JP2005228769A - Molding method and molding apparatus - Google Patents

Molding method and molding apparatus Download PDF

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JP2005228769A
JP2005228769A JP2004033020A JP2004033020A JP2005228769A JP 2005228769 A JP2005228769 A JP 2005228769A JP 2004033020 A JP2004033020 A JP 2004033020A JP 2004033020 A JP2004033020 A JP 2004033020A JP 2005228769 A JP2005228769 A JP 2005228769A
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mold
runner
load
insulating substrate
gate
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JP4153881B2 (en
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Akiji Shibata
明司 柴田
Kanehiro Nogawa
兼弘 野川
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Hitachi Cable Ltd
MTEX Matsumura Corp
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Hitachi Cable Ltd
MTEX Matsumura Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To prevent a scuff mark or the remain of a bending mark on a wiring board when a gate, a runner, and a cull sections are removed, after a semiconductor chip mounted on a film-like wiring board is sealed by a transfer mold. <P>SOLUTION: Before the semiconductor chip is sealed, an opening 2C, penetrated at the rear face from a plane on which the semiconductor chip is mounted, is formed on the region overlapped with the runner of an insulating board 2. After sealing with resin, a load is applied to a mold 7A from the component side of the insulating board, a load is applied to the runner 7C filled in the opening 2C from the rear surface of the insulating board, an angle formed between the region overlapped with the mold 7A of the insulating board and the region overlapped with the gate 7B; and the runner 7C is set to a predetermined angle, and the gate 7B and the runner 7C are released from the insulating board 2. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

本発明は、モールド方法及びモールド装置に関し、特に、トランスファモールドによりフィルム状の配線板に実装した半導体チップをモールドする方法に適用して有効な技術に関するものである。   The present invention relates to a molding method and a molding apparatus, and more particularly to a technique effective when applied to a method of molding a semiconductor chip mounted on a film-like wiring board by transfer molding.

従来、リードフレームや絶縁基板に導体パターンを形成した配線板上に半導体チップが実装された半導体装置には、前記半導体チップの周囲が絶縁性の樹脂材料(モールド材料)でモールドされた半導体装置(以下、樹脂封止型半導体装置という)がある。前記樹脂封止型半導体装置は、前記モールド材料で前記半導体チップを封止することで、前記半導体チップや、前記配線板の導体パターンと前記半導体チップの接続部の保護をしている。   Conventionally, in a semiconductor device in which a semiconductor chip is mounted on a wiring board in which a conductor pattern is formed on a lead frame or an insulating substrate, a semiconductor device in which the periphery of the semiconductor chip is molded with an insulating resin material (mold material) ( Hereinafter, it is referred to as a resin-encapsulated semiconductor device. In the resin-encapsulated semiconductor device, the semiconductor chip is sealed with the molding material, thereby protecting the semiconductor chip and the connection part between the conductor pattern of the wiring board and the semiconductor chip.

また、前記モールド材料で半導体チップを封止するときには、一般に、成形金型を用いたトランスファモールドで封止している。前記トランスファモールドでは、前記半導体チップが実装されたリードフレームや配線板を前記成形金型で挟み、例えば、プランジャを用いて溶融したモールド材料(絶縁樹脂)を、前記成形金型のカルからランナ,ランナからゲート,ゲートからキャビティへと加圧移動させ、前記キャビティ内にある半導体チップを封止する。そのため、前記半導体チップを封止した後、前記配線板には、前記成形金型のゲート,ランナ,及びカルの内部で硬化したモールド材料(以下、ゲート部,ランナ部,及びカル部という)が残っている。そこで、前記トランスファモールドで封止する装置には、一般に、封止後に、前記ゲート部,ランナ部,カル部を除去する除去手段が備わっている。なお、前記カルは、樹脂注入の際にランナに充填されずにプランジャの下面において樹脂が残存する成形金型の領域であり、前記ランナは、前記成形金型でキャビティに溶融材料を流し込む経路のうち前記カルからゲートまでの領域であり、前記ゲートは、前記成形金型において溶融樹脂がキャビティに注入される注入口であって、ランナからキャビティまでの所定領域からなる経路である。   Further, when the semiconductor chip is sealed with the molding material, it is generally sealed with a transfer mold using a molding die. In the transfer mold, a lead frame or a wiring board on which the semiconductor chip is mounted is sandwiched between the molding dies, for example, a mold material (insulating resin) melted using a plunger is moved from the molding die to a runner, The semiconductor chip in the cavity is sealed by pressurizing and moving from the runner to the gate and from the gate to the cavity. Therefore, after the semiconductor chip is sealed, the wiring board has a molding material (hereinafter referred to as a gate portion, a runner portion, and a cull portion) cured inside the gate, runner, and cull of the molding die. Remaining. Therefore, an apparatus for sealing with the transfer mold is generally provided with a removing means for removing the gate portion, the runner portion, and the cull portion after sealing. The cull is an area of the molding die where the resin remains on the lower surface of the plunger without being filled into the runner at the time of resin injection, and the runner is a path of the molten material flowing into the cavity by the molding die. Of these, it is a region from the cull to the gate, and the gate is an injection port through which molten resin is injected into the cavity in the molding die, and is a path including a predetermined region from the runner to the cavity.

前記半導体チップがリードフレーム上に実装されている場合、前記除去手段は、例えば、前記リードフレームを叩くなどの衝撃を与えて前記ゲート部,ランナ部,及びカル部を落とすような手段が用いられる。しかしながら、このような方法は、前記リードフレームのように、剛性が高い場合にのみ有効であり、インターポーザのようなフィルム状の絶縁基板に導体パターンを形成した配線板に実装された半導体チップを封止した場合には適用できない。   When the semiconductor chip is mounted on a lead frame, the removing means is a means that drops the gate portion, the runner portion, and the cull portion by applying an impact such as hitting the lead frame. . However, such a method is effective only when the rigidity is high as in the case of the lead frame, and a semiconductor chip mounted on a wiring board having a conductor pattern formed on a film-like insulating substrate such as an interposer is sealed. It cannot be applied if stopped.

前記半導体チップが、前記フィルム状の絶縁基板に導体パターンを形成した配線板に実装されている場合は、例えば、前記配線板を固定した状態で前記カル部及びランナ部を回動し、前記ランナ部及びゲート部を前記絶縁基板から引きはがすようにして除去する方法がある。また、その逆で、前記カル部を固定した状態で、前記配線板を回動し、前記ランナ部及びゲート部を前記絶縁基板から引きはがすようにして除去する方法もある。また、その他にも、例えば、前記絶縁基板の前記半導体チップが実装された面(以下、第1主面という)の裏面(以下、第2主面)からローラを押し当てて前記絶縁基板を折り曲げて前記ランナ部及びゲート部を除去する方法がある(例えば、特許文献1を参照。)。
特許第3339712号公報
When the semiconductor chip is mounted on a wiring board in which a conductor pattern is formed on the film-like insulating substrate, for example, the cull part and the runner part are rotated with the wiring board fixed, and the runner There is a method in which the part and the gate part are removed by peeling off from the insulating substrate. On the contrary, there is also a method of removing the runner part and the gate part from the insulating substrate by rotating the wiring board with the cull part fixed. In addition, for example, the insulating substrate is bent by pressing a roller from the back surface (hereinafter referred to as the second main surface) of the surface (hereinafter referred to as the first main surface) of the insulating substrate on which the semiconductor chip is mounted. There is a method of removing the runner part and the gate part (see, for example, Patent Document 1).
Japanese Patent No. 3333912

しかしながら、従来の技術のうち、前記半導体チップが前記フィルム状の絶縁基板に導体パターンを形成した配線板に実装されている場合に、前記ゲート部,ランナ部,及びカル部を除去する方法では、ツールやローラを、前記絶縁基板に直接接触させて折り曲げている。そのため、前記絶縁基板に擦り傷がつきやすいという問題がある。   However, among the conventional techniques, when the semiconductor chip is mounted on a wiring board in which a conductor pattern is formed on the film-like insulating substrate, the method of removing the gate part, the runner part, and the cull part, A tool or roller is bent in direct contact with the insulating substrate. Therefore, there is a problem that the insulating substrate is easily scratched.

