JP2005033149A - Method and apparatus for evaluation test of solder wettability of mounting component - Google Patents

Method and apparatus for evaluation test of solder wettability of mounting component Download PDF

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JP2005033149A
JP2005033149A JP2003293612A JP2003293612A JP2005033149A JP 2005033149 A JP2005033149 A JP 2005033149A JP 2003293612 A JP2003293612 A JP 2003293612A JP 2003293612 A JP2003293612 A JP 2003293612A JP 2005033149 A JP2005033149 A JP 2005033149A
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solder
solder paste
wettability
mounting component
test jig
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Yoshiyuki Osawa
義征 大澤
Kyoko Fukutani
京子 福谷
Atsushi Takeuchi
敦史 竹内
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RESUKA KK
Rhesca Co Ltd
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RESUKA KK
Rhesca Co Ltd
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<P>PROBLEM TO BE SOLVED: To provide a method and an apparatus that can precisely measure the solder wettability of a surface-mounting component or the like which has been miniaturized to cope with the miniaturization of electronic/electric products. <P>SOLUTION: A resist film 15 is formed on the upper face of a test jig plate 4 so that solder paste 3, which is printed or applied on the inside of the resist-film pattern 15, can form a sphere without spreading out by wetting when the solder paste is melted. The solder paste 3 is heated to form a melted sphere, and a mounting component 1 is touched to the small solder sphere. The force required to move the mounting component upward by a chuck 2 is detected to find the solder wettability of the mounting component 1. In forming the resist film 15 so that the melted solder may not arbitrarily spread out, the resist film 15 is applied on the outside of a circle located at the center of the test jig plate 4, wherein the diameter of the circle is arbitrarily determined such as 1 mm, 2 mm, or 4 mm, depending on the size of the mounting component to be measured. The quantity of the solder paste 3, which is printed or applied, is determined by considering the size of the melted sphere. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

この発明は、電子・電気製品に使用される実装部品のはんだ濡れ性を評価する方法および装置に関する。  The present invention relates to a method and an apparatus for evaluating solder wettability of a mounting component used in an electronic / electric product.

近年、携帯電話、デジタルカメラなど、電子・電気製品の高機能化と共に小型化が進み、それに伴って製品に使用される実装部品の微小化も進み、1005や0603型などのコンデンサーや抵抗などが使用されるようになってきた。微小化した実装部品のはんだ濡れを評価することも極めて重要なことであり、いろいろな測定法が開示されている(例えば、特許文献1、2、3参照)。また、基板に実装部品を結合するときに使用される、はんだの鉛フリー化が進んでいる。プリント配線基板や実装部品と鉛フリーはんだペーストの濡れ性が重要で有り,鉛フリーはんだの代表的な錫(Sn)とビスマス(Bi)系のSn−Bi共晶はんだの銅板上での濡れ性についても詳細に検討されている(例えば、非特許文献1参照)。  In recent years, as electronic and electrical products such as mobile phones and digital cameras have become more sophisticated, miniaturization has progressed, and along with that, mounting components used in products have also become smaller, and capacitors and resistors such as 1005 and 0603 types have been developed. Has come to be used. It is also extremely important to evaluate solder wetting of a miniaturized mounting component, and various measurement methods are disclosed (for example, see Patent Documents 1, 2, and 3). In addition, lead-free solder used for bonding mounting components to a substrate is in progress. The wettability of printed wiring boards and mounting components and lead-free solder paste is important. Lead-free solder typical tin (Sn) and bismuth (Bi) Sn-Bi eutectic solder on the copper plate Has also been studied in detail (for example, see Non-Patent Document 1).

