JP2005190344A - Device for testing automatic ticket handling system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To automate a test for an automatic ticket handling system that uses a contactless IC card, thus conducting the test quickly with good reproducibility and high accuracy. <P>SOLUTION: The device for testing the automatic ticket handling system that uses the contactless IC card includes a robot 7 that exposes the contactless IC card 9 to the wave-emission area of an automatic ticket gate 3, and a control means 1 for taking in data on the reaction result of the automatic ticket gate when the contactless IC card is exposed and for controlling the robot. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to a test apparatus for an automatic ticket gate processing system using a non-contact IC card.

  When a non-contact IC card charged with value information such as commuter pass information and ticket information is held over a predetermined area of the automatic ticket gate, the automatic ticket gate reads the information of the non-contact IC card and writes the necessary information to automatically check the ticket. Systems that do this are becoming popular. In this system, when a non-contact IC card is placed over the area of radio waves emitted from the automatic ticket gate, the non-contact IC card becomes communicable with the automatic ticket gate using the received radio wave energy as a power source. By reading the value information charged in the contact IC card and writing the necessary information, the ticket gate processing can be performed instantaneously.

  Thus, an automatic ticket gate processing system using a non-contact IC card is characterized in that an instantaneous ticket gate processing can be performed. Therefore, it is necessary to perform an actual machine test so that a situation where the system does not operate properly does not occur. In a conventional automatic ticket gate processing system test, a non-contact IC card is manually placed over an area where radio waves are radiated, and the position is changed three-dimensionally while measuring with a ruler, etc., and the automatic ticket gate responds. This is done by checking whether or not (reading and writing of information) has been completed.

  In the conventional test method, the position where the non-contact IC card is held is changed three-dimensionally while measuring with a ruler by hand. For example, when the test range is 10 cm × 10 cm and the height is 10 cm, the interval is 1 cm. If the position is changed, the test must be performed at 1000 points. The test takes enormous labor and time, and it is almost impossible to perform a highly accurate test with finer measurement points with high reproducibility. Furthermore, in actuality, the reaction of the automatic ticket gate differs depending on the posture, angle, passing time, pass (movement trajectory), etc. over which the card is held, and these tests cannot be performed manually.

SUMMARY OF THE INVENTION The present invention is intended to solve the above-described problems, and an object of the present invention is to automate a test of an automatic ticket gate processing system using a non-contact IC card so that the test can be performed with high reproducibility and high accuracy and speed.
Therefore, the present invention provides a test apparatus for an automatic ticket gate processing system using a non-contact IC card, and a robot that holds a non-contact IC card over a radio wave emission area of an automatic ticket gate, and an automatic ticket gate when the non-contact IC card is held over. It is characterized by comprising control means for taking in the data of the reaction results of the machine and controlling the robot.
Further, the present invention is characterized in that the robot holds a non-contact IC card over a plurality of measurement points in a radio wave radiation area.
Further, the present invention is characterized in that the robot holds the non-contact IC card while changing the number of measurement points and the distance between the measurement points.
Further, the present invention is characterized in that the robot holds the non-contact IC card while changing its posture and angle.
Moreover, the present invention is characterized in that the robot holds the non-contact touch IC card while changing the passing time.
Further, the present invention is characterized in that the robot holds the non-contact IC card while changing the locus thereof.

  In the present invention, since the robot performs the operation of holding the non-contact IC card over the radio wave radiation area of the automatic ticket gate, the number of measurement points and the distance between the measurement points can be freely changed, and the attitude of the non-contact IC card It is possible to perform tests with high reproducibility, high accuracy and speed by changing the angle, passing time, and path.

BEST MODE FOR CARRYING OUT THE INVENTION

Embodiments of the present invention will be described below.
FIG. 1 is a conceptual diagram illustrating the configuration of a test apparatus according to this embodiment.
Note that this test equipment is used when the automatic ticket gate operates normally and tests the quality and performance of the non-contact IC card, and when the non-contact IC card is normal and tests the quality and performance of the automatic ticket gate, Various tests in the automatic ticket gate processing system can be performed, for example, when both the machine and the non-contact IC card are normal and the performance test of both is performed.

  A robot 7 controlled by the control device 1 is installed on the test stage 6. The robot can be operated in various patterns depending on the program installed in the control device 1 and the data input from the input device 2. The test stage 6 is changed in its three-dimensional position and angle by a stage controller 4 that is operated by a power source 5 so that it can be used for various automatic ticket gates. Below the test stage 6, a test automatic ticket gate 3 is installed, and a non-contact IC card 9 set on an IC card installation base 8 of the robot is placed over a radio wave radiation area.

  When the robot 7 holds the non-contact IC card 9 set on the IC card installation base 8 over the radio wave emission area of the automatic ticket gate, the non-contact IC card 9 can communicate with the automatic ticket gate using the received radio wave as an energy source. Thus, the automatic ticket gate 3 reads the identification information, value information, etc. of the non-contact IC card 9 and writes necessary information. The measurement result of whether or not this series of processing is normally performed is taken into the control device 1. In the control device 1, the robot 7 holds the contactless IC card at a plurality of measurement points in the radio wave radiation area, processes the measurement results at each measurement point, and displays the processing results on the monitor 10.

  As described above, since the robot performs the operation of holding the non-contact IC card over the radio wave emission area of the automatic ticket gate, the number of measurement points and the distance between the measurement points can be freely changed, and the attitude of the non-contact IC card. It is possible to test with good reproducibility by changing the angle, passing time, and path.

