JP2005188934A - Inspection apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To reduce an inspection work time and improve the efficiency for manufacturing a board by parallelly implementing an automatic inspection by an inspection apparatus and a re-inspection by a worker with regard to the single board. <P>SOLUTION: A CPU 31 sets a flag Fi, and an i-th image data determined as a fault during the automatic inspection is read from an image memory 34 and displayed on a display 21 (s11, s12). A re-inspection result inputted from a remote controller box 3 by the worker is waited (s13, s14). When an OK button 33 is operated in the remote controller box 3, the CPU 31 resets the flag Fi (s15). The CPU 31 parallelly implements processes s1-s9, s11-s15 by using a multi-task process. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to an inspection apparatus for automatically inspecting the suitability of component mounting quality from the state of a joint between a component and solder on a substrate.

  As an inspection apparatus, there is an apparatus that sequentially images a joint portion of a component and a solder on a substrate, and compares the captured image with a reference image to automatically inspect whether or not the component is properly mounted (for example, Patent Document) 1). Such an inspection apparatus receives teaching inputs of a plurality of inspection positions on one board to be inspected, and sequentially inspects the suitability of component mounting quality at the plurality of instructed inspection positions.

  However, it is not easy to determine whether or not the solder joint state is appropriate based on the image, and the error range from the reference image that the inspection apparatus determines to be appropriate is set to be relatively narrow in order to prevent oversight of defective parts. For this reason, even when it is determined that the inspection apparatus is defective, there are many cases where there is actually no problem in the component mounting quality.

Therefore, in the inspection method using the conventional inspection apparatus, inspection results for a plurality of inspection positions on each substrate are stored in the inspection apparatus, and when the inspection for one substrate is completed, the results are output from the inspection apparatus. An operator visually reinspects the inspection position determined by the inspection apparatus as defective in the output result, and confirms the determination result of the inspection apparatus.
JP 2000-004079 A

  However, if automatic inspection by the inspection apparatus for all of the plurality of inspection positions on one substrate is completed and the operator re-inspects the defective part on the substrate, the time required for automatic inspection by the inspection apparatus The time obtained by adding the time required for re-inspection by the operator is the inspection time for each substrate. For this reason, there has been a problem that the inspection work takes a long time and the manufacturing efficiency of the substrate is lowered.

  An object of the present invention is to enable an operator to immediately re-inspect the inspection position when it is determined to be a defective part by automatic inspection, and to perform automatic inspection of a single substrate and re-inspection by an operator. An object of the present invention is to provide an inspection apparatus capable of shortening the inspection work by performing the inspection in parallel and improving the manufacturing efficiency of the substrate.

The inspection apparatus of the present invention is a means for solving the above-described problems,
Images of a plurality of inspection positions on the substrate are sequentially picked up, the suitability of component mounting quality at each inspection position is automatically inspected based on a comparison between the picked-up image and a pre-stored reference image, and the inspection result is stored In the inspection device memorized in
When it is determined that the component mounting quality is poor at any of the plurality of inspection positions, an image of the inspection position is displayed on the display means, and an input of a re-inspection result by visual inspection of the operator is accepted and input. The result of the re-inspection is overwritten in the storage means, and during this time, the determination of the suitability of the component mounting quality at the next inspection position is continued.

  In this configuration, the automatic inspection by the inspection apparatus and the re-inspection by the operator's visual inspection for the inspection position determined to be defective in the automatic inspection are performed in parallel for the component mounting quality at a plurality of inspection positions on a single substrate. Done. Accordingly, both the automatic inspection by the inspection apparatus and the re-inspection by the operator's visual inspection for one substrate are completed only in the time required for the automatic inspection by the inspection apparatus.

  In addition, an input unit that receives an input operation of the re-examination result is provided.

  In this configuration, the operator inputs the result of the reexamination by operating the input means. Therefore, the operator can input the result of the reexamination accurately through the dedicated input means.

  Furthermore, the display screen of the display means is divided into a plurality of display areas, and each of the plurality of inspection positions determined to have poor component mounting quality is displayed in each display area.

  In this configuration, images at different inspection positions are displayed in each of the plurality of display areas. Therefore, when a large number of inspection positions on one substrate are set and it is determined that a plurality of inspection positions are defective by automatic inspection, the operator does not perform an operation of switching display screens. Can be re-inspected.

  According to the inspection apparatus of the present invention, the component mounting quality at a plurality of inspection positions on a single substrate is automatically inspected by the inspection apparatus, and re-inspection by the operator's visual inspection for the inspection position determined to be defective in the automatic inspection. In parallel, it is possible to complete both the automatic inspection by the inspection apparatus and the re-inspection by the operator's visual inspection for one substrate only in the time required for the automatic inspection by the inspection apparatus. Thereby, the inspection work can be shortened and the manufacturing efficiency of the substrate can be improved.

  In addition, by enabling the operator to input the reinspection result by operating the input unit, the reinspection result can be accurately input through the dedicated input unit.