国内規格では、はんだペーストの濡れ性評価試験方法として、電気・電子機器製造関係の団体である、(社)日本電子機械工業会(現在、日本電子情報産業協会)では規格(EIAJ ET−7404)を制定している。この規格には図1に示した急速加熱試験方法と、図3に示したプロフアイル昇温試験方法が定められている。図3に示したプロフアイル試験方法は、温度条件を実際の製造ラインと同じ温度で試験する試験方法であるため、試験時間が掛かることと、はんだペーストが溶融される時の濡れ出力が安定しないこと、などの理由から図1に示した急速加熱試験方法が一般的に簡便な試験方法として使用されている。  In the domestic standards, as a method for evaluating the wettability of solder paste, it is an organization related to the manufacture of electrical and electronic equipment. The Japan Electronic Machinery Manufacturers Association (currently Japan Electronics and Information Industries Association) has a standard (EIAJ ET-7404) Has been enacted. This standard defines the rapid heating test method shown in FIG. 1 and the profile temperature raising test method shown in FIG. The profile test method shown in FIG. 3 is a test method in which the temperature conditions are tested at the same temperature as the actual production line, so that it takes a long time and the wetting output when the solder paste is melted is not stable. For these reasons, the rapid heating test method shown in FIG. 1 is generally used as a simple test method.

図1の急速加熱試験方法を説明すると(1)は実装部品、(2)は濡れ力を測定する荷重計に接続された実装部品チャック、(3)は印刷されたはんだペースト、(4)は試験治具板、(5)は試験治具板保持機構、(6)は溶融はんだポットをそれぞれ表す。試験方法は図1(a)のように試験治具板(4)にはんだペースト(3)を印刷し、実装部品(1)をはんだペースト(3)に任意の深さ浸せきさせる。次に図1(b)のように溶融ポット(6)、または試料側を移動させ、溶融はんだに試験治具板(4)を浸せきさせる。この時に試験治具板(4)は70℃/秒以上の昇温速度で昇温されなければならない、と定められている。  The rapid heating test method of FIG. 1 will be described. (1) is a mounted component, (2) is a mounted component chuck connected to a load meter for measuring the wetting force, (3) is a printed solder paste, (4) is A test jig plate, (5) represents a test jig plate holding mechanism, and (6) represents a molten solder pot. As shown in FIG. 1A, the test method is to print the solder paste (3) on the test jig plate (4) and immerse the mounting component (1) in the solder paste (3) at an arbitrary depth. Next, as shown in FIG. 1B, the melting pot (6) or the sample side is moved, and the test jig plate (4) is immersed in the molten solder. At this time, it is stipulated that the test jig plate (4) must be heated at a heating rate of 70 ° C./second or more.

図2は急速加熱方法で試験した一般的な濡れ出力の波形で、図中、t0は実装部品をはんだポットに浸せきした時、t1は実装部品にはんだペーストが溶融して濡れが発生して濡れ上がりゼロを超えた時である。規格では、濡れ性評価はt0〜t1の時間を濡れが始まる時間T0として測定すること、また、t1〜2/3Fmaxに到達した時までの時間T1を計測し、部品毎に相対比較して濡れの評価を行おうとしている。但し、この規格では昇温が70℃/秒以上であるから鉛フリーはんだペーストでは錫(Sn)+銀(Ag)+銅(Cu)系のはんだで溶融温度が217℃、Sn+Ag系はんだでは更に高温となり、はんだポット温度は245℃から250℃が必要となるために濡れが始まる時間T0は3秒以上となる。また、試験治具板(4)の温度は試験治具板保持機構(5)の熱伝導により熱の影響を受ける。しかし、JIS C0053はんだ付け試験方法(平衡法)では溶融はんだに試料を浸せきし、濡れの評価を行っているがJIS C0053の解説IIでは濡れが始まる時間は1〜2.5秒が望ましいが、はんだめっきされた電子部品などにおいては0.3〜0.6秒を要することがあるので、ぬれが始まる時間を2.5秒以下が望ましい、と表記されている。  FIG. 2 is a waveform of a general wetting output tested by the rapid heating method. In the figure, t0 indicates that when the mounting component is immersed in a solder pot, t1 indicates that the solder paste melts on the mounting component and the wetting occurs. It is when the rise has exceeded zero. According to the standard, the wettability evaluation is performed by measuring the time from t0 to t1 as the time T0 when wetting starts, and measuring the time T1 until reaching t1 to 2 / 3Fmax, and comparing each component relative to the wetness. We are going to evaluate However, in this standard, the temperature rise is 70 ° C./second or more, so the lead-free solder paste has a tin (Sn) + silver (Ag) + copper (Cu) solder and a melting temperature of 217 ° C., and the Sn + Ag solder further Since the temperature becomes high and the solder pot temperature needs to be 245 ° C. to 250 ° C., the time T0 at which wetting begins is 3 seconds or more. The temperature of the test jig plate (4) is affected by heat due to the heat conduction of the test jig plate holding mechanism (5). However, in the JIS C0053 soldering test method (equilibrium method), the sample is immersed in the molten solder and the wetting is evaluated. However, in the explanation II of JIS C0053, the time when wetting starts is preferably 1 to 2.5 seconds. Since solder-plated electronic parts and the like may take 0.3 to 0.6 seconds, it is indicated that the time for starting wetting is preferably 2.5 seconds or less.

