JP2004251679A - Electromagnetic field measuring unit - Google Patents

Electromagnetic field measuring unit Download PDF

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Publication number
JP2004251679A
JP2004251679A JP2003040599A JP2003040599A JP2004251679A JP 2004251679 A JP2004251679 A JP 2004251679A JP 2003040599 A JP2003040599 A JP 2003040599A JP 2003040599 A JP2003040599 A JP 2003040599A JP 2004251679 A JP2004251679 A JP 2004251679A
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Prior art keywords
electromagnetic field
modulated
signal
antenna
field measuring
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JP2003040599A
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Japanese (ja)
Inventor
Tsutomu Chin
陳　　強
Kunio Sawatani
邦男 澤谷
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Intelligent Cosmos Research Institute
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Intelligent Cosmos Research Institute
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Abstract

<P>PROBLEM TO BE SOLVED: To reduce complexity in analysis and to improve instant detection properties in an electromagnetic field measuring unit. <P>SOLUTION: The electromagnetic field measuring unit comprises: a plurality of modulation scattering elements 14 that receive local signals having different frequencies and are arranged on a circumference with a specific radius; a reception antenna 15 for receiving modulation scattered signals, where radiation signals from a radiation source are modulated by the modulation scattering elements 14; and a reference antenna 16 installed at a specific position to generate a reference signal of a signal received by the reception antenna 15. <P>COPYRIGHT: (C)2004,JPO&NCIPI

Description

【０００１】
【発明の属する技術分野】
この発明は、電磁界測定装置に関するものであり、特に、漏洩電磁波を測定する電磁界測定装置に関するものである。
【０００２】
【従来の技術】
近年、電磁波の利用形態が多様化・一般化し、利用密度も飛躍的に増大する傾向にある。このような状況の中で、昨今電磁環境両立性（ＥＭＣ：Ｅｌｅｃｔｒｏ Ｍａｇｎｅｔｉｃ Ｃｏｍｐａｔｉｂｉｌｉｔｙ）に関する問題がある。具体的には、無線端末が送信する電磁波や電子機器から漏洩する不要電磁波が他の装置に干渉して誤動作や通信品質を低下させる障害が発生しているため、重大な社会的影響が懸念されている。
【０００３】