また、前記従来の方法では、前記絶縁基板を折り曲げたときに、折り曲げ角度が大きく、前記絶縁基板の塑性限界角度より大きな曲げが加わることがある。そのため、前記絶縁基板に折り曲げ跡が残り、その後の搬送作業に支障をきたすという問題がある。   Further, in the conventional method, when the insulating substrate is bent, the bending angle may be large and bending larger than the plastic limit angle of the insulating substrate may be applied. For this reason, there is a problem that the trace of bending remains on the insulating substrate, which hinders the subsequent transfer operation.

本発明の目的は、フィルム状の配線板に実装した半導体チップをトランスファモールドで封止した後、前記ゲート部,ランナ部,及びカル部を除去するときに、前記配線板(絶縁基板)に擦り傷がついたり、折り曲げ跡が残ったりするのを防ぐことが可能な技術を提供することにある。   An object of the present invention is to scratch the wiring board (insulating substrate) when a semiconductor chip mounted on a film-like wiring board is sealed with a transfer mold and then the gate part, runner part, and cull part are removed. It is an object of the present invention to provide a technique capable of preventing a mark or a folding mark from remaining.

本発明の前記ならびにその他の目的と新規な特徴は、本明細書の記述及び添付図面によって明らかになるであろう。   The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

本願において開示される発明の概略を説明すれば、以下の通りである。   The outline of the invention disclosed in the present application will be described as follows.

(1) フィルム状の絶縁基板に導体パターンを形成した配線板上に実装された半導体チップを、成形金型を用いたトランスファモールドで封止した後、前記成形金型のゲート,ランナ,及びカルの内部で硬化したモールド材料(以下、それぞれゲート部,ランナ部,及びカル部という)を、前記半導体チップを封止するモールド材料(以下、モールド部という)から分離して除去するモールド方法であって、前記半導体チップを封止する前に、前記絶縁基板の前記ランナ部と重なる領域に、前記半導体チップを実装した面(以下、第1主面という)からその裏面(以下、第2主面という)に貫通する開口部を形成しておき、前記半導体チップを封止した後、前記絶縁基板の第1主面側から前記モールド部に荷重をかけるとともに、前記絶縁基板の第2主面側から、前記開口部に充填された前記ランナ部に荷重をかけて、前記絶縁基板の前記モールド部と重なる領域と、前記ゲート部及びランナ部と重なる領域とのなす角を、あらかじめ定められた角度にして前記ゲート部及び前記ランナ部を前記絶縁基板から剥がすモールド方法である。   (1) After a semiconductor chip mounted on a wiring board having a conductor pattern formed on a film-like insulating substrate is sealed with a transfer mold using a molding die, the gate, runner, and calf of the molding die A molding method in which a mold material hardened inside (hereinafter referred to as a gate portion, a runner portion, and a cull portion, respectively) is separated from a mold material (hereinafter referred to as a mold portion) for sealing the semiconductor chip and removed. Before sealing the semiconductor chip, the surface (hereinafter referred to as the first main surface) on which the semiconductor chip is mounted in the region overlapping the runner portion of the insulating substrate to the back surface (hereinafter referred to as the second main surface). And after the semiconductor chip is sealed, a load is applied to the mold portion from the first main surface side of the insulating substrate, and the insulation An angle formed between a region overlapping the mold portion of the insulating substrate and a region overlapping the gate portion and the runner portion by applying a load to the runner portion filled in the opening from the second main surface side of the plate Is a molding method in which the gate portion and the runner portion are peeled off from the insulating substrate at a predetermined angle.

(2) フィルム状の絶縁基板に導体パターンを形成した配線板上に実装された半導体チップを成形金型を用いたトランスファモールドで封止する封止手段と、前記封止手段で封止した後、前記成形金型のゲート,ランナ,及びカルの内部で硬化したモールド材料(以下、それぞれゲート部,ランナ部,及びカル部という)を、前記半導体チップを封止するモールド材料(以下、モールド部という)から分離して除去する除去手段とを備えるモールド装置であって、前記除去手段は、前記絶縁基板の半導体チップを実装した面(以下、第1主面という)から前記モールド部に荷重をかけるモールド部荷重部材と、前記絶縁基板の前記第1主面の裏面(以下、第2主面という)から前記ランナ部に荷重をかけるランナ部荷重部材と、前記カル部を把持する把持機構とを備え、前記封止手段で前記半導体チップを封止する前に、前記絶縁基板の前記ランナ部と重なる領域に、前記第1主面から第2主面に貫通する開口部を形成しておき、前記ランナ部荷重手段は、前記絶縁基板の開口部に充填されたランナ部に荷重をかけて、前記絶縁基板の前記モールド部と重なる領域と、前記ゲート部及びランナ部と重なる領域とのなす角を、あらかじめ定められた角度にして前記ゲート部及び前記ランナ部を前記絶縁基板から剥がすモールド装置である。   (2) After sealing with a sealing means for sealing a semiconductor chip mounted on a wiring board having a conductor pattern formed on a film-like insulating substrate with a transfer mold using a molding die The molding material cured inside the gate, the runner, and the cull of the molding die (hereinafter referred to as the gate portion, the runner portion, and the cull portion, respectively) is used as the molding material that seals the semiconductor chip (hereinafter, the mold portion). And removing means for separating and removing the load from the surface on which the semiconductor chip of the insulating substrate is mounted (hereinafter referred to as the first main surface). A mold part load member to be applied, a runner part load member for applying a load to the runner part from the back surface of the first main surface (hereinafter referred to as second main surface) of the insulating substrate, and the cull part. An opening penetrating from the first main surface to the second main surface in a region overlapping with the runner portion of the insulating substrate before the semiconductor chip is sealed by the sealing means. The runner portion loading means applies a load to the runner portion filled in the opening of the insulating substrate, overlaps the mold portion of the insulating substrate, and the gate portion and the runner portion. In the molding apparatus, the gate portion and the runner portion are peeled off from the insulating substrate by setting an angle formed with the overlapping region to a predetermined angle.

本発明のモールド方法は、前記(1)の手段のように、前記絶縁基板の第1主面側から前記モールド部に荷重をかけるとともに、前記絶縁基板の第2主面側から、前記開口部に充填された前記ランナ部に荷重をかけて、前記ゲート部及び前記ランナ部を前記絶縁基板から剥がす。このとき、前記絶縁基板の第1主面側からかかる荷重と前記第2主面側からかかる荷重は、向きが反対であり、かつ、前記絶縁基板上の異なる位置にかかる。そのため、前記絶縁基板のモールド部と重なる部分が前記ゲート部及びランナ部と重なる部分に対して傾き、前記モールド部とゲート部の境界に応力が集中しクラックが生じる。その後、荷重を続ければ、前記絶縁基板にかかる荷重の向きと前記ランナ部及びゲート部にかかる荷重の向きが反対方向なので、前記ランナ部及びゲート部が前記絶縁基板から剥がれる。このとき、荷重は、前記モールド部及び前記絶縁基板の開口部に充填されたランナ部にかかるので、前記絶縁基板に擦り傷がつくのを防げる。また、前記絶縁基板のモールド部と重なる部分の前記ゲート部及びランナ部と重なる部分に対する傾きは、前記モールド部とゲート部の境界にクラックが生じればよいので、数度程度傾けばよい。そのため、前記絶縁基板に折り曲げ跡が残ることも防げる。   The molding method of the present invention applies a load to the mold part from the first main surface side of the insulating substrate as in the means of (1), and the opening portion from the second main surface side of the insulating substrate. A load is applied to the runner portion filled in the substrate, and the gate portion and the runner portion are peeled off from the insulating substrate. At this time, the load applied from the first main surface side of the insulating substrate and the load applied from the second main surface side have opposite directions and are applied to different positions on the insulating substrate. Therefore, the portion of the insulating substrate that overlaps with the mold portion is inclined with respect to the portion of the gate portion and the runner portion that overlaps, and stress concentrates on the boundary between the mold portion and the gate portion to cause cracks. Thereafter, if the load is continued, the direction of the load applied to the insulating substrate and the direction of the load applied to the runner portion and the gate portion are opposite directions, so the runner portion and the gate portion are peeled off from the insulating substrate. At this time, the load is applied to the runner part filled in the mold part and the opening part of the insulating substrate, so that the insulating substrate can be prevented from being scratched. Further, the inclination of the portion of the insulating substrate that overlaps the mold portion with respect to the portion that overlaps the gate portion and the runner portion may be inclined by several degrees because a crack may be generated at the boundary between the mold portion and the gate portion. For this reason, it is possible to prevent bending marks from remaining on the insulating substrate.

