JP2005255437A - Single crystal production apparatus and single crystal production method - Google Patents
Single crystal production apparatus and single crystal production method Download PDFInfo
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- JP2005255437A JP2005255437A JP2004067151A JP2004067151A JP2005255437A JP 2005255437 A JP2005255437 A JP 2005255437A JP 2004067151 A JP2004067151 A JP 2004067151A JP 2004067151 A JP2004067151 A JP 2004067151A JP 2005255437 A JP2005255437 A JP 2005255437A
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Abstract
Description
本発明は単結晶、特に酸化物単結晶の製造に関わり、結晶にクラックを発生させることのない製造装置及び製造方法に関する。さらに、電力を節約する製造方法に関する。 The present invention relates to production of a single crystal, particularly an oxide single crystal, and relates to a production apparatus and a production method that do not cause cracks in the crystal. Furthermore, the present invention relates to a manufacturing method that saves power.
一般に単結晶製造装置は、断熱材の構造が単結晶育成中、及び冷却中ともに同一構造となっている。特許文献1で開口部に蓋をする方法が提案されているが、結晶の温度を制御することはできない。また、アフタ・ヒータにより結晶上部を加熱する方法があるが、高周波電源を利用するチョクラルスキー法では、さらに大きな電力を必要とする。 In general, in a single crystal manufacturing apparatus, the structure of the heat insulating material is the same during both single crystal growth and cooling. Patent Document 1 proposes a method of covering the opening, but the temperature of the crystal cannot be controlled. In addition, there is a method of heating the upper part of the crystal with an after heater, but the Czochralski method using a high frequency power source requires a larger electric power.
結晶にクラックが発生するおもな原因は、単結晶に大きな温度差が生じその熱応力によりクラックが発生する。
上記の従来技術のように、冷却開始時に蓋を完全に閉じると結晶あるいはルツボの一部または全部が融点を超え融解してしまう。また、冷却の途中から蓋を閉じるとそれまでに上部の低温ガスが流入し、あるいは結晶の放熱が大きくクラック防止効果が無い。また、はじめから、ほぼ閉じた状態では固液界面の温度勾配が小さくなり、結晶成長が遅いため育成時間が長くなる。また、新たな熱源が必要となり、装置の構造が複雑になり、さらに電力を多く必要とする。
本発明は、新たな熱源を追加することなく、むしろ電力を低減し、短時間でクラックの発生しない単結晶を得る単結晶製造装置と製造方法を提供する。
The main cause of cracks in the crystal is that a large temperature difference occurs in the single crystal and cracks are generated due to the thermal stress.
If the lid is completely closed at the start of cooling as in the prior art described above, some or all of the crystal or crucible exceeds the melting point and melts. Further, when the lid is closed during the cooling, the upper low temperature gas flows by that time, or the heat radiation of the crystal is large and there is no crack prevention effect. In addition, in the almost closed state from the beginning, the temperature gradient at the solid-liquid interface becomes small, and the growth time becomes long because the crystal growth is slow. In addition, a new heat source is required, the structure of the apparatus is complicated, and more electric power is required.
The present invention provides a single crystal manufacturing apparatus and a manufacturing method for obtaining a single crystal in which power is reduced and cracks do not occur in a short time without adding a new heat source.
本発明は、以下の発明に関する。
<1> ルツボ内の融液を加熱し、融液に種結晶を接触させ、それを引上げて単結晶を製造する方法において、耐火物の上部開口部を自動、あるいは手動にてその開閉量を連続的に調整する機構を有し、かつ、開口部の開閉量と高周波電源の出力を同時に制御する機構を有する単結晶製造装置。
<2> 上記<1>において、結晶温度、または、炉内温度を測定し、その測定温度に応じて開口部の開閉量と高周波電源の出力を同時に調節する機能を有する単結晶製造装置。
<3> 上記<1>において、計算あるいは実験により適切な開口部の開閉量と高周波電源の出力を予め求めておき、自動あるいは手動で開口部の開閉量と高周波電源の出力を同時に調節する単結晶の製造方法。
<4> 上記<1>において、急冷、除冷、急冷の組み合わせで短時間にて、長時間冷却と同等のクラック発生防止効果を得る機能を有する単結晶の製造方法。
<5> 上記<1>〜<4>の装置または方法により製造した単結晶。
The present invention relates to the following inventions.