これらの不要電波を測定する装置として、互いに１８０°向き合わせて配置され、二つの校正された電磁界測定プローブと、この電磁界測定プローブを測定対象の電磁波源を中心として１８０°回転させ、電磁界分布や波原分布を求める電磁界分布測定装置がある（例えば、特許文献１を参照）。
【０００４】
【特許文献１】
特開平０５−０２６９３０号公報（第３−５頁、第１図）
【０００５】
【発明が解決しようとする課題】
しかしながら、この電磁界分布測定装置は、電磁波源を取り囲む曲面上の電磁界を測定し、得られた電磁界分布を解析して波源分布を求め、あるいは、電磁波源を含む閉曲面上の電磁界分布を測定し、この電磁界分布から任意の点における電磁界を求める必要があった。したがって、この電磁界分布測定装置は、上述のような複雑な解析を必要とするため、解析に時間がかかるとともに、瞬時探知性に劣るという欠点があった。
【０００６】
この発明は、上記に鑑みてなされたものであり、複雑な解析を必要とせず、瞬時探知性に優れた電磁界測定装置を提供することを目的とする。
【０００７】
【課題を解決するための手段】
上述した課題を解決し、目的を達成するために、この発明にかかる電磁界測定装置にあっては、それぞれに異なる周波数のローカル信号が印加され、所定の半径の円周上に配置される複数の変調散乱素子と、放射源からの放射信号が前記変調散乱素子で変調された変調散乱信号を受信する受信アンテナとを備えたことを特徴とする。
【０００８】
この発明によれば、所定の半径の円周上に配置される複数のアンテナ素子は、それぞれに異なる周波数のローカル信号が印加される。また、放射源から放射された放射信号がこれらのアンテナ素子で変調され、受信アンテナは、これらの変調散乱信号を受信する。
【０００９】
つぎの発明にかかる電磁界測定装置にあっては、前記受信アンテナが受信した信号の基準信号を生成するために所定の位置に設置される参照アンテナをさらに備えたことを特徴とする。
【００１０】
この発明によれば、所定の位置に設置された参照アンテナは、受信アンテナが受信した信号の基準信号を生成するために使用され、電磁界の強度分布だけでなく、位相分布をも求めることができる。
【００１１】
【発明の実施の形態】
以下、この発明にかかる電磁界測定装置の実施の形態を図面に基づいて詳細に説明する。なお、この実施の形態によりこの発明が限定されるものではない。
【００１２】
図１は、この発明の実施の形態にかかる電磁界測定装置の構成を示す概要図である。同図に示す電磁界測定装置は、放射源１２を取り囲む所定半径の円周上に配置された多数の変調散乱素子１４と、ｙ軸上に設置された受信アンテナ１５と、受信アンテナ１５から送信された信号の波形を時間領域で記録する時間波形記録装置２１と、時間波形記録装置２１から送信された信号の波形を解析する波形解析装置２２とを備えている。
【００１３】
つぎに、図１を用いて、この電磁界測定装置の動作を説明する。複数の変調散乱素子１４には、それぞれ異なる周波数のローカル信号が印加されている。一方、放射源１２から放射された電磁波は、これらの変調散乱素子１４で散乱される。このとき、変調散乱素子１４で散乱される散乱波は、それぞれが異なる周波数で変調された変調散乱波となる。ｙ軸上に配置された受信アンテナ１５は、この変調散乱波を受信し、この受信信号を時間波形記録装置２１に送信する。時間波形記録装置２１は、受信アンテナ１５から送信された信号を記録する。時間波形記録装置２１で記録された信号は、波形解析装置２２に送信される。波形解析装置２２は、時間領域の信号を周波数領域の信号に変換（例えば、フーリエ変換）するとともに変換された信号を処理して電磁界測定面での電磁界強度分布を作成する。
【００１４】
図２は、変調散乱素子として用いられる変調散乱ダイポールアンテナの模式的な構造を示す図である。同図に示すように、ダイポールアンテナの給電端と並列にダイオード１７を装荷することによって、変調散乱素子を構成することができる。同図では、ダイオード１７に印加するローカル信号を同軸ケーブルで給電する例を示しているが、同軸ケーブルで給電せずにダイポールアンテナに直接ＶＣＯ（電圧制御発振器）を取り付けてもよい。また、同軸ケーブルで給電する場合、同軸ケーブルとダイポールアンテナとの間のインピーダンス整合を取るために、これらの間にバランを挿入したり、抵抗素子を挿入してもよい。
【００１５】
図３は、変調散乱素子の動作を説明するための説明図である。同図において、変調散乱素子１４には信号発生器２４からローカル信号（周波数ｆＬＯ）が印加されている。一方、放射源を模擬する送信アンテナ１９には信号発生器２３からＲＦ信号（周波数ｆＲＦ）が印加されている。いま、変調散乱素子１４にＲＦ信号がＲが入射すると、変調散乱素子１４に装荷されたダイオードはミキシングダイオードとして動作し、変調散乱素子１４からは主な周波数成分としてｆ＝ｆＲＦ＋ｆＬＯまたはｆ＝ｆＲＦ−ｆＬＯの周波数の信号が再放射される。