また、前記(1)の手段のような方法で前記ゲート部及びランナ部を絶縁基板から剥がすときには、モールド装置に、例えば、前記(2)の手段のような除去手段を設ければよい。このとき、前記モールド部荷重部材の、前記ゲート部により前記ランナ部と連続しているモールド部に荷重をかける荷重面が、前記モールド部をあらかじめ定められた角度にする傾斜部または段差を備えていれば、前記絶縁基板のモールド部と重なる部分と前記ゲート部及びランナ部と重なる部分とのなす角を容易に制御でき、前記絶縁基板に折り曲げ跡が残ったり、絶縁基板が切れたりすることを防げる。   Further, when the gate part and the runner part are peeled off from the insulating substrate by the method (1), a removing means such as the means (2) may be provided in the molding apparatus. At this time, a load surface that applies a load to the mold part that is continuous with the runner part by the gate part of the mold part load member includes an inclined part or a step that makes the mold part have a predetermined angle. Then, the angle formed by the portion of the insulating substrate that overlaps the mold portion and the portion of the gate portion and the runner portion can be easily controlled, and the bending trace remains on the insulating substrate or the insulating substrate is cut off. I can prevent it.

以下、本発明について、図面を参照して実施の形態(実施例)とともに詳細に説明する。
なお、実施例を説明するための全図において、同一機能を有するものは、同一符号を付け、その繰り返しの説明は省略する。
Hereinafter, the present invention will be described in detail together with embodiments (examples) with reference to the drawings.
In all the drawings for explaining the embodiments, parts having the same function are given the same reference numerals and their repeated explanation is omitted.

本発明のモールド方法では、フィルム状の配線板に実装した半導体チップをトランスファモールドで封止するときに、前記配線板(絶縁基板)のランナと重なる位置に開口部を形成しておき、前記封止する半導体チップが実装された面(第1主面)の裏面(第2主面)にモールド材料のランナ部を露出させておく。そして、前記半導体チップを封止した後、前記モールド材料の半導体チップを封止している部分(モールド部)と前記ランナ部に、向きが反対の荷重をかけることで、荷重をかけるツール(荷重手段)を前記絶縁基板に接触させることなく、前記モールド材料の不要な部分を除去する。   In the molding method of the present invention, when a semiconductor chip mounted on a film-like wiring board is sealed with a transfer mold, an opening is formed at a position overlapping the runner of the wiring board (insulating substrate), and the sealing is performed. The runner portion of the mold material is exposed on the back surface (second main surface) of the surface (first main surface) on which the semiconductor chip to be stopped is mounted. Then, after sealing the semiconductor chip, a tool (load) that applies a load by applying an opposite load to the portion of the molding material sealing the semiconductor chip (mold portion) and the runner portion is applied. The unnecessary portion of the molding material is removed without bringing the means into contact with the insulating substrate.

図1乃至図5は、本発明のモールド方法の原理を説明するための模式図であり、図1はモールド装置の概略構成を示す図、図2(a)はモールド手段でモールドした直後の配線板の状態を示す平面図、図2(b)は図2(a)の下面図、図2(c)は図2(a)のA−A’線での断面図、図3(a),図3(b),図4(a),及び図4(b)はゲート部及びランナ部を絶縁基板から剥がす動作を説明するための図、図5は変形例を示す図である。
図1において、1A,1Bはリール、2は配線板、3はローダー部、4はモールド部、4Aはモールド手段、4Bは不要樹脂除去手段、401,402は成形金型、403はモールド部荷重部材、404はランナ部荷重部材、405は不要樹脂回収手段、406は張力調節ローラ、5はアンローダー部である。また、図2(a),図2(b),及び図2(c)において、2Aは配線板の第1主面、2Bは配線板の第2主面、2Cは配線板の開口部、6は半導体チップ、7Aはモールド部、7Bはゲート部、7Cはランナ部、7Dはカル部である。また、図3(a),図3(b),図4(a),及び図4(b)において、403A,403B,403Cは荷重面である、404Aは荷重ピン、404Bは荷重ピン固定プレートである。
1 to 5 are schematic diagrams for explaining the principle of the molding method of the present invention. FIG. 1 is a diagram showing a schematic configuration of a molding apparatus, and FIG. 2A is a wiring immediately after molding by a molding means. FIG. 2 (b) is a bottom view of FIG. 2 (a), FIG. 2 (c) is a cross-sectional view taken along the line AA 'of FIG. 2 (a), and FIG. 3 (a). 3 (b), 4 (a), and 4 (b) are diagrams for explaining the operation of peeling the gate portion and the runner portion from the insulating substrate, and FIG. 5 is a diagram showing a modification.
In FIG. 1, 1A and 1B are reels, 2 is a wiring board, 3 is a loader section, 4 is a mold section, 4A is a molding means, 4B is an unnecessary resin removing means, 401 and 402 are molding dies, and 403 is a mold section load. A member, 404 is a runner load member, 405 is an unnecessary resin recovery means, 406 is a tension adjusting roller, and 5 is an unloader. 2A, 2B, and 2C, 2A is the first main surface of the wiring board, 2B is the second main surface of the wiring board, 2C is the opening of the wiring board, 6 is a semiconductor chip, 7A is a mold part, 7B is a gate part, 7C is a runner part, and 7D is a cull part. 3A, 3B, 4A, and 4B, 403A, 403B, and 403C are load surfaces, 404A is a load pin, and 404B is a load pin fixing plate. It is.

本発明のモールド方法は、フィルム状の配線板に実装された半導体チップを、成形金型を用いたトランスファモールドで封止する方法である。このとき、封止に用いるモールド装置は、例えば、図1に示すように、リール1Aに巻き取られている、前記半導体チップが実装されたフィルム状の配線板2を引き出すローダー部3と、前記引き出された配線板2の半導体チップをモールド材料で封止する封止手段(モールド手段)4A及び封止後にモールド材料(樹脂)の不要な部分を除去する不要樹脂除去手段4Bを備えるモールド部4と、前記モールド部4で半導体チップを封止した配線板2をリールに巻き取るアンローダー部5からなる。   The molding method of the present invention is a method of sealing a semiconductor chip mounted on a film-like wiring board with a transfer mold using a molding die. At this time, for example, as shown in FIG. 1, the molding apparatus used for sealing includes a loader unit 3 that pulls out the film-like wiring board 2 on which the semiconductor chip is mounted, which is wound around a reel 1 </ b> A, Mold part 4 having sealing means (molding means) 4A for sealing the semiconductor chip of the drawn wiring board 2 with a molding material and unnecessary resin removing means 4B for removing unnecessary portions of the molding material (resin) after sealing. And an unloader portion 5 for winding the wiring board 2 in which the semiconductor chip is sealed by the mold portion 4 around a reel.

