.

  Further, by changing the pattern data stored in the pattern storage unit 143 in accordance with the design change of the circuit board 5 to be inspected, the deletion of the inspection target, the addition of precautions, etc., a different pattern can be added to the liquid crystal panel 23. Can be displayed. In the present embodiment, the case where the types, positions, etc. of the electronic components 51, 52,... Arranged on the circuit boards 5, 5,. The type, position, etc. of the arranged electronic components 51, 52,... May be changed every five. In this case, the patterns 231, 232,... Displayed on one circuit board 5 are different from the control apparatus 1 to the display apparatus 2 so that the patterns displayed on the other circuit boards 5 are different. Pattern data is output.

  As a result, the display device 2 can be used as if it is a general-purpose template, can be used for various inspections, can flexibly cope with changes in inspection contents, and repeats Can be used. For this reason, for example, even when performing division of inspection locations by a plurality of workers, each worker can inspect different inspection objects using the same type of display device 2. Further, the shape and arrangement of the high light-transmitting area provided in the liquid crystal panel 23, the display contents and arrangement of the inspection information, the shape and arrangement of the holes formed in the template, the contents of the information attached / described on the template, and Since the degree of freedom is higher than the arrangement and the like, the display device 2 is more convenient than the template.

  In addition, the liquid crystal panel 23 can display the inspection procedure that has been conventionally described in the inspection instruction, the document and / or the image of the precautions for the inspection itself, the mistake of the object to be inspected, the inspection omission, the defective part Oversight, misjudgment of pass / fail, etc. can be reduced, and as a result, the inspection efficiency and inspection accuracy of the operator can be improved. In order to further improve the accuracy of the inspection, an image of a good / defective sample to be compared with the inspection object can be displayed on the liquid crystal panel 23. Such display of documents and images is not only performed simultaneously with the display of the patterns 232,..., But also interrupts the display of the patterns 231, 232,. May be executed (online help function).

  Further, the operator can store the number of non-defective products, the number of defective products, and the like in the total storage unit 142 by operating the operation unit 25 and simultaneously with the inspection of each of the electrical components 51, 52,. . Furthermore, the worker causes the defect rate to be aggregated and stored in the aggregation storage unit 142, and when the defect rate exceeds a predetermined upper limit value, information indicating that the defect rate is too high is output to the display unit 15. Thus, it is possible to automatically notify the operator of the control device 1 that the defect rate has reached or exceeded the predetermined upper limit value. Information relating to the inspection result is accumulated in the total storage unit 142, and information relating to the inspection is stored in the inspection storage unit 141. Therefore, the operator of the control device 1 can easily obtain information relating to the inspection / inspection result. Can be managed.

  Since the inspection support system as described above does not need to include one or a plurality of imaging devices that image the inspection object, a movable table for changing the position of the inspection object, the configuration of the system is simple, In addition, the cost is low. Further, since the display device 2 is not provided with the CPU 10, HDD 14, etc., and operates according to the control of the control device 2, the structure of the display device 2 is simple, and the display devices 2, 2,. can do. Further, the display device 2 is light because the number of parts is small.

  In addition, the structure which connects the control apparatus 1, the display apparatus 2, and the hub 3 by radio | wireless may be sufficient as an inspection assistance system. The hub 3 is not configured to determine the display device 2 to which the pattern data is to be transmitted, but the display device 2 determines whether or not the pattern data is to be received, and the control device 1 and further the hub 3 A configuration in which pattern data is transmitted to all of the devices 2, 2,. Further, the control device 1 and the display device 2 may be in a one-to-one correspondence. In this case, the hub 3 is unnecessary.

  Furthermore, the operation unit 25 may be provided separately from the display device 2. Further, when the control device 1 and the display device 2 have a one-to-one correspondence, the display device 2 may not include the operation unit 25 but may use the operation unit 16 of the control device 1 instead.

  Further, in the total storage unit 142, the inspection results of the display devices 2, 2,... May be individually totaled, and the inspection results of the display devices 2, 2,.

  Furthermore, the operation unit 25 may include a touch panel laminated on the liquid crystal panel 23, and various keys may be provided as soft keys on the touch panel. When the OK key 251 and the NG key 252 are provided as soft keys in the vicinity of the high light-transmitting areas 231, 232,... Or overlapped with the high light-transmitting areas 231, 232,. Since the inspection is performed while pointing and confirming certain electronic components 51, 52,..., An operator who has determined whether or not the product is OK can immediately operate the OK key 251 or the NG key 252.