【００１６】
図４は、図１に示す電磁界測定装置において、さらに参照アンテナを備えた電磁界測定装置の構成を示す概要図である。同図において、参照アンテナ１６は、変調散乱素子１４が配置される円周を挟んで受信アンテナ１５と対角の位置に設置されている。参照アンテナ１６で受信した信号は、位相測定における基準信号となるものである。したがって、図４に示す電磁界測定装置では、電磁界強度分布に加えて位相分布を求めることができる。なお、図４では、参照アンテナ１６の位置を変調散乱素子１４が配置される円周を挟んで受信アンテナ１５と対角の位置に設置しているが、この位置に限られるものではなく、放射源１２からの信号が所定のレベルで受信できる任意の位置に設置することができる。
【００１７】
（測定結果）
図５は、図１に示す電磁界測定装置の測定系を示す概要図である。同図において、放射源１２が座標系の中心に設置され、半径Ｒの円周上に３つの変調散乱素子１４ａ、１４ｂ、１４ｃが設置されている。変調散乱素子１４ａはｘ軸上に設置され、変調散乱素子１４ｂはｚ軸方向から見て時計回りの方向に変調散乱素子１４ａから素子間隔ｄだけ離間して設置され、変調散乱素子１４ｃはｚ軸方向から見て反時計回りの方向に変調散乱素子１４ａから素子間隔ｄだけ離間した位置に設置されている。受信アンテナ１５は、放射源１２の上方（ｚ軸上）に放射源１２からλ０だけ離間した位置に設置されている。参照アンテナ１６は、変調散乱素子１４の下方にλ０だけ離間した位置に設置されている。
【００１８】
つぎに、電磁界強度分布および位相分布の測定の手順について説明する。まず、変調散乱素子１４ａのみを設置し、他の変調散乱素子１４ｂ、１４ｃを除去した状態で電界強度を測定する。このとき得られた電界強度をＰ０とする。
【００１９】
つぎに、変調散乱素子１４ａ、１４ｂ、１４ｃの３本を用いて、変調散乱素子１４ａの場合と同様な条件で電界強度を測定する。この測定で得られた電界強度は、素子間隔ｄの関数であり、これをＰ（ｄ）とする。このとき、素子間隔ｄの変化に対するＰ（ｄ）／Ｐ０の値を評価し、この値が±１ｄＢ以内にある素子間隔を選ぶ。測定結果は省略するが、素子間隔が３λ０／２以上のときは、Ｐ（ｄ）／Ｐ０がこの要件を満たすことを確認している。
【００２０】
そこで、図５において、二つの変調散乱素子１４ｂ、１４ｃを素子間隔ｄ＝３λ０／２の位置に配置し（すなわち、これらの変調素子間隔は３λ０となる。）、放射源１２をｚ軸の周りに回転させ、変調散乱素子１４ｂ、１４ｃから散乱される変調散乱波を用いて電磁界強度分布および位相分布を測定する。
【００２１】
図６（ａ）は、この測定によって得られた電磁界強度分布を示すグラフであり、（ｂ）は、この測定によって得られた位相分布を示すグラフである。同図（ａ）および（ｂ）に示すグラフにおいて、変調散乱法とは、二つの変調散乱素子１４ｂ、１４ｃを変調散乱素子として使用し、上述した測定手法に基づいて測定した測定結果であり、直接測定とは、ネットワークアナライザを用いて直接測定した測定結果である。なお、同図（ａ）および（ｂ）において、θとは、放射源の主放射方向とｘ軸とのなす角度であり、φとはθ＝０°のときに受信された信号の位相を基準とした信号位相を示すものである。
【００２２】
測定に使用したその他のパラメータは、放射源１２から送信される周波数ｆＲＦ＝１ＧＨｚ、Ｒ＝０．６ｍ（２λ０）、ｄ＝０．４５ｍ（３／２λ０）、変調散乱素子１４ｂのローカル信号ｆＬＯ１＝８０ＭＨｚ、変調散乱素子１４ｃのローカル信号ｆＬＯ２＝６０ＭＨｚである。
【００２３】
図６（ａ）および（ｂ）の結果を見れば明らかなように、電磁界強度分布および位相分布ともに精度よく測定されていることが確認できる。なお、図１に示した電磁界測定装置を用いれば、図６（ａ）の電磁界強度分を測定することができる。
【００２４】
なお、この測定では、放射源１２を回転させ、円周上に配置した二つの変調散乱素子を用いて電磁界強度分布および位相分布を測定したが、実際には、放射源１２の周りに複数の変調散乱素子が配置され、時々刻々と変化する時系列信号を周波数領域信号に変換するだけで、電磁界強度とその位相を短時間に出力することができる。
【００２５】
なお、この実施の形態では受信アンテナ１５と時間波形記録装置２１を信号ケーブルで接続する例を示したが、この例に限られるものではなく、受信アンテナ１５で受信した信号を、無線信号で時間波形記録装置２１に送信させることも可能である。
【００２６】