また、前記モールド手段4Aは、トランスファモールドで前記半導体チップを封止する手段であり一組の成形金型401,402を備える。また、前記不要樹脂除去手段4Bは、前記成形金型401,402のゲート,ランナ,及びカルで硬化したモールド材料(以下、ゲート部,ランナ部,及びカル部という)を前記配線板2から除去する手段であり、前記半導体チップを封止しているモールド材料(以下、モールド部という)に荷重をかけるモールド部荷重部材403と、前記ランナ部に荷重をかけるランナ部荷重手段404と、除去したゲート部,ランナ部,及びカル部を回収する不要樹脂回収手段405を備える。また、前記モールド部4は、前記各手段に加え、搬送する前記配線板(絶縁基板)にかかる張力を調節する張力調節ローラ406を備える。   The molding means 4A is means for sealing the semiconductor chip by transfer molding, and includes a pair of molding dies 401 and 402. Further, the unnecessary resin removing means 4B removes from the wiring board 2 the molding material hardened by the gate, runner and cull of the molding dies 401 and 402 (hereinafter referred to as the gate portion, runner portion and cull portion). A mold part load member 403 for applying a load to a mold material (hereinafter referred to as a mold part) sealing the semiconductor chip, and a runner part load means 404 for applying a load to the runner part. An unnecessary resin collecting means 405 for collecting the gate portion, the runner portion, and the cull portion is provided. The mold unit 4 includes a tension adjusting roller 406 that adjusts the tension applied to the wiring board (insulating substrate) to be conveyed, in addition to the above means.

図1に示したようなモールド装置を用いて、前記配線板に実装された半導体チップを封止するときには、まず、前記ローダー部3で、前記リール1Aに巻き取られている前記半導体チップが実装された配線板2を引き出し、前記モールド部4に搬送する。このとき、前記配線板は、エンボステープを重ね合わせてリール1Aに巻き取られているので、前記ローダー部3では、前記配線板2を引き出して搬送する一方で、前記エンボステープを別のリールに巻き取り、回収する。   When the semiconductor chip mounted on the wiring board is sealed using the molding apparatus as shown in FIG. 1, first, the semiconductor chip wound around the reel 1A is mounted by the loader unit 3. The formed wiring board 2 is pulled out and conveyed to the mold part 4. At this time, since the wiring board is wound around the reel 1A with the embossed tape overlapped, the loader unit 3 pulls out and conveys the wiring board 2, while the embossed tape is put on another reel. Wind up and collect.

前記リール1Aから引き出されて前記モールド部4に搬送された配線板2は、前記モールド手段4Aにおいて、前記配線板2に実装された半導体チップがモールド材料で封止される。このとき、前記モールド手段4は、トランスファモールドで前記半導体チップを封止し、まず、前記半導体チップが実装された配線板2を前記成形金型401,402で挟み、固定する。そして、加熱して溶融させたモールド材料(絶縁樹脂)を、図示しないプランジャにより前記成形金型401,402のカルからランナ,ランナからゲート,ゲートからキャビティへと流し込み、前記キャビティ内にある半導体チップを封止する。   In the wiring board 2 pulled out from the reel 1A and transported to the mold section 4, the semiconductor chip mounted on the wiring board 2 is sealed with a molding material in the molding means 4A. At this time, the molding means 4 seals the semiconductor chip by transfer molding, and first, the wiring board 2 on which the semiconductor chip is mounted is sandwiched between the molding dies 401 and 402 and fixed. Then, the mold material (insulating resin) heated and melted is poured from the cull of the molding dies 401 and 402 to the runner, from the runner to the gate, and from the gate to the cavity by a plunger (not shown), and the semiconductor chip in the cavity. Is sealed.

また、前記成形金型401,402を用いたトランスファモールドの場合、前記成形金型401,402から取り出した配線板2、すなわち、前記半導体チップを封止した直後の前記配線板2には、例えば、図2(a)及び図2(b)に示すように、半導体チップ6の周囲を封止するモールド部7Aの他に、前記成形金型401,402のゲート,ランナ,及びカルの内部で硬化したゲート部7B,ランナ部7C,及びカル部7Dが残っている。特に、前記カル部7Dは、前記配線板2の外部にあるので、そのままではリールに巻き取れない。そこで、前記成形金型401,402から取り出した後、前記不要樹脂除去手段4Bにおいて、前記ゲート部7B,ランナ部7C,及びカル部7Dの不要な樹脂を除去する。   Further, in the case of transfer molding using the molding dies 401 and 402, the wiring board 2 taken out from the molding dies 401 and 402, that is, the wiring board 2 immediately after sealing the semiconductor chip, As shown in FIGS. 2A and 2B, in addition to the mold portion 7A for sealing the periphery of the semiconductor chip 6, the gates, runners, and culls of the molding dies 401 and 402 are used. The hardened gate portion 7B, runner portion 7C, and cull portion 7D remain. In particular, since the cull portion 7D is outside the wiring board 2, it cannot be wound around the reel as it is. Therefore, after taking out from the molding dies 401 and 402, the unnecessary resin removing means 4B removes unnecessary resin from the gate portion 7B, the runner portion 7C, and the cull portion 7D.

また、本発明のモールド方法では、前記不要樹脂除去手段4Bを用いて前記ゲート部7B,ランナ部7C,及びカル部7Dの不要な樹脂を除去するにあたって、前記配線板2には、図2(a),図2(b),及び図2(c)に示すように、前記半導体チップ6が実装された面(以下、第1主面という)2Aからその裏面(以下、第2主面という)2Bに貫通した開口部2Cを形成しておく。このとき、前記配線板2に前記開口部2Cが形成されていると、前記モールド手段4Aで半導体チップ6を封止したときに、図2(c)に示すように、前記ランナ部7Cが前記開口部2Cにも存在し、前記配線板2の第2主面2Bから露出した状態になっている。   Further, in the molding method of the present invention, when the unnecessary resin is removed from the gate portion 7B, the runner portion 7C, and the cull portion 7D using the unnecessary resin removing means 4B, the wiring board 2 has the structure shown in FIG. As shown in FIG. 2A, FIG. 2B, and FIG. 2C, the surface (hereinafter referred to as the first main surface) 2A on which the semiconductor chip 6 is mounted to the back surface (hereinafter referred to as the second main surface). ) An opening 2C penetrating 2B is formed. At this time, if the opening 2C is formed in the wiring board 2, when the semiconductor chip 6 is sealed by the molding means 4A, the runner portion 7C is moved as shown in FIG. It exists also in the opening 2 </ b> C and is exposed from the second main surface 2 </ b> B of the wiring board 2.

本発明のモールド装置における前記不要樹脂除去手段4Bは、例えば、前記配線板2のモールド部7Aに荷重をかけるモールド部荷重部材403と、前記ランナ部7Cに荷重をかけるランナ部荷重部材404からなる。このとき、前記ランナ部荷重部材404は、例えば、図3(a)に示すように、前記配線板2の第2主面2B側にあり、前記配線板2の開口部2Cの内部にあるランナ部7Cと接触して荷重をかけるピン状の部材(以下、突き上げピンという)404Aと、前記突き上げピン404Aを一体的に保持する保持プレート404Bとを備える。   The unnecessary resin removing means 4B in the molding apparatus of the present invention includes, for example, a mold part load member 403 that applies a load to the mold part 7A of the wiring board 2 and a runner part load member 404 that applies a load to the runner part 7C. . At this time, the runner load member 404 is, for example, on the second main surface 2B side of the wiring board 2 and inside the opening 2C of the wiring board 2 as shown in FIG. A pin-shaped member (hereinafter referred to as a push-up pin) 404A that contacts the portion 7C and applies a load, and a holding plate 404B that integrally holds the push-up pin 404A are provided.

また、前記モールド部荷重部材403は、例えば、図3(a)に示すように、前記突き上げピン404Aが接触しているランナ部7Cとゲート7Bを介して連続しているモールド部7A上に、前記配線板2の搬送方向と平行な荷重面403A及びあらかじめ定められた角度に傾斜した荷重面403Bが設けられている。また、例えば、前記ランナ部7Cから見て、前記ゲート7Bの突出方向と反対の方向にあるモールド部7A上には、前記配線板2の搬送方向と平行であり、例えば、前記配線板2の第1主面2A等の基準面からの距離が、前記荷重面403Aよりも離れている荷重面403Cが設けられている。   Further, as shown in FIG. 3A, for example, the mold part load member 403 is formed on the mold part 7A that is continuous with the runner part 7C that is in contact with the push-up pin 404A and the gate 7B. A load surface 403A parallel to the conveyance direction of the wiring board 2 and a load surface 403B inclined at a predetermined angle are provided. Further, for example, when viewed from the runner portion 7C, on the mold portion 7A in the direction opposite to the protruding direction of the gate 7B, it is parallel to the conveyance direction of the wiring board 2, and for example, the wiring board 2 A load surface 403C is provided such that the distance from the reference surface such as the first main surface 2A is greater than the load surface 403A.

