JP2005319152A5 - - Google Patents

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Publication number
JP2005319152A5
JP2005319152A5 JP2004140769A JP2004140769A JP2005319152A5 JP 2005319152 A5 JP2005319152 A5 JP 2005319152A5 JP 2004140769 A JP2004140769 A JP 2004140769A JP 2004140769 A JP2004140769 A JP 2004140769A JP 2005319152 A5 JP2005319152 A5 JP 2005319152A5
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JP
Japan
Prior art keywords
afterglow
ray
ray detector
correction
output
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Application number
JP2004140769A
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English (en)
Japanese (ja)
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JP2005319152A (ja
JP4500101B2 (ja
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Priority to JP2004140769A priority Critical patent/JP4500101B2/ja
Priority claimed from JP2004140769A external-priority patent/JP4500101B2/ja
Publication of JP2005319152A publication Critical patent/JP2005319152A/ja
Publication of JP2005319152A5 publication Critical patent/JP2005319152A5/ja
Application granted granted Critical
Publication of JP4500101B2 publication Critical patent/JP4500101B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004140769A 2004-05-11 2004-05-11 Ｘ線ｃｔ装置 Expired - Fee Related JP4500101B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004140769A JP4500101B2 (ja) 2004-05-11 2004-05-11 Ｘ線ｃｔ装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004140769A JP4500101B2 (ja) 2004-05-11 2004-05-11 Ｘ線ｃｔ装置

Publications (3)

Publication Number Publication Date
JP2005319152A JP2005319152A (ja) 2005-11-17
JP2005319152A5 true JP2005319152A5 (enrdf_load_stackoverflow) 2007-02-01
JP4500101B2 JP4500101B2 (ja) 2010-07-14

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ID=35466867

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004140769A Expired - Fee Related JP4500101B2 (ja) 2004-05-11 2004-05-11 Ｘ線ｃｔ装置

Country Status (1)

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JP (1) JP4500101B2 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8309910B2 (en) * 2010-12-15 2012-11-13 General Electric Company Phantom for spectral CT image system calibration
JP5819531B2 (ja) * 2012-08-22 2015-11-24 株式会社日立メディコ Ｘ線ｃｔ装置およびｘ線ｃｔ画像生成方法
KR101347254B1 (ko) * 2012-09-10 2014-01-07 연세대학교 원주산학협력단 방사선 검출기의 불균일성 보정 방법
CN103405241B (zh) * 2013-07-21 2015-07-08 西北工业大学 一种射线成像的探测器余辉校正方法
JP7242255B2 (ja) * 2018-11-05 2023-03-20 キヤノンメディカルシステムズ株式会社 Ｘ線ｃｔ装置および検出器ユニット

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5331682A (en) * 1991-11-25 1994-07-19 General Electric Company Radiation detector offset and afterglow compensation technique
JPH08243101A (ja) * 1995-03-14 1996-09-24 Ge Yokogawa Medical Syst Ltd Ｘ線検出器の特性改善方法及びｘ線ｃｔ装置
JP2002306467A (ja) * 2001-04-17 2002-10-22 Hitachi Medical Corp Ｘ線ｃｔ装置

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