以上説明したように、この実施の形態の電磁界測定装置によれば、所定の半径の円周上に配置される複数のアンテナ素子は、それぞれに異なる周波数のローカル信号が印加されるとともに、放射源から放射された放射信号がこれらのアンテナ素子で変調され、受信アンテナは、これらの変調散乱信号を受信するようにしているので、複雑な解析を必要とせず、瞬時探知性に優れた電磁界測定装置を提供することができる。
【００２７】
また、この実施の形態の電磁界測定装置によれば、受信アンテナが受信した信号の基準信号を生成するために所定の位置に参照アンテナを設置するようにしているので、電磁界の強度分布だけでなく、位相分布をも求めることができる。
【００２８】
【発明の効果】
以上説明したとおり、この発明によれば、所定の半径の円周上に配置される複数のアンテナ素子は、それぞれに異なる周波数のローカル信号が印加されるるとともに、放射源から放射された放射信号がこれらのアンテナ素子で変調され、受信アンテナは、これらの変調散乱信号を受信するようにしているので、複雑な解析を必要とせず、瞬時探知性に優れた電磁界測定装置を提供することができる。
【図面の簡単な説明】
【図１】この発明の実施の形態にかかる電磁界測定装置の構成を示す概要図である。
【図２】変調散乱素子として用いられる変調散乱ダイポールアンテナの模式的な構造を示す図である。
【図３】変調散乱素子の動作を説明するための説明図である。
【図４】図１に示す電磁界測定装置において、さらに参照アンテナを備えた電磁界測定装置の構成を示す概要図である。
【図５】図１に示す電磁界測定装置の測定系を示す概要図である。
【図６】（ａ）は、この測定によって得られた電磁界強度分布を示すグラフであり、（ｂ）は、この測定によって得られた位相分布を示すグラフである。
【符号の説明】
１２ 放射源
１４，１４ａ，１４ｂ，１４ｃ 変調散乱素子
１５ 受信アンテナ
１６ 参照アンテナ
１７ ダイオード
１９ 送信アンテナ
２１ 時間波形記録装置
２２ 波形解析装置
２３，２４ 信号発生器[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an electromagnetic field measuring apparatus, and more particularly to an electromagnetic field measuring apparatus that measures leaked electromagnetic waves.
[0002]
[Prior art]
In recent years, the use forms of electromagnetic waves have been diversified and generalized, and the use density has been increasing dramatically. Under such circumstances, there has recently been a problem regarding electromagnetic compatibility (EMC). Specifically, there is a concern about serious social impact because electromagnetic waves transmitted by wireless terminals and unwanted electromagnetic waves leaking from electronic devices interfere with other devices and cause malfunctions and degradation of communication quality. ing.
[0003]
As an apparatus for measuring these unnecessary radio waves, two calibrated electromagnetic field measurement probes which are arranged to face each other by 180 °, and this electromagnetic field measurement probe are rotated by 180 ° around the electromagnetic wave source to be measured, There is an electromagnetic field distribution measuring device for obtaining a field distribution and a wave field distribution (see, for example, Patent Document 1).