  Moreover, the structure which provides the NG key 252 so that it may overlap with the high translucent area | regions 231, 232, ..., and the position where the touch panel was operated may be recorded. In this case, not only the information that the electronic components 51, 52,... Are defective, but also the location information of the defective portions of the electronic components 51, 52,.

  In this embodiment, the case where inspection information is displayed with a light transmittance lower than that of the low light transmission region so as to overlap with the low light transmission region is illustrated, but the light transmittance higher than that of the low light transmission region is illustrated. The inspection information may be displayed in such a manner that the inspection information may be displayed so as to be superimposed on the highly light-transmissive region. Furthermore, a pattern in which a high light-transmitting region corresponding to the inspection object, a linear low light-transmitting region surrounding the high light-transmitting region, and a region that does not correspond to the inspection object but has a high light transmittance may be used. Furthermore, a pattern in which the high light transmission region surrounds the low light transmission region may be used. The pattern displayed on the liquid crystal panel 23 may be displayed in color. In other words, any pattern may be used as long as it is a pattern in which a high light-transmitting region and a low light-transmitting region for clearly indicating the electronic components 51, 52,. The form is not limited to the present embodiment.

  In this embodiment, the case where the worker visually inspects the electronic components 51, 52,... Directly through the liquid crystal panel 23 is exemplified. The electronic components 51, 52,... May be inspected via a mirror or the like, and the electronic components 51, 52,.

  Further, the size of the circuit board 5 may be larger than the size of the liquid crystal panel 23. In this case, or when inspecting using a microscope, a magnifying glass, etc., the position of the display device 2 (and the microscope, the magnifying glass, etc.) is moved according to the position of the electronic components 51, 52,. However, the circuit board 5 may be moved according to the position of the display device 2 (and a microscope, a magnifier, etc.). When the circuit board 5 is moved, a table for moving the circuit board 5 as disclosed in Patent Documents 1 to 3 may be used.

  Further, not only inspection objects arranged on a plane, inspection objects arranged on a line, inspection objects arranged three-dimensionally, and the like may be inspected. Further, the liquid crystal panel 23 may not be rectangular and may not be flat.

Embodiment 2. FIG.
FIG. 7 is a block diagram showing a configuration of an inspection support system according to Embodiment 2 of the present invention. The inspection support system in the first embodiment is configured to include the control device 1, the display device 2 on which the pattern is not displayed on the liquid crystal panel 23 without the operation control by the control device 1, the hub 3, and the illumination device. The inspection support system in the present embodiment includes a display device 4 that displays a pattern without operation control by other devices and an illumination device (not shown). That is, the display device 4 has both functions of the control device 1 and the display device 2.

  The display device 4 includes the CPU 40, ROM 41, RAM 42, and HDD 44 corresponding to the CPU 10, ROM 11, RAM 12, and HDD 14 of the control device 1, and the data storage unit 21, panel drive unit 22, liquid crystal panel 23, and operation unit 25 of the display device 2. A corresponding data storage unit 45, panel drive unit 46, liquid crystal panel 47, and operation unit 43 are provided. Also, the OK key 251 and NG key 432 of the operation unit 43 correspond to the OK key 251 and NG key 252 of the operation unit 25, and the inspection storage unit 141, the total storage unit 142, and the pattern storage unit 143 of the HDD 14 correspond to the HDD 44. The inspection storage unit 441, the total storage unit 442, and the pattern storage unit 443 correspond to each other.

  Before starting the inspection of the circuit boards 5, 5,..., For example, the operator connects the display device 4 to an external database server that stores data relating to the inspection, and the “inspection object” and “inspection object” in the inspection storage unit 441 are connected. Various data stored in columns such as “position”, “inspection order”, “inspection information”, and “inspection object” in the pattern storage unit 143 are downloaded in advance. Here, when the pattern data stored in the pattern storage unit 443 is also downloaded, the burden on the CPU 40 is reduced by not creating the pattern data.

  Further, after the inspection of the circuit boards 5, 5,..., The operator connects the display device 4 to an external database server that stores data related to the inspection results, for example, and displays the inspection results stored in the total storage unit 443. Upload.

