JP2005221373A5 - - Google Patents

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Publication number
JP2005221373A5
JP2005221373A5 JP2004029417A JP2004029417A JP2005221373A5 JP 2005221373 A5 JP2005221373 A5 JP 2005221373A5 JP 2004029417 A JP2004029417 A JP 2004029417A JP 2004029417 A JP2004029417 A JP 2004029417A JP 2005221373 A5 JP2005221373 A5 JP 2005221373A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004029417A
Other languages
Japanese (ja)
Other versions
JP2005221373A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2004029417A priority Critical patent/JP2005221373A/ja
Priority claimed from JP2004029417A external-priority patent/JP2005221373A/ja
Publication of JP2005221373A publication Critical patent/JP2005221373A/ja
Publication of JP2005221373A5 publication Critical patent/JP2005221373A5/ja
Pending legal-status Critical Current

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JP2004029417A 2004-02-05 2004-02-05 元素分析装置 Pending JP2005221373A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004029417A JP2005221373A (ja) 2004-02-05 2004-02-05 元素分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004029417A JP2005221373A (ja) 2004-02-05 2004-02-05 元素分析装置

Publications (2)

Publication Number Publication Date
JP2005221373A JP2005221373A (ja) 2005-08-18
JP2005221373A5 true JP2005221373A5 (cg-RX-API-DMAC10.html) 2007-03-22

Family

ID=34997127

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004029417A Pending JP2005221373A (ja) 2004-02-05 2004-02-05 元素分析装置

Country Status (1)

Country Link
JP (1) JP2005221373A (cg-RX-API-DMAC10.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4768468B2 (ja) * 2005-05-26 2011-09-07 株式会社東芝 元素分析方法および装置、並びに分析試料作成方法
WO2011070817A1 (ja) * 2009-12-09 2011-06-16 株式会社村田製作所 空隙配置構造体が保持された分光測定用デバイス、それに用いられる枠部材、および、分光器
CN104181131B (zh) * 2014-08-15 2016-08-24 中国科学院上海技术物理研究所 红外调制光致发光二维成像光路自动定位校准装置
WO2016085313A2 (ko) * 2014-11-28 2016-06-02 광주과학기술원 액체 내 오염물질의 화학적 원소 분석장치 및 분석방법
KR101723535B1 (ko) * 2014-11-28 2017-04-06 광주과학기술원 액체 내 오염물질의 화학적 원소 분석장치 및 분석방법
CN117222090B (zh) * 2023-07-18 2024-07-19 中国人民解放军国防科技大学 可调节高空间分辨率的平面等离子体速度测量系统及方法

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