以下の説明では、前記荷重面403A,403Bで荷重をかけるモールド部7Aと、前記荷重面403Cで荷重をかけるモールド部7Aを区別するために、前記配線板2の搬送方向を、図3(a)に示したように、紙面左から右の方向とし、前記荷重面403A,403Bで荷重をかけるモールド部7Aを上流側のモールド部7A(1)、前記荷重面403Cで荷重をかけるモールド部7Aを下流側のモールド部7A(2)という。   In the following description, in order to distinguish between the mold portion 7A that applies a load on the load surfaces 403A and 403B and the mold portion 7A that applies a load on the load surface 403C, the conveyance direction of the wiring board 2 is shown in FIG. ), The mold part 7A that applies the load on the load surfaces 403A and 403B is the mold part 7A (1) on the upstream side, and the mold part 7A that applies the load on the load surface 403C. Is referred to as a downstream mold portion 7A (2).

ここで、例えば、前記ランナ部荷重部材404を固定した状態で、前記モールド部荷重部材403により荷重をかけると、前記配線板2のうち、前記突き上げピン404Aと接触しているランナ部7Cの周辺は拘束されるので、前記荷重面403Aから荷重を受けている上流側のモールド部7A(1)は回動し、図3(b)に示すように、前記上流側のモールド部7A(1)は荷重面403Bと接触した状態になる。そして、荷重を続けると、前記下流側のモールド部7A(2)と荷重面403Cも接触する。   Here, for example, when a load is applied by the mold part load member 403 with the runner part load member 404 fixed, the periphery of the runner part 7C in contact with the push-up pin 404A in the wiring board 2 Is restrained, the upstream mold portion 7A (1) receiving the load from the load surface 403A rotates and, as shown in FIG. 3B, the upstream mold portion 7A (1). Is in contact with the load surface 403B. When the load continues, the downstream mold portion 7A (2) and the load surface 403C come into contact with each other.

このとき、前記上流側のモールド部7A(1)は、前記荷重面403Bと接触しており、前記配線板2の搬送方向に対してあらかじめ定められた角度だけ傾斜している。そのため、前記上流側のモールド部7A(1)とゲート部7Bの境界付近で、例えば、図4(a)に示すように、前記配線板2に反りが生じ、モールド部7A(1)とゲート部7Bには、それぞれ逆方向の応力がかかる。その結果、前記モールド部7A(1)とゲート部7Bの境界付近でクラック8が生じる。   At this time, the mold part 7A (1) on the upstream side is in contact with the load surface 403B, and is inclined by a predetermined angle with respect to the transport direction of the wiring board 2. Therefore, in the vicinity of the boundary between the upstream mold part 7A (1) and the gate part 7B, for example, as shown in FIG. 4A, the wiring board 2 is warped, and the mold part 7A (1) and the gate Stresses in opposite directions are applied to the portions 7B. As a result, a crack 8 is generated near the boundary between the mold part 7A (1) and the gate part 7B.

このとき、前記配線板2の搬送方向と前記上流側のモールド部7A(1)と重なる領域のなす角θは、例えば、2度から10度程度であればよく、その程度の折り曲げであれば、前記配線板2(絶縁基板)の弾性限界内であり、塑性変形による折り曲げ跡がつくことを防げる。   At this time, an angle θ formed by a region overlapping the conveyance direction of the wiring board 2 and the upstream mold part 7A (1) may be, for example, about 2 degrees to 10 degrees, and if it is bent to that extent It is within the elastic limit of the wiring board 2 (insulating substrate), and it is possible to prevent the bending trace from being caused by plastic deformation.

その後、前記モールド部荷重部材403による荷重を続けた場合、前記上流側のモールド部7A(1)及び下流側のモールド部7A(2)はそれぞれ、前記配線板2の第1主面2Aから第2主面2Bの方向(紙面下向き)の外力を受ける。一方、固定されている前記突き上げピン404Aと接触しているランナ部7Cは、前記突き上げピン404Aから、前記配線板2の第2主面2Bから第1主面2Aの方向(紙面上向き)の外力を受ける。その結果、図4(b)に示すように、前記ランナ部7C及びゲート部7Bが前記配線板2から剥がれる。そして、図示は省略するが、前記剥がれたランナ部7C及びゲート部7Bを、前記カル部7Dとともに回収(除去)した後、前記モールド部荷重部材403を元の位置に戻すと、前記ゲート部7B,ランナ部7C,及びカル部7Dの除去が完了する。そしてその後は、前記配線板2をあらかじめ定められた距離だけ搬送し、前記動作を繰り返す。   After that, when the load by the mold part load member 403 is continued, the upstream mold part 7A (1) and the downstream mold part 7A (2) are separated from the first main surface 2A of the wiring board 2, respectively. 2 receives an external force in the direction of the main surface 2B (downward on the paper surface). On the other hand, the runner portion 7C that is in contact with the fixed push-up pin 404A has an external force in the direction from the second main surface 2B to the first main surface 2A of the wiring board 2 (upward on the paper surface) from the push-up pin 404A. Receive. As a result, the runner portion 7C and the gate portion 7B are peeled off from the wiring board 2 as shown in FIG. And although illustration is omitted, after recovering (removing) the peeled runner portion 7C and gate portion 7B together with the cull portion 7D, the mold portion load member 403 is returned to the original position, and the gate portion 7B , The removal of the runner portion 7C and the cull portion 7D is completed. Thereafter, the wiring board 2 is transported by a predetermined distance, and the above operation is repeated.

このように、前記モールド部荷重部材403で前記モールド部7Aに荷重をかけるとともに、前記配線板(絶縁基板)の開口部2Cに充填されたランナ部7Cに、前記モールド部7Aとは反対方向の荷重をかけることで、前記各荷重手段403,404Aを前記配線板2(絶縁基板)に接触させることなく、前記ゲート部7B及びランナ部7Cを前記配線板2から剥がすことができる。そのため、前記配線板(絶縁基板)に擦り傷がつくのを防げる。   In this way, the mold part load member 403 applies a load to the mold part 7A, and the runner part 7C filled in the opening 2C of the wiring board (insulating substrate) has a direction opposite to the mold part 7A. By applying a load, the gate portion 7B and the runner portion 7C can be peeled off from the wiring board 2 without bringing the load means 403 and 404A into contact with the wiring board 2 (insulating substrate). Therefore, it is possible to prevent the wiring board (insulating substrate) from being scratched.

そして、前記手順により前記ゲート部7B,ランナ部7C,及びカル部7Dの除去が完了した後は、順次搬送して、前記アンローダー部5において、エンボステープを重ね合わせてリール1Bに巻き取る。   Then, after the removal of the gate portion 7B, the runner portion 7C, and the cull portion 7D is completed by the above procedure, the unloader portion 5 superimposes the embossed tape and winds it on the reel 1B.

また、ここまでの説明では、前記ゲート7Bと連続したモールド部7Aに荷重をかける荷重面は、前記図3(a)に示したように、搬送方向と平行な荷重面403Aと傾斜した荷重面403Bからなっているが、これに限らず、例えば、図5に示すように、前記ゲート部7Bと連続したモールド部7Aの、前記ゲート部7Bから遠い位置で荷重をかける荷重面403Aと、前記ゲート部7Bに近い位置で荷重をかける第2荷重面403Dの独立した2つの荷重面からなり、前記第1荷重面403Aと第2荷重部403Dの間に、前記モールド部7Aをあらかじめ定められた角度に傾斜させるだけの段差dを設けても良い。   In the above description, the load surface for applying a load to the mold part 7A continuous with the gate 7B is, as shown in FIG. 3A, a load surface 403A parallel to the conveying direction and an inclined load surface. Although not limited to this, for example, as shown in FIG. 5, a load surface 403A for applying a load at a position far from the gate portion 7B of the mold portion 7A continuous with the gate portion 7B, It consists of two independent load surfaces, a second load surface 403D that applies a load at a position close to the gate portion 7B, and the mold portion 7A is predetermined between the first load surface 403A and the second load portion 403D. You may provide the level | step difference d which only makes it incline to an angle.