  Further, the CPU 40 outputs high defect rate information to the total storage unit 442 and the liquid crystal panel 47, and displays the high defect rate information on the liquid crystal panel 47 to notify the operator that the defect rate is too high. In addition, description of the part corresponding to Embodiment 1 is abbreviate | omitted.

  When using the inspection support system as described above, the operator can perform an inspection using the display device 4 in the same manner as the display device 2. Further, since the control device 1, the hub 3, and the like are unnecessary, the inspection support system is compact. Furthermore, since the display device 4 does not need to communicate with other devices during the inspection, it is not necessary to construct a communication network for the inspection support system at the production site, and the burden on the other communication network is not increased.

  Instead of the HDD 44, a card slot for inserting a portable memory card and an external storage unit for reading / writing data from / to the memory card are provided, and the memory card includes an inspection storage unit 441, a total storage unit 442, and The pattern storage unit 443 may be provided. In this case, the operator inserts a memory card storing data relating to the inspection into the card slot, and the CPU 40 reads out necessary data from the memory card using the external storage unit. Further, after the CPU 40 writes data relating to the inspection result to the memory card, the operator ejects the memory card from the card slot, and submits the ejected memory card to, for example, an administrator of the inspection support system. Insert a new memory card.

It is a perspective view which shows the structure of the test | inspection assistance system which concerns on Embodiment 1 of this invention. It is a block diagram which shows the structure of the test | inspection assistance system which concerns on Embodiment 1 of this invention. It is a schematic diagram which shows an example of the data memorize | stored in HDD of the control apparatus with which the test | inspection assistance system which concerns on Embodiment 1 of this invention is provided. It is a schematic diagram which shows an example of the pattern displayed on the liquid crystal panel of the test | inspection assistance system which concerns on Embodiment 1 of this invention. It is a flowchart which shows the procedure of the pattern display process of the test | inspection assistance system which concerns on Embodiment 1 of this invention. It is a flowchart which shows the procedure of the pattern display process of the test | inspection assistance system which concerns on Embodiment 1 of this invention. It is a block diagram which shows the structure of the test | inspection assistance system which concerns on Embodiment 2 of this invention.

Explanation of symbols

10, 40 CPU (operation receiving means, counting means, output means)
142,442 Total storage unit (information storage means)
22, 46 Panel drive unit (pattern display means)
23, 47 Liquid crystal panel 231, 232 Pattern 231a, 232a High light transmission region 231b, 232b Low light transmission region 232c Inspection information (information)
25 Operation part (operation receiving means)
5 Circuit board 51, 52, 53 Electronic components (subject to inspection)

Claims (8)

In a method for optically inspecting an inspection object,
A space in which one or a plurality of inspection objects are arranged in a plane is covered with a liquid crystal panel, and a pattern in which a high light-transmitting area and a low light-transmitting area corresponding to the position of the inspection object are mixed is displayed on the liquid crystal panel. An inspection method characterized by optically inspecting the inspection object through the high light-transmitting region.   The inspection method according to claim 1, wherein a plurality of different patterns are displayed in order on the liquid crystal panel. A liquid crystal panel to be arranged so as to cover a space in which one or a plurality of inspection objects are arranged in a plane, and a pattern display means for displaying on the liquid crystal panel a pattern in which regions having different transmissivities are mixed are provided. An inspection support system,
The said pattern display means displays on the said liquid crystal panel the pattern in which the high translucency area | region and low translucency area | region corresponding to the position of a test object are mixed, The inspection assistance system characterized by the above-mentioned.   The inspection support system according to claim 3, wherein the pattern display means displays a plurality of different patterns on the liquid crystal panel in order.   The inspection support system according to claim 3 or 4, wherein the pattern display means displays information in addition to the pattern. An operation accepting means for accepting an operation;
The inspection support system according to claim 3, further comprising: an information storage unit that stores information according to an operation received by the operation reception unit. An operation accepting means for accepting an operation;
Tally means for tallying information according to the operation accepted by the operation accepting means;
An inspection support system according to any one of claims 3 to 5, further comprising: an output unit that outputs information according to a totaling result of the totaling unit. An operation receiving means for receiving an operation;
5. The inspection support system according to claim 4, wherein the pattern display means displays a plurality of different patterns in order on the liquid crystal panel each time the operation accepting means accepts an operation.

Images