実際の実装部品について、濡れの始まる時間は部品のメッキ種類の違い、酸化度合いの差、各種はんだペーストの差などの違いは大きくても0.5秒前後であることが知られている。ゆえに濡れが始まる時間TOはJIS C0053では試料が溶融はんだに接触してからはんだがはんだ槽の表面レベル以上に上昇しようとする点までの時間としている。これに対し急速加熱試験方法は試験治具板がはんだポット浴面に接触してから供試品とはんだ合金が90°の接触角を生じるまでの時間と定義されている。また、急速加熱試験方法の実際の測定においては,はんだペーストを溶融するためには試験治具板を通して加熱されるため、試験治具板保持治具の温度影響を直接受けて濡れが始まる時間T0が長くなり、相対比較ではあるが測定されたT0が実装部品の違いに寄るものか、熱容量・熱伝導等によるものか見極めることが極めて難しい。  For actual mounted parts, it is known that the starting time of wetting is about 0.5 seconds at most, such as differences in the types of plating of parts, differences in the degree of oxidation, and differences in various solder pastes. Therefore, the time TO at which wetting starts is the time from the time when the sample comes into contact with the molten solder until the point when the solder tries to rise above the surface level of the solder bath. On the other hand, the rapid heating test method is defined as the time from when the test jig plate comes into contact with the solder pot bath surface until the specimen and the solder alloy form a 90 ° contact angle. In the actual measurement of the rapid heating test method, since the solder paste is melted by heating through the test jig plate, the time T0 when wetting starts directly under the influence of the temperature of the test jig plate holding jig. However, it is extremely difficult to determine whether the measured T0 is due to differences in mounted parts or due to heat capacity, heat conduction, etc., although it is a relative comparison.

実装部品の濡れ性評価方法の国際規格として、はんだペーストでなく、はんだペレットを使用したものとしてIEC60068−2−69(Solderability Testing of Electronic Component for Surface Mount Technology by the Wetting Balance Method)がある(例えば、非特許文献2参照)。この規格では図4に示したようなはんだ小球法が規格されている。一方、国内規格でも(社)日本電子機械工業会より、EIAJ ET−7401として、IEC 60068−2−69と同じようにはんだペレットを使用したはんだ小球法が規格されている。図4で(8)はピンセット、(9)は25mgまたは200mgのはんだペレット、(10)は溶融されたペレット、(11)はアルミブロック、(12)は直径2mmまたは4mmの鉄心、(13)はヒータ、(14)は制御用熱電対を表す。はんだ小球法は、アルミブロック(11)をヒーター(13)にて235℃または245℃など、任意の温度に加熱制御する。次に実装部品の大きさに合わせた重量が25mgまたは200mgのはんだペレット(9)を鉄心(12)の上に置く。はんだペレット(9)は溶融され、(10)に示したような直径2mmまたは4mmの溶融したはんだ球とする。次に実装部品及びはんだ球にフラックスを塗布し、実装部品をはんだ球に任意の量浸せきさせ濡れ力を測定する。しかし、このはんだ小球法規格は、はんだペレットでの測定法であり、はんだペーストの測定はできない。
特開2001−074630 特開2002−286612 特開2003−168699 田辺晃生、水谷承靖、朝木善次郎、資源処理技術、Vol.48,No.3,p.184(2001) H.Yoshida,M.E.Warwick,and S.P.Hawkins,Inter.Tin Res.Inst.(England),Pub.No.686.
As an international standard for evaluating the wettability of mounted parts, there is IEC 60068-2-69 (Solderability Testing of Electronic Component for Surface Mount Technology The Thing Bet. Non-patent document 2). In this standard, the solder ball method shown in FIG. 4 is standardized. On the other hand, a solder ball method using solder pellets is also standardized by Japan Electronic Machinery Manufacturers Association as EIAJ ET-7401 as in IEC 60068-2-69. In FIG. 4, (8) is tweezers, (9) is 25 mg or 200 mg solder pellets, (10) is molten pellets, (11) is an aluminum block, (12) is a 2 mm or 4 mm diameter iron core, (13) Represents a heater, and (14) represents a control thermocouple. In the solder ball method, the aluminum block (11) is heated and controlled to an arbitrary temperature such as 235 ° C. or 245 ° C. by the heater (13). Next, a solder pellet (9) having a weight of 25 mg or 200 mg according to the size of the mounted component is placed on the iron core (12). The solder pellet (9) is melted to form a molten solder ball having a diameter of 2 mm or 4 mm as shown in (10). Next, a flux is applied to the mounting component and the solder ball, and the mounting component is immersed in the solder ball in an arbitrary amount, and the wetting force is measured. However, this solder ball method standard is a measurement method using solder pellets and cannot measure solder paste.
JP2001-074630 JP 2002-286612 A JP 2003-168699 A Tanabe Yayoi, Mizutani Seigo, Asagi Zenjiro, Resource Processing Technology, Vol. 48, no. 3, p. 184 (2001) H. Yoshida, M .; E. Warwick, and S.W. P. Hawkins, Inter. Tin Res. Inst. (England), Pub. No. 686.