図6乃至図13は、本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、図6は不要樹脂除去手段の全体的な構成を示す図、図7は封止直後の配線板の構成を示す平面図、図8は配線板の支持方法を説明する図、図9乃至図13は不要樹脂を除去する動作を説明するための図である。   6 to 13 are schematic views for explaining a method for removing unnecessary resin in the molding method according to an embodiment of the present invention. FIG. 6 is a diagram showing an overall configuration of unnecessary resin removing means, and FIG. Is a plan view showing the structure of the wiring board immediately after sealing, FIG. 8 is a view for explaining a method of supporting the wiring board, and FIGS. 9 to 13 are views for explaining an operation for removing unnecessary resin.

本実施例のモールド方法における不要樹脂の除去方法は、1回の動作で、4箇所のゲート部7B及びランナ部7Cを剥がして除去する方法であり、前記不要樹脂除去手段は、前記ランナ部荷重部材404の突き上げピン404Aは、図7に示すように、前記配線板2の搬送方向に沿って、4箇所のランナ部7Cと対応する位置に設けられている。   The removal method of the unnecessary resin in the molding method of the present embodiment is a method in which the four gate portions 7B and the runner portion 7C are peeled and removed in one operation, and the unnecessary resin removal means is the runner portion load. As shown in FIG. 7, the push-up pins 404A of the member 404 are provided at positions corresponding to the four runner portions 7C along the conveyance direction of the wiring board 2.

また、前記モールド部荷重部材403は、前記突き上げピン404Aと接触する各ランナ部7Cとゲート部7Bで連続している各モールド部7A上に、図5に示した第1荷重面403A及び第2荷重面403Dと同様の構成の荷重面403A,403Dが設けられている。このとき、各モールド部7A上の第1荷重面403Aと第2荷重面403Dの間には、前記モールド部7Aをあらかじめ定められた角度に傾斜させるだけの段差d1が設けられているとする。また、隣り合うモールド部7A上の第1荷重面403A同士の間には、あらかじめ定められた距離の段差d2が設けられているとする。このとき、前記配線板2の搬送方向は、図6に示したように、紙面左から右の方向とし、前記ゲート部7B及びランナ部7Cを剥がすモールド部7Aは、上流側(紙面左側)から順に、第1モールド部7A(1),第2モールド部7A(2),第3モールド部7A(3),及び第4モールド部7A(4)と呼び、区別する。   Further, the mold part load member 403 is formed on the mold part 7A continuous with the runner part 7C and the gate part 7B in contact with the push-up pin 404A, and the first load surface 403A and the second load surface 403A shown in FIG. Load surfaces 403A and 403D having the same configuration as the load surface 403D are provided. At this time, it is assumed that a step d1 is provided between the first load surface 403A and the second load surface 403D on each mold portion 7A so as to incline the mold portion 7A at a predetermined angle. Further, it is assumed that a step d2 having a predetermined distance is provided between the first load surfaces 403A on the adjacent mold parts 7A. At this time, as shown in FIG. 6, the conveyance direction of the wiring board 2 is the direction from the left to the right of the paper surface, and the mold portion 7A for peeling the gate portion 7B and the runner portion 7C is from the upstream side (the left side of the paper surface) The first mold part 7A (1), the second mold part 7A (2), the third mold part 7A (3), and the fourth mold part 7A (4) are called and distinguished in order.

また、前記モールド部荷重部材403は、前記4組の荷重面403A,403Dに加え、前記第4モールド部7A(4)の下流側(紙面右側)のモールド部に荷重をかける荷重面403Cが設けられている。   In addition to the four sets of load surfaces 403A and 403D, the mold portion load member 403 is provided with a load surface 403C for applying a load to the mold portion on the downstream side (right side of the paper surface) of the fourth mold portion 7A (4). It has been.

また、本実施例の不要樹脂除去手段4Bを用いる場合、前記成形金型401,402で前記配線板2に実装された半導体チップ6を封止したときに、前記カル部7Dが、図7に示すように、前記配線板2の長手方向の端部2D,2Eから、交互に突出するようにする。そして、前記不要樹脂除去手段4Bで前記ゲート部7B,ランナ部7C,及びカル部7Dを除去するときには、図8に示すように、前記配線板の端部2D,2Eから突出したカル部7Dを、把持機構9で挟み、前記配線板2を宙に浮かせた状態で支持しておく。このとき、図7に示したように、前記カル部7Bが前記配線板2の両端部2D,2Eから交互に突出していれば、前記配線板2を水平に保てる。   When the unnecessary resin removing means 4B of this embodiment is used, when the semiconductor chip 6 mounted on the wiring board 2 is sealed with the molding dies 401 and 402, the cull portion 7D is shown in FIG. As shown, the wiring boards 2 protrude alternately from the longitudinal ends 2D and 2E. Then, when the gate portion 7B, the runner portion 7C, and the cull portion 7D are removed by the unnecessary resin removing means 4B, as shown in FIG. 8, the cull portion 7D protruding from the end portions 2D, 2E of the wiring board is removed. The wiring board 2 is supported in a state where it is sandwiched between the gripping mechanisms 9 and suspended in the air. At this time, as shown in FIG. 7, if the cull portion 7B protrudes alternately from both end portions 2D and 2E of the wiring board 2, the wiring board 2 can be kept horizontal.

本実施例の不要樹脂除去手段4Bを用いて、前記ゲート部7B,ランナ部7C,及びカル部7Dを除去するときには、図9に示すように、前記ランナ部荷重部材404を前記配線板2側に移動させて前記突き上げピン404Aを前記配線板2の開口部2Cのランナ部7Cと接触させるとともに、前記モールド部荷重部材403を前記配線板2側に移動させる。このとき、前記モールド部荷重部材403は、例えば、図9に示すように、最も上流側の第1モールド部7A(1)とその上部の荷重面403Aが接触した後、前記第1モールド部7A(1)が搬送方向に対してあらかじめ定められた角度に傾斜し、前記第2モールド部7A(2)とその上部の前記荷重面403Aが接触する。そして、前記第1モールド部7A(1)とゲート部7Bの境界付近にクラックが生じる。   When removing the gate portion 7B, the runner portion 7C, and the cull portion 7D using the unnecessary resin removing means 4B of this embodiment, the runner portion load member 404 is connected to the wiring board 2 side as shown in FIG. The push pin 404A is brought into contact with the runner portion 7C of the opening 2C of the wiring board 2 and the mold portion load member 403 is moved to the wiring board 2 side. At this time, as shown in FIG. 9, for example, the mold part load member 403 is configured such that the most upstream first mold part 7A (1) and the upper load surface 403A come into contact with each other, and then the first mold part 7A. (1) is inclined at a predetermined angle with respect to the conveying direction, and the second mold portion 7A (2) and the load surface 403A on the upper side thereof contact. A crack is generated near the boundary between the first mold part 7A (1) and the gate part 7B.

その後、前記モールド部荷重部材403をさらに前記配線板側に移動させると、図10に示すように、前記第1モールド部7A(1)と連続していたゲート部7B及びランナ部7Cが前記配線板2から剥がれる。そして、今度は、前記第2モールド部7A(2)が前記搬送方向に対してあらかじめ定められた角度に傾斜し、前記第3モールド部7A(3)とその上部の前記荷重面403Aが接触し、前記第2モールド部7A(2)とゲート部7Bの境界付近にクラックが生じる。   Thereafter, when the mold part load member 403 is further moved to the wiring board side, as shown in FIG. 10, the gate part 7B and the runner part 7C which are continuous with the first mold part 7A (1) are connected to the wiring. Peel from the plate 2. Then, this time, the second mold part 7A (2) is inclined at a predetermined angle with respect to the transport direction, and the third mold part 7A (3) and the load surface 403A on the upper side thereof contact each other. A crack is generated near the boundary between the second mold part 7A (2) and the gate part 7B.

