JP2005003667A5 - - Google Patents
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- JP2005003667A5 JP2005003667A5 JP2003428088A JP2003428088A JP2005003667A5 JP 2005003667 A5 JP2005003667 A5 JP 2005003667A5 JP 2003428088 A JP2003428088 A JP 2003428088A JP 2003428088 A JP2003428088 A JP 2003428088A JP 2005003667 A5 JP2005003667 A5 JP 2005003667A5
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003428088A JP2005003667A (en) | 2003-05-16 | 2003-12-24 | Reference axis setting optical system, eccentricity measuring machine and eccentricity-measuring method using the optical system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003139295 | 2003-05-16 | ||
JP2003428088A JP2005003667A (en) | 2003-05-16 | 2003-12-24 | Reference axis setting optical system, eccentricity measuring machine and eccentricity-measuring method using the optical system |
Publications (2)
Publication Number | Publication Date |
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JP2005003667A JP2005003667A (en) | 2005-01-06 |
JP2005003667A5 true JP2005003667A5 (en) | 2007-02-15 |
Family
ID=34106322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003428088A Pending JP2005003667A (en) | 2003-05-16 | 2003-12-24 | Reference axis setting optical system, eccentricity measuring machine and eccentricity-measuring method using the optical system |
Country Status (1)
Country | Link |
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JP (1) | JP2005003667A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5217350B2 (en) * | 2007-10-12 | 2013-06-19 | 株式会社ニコン | Eccentricity measuring device |
JP2015175822A (en) * | 2014-03-18 | 2015-10-05 | 富士通株式会社 | Focal length measurement method and measurement device |
JP2015184255A (en) * | 2014-03-26 | 2015-10-22 | 富士通株式会社 | Focal length measurement method and measurement device |
JPWO2022224344A1 (en) * | 2021-04-20 | 2022-10-27 | ||
CN113670232A (en) * | 2021-08-18 | 2021-11-19 | 歌尔光学科技有限公司 | Virtual reality equipment eccentric standard sample and standard sample eccentric value measuring method |
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2003
- 2003-12-24 JP JP2003428088A patent/JP2005003667A/en active Pending