[0004]
[Patent Document 1]
Japanese Patent Laid-Open No. 05-026930 (page 3-5, FIG. 1)
[0005]
[Problems to be solved by the invention]
However, this electromagnetic field distribution measuring device measures the electromagnetic field on the curved surface surrounding the electromagnetic wave source and analyzes the obtained electromagnetic field distribution to obtain the wave source distribution, or the electromagnetic field on the closed curved surface including the electromagnetic wave source. It was necessary to measure the distribution and obtain the electromagnetic field at an arbitrary point from this electromagnetic field distribution. Therefore, this electromagnetic field distribution measuring apparatus requires the complicated analysis as described above, and thus has the disadvantages that it takes time for the analysis and is inferior in instantaneous detectability.
[0006]
The present invention has been made in view of the above, and an object of the present invention is to provide an electromagnetic field measuring apparatus that does not require complicated analysis and has excellent instantaneous detectability.
[0007]
[Means for Solving the Problems]
In order to solve the above-described problems and achieve the object, in the electromagnetic field measurement apparatus according to the present invention, a plurality of local signals having different frequencies are applied to each other and arranged on the circumference of a predetermined radius. And a receiving antenna that receives the modulated scattered signal obtained by modulating the radiation signal from the radiation source by the modulated scattering element.
[0008]
According to the present invention, local signals having different frequencies are applied to the plurality of antenna elements arranged on the circumference of a predetermined radius. Further, the radiation signal radiated from the radiation source is modulated by these antenna elements, and the receiving antenna receives these modulated scattered signals.
[0009]
The electromagnetic field measurement apparatus according to the next invention is characterized by further comprising a reference antenna installed at a predetermined position in order to generate a reference signal of a signal received by the reception antenna.
[0010]
According to the present invention, the reference antenna installed at a predetermined position is used to generate a reference signal of the signal received by the receiving antenna, and can obtain not only the electromagnetic field intensity distribution but also the phase distribution. it can.
[0011]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of an electromagnetic field measuring apparatus according to the present invention will be described below in detail with reference to the drawings. Note that the present invention is not limited to the embodiments.
[0012]
FIG. 1 is a schematic diagram showing a configuration of an electromagnetic field measuring apparatus according to an embodiment of the present invention. The electromagnetic field measuring apparatus shown in FIG. 1 has a large number of modulated scattering elements 14 arranged on a circumference of a predetermined radius surrounding the radiation source 12, a receiving antenna 15 installed on the y-axis, and transmission from the receiving antenna 15. A time waveform recording device 21 that records the waveform of the received signal in the time domain, and a waveform analysis device 22 that analyzes the waveform of the signal transmitted from the time waveform recording device 21.
[0013]
Next, the operation of this electromagnetic field measuring apparatus will be described with reference to FIG. A plurality of local signals having different frequencies are applied to the plurality of modulated scattering elements 14. On the other hand, the electromagnetic waves radiated from the radiation source 12 are scattered by these modulated scattering elements 14. At this time, the scattered waves scattered by the modulated scattering element 14 become modulated scattered waves modulated at different frequencies. The receiving antenna 15 arranged on the y-axis receives this modulated scattered wave and transmits this received signal to the time waveform recording device 21. The time waveform recording device 21 records the signal transmitted from the receiving antenna 15. The signal recorded by the time waveform recording device 21 is transmitted to the waveform analysis device 22. The waveform analyzer 22 converts a time domain signal into a frequency domain signal (for example, Fourier transform) and processes the converted signal to create an electromagnetic field intensity distribution on the electromagnetic field measurement surface.
[0014]
FIG. 2 is a diagram showing a schematic structure of a modulated scattering dipole antenna used as a modulated scattering element. As shown in the figure, a modulated scattering element can be configured by loading a diode 17 in parallel with the feeding end of the dipole antenna. In the figure, an example is shown in which a local signal applied to the diode 17 is fed by a coaxial cable, but a VCO (voltage controlled oscillator) may be directly attached to the dipole antenna without feeding by the coaxial cable. When power is supplied by a coaxial cable, a balun or a resistance element may be inserted between the coaxial cable and the dipole antenna in order to achieve impedance matching.