  Furthermore, when a plurality of inspection positions on a single substrate are set by displaying images of different inspection positions in each of a plurality of display areas, and it is determined that a plurality of inspection positions are defective by automatic inspection In addition, a plurality of inspection positions can be re-inspected without performing an operation of switching the display screen, and the workability of the operator can be improved.

  FIG. 1 is a diagram showing a configuration of an inspection apparatus which is an example of an embodiment of the present invention. FIG. 2 is a diagram showing a configuration of a main part of the inspection apparatus. FIG. 3 is an external view of a remote control box provided in the inspection apparatus. The inspection device 10 includes a main body 1, a control device 2, and a remote control box 3. The main body 1 includes a turntable 11, a light source 12, and an imaging unit 13 in a hollow housing that is open to the front.

  The turntable 11 includes rails 11a and 11b that move horizontally in the direction of approaching and separating from each other on the upper surface. The rails 11a and 11b sandwich the substrate 20 to be inspected with a center reference. The turntable 11 rotates horizontally within the main body 1, and directs the solder joint that is the inspection position on the substrate 20 in the optical path direction of the imaging unit 13.

  The light source 12 irradiates the upper surface of the substrate on the turntable 11 with illumination light. As shown in FIG. 2, the imaging unit 13 includes an active mirror 13a, an active objective lens 13b, a relay lens 13c, a zoom lens 13d, and a CCD (Charge Coupled Devices) 13e. The imaging unit 13 rotates the active mirror 13a biaxially toward the inspection target region on the substrate 20 on the turntable 11, moves the active objective lens 13b in the optical path direction, and adjusts the imaging size by the zoom lens 13d. The reflected light at the inspection position of the illumination light from the light source 12 is imaged on the light receiving surface of the CCD 13e, and the image at the inspection position is read by the CCD 13e.

  In the lower part of the front surface of the main body 1, a power switch 14a for turning on and off the main body 1, indicator lamps 14b to 14d for displaying an operation state, and the like are provided.

  The control device 2 is configured by a personal computer including a display 21, a keyboard 22, and a mouse 23. The display 21 is display means of the present invention, and the control device 2 is connected to the main body 1 and inputs / outputs data to / from the main body 1. The control device 2 accepts input of teaching data by operating the keyboard 22 and the mouse 23. The teaching data is data for specifying an inspection position on the substrate.

  The remote control box 3 is connected to the control device 2. The remote control box 3 is an input means of the present invention, and includes buttons 31 to 37 for starting inspection, stopping inspection, OK, NG, image forward feed, image reverse feed and emergency stop, as shown in FIG. The signal which specifies the operated button among -37 is output to the control apparatus 2.

  The inspection start button 31 receives an instruction to start automatic inspection by the main body 1. The inspection stop button 32 receives an instruction to end automatic inspection by the main body 1. The OK button 33 receives an input indicating that the state of the inspection position is appropriate as a result of re-inspection by the operator's visual inspection. The NG button 34 receives an input indicating that the state of the inspection position is defective as a result of re-inspection by the operator's visual inspection. The image forward button 35 receives an instruction to switch the image at the inspection position to be displayed on the display 21 to the next image. The image reverse button 36 receives an instruction to switch the image at the examination position to be displayed on the display 21 to the previous image. The emergency stop button 37 receives an instruction to interrupt the inspection operation in an emergency.

  FIG. 4 is a block diagram of the control device of the inspection apparatus. The control device 2 of the inspection apparatus 10 is configured by connecting an image memory 34, an A / D converter 35, a motor driver 36, and interfaces 37 to 40 to a CPU 31 having a ROM 32 and a RAM 33. The CPU 31 controls each connected device according to a program written in advance in the ROM 32, and temporarily stores data input / output during this time in the RAM 33 which is the storage means of the present invention.

  The A / D converter 35 is connected to the CCD 13e of the imaging unit 13. The A / D converter 35 converts the output signal of the CCD 13e into digital data and inputs it to the CPU 31 as imaging data at the inspection position. The CPU 31 stores the input imaging data in the image memory 34.

  The motor driver 36 includes a turntable motor 41 that rotates the turntable 11 in the main body 1, mirror motors 42 and 43 that rotate the active mirror 13 a in the imaging unit 13, and a lens motor 44 that moves the active lens 13 b in the imaging unit 13. Etc. are connected. The CPU 31 outputs drive data for the motors 41 to 44 to the motor driver 36. The motor driver 36 drives the motors 41 to 44 based on the drive data input from the CPU 31.

  A remote control box 3, a keyboard 22, a mouse 23, and a display 21 are connected to each of the interfaces 37 to 40. Operation data of the remote control box 3, the keyboard 22 and the mouse 23 is input to the CPU 31 via the interfaces 37 to 39. The CPU 31 stores the teaching data input via the keyboard 22 and the mouse 23 in a predetermined memory area of the RAM 33, and outputs driving data to the motor driver 36 based on the teaching data stored in the RAM 33 during the inspection operation. . Further, the CPU 31 outputs display data to the display 21 via the interface 40.