FIG. 2 is a diagram for explaining an example of an automatic ticket gate passage measurement method.
In this example, the non-contact IC card 9 is approached and separated at an acute angle with respect to the normal of the radio wave radiation surface of the automatic ticket gate 3 by the robot, and the non-contact IC card 9 is radiated by a V-shaped path. Pass through area 20 and test automatic ticket gate response. Since the robot moves the non-contact IC card, if it is set, it can pass through the same path. Further, when the non-contact IC card 9 approaches or separates, it is possible to change the angle with respect to the normal line of the radio wave radiation surface, or to test by changing the posture. It is also possible to fix the path for moving the non-contact IC card, change the speed, and change the time for passing through the radiated radio wave area 20 for various tests. In this way, it is possible to carry out quantitative measurements with high reproducibility, such as measurements on specific paths, measurements with different angles and postures, measurements with different passage times, etc., which were difficult with conventional manual measurements. .

FIG. 3 is a diagram for explaining another example of the automatic ticket gate passing measurement method.
In this example, the height of the V-shaped path in FIG. 2 is changed in various ways, and the robot divides the non-contact IC card 9 into the radiated radio wave area 20 of the automatic ticket checker 3 with different V-shaped path paths 21, 22, and 23. I let it pass. Even in this measurement pattern, the measurement by changing the angle and the posture and the measurement by changing the passing time may be performed in combination as in the case of FIG.

FIG. 4 is a diagram for explaining an example of an automatic ticket gate passing measurement method having an inclined surface.
Even when the radio wave emission surface of the automatic ticket gate is inclined, as in the case of FIG. 2, the robot approaches the contactless IC card at an acute angle with respect to the normal of the radio wave emission surface of the automatic ticket gate 3, Test the reaction of the automatic ticket gate by separating and passing through the radiated radio wave area 20 with a V-shaped path. In this example as well, measurement with different angles and postures and measurement with different passage times may be performed in combination.

FIG. 5 is a diagram for explaining an example of a test method in which the height of the passing path is changed.
In this example, the robot moves the non-contact IC card 9 through paths 31, 32, 33, 34, 35, and 36 having different heights in parallel with the radio wave radiation surface of the automatic ticket checker 3 to pass through the radiation radio wave area. It is carried out. Also in this example, the test may be performed by changing various times of passing through the radiated radio wave area 20.

FIG. 6 is a diagram for explaining another example of the automatic ticket checker passing measurement method having an inclined surface.
In this example, the surface of the automatic ticket gate that emits radio waves is inclined at a certain angle, while the non-contact IC card 9 is changed in height to 41, 42, 43, 44, 45, The radio wave area is passed through 46 paths. Also in this example, the test may be performed by changing various times of passing through the radiated radio wave area 20.

FIG. 7 is a diagram for explaining an example of a passing measurement method adapted to the angle of the automatic ticket gate.
In this example, the surface of the automatic ticket gate that radiates radio waves is inclined at a certain angle, and the radio wave area is changed by 51, 52, 53, 54, 55, and 56 by changing the height parallel to this plane. I let it pass. In this example as well, the time for passing through the radiated radio wave area 20 may be varied and tested.

FIG. 8 shows the measurement results displayed on the monitor.
The illustrated example shows a communication distance measurement result in which information can be read and written when an automatic ticket checker and a non-contact IC card are used and measurement is performed by sequentially changing measurement points. As described above, the robot 7 can place the non-contact IC card at a plurality of measurement points in the radio wave radiation area, and can freely change the number of measurement points and the distance between them. FIG. 8 is a graph in which the measurement points are made minute and the maximum communicable distance at each two-dimensional position is plotted. Although it was not known in a conventional manual test, as shown in FIG. 8, it was found that radio waves were hardly emitted depending on the two-dimensional position, and the communicable range greatly changed at the two-dimensional position. It can be seen that a non-contact IC card can be held over.

  According to the present invention, since the test of an automatic ticket gate processing system using a non-contact IC card can be automated and the test can be performed with high reproducibility and high accuracy and speed, the industrial utility value is extremely large.

It is a conceptual diagram explaining the structure of a test apparatus. It is a figure explaining the example of an automatic ticket gate passage measurement method. It is a figure explaining the other example of the automatic ticket gate passage measurement method. It is a figure explaining the example of the automatic ticket gate passage measurement method which has an inclined surface. It is a figure explaining the example of the test method which changed the height of the passage path. It is a figure explaining the other example of the test method which changed the height of the passage path. It is a figure explaining the example of the passage measurement method matched with the angle of the automatic ticket gate. It is a figure which shows the measurement result displayed on the monitor.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Control apparatus, 2 ... Input device, 3 ... Automatic ticket gate, 4 ... Stage controller, 5 ... Power supply, 6 ... Test stage, 7 ... Robot, 8 ... IC card installation stand, 9 ... Non-contact IC card, 10 ... Monitor, 20 ... radiation area.

Claims (6)

In an automatic ticket gate processing system test device using a non-contact IC card,
A robot that holds a contactless IC card over the radio emission area of an automatic ticket gate,
Control means for controlling the robot while taking in the data of the reaction result of the automatic ticket gate when holding the non-contact IC card,
A test apparatus for an automatic ticket gate processing system, comprising: The test apparatus according to claim 1, wherein the robot holds a non-contact IC card over a plurality of measurement points in a radio wave radiation area. The test apparatus according to claim 2, wherein the robot holds the non-contact IC card while changing the number of measurement points and the distance between the measurement points. The test apparatus according to claim 1, wherein the robot holds the non-contact IC card while changing its posture and angle. The test apparatus according to claim 1, wherein the robot holds the non-contact touch IC card while changing a passing time thereof. The test apparatus according to claim 1, wherein the robot holds the robot while changing the locus of the non-contact IC card.

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