JP2005226095A - Apparatus for attaching/detaching probe - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an apparatus for attaching/detaching a probe with which in the case of performing the attachment/detachment of the probe by moving a lance tube to the horizontal direction, even in the case the centers of the lance tube and the probe are not mutually matched, the automatic adjustment of the centers can be obtained. <P>SOLUTION: In this apparatus, a rotating frame 2 having a rotating shaft 2a is arranged so as to be rotatable around the rotating shaft 2a at the upper part of a attaching/detaching frame 1 set to the horizontal direction. In the rotating frame 2, an ascending/descending link 3 is arranged so as to be movable to the vertical direction, and in the ascending/descending link 3, a guide cone opening/closing means 4, an ascending/descending frame 5 and a probe holding means 6 are arranged. A zero-adjusting means 9 for regulating the initial stage height of the ascending/descending link 3 is arranged between the ascending/descending link 3 and the rotating frame 2, and the guide cone opening/closing means 4 and a perpendicular directional reversion spring 7 in the probe holding means 6 are arranged between the ascending/descending frame 5 and the rotating frame 2, and the guide cone opening/closing means 4 and a horizontal directional reversion spring 8 in the probe holding means 6 are arranged between the ascending/descending frame 1 and the rotating frame 2. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention is a sampling device that performs temperature measurement and sampling of molten metal such as hot metal and molten steel housed in a container such as a ladle. The present invention relates to a probe attaching / detaching device.

  A molten metal sampling apparatus has been known for a long time as disclosed in Patent Document 1, for example. A schematic configuration of this conventional sampling apparatus is shown in FIG.

  As shown in the figure, the conventional sampling apparatus has a linear lance tube 20 arranged in a vertical direction and a probe 21 for measuring the temperature of molten metal and sampling at the tip of the lance tube 20. By raising and lowering the tube 20, temperature measurement and sampling of the molten metal in the pan 22 are performed. The used probe 21 is removed from the lance tube 20 by the probe attaching / detaching device 23, and a new probe is attached to the lance tube 20.

  FIG. 7 is a conceptual diagram of the probe attaching / detaching device disclosed in Patent Document 1. In the figure, rotating arms 25 and 26 are pivotally supported on a bracket 24 fixed to a support metal (not shown), and lower ends of the rotating arms 25 and 26 are connected to a base plate 27 via pins. Thus, a link mechanism is formed in which the base plate 27 can move in the horizontal direction. A probe gripping body 28 for gripping the probe 21 and a guide cone 29 are fixed to the base plate 27.

  With such a configuration, as shown in FIG. 7A, even if the lance tube 20 descends in a state of being deviated from the core of the probe 21, the lance tube 20 is placed on the inner peripheral slope of the guide cone 29. By abutting, the guide cone 29, the flow gripper 28, and the base plate 27 move horizontally so that the position of the core of the probe 21 coincides with the core of the lance tube 20, as shown in FIG. 7B.

  As described above, according to the probe attaching / detaching apparatus shown in FIG. 7, even when the probe is attached / detached, the lance tube and the probe can be automatically aligned, that is, automatically aligned. .

However, the probe attaching / detaching apparatus shown in FIG. 7 is applicable only when the probe is attached / detached by moving the lance tube in the vertical direction, and when the probe is attached / detached by moving the lance tube horizontally. Is not applicable. That is, when the link mechanism shown in FIG. 7 is placed horizontally to apply when the probe is attached and detached by moving the lance tube in the horizontal direction, the base plate 27 moves in a certain direction due to its own weight. No longer fulfills its role.
Japanese Patent Publication No.49-49520

  The problem to be solved by the present invention is that, when the probe is attached and detached by moving the lance tube in the horizontal direction, even if the lance tube and the probe are misaligned, the lance tube and the probe are automatically aligned. It is an object of the present invention to provide a probe attaching / detaching device capable of performing the above.

  A probe attaching / detaching device according to the present invention is a probe attaching / detaching device for attaching / detaching a probe to a distal end portion of a sampling lance tube in a molten metal sampling device, and has a rotating shaft at an upper part of a horizontally installed attaching / detaching frame. A rotating frame is provided to be rotatable around the rotation axis, and a lifting link movable in the vertical direction is provided on the rotating frame. A guide cone opening / closing means, a lifting frame, and a probe gripping means are provided on the lifting link, and the lifting / lowering link is provided. A zero adjustment means for defining an initial height of the lifting link is provided between the link and the rotating frame, and a vertical return spring of the guide cone opening / closing means and the probe gripping means is provided between the lifting frame and the rotating frame. A horizontal return of the guide cone opening / closing means and the probe gripping means is provided between the detachable frame and the rotating frame. Characterized in that a Ne.