はんだペーストを使用した実装部品の濡れ性評価試験に関し、EIAJ ET−7404で規格化されている方法は急速加熱試験方法とプロファイル試験方法のみである。急速加熱試験方法での試験治具板を浸せきさせ、はんだペーストを溶融すると、温度管理を厳密に行う必要があるにもかかわらず試験治具板・保持金具などの熱容量の関係で温度が不安定となり、データの再現性が乏しくなるという問題があり、プロフアイル法は温度条件を実際の製造ラインと同じ温度で試験する試験方法であるため、試験時間が掛かることと、はんだペーストが溶融される時の濡れ出力が安定しないという問題がある。複雑な温度管理をしなくても簡便に測定ができて、しかも安価にはんだペーストと実装部品の濡れ力を測定する方法および装置の開発が望まれている。  Regarding the wettability evaluation test of mounted parts using a solder paste, the only methods standardized by EIAJ ET-7404 are the rapid heating test method and the profile test method. When the test jig plate in the rapid heating test method is immersed and the solder paste is melted, the temperature is unstable due to the heat capacity of the test jig plate and holding metal fittings, although it is necessary to strictly control the temperature. Since the reproducibility of data is poor, the profile method is a test method that tests the temperature conditions at the same temperature as the actual production line, so it takes a long time and the solder paste is melted. There is a problem that the wet output at the time is not stable. It is desired to develop a method and an apparatus that can easily measure without complicated temperature control and that can measure the wetting force between a solder paste and a mounted component at a low cost.

係る事情に鑑み、発明者らは鋭意研究の結果、先ずはんだペーストで小球を作り、IEC 60068−2−69に規定されたはんだペレット測定法に準じて溶融したはんだペーストの小球と実装部品との濡れ力を求めることから実装部品のはんだ濡れ力を求める方法を発明するに至った。従来から、はんだ小球法の測定方法では同一サンプルであればはんだ球が小さければ小さいほど濡れ力は表面張力のため大きく出力される事が知られている。このためIEC 60068−2−69では実装部品の大きさとはんだ球の大きさを決めている。この発明は、溶融はんだ球の大きさを実装部品の大きさに合わせて変えることにより、試験治具板上に作製したはんだ小球を用いてはんだペーストと実装部品の濡れ力を測定する方法および装置に関する。  In view of such circumstances, as a result of intensive research, the inventors first made small spheres with solder paste and then melted the solder paste spheres and mounting components according to the solder pellet measurement method defined in IEC 60068-2-69. As a result, the inventors have invented a method for determining the solder wettability of a mounted component. Conventionally, it is known that in the measurement method of the solder ball method, the smaller the solder ball, the larger the wetting force is output due to the surface tension in the same sample. For this reason, IEC 60068-2-69 determines the size of the mounted component and the size of the solder ball. The present invention relates to a method for measuring the wetting force between a solder paste and a mounting component using a solder small ball produced on a test jig plate by changing the size of a molten solder ball according to the size of the mounting component, and Relates to the device.