<1> In the method of heating the melt in the crucible, bringing the seed crystal into contact with the melt and pulling it up to produce a single crystal, the upper opening of the refractory can be opened or closed automatically or manually. A single crystal manufacturing apparatus having a mechanism for continuously adjusting and a mechanism for simultaneously controlling an opening / closing amount of an opening and an output of a high-frequency power source.
<2> The single crystal manufacturing apparatus according to <1>, wherein the crystal temperature or the furnace temperature is measured, and the opening / closing amount of the opening and the output of the high-frequency power source are simultaneously adjusted according to the measured temperature.
<3> In the above item <1>, an appropriate opening / closing amount of the opening and the output of the high-frequency power source are obtained in advance by calculation or experiment, and the opening / closing amount of the opening and the output of the high-frequency power source are simultaneously adjusted automatically or manually. Crystal production method.
<4> A method for producing a single crystal according to the above <1>, which has a function of obtaining the same cracking prevention effect as that of long-time cooling in a short time by a combination of rapid cooling, removal cooling, and rapid cooling.
<5> A single crystal produced by the apparatus or method of <1> to <4> above.
本発明によれば、単結晶製造装置において、相反する育成に適した断熱材構造と冷却に適した断熱材構造を連続した育成工程の中で実現し結晶の温度を制御することで、クラックの発生を防止し、生産性を向上する効果がある。 According to the present invention, in a single crystal manufacturing apparatus, a heat insulating material structure suitable for conflicting growth and a heat insulating material structure suitable for cooling are realized in a continuous growth process, and the temperature of the crack is controlled. This has the effect of preventing generation and improving productivity.
結晶育成中は耐火物上方の可動式耐火物を退避させておく。結晶育成が終了し結晶を原料融液から切り離した時刻に可動式耐火物を固定断熱部上部に移動し、固定断熱部上方付近のガスの出入りを制限し、外側からの低温気流の流入を遮断、内側からの高温気流の流出を遮断する。さらに結晶からの熱放射を抑え耐火物内側を高温化する。しかしながら、ほぼ閉じた状態となると高温化した結晶あるいはルツボが融点を超えるため、高周波電源の出力を低下させる。あるいは、可動式耐火物の移動量を調整し結晶の融解またはルツボが融点を超えるのを防ぐことができる。 The movable refractory above the refractory is retracted during crystal growth. At the time when crystal growth is completed and the crystal is separated from the raw material melt, the movable refractory is moved to the upper part of the fixed heat insulating part, restricting the inflow and outflow of gas near the upper part of the fixed heat insulating part, and blocking the inflow of low-temperature airflow from the outside. Blocks outflow of hot airflow from the inside. Furthermore, heat radiation from the crystal is suppressed and the inside of the refractory is heated. However, when the state is almost closed, the crystal or crucible having a high temperature exceeds the melting point, so that the output of the high-frequency power source is lowered. Alternatively, the moving amount of the movable refractory can be adjusted to prevent the melting of the crystal or the crucible from exceeding the melting point.
以下、本発明の実施例を図1、図2、図3、図4、により説明する。
図1は本発明を適用した実施例の断面図である。導電性のルツボ1の周りはジルコニアなどの耐火物6で囲まれている。耐火物6の外側には高周波コイル10が巻かれている。高周波コイル10には高周波電源11が接続されている。ルツボ1の中には原料2が融解した液体があり、種結晶4をホルダ5で回転しながら引上げて結晶3を生成する。
Embodiments of the present invention will be described below with reference to FIGS. 1, 2, 3, and 4. FIG.
FIG. 1 is a sectional view of an embodiment to which the present invention is applied. The conductive crucible 1 is surrounded by a refractory 6 such as zirconia. A high frequency coil 10 is wound around the outside of the refractory 6. A high frequency power source 11 is connected to the high frequency coil 10. In the crucible 1, there is a liquid in which the raw material 2 is melted, and the seed crystal 4 is pulled up while being rotated by the holder 5 to generate a crystal 3.