  In this probe attaching / detaching device, the rotating shaft of the rotating frame can be provided to be slidable with respect to the attaching / detaching frame, and mounting force adjusting means capable of adjusting the sliding force of the rotating shaft can be provided.

  According to the probe attaching / detaching device of the present invention, when the probe is attached and detached by moving the lance tube in the horizontal direction, the lance tube and the probe are automatically aligned even if the centers of the lance tube and the probe are misaligned. In addition, automatic alignment of the lance tube and the probe in the molten metal sampling apparatus having a mechanism for moving the lance tube in the horizontal direction can be easily performed.

  Embodiments of the present invention will be described below based on examples shown in the drawings.

  1 is a front view showing a probe attaching / detaching device of the present invention, FIG. 2 is a view taken along the line AA in FIG. 1, FIG. 3 is a view taken along the line BB in FIG. 1, and FIG. FIG. 5 is a view taken along line D-D in FIG. 1.

  As shown in the drawing, a bearing 1a is provided on an upper part of a horizontally installed removable frame 1. A rotating shaft 2a provided on both short sides of the rotating frame 2 having a rectangular planar shape is supported on the bearing 1a so as to be rotatable and horizontally movable. As a result, the rotating frame 2 is supported by the rotating shaft 2a. It can rotate around and move horizontally.

  The rotary frame 2 is provided with a pair of elevating links 3 having a parallelogram shape. The elevating link 3 has a bracket piece 3a fixed to the rotating frame 2, and arm pieces 3b and 3c pivotally supported on one end of the bracket piece 3a. The other ends of the arm pieces 3b and 3c are It is connected by a connecting piece 3d through a pin. Thereby, the elevating link 3 can be moved up and down in the vertical direction with the bracket piece 3a side as a fixed end.

  A guide cone opening / closing means 4, a lifting frame 5, and a probe gripping means 6 are provided on the connecting piece 3 d of the lifting link 3.

  As shown in FIG. 2, the guide cone opening / closing means 4 includes a guide cone opening / closing cylinder 4a formed of an air cylinder, a link 4b, and a half-shaped guide cone 4c. Then, by expanding and contracting the guide cone opening / closing cylinder 4a, the half-shaped guide cone 4c is opened / closed via the link 4b, and the lance tube 20 is slid on the inner surface in the closed state. Guide 20

  As described above, the lifting frame 5 is provided on the connecting piece 3d of the lifting link 3, and a vertical return spring 7 is provided between the lifting frame 5 and the rotary frame 2 as shown in FIG. Yes. Further, horizontal return springs 8 are provided between the detachable frame 1 and the four corners of the rotating frame 2 via brackets 1b, respectively.

  As shown in FIG. 4, the probe gripping means 6 comprises a probe gripping claw opening / closing cylinder 6a made of an air cylinder, a link 6b, and a probe gripping claw 6c. The probe gripping claw 6c is opened / closed via the link 6b by the expansion / contraction of the probe grip opening / closing cylinder 6a, and the new and old probes 21 are securely gripped in the closed state.

  Further, as shown in FIGS. 1 and 5, a zero adjustment cylinder 9 is provided between the elevating link 3 and the rotating frame 2 via the elevating frame 5. The zero adjustment cylinder 9 is composed of an air cylinder, and supports the guide cone 4c and the probe gripping claw 6c to move to the lower position by its own weight, and the center position of the lance tube 20 and the guide cone 4c and the probe gripping claw 6c. The initial height of the elevating link 3 is set and corrected so that the center position becomes a predetermined position that matches. That is, the zero adjustment cylinder 9 applies a pressing force corresponding to the weight of the lifting link 3 including the guide cone opening / closing means 4, the lifting frame 5, and the probe gripping means 6 to the lifting link 3, so that the initial height of the lifting link 3 is increased. The height of the lift link 3 can be raised and lowered.