この発明は、各種はんだペーストを用いた表面実装部品のはんだ付け性試験を、はんだペーストを実装部品に合わせた大きさの溶融はんだ球にして測定するので、従来の測定方法に比較して外部からの熱の影響を無くした方法であり、簡便に精度良く測定することができる。  Since this invention measures the solderability test of surface-mounted components using various solder pastes as a molten solder ball of a size that matches the solder paste to the mounted components, compared to conventional measuring methods, It is a method that eliminates the influence of heat, and can be easily and accurately measured.

この発明を実施するための最良の形態を、図面を用いて説明する。図5は使用する試料治具板の平面図(a)および側面図(b)である。図5(b)中、(4)は治具板で上面ははんだペーストが溶融したときに濡れ広がらないで球が出来るようにレジスト膜(15)が形成されている。このレジスト膜(15)は、測定する実装部品の大きさに合わせて治具板の中心に直径1mm、2mm、4mmなど、任意の円の外側の部分に施す。また、印刷するはんだペーストの量は溶融時の球の大きさを考慮してスクリーン印刷またはロールコーターで塗布して行う。ここで重要なことは実装部品の大きさに合わせレジスト膜径、スクリーンの大きさを決める事である。図6は実際の測定手順を示している。図6(a)のようにはんだペーストが印刷された試験治具板を加熱コントロールされたアルミブロックの上に置く。はんだペーストは溶融され、球形を形成する(図6(b))。次に実装部品をはんだ球に浸せきさせ、濡れ力を測定する。図7は濡れ出力の波形の説明図である。t0は実装部品が溶融はんだ球に接触した時でt1は実装部品とはんだが90°の接触角を生じた時で、T1=t1−t0を濡れが始まる時間として評価する。  The best mode for carrying out the present invention will be described with reference to the drawings. FIG. 5 is a plan view (a) and a side view (b) of the sample jig plate used. In FIG. 5B, (4) is a jig plate, and the resist film (15) is formed on the upper surface so that a sphere can be formed without wetting and spreading when the solder paste is melted. This resist film (15) is applied to the outer part of an arbitrary circle such as a diameter of 1 mm, 2 mm or 4 mm in the center of the jig plate in accordance with the size of the mounted component to be measured. The amount of solder paste to be printed is applied by screen printing or roll coater in consideration of the size of the sphere at the time of melting. What is important here is to determine the resist film diameter and the screen size according to the size of the mounted component. FIG. 6 shows an actual measurement procedure. As shown in FIG. 6A, a test jig plate on which a solder paste is printed is placed on an aluminum block that is controlled by heating. The solder paste is melted to form a spherical shape (FIG. 6B). Next, the mounting component is immersed in a solder ball, and the wetting force is measured. FIG. 7 is an explanatory diagram of the waveform of the wetting output. t0 is the time when the mounting component comes into contact with the molten solder ball, t1 is the time when the mounting component and the solder have a contact angle of 90 °, and T1 = t1−t0 is evaluated as the time when wetting begins.

この発明の実装部品のはんだ濡れ性評価試験方法および装置は、電子・電気製品の小型化に対応して微小化が進む実装部品のはんだ濡れ性を比較的短時間に、簡便に精度良く測定できる方法であり、かつ従来の装置を一部改造するたけで容易に利用できる利点があり、当該産業に於いて利用価値が非常に高い。  The method and apparatus for evaluating solder wettability of mounted components according to the present invention can easily and accurately measure the solder wettability of mounted components that are becoming smaller in response to miniaturization of electronic and electrical products in a relatively short time. This method is advantageous in that it can be easily used by simply modifying a conventional apparatus, and its utility value is very high in the industry.

急速加熱試験法の概念図である。It is a conceptual diagram of the rapid heating test method. 急速加熱試験法を用いた濡れ力の出力波形の説明図である。It is explanatory drawing of the output waveform of the wetting force using the rapid heating test method. プロフアイル試験法の概念図である。It is a conceptual diagram of a profile test method. はんだ小球法の概念図である。It is a conceptual diagram of the solder ball method. 試験治具板の説明図である。It is explanatory drawing of a test jig board. 実際の測定方法の説明図である。It is explanatory drawing of an actual measuring method. はんだ小球法を用いた濡れ力の出力波形の説明図である。It is explanatory drawing of the output waveform of the wetting force using the solder ball method.