その後、繰り返しの説明は省略するが、前記モールド部荷重部材403をさらに前記配線板側に移動させていくと、図11に示すように、前記第4モールド部7A(4)が傾斜し、前記第4モールド部7A(4)の下流側のモールド部7Aとその上部の荷重面403Cが接触する。そして、前記第4モールド部7A(4)とゲート部7Bの境界付近にクラックが生じる。そして、そのまま前記モールド部荷重部材403をさらに前記配線板側に移動させると、図12に示すように、前記第4モールド部7A(4)と連続していたゲート部7B及びランナ部7Cが前記配線板2から剥がれる。   Thereafter, although repeated description is omitted, when the mold part load member 403 is further moved to the wiring board side, as shown in FIG. 11, the fourth mold part 7A (4) is inclined, The mold part 7A on the downstream side of the fourth mold part 7A (4) and the upper load surface 403C come into contact with each other. A crack is generated near the boundary between the fourth mold part 7A (4) and the gate part 7B. Then, when the mold part load member 403 is further moved to the wiring board side as it is, as shown in FIG. 12, the gate part 7B and the runner part 7C which are continuous with the fourth mold part 7A (4) are The wiring board 2 is peeled off.

こうして、前記各モールド部7A(1),7A(2),7A(3),7A(4)と連続していたゲート部7B及びランナ部7Cを前記配線板2から剥がしたら、例えば、前記カル部7Dを把持している把持機構9を移動させて、前記ゲート部7B,ランナ部7C,及びカル部7Dからなる不要な樹脂を、前記不要樹脂回収手段405で回収する。   Thus, when the gate part 7B and the runner part 7C that are continuous with the mold parts 7A (1), 7A (2), 7A (3), and 7A (4) are peeled off from the wiring board 2, for example, The unnecessary resin consisting of the gate portion 7B, the runner portion 7C, and the cull portion 7D is recovered by the unnecessary resin recovery means 405 by moving the gripping mechanism 9 that grips the portion 7D.

前記不要な樹脂を回収したら、図13に示すように、前記モールド部荷重部材403及びランナ部荷重部材404を元の位置に戻し、前記配線板2を、モールド部4個分移動させて、前記動作を繰り返す。こうすれば、1回の動作で、4箇所のゲート部7B及びランナ部7Cを前記配線板2から剥がし、除去することができる。   When the unnecessary resin is recovered, as shown in FIG. 13, the mold part load member 403 and the runner part load member 404 are returned to their original positions, and the wiring board 2 is moved by four mold parts, Repeat the operation. If it carries out like this, four gate parts 7B and runner parts 7C can be peeled from the said wiring board 2 by one operation | movement, and can be removed.

以上説明したように、本実施例の不要樹脂除去手段によれば、前記モールド部荷重部材403及び前記ランナ部荷重部材404を用いることで、前記配線板2(絶縁基板)に触れることなく、前記ゲート部7B,ランナ部7C,及びカル部7Dを除去することができる。そのため、前記配線板2に不要な擦り傷がつくことを防げる。   As described above, according to the unnecessary resin removing means of the present embodiment, the mold part load member 403 and the runner part load member 404 can be used without touching the wiring board 2 (insulating substrate). The gate portion 7B, the runner portion 7C, and the cull portion 7D can be removed. Therefore, unnecessary scratches on the wiring board 2 can be prevented.

また、前記モールド部7Aと前記ランナ部7Cから、それぞれ反対方向の荷重をかけて、前記モールド部7Aを搬送方向に対してあらかじめ定められた角度に傾斜させ、前記モールド部7Aとゲート部7Bの境界付近にクラックを生じさせることで、前記ゲート部7Bの残存を低減することができる。またこのとき、傾斜させる角度は、数度程度でよいので、前記絶縁基板の弾性限界を超えることはなく、塑性変形により前記配線板2に折り曲げ跡がつくことを防げる。   Further, by applying loads in opposite directions from the mold part 7A and the runner part 7C, the mold part 7A is inclined at a predetermined angle with respect to the transport direction, so that the mold part 7A and the gate part 7B By generating cracks in the vicinity of the boundary, the remaining gate portion 7B can be reduced. At this time, the angle of inclination may be about several degrees, so that the elastic limit of the insulating substrate is not exceeded, and the wiring board 2 can be prevented from being bent due to plastic deformation.

また、本実施例の不要樹脂除去手段では、1回の動作で、4箇所のゲート部7B及びランナ部7Cを前記配線板2から剥がし、除去することができる。そのため、除去作業の効率が良くなる。また、本実施例では、1回の動作で、4箇所のゲート部7B及びランナ部7Cを前記配線板2から剥がす例を示したが、これに限らず、さらに多数箇所のゲート部7B及びランナ部7Cを、1回の動作で前記配線板2から剥がし、除去するようにしてもよい。   Further, the unnecessary resin removing means of the present embodiment can remove the four gate portions 7B and the runner portions 7C from the wiring board 2 by one operation. Therefore, the efficiency of the removal work is improved. In the present embodiment, an example in which the four gate portions 7B and the runner portions 7C are peeled off from the wiring board 2 by one operation is shown. However, the present invention is not limited to this, and more gate portions 7B and runners are provided. The part 7C may be removed from the wiring board 2 by a single operation.

以上、本発明を、前記実施例に基づき具体的に説明したが、本発明は、前記実施例に限定されるものではなく、その要旨を逸脱しない範囲において、種々変更可能であることはもちろんである。   The present invention has been specifically described above based on the above-described embodiments. However, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the present invention. is there.

本発明のモールド方法の原理を説明するための模式図であり、モールド装置の概略構成を示す図であるIt is a schematic diagram for demonstrating the principle of the molding method of this invention, and is a figure which shows schematic structure of a molding apparatus. 本発明のモールド方法の原理を説明するための模式図であり、図2(a)はモールド手段でモールドした直後の配線板の状態を示す平面図、図2(b)は図2(a)の下面図、図2(c)は図2(a)のA−A’線での断面図である。2A and 2B are schematic views for explaining the principle of the molding method of the present invention, in which FIG. 2A is a plan view showing a state of a wiring board immediately after being molded by molding means, and FIG. 2B is a plan view of FIG. FIG. 2C is a cross-sectional view taken along the line AA ′ of FIG. 本発明のモールド方法の原理を説明するための模式図であり、図3(a)及び図3(b)はゲート部及びランナ部を絶縁基板から剥がす動作を説明するための図である。FIGS. 3A and 3B are schematic views for explaining the principle of the molding method of the present invention, and FIGS. 3A and 3B are views for explaining the operation of peeling the gate portion and the runner portion from the insulating substrate. 本発明のモールド方法の原理を説明するための模式図であり、図4(a)及び図4(b)はゲート部及びランナ部を絶縁基板から剥がす動作を説明するための図である。FIGS. 4A and 4B are schematic diagrams for explaining the principle of the molding method of the present invention, and FIGS. 4A and 4B are diagrams for explaining the operation of peeling the gate portion and the runner portion from the insulating substrate. 本発明のモールド方法の原理を説明するための模式図であり、モールド部の荷重方法の変形例を示す図である。It is a schematic diagram for demonstrating the principle of the molding method of this invention, and is a figure which shows the modification of the loading method of a mold part. 本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、不要樹脂除去手段の構成を示す図である。It is a schematic diagram for demonstrating the removal method of the unnecessary resin in the molding method of one Example by this invention, and is a figure which shows the structure of an unnecessary resin removal means. 本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、封止直後の配線板の構成を示す平面図である。It is a schematic diagram for demonstrating the removal method of the unnecessary resin in the molding method of one Example by this invention, and is a top view which shows the structure of the wiring board immediately after sealing. 本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、配線板の支持方法を説明する図である。It is a schematic diagram for demonstrating the removal method of the unnecessary resin in the molding method of one Example by this invention, and is a figure explaining the support method of a wiring board. 本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、不要樹脂を除去する動作を説明する図である。It is a schematic diagram for demonstrating the removal method of the unnecessary resin in the molding method of one Example by this invention, and is a figure explaining the operation | movement which removes an unnecessary resin. 本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、不要樹脂を除去する動作を説明する図である。It is a schematic diagram for demonstrating the removal method of the unnecessary resin in the molding method of one Example by this invention, and is a figure explaining the operation | movement which removes an unnecessary resin. 本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、不要樹脂を除去する動作を説明する図である。It is a schematic diagram for demonstrating the removal method of the unnecessary resin in the molding method of one Example by this invention, and is a figure explaining the operation | movement which removes an unnecessary resin. 本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、不要樹脂を除去する動作を説明する図である。It is a schematic diagram for demonstrating the removal method of the unnecessary resin in the molding method of one Example by this invention, and is a figure explaining the operation | movement which removes an unnecessary resin. 本発明による一実施例のモールド方法における不要樹脂の除去方法を説明するための模式図であり、不要樹脂を除去する動作を説明する図である。It is a schematic diagram for demonstrating the removal method of the unnecessary resin in the molding method of one Example by this invention, and is a figure explaining the operation | movement which removes an unnecessary resin.