[0015]
FIG. 3 is an explanatory diagram for explaining the operation of the modulated scattering element. In the figure, a local signal (frequency f LO ) is applied from the signal generator 24 to the modulated scattering element 14. On the other hand, an RF signal (frequency f RF ) is applied from the signal generator 23 to the transmission antenna 19 that simulates the radiation source. Now, when the RF signal R is incident on the modulated scattering element 14, the diode loaded on the modulated scattering element 14 operates as a mixing diode, and f = f RF + f LO or f as a main frequency component from the modulated scattering element 14. A signal with a frequency of = f RF -f LO is re-radiated.
[0016]
FIG. 4 is a schematic diagram showing a configuration of the electromagnetic field measuring apparatus further including a reference antenna in the electromagnetic field measuring apparatus shown in FIG. In the figure, the reference antenna 16 is installed at a position diagonal to the receiving antenna 15 across the circumference where the modulated scattering element 14 is arranged. The signal received by the reference antenna 16 becomes a reference signal in phase measurement. Therefore, the electromagnetic field measuring apparatus shown in FIG. 4 can obtain the phase distribution in addition to the electromagnetic field intensity distribution. In FIG. 4, the position of the reference antenna 16 is set at a position diagonal to the receiving antenna 15 across the circumference where the modulated scattering element 14 is arranged, but the position is not limited to this position, and radiation is performed. It can be installed at any position where the signal from the source 12 can be received at a predetermined level.
[0017]
(Measurement result)
FIG. 5 is a schematic diagram showing a measurement system of the electromagnetic field measuring apparatus shown in FIG. In the figure, the radiation source 12 is installed at the center of the coordinate system, and three modulated scattering elements 14a, 14b, 14c are installed on the circumference of the radius R. The modulated scattering element 14a is installed on the x-axis, the modulated scattering element 14b is installed in the clockwise direction when viewed from the z-axis direction, and is separated from the modulated scattering element 14a by the element interval d, and the modulated scattering element 14c is installed in the z-axis. It is installed at a position spaced apart from the modulated scattering element 14a by an element interval d in a counterclockwise direction when viewed from the direction. The receiving antenna 15 is installed above the radiation source 12 (on the z axis) at a position spaced apart from the radiation source 12 by λ 0 . The reference antenna 16 is installed below the modulation scattering element 14 at a position separated by λ 0 .
[0018]
Next, procedures for measuring the electromagnetic field intensity distribution and the phase distribution will be described. First, the electric field strength is measured with only the modulated scattering element 14a installed and the other modulated scattering elements 14b and 14c removed. The electric field strength obtained at this time is P 0 .
[0019]
Next, the electric field strength is measured under the same conditions as in the case of the modulated scattering element 14a using the three modulated scattering elements 14a, 14b, and 14c. The electric field strength obtained by this measurement is a function of the element interval d, and this is P (d). At this time, the value of P (d) / P 0 with respect to the change of the element interval d is evaluated, and the element interval having this value within ± 1 dB is selected. Measurement results is omitted, element spacing is 3 [lambda] 0/2 or more time, P (d) / P 0 is sure to meet this requirement.
[0020]
Therefore, in FIG. 5, arranged two modulation scattering element 14b, and 14c to the position of the element spacing d = 3λ 0/2 (i.e., these modulation element interval is 3 [lambda] 0.), A radiation source 12 z-axis The electromagnetic field intensity distribution and the phase distribution are measured using modulated scattered waves scattered from the modulated scattering elements 14b and 14c.