符号の説明Explanation of symbols

1 表面実装部品
2 接続チャック
3 印刷されたはんだペースト
4 試験治具板
5 治具板保持機構
6 溶融はんだポット
7 ホットプレート
8 ピンセット
9 はんだペレット
10 溶融されたはんだ小球
11 アルミニウムブロック
12 鉄芯
13 ヒータ
14 制御用熱電対
15 レジスト膜
DESCRIPTION OF SYMBOLS 1 Surface mount component 2 Connection chuck 3 Printed solder paste 4 Test jig board 5 Jig board holding mechanism 6 Molten solder pot 7 Hot plate 8 Tweezers 9 Solder pellet 10 Molten solder ball 11 Aluminum block 12 Iron core 13 Heater 14 Control thermocouple 15 Resist film

Claims (5)

はんだペーストと微小な実装部品との濡れ性評価を、加熱装置を備えた試験治具の表面に、該鉛フリーはんだが溶解して形成された小球状の溶融はんだと実装部品とを接触させた後、実装部品を引き上げる力を検出することを特徴とする、はんだ濡れ性の測定方法および装置。  Evaluation of wettability between solder paste and minute mounting parts was made by contacting the mounting parts with small spherical molten solder formed by melting the lead-free solder on the surface of a test jig equipped with a heating device. Thereafter, a method and an apparatus for measuring solder wettability, wherein a force for pulling up a mounted component is detected. 試験治具板にレジスト膜を形成し、試験治具板にはんだペーストを印刷または塗布した後、加熱してはんだペーストを溶解してはんだ小球を作り、溶融はんだ小球を利用して実装部品のはんた濡れ性の評価をおこなうことを特徴とする、はんだ濡れ性の測定方法及び装置。  A resist film is formed on the test jig plate, and solder paste is printed or applied to the test jig plate, and then heated to melt the solder paste to create solder balls, which are mounted components using the molten solder balls. A solder wettability measuring method and apparatus, characterized in that evaluation of solder wettability is performed. 実装部品の大きさに合わせレジスト膜径、ソルダペースト印刷量を決めて溶融はんだ小球を作り、はんだ濡れ性を評価することを特徴とする、請求項1または請求項2に記載のはんだ濡れ性の測定方法及び装置。  3. The solder wettability according to claim 1, wherein the solder wettability is evaluated by determining a resist film diameter and a solder paste printing amount according to the size of the mounted component to create a molten solder ball. Measuring method and apparatus. 実装部品が表面実装部品であり、はんだペーストが鉛フリーはんだであることを特徴とする、請求項1または請求項2または請求項3の何れか一項に記載のはんだ濡れ性の測定方法及び装置。  4. The method and apparatus for measuring solder wettability according to claim 1, wherein the mounted component is a surface-mounted component, and the solder paste is lead-free solder. . 試験治具板上に形成するレジスト膜の形成およびはんだペースト膜の印刷または塗布をスクリーン印刷法、ロール塗布法で行うことを特徴とする請求項2に記載のはんだ濡れ性の測定方法及び装置。  3. The method and apparatus for measuring solder wettability according to claim 2, wherein a resist film formed on the test jig plate and a solder paste film are printed or applied by a screen printing method or a roll coating method.
JP2003293612A 2003-07-11 2003-07-11 Method and apparatus for evaluation test of solder wettability of mounting component Pending JP2005033149A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2475600A (en) * 2009-11-21 2011-05-25 Graham Naisbitt Synchronous testing of the solderability of components and solder paste usability
WO2013051650A1 (en) * 2011-10-06 2013-04-11 新日鉄住金マテリアルズ株式会社 Method for assessing solder mounting performance

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2475600A (en) * 2009-11-21 2011-05-25 Graham Naisbitt Synchronous testing of the solderability of components and solder paste usability
WO2013051650A1 (en) * 2011-10-06 2013-04-11 新日鉄住金マテリアルズ株式会社 Method for assessing solder mounting performance
JPWO2013051650A1 (en) * 2011-10-06 2015-03-30 新日鉄住金マテリアルズ株式会社 Solder mountability evaluation method

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