符号の説明Explanation of symbols

1A,1B…リール
2…配線板
3…ローダー部
4…モールド部
4A…モールド手段
4B…不要樹脂除去手段
401,402…成形金型
403…モールド部荷重部材
404…ランナ部荷重部材
405…不要樹脂回収手段
406…張力調節ローラ
5…アンローダー部
6…半導体チップ
7A…モールド部
7B…ゲート部
7C…ランナ部
7D…カル部
8…クラック
9…把持機構
DESCRIPTION OF SYMBOLS 1A, 1B ... Reel 2 ... Wiring board 3 ... Loader part 4 ... Mold part 4A ... Molding means 4B ... Unnecessary resin removal means 401, 402 ... Molding die 403 ... Mold part load member 404 ... Runner part load member 405 ... Unnecessary resin Collecting means 406 ... tension adjusting roller 5 ... unloader part 6 ... semiconductor chip 7A ... mold part 7B ... gate part 7C ... runner part 7D ... cull part 8 ... crack 9 ... gripping mechanism

Claims (3)

フィルム状の絶縁基板に導体パターンを形成した配線板上に実装された半導体チップを、成形金型を用いたトランスファモールドで封止した後、前記成形金型のゲート,ランナ,及びカルの内部で硬化したモールド材料(以下、それぞれゲート部,ランナ部,及びカル部という)を、前記半導体チップを封止するモールド材料(以下、モールド部という)から分離して除去するモールド方法であって、
前記半導体チップを封止する前に、前記絶縁基板の前記ランナ部と重なる領域に、前記半導体チップを実装した面(以下、第1主面という)からその裏面(以下、第2主面という)に貫通する開口部を形成しておき、
前記半導体チップを封止した後、前記絶縁基板の第1主面側から前記モールド部に荷重をかけるとともに、前記絶縁基板の第2主面側から前記開口部に充填された前記ランナ部に荷重をかけて、
前記絶縁基板の前記モールド部と重なる領域と、前記ゲート部及びランナ部と重なる領域とのなす角を、あらかじめ定められた角度にして前記ゲート部及び前記ランナ部を前記絶縁基板から剥がすことを特徴とするモールド方法。
A semiconductor chip mounted on a wiring board having a conductive pattern formed on a film-like insulating substrate is sealed with a transfer mold using a molding die, and then inside the gate, runner, and cull of the molding die. A mold method for separating and removing a cured mold material (hereinafter referred to as a gate part, a runner part, and a cull part, respectively) from a mold material for sealing the semiconductor chip (hereinafter referred to as a mold part),
Before sealing the semiconductor chip, a surface (hereinafter referred to as a first main surface) on which the semiconductor chip is mounted in a region overlapping the runner portion of the insulating substrate to a back surface (hereinafter referred to as a second main surface). Forming an opening that penetrates the
After sealing the semiconductor chip, a load is applied to the mold portion from the first main surface side of the insulating substrate, and a load is applied to the runner portion filled in the opening from the second main surface side of the insulating substrate. Over
The gate portion and the runner portion are peeled off from the insulating substrate at an angle defined by a region overlapping the mold portion of the insulating substrate and a region overlapping the gate portion and the runner portion. Mold method.
フィルム状の絶縁基板に導体パターンを形成した配線板上に実装された半導体チップを成形金型を用いたトランスファモールドで封止する封止手段と、前記封止手段で封止した後、前記成形金型のゲート,ランナ,及びカルの内部で硬化したモールド材料(以下、それぞれゲート部,ランナ部,及びカル部という)を、前記半導体チップを封止するモールド材料(以下、モールド部という)から分離して除去する除去手段とを備えるモールド装置であって、
前記除去手段は、前記絶縁基板の半導体チップを実装した面(以下、第1主面という)から前記モールド部に荷重をかけるモールド部荷重部材と、前記絶縁基板の前記第1主面の裏面(以下、第2主面という)から前記ランナ部に荷重をかけるランナ部荷重部材と、前記カル部を把持する把持機構とを備え、
前記封止手段で前記半導体チップを封止する前に、前記絶縁基板の前記ランナ部と重なる領域に、前記第1主面から第2主面に貫通する開口部を形成しておき、
前記ランナ部荷重部材は、前記絶縁基板の開口部に充填されたランナ部に荷重をかけて、前記絶縁基板の前記モールド部と重なる領域と、前記ゲート部及びランナ部と重なる領域とのなす角を、あらかじめ定められた角度にして前記ゲート部及び前記ランナ部を前記絶縁基板から剥がすことを特徴とするモールド装置。
A sealing means for sealing a semiconductor chip mounted on a wiring board having a conductor pattern formed on a film-like insulating substrate with a transfer mold using a molding die, and after the sealing means, the molding Mold material hardened inside the mold gate, runner, and cull (hereinafter referred to as gate portion, runner portion, and cull portion, respectively) is molded from the mold material that seals the semiconductor chip (hereinafter referred to as mold portion). A mold apparatus comprising a removing means for separating and removing,
The removing means includes a mold part load member that applies a load to the mold part from a surface of the insulating substrate on which the semiconductor chip is mounted (hereinafter referred to as a first main surface), and a back surface of the first main surface of the insulating substrate ( (Hereinafter, referred to as a second main surface) comprising a runner portion load member for applying a load to the runner portion, and a gripping mechanism for gripping the cull portion,
Before sealing the semiconductor chip with the sealing means, an opening that penetrates from the first main surface to the second main surface is formed in a region overlapping the runner portion of the insulating substrate,
The runner portion load member applies a load to the runner portion filled in the opening of the insulating substrate, and an angle formed between a region overlapping the mold portion of the insulating substrate and a region overlapping the gate portion and the runner portion. Is formed at a predetermined angle to peel off the gate portion and the runner portion from the insulating substrate.
前記モールド部荷重部材の、前記ゲート部により前記ランナ部と連続しているモールド部に荷重をかける荷重面は、前記モールド部をあらかじめ定められた角度にする傾斜部または段差を備えることを特徴とする請求項2に記載のモールド装置。   A load surface that applies a load to the mold part that is continuous with the runner part by the gate part of the mold part load member includes an inclined part or a step that makes the mold part have a predetermined angle. The molding apparatus according to claim 2.
JP2004033020A 2004-02-10 2004-02-10 Molding method and molding apparatus Expired - Fee Related JP4153881B2 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6184632B1 (en) * 2017-03-23 2017-08-23 エムテックスマツムラ株式会社 Gate break device and resin molding system
JP7395874B2 (en) 2019-08-21 2023-12-12 I-Pex株式会社 Gate breaking method and gate breaking device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6184632B1 (en) * 2017-03-23 2017-08-23 エムテックスマツムラ株式会社 Gate break device and resin molding system
JP7395874B2 (en) 2019-08-21 2023-12-12 I-Pex株式会社 Gate breaking method and gate breaking device

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