JP2005252189A - System for detecting board abnormality - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a system for detecting abnormalities of a board which enables detection of the abnormalities of the board, on which electronic devices and a CPU are mounted. <P>SOLUTION: The system starts the electronic board which has at least the electronic devices 22-24, including a semiconductor circuit and the CUP 21, and is equipped with a personal computer for inspection 10, which extracts the inspection information, on whether the driving of the electronic substrate 20 is normal from the CUP 21 and a control database 41, in which the inspection information collected from the personal computer for inspection 10 is are stored, related to the electronic board and electronic devices. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a substrate abnormality detection system that detects the presence or absence of an abnormality in an electronic substrate mounted on an electronic device such as a projector, and more particularly to abnormality detection of a substrate on which an electronic device including a CPU and a semiconductor device is mounted.

Conventionally, various electronic devices are mounted on boards mounted on projectors, rear projectors, etc., but it is difficult to grasp whether the electronic devices are functioning normally at the manufacturing stage. The current situation is that the electronic device is found to be abnormal only after the lighting operation. Alternatively, an abnormality of only the type of communication (2-wire serial, 3-wire serial, etc.) viewed from the control device is returned by a communication command, or the abnormality is detected by a combination of few LED lightings. On the other hand, as an apparatus for detecting an abnormality of an electronic device, for example, there is an apparatus that detects and displays details of an error of an apparatus individually and can deal with it quickly (for example, Patent Document 1).
JP 2000-262723 A

  In the manufacture of projectors, rear projectors, etc., for example, the state that the electronic device is found to be abnormal only after the lamp is turned on, or the communication command viewed from the control device is returned as a communication command, Alternatively, if an abnormality is detected by a combination of a small number of LED lighting, it is not known which electronic device has an abnormality, and there is a problem that it takes time to specify an electronic device having an abnormality. In addition, an error in an electronic device that is individually detected and displayed in detail and can be quickly dealt with (for example, Patent Document 1) is intended for an error in a use state in which a product is completed. Therefore, the present invention cannot be applied in the manufacturing process of the electronic device such as the projector described above.

  The present invention has been made to solve such problems, and an object of the present invention is to provide a substrate abnormality detection system capable of detecting the presence or absence of abnormality of a substrate on which an electronic device is mounted. To do.

  The substrate abnormality detection system according to the present invention activates an electronic substrate including at least an electronic device including a semiconductor circuit and a CPU, and also inspects whether or not the electronic substrate is normally driven from the CPU. An inspection information processing apparatus to be collected, and a management database in which inspection information collected by the inspection information processing apparatus is stored in association with the electronic substrate and the electronic device. In the present invention, since the inspection information collected by the information processing apparatus for inspection is stored in the management database in association with the electronic substrate and the electronic device, the details of the inspection information of the electronic device in the manufacturing stage are grasped. If there is an abnormality, it is possible to deal with it in units of electronic devices, and a quick response is possible. In addition, since inspection information for each electronic device is stored in the management database, the inspection history can be grasped for each electronic device.

  In the substrate abnormality detection system according to the present invention, the inspection information processing apparatus drives the electronic device with a command used in the electronic device to the CPU, and determines whether or not the driving is normally performed. Inspection information is collected from the CPU. In the present invention, the inspection information processing apparatus causes the CPU to drive the electronic device with a command used in the electronic device, and a state close to actual driving is obtained. Inspection information on whether or not it is normally performed can be obtained with high accuracy.

  In the substrate abnormality detection system according to the present invention, the management database stores repair information of the electronic device when the electronic device determined to be not driven normally is repaired. In the present invention, since the repair information for each electronic device is stored in the management database, the repair history of the electronic device can be grasped.

  In the substrate abnormality detection system according to the present invention, at least the product number and the electronic substrate number included in the product are stored in association with each other in the management database, and inspection information and information on each electronic substrate are stored. The repair information at the time of repair is stored. In the present invention, when there is a malfunction such as a failure in the manufactured product, a history in the manufacturing stage is obtained by searching the data in the management database, and a quick response is possible.

Embodiment 1. FIG.
FIG. 1 is a system configuration diagram of a substrate abnormality detection apparatus and related equipment according to Embodiment 1 of the present invention. An inspection PC (information processing apparatus for inspection) 10 is connected to a substrate 20 to be inspected. For example, a CPU 21, electronic devices 22 to 24, and an input / output port (serial interface) 25 are mounted on the substrate 20. Further, a display device 26 such as an LED is further mounted on the substrate 20 so that the inspection result by the CPU 21 is displayed. The inspection PC 10 exchanges serial data with the CPU 21 of the substrate 20 via the input / output port 25. It is assumed that an inspection program is incorporated in the CPU 21 in advance. The inspection PC 10 is connected to the server 40 via the LAN 30, and the server 40 is connected to the management database 41 so that the management database 41 can be accessed via the server 40. Further, a management computer 50 for managing the entire manufacturing process is connected to the server 40 via the LAN 30, for example, and the management computer 50 manages the entire manufacturing process in the management database 41 via the server 40. Write the necessary data above. For example, the management database 41 stores the lot number, quantity, etc. of the main components to be mounted before the start of manufacturing. The manufacturing operator stores the serial number of the currently manufactured product in the server 40, and when the inspection information from the inspection PC 10 is transmitted, the serial number and the inspection information are linked. Store in the management database 41.

