JP2006010770A5 - - Google Patents

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Publication number
JP2006010770A5
JP2006010770A5 JP2004183925A JP2004183925A JP2006010770A5 JP 2006010770 A5 JP2006010770 A5 JP 2006010770A5 JP 2004183925 A JP2004183925 A JP 2004183925A JP 2004183925 A JP2004183925 A JP 2004183925A JP 2006010770 A5 JP2006010770 A5 JP 2006010770A5
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JP
Japan
Prior art keywords
luminance information
microscope apparatus
sample
stage
laser scanning
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JP2004183925A
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Japanese (ja)
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JP2006010770A (en
JP4679840B2 (en
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Priority to JP2004183925A priority Critical patent/JP4679840B2/en
Priority claimed from JP2004183925A external-priority patent/JP4679840B2/en
Publication of JP2006010770A publication Critical patent/JP2006010770A/en
Publication of JP2006010770A5 publication Critical patent/JP2006010770A5/ja
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Publication of JP4679840B2 publication Critical patent/JP4679840B2/en
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Claims (9)

ステージ又は及び対物レンズを退避位置へ移動する退避手段と、
第1の部材、標本、及び第2の部材が前記第1の部材、前記標本、前記第2の部材の順に重ねて載置された前記ステージ又は及び前記対物レンズを復帰位置へ移動する復帰手段と、
前記復帰位置への移動中に、前記第1の部材及び前記第2の部材からの反射光の輝度情報を取得する輝度情報取得手段と、
該輝度情報取得手段により取得された輝度情報を基にZ方向の観察範囲を決定する観察範囲決定手段と、
を有することを特徴とするレーザ走査型顕微鏡装置。
Retracting means for moving the stage or the objective lens to the retracted position;
Return means for moving the first member, the specimen, and the second member to the return position, the stage or the objective lens on which the first member, the specimen, and the second member are stacked in this order. When,
Luminance information acquisition means for acquiring luminance information of reflected light from the first member and the second member during the movement to the return position;
An observation range determination unit that determines an observation range in the Z direction based on the luminance information acquired by the luminance information acquisition unit;
A laser scanning microscope apparatus comprising:
前記観察範囲決定手段により決定されたZ方向の観察範囲に従って、前記ステージ又は及び前記対物レンズの可動範囲を制限する、
ことを特徴とする請求項1記載のレーザ走査型顕微鏡装置。
Limiting the movable range of the stage or the objective lens according to the observation range in the Z direction determined by the observation range determination means,
The laser scanning microscope apparatus according to claim 1.
ステージ又は及び対物レンズを退避位置へ移動し、
第1の部材、標本、及び第2の部材が前記第1の部材、前記標本、前記第2の部材の順に重ねて載置された前記ステージ又は及び前記対物レンズを復帰位置へ移動し、
該復帰位置への移動中に、前記第1の部材及び前記第2の部材からの反射光の輝度情報を取得し、
該取得した輝度情報を基にZ方向の観察範囲を決定する、
ことを特徴とするレーザ走査型顕微鏡装置の制御方法。
Move the stage or objective lens to the retracted position,
The first member, the specimen, and the second member are moved to the return position, the stage or the objective lens placed in the order of the first member, the specimen, and the second member,
During the movement to the return position, the brightness information of the reflected light from the first member and the second member is acquired,
Determining the observation range in the Z direction based on the acquired luminance information;
A method of controlling a laser scanning microscope apparatus, characterized in that:
コンピュータに、
ステージ又は及び対物レンズを退避位置へ移動する機能と、
第1の部材、標本、及び第2の部材が前記第1の部材、前記標本、前記第2の部材の順に重ねて載置された前記ステージ又は及び前記対物レンズを復帰位置へ移動する復帰機能と、
該復帰位置への移動中に、前記第1の部材及び前記第2の部材からの反射光の輝度情報を取得する輝度情報取得機能と、
該取得した輝度情報を基にZ方向の観察範囲を決定する観察範囲決定機能と、
を実現させるためのレーザ走査型顕微鏡装置の制御プログラム。
On the computer,
A function of moving the stage or the objective lens to the retracted position;
A return function for moving the first member, the sample, and the second member to the return position, and the stage or the objective lens on which the first member, the sample, and the second member are stacked in this order. When,
A luminance information acquisition function for acquiring luminance information of reflected light from the first member and the second member during the movement to the return position;