[0021]
FIG. 6A is a graph showing the electromagnetic field intensity distribution obtained by this measurement, and FIG. 6B is a graph showing the phase distribution obtained by this measurement. In the graphs shown in FIGS. 4A and 4B, the modulated scattering method is a measurement result measured based on the above-described measurement method using two modulated scattering elements 14b and 14c as modulated scattering elements. The direct measurement is a measurement result directly measured using a network analyzer. In FIGS. 2A and 2B, θ is an angle formed by the main radiation direction of the radiation source and the x axis, and φ is the phase of the signal received when θ = 0 °. It shows the signal phase as a reference.
[0022]
Other parameters used for the measurement are the frequency f RF = 1 GHz transmitted from the radiation source 12, R = 0.6 m (2λ 0 ), d = 0.45 m (3 / 2λ 0 ), the locality of the modulation scattering element 14 b. The signal f LO1 = 80 MHz, and the local signal f LO2 = 60 MHz of the modulated scattering element 14 c.
[0023]
As is apparent from the results of FIGS. 6A and 6B, it can be confirmed that both the electromagnetic field intensity distribution and the phase distribution are accurately measured. If the electromagnetic field measuring apparatus shown in FIG. 1 is used, the electromagnetic field intensity component shown in FIG. 6A can be measured.
[0024]
In this measurement, the radiation source 12 is rotated, and the electromagnetic field intensity distribution and the phase distribution are measured using two modulated scattering elements arranged on the circumference. Thus, the electromagnetic field intensity and its phase can be output in a short time by simply converting a time-series signal that changes every moment into a frequency domain signal.
[0025]
In this embodiment, an example is shown in which the receiving antenna 15 and the time waveform recording device 21 are connected by a signal cable. However, the present invention is not limited to this example. It is also possible to transmit to the waveform recording device 21.
[0026]
As described above, according to the electromagnetic field measurement apparatus of this embodiment, a plurality of antenna elements arranged on the circumference of a predetermined radius are applied with local signals of different frequencies and radiated. The radiated signal radiated from the source is modulated by these antenna elements, and the receiving antenna receives these modulated scattered signals. Therefore, it does not require complicated analysis and has an excellent electromagnetic field detection capability. A measuring device can be provided.
[0027]
Further, according to the electromagnetic field measurement apparatus of this embodiment, since the reference antenna is installed at a predetermined position in order to generate the reference signal of the signal received by the receiving antenna, only the intensity distribution of the electromagnetic field In addition, the phase distribution can be obtained.
[0028]
【The invention's effect】
As described above, according to the present invention, a plurality of antenna elements arranged on the circumference of a predetermined radius are applied with local signals having different frequencies, and the radiation signals radiated from the radiation source are received. Modulated by these antenna elements, and the receiving antenna receives these modulated scattered signals, so that it is possible to provide an electromagnetic field measuring apparatus excellent in instantaneous detectability without requiring complicated analysis. .
[Brief description of the drawings]
FIG. 1 is a schematic diagram showing a configuration of an electromagnetic field measuring apparatus according to an embodiment of the present invention.
FIG. 2 is a diagram showing a schematic structure of a modulated scattering dipole antenna used as a modulated scattering element.
FIG. 3 is an explanatory diagram for explaining the operation of a modulated scattering element;
4 is a schematic diagram showing a configuration of an electromagnetic field measuring apparatus further including a reference antenna in the electromagnetic field measuring apparatus shown in FIG. 1. FIG.
5 is a schematic diagram showing a measurement system of the electromagnetic field measuring apparatus shown in FIG.
6A is a graph showing an electromagnetic field intensity distribution obtained by this measurement, and FIG. 6B is a graph showing a phase distribution obtained by this measurement.