結晶育成時は可動式耐火物8を固定耐火物7の外側あるいは上方に退避させ、固定耐火物7上方から放熱し結晶成長を促進する。固定耐火物7が大きく開いた状態で高周波電源11の出力を図2のAで示すように冷却すると結晶3の肩部温度は図3のCに示すように変化する。これに対し、図1に示すように冷却開始と同時に可動式耐火物8で固定耐火物7の上方を閉じると結晶3の肩部温度は図3のDに示すように高温化する。このとき結晶3やルツボ1は一部あるいは全部が融点を超え融解する可能性がある。 At the time of crystal growth, the movable refractory 8 is retracted outside or above the fixed refractory 7, and heat is dissipated from above the fixed refractory 7 to promote crystal growth. When the output of the high-frequency power source 11 is cooled as indicated by A in FIG. 2 in a state where the fixed refractory 7 is wide open, the shoulder temperature of the crystal 3 changes as indicated by C in FIG. On the other hand, as shown in FIG. 1, when the upper part of the fixed refractory 7 is closed with the movable refractory 8 simultaneously with the start of cooling, the shoulder temperature of the crystal 3 is increased as shown in FIG. At this time, the crystal 3 or the crucible 1 may partially or completely exceed the melting point and melt.
そこで、図1に示すように冷却開始と同時に可動式耐火物8で固定耐火物7の上方を閉じ、同時に高周波電源11の出力を図2のBで示すようにステップ状に変化させると結晶3の肩部温度は図3のCに示すような標準状態と同等の温度変化を示す。このとき、可動式耐火物8が固定耐火物7の上部を閉じるため周囲の低温ガス流入を遮断し、かつ、耐火物内側の高温ガスの流出を遮断する。さらに結晶3からの熱放射による低温化を防ぎ、特に結晶3の肩部を高温化し、クラックの発生を防止する。 Therefore, when the cooling refractory 8 is closed with the movable refractory 8 at the same time as cooling is started as shown in FIG. 1 and the output of the high-frequency power source 11 is changed stepwise as shown in FIG. The shoulder temperature of FIG. 3 shows a temperature change equivalent to the standard state as shown in FIG. At this time, since the movable refractory 8 closes the upper part of the fixed refractory 7, the surrounding cold gas inflow is blocked, and the outflow of hot gas inside the refractory is blocked. Further, the temperature is prevented from being lowered by heat radiation from the crystal 3, and in particular, the shoulder of the crystal 3 is heated to prevent the occurrence of cracks.
また、高周波電源11の出力を直線状に下げていく過程のなかで、放射温度計12の測定値をもとに結晶温度が融点を超えないように、可動式耐火物8を必要なだけ閉じることで結晶全体を均熱化しクラックの発生を防止する。 Further, in the process of decreasing the output of the high frequency power supply 11 linearly, the movable refractory 8 is closed as necessary so that the crystal temperature does not exceed the melting point based on the measurement value of the radiation thermometer 12. As a result, the entire crystal is soaked and cracks are prevented from occurring.
また、高周波電源11の出力を直線状に下げていく過程のなかで、結晶温度が融点を超えないように、可動式耐火物8を実験値をもとにあらかじめ決めた量だけ閉じることで結晶全体を均熱化しクラックの発生を防止する。 Further, in the process of decreasing the output of the high-frequency power source 11 linearly, the movable refractory 8 is closed by a predetermined amount based on experimental values so that the crystal temperature does not exceed the melting point. The whole is soaked to prevent cracks.
図4にもうひとつの実施例を示す。結晶3を冷却する過程で発生するクラックを防止するために高周波電源11の出力の降下率を小さくし、長い時間をかけて冷却している。実験によれば、結晶にクラックが生じやすい温度領域が存在し、この温度区間だけをゆっくり冷却すれば、他の区間の高周波電源出力の降下率を大きくしても同等の効果を得る。これにより、短時間でクラックの無い結晶を小さい電力で得ることが可能となる。 FIG. 4 shows another embodiment. In order to prevent cracks generated in the process of cooling the crystal 3, the rate of decrease in the output of the high-frequency power supply 11 is reduced, and cooling is performed over a long time. According to experiments, there is a temperature region where cracks are likely to occur in the crystal, and if only this temperature interval is slowly cooled, the same effect can be obtained even if the rate of decrease in the high-frequency power output in other intervals is increased. Thereby, it becomes possible to obtain a crack-free crystal with a small electric power in a short time.
1:ルツボ
2:原料
3:結晶
4:種結晶
5:ホルダ
6:台座耐火物
7:固定耐火物
8:可動式蓋耐火
9:炉体
10:高周波コイル
11:高周波電源
12:放射温度計
1: crucible 2: raw material 3: crystal 4: seed crystal 5: holder 6: pedestal refractory 7: fixed refractory 8: movable lid refractory 9: furnace body 10: high frequency coil 11: high frequency power supply 12: radiation thermometer
Claims (5)
The single crystal manufactured by the apparatus or method of Claims 1-4.
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