  FIG. 2 is a diagram showing an example of data in the management database 41, which is configured to store the serial number of the board 20 to be inspected and the inspection result of the electronic device mounted on the board.

FIG. 3 is a flowchart showing a processing process when the substrate 20 is inspected by the inspection PC 10.
First, when the serial number of the substrate 20 is input to the inspection PC 10 by the operation of the manufacturing operator or automatically (S1), the inspection PC 10 activates the substrate 20 in the manufacturing process mode (inspection mode) (S2). Here, the substrate 20 (CPU 21) is activated in the manufacturing process mode (or the port check of the control device) so that the activation time of the product (substrate) does not become long. The CPU 21 of the substrate 20 is activated when receiving the activation signal for the manufacturing process mode via the input / output port 25, and starts arithmetic processing according to a preset inspection program. Here, the inspection PC 10 sets n = 1 as a count for specifying the electronic devices 22 to 24 (S3), and the CPU 21 inspects the electronic device 1 (22) corresponding to the count n (= 1). (S4). In this inspection, for example, a command used in the electronic device 1 (22) is supplied to check whether the device is operating normally. The CPU 21 transmits this inspection information via the input / output port 25, and the inspection PC 10 collects the inspection information (S5), and further transmits it to the server 40 for storage in the management database 41 (S6). If there is no abnormality in the inspection result, the inspection PC 10 determines whether or not all the electronic devices on the board 20 with the serial number are inspected (S8). The count for specifying the electronic device 2 (23) to be inspected is incremented (n = n + 1) (S9), and the above processes (S4) to (S8) are repeated.

  When the CPU 21 determines that there is an abnormality in the above processing, it displays it on the display device 26. For example, the display device 26 displays the device address and device subaddress of the function in error. Thereby, for example, the manufacturing operator of the manufacturing line can grasp which electronic devices 22 to 24 are abnormal. Further, when the inspection result is abnormal in the inspection PC 10, a message to that effect is displayed (S10). When the manufacturing operator grasps that the inspection result is abnormal, the manufacturing operator operates the inspection PC 10 to search the management database 41 and analyzes the inspection result of the corresponding electronic device. Is determined and corrected (S11). Then, the operator operates the inspection PC 10 and sends the repair information to the management database 41. As a result, the management database 41 stores the inspection results and the corresponding repair contents for each electronic device. For example, as shown in FIG. 2, the inspection information is stored in such a manner that “write NG at address xxx” for the electronic device 1 (23) and “read NG at address xxx” for the electronic device 2 (23). To go. In addition, the contents of repair (not shown) are stored in the same manner as the processing performed to correct the abnormality. When the repair of the electronic device determined to be abnormal is completed, the inspection of the electronic device is performed again (S4 to S8).

  As described above, in the first embodiment, since the inspection is performed in units of electronic devices in the manufacturing stage and the contents of the abnormality are grasped, when there is an abnormality in the electronic device, it can be appropriately and quickly performed. As a result, the time required to complete the product can be shortened. In particular, when the present embodiment is applied to the fact that the electronic device is found to be abnormal only after the lamp is turned on, such as a projector or a rear projector, the effect is remarkable when the embodiment is applied. . In addition, when the present embodiment is applied to an electronic device such as a projector, a rear projector, or the like that has no interdependence between electronic devices and functions by arranging the electronic devices in series, the effect is There is something prominent.

 Further, since the inspection result of the electronic device and the corresponding repair contents are accumulated in the manufacturing process in the management database 41, the lot number of the product or part code currently flowing in the manufacturing lot and the above inspection information are used. Thus, it is possible to manage the delivered part quality and the board manufacturing quality, and to trace the part or the board when a failure occurs.

  In the first embodiment, the example in which the display device 26 such as the LED is mounted on the substrate 20 has been described. However, in the present invention, the mounting of the display device 26 may be omitted.

1 is a system configuration diagram of a substrate abnormality detection device and related devices according to Embodiment 1 of the present invention. The figure which showed an example of the data of a management database. The flowchart which showed the process at the time of test | inspecting a board | substrate.

Explanation of symbols

20 substrates, 22-24 electronic devices, 25 input / output ports, 26 display devices, 40 servers, 41 management databases, 50 management computers.

Claims (4)

An information processing apparatus for inspection that activates an electronic substrate including at least an electronic device including a semiconductor circuit and a CPU and collects inspection information from the CPU as to whether or not the electronic substrate is normally driven;
A substrate abnormality detection system comprising: a management database in which inspection information collected by the information processing apparatus for inspection is stored in association with the electronic substrate and the electronic device.   The inspection information processing apparatus causes the CPU to drive the electronic device with a command used in the electronic device, and collects inspection information from the CPU as to whether the drive is normally performed. The substrate abnormality detection system according to claim 1, wherein:   3. The board abnormality according to claim 1, wherein repair information of the electronic device is stored in the management database when the electronic device determined not to be normally driven is repaired. Detection system. The management database stores at least the product number and the electronic board number included in the product in association with each other, and stores inspection information and repair information when the electronic board is repaired as information on each electronic board. The substrate abnormality detection system according to claim 3.

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