An observation range determination function for determining an observation range in the Z direction based on the acquired luminance information;
A control program for a laser scanning microscope apparatus for realizing the above.
前記輝度情報取得手段は、前記復帰位置への移動中の各Z位置において一定のポイントに対する輝度情報を取得することを特徴とする請求項1または2に記載のレーザ走査型顕微鏡装置。The laser scanning microscope apparatus according to claim 1, wherein the luminance information acquisition unit acquires luminance information for a certain point at each Z position during movement to the return position. 前記輝度情報を取得するために照射される光を標本上で走査する走査手段を有し、Scanning means for scanning the sample with light irradiated to obtain the luminance information;
前記輝度情報取得手段は、前記復帰位置への移動中の各Z位置において前記走査手段により前記光を1次元又は2次元に走査し、走査された線又は領域の平均輝度を前記輝度情報として取得することを特徴とする請求項1または2に記載のレーザ走査型顕微鏡装置。The luminance information acquisition means scans the light one-dimensionally or two-dimensionally by the scanning means at each Z position during movement to the return position, and acquires the average luminance of the scanned line or region as the luminance information The laser scanning microscope apparatus according to claim 1, wherein:
前記輝度情報を取得するために照射される光を標本上で走査する走査手段を有し、Scanning means for scanning the sample with light irradiated to obtain the luminance information;
前記輝度情報取得手段は、前記復帰位置への移動中の各Z位置において、前記走査手段により前記光を標本上の2つの線上にライン走査することにより、XY位置の異なる複数の位置ごとの前記輝度情報を取得することを特徴とする請求項1または2に記載のレーザ走査型顕微鏡装置。The luminance information acquisition unit performs line scanning of the light on two lines on the sample by the scanning unit at each Z position during movement to the return position. Luminance information is acquired, The laser scanning microscope apparatus of Claim 1 or 2 characterized by the above-mentioned.
前記取得されたXY位置の異なる複数の位置ごとの輝度情報から、各位置のZ方向の観察範囲を求め、それらの差から前記ステージの傾き分を求めて、この求めた傾き分を考慮したZ方向の観察範囲を設定することを特徴とする請求項7記載のレーザ走査型顕微鏡装置。From the acquired luminance information for each of a plurality of different XY positions, an observation range in the Z direction at each position is obtained, and an inclination of the stage is obtained from the difference between them, and the Z in consideration of the obtained inclination is obtained. 8. The laser scanning microscope apparatus according to claim 7, wherein a direction observation range is set. 前記輝度情報取得手段が前記輝度情報を取得するために標本へ照射される光の波長と、前記標本の実際の観察を行うために標本へ照射される光の波長が異なることを特徴とする請求項1または2に記載のレーザ走査型顕微鏡装置。The wavelength of light emitted to the sample for the luminance information acquisition unit to acquire the luminance information is different from the wavelength of light irradiated to the sample for actual observation of the sample. Item 3. The laser scanning microscope apparatus according to Item 1 or 2.
JP2004183925A 2004-06-22 2004-06-22 Laser scanning microscope Expired - Fee Related JP4679840B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004183925A JP4679840B2 (en) 2004-06-22 2004-06-22 Laser scanning microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004183925A JP4679840B2 (en) 2004-06-22 2004-06-22 Laser scanning microscope

Publications (3)

Publication Number Publication Date
JP2006010770A JP2006010770A (en) 2006-01-12
JP2006010770A5 true JP2006010770A5 (en) 2007-09-06
JP4679840B2 JP4679840B2 (en) 2011-05-11

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JP2004183925A Expired - Fee Related JP4679840B2 (en) 2004-06-22 2004-06-22 Laser scanning microscope

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009223164A (en) * 2008-03-18 2009-10-01 Olympus Corp Microscopic image photographing apparatus

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3631304B2 (en) * 1995-10-24 2005-03-23 オリンパス株式会社 Microscope automatic focusing device
JP2002039722A (en) * 2000-07-19 2002-02-06 Olympus Optical Co Ltd Device and method for data acquisition in film thickness measurement and recording medium stored with program for data acquisition
JP2003270524A (en) * 2002-03-19 2003-09-25 Nikon Corp Focus detector and microscope provided therewith, and method for detecting focus
JP4307815B2 (en) * 2002-10-10 2009-08-05 オリンパス株式会社 Confocal laser scanning microscope apparatus and program thereof

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