  In the above configuration, when attaching / detaching the probe 21 to / from the lance tube 20, as described above, the lance tube 20 slides on the inner surface of the guide cone 4 c by horizontally moving the lance tube 20 or the detachable frame 1. It moves to the right direction relatively in FIG. At this time, if the lance tube 20 is bent downward in FIG. 1, the inner surface of the guide cone 4 c is pushed downward by the lance tube 20, whereby the guide cone 4 c is moved by the vertical return spring 7. The upper spring is shrunk and its position moves downward. Along with this, the probe gripping claw 6c also moves in the same direction as the guide cone 4c by the same amount. Further, depending on the bending direction of the lance tube 20, the guide cone 4 c may receive a horizontal component force. In this case, the guide cone 4 c and the probe gripping claw 6 c are horizontally aligned as a result of the rotation of the rotating frame 2. Move the same amount in both directions. In this way, the guide cone 4c and the probe gripping claw 6c move in the same direction following the bending (center misalignment) of the lance tube 20. Therefore, when the lance tube 20 reaches the probe gripping claw 6c that grips the new probe 21 via the guide cone 4c, the center positions of the two match. In this state, when the lance tube 20 or the detachable frame 1 is further moved horizontally, a new probe 21 is attached to the lance tube 20.

  Completion of the probe mounting is grasped by, for example, a limit switch 10 (see FIG. 1) provided on the detachable frame 1 or a position sensor, and the movement of the lance tube or the detachable frame moving means is stopped. That is, after the probe mounting is completed, when the lance tube 20 or the detachable frame 1 continues to move, the rotating shaft 2a of the rotating frame 2 starts to slide, and the end of the rotating shaft 2a is provided on the detachable frame 1. Since the limit switch 10 is touched, it can be confirmed that the mounting has been completed. Further, by adjusting the sliding force of the rotating shaft 2 a with the mounting force adjusting cylinder 11, the insertion force of the probe 21 into the lance tube 20 can be adjusted. That is, the insertion force can be adjusted by increasing or decreasing the set pressure of the pressure reducing valve 11a attached to the mounting force adjusting cylinder 11. For example, when the set pressure is increased, the sliding force of the rotating shaft 2a is increased, and the insertion force of the probe 21 into the lance tube 20 is increased. Conversely, when the set pressure is reduced, the sliding force is reduced and the insertion force is reduced. With the above adjustment, the required insertion force of the probe 21 can be appropriately set according to the bending amount (center misalignment amount) and diameter of the lance tube, the difference in probe diameter, and the like. 21 is securely inserted.

  When the guide cone 4c and the probe gripping claw 6c are released after the probe mounting is completed, the rotating frame 2 and the lifting link 3 are automatically returned to a predetermined initial position by the restoring force of the vertical return spring 7 and the horizontal return spring 8. Accordingly, the guide cone 4c and the probe gripping claw 6c are also automatically returned to a predetermined initial position.

  INDUSTRIAL APPLICABILITY The present invention can be used as a probe attaching / detaching device in a molten metal sampling device, and in particular, can be suitably used as a probe attaching / detaching device in a molten metal sampling device having a mechanism for moving a lance tube in a horizontal direction.

It is a front view which shows the probe attachment / detachment apparatus of this invention. It is an AA arrow line view of FIG. It is a BB line arrow directional view of FIG. It is CC line arrow line view of FIG. It is a DD line arrow line view of FIG. It is a front view which shows the conventional sampling device. It is a conceptual diagram of the probe attachment / detachment apparatus in the sampling device of FIG.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Detachable frame 2 Rotating frame 2a Rotating shaft 3 Lifting link 4 Guide cone opening / closing means 5 Lifting frame 6 Probe gripping means 6
7 Vertical return spring 8 Horizontal return spring 9 Zero adjustment cylinder (zero adjustment means)
10 Limit switch 11 Mounting force adjustment cylinder 20 Lance tube 21 Probe

Claims (2)

A probe attaching / detaching device for attaching / detaching a probe to a tip of a sampling lance tube in a molten metal sampling device,
A rotating frame having a rotating shaft is provided on the top of a horizontally installed removable frame so as to be rotatable around the rotating shaft,
The rotating frame is provided with a lifting link movable in the vertical direction,
A guide cone opening / closing means, a lifting frame and a probe gripping means are provided on the lifting link,
Between the elevating link and the rotating frame, a zero adjustment means for defining an initial height of the elevating link is provided,
A vertical return spring for the guide cone opening / closing means and the probe gripping means is provided between the lifting frame and the rotating frame,
A probe attaching / detaching device, wherein a horizontal return spring for the guide cone opening / closing means and the probe gripping means is provided between the attaching / detaching frame and the rotating frame.   2. The probe attaching / detaching device according to claim 1, further comprising a mounting force adjusting means capable of adjusting a sliding force of the rotating shaft while providing a rotating shaft of the rotating frame so as to be slidable with respect to the attaching / detaching frame. .

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