[Explanation of symbols]
12 Radiation sources 14, 14a, 14b, 14c Modulation scattering element 15 Reception antenna 16 Reference antenna 17 Diode 19 Transmission antenna 21 Time waveform recording device 22 Waveform analysis device 23, 24 Signal generator

Claims (2)

それぞれに異なる周波数のローカル信号が印加され、所定の半径の円周上に配置される複数の変調散乱素子と、
放射源からの放射信号が前記変調散乱素子で変調された変調散乱信号を受信する受信アンテナと、
を備えたことを特徴とする電磁界測定装置。A plurality of modulated scattering elements, each of which is applied with a local signal having a different frequency and arranged on a circumference of a predetermined radius;
A receiving antenna for receiving a modulated scattered signal in which a radiation signal from a radiation source is modulated by the modulated scattering element;
An electromagnetic field measuring apparatus comprising: 前記受信アンテナが受信した信号の基準信号を生成するために所定の位置に設置される参照アンテナをさらに備えたことを特徴とする請求項１に記載の電磁界測定装置。The electromagnetic field measurement apparatus according to claim 1, further comprising a reference antenna installed at a predetermined position in order to generate a reference signal of a signal received by the reception antenna.
JP2003040599A 2003-02-19 2003-02-19 Electromagnetic field measuring unit Pending JP2004251679A (en)

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WO2006100360A1 (en) * 2005-03-23 2006-09-28 Centre National De La Recherche Scientifique (C.N.R.S.) Electromagnetic field acquisition method and system
JP2008107197A (en) * 2006-10-25 2008-05-08 Akita Prefecture System for measuring electromagnetic field
CN109142888A (en) * 2018-09-25 2019-01-04 北京空间飞行器总体设计部 A kind of satellite electromagnetic leakage localization method and system
CN104792456B (en) * 2008-02-29 2024-02-13 斯达威力艾都威乐有限两合公司 Operating device for calibrating torque wrench

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JPH0436665A (en) * 1990-06-01 1992-02-06 Nippon Telegr & Teleph Corp <Ntt> Electromagnetic field intensity measuring instrument
US5410324A (en) * 1991-03-14 1995-04-25 Centre National De La Recherche Scientifique Method and apparatus for determining antenna radiation patterns
JP2002026637A (en) * 2000-07-10 2002-01-25 Hiroshi Hata Split strip antenna
JP2002531978A (en) * 1998-11-27 2002-09-24 コミッサリア ア レネルジー アトミーク Ultrasonic contact transducer with multiple elements
WO2003012465A1 (en) * 2001-07-27 2003-02-13 Advantest Corporation Electromagnetic wave measuring apparatus

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Publication number Priority date Publication date Assignee Title
JPH0436665A (en) * 1990-06-01 1992-02-06 Nippon Telegr & Teleph Corp <Ntt> Electromagnetic field intensity measuring instrument
US5410324A (en) * 1991-03-14 1995-04-25 Centre National De La Recherche Scientifique Method and apparatus for determining antenna radiation patterns
JP2002531978A (en) * 1998-11-27 2002-09-24 コミッサリア ア レネルジー アトミーク Ultrasonic contact transducer with multiple elements
JP2002026637A (en) * 2000-07-10 2002-01-25 Hiroshi Hata Split strip antenna
WO2003012465A1 (en) * 2001-07-27 2003-02-13 Advantest Corporation Electromagnetic wave measuring apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006100360A1 (en) * 2005-03-23 2006-09-28 Centre National De La Recherche Scientifique (C.N.R.S.) Electromagnetic field acquisition method and system
JP2008107197A (en) * 2006-10-25 2008-05-08 Akita Prefecture System for measuring electromagnetic field
CN104792456B (en) * 2008-02-29 2024-02-13 斯达威力艾都威乐有限两合公司 Operating device for calibrating torque wrench
CN109142888A (en) * 2018-09-25 2019-01-04 北京空间飞行器总体设计部 A kind of satellite electromagnetic leakage localization method and system
CN109142888B (en) * 2018-09-25 2020-12-18 北京空间飞行器总体设计部 Satellite electromagnetic leakage positioning method and system

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