  FIG. 5 is a flowchart showing a processing procedure of the control device of the inspection apparatus. The CPU 31 of the control device 2 waits for the operation of the start button 31 of the remote control box 3 (s1), and when the start button 31 is operated, the content of the counter i is set to 1 (s2). The counter i is assigned to a predetermined memory area of the RAM 33 and specifies an inspection position on the substrate 20. The CPU 31 captures an image of the inspection position specified by the contents of the counter i via the CCD 13e (s3), and stores the captured image data in the image memory 34 (s4).

  The CPU 31 determines suitability by comparing the image at the i-th inspection position stored in the image memory 34 with a reference image stored in advance (s5). When determining that the image is appropriate, the CPU 31 increments the count value of the counter i (s6 → s8). When determining that the image is defective, the CPU 31 sets the i-th flag Fi and increments the count value of the counter i (s6 → s7 → s8). The flag Fi is assigned to a predetermined memory area of the RAM 33 corresponding to each inspection position, and stores the suitability of the i-th inspection position. The CPU 31 repeatedly executes the processes from s3 to s8 for the total number I of a plurality of inspection positions taught in advance (s9 → s3).

  On the other hand, the CPU 31 waits for the flag Fi to be set (s11). When the flag Fi is set, the i-th image data is read from the image memory and displayed on the display 21 (s12). Thereafter, the CPU 31 waits for the input of the operator's re-inspection result from the remote control box 3 (s13, s14). The CPU 31 resets the flag Fi when the OK button 33 is operated in the remote control box 3 (s15), and returns to s11 as it is when the NG button 34 is operated in the remote control box 3.

  The CPU 31 performs the processes of s1 to s9 and the processes of s11 to s15 in parallel by multitask processing.

  As a result, when one of the flags Fi is set when the inspection work for one substrate 20 is completed, it is determined as a defective product, and when none of the flags Fi is set, it is determined as a non-defective product.

  Through the above processing, re-inspection by an operator can be simultaneously performed during automatic inspection of one substrate 20 by the inspection apparatus. When the substrate 20 is taken out from the main body 1, automatic inspection and re-inspection of the substrate 20 are performed. All are completed, and the time required for the inspection work of the component mounting quality on the board 20 is shortened.

  Note that the inspection result can be displayed on the display 21 when the automatic inspection and re-inspection for all inspection positions are completed. In this case, when the result of the automatic inspection is OK, when the re-inspection is switched to OK, and when the re-inspection is NG, the respective cases can be displayed distinctly by changing the display color.

  In addition, when automatic inspection and re-inspection for all inspection positions are completed, different sounds are generated for defective products and non-defective products so that the operator can easily recognize the completion and results of the inspection. Also good.

  Furthermore, an image of a defective inspection position for at least one substrate to be inspected is accumulated and stored in the image memory 34, and one of a plurality of inspection position images determined to be defective by automatic inspection is displayed as a reverse button. It is also possible to selectively display on the display 21 by operating the 35 and progressive button 36.

  In addition, as shown in FIG. 1, it is possible to divide the display screen of the display 21 into a plurality of display areas such as four divisions and display an image at one inspection position in each display area. In this case, the operator may switch to a state where an image of a single inspection position desired by the worker is displayed on the entire display screen of the display 21 by operating the remote control box 3 or the like.

  Further, when the inspection position determined to be defective by the automatic inspection by the inspection apparatus 10 is determined to be appropriate by the re-inspection by the operator, the result is reflected in the reference image, thereby being closer to the result of the visual inspection by the operator. Automatic inspection can be performed.

It is a figure showing composition of an inspection device which is an example of an embodiment of the present invention. It is a figure which shows the structure of the imaging part with which the main body of the said inspection apparatus is equipped. It is an external view of the remote control box with which the said inspection apparatus is equipped. It is a block diagram of the control apparatus of the said inspection apparatus. It is a flowchart which shows the process sequence of the control apparatus of the said inspection apparatus.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Main body 2 Control apparatus 3 Remote control box 10 Inspection apparatus 13 Imaging part 20 Board | substrate 21 Display

Claims (3)

Images of a plurality of inspection positions on the substrate are sequentially picked up, the suitability of component mounting quality at each inspection position is automatically inspected based on a comparison between the picked-up image and a pre-stored reference image, and the inspection result is stored In the inspection device memorized in
When it is determined that the component mounting quality is poor at any of the plurality of inspection positions, an image of the inspection position is displayed on the display means, and an input of a re-inspection result by visual inspection of the operator is accepted and input. An inspection apparatus characterized by overwriting the result of re-inspection on the storage means and continuing to determine whether the component mounting quality is appropriate at the next inspection position during this time.   The inspection apparatus according to claim 1, further comprising an input unit that receives an input operation of the re-inspection result.   2. The inspection according to claim 1, wherein the display screen of the display means is divided into a plurality of display areas, and each of the plurality of inspection positions determined to have poor component mounting quality is displayed in each display area. apparatus.

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